DXC program

New Developments in XRD/XRF Instrumentation
(vendor/commercial presentations permitted)

Chairs:
T. Fawcett, Emeritus, ICDD, USA, dxcfawcett@outlook.com
A. Drews, Ford Motor Company, USA, adrews@ford.com

Abstracts should be submitted by technical representatives of a manufacturer. They should discuss specifications, and applications concerning one of their newest and most important products. Talks should include comments about software, XRD and XRF equipment, and accessories. No mention of prices or a comparison with competitors’ products can be included.

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X-ray Absorption Spectroscopy (XAS)

Chair: S. Seshadri, Sigray, USA, srivatsan.seshadri@sigray.com

This special session will showcase the latest developments in the XAS instrumentation and Qualitative and Quantitative Analyses of materials using X-ray Absorption Spectroscopy. The scope of instrumentation includes new developments in X-ray optics, laboratory X-ray sources, detectors and Machine Learning techniques to accurately interpret and classify X-ray Absorption spectra. The materials studied can include, but not limited to, energy storage materials, catalysts, semiconductors, biological materials and metallodrugs.

Invited Speakers:
U.E.A. Fittschen, TU Clausthal, Germany
P. Kennepohl, University of Calgary, Canada
S.R. Bare, SLAC National Accelerator Laboratory, USA

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Imaging

Chair: TBA
Session description coming soon.

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Machine Learning Techniques in X-ray Analysis

Chairs:
A. Mehta, SLAC, SSRL, USA, mehta@slac.stanford.edu
M. Cherukara, Argonne National Laboratory, USA, mcherukara@anl.gov

The capabilities provided by next generation light sources along with the development of new characterization techniques and detector advances are expected to dramatically increase the complexity and volume of data generated by instruments at the new light sources. Traditional techniques of data reduction and analysis will not be able to keep pace. Machine learning methods applied to a variety of X-ray characterization techniques have shown promise in accelerating, and in some cases improving the accuracy of X-ray data inversion, abstraction and inference. This workshop is being organized to discuss the current state and potential of machine learning methods applied to synchrotron and XFEL data.

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Cultural Heritage

Chair: M. Schmeling, Loyola University of Chicago, USA, mschmel@luc.edu

This session covers all aspects of X-ray analysis related to objects of cultural heritage such as paintings, sculptures, manuscripts, and buildings. Presentations involving multiple methods like XRF and XRD or XRF and Raman Spectroscopy are highly encouraged.

Invited Speaker:
M. Loubser, University of Pretoria, USA

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XRF & XRD in Construction Materials

Chair: S. Vaidya, CTL Group, USA, svaidya@ctlgroup.com

X-ray analytical tools continue to gain applications throughout the construction industry, all the way from QA/QC in material production to failure investigations. As such, this session solicits presentations involving various X-ray techniques employed in construction materials’ production, quality testing, and failure mechanism investigations.

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Industrial Applications of XRD & XRF

Chair: D. Broton, CTLGroup, USA, dbroton@ctlgroup.com
Session description coming soon.

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Functional Materials

Chair: F. Meirer, Debye Institute for Nanomaterials Science, Utrecht University, The Netherlands, f.meirer@uu.nl

This session covers all aspects of X-ray analysis related to functional materials such as batteries, catalysts, solar cells, and semiconductor materials. Special emphasis will be put on in-situ or operando studies as well as multi-technique approaches such as XRF and XRD, XRF and vibrational spectroscopy, or X-ray and Electron microscopy.

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Non-ambient Analysis

Chair: B. Wheaton, Corning Incorporated, USA, wheatonbr@corning.com

This session covers all aspects of non-ambient analysis and techniques to gain knowledge of the behavior of materials under various conditions.  Presentations involving use of non-ambient analysis techniques are encouraged.

Invited Speakers:
K.H. Stone, SLAC National Accelerator Laboratory, USA
B. Puhr, Anton Paar GmbH, Austria

General XRD

Chair: C. Murray, IBM T.J. Watson Research Center, USA, conal@us.ibm.com

Welcoming abstracts in all areas of X-ray diffraction and related techniques.

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Advanced PDF Modelling

Chairs:
B. Aoun, USA, bachir.aoun@e-aoun.com
K. Page, University of Tennessee Knoxville, USA, kpage@ati.ac.at

Session description coming soon.

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Quantitative Phase Analysis

Chair: J. Kaduk, Poly Crystallography, Inc., USA, kaduk@polycrystallography.com

Session description coming soon.

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Stress Analysis

Chair: T.R. Watkins, Oak Ridge National Laboratory, USA, watkinstr@ornl.gov

The Stress Analysis session seeks to provide a forum to display and discuss the latest techniques and analyses for stress work using diffraction across a broad range of applications.  Contributions are also sought from related areas that impact stress analysis including but not limited to texture, elasticity, statistics, validation, modelling, etc.

Keywords: Stress, Strain, in-situ, x-ray, neutron.

General XRF

Chair: U. Fittschen, TU Clausthal, Clausthal-Zellerfeld, Germany, ursula.fittschen@tu-clausthal.de

Authors are invited to submit X-ray fluorescence and related X-ray technique papers to the general XRF session. Such papers on topics that do not fit well into other specific sessions can be submitted to the General XRF session.

Invited Speaker:
G. Peaslee, University of Notre Dame, USA
T. Schirmer, Institute of Disposal Research, Clausthal University of Technology, Germany
Stoichiometric Calculation of Lithium-Containing Phases Based On Spatially Resolved X-ray Analysis and Virtual Compounds

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Trace Analysis including TXRF

Chair: M. Krämer, AXO Dresden GmbH, Germany, markus.kraemer@axo-dresden.de

The general subject of this session is how useful are x-rays for trace and ultra-trace element analysis and contents of contributed papers should be dealing with the analysis of environmental, medical, technical, forensic and art samples wherever trace element play an important role. Papers are welcome with presentations of most modern techniques and instrumentation for trace element analysis using EDXRF or WDXRF. Papers dealing with methods to improve the detection limits in XRF either by background reduction or application of new X-ray sources in combination with X-ray optics for lab and synchrotron radiation are welcome. Presentations dealing with the developments extending the detectable elemental range down to light elements (eg. Carbon) are also interesting for this session.

Invited Speaker:
Rainer Unterumsberger, Physikalisch-Technische Bundesanstalt (PTB), Germany

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Quantitative Analysis of XRF

Chair: L.L. Brehm, Dow, Retired, USA, lora.brehm@dupont.com

Papers accepted for presentation in the Quantitative XRF Session should discuss applications of quantitative XRF (any type of XRF technology), and/or in general key parameters or novel ideas related to improving methods for quantitative XRF.

Invited Speakers:
W. T. Elam, Applied Physics Lab, University of Washington, USA
Elemental Quantification Software for the Planetary Instrument for X-ray Lithochemistry

Chris Heirwegh, Jet Propulsion Laboratory, California Institute of Technology, USA
The Mars 2020 Mission and the Elemental Calibration of the Planetary Instrument for X-ray Lithochemistry (PIXL)