The 54 th Annual Denver X-ray Conference (DXC) was held in Colorado Springs , Colorado from 1-5 August 2005. The conference returned to the Sheraton Colorado Springs, and attracted over 300 registered attendees and over 200 exhibit personnel.
Conference week began with 14 tutorial workshops, held on Monday and Tuesday. Topics included: X-ray Microtomography; X-ray Optics; Rietveld Applications; Diffraction Analysis of Stress & Strain; Line Profile Analysis by the Whole Powder Pattern Fitting; Two-dimensional X-ray Diffraction; Specimen Preparation XRF; Energy Dispersive XRF; Quantitative XRF; Basic XRF and Monte Carlo Techniques in XRF. Tim Elam, known to many as an instructor in the Quantitative XRF and Energy Dispersive XRF workshops, also held a new position at this year's conference. Tim, who is affiliated with EDAX, Mahwah, NJ and the University of Washington, Redmond, WA, is now the newest member to join the Denver X-ray Conference Organizing Committee. Congratulations, Tim! Hope you enjoyed the “hazing” during your initiation week.
Fifteen special sessions filled the remaining two and a half days of the conference. Topics included:
New Developments in XRD & XRF Instrumentation; Advanced Imaging Techniques; Thin Films; X-ray Microtomography Applied to Materials Characterization; Microbeam Analysis; Industrial Applications of XRD & XRF; X-ray Optics; Detectors & Sources; Stress Analysis; Industrial Applications of XRD; Line Profile Analysis; Trace Analysis – ppm to ppb; Fusion Applications; Quantitative XRF and Energy Dispersive Applications. Missing from the sessions was Ting Huang, Emeritus, IBM, San Jose , CA , who organized the Detectors & Sources session, as well as the Thin Films session. A very special thank you to Tom Blanton, Eastman Kodak Company, Rochester , NY and Hideo Toraya, Rigaku Corporation, Tokyo, Japan , for chairing Dr. Huang's sessions in his absence. The talks ran smoothly during the sessions, due in part to the contribution of Diane Donati from PANalytical, Natick , MA . Diane stepped in to help the conference staff by loaning her projector on Thursday morning. Thank you Diane, you are our hero!
The Plenary Session, “X-ray Imaging”, was organized by Randy Barton, Emeritus, DuPont Experimental Station, Wilmington , DE and Stuart Stock, Northwestern University Medical School , Chicago , IL . The plenary topic of Imaging drew a huge crowd, and was one of the most popular plenary sessions to date. Four invited talks were presented during the Plenary: “ BIOMEDICAL X-RAY IMAGING, CURRENT STATUS AND SOME FUTURE CHALLENGES”, E.L. Ritman, Mayo Clinic College of Medicine, Rochester , MN ; “ WHERE ARE WE AFTER THE DECADE-LONG RENAISSANCE IN X-RAY IMAGING?” A. Snigirev, European Synchrotron Radiation Facility, Grenoble , France ; “X-RAY BACKSCATTER IMAGING: PHOTOGRAPHY THROUGH BARRIERS”, J. Callerame, American Science & Engineering, Inc., Billerica , MA ; “ GEOSCIENCE APPLICATIONS OF SYNCHROTRON X-RAY IMAGING” M.L. Rivers, Department of Geophysical Sciences and Center for Advanced Radiation Sources, University of Chicago , Chicago , IL . Each speaker gave a mesmerizing and provoking talk, not to mention their contribution of the fascinating images that were used on the covers of all the conference publications for 2005. It was a great honor to have such distinguished speakers at the conference, and we hope to visit the topic of imaging again in the future.
An awards presentation also took place during the Plenary Session to honor a variety of important contributions to the field of materials analysis. It was an uncommon event, but The 2005 Barrett Award was given as a joint award this year to two scientists that have excelled in the field of X-ray diffraction. The award was presented to Brian K. Tanner, University of Durham , Durham , UK and D. Keith Bowen, Bede Scientific Instruments, Ltd., Durham , UK . The award was presented by Cev Noyan, Columbia University , New York , NY. Dr. Tanner gave one of the finest acceptance speeches ever spoken at the conference, touching on the importance of not only the scientific contributions, but of the friendships and respect that grows between the scientists themselves. We quote Dr. Tanner, as his speech symbolized the essence of the true success of the Denver Conference, “One reason why the sociologists have got it so wrong in their analysis of science is that they misinterpret the human emotions that overlay the formal structure of the scientific method. They sensationalise the rivalries and trivialise the friendships. The Denver Conference epitomises the power of those friendships; it always has done and long may it continue.” The second award scheduled to be presented at the conference, also by Cev Noyan of Columbia University , NY , was the 2005 Jerome B. Cohen Student Award, however there was no recipient for the 2005 award. The final honor, The Jenkins Award, was presented to Victor Buhrke, Consultant, Portola Valley , CA , and was presented by John Gilfrich, Emeritus, SFA, Inc./NRL, Bethesda , MD. Dr. Buhrke accepted the award with pride, and spoke kindly of his dear friend Ron Jenkins. He then introduced Dr. Jenkins' wife, Phyllis, to the crowd, as well as, his own wife and partner, Janet. It was a heart warming moment that once again demonstrated the strong relationships that grow at the Denver Conference.
Poster sessions were held on Monday, Tuesday and Wednesday evening of conference week. Judges were appointed each night to select the best posters. The following posters were selected as the best: “3D INTERACTIVE DATA LANGUAGE POLE FIGURE VISUALIZATION” Colleen S. Frazer, Mark A. Rodriguez, Ralph G. Tissot, Sandia National Laboratories, Albuquerque, NM; “OPTIMAL DESIGN OF TRANSMISSION GRATING FOR X-RAY TALBOT INTERFEROMETER” Wataru Yashiro, Atsushi Momose, Akiko Masada, The University of Tokyo, Tokyo, Japan; “VALUE OF NUMERICAL ANALYSIS OF LINEAR ATTENUATION COEFFICIENTS IN MICROTOMOGRAPHY” Stuart R. Stock, Northwestern University, Chicago, IL and Francesco DeCarlo, APS, Argonne National Laboratory, Argonne, IL; “COMPARISON OF TEXTURE IN COPPER AND ALUMINUM THIN FILMS DETERMINED BY XRD AND EBSD” Jens Müller, Roy H. Geiss, D.T. Read, R. Keller, NIST, Boulder, CO and Davor Balzar, NIST, Boulder, CO and University of Denver, Denver, CO; “CHARACTERIZING SEMICONDUCTOR THIN FILMS WITH A CONFOCAL MICRO X-RAY FLUORESCENCE SPECTROMETER” George J. Havrilla, Elizabeth P. Hastings, Los Alamos National Laboratory, Los Alamos, NM and Chris Sparks, Process Characterization Laboratory, ATDF, Austin, TX; “MONTE-CARLO MODELING OF SILICON X-RAY DETECTORS” Brian Cross, Cross Roads Scientific, El Granada, CA, Greg Bale, Barrie Lowe and Rob Sareen, Gresham Scientific Instruments, Ltd., Buckinghamshire, United Kingdom; “DEVELOPMENT OF PLASTIC CERTIFIED REFERENCE MATERIALS FOR XRF ANALYSIS (JSAC 0611-0615) CONTAINING Pb, Cd, Cr” K. Nakano, Meiji University , Kanagawa, Japan and Osaka City University , Osaka, Japan and PRESTO, JST, Saitama, Japan, Kouichi Tsuji, Osaka City University, Osaka, Japan and PRESTO, JST, Saitama, Japan and Toshihiro Nakamura, Meiji University , Kanagawa , Japan .
Exhibits at the conference ran from Monday to Thursday where 40 companies displayed their various products and services for X-ray powder diffraction and X-ray fluorescence spectrometry. The following companies participated at the exhibits: AMPTEK, Inc.; ATPS, Inc.; Austin AI, LLC; Blake Industries, Inc.; Bruker AXS, Inc.; Brushwellman Electrofusion Products; Chemplex Industries, Inc.; Corporation Scientifique Claisse, Inc.; EDAX, Inc.; GBC Scientific Equipment Pty Ltd.; Gresham Scientific Instruments; Handley Analytical Services; Hecus X-ray Systems GmbH; Herzog Automation Corporation; HORIBA Jobin Yvon, Inc.; Inel, Inc.; Innov-X Systems, Inc.; International Centre for Diffraction Data (ICDD); Jordan Valley; Kratos Analytical; Materials Data, Inc.; MOXTEK, Inc.; Osmic, Inc.; Oxford Instruments Analytical; PANalytical; Princeton Gamma Tech Instruments; Radiant Detector Technologies; Rigaku/MSC, Inc.; Rocklabs Ltd.; SCT/Euro Industries; Spectro Analytical Instruments; Spectrum Plus; SPEX SamplePrep, LLC; Thales Components Corporation; Thermo Electron; Wiley; Xenocs SA; XIA LLC; X-ray & Specialty Instruments, Inc. and X-ray Optical Systems, Inc. It should be noted that the companies who participate in the exhibit also contribute to the conference technical program in an invaluable measure. The sales representatives who work the booths are also the scientists participating in our workshops and sessions – often as instructors and invited speakers. We thank them for their contributions.
A special thank you goes out to the vendors who sponsored evening receptions: Corporation Scientifique Claisse; GBC Scientific Equipment; Kratos/Shimadzu; Materials Data, Inc.; MOXTEK, Inc.; PANalytical; Rigaku/MSC, Inc. and Wiley. We would like to recognize Faycal Bouker from Claisse for the tremendous amount of preparation and hard work that he endured to make the Sunday evening reception a pleasant success; even though he himself was unable to attend the conference and enjoy the party. Thank you, Faycal!
On a personal note, I would like to acknowledge the members of the Organizing Committee, the instructors, speakers, chairs, and organizers for all of the time and effort that they volunteered to make this conference happen. Each attendee has contributed, in a remarkable way, to the tradition of camaraderie that has made the Denver X-ray Conference unique from all other scientific programs. It has become a reunion of friends and colleagues, and a time of year that I truly look forward to. I hope to see you all again in 2006!