2001 Denver X-ray Conference™ > Monday Workshops
Steamboat Springs, Colorado, USA - 30th July - 3rd August 2001Workshops, Monday a.m.
XRD & XRF
W-1 AN IN-DEPTH LOOK AT CEMENT ANALYSIS (Twilight)
Organizers & Instructors:
D. Broton, Construction Technology Labs, Skokie, IL
J. Anzelmo, Bruker AXS, Inc., Madison, WIThis workshop will cover:
1. Raw materials analysis (limestone, clay, gypsum, coal)
2. Clinker & cement analysis, pressed vs. fused
3. Free lime in cement and clinker
4. QXRD for phase composition
5. Reitveld vs. selective dissolutionXRD
W-2 SMALL ANGLE SCATTERING (Rainbow)
Organized by:
J.D. Londono, DuPont Company – CRD, Wilmington, DEInstructors:
B. Crist, Northwestern University, Evanston, IL
R.P. Hjelm, Los Alamos National Laboratory, Los Alamos, NM
J.S. Pedersen, University of Aarhus, Aarhus, DenmarkThe purpose of the workshop is to attract new people to the field—particularly those that may be wondering
whether this is a useful technique for their application. The format will be tutorial in nature. In addition, the workshop aims to provide a sufficiently broad overview of the field so that experienced users will find it useful to
identify new opportunities. It will be divided into three parts: 1) Instrumentation and resolution effects, 2) the information hidden in small-angle curves and how to extract it, and 3) the impact of small-angle in biology, materials science, metallurgy and polymer and colloid physics. We are lucky to have three very experienced instructors. They are also very different in their approach and experience, contributing to the broad focus of the workshop.XRF
W-3 AN INTRODUCTION TO X-RAY FLUORESCENCE (Sunshine Peak)
Organizers & Instructors:
R. Jenkins, Emeritus, International Centre for Diffraction Data, Newtown Square, PA
J. Croke, Emeritus, Philips Analytical, Natick, MAThis workshop is intended for beginners and those fairly new to the field of X-ray fluorescence analysis. We
will describe the principles behind the technique and describe the basics of X-ray spectra, and absorption effects. We will describe briefly the types of instrumentation used in the field and compare and contrast the features of wavelength and energy dispersive spectrometers. The use of both techniques for qualitative analysis will be covered. We will then briefly cover specimen preparation methods and then introduce the basic concepts behind quantitative analysis.
W-4 TOTAL REFLECTION (set-up procedures) (Buddy’s Run)
Organized by:
M.A. Zaitz, IBM Microelectronics, Hopewell Junction, NY
P. Wobrauschek, Atominstitut der Österreichischen Universitäten, Vienna, AustriaInstructors:
M.A. Zaitz, IBM Microelectronics, Hopewell Junction, NY
P. Wobrauschek, C. Streli, Atominstitut der Österreichischen Universitäten, Vienna, Austria
B. Holyñska, University of Mining and Metallurgy, Krakow, PolandThis workshop will cover the basics of total reflection X-ray fluorescence, as well as instrumentation, calibration,
and applications.Workshops, Monday p.m.
XRD & XRF
W-5 X-RAY ABSORPTION SPECTROSCOPY: PUTTING IT TO WORK
FOR MATERIALS CHARACTERIZATION (Rainbow)
Organized by:
H.D. Rosenfeld, DuPont Experimental Station, Wilmington, DEInstructors:
H.D. Rosenfeld, DuPont Experimental Station, Wilmington, DE
B. Ravel, U.S. Naval Research Laboratory, Washington, DC
M. Newville, Argonne National Laboratory, Argonne, ILX-ray absorption spectroscopy (XAS) analysis can often provide materials characterization where conventional
diffraction analysis cannot. Such cases include samples with small coherent domain size, or low concentration
of the phase of interest in a multiphase sample, or both (as is often the case with catalysts). Often
XAS can differentiate phases with difficult to distinguish structure factors, such as Co3O4 and CoAl2O4. XAS
can also yield information that diffraction analysis alone cannot, such as electronic structure or oxidation state.
If you’ve been faced with these types of materials characterization problems, XAS might be just what you’re
looking for. In this workshop, we will present practical examples that will show you explicitly how to put XAS
to work for you in your materials characterization problems, in language anyone experienced in X-ray diffraction
can understand. Each example will show aspects of the following: Is XAS the right technique for this
problem; How do I prepare my samples?; How do I collect good data?; How do I analyze my data to get the
answers I need? While we can’t make you an X-ray spectroscopy expert in two hours, we can give you enough
information to perform and analyze some simple, yet powerful, experiments. This workshop will provide you
the opportunity to add a very useful, complimentary technique to your materials characterization toolbox.
W-6 USE OF THE WEB AS A RESOURCE (Buddy’s Run)
Organizer & Instructor:
M. Kottenhahn, International Centre for Diffraction Data, Newtown Square, PAThis workshop will focus on concepts of mining the web for information using search engines, search indexes,
and other resources. Getting 754,710 hits when you put “X-ray” into your search engine? Do you know how to
find items in the “Invisible Web”? Find out how to extract what you want and evaluate the found information.
Learn search engine optimization strategies so your web site can be found easily. An overview of X-ray related
web sites will be presented.XRF
W-7 MAINTENANCE AND CALIBRATION OF X-RAY FLUORESCENCE SPECTROMETERS (Sunshine Peak)
Organized by:
R. Jenkins, Emeritus, International Centre for Diffraction Data, Newtown Square, PA
J. Croke, Emeritus, Philips Analytical, Natick, MAInstructors:
S. Williams, J. Ombres, Philips Analytical, Natick, MA
A. Sanborg, EDAX International, Mahwah, NJThis workshop is intended for beginners and those fairly new to the field of X-ray fluorescence analysis. We
will describe the need for careful maintenance of X-ray instruments with special emphasis on X-ray tubes,
detectors, and specimen handling components. We will discuss the basic techniques of instrument calibration
and the maintenance of the integrity of a given calibration setup.W-8 FUNDAMENTAL PARAMETERS (Twilight)
Organized by:
M. Mantler, Vienna University of Technology, Vienna, AustriaInstructors:
M. Mantler, Vienna University of Technology, Vienna, Austria
B. Vrebos, Philips Analytical, Almelo, The Netherlands
W.T. Elam, University of Washington, Seattle, WAThis workshop will cover:
1. Atomic (“fundamental”) parameters and tube spectra: definitions, sources (tables, available data files,
computed data and related algorithms), accuracy.
2. Theoretical background: physical-mathematical models for primary and secondary excitation, Coster-
Kronig transitions, conventional equations and Monte-Carlo methods.
3. Software issues: technical aspects, availability.
4. Fundamental parameters and computed influence coefficients.
5. Thin films, inhomogeneous specimens, light elements.
6. Practical applications.For more information please contact Denise Flaherty - flaherty@icdd.com
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