2002 Denver X-ray Conference > At-A Glance 2002 DXC - Quick Links Choose One DXC 2002 Home DXC 2002 At-a-Glance Monday Workshops Tuesday Workshops Monday Poster Tuesday Poster Wednesday Poster Wednesday Plenary Wednesday Sessions Thursday Sessions Friday Sessions Dates to Remember Hotel Information Find a Roommate Presented Papers Contributed Papers Jerome B. Cohen Student Award DXC Main Home Sun. eve.: 5:30-7:30 Welcoming Reception Sponsored by: Bede Scientific, SPEX CertiPrep and Claisse Scientifique (Summit) Day & Time XRD & XRF XRD XRF MON. am: Workshops   W-1 Texture Analysis I Schaeben (Learning Center) W-2 Methods of Phase ID Jenkins, Faber, Fawcett (Carson) W-3 Fundamentals of XRF Gilfrich/Croke (Summit I & II) W-4 Layered Materials Dirken (Fremont) MON. pm: Workshops   W-5 Texture Analysis II Schaeben (Learning Center) W-6 Advances in DB Technology Faber (Carson) W-7 Specimen Preparation I Broton (Summit I & II) W-8 Polarized X-ray Optics Chappell (Summit III) Mon. eve.: 6:30-8:30 Philips Analytical Reception and XRD Poster Session I. Sponsored by: Philips Analytical (Noyan/Rendle) (Summit) TUE. am: Workshops W-9 Optics Havrilla/Al-Mosheky (Carson) W-10 Rietveld Applications I Kaduk (Summit III) W-11 Specimen Preparation II Broton (Summit I & II) W-12 Mathematical Methods Mantler (Fremont) TUE. pm: Workshops   W-13 Rietveld Applications II Kaduk (Summit III) W-14 Line Broadening Makinson (Carson) W-15 Quantitative Analysis – Standardless Methods Anzelmo (Summit I & II) W-16 TXRF Zaitz (Learning Center) Tue. eve.: 6:30-8:30 MDI and Rigaku/MSC, Inc. Reception and XRD Poster Session II. Sponsored by: MDI and Rigaku/MSC, Inc. (Huang/Barton) (Summit) Wed. am: 8:30-12:30 Plenary Session: “Applications of X-ray Analysis to Forensic Materials” (Rendle/Jenkins) (Summit III) WED. pm: Sessions C-1 New Developments in XRD & XRF Instrumentation Buhrke (Carson) C-2 Synchrotron Applications I Lavoie/Ludwig (Summit II) D-1 Rietveld Applications I Kaduk (Fremont) D-2 Thin Films Huang (Summit I)   Wed. eve: 6:30 – 8:30 Bruker AXS, Inc. Reception and XRF Poster Session. Sponsored by: Bruker AXS, Inc. (Zaitz/Taniguchi) (Summit) THURS. am: Sessions C-3 Synchrotron Applications II Lavoie/Ludwig (Summit II) D-3 Rietveld Applications II Kaduk (Fremont) D-4 Industrial Applications of XRD I Snyder/Hubbard (Summit III) F-1 Quantitative XRF Gilfrich/Vrebos (Summit I) THURS. pm: Sessions C-4 Microbeam Analysis Havrilla (Summit II) D-5 Industrial Applications of XRD II Snyder/Hubbard (Summit III) D-6 Neutron Diffraction Üstündag/Bourke (Fremont) F-2 Polarized X-ray Optics Chappell/Ryon (Summit I) FRI. am: Sessions C-5 X-ray Optics Gao/Havrilla (Summit II) D-7 Stress Analysis Goldsmith (Fremont) F-3 Problem Solving/Industrial Applications of XRF Broton (Summit I)