53rd Annual Denver X-ray Conference Wrap-Up

The 53rd Annual Denver X-ray Conference (DXC) was held in Steamboat Springs, Colorado at the Sheraton Steamboat Resort. The conference ran from 2-6 August 2004, attracting nearly 300 registered attendees and over 200 exhibit personnel.

Conference week began with 16 tutorial workshops, held on Monday and Tuesday. Topics included: How to do Synchrotron Experiments; Rietveld Applications; Specimen Preparation XRF; Thin Film XRF Analysis; X-ray Physics; Optics; Microbeam X-ray Stress Analysis; Total Pattern Analysis; Quantitative XRF; Fundamentals of XRF; Principles & Use of Micro XRD & XRF; Specimen Preparation XRD; and Small Angle Scattering.

Sixteen special sessions filled the remaining two and a half days of the conference. Topics included: New Developments in XRD & XRF Instrumentation; Thin Films; Small Angle Scattering; Quantitative XRF; Detectors & Sources; Synchrotron Applications; Stress Analysis; Problem Solving/Industrial Applications of XRF; X-ray Optics; Industrial Applications of XRD; Trace Analysis; Microbeam Analysis; Parallel Beam Diffraction; Rietveld Applications; and Polymers.

The Plenary Session, “Red Hot X-rays”, was organized by Charles Prewitt, University of Arizona, Tucson, AZ and Robert Snyder, Georgia Institute of Technology, Atlanta, GA. Four invited talks were presented during the Plenary: “GETTING THE HOT STRUCTURES” K.F. Kelton, Department of Physics, Washington University, St. Louis, MO; “THE STRUCTURE OF LIQUID AL ALLOYS AT HIGH SUPERHEATS USING HIGH ENERGY X-RAYS” M.J. Kramer, Ames Laboratory, Iowa State University, Ames, IA; “DIFFRACTION STUDIES OF ORDER-DISORDER AT HIGH PRESSURES AND TEMPERATURES: TRANSITIONS IN DOLOMITE AND ANHYDRITE” J.B. Parise, Geosciences, State University of NY, Stony Brook, NY; “LAUE MICRODIFFRACTION FOR STRUCTURE ANALYSIS AT ULTRA HIGH PRESSURE (LAMSA UHP) - AN OLD SOLUTION TO A NEW PROBLEM” P. Dera, Carnegie Institution of Washington, Geophysical Lab, Washington, DC.

An awards presentation also took place during the Plenary Session to honor a variety of important contributions to the field of materials analysis. The 2004 Birks Award was presented to Tomoya Arai, Rigaku Industrial Corporation, Osaka, Japan, presented by Michael Mantler, Vienna University of Technology, Vienna, Austria. The 2004 McMurdie Award was presented to Winnie Wong-Ng, National Institute of Standards & Technology, Gaithersburg, MD, presented by Camden R. Hubbard, Oak Ridge National Laboratory, Oak Ridge, TN. The 2004 Hanawalt Award was presented to Robert L. Snyder, Georgia Institute of Technology, Atlanta, GA, presented by James A. Kaduk, BP Chemicals, Naperville, IL. Dr. Snyder also gave a brief lecture after receiving the Hanawalt Award, “THE EVOLUTION OF TOTAL PATTERN ANALYSIS”.

Poster sessions were held on Monday, Tuesday and Wednesday evening of conference week. Judges were appointed each night to select the best posters. The following posters were selected as the best: “ON THE FORMATION OF BROWNMILLERITE AND THE CHOICE OF STRUCTURE ON THE ACCURACY OF THE RIETVELD METHOD” S.Y. Nelson, C. Mattern, R.S. Winburn, Minot State University, Minot, ND; “PHASE EQUILIBRIA DETERMINATION OF NH4NO3-KNO3 MIXTURES BY USING X-RAY DIFFRACTION METHOD” W.-M. Chien, D. Chandra, J. Smith, University of Nevada, Reno, Nevada, C.J. Rawn, Oak Ridge National Laboratory, Oak Ridge, TN, A.K. Helmy, Special Devices, Inc., Moorpark, CA; “INVESTIGATION OF THE MICRO STRUCTURE OF ENERGETIC CRYSTALS BY MEANS OF X-RAY POWDER DIFFRACTION” M. Herrmann, Fraunhofer Institut für Chemische Technologie, Pfinztal, Germany; “THE COMPARISATION OF QUANTITATIVE XRD, OPTICAL MICROSCOPY AND CATHODOLUMINESCENCE TECHNIQUE ON ORDINARY PORTLAND CEMENT CLINKERS” N. Winkler, H. Pöllmann, University of Halle, Germany, J. Göske, Center for Materials Analysis, Lauf a. d. Pegnitz, Germany; “EVALUATION OF LOCAL SHORT-RANGE ORDER AROUND Fe ATOMS IN FePt FILMS BY X-RAY FLUORESCENCE HOLOGRAPHY” Y. Takahashi, K. Hayashi, E. Matsubara, T. Shima, K. Takanashi, Tohoku University, Sendai, Japan; “ELEMENTAL MAPPING OF HUMAN BRAIN BY SR-µXRF” N. Zoeger, C. Streli, P. Wobrauschek, C. Jokubonis, Atominstitut, Vienna University of Technology, Vienna, Austria, G. Pepponi, ITC-irst, Trento, Italy, P. Roschger, Ludwig Bolzmann-Institut für Osteologie, Vienna, Austria, S. Bohic, ESRF, Grenoble, France, W. Osterode, Universitätsklinik für Innere Medizin IV, Vienna, Austria; “CHEMICAL-PHYSICAL CHARACTERISATION OF POLLEN WITH TXRF AND TOF-SIMS” G. Pepponi, P. Lazzeri, ITC-irst, Trento, Italy, E. Gottardini, F. Cristofolini, F. Corradini, IASMA, Trento, Italy, G. Clauser, APPA, Trento, Italy, A. Torboli, Ital Structures, Riva del Garda, Italy.

Exhibits at the conference ran from Monday to Thursday where 41 companies displayed their various products and services for X-ray powder diffraction and X-ray fluorescence spectrometry. The following companies participated at the exhibits: AMPTEK, Inc.; ATPS, Inc.; Australian X-ray Tubes Pty Limited; Blake Industries, Inc.; Bruker AXS, Inc.; Brushwellman Electrofusion Products; Chemplex Industries, Inc.; Corporation Scientifique Claisse, Inc.; EDAX, Inc.; Engelhard Corporation; GBC Scientific Equipment Pty Ltd.; Gresham Scientific Instruments; Handley Analytical Services; Hecus X-ray Systems GmbH; Inel, Inc.; Initiative Scientific Products; International Centre for Diffraction Data; Kitco, Inc.; Kratos Analytical; Laval Lab, Inc.; LND, Inc.; Materials Data, Inc.; MOXTEK, Inc.; Omega Data Systems BV; Osmic, Inc.; Oxford Instruments; PANalytical; Premier Lab Supply; Rigaku/MSC, Inc.; Rocklabs Ltd.; Sietronics Pty Limited; Sigma Chemicals; Spectro Analytical Instruments; Spectrum Plus; SPEX CertiPrep, Inc.; Thales Components Corporation; Thermo Electron; Wiley; Xenocs SA; X-ray Instrumentation Associates; and X-ray Optical Systems, Inc.

A special thank you goes out to the vendors who sponsored evening receptions: Australian X-ray Tubes Pty Limited; Blake Industries, Inc.; Bruker AXS, Inc.; Corporation Scientifique Claisse, Inc.; Englehard Corporation; Handley Analytical Services; Kitco, Inc.; Kratos Analytical; Laval Lab, Inc.; Materials Data, Inc.; MOXTEK, Inc.; Osmic, Inc.; PANalytical; Rigaku/MSC, Inc.; Rocklabs Ltd.; Spectrum Plus; SPEX CertiPrep, Inc.; Thales Electron Devices; Thermo Electron; and Wiley.

See a preview of the 2005 Program.






For more information please contact Denise Zulli - zulli@icdd.com