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49th Annual (2000) DXC > Friday Sessions (August 4)
Morning Sessions: XRD(D-8 & D-9) - XRF(F-4 & F-5)

Sessions, Friday a.m.

XRD (Evergreen A)
Session D-8 NEW DEVELOPMENTS IN XRD INSTRUMENTATION II

Organized by: S.T. Misture New York State College of Ceramics at Alfred University, Alfred, NY
co-Chair: B. O’Connor Curtin University of Technology, Perth, Australia

8:30  D-004 RAY-TRACING STUDY ON A K 1 -K 2 CHARACTERISTIC OF A PARABOLIC GRADED MULTILAYER – Invited
H. Toraya, Nagoya Institute of Technology, Tajimi, Japan
9:00 D-018 WAVELET REPRESENTATION OF DIFFRACTION POLE FIGURES
H. Schaeben, J. Prestin, Freiberg University of Mining and Technology, Freiberg, Germany
9:20 D-095 AN INSTRUMENT FOR RAPID TEXTURE MAPPING ON 200 MM WAFERS
K.J. Kozaczek, R.I. Martin, D.S. Kurtz, P.R. Moran, S.P. O’Leary, HyperNex, Inc., State College, PA
9:40 D-118 INNOVATIVE ADVANCES IN THE FIELD OF X-RAY DIFFRACTION ANALYSIS
P.J. LaPuma, Bruker AXS, Inc., Billerica, MA
10:00   Break
10:20 D-041 PORTABLE MINIDIFFRACTOMETER FOR MEASUREMENTS IN-LABORATORY AND IN-FIELD CONDITIONS
J.T. de Assis, V.I. Monine, F.R. Pereira, Instituto Politécnico do Rio de Janeiro, Nova Friburgo, Brasil
10:40  D-101  MNI, A NEW APPROACH TO QUANTITATIVE XRD ANALYSIS USING THE ICDD PDF-2 DATABASE
R. Clapp, Diffraction Technology Pty. Ltd., Canberra, Australia
11:00  D-092 NEW DEVELOPMENTS IN (OLD) XRD SOFTWARE: JPOWD

WITHDRAWN 
Q. Johnson, S. Weber, Materials Data, Inc., Livermore, CA
11:00  D-061  TRADITIONAL ANALYTICAL X-RAY TECHNIQUE INITIATES INNOVATIVE DEVELOPMENTS OF INDUSTRIAL SYSTEMS IN AIRCRAFT, SEMICONDUCTOR AND AUTOMOTIVE QUALITY CONTROL
A. Haase, Rich. Seifert & Co., Ahrensburg, Germany

XRD (Evergreen B)
Session D-9 THIN FILMS ANALYSIS XRD

Organized by: T.C. Huang Emeritus, IBM Almaden Research Center, San Jose, CA
  J. Harada Rigaku Corporation, Tokyo, Japan
co-Chairs:  S.-F. Lin Nankai University, Tianjin, People’s Republic of China

8:30 D-080 X-RAY CHARACTERIZATION OF SURFACE AND INTERFACE ROUGHNESS – Invited
J. Harada, Rigaku Corporation, Tokyo, Japan
9:00 D-091 NEW ANALYTICAL PROCEDURE FOR DETERMINING THE CRYSTALLITE SIZE DISTRIBUTION THROUGH PROFILE FITTING
B.R. York, IBM Materials Laboratory, San Jose, CA
9:20 D-039  X-RAY STUDY OF Mo/Si MULTILAYERS GROWN ON GLASS SUBSTRATE
A. Ulyanenkov, K. Inaba, K. Omote, J. Harada, Rigaku Corporation, Tokyo, Japan
M. Ishino, O. Yoda, Advanced Photon Research Center, Kyoto, Japan
9:40 D-011  IN SITU X-RAY DIFFRACTION ANALYSIS OF DISORDER AND STRAIN IN ION IMPLANTED CERAMIC THIN FILMS
S. Grigull, European Synchrotron Radiation Facility, Grenoble, France
M. Nastasi, Los Alamos National Laboratory, Los Alamos, NM
C.A. Zorman, Case Western Reserve University, Cleveland, OH
10:00   Break
10:20 D-038 X-RAY DIFFRACTION ANALYSIS OF FREE-STANDING AND BURIED QUANTUM WIRES – Invited
A. Ulyanenkov, K. Omote, K. Inaba, Rigaku Corporation, Tokyo, Japan
U. Pietsch, N. Darowski, University of Potsdam, Potsdam, Germany
P. Mikulik, Masaryk University, Brno, Czech Republic
A. Forchel, University of Wurzburg, Wurzburg, Germany
10:50 D-097  HIGH RESOLUTION TEXTURE ANALYSIS OF THIN BLANKET FILMS DISCREET TEST STRUCTURES IN SEMICONDUCTOR DEVICES
K.J. Kozaczek, R.I. Martin, D.S. Kurtz, P.R. Moran, S.P. O’Leary, HyperNex, Inc., State College, PA
11:10 D-050  AN INVESTIGATION OF GIANT MAGNETORESISTANCE (GMR) SPIN-VALVE STRUCTURES USING X-RAY DIFFRACTION AND REFLECTIVITY
E. Brown, EB Scientific Enterprises, Golden, CO
M. Wormington, Bede Scientific Incorporated, Englewood, CO
11:30 D-088 APPLICATIONS OF FAST X-RAY REFLECTOMETRY – A NEW TOOL FOR IN SITU THIN FILM ANALYSIS
D.K. Agnihotri, R. Ortega, Rigaku/USA, The Woodlands, TX

XRF (Evergreen D)
Session F-4 INDUSTRIAL APPLICATIONS OF XRF II

Organized by: H.L. Baker Northwest Alloys (ALCOA), Addy, WA
co-Chair: G.J. Havrilla Los Alamos National Laboratory, Los Alamos, NM

 

8:00 F-06 PROBLEMS BY USING PRESSED POWDER PELLETS FOR XRF ANALYSIS OF FEROSILICON ALLOYS - Invited
T. Eivindson, Ø. Mikkelsen, Elkem ASA Research, Norway
8:30   ANALYSIS OF NICKEL, CHROME AND FERROUS BASED METALS BY XRF USING FUNDAMENTAL PARAMETERS APPROACH – Invited
B. Wheeler, Rigaku/USA, Inc. (retired), Danvers, MA
9:00  F-11  FUSED BEADS FROM METAL DRILLINGS AND CHIPS APPLICATION TO Sn-Pb ALLOYS
J. Blanchette, F. Claisse, Corporation Scientifique Claisse, Inc., Québec, Canada
9:20  F-29  APPLICATIONS OF X-RAY ANALYSES AS A PROCESS MONITORING TOOL IN ALUMINIUM INDUSTRY
K.V. Krishnan, V.V. Kutumbarao, Jawaharlal Nehru Aluminium Research
9:40 F-35 XRF’S ROLE IN THE PRODUCTION OF MAGNESIUM METAL BY THE MAGNATHERMIC METHOD
H.L. Baker, Northwest Alloys, Inc., Addy, WA
10:00    Break
10:20  F-39  PORTABLE XRF FOR METALS ANALYSIS
D. Kenning, R. Kuhlman, L.S. Price, Edax Portable Products Division,
J. Nicolosi, R. Shen, Edax, Inc., Mahwah, NJ
10:40  F-41  REFINEMENTS USEFUL FOR X-RAY FLUORESCENCE CALIBRATION CURVES – Invited
R.W. Morton, J.F. Geibel, J.J. Gislason, R.L. Heald, Phillips Petroleum Company, Bartlesville, OK
11:10  F-19  CERTIFICATION OF SRM® 1848 PCMO ADDITIVE PACKAGE
J. Sieber, S. Leigh, National Institute of Standards and Technology, Gaithersburg, MD

XRF (Evergreen C)
Session F-5 QUANTITATIVE XRF & SOFTWARE

Organized by: M. Mantler Vienna University of Technology, Vienna, Austria
co-Chair: R. van Grieken University of Antwerp, Antwerp, Belgium

 

8:30  F-44  QUANTITATIVE XRF OF ART OBJECTS – Invited
M. Schreiner, Academy of Fine Arts, Vienna, Austria
C. Neelmeijer, Research Center Rossendorf, Inc., Dresden, Germany
M. Mantler, Vienna University of Technology, Vienna, Austria
9:00  F-24  INVESTIGATION OF FLUORESCENCE YIELDS OF LOW Z ELEMENTS USINGMONOCHROMATIZED SYNCHROTRON RADIATION OF HIGH SPECTRAL PURITY – Invited
B. Beckhoff, G. Ulm, Physikalisch-Technische Bundesanstalt, Berlin, Germany
9:30  F-05 A CRITICAL EVALUATION OF LINE OVERLAP CORRECTIONS IN X-RAY SPECTROMETRY
L.E. Creasy, Titanium Metals Corporation, Morgantown, PA
9:50  F-15  NEW APPLICATIONS OF MULTIFUNCTIONAL SYSTEM OF ENERGY DISPERSIVE X-RAY FLUORESCENCE
B. Holyñska, B. Ostachowicz, J. Ostachowicz, L. Samek, D. Wegrzynek, University of Mining and Metallurgy, Kraków, Poland
10:10   Break
10:30 F-16  DECONVOLUTION OF THE INSTRUMENTAL PROFILE FUNCTION FROM SOFT Fe L X-RAY SPECTRA
G. Trudgett, R. Cheary, University of Technology, Sydney, Australia
K. Turner, BHP Steel, Australia
10:50  F-17 INTELLIGENT INTERPOLATION FOR BACKGROUND SUBTRACTION IN TRACE-ELEMENT ANALYSIS
R.A. Couture, Washington University, St. Louis, MO
11:10 F-21  NON-DESTRUCTIVE EDXRF ANALYSIS OF GARMENT BUTTONS 
G.S. Hall, Rutgers University, Piscataway, NJ
11:30 F-36 BACKGROUND REMOVE IN XRF SPECTRUM – A COMPARISON OF VARIOUS TECHNIQUES
T. He, CMI International Corporation, Elk Grove Village, IL