The 2002 Denver X-ray Conference
Antlers Adam's Mark Hotel
(formerly Antlers Doubletree Hotel)
Colorado Springs, Colorado, U.S.A.
29th July - 2nd August 2002
The 2002 Denver X-ray Conference was a great
success.
Please read the Conference Summary
DXC 2002 Program in PDF Format
Monday and Tuesday Workshops
Monday- Wednesday Poster Sessions
Wednesday - Friday Sessions
Evening Events
Exhibitor Information
Call for Papers - Call for Papers in PDF Form
Hotel Information
Travel and Directions
Travel Registration Form - PDF
format
Local Attractions
Map 1, Map
2, Hotel Layout
Abstract Information
View list of Abstracts - Search
Abstracts
AT A GLANCE Sun. eve.: 5:30-7:30 Welcoming Reception Sponsored by: Bede Scientific, SPEX CertiPrep and Claisse Scientifique (Summit) |
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| Day & Time | XRD & XRF | XRD | XRF |
| MON. am: Workshops |
W-1 Texture Analysis I Schaeben (Learning Center) W-2 Methods of Phase ID Jenkins, Faber, Fawcett (Carson) |
W-3 Fundamentals of XRF Gilfrich/Croke (Summit I & II) W-4 Layered Materials Dirken (Fremont) |
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| MON. pm: Workshops |
W-5 Texture Analysis II Schaeben (Learning Center) W-6 Advances in DB Technology Faber (Carson) |
W-7 Specimen Preparation I Broton (Summit I & II) W-8 Polarized X-ray Optics Chappell (Summit III) |
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| Mon. eve.: 6:30-8:30
Philips Analytical Reception and XRD Poster Session I. Sponsored by:
Philips Analytical (Noyan/Rendle) (Summit) |
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| TUE. am: Workshops |
W-9 Optics Havrilla/Al-Mosheky (Carson) |
W-10 Rietveld Applications I Kaduk (Summit III) |
W-11 Specimen Preparation II Broton (Summit I & II) W-12 Mathematical Methods Mantler (Fremont) |
| TUE. pm: Workshops |
W-13 Rietveld Applications II Kaduk (Summit III) W-14 Line Broadening Makinson (Carson) |
W-15 Quantitative Analysis – Standardless Methods Anzelmo (Summit I & II) W-16 TXRF Zaitz (Learning Center) |
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| Tue. eve.: 6:30-8:30
MDI and Rigaku/MSC, Inc. Reception and XRD Poster Session II. Sponsored
by: MDI and Rigaku/MSC, Inc. (Huang/Barton) (Summit) |
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| Wed. am: 8:30-12:30
Plenary Session: “Applications of X-ray Analysis to Forensic Materials” (Rendle/Jenkins) (Summit III) |
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| WED. pm: Sessions |
C-1 New Developments in XRD & XRF Instrumentation Buhrke (Carson) C-2 Synchrotron Applications I Lavoie/Ludwig (Summit II) |
D-1 Rietveld Applications I Kaduk (Fremont) D-2 Thin Films Huang (Summit I) |
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| Wed. eve: 6:30 –
8:30 Bruker AXS, Inc. Reception and XRF Poster Session. Sponsored by:
Bruker AXS, Inc. (Zaitz/Taniguchi) (Summit) |
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| THURS. am: Sessions |
C-3 Synchrotron Applications II Lavoie/Ludwig (Summit II) |
D-3 Rietveld Applications II Kaduk (Fremont) D-4 Industrial Applications of XRD I Snyder/Hubbard (Summit III) |
F-1 Quantitative XRF Gilfrich/Vrebos (Summit I) |
| THURS. pm: Sessions |
C-4 Microbeam Analysis Havrilla (Summit II) |
D-5 Industrial Applications of XRD II Snyder/Hubbard (Summit III) D-6 Neutron Diffraction Üstündag/Bourke (Fremont) |
F-2 Polarized X-ray Optics Chappell/Ryon (Summit I) |
| FRI. am: Sessions |
C-5 X-ray Optics Gao/Havrilla (Summit II) |
D-7 Stress Analysis Goldsmith (Fremont) |
F-3 Problem Solving/Industrial Applications of XRF Broton (Summit I) |