SCHEDULE

2005 Denver X-ray Conference Program
Special Sessions:
 
X-ray Imaging
(Barton/Stock)

New Developments in XRD & XRF Instr. (Anzelmo)

Thin Films (Huang)

Detectors & Sources (Huang)

Advanced Imaging Techniques (Snigirev)

X-ray Optics (Havrilla)

Microbeam Analysis (Buhrke)

XMT Applied to Materials Characterization (Stock/Barton)

Stress Analysis (to be confirmed)

Industrial Applications of XRD (Snyder/Hubbard)

Parallel Beam Diffraction (Misture)

Line Profile Analysis (Snyder/Kaduk)

Quantitative XRF (Gilfrich)

Problem Solving/Industrial Applications – XRF (Broton)

Trace Analysis – ppm to ppb (to be confirmed)

Energy Dispersive Applications (to be confirmed)

Fusion Applications (Anzelmo)

 

2005 Workshops:
Joint XRD & XRF
XRD
XRF

X-ray Microtomography
Organized by: S. Stock
Northwestern University Medical School
Chicago, IL
s-stock@northwestern.edu

X-ray Optics
Organized by: G.J. Havrilla
Los Alamos National Laboratory
Los Alamos, NM
havrilla@lanl.gov

Rietveld Applications
I—Beginner & II—Advanced
Full day

Organized by: A. Kern
Bruker AXS GmbH
Karlsruhe, Germany
arnt.kern@bruker-axs.de
J. Faber
International Centre for Diffraction Data
Newtown Square, PA
faber@icdd.com

Stress Analysis
Organized by: I.C. Noyan
Columbia University
New York, NY
icn2@columbia.edu

Line Profile Analysis by the
Whole Powder Pattern Fitting

Organized by: D. Balzar
University of Denver
Denver, CO and NIST, Boulder, CO
balzar@boulder.nist.gov

Two-dimensional X-ray
Diffraction

Organized by: T. Blanton
Eastman Kodak Company
Rochester, NY
tblanton@icdd.com
B. He
Bruker AXS, Inc.
Madison, WI
bhe@bruker-axs.com

Specimen Preparation I & II
Full day

Organized by: J. Anzelmo
Anzelmo & Associates, Inc.
Madison, WI
jaanzelmo@aol.com
D. Broton
Construction Technology Labs
Skokie, IL
dbroton@ctlgroup.com

Energy Dispersive XRF
Organized by: M.A. Zaitz
IBM
Hopewell Junction, NY
zaitz@us.ibm.com
J. Anzelmo
Anzelmo & Associates, Inc.
Madison, WI
jaanzelmo@aol.com

Quantitative XRF I & II
Full day

Organized by: M. Mantler
Vienna University of Technology
Vienna, Austria
michael.mantler@ifp.tuwien.ac.at

Basic XRF
Organized by: L. Creasy
Timet North American Operation
Morgantown, PA
larry.creasy@timet.com

Monte Carlo Techniques in
XRF

Organized by: R. Gardner
North Carolina State University
Raleigh, NC
gardner@ncsu.edu


Plenary Session: Wednesday, 3 August
X-ray Imaging

Organized by: R. Barton, Jr., Emeritus, DuPont Experimental Station, Wilmington, DE
S. Stock, Northwestern University Medical School, Chicago, IL

“Biomedical X-ray Imaging, Current Status and Some Future Challenges”
E.L. Ritman, Mayo Clinic College of Medicine, Rochester, MN

“Where Are We After The Decade-Long Renaissance in X-ray Imaging?”
A. Snigirev, ESRF—European Synchrotron Radiation Facility, Grenoble, France

“X-ray Backscatter Imaging: Photography Through Barriers”
J. Callerame, American Science & Engineering, Inc., Billerica, MA

“Geoscience Applications of Synchrotron Computed Microtomography”
M.L. Rivers, University of Chicago, Chicago, IL

 

Special Sessions: Invited Talks

XRD & XRF

New Developments in XRD & XRF Instrumentation
Organized by: J. Anzelmo
Anzelmo & Associates, Inc.
Madison, WI
jaanzelmo@aol.com, 608.824.0254
Abstracts should be submitted by technical representatives of a manufacturer. They should discuss specifications, and applications concerning one of their newest and most important products. Talks should include comments about software, XRD and XRF equipment, and accessories. No mention of prices or a comparison with competitors’ products can be included.

Thin Films
Organized by: T.C. Huang
Emeritus
IBM Almaden Research Center
San Jose, CA
tinghuang@tinghuang.com
408.578.4060
Co-chair: H. Toraya
Rigaku Corporation, Tokyo, Japan
“Novel Analytical Approaches in Numerical Analysis of XRR and HRXRD Data from Thin Films”
A. Ulyanenkov
Bruker AXS GmbH, Karlsruhe, Germany

Detectors & Sources
Organized by: T.C. Huang
Emeritus
IBM Almaden Research Center
San Jose, CA
tinghuang@tinghuang.com
408.578.4060
“ A New Area Detector for Rapid XRD Study of Inhomogeneous Samples”
T. Taguchi
Rigaku Corporation, Tokyo, Japan

Advanced Imaging Techniques
Organized by: A. Snigirev
ESRF—European Synchrotron Radiation Facility, Grenoble, France
snigirev@esrf.fr
Co-chair: S. Wilkins
CSIRO Manufacturing & Infrastructure Technology, Victoria, Australia
“Phase Imaging with an X-ray Talbot Interferometer”
A. Momose
The University of Tokyo, Chiba, Japan
“Time-resolved X-ray Imaging in Studies of Advanced Alloy Solidification Processes”
R. Mathiesen
SINTEF Materials Technology,
Trondheim, Norway
“Quantitative sub-100nm Phasecontrast Imaging Using an SEMbased Full-field X-ray Microscope”
S. Wilkins
CSIRO Manufacturing & Infrastructure Technology, Victoria, Australia

X-ray Optics
Organized by: G.J. Havrilla
Los Alamos National Laboratory
Los Alamos, NM
havrilla@lanl.gov
505.667.9627
Invited talks to be announced.

Microbeam Analysis
Organized by: V.E. Buhrke,
Consultant
Portola Valley, CA
vebuhrke@sbcglobal.net
650.851.5020
“ Micro Diffraction Techniques”
T.N. Blanton
Eastman Kodak Company, Rochester, NY

XMT Applied to Materials Characterization
Organized by: S. Stock
Northwestern University Medical School
Chicago, IL
s-stock@northwestern.edu
312.503.1845
R. Barton, Jr.
Emeritus
DuPont Experimental Station
Wilmington, DE
rb905@comcast.net
302.655.5126
“Multi-mode X-ray Study of Sulfate Attack of Portland Cement”
K.E. Kurtis
Georgia Institute of Technology,
Atlanta, GA
“Ultrafast X-ray Imaging for Fuel Spray Applications”
J. Wang
Argonne National Laboratory, Advanced
Photon Source, Argonne, IL
“Microtomographic Imaging and Analysis for Basic Research”
J.H. Dunsmuir
ExxonMobil Research and Engineering
Co., Annandale, NJ

XRD

Stress Analysis
Organized by: C. Goldsmith
IBM, Hopewell Junction, NY
cgoldsmi@us.ibm.com
845.894.3683
T.R. Watkins
Oak Ridge National Laboratory
Oak Ridge, TN
watkinstr@ornl.gov
865.574.2046

“Recipes for the Collection of Reliable XRD Residual Stress Data”
A.C. Vermeulen
PANalytical, Almelo, The Netherlands
“Plastic Anisotropy in Hot Extruded Mg and Brass Alloys”
W. Reimers
Technische Universitaet Berlin, Berlin,
Germany

Industrial Applications of XRD
Organized by: R.L. Snyder
Georgia Institute of Technology
Atlanta, GA
bob.snyder@mse.gatech.edu
404.894.2888
C.R. Hubbard
Oak Ridge National Laboratory
Oak Ridge, TN
hubbardcr@ornl.gov
865.574.4472
E.A. Payzant
Oak Ridge National Laboratory
Oak Ridge, TN
payzanta@ornl.gov
865.574.6538

“An X-ray Diffraction Investigation of Nanomaterial Used in Composite Catalyst Systems”
K. Edwards
W.R. Grace, Columbia, MD

Parallel Beam Diffraction
Organized by: S.T. Misture
New York State College of Ceramics at Alfred University
Alfred, NY
misture@alfred.edu
607.871.2438

“Application of Parallel Beam Optics at Elevated Temperatures”
T.R. Watkins
Oak Ridge National Laboratory, Oak
Ridge, TN

Line Profile Analysis
Organized by: R.L. Snyder
Georgia Institute of Technology
Atlanta, GA
bob.snyder@mse.gatech.edu
404.894.2888
J.A. Kaduk
BP Chemicals
Naperville, IL
James.Kaduk@ineos.com
630.420.4547
Invited talks to be announced

XRF

Quantitative XRF
Organized by: J. Gilfrich
Emeritus
SFA, Inc./NRL
Bethesda, MD
jgilfrich@att.net
301.365.5070
Co-chair: W.T. Elam
University of Washington
Redmond, WA

“Standardless Analysis”
M. Mantler
Vienna Institute of Technology, Vienna,
Austria
“Optimization of Quantification Schemes for Contemporary Field-Portable XRF Analyzers”
S. Piorek
Niton LLC, Billerica, MA

Problem Solving/Industrial Applications—XRF
Organized by: D. Broton
Construction Technology Labs
Skokie, IL
dbroton@CTLgroup.com
847.965.7500

“Modern X-ray Instrumentation in an Old Cement Plant Laboratory”
B. Rowe
Holcim, Inc., Clarksville, MO
“Practical Applications of New Generation XRF-XRD Instruments in Cement Process Control Systems”
S. Feldman
PANalytical, Inc., Natick, MA

Trace Analysis—ppm to ppb
Organized by: M.A. Zaitz
IBM
Hopewell Junction, NY
Zaitz@us.ibm.com
845.894.6337

“Applications of High-energy Polarized Beam EDXRF”
R. Van Grieken
University of Antwerp, Antwerp, Belgium

Energy Dispersive Applications
Organized by: R. Van Grieken
University of Antwerp
Antwerp, Belgium,
rene.vangrieken@uantwerpen.be

“Quantitative ED Electron Probe X-ray Microanalysis of Individual Particles”
C-U. Ro
Inha University, Incheon, Korea
“Micro-XRF Analysis of Biomaterials”
K. Tsuji
Osaka City University, Osaka, Japan
“EDXRF of Hot Particles”
S. Török
KFKI Atomic Energy Research Institute,
Budapest, Hungary

Fusion Applications
Organized by: J. Anzelmo
Anzelmo & Associates, Inc.
Madison, WI
jaanzelmo@aol.com
608.824.0254
Co-chair: T. Ahmedali
McGill University
Montreal, Canada

“XRF Analysis of Complex Materials: Optimizing the Technique”
T. Ahmedali
McGill University, Montreal, Canada
“The Fusion Method Applied to a Wide Variety of Industrial Applications”
K. Maley
SGS Lakefield Research, Ontario, Canada

 

 

 

For more information please contact Denise Zulli - zulli@icdd.com

 

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