189 of 2004 DXC abstracts sorted by correspondent author's last name

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DETAILED CORRECTION PROCEDURE FOR X-RAY SPECTROSCOPIC DATA COLLECTED AT A SYNCHROTRON RADIATION FACILITY: SIMULATIONS AND EXPERIMENT
J.M. Ablett, C.-C. Kao, J.M. Ablett, C.-C. Kao
J.C. Woick, J.C. Woick
THIN BERYLLIUM WINDOW WITH HIGH-TEMPERATURE COMPATIBILITY
M.C. Roberts, E.C. Anderson, R. Stillwell, M.C. Roberts, E.C. Anderson, R. Stillwell
BAYESIAN CHARACTERISATION OF NANOCRYSTALLITES FROM LINE PROFILE DATA
N.Armstrong, W. Kalceff, N.Armstrong, W. Kalceff
J.P. Cline, J.P. Cline
D.R. Dowd, D.R. Dowd
BENCH TOP X-RAY FLUORESCENCE SPECTROMETERS BASED ON ORTHOGONAL AND TOTAL REFLECTION GEOMETRY FOR EXCITATION
R. Ayala Jiménez, R. Ayala Jiménez
STRESSES IN SHAPE MEMORY POLYMER MATRIX COMPOSITES FOR BIOMEDICAL APPLICATIONS
Davor Balzar*, Davor Balzar*
Ken Gall, Martin L. Dunn, and Yiping Liu, Ken Gall, Martin L. Dunn, and Yiping Liu
MEASUREMENT OF LARGE CRYSTALLITE SIZES IN POLY(OXYMETHYLENE)
R. Barton, Jr., R. Barton, Jr.
J.R. Lawson, J.R. Lawson
RECENT DEVELOPMENTS OF MULTILAYER OPTICS FOR X-RAY DIFFRACTOMETRY
A. Bauer*, C. Michaelsen, A. Oehr, C. Hoffmann, J. Wiesmann, A. Bauer*, C. Michaelsen, A. Oehr, C. Hoffmann, J. Wiesmann
A. Storm, L. Seijbel, A. Storm, L. Seijbel
IN SITU STUDIES OF NANO-PARTICLE GROWTH IN FLAMES
G. Beaucage, N. Agashe, G. Beaucage, N. Agashe
H.K. Kammler, S.E. Pratsinis, H.K. Kammler, S.E. Pratsinis
J. Ilavsky, P. Jemian, J. Ilavsky, P. Jemian
T. Narayanan, T. Narayanan
D. Londono, D. Londono
ANALYSIS OF RESIDUAL STRESS STATE OF HARDMETAL CARBIDE CUTTING TOOL SUBSTRATES
Michael F. Beblo, Michael F. Beblo
EQUA ALL - THE NEW STANDARDLESS SOLUTION FOR ENERGY DISPERSIVE X-RAY FLUORESCENCE
K. Behrens, K. Mauser, K. Behrens, K. Mauser
MEASUREMENT AND MODELING OF RESIDUAL STRESSES AT MICROSCOPIC AND MESOSCOPIC LEVELS USING MICRO RAMAN SPECTROSCOPY AND X-RAY DIFFRACTION
B. Benedikt, M. Lewis, P. Rangaswamy, B. Benedikt, M. Lewis, P. Rangaswamy
LATTICE STRAIN DEVELOPMENT AND STRAIN-INDUCED PHASE TRANSFORMATION DURING FATIGUE OF A COBALT-BASED SUPERALLOY
M.L. Benson, T.A. Saleh, P.K. Liaw, H. Choo, R.A. Buchanan, , M.L. Benson, T.A. Saleh, P.K. Liaw, H. Choo, R.A. Buchanan,
X.-L. Wang, A.D. Stoica,, X.-L. Wang, A.D. Stoica,
M.R. Daymond, , M.R. Daymond,
D.W. Brown, D.W. Brown
D.L. Klarstrom,, D.L. Klarstrom,
SULFUR ANALYSIS IN FUELS, A NEW APPROACH USING MONOCHROMATIC WAVELENGTH DISPERSIVE X-RAY FLUORESCENCE (MWD XRF)
B. Beumer, Z. Chen, F. Wei, I. Radley, B. Beumer, Z. Chen, F. Wei, I. Radley
AN IN SITU HIGH-TEMPERATURE X-RAY DIFFRACTION STUDY OF PHASE TRANSFORMATIONS IN SILVER BEHENATE
T.N. Blanton, T.N. Blanton
S. Misture, S. Zdzieszynski, M. Nicholas, S. Misture, S. Zdzieszynski, M. Nicholas
STRUCTURE DETAILS OF POLYMORPHISM IN ORGANIC LIGHT EMITTING DIODE (OLED) MATERIAL, Alq3
M. Rajeswaran, T.N. Blanton, M. Rajeswaran, T.N. Blanton
QUANTITATIVE ANALYSIS OF CALCIUM OXIDE DESICCANT CONVERSION TO CALCIUM HYDROXIDE USING X-RAY DIFFRACTION
T.N. Blanton, C.L. Barnes, T.N. Blanton, C.L. Barnes
LARGE AREA SILICON DRIFT DETECTORS FOR XRF APPLICATIONS
O. Boslau, O. Boslau
T. Eggert, T. Eggert
P. Goldstrass, P. Goldstrass
THEBEE ELECTRIC FLUXER…WHY YOU SHOULD MAKE IT YOURS!
F. Bouker, F. Bouker
PARALLEL BEAM XRD: HIGH ACCURACY DATA FROM POWDERS AND POLYCRYSTALLINE THIN FILMS
D.K. Bowen, D.K. Bowen
THE DIRECT DETERMINATION OF X-RAY DIFFRACTION DATA FROM SPECIFIC DEPTHS
A Broadhurst*, K D Rogers, D W Lane, A Broadhurst*, K D Rogers, D W Lane
T W Lowe, T W Lowe
APPLICATIONS OF SAMPLE/SPECIMEN PREPARATION FOR XRF ANALYSIS IN THE CEMENT AND CONCRETE INDUSTRIES
D. Broton, D. Broton
NEW SEQUENTIAL XRF: PERFORMANCE IMPROVEMENTS THROUGH INNOVATIVE DESIGN
A. Buman, R. Yellepeddi, A. Buman, R. Yellepeddi
DISLOCATIONS DENSITY AND CHARACTER EVOLUTION IN PURE CU DEFORMED BY ROLLING UNDER LIQUID NITROGEN FORM X-RAY PEAK PROFILE ANALYSIS
I. Dragomir-Cernatescu, M. Gheorghe, N. Thadhani, R. L. Snyder, I. Dragomir-Cernatescu, M. Gheorghe, N. Thadhani, R. L. Snyder
X-RAY DIFFRACTOMETRY STUDIES AND LATTICE PARAMETER CALCULATION ON KNO3-NH4NO3 SOLID SOLUTIONS
W.-M. Chien, D. Chandra, J. Smith, W.-M. Chien, D. Chandra, J. Smith
C.J. Rawn , C.J. Rawn
A.K. Helmy, A.K. Helmy
PHASE EQUILIBRIA DETERMINATION OF NH4NO3-KNO3 MIXTURES BY USING X-RAY DIFFRACTION METHOD
W.-M. Chien, D. Chandra, J. Smith, W.-M. Chien, D. Chandra, J. Smith
C.J. Rawn, C.J. Rawn
A.K. Helmy, A.K. Helmy
NOVEL X-RAY REFLECTOMETRY ANALYSIS OF MULTILAYER THICK FILMS
Z.D. Chen, Z.D. Chen
J. Higgins, D. Nelson, J. Higgins, D. Nelson
VERY LOW ANGLE OR LARGE D-SPACING WORK USING A PLANAR X-RAY WAVEGUIDE RESONATOR AS A PRIMARY COLLIMATOR ON A CONVENTIONAL POWDER X-RAY DIFFRACTOMETER
R. Clapp, R. Clapp
QUANTITATIVE EVALUATION OF GRADED PARABOLIC MULTILAYER OPTICS
J.P. Cline, D. Windover, A. Henins, J.P. Cline, D. Windover, A. Henins
X-RAY SCATTERING AND DSC STUDIES OF PRE-MELTING CRYSTALLIZATION BEHAVIOR IN NYLON 6
S.T. Correale, S.T. Correale
N.S. Murthy, N.S. Murthy
ACCURATE DETERMINATION OF ORGANIC CRYSTAL STRUCTURES FROM POWDER DIFFRACTION DATA
W.I.F David, W.I.F David
DEVELOPMENT OF XRD IN EL SALVADOR
E. de Henríquez,, E. de Henríquez,
FULL-PATTERN CLUSTER ANALYSIS ON X-RAY POWDER DIFFRACTION DATA
T. Degen, T. Degen
LAUE MICRODIFFRACTION FOR STRUCTURE ANALYSIS AT ULTRA HIGH PRESSURE (LAMSA UHP) - AN OLD SOLUTION TO A NEW PROBLEM
P. Dera, P. Dera
TEXTURE OF NiSi FILMS ON SINGLE CRYSTAL SILICON
C. Detavernier, C. Detavernier
WDXRF ANALYSIS OF THIN LAYERS
M.W. Dirken, M.W. Dirken
TEMPERATURE CALIBRATION FOR HIGH-TEMPERATURE X-RAY DIFFRACTION
M.D. Dolan, S.I. Zdzieszynski, S.T. Misture,, M.D. Dolan, S.I. Zdzieszynski, S.T. Misture,
INVESTIGATION OF REACTION KINETICS IN CERAMIC SYSTEMS
M.D. Dolan, ST. Misture,, M.D. Dolan, ST. Misture,
MODELLING THE RESPONSE OF SILICON X-RAY DETECTORS
T. Eggert, T. Eggert
WAVEGUIDE-RESONATOR APPLICATION FOR DIRECT X-RAY FLUORESCENCE ANALYSIS OF GAS MIXTURES
V.K. Egorov, E.V. Egorov, T.V. Bil’chic, V.K. Egorov, E.V. Egorov, T.V. Bil’chic
RESIDUAL STRESSES AND SIZE-STRAIN PHENOMENA IN THERMALLY CYCLED Cu LAYERS ON ANISOTROPICAL SiO2(110) SUBSTRATES
E. Eiper, E. Eiper
M. Hafok, M. Hafok
C. Eisenmenger-Sittner, C. Eisenmenger-Sittner
J. Keckes, J. Keckes
MICRO-XRF ANALYSIS OF THIN FILMS AND COATINGS USING FUNDAMENTAL PARAMETERS
W.T. Elam, R.B. Shen, B. Scruggs, J. Nicolosi, W.T. Elam, R.B. Shen, B. Scruggs, J. Nicolosi
DEVELOPMENT OF MATERIALS ANALYSIS TOOLS FOR STUDYING NOx ADSORBER CATALYSTS
R. England, H. Fang, T. Yonushonis, R. England, H. Fang, T. Yonushonis
T. Watkins, L. Allard, D. Blom, M. Lance, C. Narula, H. Meyer, T. Watkins, L. Allard, D. Blom, M. Lance, C. Narula, H. Meyer
DDVIEW+, A NEW INTERFACE FOR ICDD PDF-4 DATABASES: THE USE OF USER-SELECTABLE SEARCH PREFERENCES FOR DATA MINING AND TOTAL PATTERN DISPLAY
J. Faber, J. Blanton, J. Faber, J. Blanton
HIGH ENERGY EDGE-ENHANCED IMAGING WITH BROADBAND X-RAYS
Kamel Fezzaa, Kamel Fezzaa
PRECIOUS METALS USE AND CARE IN SAMPLE PREPARATION
C. Fiorica, C. Fiorica
X-RAY AND NEUTRON FIBRE DIFFRACTION STUDIES OF SYNTHETIC POLYMERS
T. Forsyth,, T. Forsyth,
XRF ANALYSIS OF HARMFUL METALS COLLECTED ONTO FILTERS AS THIN LAYERS FROM WORKPLACE AIR: INTER-LABORATORY EXERCISE
R. Foster, R. Foster
EXPERIMENTAL EVALUATION OF THE TEMPERATURE ACCURACY OF THE OXFORD PHENIX CRYOSTAT – A COOL JOB
M. Fransen, J. Vasterink, M. Fransen, J. Vasterink
THE INFLUENCE OF X-RAY TUBE AND DETECTOR SETTINGS ON THE PEAK-TO-BACKGROUND RATIO OF THE POWDER DIFFRACTOGRAM
M.J. Fransen, M.J. Fransen
PARALLEL BEAM GEOMETRY AFTER THE HYPE
M. Fransen, M. Fransen
PROCEDURE TO CONSIDER FOR FUSING COPPER/IRON SULFIDE CONCENTRATES
J.P. Gagnon, J.P. Gagnon
MICRO WDXRF AND ITS INDUSTRIAL APPLICATIONS
N. Gao*, Z. Chen, N. Gao*, Z. Chen
STRUCTURE DETERMINATION OF POLYMER FIBER USING DIRECT METHOD TECHNIQUES
K.H. Gardner, K.H. Gardner
RIETVELD PROCESSING OF PHASES IN HIGHLY TEXTURED REFRACTORY STEELS
J.L. Garin, R.L. Mannheim, J.L. Garin, R.L. Mannheim
INTERNAL STRAIN PROFILE AROUND THE CRACK TIP AND ITS INFLUENCE ON HYDRIDE FORMATION IN ZIRCALOY-4
E. Garlea*, B. Yang, M. M. Morrison, R. A. Buchanan, P. K. Liaw, E. Garlea*, B. Yang, M. M. Morrison, R. A. Buchanan, P. K. Liaw
Hahn Choo, Hahn Choo
D. W. Brown, D. W. Brown
S. Park, L. L. Daemen, S. Park, L. L. Daemen
H. F. Letzring, H. F. Letzring
C. R. Hubbard, C. R. Hubbard
RAPID EDXRF TECHNIQUES FOR MATERIALS TESTING
S.J. Goldstein*, T.M. Ellis, S.M. Trujillo, L.B. Davenhall, L.D. Sivils, S.J. Goldstein*, T.M. Ellis, S.M. Trujillo, L.B. Davenhall, L.D. Sivils
SCRATCH TEST OF THIN FILMS HAVING RESIDUAL STRESS AND FIBER TEXTURE
M. Gotoh, T. Sasaki, Y. Hirose, M. Gotoh, T. Sasaki, Y. Hirose
A MONTE CARLO CODE FOR SIMULATION OF PULSE PILE-UP SPECTRAL DISTORTION IN PULSE-HEIGHT MEASUREMENT
R.P. Gardner, W. Guo, F. Li, R.P. Gardner, W. Guo, F. Li
DEVELOPMENT OF A MONTE CARLO - LIBRARY LEAST-SQUARES (MCLLS) CODE PACKAGE FOR THE EDXRF INVERSE PROBLEM
R.P. Gardner, W. Guo, R.P. Gardner, W. Guo
HIGH TEMPERATURE IN SITU X-RAY DIFFRACTION OF THE SIO2-MG DISPLACEMENT REACTION
Michael S. Haluska, Michael S. Haluska
Kenneth Sandhage, Kenneth Sandhage
Robert L. Snyder, Robert L. Snyder
HIGH TEMPERATURE X-RAY DIFFRACTION AND ELECTRON MICROSOPY OF Bl2SR2NB2FAO11.5
Michael S. Haluska, Michael S. Haluska
Scott T. Misture, Scott T. Misture
CONFOCAL X-RAY FLUORESCENCE MICROSCOPE
G. J. Havrilla, G. J. Havrilla
N. Gao, N. Gao
POLYCAPILLARY OPTICS IN MICRO X-RAY FLUORESCENCE
G. J. Havrilla, G. J. Havrilla
MICRO X-RAY FLUORESCENCE AS AN ANALYTICAL TOOL IN CASHMERE HAIR CHARACTERIZATION
S. Wiltshire, G.J. Havrilla*, T. Miller, S. Wiltshire, G.J. Havrilla*, T. Miller
D. Exline, D. Exline
ORIENTED ANTHRACENE AND PENTACENE THIN FILMS
R.L. Headrick, H. Zhou, R.L. Headrick, H. Zhou
R. Ruiz, A.C. Mayer, G.G. Malliaras, R. Ruiz, A.C. Mayer, G.G. Malliaras
A. Kazimirov, A. Kazimirov
REACTION SEQUENCE AND KINETICS ANALYSIS FOR SYSNTHESIS OF BULK Bi4Ti3O12
Henriques*, Haluska*, Dolan*, M.S. Peterson*, S.T. Misture, Henriques*, Haluska*, Dolan*, M.S. Peterson*, S.T. Misture
INVESTIGATION OF THE MICRO STRUCTURE OF ENERGETIC CRYSTALS BY MEANS OF X-RAY POWDER DIFFRACTION
M. Herrmann,, M. Herrmann,
FAST IN-SITU X-RAY DIFFRACTION STRESS ANALYSIS DURING HEAT TREATMENT CYCLES OF STEEL
T.K. Hirsch, A. da Silva Rocha, T.K. Hirsch, A. da Silva Rocha
SIMULTANEOUS SAXS/WAXD STUDY OF IN-SITU POLYMER PROCESSING
B.S. Hsiao, B.S. Hsiao
A REVIEW OF COMPACT, LOW-POWER, ON-LINE, DIFFRACTION-BASED ANALYZERS
H. Huang, W.M. Gibson,, H. Huang, W.M. Gibson,
LARGE SPECIMEN X-RAY AND NEUTRON DIFFRACTION RESIDUAL STRESS FACILITIES
C. R. Hubbard*,T. R. Watkins, M. C. Wright, A. D. Stoica, W. B. Bailey, C. R. Hubbard*,T. R. Watkins, M. C. Wright, A. D. Stoica, W. B. Bailey
IMPACT OF DIFFERENT STRENGTHENING MECHANISMS ON INTERGRANULAR STRAINS IN DEFORMED ALUMINUM ALLOYS
C.R. Hubbard, J. Pang,, C.R. Hubbard, J. Pang,
T.A. Saleh, J.W. Jeon, P.K. Liaw, T.A. Saleh, J.W. Jeon, P.K. Liaw
H. Choo, H. Choo
D.W. Brown, M.A.M. Bourke, D.W. Brown, M.A.M. Bourke
GRAZING-INCIDENT X-RAY DIFFRACTION ANALYSES OF NOVEL MAGNETIC THIN FILMS
K. Inaba, Y. Ito, K. Omote, H. Toraya,, K. Inaba, Y. Ito, K. Omote, H. Toraya,
PPB ANALYSIS BY XRF; A NEW MICRO-DROPLET METHOD FOR ENVIRONMENTAL LIQUID SAMPLE
T. Moriyama*, Y. Yamada, H. Kohno, T. Moriyama*, Y. Yamada, H. Kohno
H. Inoue, J. Martin, H. Inoue, J. Martin
IMPROVING ENERGY STABILITY IN THE NIST MICROCALORIMETER X-RAY DETECTOR
T. Jach, J.A. Small, D.E. Newbury,, T. Jach, J.A. Small, D.E. Newbury,
DIFFRACTIVE KIRKPATRICK-BAEZ OPTIC FOR MICRO X-RAY FLUORESCENCE
B. Verman, B. Kim, D. Wilcox, R. Samokyszyn, L. Jiang, B. Verman, B. Kim, D. Wilcox, R. Samokyszyn, L. Jiang
THE X-RAY FLUORESCENCE ANALYSIS OF CHLORINE IN PALLADIUM MATERIALS
A.R. Jurgensen, D.M. Missimer , R.L. Rutherford,, A.R. Jurgensen, D.M. Missimer , R.L. Rutherford,
HIGH TEMPERATURE PHASE TRANSFORMATIONS IN RARE EARTH TITANATES
K. Jurkschat, P. Sarin, W. M. Kriven, K. Jurkschat, P. Sarin, W. M. Kriven
CRYSTAL STRUCTURE OF GUAIFENESIN, 3-(2-METHOXYPHENOXY)-1,2-PROPANEDIOL
James A. Kaduk, James A. Kaduk
STRUCTURAL INVESTIGATION OF (Ba1-xSrx)2TiO4 USING SYNCHROTRON AND LABORATORY X-RAY
J.A. Kaduk, J.A. Kaduk
W. Wong-Ng, J. Frank, W. Wong-Ng, J. Frank
EFFECT OF MICROCRACKS AND RESIDUAL STRESS OF Cr PLATING LAYER ON FATIGUE STRENGTH
Y. KOBAYASHI, J. NAGASAWA, Y. KOBAYASHI, J. NAGASAWA
Y. KANEMATSU,T. SASAKI, Y. HIROSE, Y. KANEMATSU,T. SASAKI, Y. HIROSE
SIMULTANEOUS EVALUATION OF TOTAL AND THERMAL STRAINS/STRESSES IN THERMALLY CYCLED THIN FILMS
Jozef Keckes, Jozef Keckes
IN-SITU SYNCHROTRON WAXS ON WOOD FOILS AND ON INDIVIDUAL WOOD CELLS COMBINED WITH MICROTENSILE TESTS
Jozef Keckes, Jozef Keckes
I. Burgert, P. Fratzl, I. Burgert, P. Fratzl
M. Müller, K. Kölln, M. Müller, K. Kölln
S. E. Stanzl-Tschegg, S. E. Stanzl-Tschegg
S. V. Roth, S. V. Roth
GETTING THE HOT STRUCTURES
K.F. Kelton, K.F. Kelton
IN SITU X-RAY INVERSTIGATIONS ON DIFFERENT DEHYDRATIONSTAGES OF MANGANEOUS LAYERED DOUBLE HYDROXIDES
U.König, H. Pöllmann, U.König, H. Pöllmann
THE STRUCTURE OF LIQUID AL ALLOYS AT HIGH SUPERHEATS USING HIGH ENERGY X-RAYS
M.J. Kramer, M.J. Kramer
J.R. Morris, J.R. Morris
U. Dahlborg, U. Dahlborg
APPLICATIONS OF QUANTITATIVE XRD PHASE ANALYSIS IN ALUMINIUM INDUSTRY
K.V. Krishnan, K.V. Krishnan
SWAXS SYSTEM- 3 : THE NEW GENERATION OF AUTOMATED SMALL- AND WIDE-ANGLE X-RAY SYSTEMS
P. Laggner, R. Koschuch, M. Kriechbaum, P. Laggner, R. Koschuch, M. Kriechbaum
LOOKING AT SMALL HOLES: CROSS-VALIDATION OF SAXS- AND BET- POROSIMETRY
P. Laggner, P. Laggner
FROM LAB TO FAB: THE DEVELOPMENT AND DEPLOYMENT OF NEW METROLOGY TECHNOLOGY FOR THE GLOBAL SEMICONDUCTOR INDUSTRY
B. Landes, B. Kern, J. Niu, C. Mohler, J. Hahnfeld, D. Yontz, B. Landes, B. Kern, J. Niu, C. Mohler, J. Hahnfeld, D. Yontz
J. Quintana, S. Weigand, J. Quintana, S. Weigand
HIGH RESOLUTION X-RAY DIFFRACTION:COMPARISON OF DIFFRENT OPTIC CONFIGURATIONS
R.A. Larsen, C. Riese, M. Fransen, R.A. Larsen, C. Riese, M. Fransen
J. Higgins, J. Higgins
11-BM, A DEDICATED HIGH-RESOLUTION POWDER DIFFRACTION BEAMLINE AT THE ADVANCED PHOTON SOURCE
P.L. Lee*, M.A. Beno, R.B. Von Dreele, D. Shu, C. Kurtz, G. Jennings, P.L. Lee*, M.A. Beno, R.B. Von Dreele, D. Shu, C. Kurtz, G. Jennings
J.D. Jorgensen, J.F. Mitchell, J.D. Jorgensen, J.F. Mitchell
IN-SITU STRUCTURE DEVELOPMENT DURING THE MELT SPINNING OF NYLON 66
J. D. Londono, H. Chang, R. V. Davidson, J. Potter, J. D. Londono, H. Chang, R. V. Davidson, J. Potter
STRATEGIES FOR PARALLEL BEAM DIFFRACTION ANALYSIS OF MESOPOROUS THIN FILMS
K. Macchiarola, C. Reiss, B. Kinneging, K. Macchiarola, C. Reiss, B. Kinneging
IDENTIFICATION OF CONTAMINATIONS ON WAFERS BY X-RAY FLUORESCENCE TECHNIQUE
S. Maeo, K. Taniguchi, S. Maeo, K. Taniguchi
T. KUROSAWA, K. AIKOH, I. HOURAI, T. KUROSAWA, K. AIKOH, I. HOURAI
ETCHING METHODS FOR IMPROVING SURFACE IMPERFECTIONS OF DIAMONDS USED FOR X-RAY MONOCHROMATORS
J.A. Maj, A.T. Macrander, S.F. Krasnicki, Y. Zhong, R. Khachatryan,, J.A. Maj, A.T. Macrander, S.F. Krasnicki, Y. Zhong, R. Khachatryan,
COMPARISON OF COMPUTED ABSOLUTE FLUORESCENCE PHOTON COUNTS WITH DATA FROM FULLY CALIBRATED BEAMLINES AND DETECTORS AT PTB/BESSY-II
M. Mantler, M. Mantler
B. Beckhoff, M. Kolbe, G. Ulm, B. Beckhoff, M. Kolbe, G. Ulm
FLUORESCENCE EXCITATION OF Pb Kalpha RADIATION AND BACKGROUND FROM SCATTERED PRIMARY RADIATION: RESULTS FROM EXPERIMENTS AT HASYLAB AND FROM THEORETICAL MODELS
M. Mantler, P. Wobrauschek, N. Zoeger, G. Pepponi, C. Streli, M. Mantler, P. Wobrauschek, N. Zoeger, G. Pepponi, C. Streli
G. Falkenberg,, G. Falkenberg,
Materials science applications of the three dimensional x-ray diffraction microscope
lawrence, margulies, lawrence, margulies
poulsen, henning, poulsen, henning
schmidt, soeren, schmidt, soeren
lauridsen, eric, lauridsen, eric
kvick, ake, kvick, ake
RELAXATION OF RESIDUAL STRESS IN SHOT PEENED Ti-6Al-4V DUE TO FRETTING FATIGUE
S. Martinez, S. Sathish, M. Blodgett, S. Martinez, S. Sathish, M. Blodgett
S. Mall, S. Mall
HIGH-RESOLUTION X-RAY TOPOGRAPHY APPARATUS USING A LINE-FOCUS HYBRID MONOCHROMATOR
D.E. McCready, M.B. Toloczko,, D.E. McCready, M.B. Toloczko,
THE ROLE OF STANDARDS AUSTRALIA IN ACHIEVING AND MAINTAINING ACCURACY AND PRECISION IN LITHIUM BORATE FUSION – XRF SPECTROMETRIC ANALYSIS.
Jorg G. H. Metz, Jorg G. H. Metz
MICRO X-RAY FLUORESCENCE IMAGING OF PHARMACEUTICAL TABLET FORMULATIONS
T. C. Miller *, T. C. Miller *
G.J. Havrilla, G.J. Havrilla
COMBINATORIAL DEVELOPMENT OF SPECIFIC RECEPTORS FOR RADIONUCLIDE DECONTAMINATION USING MICRO X-RAY FLUORESCENCE
T.C. Miller *, T.C. Miller *
M.L.Stanton, G.J. Havrilla, B.P. Warner, C.A. Wells, M.L.Stanton, G.J. Havrilla, B.P. Warner, C.A. Wells
A COMPARISON BETWEEN RIGAKU AND UNIQUANT QUANTITATIVE AND SEMI QUANTITATIVE SOFTWARE ROUTINES
D.M. Missimer, A.R. Jurgensen, R.L. Rutherford,, D.M. Missimer, A.R. Jurgensen, R.L. Rutherford,
FUNDAMENTAL PARAMETERS FITTING OF XRPD DATA MEASURED USING MULTILAYER OPTICS
Scott T. Misture, Scott T. Misture
Michael D. Dolan, Michael D. Dolan
ELASTIC PROPERTIES AND LAMELLAR STRUCTURE OF TiAl SYSTEM INTERMETALLIC COMPOUNDS
H. Hirose, H. Hirose
T. Murotani, , T. Murotani,
M. Gotoh, , M. Gotoh,
H. Tabata, H. Tabata
TRANSIENT STRESS EFFECTS IN THIN FILMS DETERMINED BY X-RAY DIFFRACTION
C.E. Murray, C.E. Murray
CHARACTERIZATION OF STRUCTURED FLUIDS DURING FLOW BY SMALL ANGLE NEUTRON SCATTERING
A.I. Nakatani, A.I. Nakatani
ACCURACY OF THE ANALYSIS OF GOLD ALLOYS WITH EDXRF
B. Nensel, B. Nensel
M. Haller,, M. Haller,
AUTOMATION IN RESEARCH AND PRODUCTION USING X-RAY POWDER DIFFRACTION
J.P. Nicolich, J.P. Nicolich
ADVANCED PULSE PROCESSING AND ANALYTICAL METHODS FOR QUANTITATIVE ENERGY DISPERSIVE XRF AND MICRO-EDXRF
J.A. Nicolosi, R.B. Shen, B. Scruggs, W.T. Elam, M. Solazzi,, J.A. Nicolosi, R.B. Shen, B. Scruggs, W.T. Elam, M. Solazzi,
SAMPLING VOLUME CONCERNS IN MICRO X-RAY DIFFRACTION
I.C. Noyan, I.C. Noyan
A NEW ULTRA FAST AND LOW NOISE X-RAY DETECTOR SYSTEM
K. Omote, A. Tsukiyama, M. Kuraibayashi, T. Saito,, K. Omote, A. Tsukiyama, M. Kuraibayashi, T. Saito,
QUANTITATIVE ANALYSIS OF SINGLE PARTICLES BY COMBINATION OF X-RAY MICROANALYSIS AND MONTE CARLO SIMULATIONS
J. Osán*, S. Török, J. Osán*, S. Török
L. Vincze, L. Vincze
CHARACTERIZATION OF SEDIMENTS IN NORTHEAST-HUNGARIAN RIVERS USING SINGLE-PARTICLE X-RAY EMISSION AND ABSORPTION METHODS
J. Osán*, S. Török, S. Kurunczi, A. Alsecz, J. Osán*, S. Török, S. Kurunczi, A. Alsecz
G. Falkenberg, G. Falkenberg
R. Van Grieken, R. Van Grieken
XRF APPLICATIONS IN THE SILICA INDUSTRY
M.L. Paige, M.L. Paige
EFFECT OF CRYSTAL SIZE ON QUANTITATIVE ESTIMATION OF SILICA POLYMORPHS IN SILICA BRICKS BY X-RAY DIFFRACTION
P. Sahu, B.K. Panda, J.D. Panda, P. Sahu, B.K. Panda, J.D. Panda
ADVANCES IN THERMOELECTRICALLY COOLED Si-PIN X-RAY DETECTORS
A. Huber, J. Pantazis, R. Redus, T. Pantazis, A. Huber, J. Pantazis, R. Redus, T. Pantazis
DIFFRACTION STUDIES OF ORDER-DISORDER AT HIGH PRESSURES AND TEMPERATURES: TRANSITIONS IN DOLOMITE AND ANHYDRITE
J.B. Parise, S. Antao, J.B. Parise, S. Antao
Wilson Crichton, Wilson Crichton
IN-SITU HTXRD CHARACTERIZATION FOR THIN FILMS
E. Andrew Payzant*, E. Andrew Payzant*
Scott A. Speakman, Scott A. Speakman
LONG-RANGE AND SHORT-RANGE ORDERING IN Y-DOPED La2Zr2O7
E.A. Payzant*, S.A. Speakman, R.D. Carneim, T.R. Armstrong, E.A. Payzant*, S.A. Speakman, R.D. Carneim, T.R. Armstrong
T.E. Proffen, T.E. Proffen
CHEMICAL-PHYSICAL CHARACTERISATION OF POLLEN WITH TXRF AND TOF-SIMS
G. Pepponi, P. Lazzeri, G. Pepponi, P. Lazzeri
E. Gottardini, F. Cristofolini, F. Corradini, E. Gottardini, F. Cristofolini, F. Corradini
G. Clauser, G. Clauser
A. Torboli, A. Torboli
GI-XRF, SIMS, MEIS: COMPLEMENTARY TECHNIQUES FOR THE CHARACTERISATION OF ARSENIC ULTRA SHALLOW JUNCTIONS
G. Pepponi, D. Giubertoni, M. Barozzi, M. Bersani, G. Pepponi, D. Giubertoni, M. Barozzi, M. Bersani
N. Zoeger, C. Streli, N. Zoeger, C. Streli
M. Werner, J.A. van den Berg, M. Werner, J.A. van den Berg
COMPLEX DESCRIPTION OF SUBSTRUCTURE, RESIDUAL STRAIN AND LATTICE DEFECTS IN TEXTURED METAL MATERIALS BY USE OF GENERALIZED POLE FIGURES
Yu. Perlovich, M. Isaenkova, Yu. Perlovich, M. Isaenkova
RESIDUAL MICROSTRESS DISTRIBUTION IN TEXTURED METAL MATERIALS: METHOD OF STUDY AND REVEALED PRINCIPLES
Yu. Perlovich, M. Isaenkova, V. Fesenko, Yu. Perlovich, M. Isaenkova, V. Fesenko
3D structure of dendritic and hyper-branched macromolecules by x-ray diffraction
Valeri Petkov, Valeri Petkov
ANALYSIS OF TOXIC METALS IN PLASTICS FOR COMPLIANCE WITH ENVIRONMENTAL REGULATIONS
S. Piorek,, S. Piorek,
XRD investigations in anhydrous and hydrous cementitious systems
Herbert, Herbert
Pöllmann, Pöllmann
,
Methanesulfonatehydrates – Synthesis and XRD Investigations
*Pöllmann Herbert, *Pöllmann Herbert
Stöber Stefan, Stöber Stefan
Tewelde Mulugheta, Tewelde Mulugheta
Wagner Cristof, Wagner Cristof
Merzweiler Kurt, Merzweiler Kurt
BRUKER AXS SUPER SPEED SOLUTIONS FOR X-RAY DIFFRACTION APPLICATIONS
U. Preckwinkel, B. He, L. Bruegemann, U. Preckwinkel, B. He, L. Bruegemann
NONDESTRUCTIVE TESTING OF MOISTURE DISTRIBUTION IN WOOD USING PULSED NEUTRON SOURCE
M. A. Reda* and J. F. Harmon, M. A. Reda* and J. F. Harmon
MINIATURE X-RAY TUBES UTILIZING CARBON NANOTUBE-BASED COLD CATHODES
A. Reyes-Mena, D. Clark Turner, E. Bard, C. Jensen, A. Reyes-Mena, D. Clark Turner, E. Bard, C. Jensen
Q. Qiu, B. Gao, J. Lu, O. Zhou, Q. Qiu, B. Gao, J. Lu, O. Zhou
TEMPERATURE EXPERIMENTS FOR IMPROVING ACCURACY IN THE CALCULATION OF THE DEGREE OF CRYSTALLINITY OF POLYAMIDE-11
P. Ricou, E. Pinel, N. Juhasz,, P. Ricou, E. Pinel, N. Juhasz,
FOCUSSING FOR MORE FLUX OR HOW TO SHAPE X-RAYS
A. Dariel, V. Roger, R. Siebrecht, D. Cenda, C. Montcalm, P. Høghøj, A. Dariel, V. Roger, R. Siebrecht, D. Cenda, C. Montcalm, P. Høghøj
XRD INVESTIGATION OF CHEMICALLY DEACTIVATED AUTOMOTIVE CATALYTIC CONVERTERS
M.H. Rossouw*, J. Tshilongo, W.H. Jordaan, M.H. Rossouw*, J. Tshilongo, W.H. Jordaan
COST-EFFECTIVE PROBLEM SOLVING WITH PORTABLE XRF
R. Koch, K. Russell, D. Sackett,, R. Koch, K. Russell, D. Sackett,
RESIDUAL STRESS IN UNI-DIRECTIONALLY DEFORMED SURFACE LAYER BY SHOTPEENING ON SPRING STEEL
T. Sakakibara, , T. Sakakibara,
Y. Sato,, Y. Sato,
X-RAY MICRODIFFRACTION STUDIES OF CORROSION SCALES IN OLD IRON/STEEL DRINKING WATER DISTRIBUTION PIPES
P. Sarin*, W.M. Kriven, P. Sarin*, W.M. Kriven
V.L. Snoeyink, V.L. Snoeyink
D. Hay, D. Hay
IN-SITU HIGH TEMPERATURE (UP TO 1650ºC), IN AIR, X-RAY DIFFRACTION (REFLECTION GEOMETRY) USING A QUADRUPOLE LAMP FURNACE
P. Sarin*, K. Jurkschat, W.M. Kriven, P. Sarin*, K. Jurkschat, W.M. Kriven
P. Zschack, P. Zschack
VIBRATING SAMPLE HOLDER FOR XRD ANALYSIS WITH MINIMAL SAMPLE PREPARATION
P. Sarrazin, , P. Sarrazin,
S. Chipera, D. Vaniman, , S. Chipera, D. Vaniman,
D. Bish,, D. Bish,
D. Blake,, D. Blake,
MATERIAL EVALUATION OF RAILS BY X-RAY STRESS MEASUREMENT
T. Sasaki, Y. Kanematsu, Y. Hirose, , T. Sasaki, Y. Kanematsu, Y. Hirose,
Y. Sato, K. Iwafuchi, , Y. Sato, K. Iwafuchi,
K. Hiratsuka, , K. Hiratsuka,
T. Yamane,, T. Yamane,
SAXSess - AN ANALYTICAL TOOL FOR NANOSTRUCTURED MATERIALS
H. Schnablegger, H. Schnablegger
A. Bergmann, O. Glatter, A. Bergmann, O. Glatter
A NOVEL APPLICATION OF PULSED X-RAY IN LASER MATTER INTERACTION
F. A. Selim*, D. P.Wells, J. F. Harmon, F. A. Selim*, D. P.Wells, J. F. Harmon
STUDY OF DYNAMIC AND STATIC STATES OF SHOCK WAVES INDUCED DEFORMATION
F. A. Selim*, D. P. Wells, J. F. Harmon and J. Williams, F. A. Selim*, D. P. Wells, J. F. Harmon and J. Williams
STUDY OF THE PbS CONDENSATE THIN FILMS BY SAXS METHOD
L. Skatkov*, L. Skatkov*
P. Cheremskoy, E.Sobol, O.Sobol, A. Panikarsky, V.Gomozov, P. Cheremskoy, E.Sobol, O.Sobol, A. Panikarsky, V.Gomozov
THE EVOLUTION OF TOTAL PATTERN ANALYSIS
R.L. Snyder, R.L. Snyder
PROGRESS WITH SILICON DRIFT DETECTORS USED FOR HIGH RESOLUTION - HIGH COUNT RATE X-RAY SPECTROSCOPY
H.Soltau*,P.Lechner, H.Soltau*,P.Lechner
G.Lutz,L.Strueder, G.Lutz,L.Strueder
C.Fiorini,A.Longoni, C.Fiorini,A.Longoni
CHARACTERIZING HAFNIUM SILICATE GATE DIELECTRICS WITH A TOTAL REFLECTION X-RAY FLUORESCENCE SPECTROMETER
Chris Sparks*, Pat Lysaght, Todd Rhoad, Chris Sparks*, Pat Lysaght, Todd Rhoad
USING STRUCTURE-PROPERTY RELATIONSHIPS TO SELECT AMONG CANDIDATE SYSTEM FOR HIGH-TEMPERATURE PROTON CONDUCTOR DEVELOPMENT
S.A. Speakman*, E.A. Payzant, and T.R. Armstrong, S.A. Speakman*, E.A. Payzant, and T.R. Armstrong
TRACE ELEMENT ANALYSIS USING A BENCHTOP TXRF-SPECTROMETER
H. Stosnach, H. Stosnach
TXRF- VERSATILE APPLICATIONS IN DEPTH PROFILING, SPECIATION BY XANES AND ULTRA TRACE ELEMENT ANALYSIS INCLUDING LOW Z ELEMENTS
C. Streli, C. Streli
A NEW SETUP FOR SYNCHROTRON RADIATION INDUCED TXRF AT HASYLAB, BEAMLINE L FOR ULTRA TRACE ANALYSIS USING A SILICON DRIFT DETECTOR
C. Streli, P. Wobrauschek, C. Jokubonis, C. Streli, P. Wobrauschek, C. Jokubonis
G.Pepponi, G.Pepponi
G.Falkenberg, G.Falkenberg
G.Zaray, G.Zaray
COMPARISON OF RESPONSE FUNCTION FITTING WITH QXAS-AXIL NON LINEAR LEAST SQUARE FITTING- SPECTRA EVALUATION OF LOW Z ELEMENTS
H.Kaldarar, C.Streli, H.Kaldarar, C.Streli
INVESTIGATION OF CU-GETTERING ON SI WAFER STRUCTURES WITH SR-µ-XRF
C.Jokubonis, C.Streli, P.Wobrauschek, C.Jokubonis, C.Streli, P.Wobrauschek
G.Pepponi, G.Pepponi
C.Mantler, L.Fabry, C.Mantler, L.Fabry
G.Falkenberg, G.Falkenberg
POWDER DIFFRACTION ANALYSIS OF HYDRAULIC CEMENTS: ASTM RIETVELD ROUND ROBIN FOR PRECISION AND BIAS
P. Stutzman, P. Stutzman
CHANGES IN ELASTIC STRAIN PROFILES AROUND A CRACK TIP DURING TENSILE LOADING AND UNLOADING CYCLES
Y. Sun,H. Choo,P. K. Liaw,Y. L. Lu,B. Yang, Y. Sun,H. Choo,P. K. Liaw,Y. L. Lu,B. Yang
H. Choo, H. Choo
D. W. Brown, D. W. Brown
ELEMENT-IDENTIFIED THREE-DIMENSIONAL ATOMIC IMAGING BY COMPLEX X-RAY HOLOGRAPHY
Y. Takahashi*, K. Hayasji, E. Matsubara, Y. Takahashi*, K. Hayasji, E. Matsubara
EVALUATION OF LOCAL SHORT-RANGE ORDER AROUND Fe ATOMS IN FePt FILMS BY X-RAY FLUORESCENCE HOLOGRAPHY
Y. Takahashi*, K. Hayashi, E. Matsubara, T. Shima, K. Takanashi, Y. Takahashi*, K. Hayashi, E. Matsubara, T. Shima, K. Takanashi
IN-SITU STRUCTURAL STUDIES OF SEMICRYSTALLINE POLYMER BLENDS USING SYNCHROTRON RADIATION
P. Thiyagarajan, S. Seifert, P. Thiyagarajan, S. Seifert
M. Kipper, B. Narasimhan, M. Kipper, B. Narasimhan
Combination of Scanning Probe Microscope and X-ray Analysis
K. Tsuji, T. Emoto, Y. Matsuoka, K. Tsuji, T. Emoto, Y. Matsuoka
Y. Miyatake, T. Nagamura, Y. Miyatake, T. Nagamura
X. Ding, X. Ding
ULTRA-FAST SIMULTANEOUS FITTING OF SEVERAL BRAGG REFLECTIONS FROM AlAs/GaAs SUPERLATTICES USING METHOD OF EIGENWAVES
A.Ulyanenkov, A.Ulyanenkov
R.Eisenhower, R.Eisenhower
I.Feranchuk, I.Feranchuk
H.Guérault, H.Guérault
H.Ress, H.Ress
TIME-RESOLVED SMALL ANGLE SCATTERING STUDIES OF ALIGNMENT OF BLOCK COPOLYMER SOLUTIONS INDUCED BY ELECTRIC FIELDS
V. Urban, , V. Urban,
A. Böker, H. Elbs, H. Hänsel, A. Knoll, S. Ludwigs, H. Zettl, V. Abetz, A.H.E. Müller, G. Krausch, A. Böker, H. Elbs, H. Hänsel, A. Knoll, S. Ludwigs, H. Zettl, V. Abetz, A.H.E. Müller, G. Krausch
X-RAY MICRODIFFRACTION STUDY OF INDENTATION INDUCED FRACTURE IN SINGLE CRYSTAL BaTiO3
R.C. Rogan, E. Üstündag, M.A. Brown, R.C. Rogan, E. Üstündag, M.A. Brown
N. Tamura,, N. Tamura,
IN-SITU STUDY OF OXIDE GROWTH ON A KANTHAL ALLOY
E. Üstündag,, E. Üstündag,
J.D. Almer, , J.D. Almer,
J. Nychka, D.R. Clarke, J. Nychka, D.R. Clarke
HIGH ENERGY X-RAY DIFFRACTION INVESTIGATION OF THE FERROELECTRIC BEHAVIOR OF (Pb,La)(Zr,Ti)O3
R.C. Rogan, E. Üstündag,, R.C. Rogan, E. Üstündag,
M.R. Daymond,, M.R. Daymond,
U. Lienert, U. Lienert
PROBING THE PHYSICAL AND ELECTRONIC PROPERTIES OF NANOMATERIALS
T. van Buuren, T. van Buuren
IN-SITU DEFORMATION STUDIES USING HIPPO/CRATES
S.C. Vogel, L. Meyer, T. Medina, D.J. Williams, S.C. Vogel, L. Meyer, T. Medina, D.J. Williams
T. Brissier, T. Brissier
C. Hartig, J. Laakmann, O. Meyer, H. Mecking, C. Hartig, J. Laakmann, O. Meyer, H. Mecking
FERROELECTRIC CERAMIC TEXTURES BY NEUTRON DIFFRACTION
J.L. Jones, J.L. Jones
S.C. Vogel, S.C. Vogel
E.B. Slamovich, K.J. Bowman, E.B. Slamovich, K.J. Bowman
PHASE TRANSFORMATION TEXTURES IN TI-6AL-4V ALLOY
S.C. Vogel, D.J. Williams, S.C. Vogel, D.J. Williams
D. Bhattacharyya, G.B. Viswanathan, H.L. Fraser, D. Bhattacharyya, G.B. Viswanathan, H.L. Fraser
ANALYSIS OF TEXTURE FROM STRONG NEUTRON ABSORBERS
H.M. Volz, S.C. Vogel, J.A. Roberts, D.J. Williams, A.C. Lawson, L.L. Daemen, C.T. Necker, H.M. Volz, S.C. Vogel, J.A. Roberts, D.J. Williams, A.C. Lawson, L.L. Daemen, C.T. Necker
RESIDUAL STRESS MEASUREMENTS OF CAST ALUMINUM ENGINE BLOCKS USING X-RAY DIFFRACTION
D.J. Wiesnera, , D.J. Wiesnera,
T.R. Watkins, T.M. Ely, C.R. Hubbard, T.R. Watkins, T.M. Ely, C.R. Hubbard
J.C. Williams, J.C. Williams
High-resolution Synchrotron Radiation XRD and Microstructure Imaging in 6-Dim Orientation-Location Space by the Moving Area Detector Method
L. Wcislak, L. Wcislak
H.J. Bunge, H.J. Bunge
H. Klein, H. Klein
U. Garbe, J.R. Schneider, U. Garbe, J.R. Schneider
PROBING POLY(ESTER URETHANE) STRUCTURE WITH ANOMALOUS SMALL ANGLE X-RAY SCATTERING
C.F. Welch*, R.P. Hjelm, E.B. Orler, D.A. Wrobleski, M.E. Hawley, J.T. Mang, C.F. Welch*, R.P. Hjelm, E.B. Orler, D.A. Wrobleski, M.E. Hawley, J.T. Mang
J.B. Kortright, J.B. Kortright
ON THE FORMATION OF BROWNMILLERITE AND THE CHOICE OF STRUCTURE ON THE ACCURACY OF THE RIETVELD METHOD
S.Y. Nelson*, C. Mattern, R.S.Winburn, S.Y. Nelson*, C. Mattern, R.S.Winburn
THE COMPARISATION OF QUANTITATIVE XRD, OPTICAL MICROSCOPY AND CATHODOLUMINESCENCE TECHNIQUE ON ORDINARY PORTLAND CEMENT CLINKERS
Herbert Pöllmann, Herbert Pöllmann
Jürgen Göske, Jürgen Göske
LIGHT ELEMENT DISTRIBUTION BY A POLYCAPILLARY LENSE AND AN UTW SDD DETECTOR INSIDE A VACUUM CHAMBER
B. Frank, P. Wobrauschek, N. Zoeger, C. Streli, B. Frank, P. Wobrauschek, N. Zoeger, C. Streli
QUANTITATIVE PROCEDURES IN TXRF
P.Wobrauschek, P.Wobrauschek
TOWARDS FAST RECIPROCAL SPACE MAPPING
J.F. Woitok, A. Kharchenko, J.F. Woitok, A. Kharchenko
“BaF2 PROCESS”: PHASE EVOLUTION OF Ba2YCu3O6+X FILMS
W. Wong-Ng, I. Levin, M.D. Vaudin, L.P. Cook, W. Wong-Ng, I. Levin, M.D. Vaudin, L.P. Cook
R. Feenstra, R. Feenstra
BaF2 PROCESS OF LONG-LENGTH CONDUCTORS: HIGH-TEMPERATURE NEUTRON AND X-RAY STUDY OF YOF
W. Wong-Ng, I. Levin, Q. Huang, L.P. Cook, W. Wong-Ng, I. Levin, Q. Huang, L.P. Cook
TWO-DIMENSIONAL MAPPING OF RESIDUAL STRESSES IN 6061-T6 ALUMINUM FRICTION STIR WELDS
W. Woo*, P. K. Liaw, W. Woo*, P. K. Liaw
H. Choo, H. Choo
D. W. Brown, D. W. Brown
Z. Feng, S. A. David, C. R. Hubbard2, Z. Feng, S. A. David, C. R. Hubbard2
DETECTION OF LATENT HUMAN FINGERPRINTS BY MICRO-X-RAY FLUORESCENCE
C.G. Worley, S.S. Wiltshire, T.C. Miller, G.J. Havrilla, V. Majidi, C.G. Worley, S.S. Wiltshire, T.C. Miller, G.J. Havrilla, V. Majidi
CRYSTALLINE OR LIQUID CRYSTALLINE? A XRD STUDY OF OCTA-SUBSTITUTED PHTHALOCYANINES
B. A. Minch, M. D. Carducci, N. R. Armstrong, B. A. Minch, M. D. Carducci, N. R. Armstrong
CRYSTAL CHEMISTRY AND ENERGETICS OF NEW NaNb03 - BASED PEROVSKITES
H. Xu, A. Navrotsky, H. Xu, A. Navrotsky
Y. Su, M.L. Balmer, Y. Su, M.L. Balmer
X-RAY STRESS MEASUREMENT OF GROUND SURFACE OF DENTAL MATERIAL
C. Zhou, M. Gotoh, C. Zhou, M. Gotoh
H. Hirose, H. Hirose
M. Shozu, M. Shozu
3D SR µ-XRF ON HUMAN BONE SAMPLES
N. Zoeger, P. Wobrauschek, C.Streli, N. Zoeger, P. Wobrauschek, C.Streli
ELEMENTAL MAPPING OF HUMAN BRAIN BY SR-µXRF
N. Zoeger, C.Streli, P. Wobrauschek, C. Jokubonis, N. Zoeger, C.Streli, P. Wobrauschek, C. Jokubonis
G. Pepponi, G. Pepponi
P. Roschger, P. Roschger
S. Bohic, S. Bohic
W. Osterode, W. Osterode
ELEMENTAL DISTRIBUTION IN VARIOUS AREAS OF HUMAN ARTICULAR BONES BY SR µ-XRF
N. Zoeger, P. Wobrauschek, C.Streli, C. Jokubonis, N. Zoeger, P. Wobrauschek, C.Streli, C. Jokubonis
G. Pepponi, G. Pepponi
P. Roschger, P. Roschger
G. Falkenberg, G. Falkenberg
W. Osterode, W. Osterode


 

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