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Complete Program now available!

The 2015 DXC will be held 3-7 August at the Westin Westminster, Westminster, Colorado, U.S.A. ICDD is pleased to announce the joint conference of the 16th International Conference on Total Reflection X-ray Fluorescence Analysis and Related Methods (TXRF 2015) and the 64th Annual Conference on Applications of X-ray Analysis (Denver X-ray Conference)

Go to TXRF2015 info

Conference Proceedings

Don't miss this opportunity to showcase your research by submitting your presented paper to the DXC conference proceedings, Advances in X-ray Analysis, Volume 59. Work presented during either an oral session or poster session is eligible for submission. Select papers will also be published in the journal, Powder Diffraction.

See the Guidelines for the Preparation of Manuscripts. The deadline for submission is 4 September 2015.

Note: To be accepted for publication, papers should describe new methods, theory and applications, improvements in methods or instrumentation, or other advances in the state of the art. Papers emphasizing commercial aspects are discouraged.

Advances in X-ray Analysis is distributed throughout the world, and the complete manuscripts of Volumes 40–55 (1996– 2011) can also be viewed on the ICDD website.

advances in x-ray analysis

Future Conference Dates

The 2016 Denver X-ray Conference will be held at the Westin O’Hare Hotel, located on River Road in Rosemont, IL, the week of August 1-5, 2016.

The 2017 dates will be confirmed shortly, but DXC will make a return to Big Sky in 2017!

Other News

Read 2014 Student Testimonials

READ THE 2014 DXC SUMMARY

John Getty Named as a FELLOW of the International Centre for Diffraction Data (ICDD)

Have an idea for a workshop or session?

If there is a topic missing from the DXC Program that would make for a great workshop or session, please let the DXC Organizing Committee know. Submit your ideas for consideration for the 2015 Conference Program.

Ideas?

 

2015 Information

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Meet the Plenary Speakers

klockenkamperDr. Reinhold Klockenkämper heads the Physical Analysis Research Group at the Institut für Spektro-chemie und angewandte Spektro-skopie and is Associate Lecturer at the Fachhochschule in Dortmund, Germany. His experience in X-ray spectral analysis spans three decades. He has published over 80 papers, reviews, and book articles. Professor Klockenkämper's research interests include micro-distribution and surface-layer analysis in general, and micro- and trace analysis by total-reflection X-ray fluorescence in particular.

Plenary Talk: Worldwide Distribution of TXRF, Its Capacity and Acceptance


MoriDr. Yoshihiro Mori is the Manager of Liquid Analysis Tool Development Department in Horiba, Ltd., Kyoto, Japan. He joined Nippon Steel Corporation in 1991 and got engaged in semiconductor R&D. He received his Ph.D. from Kyushu University in 1999 with his works for TXRF analysis of silicon wafer surface contamination. In 2001, Dr. Mori moved to Siltronic Japan Corp. as the leader of surface cleaning and analysis technology development division. In 2012, he joined Horiba, Ltd. and is now responsible for the development of spectroscopic and electrochemical liquid analysis tools, as well as new product planning. His involvement in ISO standardization started from 1998, and he served as the international secretary of ISO/TC201/WG2 from 2004 to 2011. Dr. Mori deeply contributed to develop two international standards – ISO 14706 and ISO 17331 – both for TXRF analysis of silicon wafers. He is now one of the Experts of ISO/TC201 where another TXRF standardization project is ongoing.

Plenary Talk: Industrial Applications and Standardization of TXRF


VazquezDr. Cristina Vázquez obtained her M.Sc. in Chemistry in 1976 from the School of Sciences of the University of Buenos Aires (UBA), Argentina, and became a Researcher in Analytical Chemistry at Argentine Atomic Energy Commission (CNEA). In 2000, she obtained a Ph.D. in Chemistry from the School of Sciences of the UBA, Argentina. From 1998 to 2012, Dr. Vázquez was the Head of the X-ray Fluorescence Group of the Chemistry Department at CNEA. At present, she is the Head of Quality Assurance Division at the Analytical Chemistry Department in the same institution. In addition to this responsibility, she is continuously involved in research activities in the field of X-ray spectrometry by directing degree, doctoral, and post-doctoral theses at national and international levels. Concerning teaching activities, Dr. Vázquez is Associated Professor, on a part-time basis at the Engineering School of Buenos Aires University in the Inorganic and Analytical Chemistry area.

Plenary Talk: Total Reflection X Ray Fluorescence in Latin America

 

 

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