Providing a unique mixture of sessions on training, education, and applications and papers containing details about state-of-the-art techniques and future developments in X-ray analysis.
ICDD is pleased to announce the joint conference of the 16th International Conference on Total Reflection X-ray Fluorescence Analysis and Related Methods (TXRF 2015) and the 64th Annual Conference on Applications of X-ray Analysis (Denver X-ray Conference)
Don't miss this opportunity to showcase your research by submitting your presented paper to the DXC conference proceedings, Advances in X-ray Analysis, Volume 58 on CD. Work presented during either an oral session or poster session is eligible for submission. Select papers will also be published in the journal, Powder Diffraction.
See the Guidelines for the Preparation of Manuscripts. The deadline for submission is 5 September 2014.
Note: To be accepted for publication, papers should describe new methods, theory and applications, improvements in methods or instrumentation, or other advances in the state of the art. Papers emphasizing commercial aspects are discouraged.
Advances in X-ray Analysis is distributed throughout the world, and the complete manuscripts of Volumes 40–55 (1996– 2011) can also be viewed on the ICDD website.
2015 Call for Papers Now Available!