50th Annual (2001) Denver X-ray Conference™
Sheraton Steamboat Resort
Steamboat Springs, Colorado, U.S.A.
30 July – 3 August

2001 Denver X-ray Conference™ > Call for Papers
Steamboat Springs, Colorado, USA - 30th July - 3rd August 2001

Presented Papers
The Organizing Committee considers unprofessional the withdrawal of a paper (except in special circumstances) after it has been accepted and widely advertised. Non-U.S. authors, in particular, please try to secure travel funding and approvals before submitting your abstract(s). Publication of presented papers: In the interest of releasing the conference proceedings, Advances in X-ray Analysis, as early as possible after the conclusion of the conference, we are encouraging authors to submit their manuscripts for publication during the conference at the conference registration desk. If you are unable to bring your manuscript with you at that time, please mail it no later than 7 September 2001 to: Ron Jenkins ICDD 12 Campus Boulevard Newtown Square, PA 19073-3273 U.S.A. 

Note: To be acceptable for publication, papers should describe either new methods, theory and applications, improvements in methods or instrumentation, or other advances in the state of the art. Papers emphasizing commercial aspects are discouraged. Information for preparing manuscripts will be mailed after abstracts have been received.

Contributed Papers
Contributed papers are hereby solicited for any of the special sessions listed or the XRD and XRF general sessions. Many of the contributed papers will be placed in poster sessions, held in conjunction with mixers during the evenings of conference week. Those of more general interest will be placed in oral sessions.



Plenary Session

Special Sessions XRD & XRF | Special Sessions XRD  | Special Sessions XRF

Workshops XRD & XRF | Workshops XRD | Workshops XRF

Poster Session | Jerome B. Cohen Student Award


Plenary Session: Fifty Years of the Denver X-ray Conference  

Organized by:
R. Jenkins, International Centre for Diffraction Data, Newtown Square, PA
J. Gilfrich, Emeritus, SFA, Inc./NRL,Washington, DC
“The Early Years” W. Mueller, Colorado School of Mines, Golden, CO

J. Newkirk, Colorado Sports Equipment, Inc., Evergreen, CO

“The Changing Years” C. Ruud, The Pennsylvania State University, University Park, PA

P.K. Predecki, The University of Denver, Denver, CO

“The Modern Denver Conference” R. Jenkins, International Centre for Diffraction Data, Newtown Square, PA
“Names Behind the Denver Awards:
L.S. Birks J.V. Gilfrich, Emeritus, SFA, Inc./NRL, Washington, DC
C.S. Barrett D. Chandra, The University of Nevada, Reno, NV 
H. F. McMurdie D.K. Smith, The Pennsylvania State University, University Park, PA
J.B. Cohen I.C. Noyan, IBM, Yorktown Heights, NY

Special Sessions

Special Sessions–XRD & XRF 

Synchrotron Applications (Powder Diffraction, Absorption, Grazing Incidence, X-ray Fluorescence)
Organized by:
A.T. Macrander, Argonne National Laboratory, Argonne, IL, 630-252-5672, macrander@aps.anl.gov
“Novel X-ray Diffraction Technique for Strain Measurements Using Area Detector” Y.S. Chu, Argonne National Laboratory, Argonne, IL
“Materials Characterization by Microfocused High Energy X-rays” U. Lienert, Argonne National Laboratory, Argonne, IL
 Electron Beam (Diffraction Imaging, Elemental Imaging, Phase Identification)
Organized by: 
R. Goehner, Sandia National Laboratories, Albuquerque, NM, 505-844-9200, rpgoehn@sandia.gov
“Review of Convergent-Beam Electron Diffraction (CBED)” A. Eades, Lehigh University, Bethlehem, PA
“STEM/SEM X-ray Spectrum Images: Finding the Needle in the Haystack” P. Kotula, Sandia National Laboratories, Albuquerque, NM
“Electron Backscattered Diffraction” A.J. Schwartz, Lawrence Livermore National Laboratory, Livermore, CA
 Microbeam Analysis
Organized by: 
K. Janssens, University of Antwerp (UIA), Antwerp, Belgium, koen@uia.ua.ac.be
“Monocapillary Systems for Quantitative Lab Microdiffraction” D. Balaic, Australian X-ray Capillary Optics Pty Ltd. (AXCO), Parkville, Australia
“Quantitative Analysis Using
Micro X-ray Fluorescence”
G. Havrilla, Los Alamos National Laboratory, Los Alamos, NM
“Desktop X-ray Tomography:
Instrumentation and Applications”
D. Van Dyck, University of Antwerp, Antwerp, Belgium
 New Developments in XRD & XRF Instrumentation (Commercial) (full day)
Organized by:
V.E. Buhrke, The Buhrke Company, Portola Valley, CA 650-851-5020, vbuhrke@aol.com
Abstracts should be submitted by technical representatives of a manufacturer. They should discuss specifications and applications concerning one of their newest and most important products. Talks should include comments about software, XRD and XRF equipment, and accessories. No mention of prices or a comparison with competitors’ products can be included.

Special Sessions–XRD

Polymers (1 1/2 Days)
Organized by:
R. Barton, Jr., DuPont Experimental Station,Wilmington, DE, 302-695-2578, randolph.barton-jr@usa.dupont.com

K.H. Gardner, DuPont Company–CRD, Wilmington, DE, 302-695-2408, kenn.h.gardner@usa.dupont.com

Polymer Structure: In Situ Structure Development
“Recent Work on Strain-Induced
J.A. Kornfield, California Institute of Technology, Pasadena, CA
“Application of Synchrotron Radiation in the Studies of Uniaxial and Biaxial Deformation of Polymers” A. Mahendrasingam, Keele University, Staffordshire, United Kingdom
“X-ray Scattering Studies of the Early Stages of Crystallization in Polymer Fibers” J.M. Schultz, University of Delaware,Newark, DE
Polymer Structure: Multi-Probe Studies
“Double-Twisted Helical Lamellar Crystals in a Synthetic Main-Chain Chiral Polyester Determined Using Diffraction Methods” S.Z.D. Cheng, The University of Akron, Akron, OH
“Emergence of Polymer Properties in Polydisperse Chain Assemblies—The Structural Distinction Between Low Molecular Weight Linear Polyethylene and Petroleum Waxes Revealed by Electron Crystallography” D.L. Dorset, ExxonMobil Research and Engineering Company, Annandale, NJ
“Electron Diffraction Characterization of Nascent Condensation Polymers” P.H. Geil, University of Illinois, Urbana, IL
Polymer Structure: 2D WAXS and SAXS Data Analysis
“Full-Pattern Parameterization of 2-D Small-Angle Scattering Data from Oriented Polymers and the Significance of these Parameters” N.S. Murthy, Honeywell Laboratories, Morristown, NJ
 Industrial Applications
Organized by:
F. Chung, Consultant, The Marson Corporation, Boston, MA, 630-427-1525, fchung1025@aol.com

Co-chair: D.K. Smith, Emeritus, The Pennsylvania State University, University Park, PA

“Non-Traditional Powder Crystallography in Petrochemical Industry” J.A. Kaduk, BP-Amoco Corporation, Naperville, IL
“X-ray Diffraction in Microelectronics Industry” I.C. Noyan, IBM,Yorktown Heights, NY
 High Resolution XRD
Organized by:
J. Harada, Rigaku Corporation,Tokyo, Japan, harada@rigaku.co.jp

Co-chair: T.C. Huang, Emeritus, IBM Almaden Research Center, San Jose, CA

“High Resolution Powder Diffractometer Installed on SPring-8” M.Takata, Nagoya University, Nagoya, Japan
 Stress Analysis
Organized by:
C.C. Goldsmith, IBM Microelectronics, Hopewell Junction, NY, 914-894-3683, cgoldsmi@us.ibm.com
“Techniques for Determining
X-ray Elastic Constants”
I.C. Noyan, IBM,Yorktown Heights, NY
 R.A. Young Rietveld Analysis
Organized by:
S.R. Stock, Georgia Institute of Technology, Atlanta, GA,404-894-2846, stuart.stock@mse.gatech.edu

R.L. Snyder, The Ohio State University, Columbus, OH, 614-292-6255, snyder.355@osu.edu

“Rietveld Refinement” R.A. Young, Professor Emeritus, Georgia Institute of Technology Atlanta, GA
“Apatite Structures” J.C. Elliott, Queen Mary and Westfield College,
London, United Kingdom
 General Optics
Organized by:
C.-C. Kao, Brookhaven National Laboratory, NSLS, Upton, NY, 631-344-4494, kao@bnl.gov

D. Haeffner, Argonne National Laboratory, Argonne, IL, 630-252-0126, haeffner@aps.anl.gov

“X-ray Optics for a 3-D X-ray Crystal Microscope: Submicron Polychromatic Diffraction from Polycrystalline Materials” G. Ice, Oak Ridge National Laboratory, Oak Ridge, TN
“X-ray Phase Contrast Imaging” W.-K. Lee, Argonne National Laboratory, Argonne, IL
“Sagittal Focusing of High-Energy X-rays” Z. Zhong, Brookhaven National Laboratory, NSLS,
Upton, NY
 Pharmaceuticals & Combinatorial
Organized by:
C. Kidd, Glaxo Wellcome, Research Triangle Park, NC, wck34565@glaxowellcome.com
“Searching for New Polymorphs by Parallel Crystallization and High-Throughput X-ray Diffraction Screening” C.W. Lehmann, Max-Planck-Institut fuer Kohlenforschung, Muelheim, Germany

Special Sessions - XRF

Industrial Applications
Organized by:
D. Broton, Construction Technology Labs, Skokie, IL 847-965-7500, dbroton@c-t-l.com
“High Frequency On-line XRF Analysis for Raw Feed Control in Cement Plants” J. Kemmerer, F.L. Smidth, FLS Automation, Hunt Valley, MD
“XRF and XRD Applications in
Iron and Steel Industry”
R. Yellepeddi, ARL SA, Ecublens, Switzerland
Organized by
M.A. Zaitz, IBM Microelectronics, Hopewell Junction, NY, 914-894-6337, zaitz@us.ibm.com
“TXRF for Semiconductor Applications” Y. Mori, Nippon Steel Corporation Advance Technology Research Lab, Yamaguchi, Japan
“TXRF for Environmental Studies” M. Schmeling, Loyola University Chicago, Chicago, IL
 Capillary Optics
Organized by:
G.J. Havrilla, Los Alamos National Laboratory, Los Alamos, NM, 505-667-9627, havrilla@lanl.gov
“Polycapillary Optics:An Enabling Technology for New Applications” D. Gibson, X-ray Optical Systems, Albany, NY
“Poly-capillary Based Micro-XRF and Micro-XANES by Means of Conventional and Synchrotron Radiation” K. Janssens, University of Antwerp (UIA),
Antwerp, Belgium
“X-Ray Fluorescence Microanalysis of Biomedical and Environmental Samples” M. Lankosz, University of Mining and Metallurgy, Krakow, Poland
 John Criss Commemorative Session Quantitative XRF
Organized by:
R. van Grieken, University of Antwerp, Antwerp, Belgium, vgrieken@uia.ua.ac.be

Co-Chair - J.V. Gilfrich, Emeritus, SFA, Inc./NRL, Washington D.C. 

"An Overview of the Application of Fundamental Parameters in XRF" B. Vrebos, Philips Analytical, Almelo, The Netherlands
"Matrix-Independent XRF Methods for Certification of Standard Reference Materials" J. Sieber, National Institute of Standards & Technology, Gaithersburg, MD


XRD & XRF Workshops

Use of the Web as a Resource Organized by:
M. Kottenhahn, International Centre for Diffraction Data, Newtown Square, PA, kottenhahn@icdd.com
Cement Analysis Organized by:
D. Broton, Construction Technology Labs, Skokie, IL, dbroton@c-t-l.com
Absorption Analysis Organized by:
H.D. Rosenfeld, DuPont Company–CRD, Wilmington, DE, h-david.rosenfeld@usa.dupont.com

XRD Workshops

Small Angle Scattering
Organized by:
J.D. Londono, DuPont Company–CRD, Wilmington, DE, j-david.londono@usa.dupont.com
Two-Dimensional XRD

Organized by:
T. Blanton, Eastman Kodak Company, Rochester, NY, tblanton@icdd.com

B.B. He, Bruker AXS, Inc., Madison,WI,

Maintenance, Alignment & Standards Organized by:
I.C. Noyan, IBM,Yorktown Heights, NY,
Neutron Diffraction of Polymers Organized by:
K.H. Gardner, DuPont Company–CRD, Wilmington, DE, kenn.h.gardner@usa.dupont.com
High Resolution XRD Organized by:
B.K.Tanner, University of Durham, Durham, United Kingdom, b.k.tanner@durham.ac.uk
Industrial Rietveld Applications Organized by:
R.W. Morton, Phillips Petroleum Company, Bartlesville, OK, rwmorto@ppco.com   

D.E. Simon, DES Consulting, Broken Arrow, OK, DESConsulting@att.net

XRF Workshops

Specimen Preparation (full day) Organized by:
D. Broton, Construction Technology Labs, Skokie, IL, dbroton@c-t-l.com
Total Reflection (set-up procedures)
Organized by:
M.A. Zaitz, IBM Microelectronics, Hopewell Junction, NY, zaitz@us.ibm.com

P. Wobrauschek, Atominstitut der Österreichischen Universitäten, Vienna, Austria, wobi@ati.ac.at

Introduction to XRF Organized by:
J. Croke, Philips Analytical, Inc. (retired), Mahwah, NJ, johncroke@aol.com

R. Jenkins, International Centre for Diffraction Data, Newtown Square, PA, jenkins@icdd.com

Maintenance, Alignment & Troubleshooting
Organized by:
J. Croke, Philips Analytical, Inc. (retired), Mahwah, NJ, johncroke@aol.com

R. Jenkins, International Centre for Diffraction Data, Newtown Square, PA, jenkins@icdd.com

Fundamental Parameters Organized by:
M. Mantler, Vienna University of Technology, Vienna, Austria, mmantler@xrm.atp.tuwien.ac.at


50th Anniversary Poster Session

A special area will be reserved at the Sheraton Steamboat Resort for a 50th Anniversary Poster Session. The poster session will be held Thursday evening of conference week, during the ICDD-sponsored anniversary celebration party. All attendees are invited to submit an abstract for poster presentation. Suggestions for poster themes include a historical moment in the field of X-ray analysis, advancement of a theory, instrument development, timelines, memories and experiences from past Denver X-ray Conferences. Of course, the session is open for all of your creative ideas and a prize will be given to the best poster. So dig up your old pictures, pull out your old books and get ready to take a walk down memory lane!

Abstract submissions for the 50th Anniversary Poster session will follow the same guidelines as other abstract submissions. Please read the guidelines for preparing abstracts, and please note on the information page that the abstract is being submitted for the 50th Anniversary Poster Session.

Jerome B. Cohen Student Award
For Best Student Paper at the Denver X-ray Conference

This award, instituted in the memory of Professor Jerome B. Cohen, one of the leaders in the field of X-ray analysis and in the training of students in this art, is intended to recognize the outstanding achievements of student research in this field. All students, graduate or undergraduate, who are working in any aspect of X-ray analysis, can submit their work. The research must be original, of high quality and must be primarily the work of the student.

The papers submitted for this competition must be received in electronic form by 1 July 2001 in final publication form. The winner will be selected by a committee of researchers in the field, and announced at the Plenary Session of the conference and listed in the proceedings. The award for the year 2001 will be in the amount of $1,000. Students interested in participating in this year’s competition must submit their papers and a certification form to dxc@icdd.com by the due date. The certification form can be obtained here.

For more information please contact Denise Zulli - zulli@icdd.com