2002 Denver X-ray Conference > Sessions > Thursday 1 August  2002 2002 DXC - Quick Links Choose One DXC 2002 Home DXC 2002 At-a-Glance Monday Workshops Tuesday Workshops Monday Poster Tuesday Poster Wednesday Poster Wednesday Plenary Wednesday Sessions Thursday Sessions Friday Sessions Dates to Remember Hotel Information Find a Roommate Presented Papers Contributed Papers Jerome B. Cohen Student Award DXC Main Home Session, Thursday a.m. (Summit II) SESSION C-3 SYNCHROTRON APPLICATIONS II Organized by: C. Lavoie, IBM, Yorktown Heights, NY Co-chair: K. Ludwig, Boston University, Boston, MA XRD & XRF 9:00 C-08 IN SITU SYNCHROTRON STUDIES OF CHEMICAL VAPOR DEPOSITION - Invited G.B. Stephenson, D.D. Fong, S.K. Streiffer, J.A. Eastman, O. Auciello, P.F. Fuoss, G.-R. Bai, L. Thompson, Argonne National Laboratory, Argonne, IL M.E.M. Aanerud, C. Thompson, Northern Illinois University, Dekalb, IL 9:30 F-10 TRACE-LEVEL SPECIATION AND MICROANALYSIS BY MEANS OF MONOCHROMATIC AND “PINK” BENDING MAGNET RADIATION FOCUSSED WITH POLYCAPILLARY OPTICS K. Proost, K. Janssens, L. Vincze, University of Antwerp, Antwerp, Belgium G. Falkenberg, HASYLAB at DESY, Hamburg, Germany 9:50 F-12 X-RAY ABSORPTION FINE STRUCTURE (XAFS) IMAGING WITH A NONSCANNING X-RAY FLUORESCENCE MICROSCOPE K. Sakurai, M. Mizusawa, National Institute for Materials Science, Ibaraki, Japan 10:10 Break 10:30 F-13 SYNCHROTRON X-RAY FLUORESCENCE WITH A COMPACT JOHANSSON SPECTROMETER (R=100mm) K. Sakurai, S. Kuwajima, M. Mizusawa, National Institute for Materials Science, Ibaraki, Japan 10:50 D-076 HIGH-RESOLUTION SYNCHROTRON ABSORPTION MICROTOMOGRAPHY AND MICROBEAM DIFFRACTION STUDY OF THE MINERAL PHASE MICROSTRUCTURE IN SEA URCHIN TEETH S.R. Stock, Northwestern University, Chicago, IL K. Ignatiev, Georgia Institute of Technology, Atlanta, GA T. Dahl, J. Barss, A. Veis, Northwestern University Medical School, Chicago, IL J. Almer, F. DeCarlo, Argonne National Laboratory, Argonne, IL 11:10 F-46 ALTERED PB/CA CONCENTRATIONS IN DIFFERENT BONE AREAS INVESTIGATED BY SR-XRF P. Wobrauschek, N. Zöger, G. Pepponi, C. Streli, S. Zamini, Atominstitut der Österreichischen Universitäten, Wien, Austria G. Falkenberg, HASYLAB at DESY, Hamburg, Germany W. Osterode, Universitätsklinik für Innere Medizin IV, Wien, Austria Session, Thursday a.m. (Fremont) Session D-3 Rietveld Applications II Organized by: J.A. Kaduk, BP Amoco, Naperville, IL XRD 9:00 CRYSTAL STRUCTURES OF ORGANIC/PHARMACEUTICAL COMPOUNDS - Invited P.W. Stephens, SUNY Stony Brook, Stony Brook, NY 9:30 D-078 MONOPOTASSIUM DIHYDROGEN CITRATES J.A. Kaduk, BP Chemicals, Naperville, IL 9:50 D-038 INDEXING OF POWDER DIFFRACTION PATTERNS BY ITERATIVE USE OF SINGULAR VALUE DECOMPOSITION A.A. Coelho, A. Kern, Bruker AXS GmbH, Karlsruhe, Germany 10:10 Break 10:30 D-026 X-CELL - A NOVEL INDEXING ALGORITHM FOR ROUTINE AND PROBLEM CASES M.A. Neumann, Accelrys Ltd., Cambridge, UK 10:50 D-083 RIETVELD REFINEMENT OF 2-THETA SPLIT RANGES—A METHOD FOR REDUCING ANALYSIS TIME K. Laursen, T. White, Nanyang Technological University, Singapore 11:10 D-037 CONVOLUTION BASED PROFILE FITTING A. Kern, A.A. Coelho, Bruker AXS GmbH, Karlsruhe, Germany R.W. Cheary, University of Technology Sydney, Sydney, Australia 11:30 D-100 BAYESIAN/MAXIMUM ENTROPY ANALYSIS OF BIMODAL SIZE-DISTRIBUTIONS FROM NANOPARTICLE-BROADENED LINE PROFILES N. Armstrong, W. Kalceff, University of Technology, Sydney, Australia J.P. Cline, National Institute of Standards & Technology, Gaithersburg, MD 11:50 D-001 STRUCTURE DETERMINATION OF NANOCRYSTALLINE MATERIALS BY THE ATOMIC PAIR DISTRIBUTION FUNCTION TECHNIQUE V. Petkov, Michigan State University, East Lansing, MI Session, Thursday a.m. (Summit III) SESSION D-4 INDUSTRIAL APPLICATIONS OF XRD I Organized by: R.L. Snyder, The Ohio State University, Columbus, OH C.R. Hubbard, Oak Ridge National Laboratories, Oak Ridge, TN XRD 8:30 D-070 APPLICATION OF SYNCHROTRON EDXRD STRAIN PROFILING IN SHOT PEENED MATERIALS M. Croft, I. Zakharchenko, Y. Gulak, T. Tsakalakos, Rutgers University, Piscataway, NJ Z. Zhong, NSLS, Brookhaven National Laboratory, Upton, NY 8:50 D-112 ZINC/IRON PHASE TRANSFORMATION STUDIES ON GALVANNEALED STEEL SHEET COATINGS BY X-RAY DIFFRACTION S. Wienströer, M. Genenger, C. Nazikkol, H. Mittelstädt, ThyssenKrupp Stahl AG, Duisburg, Germany M.J. Fransen, Philips Analytical, Almelo, The Netherlands 9:10 D-101 REEL-TO-REEL TEXTURE ANALYSIS OF HTS COATED CONDUCTORS USING A MODIFIED GADDS SYSTEM J.L. Reeves, V. Selvamanickam, IGC SuperPower, Schenectady, NY R.L. Snyder, The Ohio State University, Columbus, OH 9:30 D-055 USING LATTICE PARAMETERS AND LINE BROADENING TO MONITOR NEAR-SURFACE STRAIN IN DESIGNING SINTERED CERAMIC MATERIALS - A FORMIDABLE CHALLENGE S. Pratapa, B. O’Connor, Curtin University of Technology, Perth, Australia 9:50 D-032 CRYSTAL STRUCTURE DETERMINATIONS OF THE THREE-LAYER AURIVILLIUS CERAMICS USING A NEW HIGH-RESOLUTION X-RAY POWDER DIFFRACTOMETER M. Haluska, S. Speakman, S.T. Misture, New York State College of Ceramics at Alfred University, Alfred, NY 10:10 Break 10:30 D-115 APPLICATIONS OF X-RAY DIFFRACTION IN THE DIESEL ENGINE INDUSTRY -  Invited R. England, Cummins, Inc., Columbus, IN T.R. Watkins, Oak Ridge National Laboratory, Oak Ridge, TN 11:00 D-119 A TEXTURE MEASUREMENT INSTRUMENT FOR INDUSTRIAL PROCESS CONTROL  -  Invited H. Weiland, Alcoa Technical Center, Alcoa Center, PA 11:30 D-104 ANNEALING STUDIES OF PURE AND ALLOYED TANTALUM EMPLOYING ROCKING CURVES AND /2 PATTERNS R.J. De Angelis, University of Florida, Shalimar, FL D.W. Richards, M.P. Kramer, J.W. House, Air Force Research Laboratory, Eglin AFB, Florida Session, Thursday a.m. (Summit I) Session F-1 Quantitative XRF Organized by: J. Gilfrich, Emeritus, SFA, Inc./NRL, Washington, DC Co-chair: B. Vrebos, Philips Analytical, Almelo, The Netherlands XRF 9:00 F-22 ACCURACY OF THEORETICAL INFLUENCE COEFFICIENT METHODS - Invited M. Mantler, Vienna University of Technology, Vienna, Austria 9:30 F-36 QUANTITATIVE APPROACHES IN MICRO X-RAY FLUORESCENCE  - Invited G.J. Havrilla, Los Alamos National Laboratory, Los Alamos, NM 10:00 F-08 ACCURACY OF FUNDAMENTAL PARAMETERS CALCULATIONS USING A NEW ATOMIC DATABASE W.T. Elam, R.B. Shen, B. Scruggs, J. Nicolosi, EDAX, Inc., Mahwah, NJ 10:20 Break 10:40  F-23 NUMERICAL DESCRIPTION OF PHOTOELECTRIC ABSORPTION COEFFICIENTS FOR FUNDAMENTAL PARAMETER PROGRAMS H. Ebel, R. Svagera, Vienna University of Technology, Vienna, Austria A. Shaltout, National Research Center, Cairo, Egypt 11:00 F-01 ACCURATE QUANTIFICATION OF RADIOACTIVE MATERIALS BY X-RAY FLUORESCENCE: GALLIUM IN PLUTONIUM METAL C.G. Worley, Los Alamos National Laboratory, Los Alamos, NM 11:20 F-21 APPLYING THE CONCEPT OF TRUENESS TO ALLOY ANALYSIS USING WDXRF AND BORATE FUSION J.R. Sieber, National Institute of Standards & Technology, Gaithersburg, MD 11:40 F-33  APPLICATION OF THE BACKSCATTER FUNDAMENTAL PARAMETER METHOD WITH SIMULTANEOUS EXCITATION BY 55Fe AND 109Cd RADIOISOTOPE SOURCES D. Wegrzynek, A. Markowicz, E. Chinea-Cano, International Atomic Energy Agency, Vienna, Austria P. Potts, The Open University, Milton Keynes, UK 12:00 F-43 THE USE OF VARIOUS PEAK DECONVOLUTION MODELS FOR ED-XRF ANALYSIS OF LAYERED MATERIALS A. Wittkopp, B. Cross, F. Ferrandino, NeXray Corporation, Ronkonkoma, NY Session, Thursday p.m. (Summit II) Session C-4 Microbeam Analysis (Combinatorial & Robotic Applications) Organized by: G.J. Havrilla, Los Alamos National Laboratory, Los Alamos, NM XRD & XRF  1:30  C-05  SCANNING X-RAY MICROTOPOGRAPHY STUDY OF ELECTROMIGRATION IN INTEGRATED CIRCUITS - Invited P.-C. Wang, IBM Corporation, Hopewell Junction, NY 2:00 F-26 1, 2 AND 3D MICRO-ANALYSIS USING SR-BASED SPECTROSCOPY AND IMAGING - Invited A. Simionovici, ESRF, Grenoble, France 2:30 F-53 QUANTITATIVE ASPECTS OF MICROBEAM X-RAY ANALYSIS - Invited L. Vincze, University of Antwerp, Antwerp, Belgium 3:00 F-05 PUSHING THE DETECTION LIMITS OF MICRO X-RAY FLUORESCENCE T.C. Miller, G.J. Havrilla, Los Alamos National Laboratory, Los Alamos, NM 3:20 Break 3:40 F-41  MICROANALYSIS WITH A POLYCAPILLARY IN A VACUUM CHAMBER P. Wobrauschek, N. Marosi, C. Streli, Atominstitut der Österreichischen Universitäten, Wien, Austria 4:00 F-37 ELEMENTAL IMAGING USING MICRO X-RAY FLUORESCENCE IN ART AND ARCHEOLOGY G.J. Havrilla, T. Miller, Los Alamos National Laboratory, Los Alamos, NM K. Trentleman, Detroit Institute of Art, Detroit, MI R. Morton, Philips Petroleum, Bartlesville, OK 4:20 D-099 DIAGNOSIS OF Ln-DOPED PZT FILMS VIA MICRODIFFRACTION: CORRELATION OF PROPERTIES TO OBSERVED FWHM M.A. Rodriguez, G. Brennecka, B.A. Tuttle, Sandia National Laboratories, Albuquerque, NM 4:40 D-111 MEASUREMENT OF STRAIN FIELDS OF INDIVIDUAL DOMAINS IN BaTiO3 USING X-RAY MICRODIFFRACTION R.C. Rogan, E. Üstündag, G.A. Swift, California Institute of Technology, Pasadena, CA N. Tamura, Lawrence Berkeley National Laboratory, Berkeley, CA 5:00 D-105 STUDY OF FIBER-REINFORCED COMPOSITES USING X-RAY MICROTOPOGRAPHY J.C. Hanan, E. Üstündag, C.C. Aydiner, M.A. Brown, G.S. Welsh, G.A. Swift, California Institute of Technology, Pasadena, CA J.L. Jordan-Sweet, I.C. Noyan, IBM Research Division, Yorktown Heights, NY Session, Thursday p.m. (Summit III) Session D-5 INDUSTRIAL APPLICATIONS OF XRD II Organized by: R.L. Snyder, The Ohio State University, Columbus, OH C.R. Hubbard, Oak Ridge National Laboratories, Oak Ridge, TN XRD 1:30  D-097 METHODS FOR ANALYZING METAL TRITIDES IN THE X-RAY DIFFRACTION LABORATORY R. Tissot, M. Eatough, Sandia National Laboratories, Albuquerque, NM 1:50 D-116 APPLICATIONS OF X-RAY DIFFRACTION IN THE IMAGING INDUSTRY — Invited T.N. Blanton, Eastman Kodak Company, Rochester, NY 2:20 D-103 APPLICATIONS OF X-RAY POWDER DIFFRACTION IN THE PHARMACEUTICAL INDUSTRY - Invited G.A. Stephenson, Eli Lilly & Company, Indianapolis, IN 2:50 D-096 PULP AND PAPER PLANT MATERIALS ISSUES ADDRESSED BY XRD METHODS C.R. Hubbard, R.A. Peascoe, J.R. Keiser, Oak Ridge National Laboratory, Oak Ridge, TN 3:10 Break 3:30 D-079 HIGH-PRECISION PARALLEL-BEAM X-RAY DIFFRACTION SYSTEM FOR PHARMACEUTICALS ANALYSIS T. Kubo, Rigaku Corporation, Osaka, Japan 3:50 D-086 A NEW MOVABLE DIFFRACTOMETER FOR INDUSTRIAL APPLICATIONS OF NDT-XRD FOR IN FIELD MEASUREMENTS G. Berti, University of Pisa, Pisa, Italy S. Aldrighetti, Officina Elettrotecnica di Tenno, Italy 4:10 D-011 COMPARISON BETWEEN CONVENTIONAL AND TWO-DIMENSIONAL XRD B.B. He, U. Preckwinkel, K.L. Smith, Bruker AXS, Inc., Madison, WI 4:30 D-077 ADVENTURES IN CORROSION DEPOSITS - Invited J.A. Kaduk, BP Chemicals, Naperville, IL 5:00 D-065 CHARACTERIZATION OF THE SOLIDS WASTE IN THE HANFORD WASTE TANKS USING A COMBINATION OF XRD, SEM, AND PLM R.W. Warrant, G.A. Cooke, Fluor Hanford, Richland, WA Session, Thursday p.m. (Fremont) SESSION D-6 NEUTRON DIFFRACTION Organized by: E. Üstündag, California Institute of Technology, Pasadena, CA M.A.M. Bourke, Los Alamos National Laboratory, Los Alamos, XRD 1:30  D-012  THE PRECISION OF DIFFRACTION PEAK LOCATION AND THE OPTIMISED DESIGN OF A STRESS DIFFRACTOMETER - Invited M.R. Daymond, ISIS Facility, Rutherford Appleton Lab., Oxon, UK 2:00 D-036 DIFFRACTION MEASUREMENTS DURING MECHANICAL LOADING IN SUPERELASTIC AND SHAPE-MEMORY ALLOYS - Invited R. Vaidyanathan, University of Central Florida, Orlando, FL 2:30 D-085 DEVELOPMENT OF TEXTURE DURING DEFORMATION OF HEXAGONAL CLOSE PACKED METALS D.W. Brown, S.R. Agnew, W.R. Blumenthal, T.M. Holden, C. Tomé, Los Alamos National Laboratory, Los Alamos, NM 2:50 D-057 LATTICE DILATION IN A HYDROGEN CHARGED STEEL G.L. Nash, Electro-Motive Division, LaGrange, IL P. Nash, Illinois Institute of Technology, Chicago, IL H. Choo, University of Tennessee, Knoxville, TN L.L. Daemen, M.A.M. Bourke, Los Alamos National Laboratory, Los Alamos, NM 3:10 Break 3:30 D-108 EFFECT OF BEAM DIVERGENCE ON STRAIN DATA FROM NEUTRON DIFFRACTION E. Üstündag, R.A. Karnesky, California Institute of Technology, Pasadena, CA I.C. Noyan, IBM Research Division, Yorktown Heights, NY M.A.M. Bourke, D.W. Brown, Los Alamos National Laboratory, Los Alamos, NM 3:50 D-110  DEFORMATION MECHANISMS OF DUCTILE-PHASE-REINFORCED BULK METALLIC GLASS COMPOSITES S.-Y. Lee, E. Üstündag, B. Clausen, H. Choi-Yim, California Institute of Technology, Pasadena, CA D.W. Brown, M.A.M. Bourke, Los Alamos National Laboratory, Los Alamos, NM 4:10 D-062 EFFECT OF REINFORCEMENT PARTICLE FRACTURE ON THE LOAD PARTITIONING IN AN AL-SIC COMPOSITE B.S. Majumdar, New Mexico Tech, Socorro, NM H. Choo, University of Tennessee, Knoxville, TN P. Rangaswamy, M.A.M. Bourke, Los Alamos National Laboratory, Los Alamos, NM 4:30 D-106  HIGH TEMPERATURE ELASTIC STRAIN EVOLUTION IN Si3N4- BASED CERAMICS G.A. Swift, E. Üstündag, B. Clausen, California Institute of Technology, Pasadena, CA M.A.M. Bourke, Los Alamos National Laboratory, Los Alamos, NM H.-T. Lin, Oak Ridge National Laboratory, Oak Ridge, TN C.-W. Li, Honeywell Corporation, Morristown, NJ 4:50  D-107  CONSTITUTIVE BEHAVIOR OF PZT-BASED FERROELECTRIC CERAMICS R.C. Rogan, E. Üstündag, B. Clausen, California Institute of Technology, Pasadena, CA M.R. Daymond, Rutherford Appleton Laboratory, Oxon, UK C.M. Landis, Rice University, Houston, TX V. Knoblauch, Robert Bosch GmbH, Stuttgart, Germany Session, Thursday p.m. (Summit I) SESSION F-2 POLARIZED X-RAY OPTICS Organized by: B. Chappell, Macquarie University, Sydney, Australia Co-chair: R.W. Ryon, Emeritus, Lawrence Livermore National Laboratories, Livermore, CA XRF 2:00  POLARIZED BEAM XRF ANALYSIS OF GEOLOGIC MATERIALS - Invited B. Chappell, Macquarie University, Sydney, Australia 2:30 F-29 POLARIZED BEAM XRF ANALYSIS - PAST AND FUTURE - Invited J. Heckel, SPECTRO A.I., Kleve, Germany 3:00 Break 3:20 F-30 POLARIZATION FOR BACKGROUND REDUCTION IN EDXRF—THE TECHNIQUE THAT WOULD NOT WORK - Invited R.W. Ryon, Lawrence Livermore National Laboratory, Livermore, CA 3:50  F-48 THE USE OF POLARIZED LIGHT ED-XRF FOR LOW SULFUR CONTENT DETERMINATION IN AUTOMOTIVE FUELS M. Van Driessche, ChevronTexaco Technology Gent, Gent, Belgium