2002 Denver X-ray Conference > Poster Sessions > Tuesday 30 July 2002 DXC - Quick Links Choose One DXC 2002 Home DXC 2002 At-a-Glance Monday Workshops Tuesday Workshops Monday Poster Tuesday Poster Wednesday Poster Wednesday Plenary Wednesday Sessions Thursday Sessions Friday Sessions Dates to Remember Hotel Information Find a Roommate Presented Papers Contributed Papers Jerome B. Cohen Student Award DXC Main Home 6:30 p.m.–8:30 p.m., authors present The XRD Poster Session II will be held in conjunction with the MDI and Rigaku/MSC, Inc. mixer.   XRD Poster Session I, Tuesday, 30 July (Summit) Session chairs will select the two best papers for awards. Chairs: T.C. Huang, Emeritus, IBM Almaden Research Center, San Jose, CA R. Barton, Jr., Emeritus, DuPont Experimental Station, Wilmington, DE Quantitative Analysis D-060 MINERALOGY OF VOLCANIC ROCKS BY RIETVELD ANALYSIS R.M. Gonzalez, T.D. Lorbiecke, T. Edwards, J.R. Webster, R.S. Winburn, Minot State University, Minot, ND D-058 HEAVY MINERAL ANALYSIS OF SANDSTONES BY RIETVELD ANALYSIS J.R. Webster, R.P. Kight, R.S. Winburn, C.A. Cool, Minot State University, Minot, ND   Non-Ambient  D-075 XRD STUDY OF THE DEHYDRATION REACTION OF THEOPHYLLINE MONOHYDRATE: EFFECT OF POLYVINYLPYRROLIDONE C. Nunes, R. Suryanarayanan, University of Minnesota, Minneapolis, MN A. Mahendrasingam, Keele University, Staffordshire, UK D-039 HIGH-TEMPERATURE X-RAY DIFFRACTION STUDY OF REACTION RATES IN CERAMICS M.S. Peterson, II, C.A. Say, S.A. Speakman, S.T. Misture, New York State College of Ceramics at Alfred University, Alfred, NY D-030 STUDIES OF THE TRANSITION STATE FOR KDP-DKDP SOLID SOLUTION B.N. Kodess, ICS & E, Denver, CO A.I. Beskrovny, VNIIMS, Moscow, Russia D-044 HIGH TEMPERATURE X-RAY DIFFRACTION STUDIES USING A TWO-DIMENSIONAL DETECTOR J. Brechbühl, H.-G. Krane, F. Stowasser, L. Brügemann, Bruker AXS GmbH, Karlsruhe, Germany D-081 IN SITU, IN AIR, HIGH-TEMPERATURE STUDIES OF OXIDE SYSTEMS USING THE THERMAL-IMAGING TECHNIQUE L. Siah, W.M. Kriven, University of Illinois at Urbana-Champaign, Urbana, IL Stress/Strain  D-029 NANOSTRUCTURE ANALYSIS USING 2D SMALL ANGLE X-RAY SCATTERING OPTIMIZED FOR Fe-BASED ALLOYS K. Erlacher, R. Görgl, Material Center Leoben GmbH, Austria and Austrian Academy of Sciences and University of Leoben, Austria H. Jakob, Bruker AXS GmbH, Germany P. Fratzl, Austrian Academy of Sciences and University of Leoben, Austria D-034 MEASUREMENT OF STRESS IN SURFACE ACOUSTIC WAVE FILTERS USING BRAGG ANGLE CONTOUR MAPPING P.M. Adams, The Aerospace Corporation, Los Angeles, CA D-047 AN EXPERIMENTAL STUDY ON X-RAY RESIDUAL STRESSES INDUCED BY SHOT PEENING PROCESS OF AUSTENITE STAINLESS STEEL S. Takahashi, T. Murotani, Y. Hirose, Kanazawa University, Kanazawa, Japan K. Hiratsuka, Polytechnic University, Sagamihara, Japan D-050 PLASTIC STRAIN OF ROLLED DUPLEX / STAINLESS H. Hirose, Kinjo University, Ishikawa, Japan S. Takago, Industrial Research Institute of Ishikawa, Ishikawa, Japan M. Tone, T. Sasaki, Kanazawa University, Kanazawa, Japan M. Saka, Tohoku University, Miyagi, Japan D-051 DEVELOPMENT OF MEASURING SYSTEM FOR STRESS BY MEANS OF IMAGE PLATE FOR SYNCHROTRON RADIATION EXPERIMENT AT PHOTON FACTORY (KEK) T. Sasaki, Y. Hirose, Kanazawa University, Kanazawa, Japan K. Hiratsuka, Polytechnic University, Sagamihara, Japan Y. Yoshioka, Musashi Institute of Technology D-052 DEVELOPMENT OF MEASURING SYSTEM FOR STRESS BY MEANS OF NEUTRON IMAGE PLATE AT JAPAN ATOMIC ENERGY RESEARCH INSTITUTE (JAERI) T. Sasaki, Y. Hirose, Kanazawa University, Kanazawa, Japan K. Hiratsuka, Polytechnic University, Sagamihara, Japan N. Minakawa, Y. Morii, N. Niimura, Japan Atomic Energy Research Institute D-053 DEVELOPMENT OF MEASURING SYSTEM FOR STRESS BY MEANS OF IMAGE PLATE FOR LABORATORY X-RAY EQUIPMENT K. Hiratsuka, Polytechnic University, Sagamihara, Japan T. Sasaki, K. Seki, Y. Hirose, Kanazawa University, Kanazawa, Japan D-054 THERMAL FATIGUE PROPERTIES OF LASER PEENED HOT WORK DIE STEEL (H13) K. Yatsushiro, M. Sano, Yamanashi Industrial Technology Center, Yamanashi, Japan M. Kuramoto, Polytechnic University, Kanagawa, Japan D-118 MICROSTRUCTURE ANALYSIS OF STRAIN-FREE Y2O3 NANOPOWDERS FROM PATTERN DECOMPOSITION AND WHOLE PATTERN FITTING APPROACHES D. Louër, T. Bataille, T. Roisnel, Université de Rennes I, Rennes Cedex, France Thin Films D-084 USING X-RAY MAPPING TECHNIQUES TO CORRELATE SUBSTRATE AND FILM PROPERITIES WITH DEVICE PERFORMANCE K.W. Kirchner, K.A. Jones, Army Research Lab, Adelphi, MD D-002 BACKSCATTERING OF X-RADIATION BY CURVED BICRYSTALS AND CRYSTALS WITH THIN EPITAXIAL FILMS T. Tchen, Moscow State Academy of Fine Chemical Technology, Moscow, Russia D-046 EFFECT OF THE RESIDUAL STRESS ON THE MECHANICAL STRENGTH OF THE THIN FILMS M. Gotoh, T. Sasaki, Y. Hirose, Kanazawa University, Ishikawa, Japan S. Takago, Industrial Research Institute of Ishikawa, Ishikawa, Japan D-048 PREPARATION OF INTERMETALLIC COMPOUNDS COATING BY Ni-Al MIXED POWDER SPLAYING AND LATER HEAT TREATMENT T. Murotani, T. Taguchi, Y. Hirose, Kanazawa University, Kanazawa, Japan A. Ikenaga, Osaka Prefecture University, Sakai, Japan D-049 EFFECT OF PULSE TIMING ON RESIDUAL STRESS OF CRACK FREE CHROMIUM LAYER DEPOSITED BY PULSE PLATING Y. Kobayashi, J. Nagasawa, Tokico Ltd., Kawasaki, Japan K. Watanabe, Atotech Japan K.K., Yokohama, Japan T. Sasaki, Y. Hirose, Kanazawa University, Kanazawa, Japan D-089 A COMPARISON OF ANALYTICAL TECHNIQUES FOR HYDROGEN CONTENTS IN DLC FILMS FORMED BY PBII METHOD H. Yasui, Y. Hirose, T. Sasaki, Kanazawa University, Kanazawa, Japan K. Awazu, Industrial Research Institute of Ishikaway, Kanazawa, Japan H. Naramoto, Japan Atomic Energy Research Institute, Takasaki, Japan