Workshops
Monday, 4 August -Tuesday, 5 August
a.m. workshops: 9:00 a.m.–12:00 noon 
p.m. workshops: 2:00 p.m.–5:00 p.m.

 

Workshops, Tuesday a.m.

XRD

 W-9 Two-dimensional X-ray Diffraction I (Evergreen A)
Organizers & Instructors: B.B. He, Bruker AXS, Inc., Madison, WI
T.N. Blanton, Eastman Kodak Company, Rochester, NY
Instructors: T.N. Blanton, Eastman Kodak Company, Rochester, NY
R. Durst, B.B. He, U. Preckwinkel, Bruker AXS, Inc., Madison, WI
R.B. Ortega, Rigaku/MSC, The Woodlands, TX
R. Tissot, Sandia National Laboratories, Albuquerque, NM

Two-dimensional diffraction provides far more information than the conventional one-dimensional diffraction. In recent years, usage of two-dimensional diffraction has increased due to the advances in detector technology, point beam X-ray optics, software development and computing power. This workshop covers the recent progress in two-dimensional X-ray diffraction in terms of detector technology, geometry and configuration of two-dimensional diffractometer and various applications, such as phase ID, texture, stress, crystallinity, combinatorial screening and thin film analysis.

W-10 Backscatter Electron Diffraction (Evergreen B)
Organized by: R.P. Goehner, Sandia National Laboratories, Albuquerque, NM
Instructors: R.P. Goehner, R. Tissot, Sandia National Laboratories, Albuquerque, NM
S. Sitzman, HKL Technology Inc., Danbury, CT
S. Wright, TSL/EDAX, Darper, UT
A. Kleyn, Thermo Electron, Middleton, WI

This workshop will discuss the theory and practical applications of Electron Backscattered Diffraction (EBSD) alternately known as Kikuchi patterns in the Scanning Electron Microscope (SEM). The use of SEM for crystallographic applications will be discussed. The major applications areas that will be emphasized in the workshop are crystallographic texture (preferred orientation) measurements, crystallographic phase identification and the calculation of primitive cells from high quality EBSD. Three EBSD equipment manufactures will emphasize the applications of the EBSD technique.

XRF

W-11 Fundamentals of XRF (Evergreen C)
Organized by: J.V. Gilfrich, Emeritus, SFA, Inc. /NRL, Bethesda, MD
Instructors: J.V. Gilfrich, Emeritus, SFA, Inc. /NRL, Bethesda, MD 
F. Feret, Alcan International Ltd., Alcan, Québec, Canada 
S. Török, KFKI Atomic Energy Research Institute, Budapest, Hungary 

This workshop is intended to provide a basic background of the principles of XRF, specifically directed to those new to the field. It will consist of a general overview of the technique, followed by more specific details of particular applications by experts in those applications, to provide an understanding of the use of the principles previously described.

W-12 Quantitative Analysis I (Evergreen D)
Organized by: M. Mantler, Vienna University of Technology, Vienna, Austria
Instructors: M. Mantler, Vienna University of Technology, Vienna, Austria 
B. Vrebos, PANalytical, Almelo, The Netherlands 
W.T. Elam, University of Washington, Seattle, WA 

The workshop will cover: 

  • Empirical and theoretical methods of quantitative XRF 

  • Basic interactions and atomic (“fundamental”) parameters 

  • Sources and accuracy of atomic parameters and tube spectra 

  • Classical fundamental parameter methods 

  • Computed (theoretical) influence coefficients 

  • Compensation Methods 

  • Monte Carlo Methods 

  • Special cases and methods: 

    • Thin films 

    • Inhomogeneous specimens 

    • Light elements 

    • Analysis without standards

 

Workshops, Tuesday p.m.

XRD

W-13 Two-dimensional X-ray Diffraction II (Evergreen A)
Organized by: B.B. He, Bruker AXS, Inc., Madison, WI 
T.N. Blanton, Eastman Kodak Company, Rochester, NY
Instructors: T. N. Blanton, Eastman Kodak Company, Rochester, NY 
R. Durst, B.B. He, U. Preckwinkel, Bruker AXS, Inc., Madison, WI 
R. B. Ortega, Rigaku/MSC, The Woodlands, TX 
R. Tissot, Sandia National Laboratories, Albuquerque, NM

Continuation of W-9. 

W-14 High Resolution XRD (Evergreen B)
Organized by: B. Tanner, University of Durham, Durham, United Kingdom 
D.K. Bowen, Bede Scientific Inc., Englewood, CO
Instructors: B. Tanner, University of Durham, Durham, United Kingdom 
D.K. Bowen, Bede Scientific Inc., Englewood, CO 
M.S. Goorsky, UCLA, Los Angeles, CA 

The workshop will provide both a basic grounding in the techniques of high-resolution X-ray diffraction and a perspective on the current state of application of the method in an industrial context. Particular attention will be paid to the qualitative interpretation of data taken in the triple axis geometry where the X-ray scattering is mapped in reciprocal space. Laboratory based applications of grazing incidence diffraction to measure in-plane strains and mosaic distribution will be discussed.


XRF

W-15 Quantitative Analysis II (Evergreen D)
Organized by: M. Mantler, Vienna University of Technology, Vienna, Austria
Instructors:  M. Mantler, Vienna University of Technology, Vienna, Austria 
B. Vrebos, PANalytical, Almelo, The Netherlands 
W.T. Elam, University of Washington, Seattle, WA

Continuation of W-12. 

W-16 Basic TXRF (Evergreen C)
Organized by: M.A. Zaitz, IBM, Hopewell Junction, NY 
P. Wobrauschek, Atominstitut der Österreichischen Universitäten, Vienna, Austria
Instructors: M.A. Zaitz, IBM, Hopewell Junction, NY 
P. Wobrauschek, C. Streli, Atominstitut der Österreichischen Universitäten, Vienna, Austria

This workshop will cover the basics of total reflection X-ray fluorescence, as well as instrumentation, calibration, and applications.

 

 

For more information please contact Denise Zulli - zulli@icdd.com