50th Annual (2001) Denver X-ray Conference™
Sheraton Steamboat Resort
Steamboat Springs, Colorado, U.S.A.
30 July – 3 August

2001 Denver X-ray Conference™ > Tuesday Workshops
Steamboat Springs, Colorado, USA - 30th July - 3rd August 2001

Workshops, Tuesday a.m.

XRD

W-9 INDUSTRIAL RIETVELD APPLICATIONS (Sunshine Peak)
Organizers & Instructors: 
R.W. Morton, Phillips Petroleum Company, Bartlesville, OK, rwmorto@ppco.com
D.E. Simon, DES Consulting, Broken Arrow, OK, DESConsulting@att.net

The workshop will be a series of presentations about Rietveld refinement modeling applied to routine X-ray
diffraction evaluations in industrial settings. Topics include instrument parameters, quantitative analysis
techniques, phase filtering techniques, modeling amorphous components and QA/QC applications.
Recipients are encouraged to send problems to the instructors by 31 May 2001 for possible inclusion in the
workshop.

W-10 TWO-DIMENSIONAL XRD (Twilight)
Organized by: 
B.B. He, Bruker AXS, Inc., Madison, WI
T.N. Blanton, Eastman Kodak Company, Rochester, NY

Instructors: 
B.B. He, Bruker AXS, Inc., Madison, WI
T.N. Blanton, Eastman Kodak Company, Rochester, NY
U. Preckwinkel, Bruker AXS, Inc., Madison, WI
G.A. Stephenson, Eli Lilly and Company, Lilly Research Lab, Indianapolis, IN

This workshop will cover the basic concept and recent progress in two-dimensional X-ray diffraction. Because
of the unique nature of the data collected with a 2D detector, new concepts and approaches are necessary to
configure the two-dimensional diffraction system and to understand and analyze two-dimensional diffraction
data for various applications, such as phase ID, texture, stress, crystallinity, and thin film analysis.

W-11 NEUTRON DIFFRACTION OF POLYMERS (Rainbow)
Organized by: 
K.H. Gardner, DuPont Company – CRD, Willmington, DE

Instructors: 
T. Forsyth, Institut Laue Langevin, Grenoble, France
P. Langan, Los Alamos National Laboratory, Los Alamos, NM

This workshop will present the opportunities for structural studies of polymer systems by neutron diffraction.
With the aid of relevant examples from biological and synthetic polymer systems, it will describe the
unique complementarity that exists between X-ray and neutron methods. It will also describe the instrumentation
that is available for neutron work as well as a number of major developments that are on the horizon.

XRF

W-12 XRF SPECIMEN PREPARATION I (Buddy’s Run)
Organized by:
D. Broton, Construction Technology Labs, Skokie, IL
J. Anzelmo, Bruker AXS, Inc., Madison, WI

Instructors: 
D. Broton, Construction Technology Labs, Skokie, IL
J. Anzelmo, Bruker AXS, Inc., Madison, WI
S. Nettles, Construction Technology Labs, Skokie, IL
L. Creasey, TIMET, Morgantown, PA
J. Blanchette, Corporation Scientifique Claisse, Quebec, Canada

This workshop will cover:
1. Sampling, crushing, grinding
2. Preparing pressed powders
3. Borate fusions
4. Metals
5. Advances in fusion technology
6. Panel discussion (all speakers)

Workshops, Tuesday p.m.

XRD

W-13 MAINTENANCE, ALIGNMENT & STANDARDS (Sunshine Peak)
Organized by: 
I.C. Noyan, IBM, Yorktown Heights, NY
C.C. Goldsmith, IBM Microelectronics, Hopewell Junction, NY

Instructors: 
R.D. England, Cummins Engine Company, Inc., Columbus, IN
T.R. Watkins, Oak Ridge National Laboratory, Oak Ridge, TN
J.P. Cline, National Institute of Standards & Technology, Gaithersburg, MD

This workshop is designed to teach experimenters about the alignment of modern diffractometers, the use of
standards for verification of alignment, and tips on practical use. Specifically, we will be addressing the
question of what one should check if one is using a “reportedly ready” machine for the first time and what
periodic checks should be carried out to verify that the machine is in demonstrably top condition. We will
also discuss standards used for alignment, with particular emphasis on the suitability of particular standards
for particular tasks.

W-14 HIGH RESOLUTION XRD (Twilight)
Organized by: 
B.K. Tanner, University of Durham, Durham, United Kingdom

Instructors: 
B.K. Tanner, University of Durham, Durham, United Kingdom
M. Goorsky, University of California, Los Angeles, CA

The workshop will provide both a basic grounding in the techniques of high-resolution X-ray diffraction and
topography, and a perspective on the current state of application of the methods in an industrial context.
Particular attention will be paid to the qualitative interpretation of data taken in the triple axis geometry
where the X-ray scattering is mapped in reciprocal space.

XRF

W-15 XRF SPECIMEN PREPARATION II (Buddy’s Run)
Organizers: 
D. Broton, Construction Technology Labs, Skokie, IL
J. Anzelmo, Bruker AXS, Inc., Madison, WI

Instructors: 
D. Broton, Construction Technology Labs, Skokie, IL
J. Anzelmo, Bruker AXS, Inc., Madison, WI
S. Nettles, Construction Technology Labs, Skokie, IL
L. Creasey, TIMET, Morgantown, PA
J. Blanchette, Corporation Scientifique Claisse, Quebec, Canada

Continuation of W-12.

For more information please contact Denise Zulli - zulli@icdd.com