2001 Denver X-ray Conference™ > Submitted Abstracts Listings Steamboat Springs, Colorado, USA - 30th July - 3rd August 2001  SUBMITTED ABSTRACTS LISTING  (alphabetically by first author) in Adobe Acrobat PDF Form The following abstracts have been submitted for presentation at the 2001 DXC.  The schedule of presentations, including date and time, will be available in late April. Search the Abstract Listings   A - B - C - D - E - F - G - H - I - J - K - L - M - N - O - P - Q - R - S - T - U - V - W - X - Y - Z A STRAIN AND TEXTURE MEASUREMENTS USING HIGH-ENERGY X-RAYS J. Almer, U. Lienert, M. Odèn, D. Haeffner ANALYSIS OF STEEP STRESS GRADIENT BY USING SYNCHROTRON RADIATION K. Akita, Y. Yoshioka, H. Suzuki QUANTITATIVE ANALYSIS OF HYDROXYLAPATITE-ZIRCONIA BIOMATERIAL USING THE RIETVELD METHOD A.V.C. Andrade, J. Caetano Zurita, , J.A Varela, D.A Barbato, J. L. Amaral, R.D. Adati RIETVELD ANALYSIS OF PEROVSKITE AND PYROCHLORE Me DOPED PZN (Me = Ba or Ti) A.V.C. Andrade, C. O Paiva-Santos, M.A. Zaghete, J.A. Varela X-RAY FOCUSING CRYSTAL VON HAMOS SPECTROMETER WITH A CCD LINEAR ARRAY AS A DETECTOR A.Antonov, I.Grigorieva, Yu.Kasyanov, L. Knight, Q. Wang, A. Shevelko, O.Yakushev  FOCUSING OF HARD X-RAY RADIATION BY FRESNEL MODIFIED ZONE PLATES V.V. Aristov, A.A. Isoyan, A.V. Kuyumchyan, E.V. Shulakov, M.V. Grigor'ev BAYESIAN/MAXIMUM ENTROPY ANALYSIS OF NANOPARTICLE-BROADENED LINE PROFILES N. Armstrong, J.P. Cline,W.  Kalceff B MONOCAPILLARY SYSTEMS FOR QUANTITATIVE LAB MICRODIFFRACTION D.X. Balaic INVESTIGATION OF LOAD-TRANSFER IN Ta-REINFORCED BULK METALLIC GLASSES USING HIGH-ENERGY X-RAY DIFFRACTION D. K. Balch, E. Üstündag, S-Y Lee,  D.C. Dunand NEW X-RAY DIFFRACTION STATION AT NIST-BOULDER D. Balzar, D. Fitting, D. McColskey, N. C. Popa, R. Santoyo, T. Siewert, P. Spagnol IMPROVED MODELING OF RESIDUAL STRAIN/STRESS AND CRYSTALLITE-SIZE DISTRIBUTION IN RIETVELD REFINEMENT D. Balzar, N.C. Popa Three-Dimensional Microstructure by SAS and WAD Using Temperature-Induced Contrast Variation J.D. Barnes, R. Kolb, SNAP-1D: SOFTWARE FOR FULL-PROFILE POWDER DIFFRACTION PATTERN MATCHING AND QUANTITATIVE ANALYSIS G. Barr, C. J. Gilmore, J. Paisley INVESTIGATION OF THE STRUCTURAL STABILITY OF MAGNESIUM STEARATE BY TEMPERATURE AND HUMIDITY CONTROLLED X-RAY DIFFRACTION D. Beckers, S. Prugovecki, E. Meštroviæ LOW-ENERGY X-RAY FLUORESCENCE ANALYSIS BASED ON HIGH-RESOLUTION SUPERCONDUCTING TUNNEL JUNCTION DETECTORS B. Beckhoff, R. Fliegauf, G. Ulm TXRF ANALYSIS OF LOW Z ELEMENTS ON SILICON WAFER SURFACES EXCITED BY MONOCHROMATIZED UNDULATOR RADIATION B. Beckhoff, R. Fliegauf, G. Ulm, J. Weser, G. Pepponi, C. Streli, P. Wobrauschek, L. Fabry, S. Pahlke MEASUREMENT OF RESIDUAL STRESSES IN FIBER REINFORCED COMPOSITES BASED ON X-RAY DIFFRACTION B. Benedikt, P. K. Predecki, L. Kumosa, M. Kumosa CALIBRATION MONITORING OF DIFFRACTOMETERS G. Berti, M. D'Acunto A QUARTER OF CENTURY OF ROUND ROBIN TESTS ON XRD G. Berti, M. D'Acunto, F. De Marco A SAFE, QUICK AND RELIABLE FUSION METHOD FOR SILICON AND FERROSILICON J. Blanchette IN SITU HIGH-TEMPERATURE STUDY OF SILVER BEHENATE REDUCTION TO SILVER METAL USING SYNCHROTRON RADIATION T. Blanton, M. Lelental, S. Zdzieszynski, S. T. Misture THE X’CELERATOR: THE REVOLUTION IN POWDER DIFFRACTOMETRY T. Bor, M. Fransen, J. Vasterink, K. Brandt, R. Verbruggen NEW HAND HELD XRF SPECTROMETER FEATURING A COLD CATHODE X-RAY TUBE B.W. Boyer APPLICATIONS OF PCFPW FUNDAMENTAL PARAMETERS SOFTWARE IN CORPORATE R&D AND QUALITY CONTROL ANALYTICAL LABORATORIES L. Brehm, M. Buchmann, B. Haskins UNIAXIAL TENSILE DEFORMATION OF URANIUM 6 WEIGHT PERCENT NIOBIUM; A NEUTRON DIFFRACTION STUDY OF DEFORMATION TWINNING. D.W. Brown, M.A.M Bourke, P.S. Dunn, R.D. Field, M.G. Stout, D.J. Thoma INVESTIGATIONS OF SAMPLES UNDER DIFFERENT TEMPERATURE AND HUMIDITY CONDITIONS L. Bruegemann, S. Haaga, F. Stowasser, H. Leitz, U. Brotzeller USABILITY OF PORTABLE X-RAY SPECTROMETERS FOR DISCRIMINATION OF VALENCE STATES I.A. Brytov, R.I. Plotnikov, B.D. Kalinin CHARACTERIZATION OF CRYSTALLINITY IN POLYPROPYLENE BY WIDE ANGLE X-RAY DIFFRACTION J.H. Butler, D.J. Winter, R.B. Ortega C SYNCHROTRON RADIATION INDUCED µ-X-RAY FLUORESCENCE AND ABSORPTION SPECTROSCOPY ON MUNICIPAL SOLID WASTE FLY ASHES M. C. Camerani, A. Somogyi, A. Simionovici, S. Ansell, B. M. Steenari, O. Lindqvist PRACTICAL DESIGN CONSIDERATIONS OF EBSD SYSTEMS P.P. Camus, D. B. Rohde THE USE OF XRD RESIDUAL STRESS DETERMINATION TECHNIQUE FOR HYDROGEN EMBRITTLEMENT DETECTION ON HIGH-STRENGTH STEEL AND SHOT-PEENING TREATMENTS EVALUATION ON Ti-6Al-4V ALLOY. R. Capriotti, M. Colavita, F. De Paolis. EBSD CAMERA CALIBRATION: THE MOVING SCREEN TECHNIQUE REVISITED D.A. Carpenter, R. G. Richardson, L. R. Mooney NAMES BEHIND THE DENVER AWARD: Dr. CHARLES S. BARRETT D. Chandra X-RAY DIFFRACTOMETRY STUDIES ON 5-AMINOTETRAZOLE-Fe2O3-KNO3 SYSTEM D. Chandra, W.-M. Chien, C.J. Rawn, A. K. Helmy FOCUSED BEAM TOTAL REFLECTION X-RAY FLUORESCENCE ANALYSIS USING DOUBLY CURVED CRYSTAL OPTICS Z. W. Chen MONOCHROMATIC MICRO X-RAY BEAM USING DOUBLY CURVED CRYSTAL OPTICS Z. W. Chen RAPID X-RAY REFLECTOMETRY USING DOUBLY CURVED CRYSTALS Z. W. Chen DOUBLE-TWISTED HELICAL LAMELLAR CRYSTALS IN A SYNTHETIC MAIN-CHAIN CHIRAL POLYESTER DETERMINED USING DIFFRACTION METHODS S. Z. D. Cheng, C. Y. Li, S. Jin SOLID STATE PHASE TRANSITIONS OF NH4NO3-KNO3 BINARY SYSTEM W-M Chien, D. Chandra, J. Smith, C.J. Rawn, A.K. Helmy NOVEL X-RAY DIFFRACTION TECHNIQUE FOR STRAIN MEASUREMENTS USING AREA DETECTOR Y.S. Chu, D.C. Mancini, F. de Carlo, J.D. Almer, D.R. Haeffner. A VERSATILE XRF SOFTWARE IN THE TRACKS OF JOHN CRISS F. Claisse A HIGH PERFORMANCE COLLIMATOR FOR SMALL ANGLE X-RAY SCATTERING USING A MONOCAPILLARY WITH A PARABOLOIDAL PROFILE. R.A. Clapp SIMULTANEOUS XRF/XRD WITH LOW-POWER X-RAY TUBES S. Cornaby, A. Reyes-Mena, P. W. Moody, T. Hughes, A. Stradling, T. Grow, L. V. Knight BACKGROUND SUBTRACTION FOR TRACE-ELEMENT ANALYSIS – ANALYTICAL COMPARISON OF METHODS R.A. Couture SAXS STUDIES OF POLYMER MELTING B. Crist D THE LINUS PAULING FILE (LPF) PROJECT J. Daams, P. Villars ANALYSIS OF SODIUM AND SULFUR IN A PORTLAND CEMENT BY XRF WITH FUSED BEADS ON AN AUTOMATIC GAS FUSION MACHINE M. Davidts, NON-DESTRUCTIVE 3D STRUCTURAL STUDIES BY X-RAY MICROTOMOGRAPHY G.R. Davis, S.E.P. Dowker, J.C. Elliott, P. Anderson, H.S. Wassif, A. Boyde, S.R. Stock USE OF GLANCING ANGLE XRD TO EVALUATE PHASE TRANSITIONS OCCURRING DURING DISSOLUTION S. Debnath, R. Suryanarayanan, P. Predecki  X-RAY POWDER DIFFRACTION CHARACTERIZATION OF THE SEMICONDUCTING COMPOUNDS Ag2FeSnS4 AND Ag2FeSn3S8 G. Delgado, J.M. Delgado, E. Quintero, R. Tovar, M. Quintero QUANTITATIVE ANALYSIS OF LOW-Z ELEMENTS IN TOTAL REFLECTION X-RAY FLUORESCENCE SPECTROSCOPY M. Doi, M. Yamagami, T. Shoji, T. Yamada EMERGENCE OF POLYMER PROPERTIES IN POLY-DISPERSE CHAIN ASSEMBLIES - THE STRUCTURAL DISTINCTION BETWEEN LOW MOLECULAR WEIGHT LINEAR POLYETHYLENE AND PETROLEUM WAXES REVEALED BY ELECTRON CRYSTALLOGRAPHY D.L. Dorset APPLICATION OF THE RIETVELD METHOD TO DETERMINE THE STRUCTURE OF BULK METALLIC GLASSES D. Dragoi, E. Ustundag, I. Halevy, M.S. Somayazulu, J. Hu XRF ANALYSIS OF AUTOMOTIVE CATALYSTS BY FLUX/FUSION A. R. Drews DESK-TOP X-RAY MICROTOMOGRAPHY: INSTRUMENTATION AND APPLICATIONS D. Van Dyck, A. Sasov, T. Ceulemans E A REVIEW OF CONVERGENT-BEAM ELECTRON DIFFRACTION (CBED). A. Eades PREDICTING FATIGUE FAILURE USING TWO DIMENSIONAL X-RAY DETECTORS M.O. Eatough, R. G. Tissot, R. P. Goehner APPLICATION OF X-RAY SPECTROMETRY FOR ANALYSIS OF WASTE WATER L.P. Eksperiandova, A.B. Blank, Y.N. Makarovskaya CHEMICAL INFORMATION FROM X-RAY EMISSION SPECTRA W.T. Elam,  J.R. Sieber, A.L. Ankudinov, J. J. Rehr APATITE STRUCTURES J.C. Elliott, R.M. Wilson, S.E.P. Dowker ANALYSIS OF RESIDUAL STRESSES IN BENT COMPOSITE TUBES AND WELDED AIRPORT PANELS USING XRD AND FINITE ELEMENT METHODS T. Ely, G. Sarma, C. Hubbard, J. Keiser, L. Hall PHASE FRACTION OF BASE METAL OXIDES FOR ADSORBERCATALYSTS R. D. England F DEVELOPMENT OF INTERFEROMETRIC X-RAY IMAGING AT THE ADVANCED PHOTON SOURCE K. Fezzaa, W-K. Lee COMPARISON OF STANDARDS OF PERFORMANCE FOR MONOLITHIC POLYCAPILLARY FOCUSING OPTICS S. Formica, D. Gibson, S. M. Lee G A COMPACT, POLYCAPILLARY-BASED MICRO X-RAY FLUORESCENCE ANALYSIS SYSTEM N. Gao, I. Ponomarev, D. Gibson STUDIES OF THERMAL EXPANSION OF CALCIUM ALIMINATES USING HIGH TEMPERATURE SYNCHROTRON X-RAY DIFFRACTION Y. Gao, B. Nyiri FUNDAMENTAL PARAMETERS ALGORITHM FOR SEICXRF METHOD APPLIED TO BINARY AND TERNARY SAMPLES M. García, R. Figueroa, R. Rivera ELECTRON DIFFRACTION CHARACTERIZATION OF NASCENT CONDENSATION POLYMERS P. H. Geil POLYCAPILLARY OPTICS BASED NEUTRON FOCUSING FOR SMALL SAMPLE NEUTRON CRYSTALLOGRAPHY W.M. Gibson, H.H. Chen-Mayer, D.F.R. Mildner, H.J. Prask, A.J. Schultz, R. Youngman, T. Gnäupel-Herold, M.E. Miller, R. Vitt  MONITORING OF PHOSPHOROUS LEVELS IN VARIOUS PROCESS STEPS BY TXRF IN SEMICONDUCTOR MANUFACTURING A. R. Ghatak-Roy, D. Kulik, M. McBride, T. Z. Hossain X-RAY DIFFRACTION IN THE MICROELECTRONICS INDUSTRY C.C. Goldsmith, P. De Haven, T.L. Nunes, I.C. Noyan, NANOSTAR: A IN SITU COMBINATION OF SMALL-ANGLE X-RAY SCATTERING (SAXS) AND X-RAY FLUORESCENCE (XRF) R. Görgl, K. Erlacher, P. Doppler, H.F. Jakob, P. Fratzl, P. Wobrauschek , C. Streli MINIATURIZATION OF X-RAY STRESS ANALYZER T. Goto, Y. Gong  THE EFFECT OF POINT DEFECTS ON X-RAY DIFFRACTION LINE INTENSITIES S. Grigull H IN-SITU XRD TO OPTIMIZE POWDER SYNTHESIS OF AURIVILLIUS PHASES M.S. Haluska, S. Speakman, S.. Misture STRAIN EVOLUTION AFTER FIBER FAILURE IN SINGLE FIBER METAL MATRIX COMPOSITES J.C. Hanan, E. Üstündag, I. J. Beyerlein, G. A. Swift, B. Clausen1, D. W. Brown,  M.A. M. Bourke INVESTIGATION OF FIBER/MATRIX INTERFACES USING X-RAY MICROTOPOGRAPHY J.C. Hanan, E. Üstündag, C. C.  Aydiner, G. A. Swift, S. K. Kaldor, I.C. Noyan THE ELECTRON DENSITY DISTRIBUTION OF Ti AND O OCTAHEDORON IN PEROVSKITE TYPE OXIDE CRYSTALS ANALYSED BY MAXIMAM ENTROPY METHOD J. Harada, M. Sakata , Y. Akishige, A. Yoshida, E. Nishibori, Y. Kuroiwa, M. Takata  USE OF MICRO-BEAM X-RAY FLUORESCENCE AS AN EFFECTIVE ANALYTICAL TOOL FOR COMBINATORIAL CHEMISTRY M. Haschke, J. Klein, U. Vietze, W. Stichert  DUAL-CAPILLARY OPTIC MXRF G. J. Havrilla QUANTITATIVE ANALYSIS USING MICRO X-RAY FLUORESCENCE G. J. Havrilla X-RAY OPTICS FOR TWO-DIMENSIONAL DIFFRACTION B. B. He, U. Preckwinkel COMPOSITION MEASUREMENTS OF SnPb SOLDER BUMP ON C4 FLIP CHIP INTERCONNECTION FOR SEMICONDUCTOR PACKAGE INDUSTRY T. He MICRO STRAIN IN HMX INVESTIGATED WITH POWDER X-RAY DIFFRACTION AND CORRELATION WITH MECHANICAL SENSITIVITY M. Herrmann, W. Engel, H. Göbel USE OF ACCURATE STRUCTURE DATA FROM X-RAY POWDER DIFFRACTION TO SIMULATE THE MAGNETIC PROPERTIES OF RARE EARTHS J. Hölsä, M. Lahtinen, M. Lastusaari, J. Niittykoski, P. Porcher, R. Sáez Puche, J. Valkonen FIXED DEPTH DIRECTION TEXTURE ANALYSIS USING ENERGY DISPERSIVE X-RAY DIFFRACTION METHOD K. Hoshino COLLIMATING AND FOCUSING POLYCAPILLARY OPTICS FOR POWDER DIFFRACTION H. Huang, C.A. MacDonald, W. M. Gibson, J. Chik, A. Parsegian, I. Ponomarev STUDY OF THE DIFFUSING BEHAVIOR OF MoO3 and ZnO ON OXIDE THIN FILMS BY SYNCHROTRON RADIATION TXRF Y. Huang, W. Xu, J. Xu, N. Wu, J.Yan, Y. Zhu, W. He, Y. Xie SYNCHROTRON RADIATION XRF MICROPROBE STUDY OF HUMAN BONE TUMOR AND HUMAN FEMORAL HEAD SLICES Y. Huang, Y. Zhang, J. Lu, W. Liao, W. He I X-RAY OPTICS FOR A 3-D X-RAY CRYSTAL MICROSCOPE: SUBMICRON DIFFRACTION FROM POLYCRYSTALLINE MATERIALS G.E. Ice AN X-RAY DIFFRACTION STUDY OF HETEROEPITAXIAL GROWTH OF RARE EARTH FLUORIDE FILMS K. Inaba, J. Harada, K. Omote, J.M. Ko, A. Yoshikawa,  T. Fukuda J POLYCAPILLARY-BASED MICRO-XRF AND MICRO-XANES BY MEANS OF CONVENTIONAL AND SYNCHROTRON RADIATION K. Janssens, K. Proost, L. Vincze, G. Vittiglio, G. Falkenberg, F. Wei, W. He, Y. Yan THE ANALYSIS OF INCONEL 690 OXIDATION PRODUCTS AND MEASURMENT OF THEIR GROWTH RATES AS A FUNCTION OF TEMPERATURE USING X-RAY DIFFRACTION A.R. Jurgensen, D.M. Missimer, K.J. Imrich, M.E. Summer K NON-TRADITIONAL POWDER CRYSTALLOGRAPHY IN THE PETROCHEMICAL INDUSTRY J. A. Kaduk FUNDAMENTAL PARAMETER METHOD FOR LOW ENERGY REGION INCLUDING CASCADE EFFECT AND PHOTOELECTRON EXCITATION N. Kawahara, T. Shoji, T. Yamada, Y. Kataoka, B. Beckhoff, G. Ulm, M. Mantler STRAIN AND STRESS CHARACTERISATION IN THIN FILMS AND SANDWICH STRUCTURES AT ELEVATED TEMPERATURES J. Keckes ONLINE AND REAL-TIME QUANTIFICATION OF CEMENT CLINKERS USING XRD A. Kern, R. Schmidt SELFCONSISTENT DETERMINATION OF THE X-RAY ELASTIC CONSTANTS OF POLYCRYSTALLINE MATERIALS FOR ARBITRARY CRYSTAL SYMMETRY N. Koch, H. Wern STRUCTURAL AND OPTICAL PROPERTIES OF IRIDIUM FILMS ANNEALED IN AIR S. Kohli, C.D. Rithner, P.K. Dorhout, D. Niles X-RAY DIFFRACTION AS A PROCESS CONTROL TOOL IN SUPERCONDUCTOR APPLICATIONS K.J. Kozaczek, R. I Martin, D. S. Kurtz, P. R. Moran, S. P. O'Leary INVESTIGATION OF ADSORBED MERCURY DISTRIBUTION IN SILVER COATED FILTERS BY X-RAY FLUORESCENCE METHODS S. Kurunczi, S. Török, J. W. Beal QUANTITATIVE EVALUATION OF NI CONCENTRATION ON AMORPHOUS SI AT THE PPB LEVEL USING MICROSAMPLE X-RAY ANALYSIS H.J. Kwon, K.H. Park, J.S. Lee, B. Kim, H.R. Yun, G. Lee, J. R. Bogert, D. Leland L X-RAY FLUORESCENCE MICROANALYSIS OF BIOMEDICAL AND ENVIRONMENTAL SAMPLES M. Lankosz, M. Boruchowska, J. Ostachowicz X-RAY PHASE CONTRAST IMAGING W-K Lee SEARCHING FOR NEW POLYMORPHS BY PARALLEL CRYSTALLIZATION ANDHIGH-THROUGHPUT X-RAY DIFFRACTION SCREENING C.W. Lehmann TEXTURE EVOLUTION IN ETHYLENE-OCTANE COPOLYMER DURING UNIAXIAL TENSION D. Li, H. Garmestani, R.G. Alamo  RECENT ADVANCES IN STRUCTURE SOLUTION FROM POWDER DIFFRACTION DATA C. Lianga, M.A. Neumann, F.J. J. Leusen, G. E. Engel, S. Wilke , C. Conesa-Moratilla MATERIALS CHARACTERIZATION BY MICROFOCUSSED HIGH ENERGY X-RAYS U. Lienert, E.M. Lauridsen, L. Margulies, R.V. Martins, S.F. Nielsen, H.F. Poulsen RAPID XRD SCREENING FOR COMBINATORIAL CHEMISTRY ON THE MILLISECOND TIME SCALE J.B. Litteer, U. Preckwinkel, B. Nechkash, B.B. He, K. Smith IN-SITU SAXS ON A PERFLUOROSULFONATE IONOMER J. D. Londono, S. Mazur, R. V. Davidson M HIGH CONTRAST IMAGING WITH POLYCAPILLARY OPTICS C.A. MacDonald, W.M. Gibson, STRUCTURE SOLUTION FROM POWDER DIFFRACTION - EXPERIENCE AND FUTURE DEVELOPMENTS S. J. Maginn, J.C. Cole, R. Taylor, W.D.S. Motherwell, J. Luo, W.I.F. David, K. Shankland, H. Nowellj, P. J. Cox LOW DOSE HIGH RESOLUTION ELECTRON MICROSCOPY (HREM) OF POLY(METAPHENYLENE ISOPHTHALAMIDE) (MPDI) TWISTED CRYSTALS D.C. Martin BENCHTOP SEQUENTIAL WDX SPECTROMETER - ZSXmini - J.E. Martin, H. Inoue, T. Moriyama , S. Kojima, K. Toda THE LINE OVERLAP CORRECTION BY THEORETICAL INTENSITY J. Martin, A. Martin, Y. Yamada, N. Kawahara, Y. Kataoka, H. Kohno  DEEP MULTILAYER GRATINGS WITH ADJUSTABLE BANDPASS FOR XRF SPECTROSCOPY V.V. Martynov, Y. Platonov CHARACTERIZATION OF ULTRAFINE NANOSTRUCTURES BY X-RAY DIFFRACTION N. Mattern XRD CHARACTERIZATION AND MODELLING OF EPITAXIAL PEROVSKITE Pb(ZrxTi1-x)O3 FILMS GROWN UNDER HYDROTHERMAL CONDITIONS K. Mikulka-Bolen, T. Ryan, M. Oledzka, W. Suchanek, V. Kogan, L. McCandlish, W. Mayo, R.Riman EVALUATION OF SPECIMEN DISPLACEMENT ERRORS IN HIGH TEMPERATURE POWDER DIFFRACTION FURNACES S.T. Misture, C.R. Hubbard,  X.L. Wang RIETVELD REFINEMENT OF POWDER DATA FROM MULTILAYER AND POLYCAPILLARY OPTICS S.T. Misture X-RAY REFLECTIVITY AND ATOMIC FORCE MICROSCOPY FOR CHARACTERIZATION OF COATINGS ON GLASS S.T. Misture ASPECTS OF A SIMULTANEOUS XRD/XRF INSTRUMENT DESIGN P. Moody, A. Reyes-Mena, S. Cornaby, T. Grow, A. Stradling, T. Hughes, L. V. Knight TXRF FOR SEMICONDUCTOR APPLICATIONS Y. Mori RAPID WHOLE-SURFACE ANALYSIS OF SEMICONDUCTORS BY THE USE OF TXRF Y. Mori, K. Uemura, Y. Iizuka RIETVELD MODELING OF ETA AND GAMMA ALUMINA R. W. Morton, J. F. Geibel, J. J. Gislason, R. L. Heald, D. E. Lauffer, M. Sardashti, D.E. Simon N THE DENVER X-RAY CONFERECE: 1966 – 1979 J.B. Newkirk OPTICS FOR ANGULAR FILTERING OF X-RAYS IN 2 DIMENSIONS J.P. Nicolich, D.M. Gibson NEUTRON AND SYNCHROTRON X-RAY FIBER DIFFRACTION STUDIES OF CELLULOSE POLYMORPHS Y. Nishiyama, P. Langan, H. Chanzy. X-RAY DIFFRACTION STUDY ON HIGHLY ORDERED MESOSTRUCTURED THIN FILMS T. Noma, H. Miyata, K. Takada, A. Iida BENDING TECHNIQUES FOR X-RAY ELASTIC CONSTANTS DETERMINATION I.C. Noyan, S.K. Kaldor O IMPROVING THE ACCURACY OF RIETVELD-DERIVED LATTICE PARAMETERS BY AN ORDER OF MAGNITUDE B. O'Connor, S. Pratapa SURFACE AREA DETERMINATION OF INTERSTRATIFIED PHYLLOSILICATES IN ATHABASCA OIL SANDS FROM SYNCHROTRON X-RAY SCATTERING DOMAIN SIZE. O.E. Omotoso, R.J Mikula, P.W. Stephens P THE STRUCTURE OF POLY(SILYLENEMETHYLENE)S S.-Y. Park, T. Zhang, L.V. Interrante, B.L. Farmer IN-SITU HIGH TEMPERATURE XRD ANALYSIS OF HTSC TAPES K. Pathak, M. B. Dickerson, K. H. Sandhage, R. L. Snyder KINETICS OF PRECIPITATION IN MAGNESIUM-ALUMINUM ALLOYS FROM ANALYSIS OF HIGH TEMPERATURE X-RAY DIFFRACTION DATA E. A. Payzant, S.R. Agnew HIGH TEMPERATURE X-RAY POWDER DIFFRACTION STUDY OF PHASE TRANSFORMATIONS IN SrZrO3 E. A. Payzant, B.C. Chakoumakos EXCLUDED VOLUME INTERACTIONS BETWEEN CORONAL CHAINS IN BLOCK COPOLYMER MICELLES: A SANS AND SIMULATION STUDY J.S. Pedersen, C. Svaneborg, M.C. Gerstenberg, K. Almdal, I.W. Hamley, R.N. Young TRACE ELEMENT ANALYSIS OF NB AND RARE EARTH ELEMENTS INMETAL ALLOYS: COMPARISON OF SR-TXRF WITH SR-XRF ON THIN FILMS (AP1TM). G. Pepponi, P. Wobrauschek, C. Streli, C. Jokubonis, F. Hegedüs , P. Winkler,G. Falkenberg  TXRF-XANES TRACE ANALYSIS OF ORGANIC AND LOW Z COMPOUNDS ON SI WAFER SURFACES EXCITED BY MONOCHROMATISED UNDULATOR RADIATION G. Pepponi , B. Beckhoff , G.Ulm , R. Fliegauf , J. Weser , T. Ehmann  MICRO-STRAIN IN Y0.5R0.5Ba2Cu3O7-x (R=Yb, Tm, Er, Ho, Dy, Gd, Eu, Sm, AND Nd) E.J. Peterson, W.L. Hults, M. Simpson, J.L. Smith SYNCHROTRON RADIATION TXRF: NEW RESULTS P. Pianetta, K. Baur, S. Brennan, A. Singh DEVELOPMENT OF MgO CERAMIC STANDARDS FOR X-RAY AND NEUTRON LINE BROADENING ASSESSMENTS S. Pratapa, B. O'Connor THE CHANGING YEARS P. Predecki Q R DISCOVERY OF LIGHT EMISSION FROM XRF SOURCES M.A.P. Rao A STUDY OF TWINNING EVOLUTION IN ZIRCONIUM BY NEUTRON DIFFRACTION AND POLYCRYSTALLINE MODELING P. Rangaswamy, D.W. Brown, G.C. Kaschner, C. Tome, M.A.M. Bourke, M.G. Stout DHS 900 DOMED HOT STAGE - HEATING ATTACHMENT FOR FOUR-CIRCLE GONIOMETERS R. Resel, E. Tamas, J. Keckes, P. Hofbauer CHARACTERIZATION OF MINIATURE LOW-POWER X-RAY TUBES A. Reyes-Mena, D. C. Turner, S. Voronov, S. Cornaby, P. Moody, L. V. Knight RIETVELD REFINEMENT OF LiCoO2-TYPE LAYERED STRUCTURES: SEMI-QUANTITATIVE ANALYSIS OF Li CONTENTS M.A. Rodriguez, D. Ingersoll, D. H. Doughty INVESTIGATION OF THE INFLUENCE OF PARTICLE SIZE ON THE QUANTITATIVE ANALYSIS OF GLASSES BY ENERGY-DISPERSIVE MICRO X-RAY FLUORESCENCE SPECTROMETRY T. C. Roedel, H. Bronk, M. Haschke ACCURACY AND TRACEABILITY IN X-RAY FLUORESCENCE MEASUREMENTS V. Roessiger, H. Fischer, M. Haller S A XRF METHOD BASED ON SELECTIVE EXCITATION AND INTEGRAL COUNTING OF THE SAMPLE EMISSION PHOTON  R.F. Saavedra X-RAY STRESS MEASUREMENT OF SURFACE THIN LAYER BY MEANS OF EVANESCENT WAVE WITH IN-PLANE DIFFRACTION T. Sasaki, I. Tobita, K. Omote, Y. Hirose TOTAL REFLECTION X-RAY FLUORESCENCE FOR ENVIRONMENTAL SAMPLES M. Schmeling X-RAY SCATTERING STUDIES OF THE EARLY STAGES OF CRYSTALLIZATION IN POLYMER FIBERS J. M. Schultz ELECTRON BACKSCATTER DIFFRACTION A.J. Schwartz, J.R. Michael NON-DESTRUCTIVE ANALYSIS OF COMPLEX LAYER STRUCTURES USING MICRO X-RAY FLUORESCENCE B. Scruggs, M. Haschke, A. Wittkopp DEVELOPMENT OF ACCELERATOR -BASED X-RAY FLUORESCENCE FOR LARGE SAMPLE ASSAY F. A. Selim, D.P. Wells, F. J. Harmon, W. Scates, J. Kwofie, R. Spaulding, S.P. Duttagupta, J.L. Jones, T. White, T. Roney GRAZING INCIDENCE X-RAY DIFFRACTION STUDY OF LOW CARBON STEEL CORROSION INDUCED BY CARBON DIOXIDE S. Sembiring, B. O'Connor, A. van Riess DETERMINATION OF EMITTER PARAMETERS IN GaInP/GaAs HETEROJUNCTION BIPOLAR TRANSISTORS BY X-RAY DIFFRACTION A. Shen, E. Griswold, G. Hillier, L. Dang, D. Clark, I. Calder MATRIX-INDEPENDENT XRF METHODS FOR CERTIFICATION OF STANDARD REFERENCE MATERIALS J. R. Sieber RIETVELD REFINEMENT ANALYSIS OF EMD XRD POWDER PATTERNS AND A STRUCTURAL INTERPRETATION D.E. Simon, T. Andersen, C.D. Elliott HIGH TEMPERATURE X-RAY DIFFRACTION STUDIES DURING HYDRIDING OF Zr2Fe J. Smith, D. Chandra, J. R. Wermer, E.A. Payzant THE ID18F MICROPROBE ENDSTATION AT THE EUROPEAN SYNCHROTRON RADIATION FACILITY (ESRF) A. Somogyi, M. Drakopoulos, L. Vincze, B. Vekemans, M. Kocsis, A. Snigirev,  F. Adams TXRF TO MONITOR FOR HIGH K DIELECTRIC MATERIAL CONTAMINATION IN A SEMICONDUCTOR FAB C. Sparks USE OF IN-SITU XRD TO DEVELOP CONDUCTING CERAMICS WITH THE AURIVILLIUS CRYSTAL STRUCTURE S.A. Speakman, M.S. Haluska, V.B. Modi, S.T. Misture FATIGUE CRACKS IN ALUMINUM SAMPLES STUDIED WITH X-RAY PHASE CONTRAST IMAGING AND WITH ABSORPTION MICROTOMOGRAPHY S.R. Stock, K. Ignatiev, G.R. Davies, J.C. Elliott, K. Fezzaa, W.-K. Lee MINERAL PHASE MICROSTRUCTURE IN TEETH OF THE SHORT SPINED SEA URCHIN (Lytechinus variegatus) STUDIED WITH X-RAY PHASE CONTRAST IMAGING AND WITH ABSORPTION MICROTOMOGRAPHY S.R. Stock, Thomas Dahl, Joseph Barss, Arthur Veis, K. Fezzaa, W.-K. Lee SULFATE ATTACK OF PORTLAND CEMENT S.R. Stock, K. Ignatiev, A.P. Wilkinson, N. Naik, K.E. Kurtis X-RAY MICROTOMOGRAPHY OF NEONATAL MOUSE BONE S.R. Stock, K. Igarashi, P.H. Stern STRUCTURE DETERMINATION OF [(h4-cod)Pt(N3)2)] FROM X-RAY POWDER DIFFRACTION DATA F.Stowasser, N. Oberbeckmann, M. Winter, K. Merz, R.A. Fischer  A WINDOWLESS SI ANODE X-RAY TUBE FOR THE EFFICIENT EXCITATION OF LOW Z ELEMENTS ON SI WAFER SURFACES WITH TXRF C. Streli, P. Wobrauschek, K. Proksch, S. Pahlke, L. Fabry  QUANTIFICATION OF CADMIUM, MERCURY AND LEAD IN AQUEOUS SAMPLE BY ENERGY K X-RAY FLUORESCENCE SPECTROSCOPY P. Suwanathada, T.A. DeVol LOCAL STRESS MEASUREMENTS OF SINGLE CRYSTAL USING SYNCHROTRON RADIATION H. Suzuki, K. Akita, Y. Yoshioka,  H. Misawa DAMAGE EVOLUTION IN Ti-SiC UNIDIRECTIONAL FIBER COMPOSITES G. A. Swift, J.C. Hanan, E. Üstündag1, I. J. Beyerlein, B. Clausen, J. Almer, U. Lienert, D. Haeffner QUANTITATIVE CHARACTERIZATION OF ELECTROSORPTION OF CR SPECIES ON POLYCRYSTALLINE GOLD WITH X-RAY SPECTROMETRY I. Szalóki, K. Varga, R. Van Grieken T THE INNOVATED OF IN-LABORATORY XAFS APPARATUS T. Taguchi, J. Harada, K. Tohji, K. Shinoda HIGH RESOLUTION POWDER DIFFRACTOMETER INSTALLED ON SPring-8 M. Takataa, E. Nishiboria, K. Katoa, Y. Kubotab, Y. Kuroiwac, M. Sakataa VARIABLE ENERGY X-RAY REFLECTIVITY AND REFLECTION ABSORPTION FINE STRUCTURE B.K. Tanner, T.P.A. Hase, B.D. Fulthorpe, G.M. Luo, Z.H. Mai, C.H. Marrows, B.J. Hickey FROM ABATTOIR TO THE LONDON STOCK MARKET B. Tanner, N. Loxley, K. Bowen, N. Price, D. Hall,  C. Honeybourne HIGH-RESOLUTION PARALLEL-BEAM POWDER DIFFRACTION MEASUREMENT OF SUB-SURFACE DAMAGE BELOW POLISHED SURFACES OF CERAMICS B.K. Tanner, H.Z. Wu and T.P.A Hase UNFOLDING OF ULTRA-LONG ALKANES BY X-RAY DIFFRACTION A.E. Terry, J.K. Hobbs, T.L. Phillips COMPLEMENTARY X-RAY ANALYSIS OF SPUTTERED MAGNETIC AND MICROELECTRONIC DEVICE RELATED FILM MATERIALS A.A. Tijerina, A.G. Ayala, S. Rios, C.J. Gutierrez ESTIMATION OF ERRORS IN THE MEASUREMENT OF UNIT-CELL  PARAMETERS: STATISTICAL UNCERTAINTIES OF PEAK POSITIONS OF POWDER DIFFRACTION LINES DETERMINED BY INDIVIDUAL PROFILE FITTING H. Toraya U DIFFUSE X-RAY SCATTERING FROM GaAs/AlAs SUPERLATTICES: NEW THEORETICAL APPROACH FOR DATA INTERPRETATION A.Ulyanenkov, I.Feranchuk, A.Minkevich, H.Ress, J.Grenzer  CALCULATION OF ATOMIC SCATTERING AND DEBYE-WALLER FACTORS: STEP TOWARD ACCURATE ESTIMATION FOR X-RAY POLARIZABILITY A. Ulyanenkov, L.I. Komarov, I. Feranchuk  V A DIFFRACTOMETER FOR X-RAY DIFFRACTION STUDIES OF BOND COATS BENEATH THERMAL BARRIER COATINGS K. Vaidyanathan, D. Pease, E. Jordan, H. Canistraro, M. Gell, T. Watkins QUANTITATIVE X-RAY FLUORESCENCE ANALYSIS AT THE ESRF ID18F MICROPROBE B. Vekemans, L. Vincze, A. Somogyi, M. Drakopoulos, L. Kempenaers, A. Snigirev , F. Adams MICRODIFFRACTION ANALYSIS OF FIBROUS TALC: ASBESTOS IN CRAYONS J.R. Verkouteren,.G. Wylie  AUTOMATED PROCESSING OF 2D POWDER DIFFRACTION DATA S. Vogel, L. Ehm, K. Knorr W ANALYSIS OF LEAD IN CANDLE PARTICULATE EMISSIONS BY XRF USING UNIQUANT 4 S. Wasson,  Z. Guo STRUCTURAL AND THERMAL EXPANSION OF Mo-Si COMPOUNDS: THEORY AND EXPERIMENT T. R. Watkins, J. H. Schneibel, C. J. Rawn, C. L. Fu A HISTORICAL REVIEW OF RETAINED AUSTENITE AND ITS MEASUREMENTS BY X-RAY DIFFRACTION W.N. Weins A NEW REGULARIZATION METHOD TO DETERMINE STRAIN/STRESS DEPTH PROFILES FROM DIFFRACTION EXPERIMENTS H. Wern, P. Klein, G. Marchand MICRO X-RAY FLUORESCENCE SPECTROSCOPY FOR QUALITY CONTROL OF LAYERED MATERIAL A. Wittkopp, F.  Ferrandino SR-XRF INVESTIGATION OF HUMAN BONE P. Wobrauschek, G. Pepponi, C. Streli, C. Jokubonis, G. Falkenberg, W. Osterode  QUANTIFICATION OF GALLIUM IN DRIED RESIDUE SAMPLES BY XRF: AN IMPROVED SAMPLE PREPARATION METHOD FOR ANALYZING PLUTONIUM METAL C.G. Worley X Y POLYCAPILLARY OPTICS AND X-RAY ANALYTICAL TECHNIQUES Y.Yan, W.M. Gibson  INFLUENCE OF RE-NITRIDING FOR THERMAL FATIGUE PROPERTIES ON NITRIDED HOT WORK DIE STEEL (H13) K. Yatsushiro, M. Sano, M. Hihara, M. Kuramoto X-RAY FLUORESCENCE AND X-RAY DIFFRACTION IN THE IRON AND STEEL INDUSTRY- CURRENT AND FUTURE DEVELOPMENTS AND APPLICATIONS R. Yellepeddi ADVANCE IN STRESS ANALYSIS TAKING ACCOUNT OF STRESS GRADIENT Y. Yoshioka , K. Akita, Hiroshi Suzuki THE DEVELOPMENT OF THE X-RAY RIETVELD METHOD R. A. Young, R.L. Snyder Z CRYSTAL STRUCTURE OF AgRSb2 (R=Pr, Nd, Gd, Dy, Ho, Er) L. Zeng, X. Xie, H. Franzen SAGITTAL FOCUSING OF HIGH-ENERGY X-RAYS Z. Zhong, D.P. Siddons, C.C. Kao, N. Zhong, J.B. Hastings  CHARACTERIZATION OF NANOMETER LAYERED STRUCTURES USING MULTIPLE WAVELENGTH X-RAY REFLECTIVITY AND SIMULATED ANNEALING DATA ANALYSIS E. Ziegler, C. Ferrero, C. Chapron, C. Morawe For more information please contact Denise Flaherty - flaherty@icdd.com   Download Free Acrobat Reader 2001 DXC Home | Call for Papers | CfP in Adobe PDF Form   Program-at-a-Glance  | Guidelines for Preparing Abstracts