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Workshops
Monday, 4 August -Tuesday, 5 August
a.m. workshops: 9:00 a.m.–12:00 noon
p.m. workshops: 2:00 p.m.–5:00
p.m.
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Workshops, Tuesday a.m.
XRD
W-9 Two-dimensional
X-ray Diffraction I (Evergreen A)
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Organizers & Instructors: |
B.B. He, Bruker AXS, Inc.,
Madison, WI
T.N. Blanton, Eastman Kodak Company, Rochester, NY |
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Instructors: |
T.N. Blanton, Eastman Kodak
Company, Rochester, NY
R. Durst, B.B. He, U. Preckwinkel, Bruker AXS, Inc., Madison, WI
R.B. Ortega, Rigaku/MSC, The Woodlands, TX
R. Tissot, Sandia National Laboratories, Albuquerque, NM |
Two-dimensional diffraction provides far
more information than the conventional one-dimensional diffraction. In recent
years, usage of two-dimensional diffraction has increased due to the advances in
detector technology, point beam X-ray optics, software development and computing
power. This workshop covers the recent progress in two-dimensional X-ray
diffraction in terms of detector technology, geometry and configuration of
two-dimensional diffractometer and various applications, such as phase ID,
texture, stress, crystallinity, combinatorial screening and thin film analysis.
W-10 Backscatter
Electron Diffraction (Evergreen B)
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Organized by: |
R.P. Goehner, Sandia National
Laboratories, Albuquerque, NM |
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Instructors: |
R.P. Goehner, R. Tissot, Sandia
National Laboratories, Albuquerque, NM
S. Sitzman, HKL Technology Inc., Danbury, CT
S. Wright, TSL/EDAX, Darper, UT
A. Kleyn, Thermo Electron, Middleton, WI |
This workshop will discuss the theory and
practical applications of Electron Backscattered Diffraction (EBSD) alternately
known as Kikuchi patterns in the Scanning Electron Microscope (SEM). The use of
SEM for crystallographic applications will be discussed. The major applications
areas that will be emphasized in the workshop are crystallographic texture
(preferred orientation) measurements, crystallographic phase identification and
the calculation of primitive cells from high quality EBSD. Three EBSD equipment
manufactures will emphasize the applications of the EBSD technique.
XRF
W-11
Fundamentals of XRF (Evergreen C)
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Organized by: |
J.V. Gilfrich, Emeritus, SFA,
Inc. /NRL, Bethesda, MD |
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Instructors: |
J.V. Gilfrich, Emeritus, SFA,
Inc. /NRL, Bethesda, MD
F. Feret, Alcan International Ltd., Alcan, Québec, Canada
S. Török, KFKI Atomic Energy Research Institute, Budapest,
Hungary |
This workshop is intended to provide a
basic background of the principles of XRF, specifically directed to those new to
the field. It will consist of a general overview of the technique, followed by
more specific details of particular applications by experts in those
applications, to provide an understanding of the use of the principles
previously described.
W-12
Quantitative Analysis I (Evergreen D)
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Organized by: |
M. Mantler, Vienna University
of Technology, Vienna, Austria |
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Instructors: |
M. Mantler, Vienna University
of Technology, Vienna, Austria
B. Vrebos, PANalytical, Almelo, The Netherlands
W.T. Elam, University of Washington, Seattle, WA |
The workshop will cover:
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Empirical and theoretical methods of
quantitative XRF
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Basic interactions and atomic (“fundamental”)
parameters
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Sources and accuracy of atomic
parameters and tube spectra
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Classical fundamental parameter
methods
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Computed (theoretical) influence
coefficients
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Compensation Methods
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Monte Carlo Methods
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Special cases and methods:
Workshops, Tuesday p.m.
XRD
W-13
Two-dimensional X-ray Diffraction II (Evergreen A)
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Organized by: |
B.B. He, Bruker AXS, Inc., Madison,
WI
T.N. Blanton, Eastman Kodak Company, Rochester, NY |
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Instructors: |
T. N. Blanton, Eastman Kodak Company,
Rochester, NY
R. Durst, B.B. He, U. Preckwinkel, Bruker AXS, Inc., Madison, WI
R. B. Ortega, Rigaku/MSC, The Woodlands, TX
R. Tissot, Sandia National Laboratories, Albuquerque, NM |
Continuation of W-9.
W-14 High
Resolution XRD (Evergreen B)
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Organized by: |
B. Tanner, University of Durham,
Durham, United Kingdom
D.K. Bowen, Bede Scientific Inc., Englewood, CO |
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Instructors: |
B. Tanner, University of Durham,
Durham, United Kingdom
D.K. Bowen, Bede Scientific Inc., Englewood, CO
M.S. Goorsky, UCLA, Los
Angeles, CA |
The workshop will provide both a basic
grounding in the techniques of high-resolution X-ray diffraction and a
perspective on the current state of application of the method in an industrial
context. Particular attention will be paid to the qualitative interpretation of
data taken in the triple axis geometry where the X-ray scattering is mapped in
reciprocal space. Laboratory based applications of grazing incidence diffraction
to measure in-plane strains and mosaic distribution will be discussed.
XRF
W-15
Quantitative Analysis II (Evergreen D)
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Organized by: |
M. Mantler, Vienna University of
Technology, Vienna, Austria |
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Instructors: |
M. Mantler, Vienna University of
Technology, Vienna, Austria
B. Vrebos, PANalytical, Almelo, The Netherlands
W.T. Elam, University of
Washington, Seattle, WA |
Continuation of W-12.
W-16 Basic TXRF
(Evergreen C)
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Organized by: |
M.A. Zaitz, IBM, Hopewell Junction, NY
P. Wobrauschek, Atominstitut der Österreichischen Universitäten, Vienna,
Austria |
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Instructors: |
M.A. Zaitz, IBM, Hopewell Junction, NY
P. Wobrauschek, C. Streli, Atominstitut der Österreichischen
Universitäten, Vienna, Austria |
This workshop will cover the basics of
total reflection X-ray fluorescence, as well as instrumentation, calibration,
and applications.
For more
information please contact Denise Flaherty - flaherty@icdd.com
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