53rd Annual Denver X-ray Conference Wrap-Up
The 53rd Annual Denver X-ray Conference (DXC) was held in Steamboat
Springs, Colorado at the Sheraton Steamboat Resort. The conference
ran from 2-6 August 2004, attracting nearly 300 registered attendees
and over 200 exhibit personnel.
Conference week began with 16 tutorial workshops, held on Monday
and Tuesday. Topics included: How to do Synchrotron Experiments;
Rietveld Applications; Specimen Preparation XRF; Thin Film XRF
Analysis; X-ray Physics; Optics; Microbeam X-ray Stress Analysis;
Total Pattern Analysis; Quantitative XRF; Fundamentals of XRF;
Principles & Use of Micro XRD & XRF; Specimen Preparation
XRD; and Small Angle Scattering.
Sixteen special sessions filled the remaining two and a half
days of the conference. Topics included: New Developments in
XRD & XRF Instrumentation; Thin Films; Small Angle Scattering;
Quantitative XRF; Detectors & Sources; Synchrotron Applications;
Stress Analysis; Problem Solving/Industrial Applications of XRF;
X-ray Optics; Industrial Applications of XRD; Trace Analysis;
Microbeam Analysis; Parallel Beam Diffraction; Rietveld Applications;
The Plenary Session, “Red Hot X-rays”, was organized
by Charles Prewitt, University of Arizona, Tucson, AZ and Robert
Snyder, Georgia Institute of Technology, Atlanta, GA. Four invited
talks were presented during the Plenary: “GETTING THE HOT
STRUCTURES” K.F. Kelton, Department of Physics, Washington
University, St. Louis, MO; “THE STRUCTURE OF LIQUID AL
ALLOYS AT HIGH SUPERHEATS USING HIGH ENERGY X-RAYS” M.J.
Kramer, Ames Laboratory, Iowa State University, Ames, IA; “DIFFRACTION
STUDIES OF ORDER-DISORDER AT HIGH PRESSURES AND TEMPERATURES:
TRANSITIONS IN DOLOMITE AND ANHYDRITE” J.B. Parise, Geosciences,
State University of NY, Stony Brook, NY; “LAUE MICRODIFFRACTION
FOR STRUCTURE ANALYSIS AT ULTRA HIGH PRESSURE (LAMSA UHP) - AN
OLD SOLUTION TO A NEW PROBLEM” P. Dera, Carnegie Institution
of Washington, Geophysical Lab, Washington, DC.
An awards presentation also took place during the Plenary Session
to honor a variety of important contributions to the field of
materials analysis. The 2004 Birks Award was presented to Tomoya
Arai, Rigaku Industrial Corporation, Osaka, Japan, presented
by Michael Mantler, Vienna University of Technology, Vienna,
Austria. The 2004 McMurdie Award was presented to Winnie Wong-Ng,
National Institute of Standards & Technology, Gaithersburg,
MD, presented by Camden R. Hubbard, Oak Ridge National Laboratory,
Oak Ridge, TN. The 2004 Hanawalt Award was presented to Robert
L. Snyder, Georgia Institute of Technology, Atlanta, GA, presented
by James A. Kaduk, BP Chemicals, Naperville, IL. Dr. Snyder also
gave a brief lecture after receiving the Hanawalt Award, “THE
EVOLUTION OF TOTAL PATTERN ANALYSIS”.
Poster sessions were held on Monday, Tuesday and Wednesday evening
of conference week. Judges were appointed each night to select
the best posters. The following posters were selected as the
best: “ON THE FORMATION OF BROWNMILLERITE AND THE CHOICE
OF STRUCTURE ON THE ACCURACY OF THE RIETVELD METHOD” S.Y.
Nelson, C. Mattern, R.S. Winburn, Minot State University, Minot,
ND; “PHASE EQUILIBRIA DETERMINATION OF NH4NO3-KNO3 MIXTURES
BY USING X-RAY DIFFRACTION METHOD” W.-M. Chien, D. Chandra,
J. Smith, University of Nevada, Reno, Nevada, C.J. Rawn, Oak
Ridge National Laboratory, Oak Ridge, TN, A.K. Helmy, Special
Devices, Inc., Moorpark, CA; “INVESTIGATION OF THE MICRO
STRUCTURE OF ENERGETIC CRYSTALS BY MEANS OF X-RAY POWDER DIFFRACTION” M.
Herrmann, Fraunhofer Institut für Chemische Technologie,
Pfinztal, Germany; “THE COMPARISATION OF QUANTITATIVE XRD,
OPTICAL MICROSCOPY AND CATHODOLUMINESCENCE TECHNIQUE ON ORDINARY
PORTLAND CEMENT CLINKERS” N. Winkler, H. Pöllmann,
University of Halle, Germany, J. Göske, Center for Materials
Analysis, Lauf a. d. Pegnitz, Germany; “EVALUATION OF LOCAL
SHORT-RANGE ORDER AROUND Fe ATOMS IN FePt FILMS BY X-RAY FLUORESCENCE
HOLOGRAPHY” Y. Takahashi, K. Hayashi, E. Matsubara, T.
Shima, K. Takanashi, Tohoku University, Sendai, Japan; “ELEMENTAL
MAPPING OF HUMAN BRAIN BY SR-µXRF” N. Zoeger, C.
Streli, P. Wobrauschek, C. Jokubonis, Atominstitut, Vienna University
of Technology, Vienna, Austria, G. Pepponi, ITC-irst, Trento,
Italy, P. Roschger, Ludwig Bolzmann-Institut für Osteologie,
Vienna, Austria, S. Bohic, ESRF, Grenoble, France, W. Osterode,
Universitätsklinik für Innere Medizin IV, Vienna, Austria; “CHEMICAL-PHYSICAL
CHARACTERISATION OF POLLEN WITH TXRF AND TOF-SIMS” G. Pepponi,
P. Lazzeri, ITC-irst, Trento, Italy, E. Gottardini, F. Cristofolini,
F. Corradini, IASMA, Trento, Italy, G. Clauser, APPA, Trento,
Italy, A. Torboli, Ital Structures, Riva del Garda, Italy.
Exhibits at the conference ran from Monday to Thursday where
41 companies displayed their various products and services for
X-ray powder diffraction and X-ray fluorescence spectrometry.
The following companies participated at the exhibits: AMPTEK,
Inc.; ATPS, Inc.; Australian X-ray Tubes Pty Limited; Blake Industries,
Inc.; Bruker AXS, Inc.; Brushwellman Electrofusion Products;
Chemplex Industries, Inc.; Corporation Scientifique Claisse,
Inc.; EDAX, Inc.; Engelhard Corporation; GBC Scientific Equipment
Pty Ltd.; Gresham Scientific Instruments; Handley Analytical
Services; Hecus X-ray Systems GmbH; Inel, Inc.; Initiative Scientific
Products; International Centre for Diffraction Data; Kitco, Inc.;
Kratos Analytical; Laval Lab, Inc.; LND, Inc.; Materials Data,
Inc.; MOXTEK, Inc.; Omega Data Systems BV; Osmic, Inc.; Oxford
Instruments; PANalytical; Premier Lab Supply; Rigaku/MSC, Inc.;
Rocklabs Ltd.; Sietronics Pty Limited; Sigma Chemicals; Spectro
Analytical Instruments; Spectrum Plus; SPEX CertiPrep, Inc.;
Thales Components Corporation; Thermo Electron; Wiley; Xenocs
SA; X-ray Instrumentation Associates; and X-ray Optical Systems,
A special thank you goes out to the vendors who sponsored evening
receptions: Australian X-ray Tubes Pty Limited; Blake Industries,
Inc.; Bruker AXS, Inc.; Corporation Scientifique Claisse, Inc.;
Englehard Corporation; Handley Analytical Services; Kitco, Inc.;
Kratos Analytical; Laval Lab, Inc.; Materials Data, Inc.; MOXTEK,
Inc.; Osmic, Inc.; PANalytical; Rigaku/MSC, Inc.; Rocklabs Ltd.;
Spectrum Plus; SPEX CertiPrep, Inc.; Thales Electron Devices;
Thermo Electron; and Wiley.
See a preview of the 2005 Program.