200 of 2005 DXC abstracts sorted by correspondent author's last name

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MEASUREMENT OF STRAIN AND LATTICE TILT AT THE MARGINS OF THIN FILM ISLANDS ON SINGLE-CRYSTAL SUBSTRATES BY DOUBLE-CRYSTAL TOPOGRAPHY
P. M. Adams, P. M. Adams
XRF ANALYSIS OF COMPLEX MATERIALS; OPTIMIZING THE TECHNIQUE
T. Ahmedali, T. Ahmedali
FLOW PROPORTIONAL COUNTER WINDOW WITH REDUCED LEAK RATE
E.C. Anderson, B. Law, E.C. Anderson, B. Law
SRM 1979: A NIST SRM FOR NANO-CRYSTALLITE SIZE BROADENING
N. Armstrong, N. Armstrong
J.P. Cline, J. Ritter, J. Bonevich, J.P. Cline, J. Ritter, J. Bonevich
SYNTHESIS AND CHARACTERIZATION OF p-ANISIDINE-OXALATE COMPLEXES
Korupolu Raghu Babu, Korupolu Raghu Babu
MICROBEAM X-RAY STRAIN FROM MATRIX GRAINS AND FIBER OF SIMILAR SCALE IN A TENSILE STRESSED COMPOSITE
H. A., Bale, H. A., Bale
J. C., Hanan, J. C., Hanan
N., Tamura, N., Tamura
OBTAINING RELIABLE RESULTS BY LINE BROADENING ANALYSIS
Davor Balzar, Davor Balzar
SILICON MULTI-CATHODE DETECTOR (SMCD) DEVELOPMENTS FOR HIGH-SPEED XRF ANALYSIS
Shaul Barkan, Shaul Barkan
Jan S. Iwanczyk, Jan S. Iwanczyk
Valeri D. Saveliev, Valeri D. Saveliev
Liangyuan Feng, Liangyuan Feng
Carolyn R. Tull, Carolyn R. Tull
X-RAY IMAGING OF AN ELONGATED GAS PUFF TARGET TO BE USED IN X-RAY LASER EXPERIMENTS
A. Bartnik*, H. Fiedorowicz, R. Jarocki, J. Kostecki, R. Rakowski, M. Szczurek, A. Bartnik*, H. Fiedorowicz, R. Jarocki, J. Kostecki, R. Rakowski, M. Szczurek
LOBSTER EYE OPTICS FOR COLLECTING RADIATION OF A LASER-PLASMA SOFT X-RAY SOURCE BASED ON A GAS PUFF TARGET
A. Bartnik*, H. Fiedorowicz, R. Jarocki, J. Kostecki, R. Rakowski, M. Szczurek, A. Bartnik*, H. Fiedorowicz, R. Jarocki, J. Kostecki, R. Rakowski, M. Szczurek
L. Pína, L. Švéda, L. Pína, L. Švéda
A. Inneman, A. Inneman
THICKNESS DETERMINATION OF COPPER AND NICKEL NANOLAYERS: COMPARISON OF COMPLETELY REFERENCE-FREE X-RAY FLUORESCENCE ANALYSIS AND X-RAY REFLECTOMETRY
Michael Kolbe, Michael Kolbe
Burkhard Beckhoff, Burkhard Beckhoff
Michael Krumrey, Michael Krumrey
Gerhard Ulm, Gerhard Ulm
XRF COMBINED WITH NEXAFS ANALYSIS IN THE SOFT X-RAY RANGE: A CONTRIBUTION TO THE SPECIATION OF MINERALS AT THE Fe-L3,2 EDGES
B. Beckhoff, G. Ulm, B. Beckhoff, G. Ulm
Max Wilke, I. Sommerweiß, Max Wilke, I. Sommerweiß
ULTRA-TRACE ANALYSIS AND SPECIATION BY TXRF-NEXAFS IN THE SOFT X-RAY RANGE
B. Beckhoff, B. Beckhoff
CROSS SECTIONS OF X-RAY RESONANT RAMAN SCATTERING (RRS) ON NICKEL FOR POLARIZED AND UNPOLARIZED RADIATION
Ch. Zarkadas, A.G. Karydas, Ch. Zarkadas, A.G. Karydas
M. Müler, B. Beckhoff, M. Kolbe, R. Fliegauf, G. Ulm, M. Müler, B. Beckhoff, M. Kolbe, R. Fliegauf, G. Ulm
QUANTITATIVE INVESTIGATION OF THE ENHANCEMENT OF X-RAY FLUORESCENCE OF LIGHT ELEMENTS BY PHOTOELECTRON SECONDARY EXCITATION
B. Beckhoff, M. Kolbe, M. Müler, G. Ulm, B. Beckhoff, M. Kolbe, M. Müler, G. Ulm
A.G. Karydas, Ch. Zarkadas, T. Geralis, K. Kousouris, A.G. Karydas, Ch. Zarkadas, T. Geralis, K. Kousouris
N. Kawahara, T. Yamada, N. Kawahara, T. Yamada
M. Mantler, M. Mantler
MEASUREMENT AND MODELING OF INTERNAL STRESSES AT MICROSCOPIC AND MESOSCOPIC LEVELS USING MICRO RAMAN SPECTROSCOPY AND X-RAY DIFFRACTION
B Benedikt, M Lewis, P Rangaswamy, B Benedikt, M Lewis, P Rangaswamy
APPLICATIONS OF X-RAY MICRODIFFRACTION IN THE IMAGING INDUSTRY
Thomas N. Blanton, Thomas N. Blanton
WEIGHING MACHINE AND FLUX DISPENSER, Theant…TAKE THE WEIGHT OFF YOUR MIND!
F. Bouker, F. Bouker
Nanometer multilayers as monochromators for the X-ray fluorescence analysis
S. Braun, S. Braun
R. Dietsch, R. Dietsch
T. Foltyn, T. Foltyn
W. Friedrich, W. Friedrich
D. Weissbach, D. Weissbach
A. Leson, A. Leson
HIGH TEMPERATURE STRUCTURAL CHANGES IN CsD2PO4 and RbD2PO4
W. Bronowska, W. Bronowska
A. Pietraszko, A. Pietraszko
QUANTITATIVE ANALYSIS OF TITANIUM-RICH ORES BY X-RAY FLUORESCENCE
W.W. Brubaker, R.M. Martin, W.W. Brubaker, R.M. Martin
M.H. Headinger, T. Segers, A. Wall, M.H. Headinger, T. Segers, A. Wall
DETECTORS FOR X-RAY DIFFRACTION AND SCATTERING: CURRENT STATUS AND FUTURE CHALLENGES
Lutz H.M. Bruegemann, Lutz H.M. Bruegemann
Ekkehard Gerndt, Ekkehard Gerndt
Arnt Kern, Arnt Kern
XRD DATA QUALITY – ABOUT THE ART TO CONFIGURE THE OPTIMUM DIFFRACTION SYSTEM
Lutz H.M. Bruegemann, Lutz H.M. Bruegemann
Arnt Kern, Arnt Kern
Hans-Georg Krane, Hans-Georg Krane
Olaf Bahr, Olaf Bahr
MATERIALS IDENTIFICATION ON THE BASE OF DISCRETE XRAY SPECTRA
I.A Brytov, R.I. Plotnikov, A.A. Rechinski, I.A Brytov, R.I. Plotnikov, A.A. Rechinski
DEVELOPMENT TRENDS IN THE DESIGN OF WDXRF SPECTROMETERS AND THEIR IMPLEMENTATION IN THE NEW 9900 THERMOARL SIM/SEQ INSTRUMENT
A. Buman, A. Buman
INVESTIGATION OF LATERAL STRUCTURED INTERFACES
I. Busch*, J. Stümpel, I. Busch*, J. Stümpel
INFLUENCE OF GROWTH INTERRUPTION ON THE FORMATION OF SOLID-STATE INTERFACES
J. Stümpel*, I. Busch, J. Stümpel*, I. Busch
X-RAY BACKSCATTER IMAGING: PHOTOGRAPHY THROUGH BARRIERS
J. Callerame, J. Callerame
PHASE STABILITIES OF Zr2Fe and Zr3Fe HYDRIDES
D. Chandra, D. Chandra
J.R. Wermer, S.N. Paglieri, J.I. Abes, J.R. Wermer, S.N. Paglieri, J.I. Abes
M. Coleman, M. Coleman
T. Udovic, T. Udovic
A. Payzant, A. Payzant
MICROSTRAIN AND DOMAIN SIZE MEASUREMENTS OF V-0.5 at. %C HYDRIDES
D. Chandra, M. Coleman, J. Lamb, D. Chandra, M. Coleman, J. Lamb
J.R. Wermer , S.N. Paglieri, J.R. Wermer , S.N. Paglieri
C. Bowman, Jr., C. Bowman, Jr.
F.E. Lynch, F.E. Lynch
MONOCHROMATIC MICRO BEAM FOR TRACE ELEMENT MAPPING
Z.W. Chen*, N, Gao, S. Madison, W. M. Gibson, Z.W. Chen*, N, Gao, S. Madison, W. M. Gibson
HIGH FLUX MONOCHROMATIC X-RAY OPTICS FOR XRD
Z.W. Chen, H. Huang, W.M. Gibson, Z.W. Chen, H. Huang, W.M. Gibson
XRF ANALYSIS AT PPB LEVELS USING DOUBLY CURVED CRYSTAL OPTICS
Z. W. Chen, W. M. Gibson, Z. W. Chen, W. M. Gibson
X-RAY DIFFRACTION AND THERMAL STUDIES ON PENTAGLYCERINE AND NEOPENTYLGLYCOL SOLID SOLUTIONS
Wen-Ming Chien*, Dhanesh Chandra, Wen-Ming Chien*, Dhanesh Chandra
SCIENTIFIC APPLICATIONS OF PHASE-CONTRAST DIFFRACTION IMAGING
Yong S. Chu, Yong S. Chu
Andrei Tkachuk, Andrei Tkachuk
NEW OBSERVATIONS ON LiBr LAYER ON FUSION BEADS
F. Claisse, F. Claisse
MONTE-CARLO MODELING OF SILICON X-RAY DETECTORS
B. Cross, B. Cross
G. Bale, B. Lowe, R. Sareen, G. Bale, B. Lowe, R. Sareen
INDUSTRIAL X-RAY MICROTOMOGRAPHY APPLICATIONS USING A SYNCHROTRON-BASED FACILITY
*Cyrus E. Crowder, *Cyrus E. Crowder
DETECTION OF POLYMORPHISM BY POWDER X-RAY DIFFRACTION: INTERFERENCE BY PREFERRED ORIENTATION (Uncommon Polymorphic Artifacts in Powder X-Ray Diffraction Determination)
M. Davidovich, R.P. Scaringe, S. Yin, M. Davidovich, R.P. Scaringe, S. Yin
J. DiMarco, J.Z. Gougoutas, J. DiMarco, J.Z. Gougoutas
I. Vitez, I. Vitez
LINEAR ATTENUATION COEFFICIENT QUANTIFICATION WITH CONVENTINAL X-RAY MICROTOMOGRAPHY: THE QUEST FOR PERFECTION
G.R. Davis, J.C. Elliott, G.R. Davis, J.C. Elliott
X-RAY TOMOGRAPHY SYSTEM, AUTOMATION AND REMOTE ACCESS AT BEAMLINE 2BM OF THE ADVANCED PHOTON SOURCE
FRANCESCO DE CARLO, FRANCESCO DE CARLO
BRIAN TIEMAN, BRIAN TIEMAN
STUDY OF TRACE ELEMENTS IN BIOLOGICAL SAMPLES BY EDXRF AND TXRF
M.L. Carvalho, M.L. Carvalho
PHASE MIXTURE DETECTION BY FUZZY CLUSTERING OF X-RAY POWDER DIFFRACTION DATA
Thomas Degen, Thomas Degen
Detlev Götz, Detlev Götz
X-RAY LINE PROFILE ANALYSIS FOR MICROSTRUCTURAL CHARACTERIZATION OF NANOMATERIALS
Iuliana Dragomir-Cernatescu, Iuliana Dragomir-Cernatescu
MICROTOMOGRAPHIC IMAGING AND ANALYSIS FOR BASIC RESEARCH
J.H. Dunsmuir, J.H. Dunsmuir
FUNDAMENTAL PARAMETER PROGRAMS: ALGORITHMS FOR THE DESCRIPTION OF K-, L- AND M SPECTRA OF X-RAY TUBES
Horst Ebel, Horst Ebel
AN X-RAY DIFFRACTION INVESTIGATION OF NANOMATERIAL USED IN COMPOSITE CATALYST SYSTEMS
K. Edwards, K. Sutovich, K. Edwards, K. Sutovich
EXPERIMENTAL STUDY OF X-RAY ENERGY SPECTRUM FORMED BY PLANAR WAVEGUIDE-RESONATOR WITH SPECIFIC ELEMENT COMPOSITION REFLECTORS
V.K. Egorov, E.V. Egorov, V.K. Egorov, E.V. Egorov
FULL SPECTRUM CALCULATIONS OF EDXRF SPECTRA
W.T. Elam, B. Shen, B. Scruggs, J. Nicolosi, W.T. Elam, B. Shen, B. Scruggs, J. Nicolosi
THE POWDER DIFFRACTION FILE (PDF): A RELATIONAL DATABASE FOR ELECTRON DIFFRACTION
J. Faber, T. Fawcett, J. Faber, T. Fawcett
R. Goehner, R. Goehner
FORMULATION ANALYSES OF COMMERCIAL MATERIALS
T.G. Fawcett, J. Faber, F. Needham, T.G. Fawcett, J. Faber, F. Needham
C.R. Hubbard, C.R. Hubbard
J.A. Kaduk, J.A. Kaduk
PRACTICAL APPLICATIONS OF NEW GENERATION XRF-XRD INSTRUMENTS IN CEMENT PROCESS CONTROL SYSTEMS
S.B. Feldman*, A. van Eenbergen, S. Williams, S.B. Feldman*, A. van Eenbergen, S. Williams
TEMPERATURE DEPENDENCE OF RESIDUAL STRESS IN TITANIUM NITRIDE COATINGS ON HAYNES 188 SUPERALLOY
S.H. Ferguson, H.W. King, S.H. Ferguson, H.W. King
BROADBAND X-RAY RADIOGRAPHY APPLIED TO MULTIPHASE FLOW MEASUREMENTS
K. Fezzaa*, W-K. Lee, J. Wang, K. Fezzaa*, W-K. Lee, J. Wang
THE FOCUSING MIRROR: NEW POSSIBILITIES FOR TRANSMISSION POWDER XRD
M. Fransen, D. Beckers, V. Kogan, S. Prugovecki, M. Fransen, D. Beckers, V. Kogan, S. Prugovecki
PROPER SELECTION OF THIN X-TRANSPARENT FOILS FOR TRANSMISSION AND REFLECTION POWDER DIFFRACTOMETRY
M. Fransen, A. van Lemel, M. Fransen, A. van Lemel
3D INTERACTIVE DATA LANGUAGE POLE FIGURE VISUALIZATION
Colleen S. Frazer *, Mark A. Rodriguez, Ralph G. Tissot, Colleen S. Frazer *, Mark A. Rodriguez, Ralph G. Tissot
BORATE FUSIONS AND CEMQUANT – TWO COMPLEMENTARY MEANS FOR ACCURATE MINERALOGICAL ANALYSIS OF PORTLAND CEMENT
J.-P. Gagnon, J.-P. Gagnon
APPLICATION OF POLYCAPILLARY OPTICS TO MEDICAL IMAGING
Walter M. Gibson, Walter M. Gibson
Carolyn A. MacDonald, Carolyn A. MacDonald
100 MM2 SILICON DRIFT DETECTORS WITH DISCRETE FIRST FET
P. Goldstrass*, J. Kemmer, O.Boslau, T. Eggert, A. Pahlke, F. Wiest, P. Goldstrass*, J. Kemmer, O.Boslau, T. Eggert, A. Pahlke, F. Wiest
USE OF THE MONTE CARLO SIMULATION CODE CEARXRF FOR THE EDXRF INVERSE PROBLEM
W. Guo, R.P. Gardner, F. Li, W. Guo, R.P. Gardner, F. Li
APPLICATION OF X-RAY MICRODIFFRACTION TO ANALYZE NANOCRYSTALS EMBEDDED IN NANOPOROUS MATRICES
J.-M. Ha, M. D. Ward*, J.-M. Ha, M. D. Ward*
M. A. Hillmyer, M. A. Hillmyer
IN SITU HIGH TEMPERATURE X-RAY DIFFRACTION STUDY OF DIATOM DISPLACEMENT REACTIONS USING A NOVEL GRAPHITE REACTION VESSEL
Michael S., Haluska, Michael S., Haluska
Robert L. Snyder, Robert L. Snyder
Kenneth Sandhage, Kenneth Sandhage
MICROTOMOGRAPHY OF AMORPHOUS METALLIC FOAM DURING THERMO-PLASTIC EXPANSION
J. C. Hanan*, J. C. Hanan*
C. Veazey, C. Veazey
M. D. Demetriou, M. D. Demetriou
F. DeCarlo, Y. Choo, F. DeCarlo, Y. Choo
CONFOCAL MICRO X-RAY FLUORESCENCE MICROSCOPE: PERFORMANCE CAPABILITIES
E.P. Hastings, G.J. Havrilla*, E.P. Hastings, G.J. Havrilla*
NANOLITER DRIED SPOT DEPOSITION USING AN AUTOMATED DISPENSER FOR MXRF QUANTITATIVE ANALYSES
E.P. Hastings*, G.J. Havrilla, E.P. Hastings*, G.J. Havrilla
T.C. Miller, T.C. Miller
COMPARISON OF X-RAY BEAM FORMING OPTICS FOR MICRO X-RAY FLUORESCENCE
G. Havrilla, E. Hastings, B. Patterson, V. Montoya, G. Havrilla, E. Hastings, B. Patterson, V. Montoya
CHARACTERIZING SEMICONDUCTOR THIN FILMS WITH A
George J. Havrilla*, Elizabeth P. Hastings, George J. Havrilla*, Elizabeth P. Hastings
Chris Sparks, Chris Sparks
ALLOY CHARACTERIZATION AND IDENTIFICATION USING THE RUBBING TECHNIQUE WITH MICRO X-RAY FLUORESCENCE
Velma Montoya*, George J. Havrilla, Velma Montoya*, George J. Havrilla
IDENTIFICATION OF PAINTING MATERIALS USED FOR MURAL PAINTINGS BY IMAGE ANALYSIS AND XRF
S. Shirono, Y.Hayakawa*, S. Shirono, Y.Hayakawa*
A NEW GENERATION OF BRAGG POLARIZATIOn OPTICS IN EDXRF
Joachim Heckel, Joachim Heckel
A NEW APPROACH FOR QUANTITATIVE ANALYSIS IN EDXRF USING SILICON DRIFT DETECTORS
Joachim Heckel, Joachim Heckel
Development of Mobile type X-ray stress measuring equipments using EDXDM(Energy Dispersive X-ray Diffraction Method
Y. Hosokawa, Y. Hosokawa
T. Fujinami, Y. Miyoshi, H. Tanabe, T. Takamatsu, T. Fujinami, Y. Miyoshi, H. Tanabe, T. Takamatsu
J. Kawai, J. Kawai
X-Ray Projection and Microbeam using a an X-ray Wave Guide Resonator
Y. Hosokawa, Y. Hosokawa
Y. Miyoshi, H. Tanabe, T Takamatsu, Y. Miyoshi, H. Tanabe, T Takamatsu
J. Kawai, J. Kawai
DEVELOPMENT OF FOCUSING OPTICS FOR X-RAY DIFFRACTION
H. Huang, W.M. Gibson, Z. Chen, H. Huang, W.M. Gibson, Z. Chen
P. Van Roey, P. Van Roey
NONDESTRUCTIVE ANALYSIS OF INDIVIDUAL FLUID INCLUSION BY SRXRF
Y. Huang, W. He, Y. Huang, W. He
C. Wu, K. Li, C. Wu, K. Li
A NEW DECONVOLUTION METHOD FOR PORTABLE XRF ANALYSIS
B. Hubbard-Nelson, R. Koch, D. Sackett, B. Tannian, B. Hubbard-Nelson, R. Koch, D. Sackett, B. Tannian
D. Feinstein, D. Feinstein
AN IMPROVED ANALYTICAL METHODOLOGY USING SYNTHETIC STANDARDS, FUSED BEADS AND X-RAY FLUORESCENCE SPECTROMETRY FOR CEMENTS AND ASSOCIATED MATERIALS
M.N. Ingham, N.D. Eatherington, C.J.B. Gowing, M.N. Ingham, N.D. Eatherington, C.J.B. Gowing
A STUDY ON THE RELATIONSHIP BETWEEN CRYSTAL ORIENTATION AND ETCHING PROPERTIES OF PATTERNED CU ON PCB
Y.I. Jang*, B.K. Kim, J.S. Kim, Y.I. Jang*, B.K. Kim, J.S. Kim
SYNCHROTRON X-RAY STUDY OF STRUCTURAL PHASE TRANSFORMATIONS IN CONTINUOUS AND PATTERNED Ge2Sb2Te5 PHASE-CHANGE MATERIAL THIN FILMS
J.L. Jordan-Sweet, S.M. Rossnagel, P.M. Mooney, J.L. Jordan-Sweet, S.M. Rossnagel, P.M. Mooney
S. Raoux, C.T. Rettner, S. Raoux, C.T. Rettner
FUNDAMENTAL PARAMETER METHOD USING SCATTERING X-RAYS IN X-RAY FLUORESCENCE ANALYSIS
Y. Kataoka*, N. Kawahara, S. Hara, Y. Yamada, T. Matsuo, Y. Kataoka*, N. Kawahara, S. Hara, Y. Yamada, T. Matsuo
Michael Mantler, Michael Mantler
FACTORS AFFECTING IN-LINE PHASE CONTRAST IMAGING WITH A LABORATORY MICROFOCUS X-RAY SOURCE
K.L. Kelly*, B.K. Tanner, K.L. Kelly*, B.K. Tanner
IN-SITU AND REAL-TIME CHARACTERIZATION OF MOCVD GROWTH USING X-RAY DIFFRACTION
X-RAY ANALYSIS OF SiC
Kevin W. Kirchner, Kevin W. Kirchner
SPECTRO iQ - A NEW GENERATION OF BENCHTOP XRF
N. Kirkpatrick, N. Kirkpatrick
J. Heckel, D. Wissmann, J. Heckel, D. Wissmann
TOPOGRAPHIC TESTING OF CRYSTALS FOR THE ADVANCED PHOTON SOURCE USERS
S.Krasnicki, J.Maj*, A.Macrander, Y.Zhong, S.Krasnicki, J.Maj*, A.Macrander, Y.Zhong
ANALYZE OF STRESS DISTRIBUTION BASED ON MEASUREMENTS WITH TWO WAYS OF X-RAY INCIDENCE
B.Kucharska, B.Kucharska
MULTI-MODE X-RAY STUDY OF SULFATE ATTACK OF PORTLAND CEMENT
K. Kurtis, K. Kurtis
xrd
lukman, lukman
Optical properties of two-lens system on the base of hard X-ray zone plates
A.V. Kuyumchyan, A.A. Isoyan, S.M. Kouznetsov, V.V. Aristov, E.V. Shulakov, A.V. Kuyumchyan, A.A. Isoyan, S.M. Kouznetsov, V.V. Aristov, E.V. Shulakov
A. Snigirev, I. Snigireva, A. Snigirev, I. Snigireva
V. Kohn, V. Kohn
Reproduction of hologram image using a zone plate for hard X-ray Radiation
A. V. Kuyumchyan, A.A. Isoyan, V.V. Aristov, A. V. Kuyumchyan, A.A. Isoyan, V.V. Aristov
A. Yu. Souvorov, T. Ishikawa, A. Yu. Souvorov, T. Ishikawa
K. Trouni, and E. Sarkisian, K. Trouni, and E. Sarkisian
RESEARCHES ON NEURODEGENERATION USING TECHNIQUES BASED ON SYNCHROTRON RADIATION
J. Chwiej, M. Szczerbowska-Boruchowska, S. Wójcik, M. Lankosz, Z. Stęgowski, J. Chwiej, M. Szczerbowska-Boruchowska, S. Wójcik, M. Lankosz, Z. Stęgowski
D. Adamek, A. Krygowska-Wajs, B. Tomik, Z. Setkowicz, D. Adamek, A. Krygowska-Wajs, B. Tomik, Z. Setkowicz
S. Bohic, J. Susini, A. Simionovici, D. Eihert, S. Bohic, J. Susini, A. Simionovici, D. Eihert
G. Falkenberg, G. Falkenberg
Total EDXRF Assay of Plastics Exploiting Non-Sherman Volumetric Effects
A. Lee, P.J. Ramadge, A. Lee, P.J. Ramadge
B. Hubbard-Nelson, B. Hubbard-Nelson
D.I. Feinstein, D.I. Feinstein
RESIDUAL STRESS IN MACHINED SURFACES PRODUCED ON A NICKEL BASE POWDER ALLOY
Wei Li, Wei Li
Philip J. Withers, Philip J. Withers
CLOSE CONTACT PENALTY FUNCTIONS IN DIRECT SPACE METHODS AND ENERGETIC CONSIDERATIONS IN STRUCTURE REFINEMENT
DEPTH RESOLVED STRAIN SCANNING USING HIGH ENERGY SYNCHROTRON RADIATION AND A CONICAL SLIT CELL
U. Lienert, J.D. Almer, D.R. Haeffner, U. Lienert, J.D. Almer, D.R. Haeffner
DETERMINING SIZE DISTRIBUTION OF SMALL NANOPARTICLES IN HETEROGENEOUS CATALYSTS: CHALLENGES AND OPPORTUNITIES
Jingyue Liu, Jingyue Liu
THEORETICAL INTERPRETATION OF THE EXPERIMENTS WITH HIGH-RESOLUTION PARAMETRIC X-RAYS
I.D. Feranchuk, A.S. Lobko*, I.D. Feranchuk, A.S. Lobko*
A.P. Ulyanenkov, A.P. Ulyanenkov
DATA MINING WITH DIFFERENT TYPES OF X-RAY DATA
A E Chen, A E Chen
A R Drews, A R Drews
C J Gilmore, C J Gilmore
D Scholl, D Scholl
W Sverdlik, W Sverdlik
SCATTERING ENHANCED RADIOGRAPHY FOR DETERMINATION OF SIZE AND SHAPE OF PLASTIC ZONES IN POLYMERS
G.A. Maier, G.A. Maier
G. Wallner, G. Wallner
P. Fratzl, P. Fratzl
THE FUSION METHOD APPLIED TO A WIDE VARIETY OF INDUSTRIAL APPLICATIONS
A COMPARISON OF EDXRF AND RAMAN CHEMICAL IMAGING FOR USE IN FORMULATION PROCESS DEVELOPMENT AND QUALITY CONTROL.
Andrew Whitley, Andrew Whitley
Sergey Mamedov, Sergey Mamedov
Fran Adar, Fran Adar
Fiona Clarke, Fiona Clarke
STANDARDLESS XRF
Michael K. Mantler, Michael K. Mantler
COMPARISON OF FUSION VERSUS PRESSED POWDER IN XRF ANALYSIS
John E. Martin, John E. Martin
Richard Bostwick, Richard Bostwick
TIME-RESOLVED X-RAY IMAGING IN STUDIES OF ADVANCED ALLOY SOLIDIFICATION PROCESSES
RH Mathiesen, RH Mathiesen
L Arnberg, L Arnberg
CHARACTERISATION OF LARGE AREA AVALANCHE PHOTODIODES FOR X-RAY SPECTROMETRY
L.M.P. Fernandes, J.A.M. Lopes and J.M.F. dos Santos, L.M.P. Fernandes, J.A.M. Lopes and J.M.F. dos Santos
J.A.M. Lopes, J.A.M. Lopes
THERMAL LATTICE EXPANSION IN EPITAXIAL SrTiO3(100) ON Si(100)
D.E. McCready, V. Shutthanandan, D.E. McCready, V. Shutthanandan
Yong Liang, Yong Liang
AUTOMATED NANOLITER DRIED SPOT SAMPLE PREPARATION METHOD FOR X-RAY FLUORESCENCE LIQUID SAMPLE ANALYSIS
Thomasin C. Miller*, Thomasin C. Miller*
Elisabeth P. Hastings, George J. Havrilla, Elisabeth P. Hastings, George J. Havrilla
MICRO X-RAY FLUORESCENCE AS A HIGH THROUGHPUT, DOUBLE COMBINATORIAL SCREENING TOOL
E.M. Minogue*, T.P. Taylor, G.J. Havrilla, E.M. Minogue*, T.P. Taylor, G.J. Havrilla
QUANTIFYING PEPTIDE-METAL BINDING ON BEAD BASED LIBRARIES
E.M. Minogue*, T.P. Taylor, G.J. Havrilla, V.M. Montoya, E.M. Minogue*, T.P. Taylor, G.J. Havrilla, V.M. Montoya
X-RAY FLUORESCENCE ANALYSIS OF URANIUM ALUMINUM ALLOYS
D.M. Missimer, A.R. Jurgensen, R.L. Rutherford, D.M. Missimer, A.R. Jurgensen, R.L. Rutherford
PHASE IMAGING WITH AN X-RAY TALBOT INTERFEROMETER
A. Momose, A. Momose
I. Koyama, I. Koyama
W. Yashiro, W. Yashiro
Y. Suzuki, Y. Suzuki
T. Hattori, T. Hattori
RESIDUAL STRESS MEASUREMENT OF FIBER TEXTURE MATERIALS NEAR SINGLE CRYSTAL
Masahide, Gotoh, Masahide, Gotoh
Toshihiko, Sasaki, Toshihiko, Sasaki
Yukio, Hirose, Yukio, Hirose
PRELIMINARY INVESTIGATIONS FOR X-RAY IMAGING THE ARCHIMEDES PALIMPSEST USING ELEMENTAL X-RAY AREA MAPS AND STEREOVIEW ELEMENTAL X-RAY IMAGING
R. W. Morton, J. J. Gislason, R. W. Morton, J. J. Gislason
G. S. Hall, G. S. Hall
U. Bergman, U. Bergman
W. Noel, W. Noel
CRYSTALLOGRAPHIC CHANGES IN ELECTRICALLY FATIGUED PZT ACTUATORS
J. Mueller*, S. Hooker, J. Mueller*, S. Hooker
D. Balzar, D. Balzar
COMPARISON OF TEXTURE IN COPPER AND ALUMINUM THIN FILMS DETERMINED BY XRD AND EBSD
J. Mueller*, R.H. Geiss, D.T. Read, R. Keller, J. Mueller*, R.H. Geiss, D.T. Read, R. Keller
D. Balzar, D. Balzar
Development of Plastic Certified Reference Materials for XRF analysis.
T. Tsuji, T. Tsuji
T.Nakamura, T.Nakamura
GRAZING-INCIDENCE X-RAY FLUORESCENCE ANALYSIS OF MICROELECTROMECHANICAL SYSTEMS
J. Naud, J. Naud
R.Y. Fillit, R.Y. Fillit
POLYMORPHIC ANALYSIS OF TEGAFUR
F. Needham, J. Faber, T.G. Fawcett, F. Needham, J. Faber, T.G. Fawcett
D.H. Olson, D.H. Olson
R.E. Needham, R.E. Needham
CALCULATING SAMPLE DISPLACEMENT FROM PATTERNS WITH DIFFERENT FIXED INCIDENT ANGLES
J.M. Neil, A. Navrotsky, J.M. Neil, A. Navrotsky
H. Pilliere, H. Pilliere
OPTIMIZED READOUT METHODS OF SILICON DRIFT DETECTORS FOR HIGH RESOLUTION, HIGH COUNT RATE X-RAY SPECTROSCOPY
A. Niculae, H.Soltau, P.Lechner, A. Niculae, H.Soltau, P.Lechner
G. Lutz, L. Strüder, G. Lutz, L. Strüder
C. Fiorini, A. Longoni, C. Fiorini, A. Longoni
LARGE AREA SILICON DRIFT DETECTORS FOR X-RAY SPECTROSCOPY
A. Niculae, H. Soltau, P. Lechner, R. Eckhard, A. Niculae, H. Soltau, P. Lechner, R. Eckhard
G. Lutz, L. Strüder, G. Schaller, F. Schopper, G. Lutz, L. Strüder, G. Schaller, F. Schopper
C. Fiorini, A. Longoni, C. Fiorini, A. Longoni
MICRO-THIN FILM ANALYSIS USING MONO-CAPILLARY WITH 10-MICROMETER SPATIAL RESOLUTION
Kenichi Obori, Shintaro Komatani, Sumito Ohawa, Kenichi Obori, Shintaro Komatani, Sumito Ohawa
Andrew Whitley, Andrew Whitley
HIGH-PRECISION STRAIN DETERMINATION OF SGOI BY HIGH-RESOLUTION IN-PLANE DIFFRACTION HIGH-PRECISION STRAIN DETERMINATION OF SGOI BY HIGH-RESOLUTION IN-PLANE DIFFRACTION HIGH-PRECISION STRAIN DETERMINATION OF SGOI BY HIGH-RESOLUTION IN-PLANE DIFFRACTION HIGH-PRECISION STRAIN DETERMINATION OF SGOI BY HIGH-RESOLUTION IN-PLANE DIFFRACTION
Aya Ogi, Aya Ogi
MICRO AND MESO SCALE STRAIN MEASUREMENTS IN CEMENT-BASED MATERIALS
J J Biernacki, C J Parnham*, J J Biernacki, C J Parnham*
C R Hubbard, T R Watkins, C R Hubbard, T R Watkins
J Bai, J Bai
COMBINING MICRO X-RAY FLUORESCENCE AND INFRARED IMAGING SPECTROSCOPIES FOR THE UNDERSTANDING OF COMPLEX CHEMICAL SYSTEMS.
B.M. Patterson, G.J. Havrilla, B.M. Patterson, G.J. Havrilla
MALACHITE-ROSASITE GROUP: EVIDENCE FOR TWO DISTINCT STRUCTURAL TYPES THROUGH RIETVELD REFINEMENTS
N. Perchiazzi, S. Merlino, N. Perchiazzi, S. Merlino
OPTIMIZATION OF QUANTIFICATION SCHEMES FOR CONTEMPORARY FIELD-PORTABLE XRF ANALYZERS
Stanislaw Piorek, Stanislaw Piorek
SURFACE MONITOR: A NEW INSTRUMENT FOR IN SITU XRD-XRF AND OPTICAL MEASUREMENT
Paolo Plescia, Paolo Plescia
Gabriel M. Ingo, Gabriel M. Ingo
Andrea Bianco, Andrea Bianco
Combined microtromography and diffraction analyses of creep processes
Anke Rita Pyzalla*, Heinz Kaminski, Anke Rita Pyzalla*, Heinz Kaminski
Walter Reimers, Bettina Camin, Walter Reimers, Bettina Camin
Thomas Buslaps, Marco Di Michiel, Thomas Buslaps, Marco Di Michiel
DETERMINATION OF THE ELEMENT DISTRIBUTION IN SAUROPOD BONES BY MICRO-XRF
R. Ferreyro, A.R. Pyzalla, R. Ferreyro, A.R. Pyzalla
N.Cernohlawek2, C.Jokubonis2, Christina Streli2,, N.Cernohlawek2, C.Jokubonis2, Christina Streli2,
P. Martin Sander3, P. Martin Sander3
stress analysis
ELECTRIC FIELD INFLUENCE ON EMISSION OF CHARACTERISTIC X-RAY FROM Al2O3 TARGETS BOMBARDED WITH SLOW Xe+ IONS
J. C. Rao*, M. Song, K. Mitsuishi, M. Takeguchi, K. Furuya, J. C. Rao*, M. Song, K. Mitsuishi, M. Takeguchi, K. Furuya
PLASTIC ANISOTROPY IN HOT EXTRUDED Mg AND BRASS ALLOYS
W. Reimers, W. Reimers
BIOMEDICAL X-RAY IMAGING, CURRENT STATUS AND SOME FUTURE CHALLENGES
E.L. Ritman, E.L. Ritman
GEOSCIENCE APPLICATIONS OF SYNCHROTRON X-RAY IMAGING
Mark L. Rivers, Mark L. Rivers
QUANTITATIVE ENERGY-DISPERSIVE ELECTRON PROBE X-RAY MICROANALYSIS OF INDIVIDUAL PARTICLES
C.-U. Ro, C.-U. Ro
X-RAY AND NEUTRON DIFFRACTION ANALYSIS OF ErD2 FILMS
M.A. Rodriguez, J. Browning, C. Frazer, R. Tissot, M.A. Rodriguez, J. Browning, C. Frazer, R. Tissot
VISUALIZATION FOR UNDERSTANDING
H.D. Rosenfeld, H.D. Rosenfeld
THE USE OF X-RAY INSTRUMENTATION FOR QUALITY CONTROL IN A CEMENT PLANT
B.E. Rowe, C.R. Urrutia, B.E. Rowe, C.R. Urrutia
ADVANCEMENTS IN PORTABLE XRF INSTRUMENTATION
B. Hubbard-Nelson, R. Koch, K. Russell, R. Russell, D. Sackett, B. Hubbard-Nelson, R. Koch, K. Russell, R. Russell, D. Sackett
QUANTITATIVE MECHANICAL AND TRANSPORT PROPERTIES OF GRANULAR SYSTEMS CALCULATED FROM X-RAY TOMOGRAPHY IMAGES
A. Sakellariou, T.J. Senden, T.J. Sawkins, M.A. Knackstedt, M.L. Turner, A.C. Jones, M. Saadatfar, A. Limaye, C.H. Arns, A.P. Sheppard, R.M. Sok, A. Sakellariou, T.J. Senden, T.J. Sawkins, M.A. Knackstedt, M.L. Turner, A.C. Jones, M. Saadatfar, A. Limaye, C.H. Arns, A.P. Sheppard, R.M. Sok
MEASURMENT OF RESIDUAL STRESSES IN GTA SPOT WELDED Ti6AlV4V DISKS
J. Sariel, I. Dahan, J. Sariel, I. Dahan
M. Szanto, A. Stern, M. Szanto, A. Stern
DEFINITIVE MINERALOGICAL ANALYSIS ON MARS USING X-RAY DIFFRACTION
P. Sarrazin,, P. Sarrazin,
D. Blake,, D. Blake,
D. Bish,, D. Bish,
D. Vaniman, S. Chipera,, D. Vaniman, S. Chipera,
M. Gailhanou, M. Gailhanou
POWDER X-RAY DIFFRACTION DETECTION OF CRYSTALLINE PHASES IN AMORPHOUS PHARMACEUTICALS
B.A. Sarsfield*, S. Futernik, J.L. Hilden, S. Yin and G. Young, B.A. Sarsfield*, S. Futernik, J.L. Hilden, S. Yin and G. Young
J.S. Tan, J.S. Tan
LABORATORY SYSTEM FOR X-RAY NANOTOMOGRAPHY
A.Sasov, A.Sasov
SAXSess – A TOOL FOR NANOSTRUCTURED MATERIALS
H. Schnablegger, H. Schnablegger
O. Glatter, O. Glatter
T. Röder, T. Röder
WHERE ARE WE AFTER THE DECADE-LONG RENAISSANCE IN X-RAY IMAGING?
A. Snigirev, A. Snigirev
ABNORMAL X-RAY EMISSION FROM INSULATORS BOMBARDED WITH LOW ENERGY IONS
Minghui Song, Kazutaka Mitsuishi, Masaki Takeguchi, Kazuo Furuya, Minghui Song, Kazutaka Mitsuishi, Masaki Takeguchi, Kazuo Furuya
Robert C. Birtcher, Robert C. Birtcher
VALUE OF NUMERICAL ANALYSIS OF LINEAR ATTENUATION COEFFICIENTS IN MICROTOMOGRAPHY
S.R. Stock, S.R. Stock
F. DeCarlo, F. DeCarlo
CONTROLLING THE MICROSTRUCTURES OF SEVERELY PLASTIC DEFORMED Mg ALLOY, ZK60
Grigoreta M. Stoica, Joseph E. Spruiell, Peter K. Liaw, Grigoreta M. Stoica, Joseph E. Spruiell, Peter K. Liaw
Andrew E.Payzant*, Andrew E.Payzant*
Sean R. Agnew, Sean R. Agnew
Donald A. Carpenter, Donald A. Carpenter
Lijia Chen, Lijia Chen
TXRF ANALYSIS IN THE PPB TO PPM CONCENTRATION RANGE - AN APPLICATIVE STUDY
H. Stosnach, H. Stosnach
ULTRATRACE ELEMENT ANALYSIS WITH SR-TXRF AT BEAMLINE L FOR AEROSOL AND AL-OXIDE SAMPLES
J.Broekaert, B. Peschel, U. Fittschen, J.Broekaert, B. Peschel, U. Fittschen
C. Streli, P. Wobrauschek, C. Jokubonis, C. Streli, P. Wobrauschek, C. Jokubonis
G. Pepponi, G. Pepponi
G. Falkenberg, G. Falkenberg
APPLICATION OF THE TXRF METHOD FOR THE ELEMENTAL ANALYSIS OF THE CEREBROSPINAL FLUID AND SERUM IN AMYOTROPHIC LATERAL SCLEROSIS
B. Ostachowicz, M. Lankosz, B. Ostachowicz, M. Lankosz
B. Tomik, D. Adamek, B. Tomik, D. Adamek
P. Wobrauschek, C. Streli, P. Kregsamer, P. Wobrauschek, C. Streli, P. Kregsamer
TXRF ANALYSIS OF LOW Z ELEMENTS IN ENVIRONMENTAL SAMPLES
H.Hoefler, C. Streli, P. Wobrauschek, H.Hoefler, C. Streli, P. Wobrauschek
G.Zaray, G.Zaray
CHARACTERISATION OF ARSENIC ULTRA SHALLOW JUNCTIONS BY GRAZING INCIDENCE FLUORESCENCE EXAFS
G. Pepponi,D. Giubertoni, M. Bersani, G. Pepponi,D. Giubertoni, M. Bersani
C. Streli, C. Jokubonis, P. Wobrauschek, C. Streli, C. Jokubonis, P. Wobrauschek
G. Falkenberg, G. Falkenberg
A NEW AREA DETECTOR FOR HIGH-SPEED AND HIGH-SENSITIVITY X-RAY DIFFRACTION ANALYSIS
T. Taguchi, T. Taguchi
INTERFACE AND COMPOSITIONAL CHANGES ON ANNEALING COFE/CU AND NIFE/CU MULTILAYERS
T.P.A. Hase, B.D. Fulthorpe, B.K. Tanner, T.P.A. Hase, B.D. Fulthorpe, B.K. Tanner
M.S. Beal, M.S. Beal
P. Clifton, P. Clifton
HIGH-RESOLUTION PARALLEL-BEAM POWDER DIFFRACTION MEASUREMENT OF SUB-SURFACE DAMAGE IN ALUMINA AND ALUMINA-SILICON CARBIDE NANOCOMPOSITES
B.K. Tanner, B.K. Tanner
H.Z. Wu, H.Z. Wu
S.G. Roberts, S.G. Roberts
CRYSTALLOGRAPHY OF TWO-DIMENSIONALLY PATTERNED THIN FILM NANOSCALE ARRAYS
D.S. Eastwood, T.P. Hase, D. Atkinson, B.K. Tanner, D.S. Eastwood, T.P. Hase, D. Atkinson, B.K. Tanner
M. van Kampen, B. Hjörvarsson, M. van Kampen, B. Hjörvarsson
DIRECT DETERMINATION OF ATOM POSITIONS IN NON-PERFECT CRYSTALS WITH KINEMATICAL X-RAY STANDING WAVES
M. Tolkiehn, D.V. Novikov, M. Tolkiehn, D.V. Novikov
SPECIATION OF NITROGEN COMPOUNDS IN NANOSCOPIC FINE AEROSOL SAMPLES USING TXRF-NEXAFS AND LOW-Z PARTICLE EPMA
J. Osán, S. Török, J. Osán, S. Török
B. Beckhoff, G. Ulm, B. Beckhoff, G. Ulm
H. Hwang, C.-U. Ro, H. Hwang, C.-U. Ro
C. Abete, C. Abete
R. Fuoco, R. Fuoco
ENERGY DISPERSIVE X-RAY MICROANALYSIS OF HOT PARTICLES
S. Török, A. Alsecz, J. Osán, S. Török, A. Alsecz, J. Osán
N. Vajda, N. Vajda
Micro-XRF Analysis of Biological Materials
K. Tsuji, K. Nakano, K. Tsuji, K. Nakano
K. Tanaka, A. Okhrimovskyy, Y. Konishi, K. Tanaka, A. Okhrimovskyy, Y. Konishi
X. Ding, X. Ding
NOVEL ANALYTICAL APPROACHES IN NUMERICAL ANALYSIS OF XRR AND HRXRD DATA FROM THIN FILMS
A.Ulyanenkov, A.Ulyanenkov
EDXRF WITH HIGH-ENERGY POLARIZED BEAM EXCITATION FOR ANALYSIS OF AEROSOL FILTERS
R. Van Grieken* Z. Spolnik, K. Van Meel, S. Potgieter-Vermaak, R. Van Grieken* Z. Spolnik, K. Van Meel, S. Potgieter-Vermaak
PRAXIS: A COMBINED µ-XRF/µ-RAMAN SPECTROMETER FOR USE IN THE CULTURAL-HERITAGE AREA
K. Janssens, W. De Nolf, O. Schalm, B. Vekemans, K. Janssens, W. De Nolf, O. Schalm, B. Vekemans
E. Castellucci, E. Castellucci
B. Roussel, S. Charonov, B. Roussel, S. Charonov
J. Schmalz, J. Tilgner, M. Haschke, N. Langhoff, J. Schmalz, J. Tilgner, M. Haschke, N. Langhoff
P. Ramos, I. Ruisánchez, P. Ramos, I. Ruisánchez
K. Andrikopoulos, K. Andrikopoulos
TOWARDS THREE-DIMENSIONAL TRACE ELEMENT MICROSCOPIC XRF ANALYSIS
B. Vekemans, K. Janssens, B. Vekemans, K. Janssens
L. Vincze, L. Vincze
RECIPES FOR THE COLLECTION OF RELIABLE XRD RESIDUAL STRESS DATA
A.C. Vermeulen, A.C. Vermeulen
DIFFRACTION INVESTIGATION OF TENSILE LOADING OF CuNb NANO-SCALE MULTILAYER FILM
S.C. Vogel, D.W. Brown, B. Clausen, A. Misra, T. A. Saleh, M.A.M. Bourke, S.C. Vogel, D.W. Brown, B. Clausen, A. Misra, T. A. Saleh, M.A.M. Bourke
J. Almer, J. Almer
ANALYSIS OF TEXTURE AND DIFFRACTION DATA FROM STRONG NEUTRON ABSORBERS
H.M. Volz, S.C. Vogel, C.T. Necker, J.A. Roberts, A.C. Lawson, D.J. Williams, L.L. Daemen, H.M. Volz, S.C. Vogel, C.T. Necker, J.A. Roberts, A.C. Lawson, D.J. Williams, L.L. Daemen
L. Lutterotti, L. Lutterotti
J. Pehl, J. Pehl
MATRIX CORRECTION FOR TRACE ELEMENT ANALYSIS USING MASS ATTENUATION COEFFICIENTS
B. Vrebos, S. Milner , B. Vrebos, S. Milner
M. Ingham, M. Ingham
THE METHOD OF IMAGING AND 3-D DIAGNOSTICS OF ACTIVE AND PASSIVE SOURCE OF X-RADIATION IN BIOMEDICAL INVESTIGATION BY THE PHENOMENON OF RADIATION INTENSITY CORRELATION
V.I. Vysotskii, M. Vysotskyy, V.I. Vysotskii, M. Vysotskyy
ULTRAFAST X-RADIOGRAPHY AND X-TOMOGRAPHY OF HIGH-PRESSURE AND HIGH-SPEED FUEL SPRAYS
J. Wang, J. Wang
MULTI-SPECTRAL XRF COUNTING: SQUEEZE TWICE AS MUCH INFORMATION FROM YOUR DETECTOR
W.K. Warburton, P. Grudberg, J. Harris, W.K. Warburton, P. Grudberg, J. Harris
B. Cross, B. Cross
APPLICATIONS OF PARALLEL BEAM OPTICS AT ELEVATED TEMPERATURES
T. R. Watkins, T. R. Watkins
THIN POLYMER FILM STRUCTURE USING RESONANT SOFT X-RAY CONTRAST VARIATION
Cynthia Welch*, Cynthia Welch*
Rex Hjelm, Rex Hjelm
E. Bruce Orler, E. Bruce Orler
Debra Wrobleski, Debra Wrobleski
Marilyn Hawley, Marilyn Hawley
Joseph Mang, Joseph Mang
INVESTIGATING THE NATURE OF LINE BROADENING IN ELECTROCHEMICALLY DEINTERCALATED Li1.2Mn0.4Ni0.3Co0.1O2
Svetlana Niketic, Svetlana Niketic
Yvon Le Page, Yvon Le Page
Isobel J. Davidson, Isobel J. Davidson
QUANTITATIVE RIETVELD ANALYSIS OF HYDRATED CEMENTITIOUS SYSTEMS
L.D. Mitchell* , P.S. Whitfield, L.D. Mitchell* , P.S. Whitfield
UNTANGLING CATION ORDERING IN COMPLEX LITHIUM BATTERY CATHODE MATERIALS - SIMULTANEOUS REFINEMENT OF X-RAY, NEUTRON AND RESONANT SCATTERING DATA
I.J. Davidson, I.J. Davidson
L.M.D. Cranswick, L.M.D. Cranswick
I.P. Swainson, I.P. Swainson
P.W. Stephens, P.W. Stephens
QUANTITATIVE SUB-100nm PHASE-CONTRAST IMAGING USING AN SEM-BASED FULL-FIELD X-RAY MICROSCOPE
S.W. Wilkins, D. Gao, T.E. Gureyev, S.C. Mayo, P.R. Miller, Y. Nesterets, D. Parry, A. Pogany, A.W. Stevenson, S.W. Wilkins, D. Gao, T.E. Gureyev, S.C. Mayo, P.R. Miller, Y. Nesterets, D. Parry, A. Pogany, A.W. Stevenson
D. Paganin, D. Paganin
DEPTH PROFILE SUTDY OF THE COMPOSITION OF URINARY STONES AND CRYSTALS FROM CANINES AND FELINES USING X-RAY DIFFRACTION
K.R. Fjeldahl, R.S. Winburn, K.R. Fjeldahl, R.S. Winburn
MICROABSORPTION OR ABSORPTION CONTRAST IN ‘REAL’ MATERIALS
A.M. Brayko, R.S. Winburn, A.M. Brayko, R.S. Winburn
PARAMETER STUDIES FOR AN OPTIMIZED XRF-DETERMINATION OF Pb IN BONE
P. Wobrauschek, N. Cernohlawek, C. Streli, N. Zoeger, P. Wobrauschek, N. Cernohlawek, C. Streli, N. Zoeger
TXRF ANALYSIS OF DRINKING WATER AND AUSTRIAN WINE
P. Kregsamer, X. Gruber, P. Wobrauschek, C. Streli, P. Kregsamer, X. Gruber, P. Wobrauschek, C. Streli
HIGH TEMPERATURE STUDIES OF PHASE EVOLUTION OF Ba2RCu3O6+x FILMS PREPARED USING THE “BaF2 PROCESS”
W. Wong-Ng, I. Levin, J. Ritter, L.P. Cook, M. Vaudin, W. Wong-Ng, I. Levin, J. Ritter, L.P. Cook, M. Vaudin
R. Feenstra, A. Goyal, R. Feenstra, A. Goyal
DETECTION OF VISIBLE AND LATENT FINGERPRINTS BY MICRO-X-RAY FLUORESCENCE
Christopher G. Worley*, Sara S. Wiltshire, Thomasin C. Miller, George J. Havrilla, and Vahid Majidi, Christopher G. Worley*, Sara S. Wiltshire, Thomasin C. Miller, George J. Havrilla, and Vahid Majidi
MICRO X-RAY DIFFRACTION IMAGING OF BULK POLYCRYSTALLINE MATERIALS
T. Wroblewski, T. Wroblewski
A. Bjeoumikhov, A. Bjeoumikhov
B. Hasse, B. Hasse
AN X-RAY NANODIFFRACTION TECHNIQUE FOR INDIVIDUAL CRYSTALLINE NANOOBJECTS
Y. Xiao, Y. Xiao
Z. Cai, Z. Cai
B. Lai, B. Lai
Y.S. Chu, Y.S. Chu
DETERMINATION OF CATION DISTRIBUTIONS IN Mn3O4 BY ANOMALOUS X-RAY POWDER DIFFRACTION
Y. Xiao, Y. Xiao
E. Wittmer, E. Wittmer
F. Izumi, F. Izumi
S. Mini, S. Mini
T. Graber , T. Graber
P.J. Viccaro, P.J. Viccaro
QUANTITATIVE X-RAY FLUORESCENCE ANALYSIS FOR THICK SAMPLE BY FUNDAMENTAL PARAMETERS
Y. Xiao, Y. Xiao
STRUCTURAL CHARACTERIZATION OF PENTAGON-SHAPED LEAD MESOSCOPIC PARTICLES BY X-RAY MICRODIFFRACTION
Y. Xiao, Y. Xiao
Z. Cai, Z. Cai
Y. Chu, Y. Chu
A. Tkachuk, A. Tkachuk
B. Lai, B. Lai
RESIDUAL STRESS MEASUREMEN OF CEMENTITE PHASE IN PLASTICALLY DEFORMED CARBON STEELS
Lei CHE, Lei CHE
Masahide GOTOH, Masahide GOTOH
Yukio HIROSE, Yukio HIROSE
Characterization of the physical form of drug in pharmaceutical film-coated tablets and calculation of the depth of penetration of X-rays
Hiroyuki Yamada, Hiroyuki Yamada
Raj Suryanarayanan, Raj Suryanarayanan
VISUAL REPRESENTATIONS OF STRESS TENSORS OBTAINED FROM X-RAY DIFFRACTION MESAUREMENTS
M Yaman*, M Harting, M Yaman*, M Harting
R.D. Kriz, R.D. Kriz
CRYSTALLOGRAPHY AND CRYSTAL CHEMISTRY OF THE “GREEN PHASE” (Ba1-xSrx)R2CuO5 (R=LANTHANIDES AND Y)
Z. Yang*, W. Wong-Ng, Q. Huang, L.P. Cook, Z. Yang*, W. Wong-Ng, Q. Huang, L.P. Cook
J.A. Kaduk, J.A. Kaduk
T. Haugan, T. Haugan
R.A. Young, R.A. Young
OPTIMAL DESIGN OF TRANSMISSION GRATING FOR X-RAY TALBOT INTERFEROMETER
W, Yashiro, W, Yashiro
A, Masada, A, Masada
A, Momose, A, Momose
INTERNAL STRAIN MEASUREMENTS IN ULTRAHIGH-CARBON STEELS
M.L. Young*, M.L. Young*
J.D. Almer, J.D. Almer
U. Lienert, U. Lienert
D.R. Haeffner, D.R. Haeffner
D.C. Dunand, D.C. Dunand
IN-SITU STRAIN AND IMAGING MEASUREMENTS OF SUPERCONDUCTING Mg/MgB2 COMPOSITES UNDER COMPRESSIVE LOADING
M.L. Young, M.L. Young
J. DeFouw, J. DeFouw
J.D. Almer, J.D. Almer
K. Fezzaa/W.-K. Lee, K. Fezzaa/W.-K. Lee
D.R. Haeffner, D.R. Haeffner
D.C. Dunand, D.C. Dunand
LIMITED-PROJECTION TOPOGRAPHY COMPARISON OF TYPES Ib AND IIa DIAMONDS
Y. Zhong, A. Macrander, S. Krasnicki, Y. S. Chu, and J. Maj, Y. Zhong, A. Macrander, S. Krasnicki, Y. S. Chu, and J. Maj


 

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