2002 Denver X-ray Conference > Workshops > Monday, 29 July a.m. workshops: 9:00 a.m.–12:00 noon • p.m. workshops: 2:00 p.m.–5:00 p.m. 2002 DXC - Quick Links Choose One DXC 2002 Home DXC 2002 At-a-Glance Monday Workshops Tuesday Workshops Monday Poster Tuesday Poster Wednesday Poster Wednesday Plenary Wednesday Sessions Thursday Sessions Friday Sessions Dates to Remember Hotel Information Find a Roommate Presented Papers Contributed Papers Jerome B. Cohen Student Award DXC Main Home Workshops, Monday a.m. XRD W-1 Texture Analysis I (Learning Center) Organized by: H. Schaeben, Freiberg University of Mining and Technology, Freiberg, Germany Instructors: H. Schaeben, Freiberg University of Mining and Technology, Freiberg, Germany R.J. De Angelis, University of Florida, Shalimar, FL F. Heidelbach, Universität Bayreuth, Bayreuth, Germany J. Fundenberger, Université de Metz, Metz CEDEX, France Identifying experimental pole intensity data with the result of scanning the spherical X-ray transform of an orientation density function, a unifying view of mathematical texture analysis is presented in terms of spherical tomography. Material science application based on common X-ray radiation and very recent geoscience applications based on synchrotron radiation because of its penetration depth and angular resolution will be used to explain the rationale of texture analysis. W-2 Methods of Phase Identification (Carson) Organized by: R. Jenkins, Emeritus, International Centre for Diffraction Data, Newtown Square, PA Instructors: R. Jenkins, Emeritus, International Centre for Diffraction Data, Newtown Square, PA J. Faber, T. Fawcett, International Centre for Diffraction Data, Newtown Square, PA This workshop is intended for those new to the field of phase identification by X-ray powder diffraction. The program is based on the use of many worked examples and utilizes each of the standard search/match methods currently supported by the ICDD. XRF W-3 Fundamentals of XRF (Summit I & II) Organizers & Instructors: J. Gilfrich, Emeritus, SFA, Inc./NRL, Washington, DC J. Croke, Emeritus, Philips Analytical, Inc., Natick, MA This workshop is intended to explain briefly the basics of X-ray emission and how that information is applied in the practice of X-ray Fluorescence Analysis. While aimed at new workers in the field, the level of detail should have some interest for the more experienced analyst. W-4 Analysis of Layered Materials by XRF (Fremont) Organized by: M.W. Dirken, Philips Analytical, Almelo, The Netherlands Instructors: M.W. Dirken, Philips Analytical, Almelo, The Netherlands M. Mantler, Vienna University of Technology, Vienna, Austria A. Wittkopp, NeXray L.L.C., Ronkonkoma, NY This workshop provides an introduction to the analysis of layered materials and is intended for the X-ray spectroscopist who encounters this analysis for the first time. Therefore, the physics and various analysis models are presented. This is followed by contributions of ED-XRF and WD-XRF examples, focusing on practical issues including problems of finite thickness and line selection. Workshops, Monday p.m. XRD W-5 Texture Analysis II (Learning Center) Organized by: H. Schaeben, Freiberg University of Mining and Technology, Freiberg, Germany Instructors: H. Schaeben, Freiberg University of Mining and Technology, Freiberg, Germany R.J. De Angelis, University of Florida, Shalimar, FL F. Heidelbach, Universität Bayreuth, Bayreuth, Germany J. Fundenberger, Université de Metz, Metz CEDEX, France Continuation of W-1. W-6 Advances in Database Technology (Carson) Organized by: J. Faber, International Centre for Diffraction Data, Newtown Square, PA Instructors: J. Faber, S. Kabekkodu, International Centre for Diffraction Data, Newtown Square, PA The International Centre for Diffraction Data (ICDD) is responding to the changing needs in powder diffraction and materials analysis by developing completely new Powder Diffraction Files (PDF-4) in relational database (RDB) format. In this workshop, an overview of RDB technology will be presented, and how this technology helps to set the stage for total pattern analyses. The PDF-4/Full File 2002 contains 136,895 powder diffraction patterns, mainly from inorganic phases. The PDF-4/Organics 2002 will contain approximately 150,000 entries nearly all of which are organic phases. On-the-fly fully digitized patterns have been developed to facilitate direct comparisons between experiment and reference data in the PDF-4. A number of specific data mining exercises that demonstrate the power of a relational database format over the traditional (flat file) database structures will be presented. More importantly, it will be illustrated how these data mining techniques can be exploited in real problem-solving environments. XRF W-7 Specimen Preparation I (Summit I & II) Organized by: D. Broton, Construction Technology Labs, Skokie, IL Instructors: D. Broton, S. Nettles, Construction Technology Labs, Skokie, IL J. Anzelmo, Bruker AXS, Inc., Madison, WI V. Kocman, A.S.O. Design, Quebec, Canada The sampling and specimen preparation workshop at the DXC continues to be a fundamental aspect of the Conference. This workshop covers the basics of sampling and specimen preparation for a wide variety of materials. Novel approaches to preparing specimens for analysis come from instructors with many years of experience applying those techniques to real-world industrial samples. Tricks-of-the-trade and useful tips for both novices and experienced X-ray analysts will be presented. The audience is encouraged to participate by providing input about their own experiences, sample types and solutions. Topics in 2002 will include sampling, pressed powders, borate fusions, and loose packed powders. Sample preparation methods for pitch and treated wood as well as using reference materials and pure compounds for standardization of XRF instruments will also be included. W-8 Polarized X-ray Optics (Summit III) Organized by: B. Chappell, Macquarie University, Sydney, Australia Instructors: B. Chappell, Macquarie University, Sydney, Australia R.W. Ryon, Emeritus, Lawrence Livermore National Laboratories, Livermore, CA J. Heckel, Spectro Analytical Instruments, Kleve, Germany D. Wissmann, Spectro Analytical Instruments, Kleve, Germany M. van Driessche, Texaco Technology, Ghent, Belgium This workshop will discuss features of XRF analysis that are specific to the polarized technique. More specifically, it will look at the practical problems of preparing samples of liquids and powders for analysis by polarized XRF spectrometry. With an operating spectrometer, it will examine the procedures for the analysis of low levels of sulfur in gasoline and for high precision analysis of samples in fused glass beads. The use of the Compton method for matrix corrections will be discussed, and also the Turboquant method of semiquantitative analysis. This workshop also seeks contributions from other participants.