49th Annual (2000) Denver X-ray Conference™
Denver Marriott Tech Center Hotel
Denver, Colorado, U.S.A.
July 31 - August 4

49th Annual (2000) DXC > Wednesday Poster Sessions (August 2)

XRD Poster Session I, Wednesday, 2 August (Evergreen Ballroom)
6:30 p.m. – 8:30 p.m., authors present

The XRD Poster Session II will be held in conjunction with the Bruker AXS, Inc. mixer.
Session chairs will select the three best papers for awards.

Chairs: R. van Grieken University of Antwerp, Antwerp, Belgium
G. Havrilla Los Alamos National Laboratory, Los Alamos, NM

XRF Applications

F-25 INVESTIGATION OF THE TXRF DETECTION SENSITIVITY FOR LOW Z ELEMENTS AT THE PTB MONOCHROMATOR BEAMLINE FOR UNDULATOR RADIATION AT BESSY II
B. Beckhoff, G. Ulm, Physikalisch-Technische Bundesanstalt, Berlin, Germany

C. Streli, P. Wobrauschek, Atominstitut der Österreicheschen Universitäten, Wien, Austria

L. Fabry, S. Pahlke, Wacker Siltronic AG, Burghausen, Germany

 

F-53 THE USE OF XRF TO CONTROL A LANTHANIDE BENEFICIATION PLANT
E.B. McNew, Molycorp, Inc., Mt. Pass, CA

J. Willis, James Willis Consultants cc, Somerset West, South Africa

 

F-12 ANALYSIS OF THE PIGMENTS USED IN THE SCROLL PAINTINGS OF THE TALE OF GENJI, NATIONAL TREASURE, BY PORTABLE X-RAY FLUORESCENCE SPECTROMETER
K. Sugihara, K. Tamuara, M. Satoh, Seiko Instruments, Inc., Chiba, Japan

Y. Hayakawa, Y. Hirao, S. Miura, Tokyo National Research Institute of Cultural Properties, Tokyo, Japan

H. Yotsutsuji, Y. Tokugawa, Tokugawa Art Museum, Aichi, Japan

 

F-50 COMPARISON OF TXRF ANALYSIS AND EDXRF WITH 150 nm AP1 SAMPLE SUPPORT FILMS
P. Wobrauschek, G. Buzanich, N. Marosi, Atominstitut der Österreichischen Universitäten, Vienna, Austria

 XRF Instrumentation 

F-26 THE BAM BEAMLINE AT THE ELECTRON STORAGE RING BESSY II – A SUITABLE SOURCE FOR X-RAY FLUORESCENCE ANALYSIS
B. Beckhoff, R. Klein, M. Krumrey, G. Ulm, Physikalisch-Technische Bundesanstalt, Berlin, Germany

W. Görner, B.R. Müller, H. Riesemeier, Bundesanstalt für Materialforschung und-prüfung, Berlin, Germany

 

F-31 ID18F, A NEW END-STATION AT THE ESRF FOR QUANTITATIVE -XRF ANALYSIS: PRELIMINARY EXPERIMENTS
B. Vekemans, A. Somogyi, L. Vincze, K. Janssens, F. Adams, University of Antwerp, Wilrijk, Belgium

M. Drakopoulos, A. Snigirev, ESRF, Grenoble, France

 

F-18 INTERACTIVE SOFTWARE FOR UPLOADING PROCESSED X-RAY FLUORESCENCE DATA FILES TO A LABORATORY INFORMATION MANAGEMENT SYSTEM (LIMS)
J.R. Quagliano, C.G. Worley, Los Alamos National Laboratory, Los Alamos, NM

 

F-33 SPECTRUM MODIFICATION IN THE X-RAY BEAM PASSED THROUGH A SLITLESS COLLIMATOR
V.K. Egorov, A.P. Zuev, IPTM RAS, Moscow District, Russia

E.V. Egorov, Moscow Engineering and Physical Institute, Moscow, Russia

 

F-54 USING A CHARGE-COUPLED DEVICE (CCD) TO GATHER X-RAY FLUORESCENCE (XRF) AND X-RAY DIFFRACTION (XRD) INFORMATION SIMULTANEOUSLY
A. Reyes, H.K. Pew, P. Moody, MOXTEK, Inc., Orem, UT

L.V. Knight, S. Cornaby, T. Hughes, A. Stradling, Brigham Young University

 

F-55 A COMPACT, LOW-POWER TUBE WITH A FIELD EMISSION CATHODE
H.K. Pew, A. Reyes, A. Astle, D.C. Turner, S. Voronov, MOXTEK, Inc., Orem, UT