The 2006 Denver X-ray Conference would like to thank the following sponsors:


 

2006 Denver X-ray Conference Tentative Program
7-11 August, Denver Marriott Tech Center Hotel, Denver, Colorado, U.S.A.
PROGRAM AT A GLANCE
Denver X-ray Conference Program-at-a-Glance
7–11 August 2006
All sessions and workshops will be held in the Evergreen Ballroom: A, B, C or D
Sun. eve.: 6:00–8:00 Welcoming Reception sponsored by Corporation Scientifique Claisse, Moxtek, Shimadzu/Kratos, & Wiley Evergreen
Day & Time
XRD & XRF XRD XRF
Mon. am:
Workshops
9:00–12:00		   W1 Specimen Preparation XRD

(Fawcett) A
W2 Rietveld Applications—
Beginner
(Kaduk) B
W3 High Resolution XRD
(Matyi) C		 W4 Specimen Preparation XRF I
(Anzelmo) D
Mon. pm:
Workshops
2:00–5:00		   W5 Basic Crystallography
(Toby) A
W6 Rietveld Applications—
Advanced
(Kaduk) B		 W7 Trace Element Analysis
(Zaitz) C
W8 Specimen Preparation XRF II
(Anzelmo) D
Mon. eve.: 6:00–8:00 Evening Reception sponsored by PANalytical; XRD Poster Session (Noyan/Barton) Evergreen
Tue. am:
Workshops
9:00–12:00		 W9 Microbeam X-ray
Characterization I
(Noyan) A		 W10 New Generation of XRD
Databases I
(Fawcett) B		 W11 Basic XRF (Elam) C
W12 Quantitative XRF I
(Mantler) D
Tue. pm:
Workshops
2:00–5:00		 W13 Microbeam X-ray
Characterization II
(Noyan) A		 W14 New Generation of XRD
Databases II
(Fawcett) B		 W15 EDXRF
(Elam/Scruggs) C
W16 Quantitative XRF I
I (Mantler) D
Tue. eve.: 5:00–5:30 Welcome New Attendees (Buhrke) Conifer 2
Tue. eve.: 6:00–8:00 Evening Reception sponsors to be announced; XRF Poster Session (Zaitz/Havrilla) Evergreen
Wed. am: 8:30 Plenary Session: Medical Applications of X-ray Analysis (Zaitz/Kaduk) Evergreen
Wed. pm:
Sessions*		 C1 New Developments in
XRD & XRF Instrumentation
(Anzelmo) A
C2 In-Situ Characterization
(Misture) B		 D1 Structure Solution and Refinement
(Kaduk) C		 F1 Quantitative XRF
(Elam) D
Thurs. am:
Sessions*		 C3 Thin Films
(Blanton/Huang) A		 D2 Applications of High-Energy
X-rays I
(Almer/Margulies) B		 F2 New Developments and Industrial Applications of XRF
(Anzelmo) C
F3 Trace Analysis
(Streli) D
Thurs. pm:
Sessions*		 C4 X-ray Optics
(Miller) A		 D3 Applications of High-Energy
X-rays II
(Almer/Margulies) B
D4 Industrial Applications of
XRD
(Snyder/Payzant) C		 F4 Fusion Applications
(Anzelmo) D
Fri. am:
Sessions*		 C5 Detectors & Sources
(Toraya/Huang) A
C6 Environmental and
Archaeological Applications
(Elam/Kemner) B		 D5 Stress Analysis
(Goldsmith/Watkins) C		  
*Session times vary; please consult the Program for exact presentation times.

 

Workshops
Monday morning
9:00 a.m.–12:00 p.m.

XRD

W1 - Specimen Preparation XRD - Evergreen A
Organizer and Instructors: T. Fawcett, International Centre for Diffraction Data, Newtown Square, PA
M. Rodriguez, Sandia National Laboratory, Albuquerque, NM
C. Crowder, The Dow Chemical Company, Midland, MI
S. Quick, Pennsylvania State University, State College, PA
Specimen preparation is often the limiting step for obtaining good results in a diffraction experiment. Preparation methods can influence the accuracy and precision of peak positions, intensities and profile. These are the basic measurements required for qualitative and quantitative analysis. The presentation will focus on crystallite and particle effects, orientation and texture, particle statistics and how various preparation methods can reduce or eliminate these influences. We will also cover a range of preparation techniques used with common instruments and various types of specimens.
 

W2 - Rietveld Applications I—Beginner Evergreen B
Organizer and Instructors: J.A. Kaduk, INEOS Technologies, Inc., Naperville, IL
J. Faber, International Centre for Diffraction Data, Newtown Square, PA
The Rietveld method is an essential tool for the X-ray analyst, but (because it requires knowledge to use successfully) can be intimidating. While we cannot make you an expert in one day, this workshop will help you to use the Rietveld method effectively for both structural characterization and quantitative phase analysis. The focus will be on recovering the information content of a powder pattern, optimizing the modeling of the structural and nonstructural contributions to the data, and interpreting and understanding the results. Instrument and specimen contributions to the pattern, as well as data collection strategies to optimize the structural information content, will be discussed. Both graphical and statistical measures of the quality of the results will be explained. Major emphasis will be placed on obtaining accurate and precise quantitative analyses, and on techniques for successful refinement of structures. Although the Rietveld method is a refinement technique, there will be some discussion of obtaining the structural models (solving structures).
 

W3 - High Resolution XRD - Evergreen C
Organizer and Instructor: R.J. Matyi, University at Albany—SUNY, Albany, NY
X-ray methods with high angular resolution are becoming increasingly important for the physical characterization of thin film materials and structures. Vendors now market state-of-the-art X-ray tools (both hardware and software) for the routine analysis of parameters such as layer thickness, chemical composition, strain relaxation, and interfacial roughness. The recent integration of X-ray diffraction and reflectivity systems into fab-compatible process metrology tools suggests that the importance of these techniques will only increase with time. Unfortunately, the users of X-ray analysis instruments (or the supervisors who are responsible for their use) often have had relatively little introduction to the theory that underpins their operation; they may not have an appreciation of quantity of information that can be gained from X-ray analyses or the deleterious effects that limitations in hardware, software, the sample, and the experimental technique can have. In this short course, we will discuss some basic principles of high-resolution X-ray methods (notably double- and triple-axis X-ray diffractometry and high-resolution X-ray reflectometry) and will describe the capabilities and limitations of these tools for thin film materials analysis. Extensive reference will be made to “real-life” problems involving thin-film structures (ranging from amorphous dielectrics and polycrystalline metals to highly perfect epitaxial single crystal materials) to show both the utility and the shortcomings of high resolution X-ray methods.

XRF

W4 - Specimen Preparation XRF I - Evergreen D
Organizer and Instructors: J.A. Anzelmo, Anzelmo & Associates, Inc., Madison, WI
Tariq S. Ahmedali, McGill University, Montreal, Quebec, Canada
Larry Arias, Bruker AXS, Madison, WI
Luc Berube, Corporation Scientifique Claisse, Ste-Foy, Quebec, Canada
D.F. Lupton, W.C. Heraeus GmbH, Hanau, Germany
This workshop will start with a description of setting up and maintaining an analytical laboratory with the proper equipment and procedures to produce the highest level of analytical and instrumentation performance and reliability (Ahmedali). A discussion of basic and fundamental considerations with respect to sample preparation for XRF will follow (Anzelmo). The afternoon will begin with a discussion on the preparation of Liquid samples (Arias), followed by a presentation on avoiding problems with platinum ware (Lupton), and ending with the preparation of ferroalloys, soils, and other materials by the borate fusion technique (Berube).
 

Workshops
Monday afternoon
2:00–5:00 p.m.

XRD

W5 - Basic Crystallography - Evergreen A
Organizer and Instructors: B.H. Toby, APS—Argonne National Laboratory, Argonne, IL
J. Potenza, Rutgers University, New Brunswick, NJ
J.A. Kaduk, INEOS Technologies, Inc., Naperville, IL
A good understanding of crystallography is a prerequisite to practical work with Rietveld analysis. Basic crystallography is best introduced as a year-long college course. However many experts in the field have been largely self-taught. This workshop will provide a survey of topics important for powder diffraction practitioners. In this short glimpse of some fascinating topics, we will introduce key concepts and recommend tutorial and reference materials for further information. Topics to be introduced include: Where the atoms are: symmetry
operations, lattices. Hermann-Maugin and more: space groups, subgroup-supergroup relationships. From real to Fourier space: structure factors, systematic absences, powder averaging, multiplicities.
 

W6 - Rietveld Applications II - Advanced - Evergreen B
Organizer and Instructors: J.A. Kaduk, Innovene USA LLC, Naperville, IL
J. Faber, International Centre for Diffraction Data, Newtown Square, PA
See Description for W2 Rietveld Applications I - Beginner
 

XRF

W7 - Trace Element Analysis - Evergreen C
Organizer and Instructors: M.A. Zaitz, IBM, Hopewell Junction, NY
R. van Grieken, University of Antwerp, Antwerp, Belgium
M.A. Zaitz , IBM, Hopewell Junction, NY
B. Vrebos, PANalytical, Almelo, The Netherlands
J. Heckel, Spectro, Kleve, Germany
A. von Bohlen, ISAS, Dortmund, Germany
K. Tsuji, Osaka City University, Osaka , Japan
A. Markowicz, IAEA, Vienna, Austria

XRS is very powerful for inorganic trace analysis of all kinds of samples. These analyses are often only limited by the detection limits. This workshop will focus on how the detection limits can be lowered or assessed. Avoiding external contamination and implementing some preconcentration step are important aspects. The use of TXRF, polarized-beam EDXRF and WDXRF with suitable X-ray beam manipulation allow to achieve better detection limits. These approaches will be discussed. Finally, an overview will be given of application fields where XRF has been most successful for trace analysis during the last decade.

 

W8 - Specimen Preparation XRF II - Evergreen D
Organizer and Instructors: J.A. Anzelmo, Anzelmo & Associates, Inc., Madison, WI
Tariq S. Ahmedali, McGill University, Montreal, Quebec, Canada
Larry Arias, Bruker AXS, Madison, WI
Luc Berube, Corporation Scientifique Claisse, Ste-Foy, Quebec, Canada
D.F. Lupton, W.C. Heraeus GmbH, Hanau, Germany
See Description for W4 Specimen Preparation I
 

Workshops
Tuesday morning
9:00 a.m.–12:00 p.m.

XRD & XRF

W9 - Microbeam X-ray Characterization I - Evergreen A
Organizer and Instructors: I.C. Noyan, S. Polvino, Columbia University, New York, NY
J. Maser, S. Vogt, APS, Argonne National Laboratory, Argonne, IL
In this workshop we will discuss the current status of material characterization using microbeam X-rays. We will cover equipment requirements for optics, stages and detectors and give examples for fluorescence, diffraction and topographic analysis, both for laboratory and synchrotron-based systems. Practical considerations will be emphasized and we will also cover some of the free software options available for microbeam diffraction analysis.
 

XRD

W10 - New Generation of XRD Databases - Capabilities & Applications I - Evergreen B
Organizer and Instructors: T. Fawcett, S. Kabekkodu, D. Sagnella, International Centre for Diffraction Data, Newtown Square, PA
The Powder Diffraction File contains data that are extensively reviewed and statistically analyzed. The new organization of the database allows every data field to be searched, sorted, and custom organized to allow scientists full access. The authors’ original data is always changed by the ICDD’s standardization and quality review processes and many materials properties are added based on calculation or additional bibliographic review. The purpose of the data changes, organizations and additions is to facilitate a user’s ability to rapidly
search and identify materials using the database. The workshop will explain the classifications, review procedures and the scientific basis for the property calculations to enable users to more effectively use the power of the database.
 

XRF

W11 - Basic XRF - Evergreen C
Organizer and Instructors: W.T. Elam, EDAX, Inc., Mahwah, NJ and University of Washington, Seattle, WA
G.J. Havrilla, Los Alamos National Laboratory, Los Alamos, NM
This workshop provides a basic introduction to the principles of XRF, and is specifically aimed at those new to the field. It will consist of a general overview of the technique, followed by more specific details of the basic principles with emphasis on understanding how to use XRF and what its capabilities are. A few particular applications will be presented to provide an understanding of how the basic principles affect actual practice.
 

W12 - Quantitative Analysis I - Evergreen D
Organizer and Instructors: M. Mantler, Vienna University of Technology, Vienna, Austria
B. Vrebos, PANalytical, Almelo, The Netherlands
W.T. Elam, EDAX, Inc., Mahwah, NJ and University of Washington, Seattle, WA

This workshop will cover:

  • Fundamentals
  • Classical fundamental parameter models and mathematical foundation
  • Compensation methods
  • Error analysis, iteration schemes, determination of elements by difference
 

Workshops
Tuesday afternoon
2:00–5:00 p.m.

XRD & XRF

W13 - Microbeam X-ray Characterization II - Evergreen A
Organizer and Instructors: I.C. Noyan, S. Polvino, Columbia University, New York, NY
J. Maser, S. Vogt, APS, Argonne National Laboratory , Argonne, IL
See Description for W9 Microbeam X-ray Characterization I
 

XRD

W14 - New Generation of XRD Databases - Capabilities & Applications II - Evergreen B
Organizer and Instructors: T. Fawcett, J. Faber, J. Blanton, International Centre for Diffraction Data, Newtown Square, PA
The goal of many of the structural and material classifications used in the Powder Diffraction File (PDF) is to facilitate the rapid identification of materials from an experimental diffraction pattern. Frequently, material identification is just the first step in solving a problem. The Powder Diffraction File contains many problem solving tools that help in understanding material and structural chemistry. The PDF contains material knowledge of field experts, provided by members and editors. In the workshop, we will explain the workings and function of many the problem-solving tools embedded in the software of the database. We will cover data mining, effective search strategies and pattern simulation capabilities, and how the tools are applied to practical problem solving.
 

XRF

W15 - EDXRF - Evergreen C
Organizers and Instructors: W.T. Elam, EDAX, Inc., Mahwah, NJ and University of Washington, Seattle, WA
B. Scruggs, Ametek EDAX, Inc., Mahwah, NJ
J. Heckel, Spectro Analytical Instruments, Kleve, Germany
C. Streli, Atominstitut—TU Wien, Vienna, Austria
P. Wobrauschek, Atominstitut—TU Wien, Vienna, Austria
The Energy Dispersive X-ray Fluorescence (EDXRF) Workshop provides a comprehensive review of the basic fundamentals for both the beginner and experienced X-ray spectroscopist. Topics to be covered are instrumentation including sources and detectors, spectral processing, and qualitative and quantitative analysis. This year’s workshop has added coverage of several areas of application.
 

W16 - Quantitative Analysis II - Evergreen D
Organizer and Instructors: M. Mantler, Vienna University of Technology, Vienna, Austria
B. Vrebos, PANalytical, Almelo, The Netherlands
W.T. Elam, EDAX, Inc., Mahwah, NJ and University of Washington, Seattle, WA

This workshop will cover:

  • Spectrum modeling
  • Compton and Rayleigh scatter
  • Tube spectra
 

Monday, 7 August
XRD Poster Session
Evergreen Ballroom
6:00 p.m.–8:00 p.m.

The XRD Poster Session will be held in conjunction with the PANalytical mixer.

Chairs: I.C. Noyan, Columbia University, New York, NY
R. Barton, Emeritus, DuPont Experimental Station, Wilmington, DE

Session chairs will select the four best posters for awards.

Instrumentation
D078 A NEW TENSILE STAGE FOR IN-SITU X-RAY SCATTERING EXPERIMENTS COMBINED WITH MECHANICAL TESTS
K.J. Martinschitz , E. Eiper, J. Keckes, Erich Schmid Institute, Leoben, Austria
P. Boesecke, ESRF, Grenoble, France
P. Schwarzl, P. Hofbauer, Anton Paar GmbH, Graz, Austria
D098 AUTOMATIC SAMPLE HEIGHT CORRECTION FOR NON-AMBIENT EXPERIMENTS
M. Fransen, PANalytical, Almelo, The Netherlands
C. Resch, Anton Paar GmbH, Graz, Austria
G. Artioli, University of Milano, Milan, Italy
D080 USAGE OF AN ADVANCED FULLPAT METHOD TO QUANTIFY AMORPHOUS MATERIAL
T. Degen, PANalytical B.V., Almelo, The Netherlands
D084 PERFORMANCE AND INDUSTRIAL STUDIES AT THE NEW NEUTRON RESIDUAL STRESS MAPPING FACILITY
C.R. Hubbard, W.B. Bailey, F. Tang, K. An, H. Choo, A. Payzant, T. Watkins, Oak Ridge National Laboratory, Oak Ridge, TN
D085 FIRST EXPERIMENT OF A STRUCTURAL STUDIES BEAMLINE BL15 OF A COMPACT SYNCHROTRON LIGHT SOURCE (SAGA-LS) NEWLY CONSTRUCTED WITH HIGH COST PERFORMANCE
Y. Chikaura, Y. Suzuki, Kyushu Institute of Tech., Kitakyushu, Japan
T. Okajima, H. Setoyama, D. Yoshimura, Kyushu Synchrotron Light Research Center, Saga, Japan
Y. Soejima, K. Hara, Kyushu University, Fukuoka, Japan
N. Hiramatsu, A. Kohno, K. Nagata, Fukuoka University, Fukuoka, Japan
M. Tabata, Saga University, Saga, Japan
D046 DHS1100—A NEW HIGH TEMPERATURE ATTACHMENT FOR MULTIPURPOSE
4-CIRCLE X-RAY GONIOMETERS
R. Resel, M. Koini, T. Haber, Graz University of Technology, Graz, Austria
J. Keckes, Erich Schmid Institute, Leoben, Austria
P. Hofbauer, Anton Paar GmbH, Graz, Austria
D028 MICRODIFFRACTION WITH A NEW INTENSIFIED CCD CAMERA AND FOCUSSING MONOCAPILLARY OPTIC ON A CONVENTIONAL POWDER DIFFRACTOMETER
R.A. Clapp, GBC Scientific Equipment, Melbourne, Australia
D027 TRANSMISSION X-RAY POWDER DIFFRACTION WITH A CONFOCAL GRADED
D-SPACING MIRROR OPTIC—A NEW TECHNIQUE FOR DEPOSITED THIN FILMS AND CAPILLARY SAMPLES
R.A. Clapp, GBC Scientific Equipment, Melbourne, Australia
D011 ANALYSIS OF VERY SMALL SAMPLES WITH A PSEUDOPARALLEL GEOMETRY
DIFFRACTION SYSTEM
J.M. Neil, A. Navrotsky, University of California at Davis, Davis, CA
 

Grazing Incidence
D070 ANALYSIS OF LOW MASS ABSORPTION MATERIALS USING GLANCING INCIDENCE
X-RAY DIFFRACTION
N.A. Raftery, L.K. Bekessy, J. Bowpitt, Queensland University of Technology, Brisbane, Australia
D071 ANOMALOUS SCATTERING FROM SINGLE CRYSTAL SUBSTRATE
L.K. Bekessy, N.A. Raftery, S. Russell, Queensland University of Technology, Brisbane, Australia
D073 AN ANALYSIS OF THE STRESS DISTRIBUTION BASED ON MEASUREMENTS CARRIED
OUT USING X-RAY INCIDENCE METHOD
B. Kucharska, Cze˛stochowa University of Technology, Cze˛stochowa, Poland
 

Stress
D061 X-RAY DIFFRACTION MEASUREMENT FOR CHARACTERIZATION OF ENERGETIC
MATERIALS
B. Benedikt, M. Lewis, P. Rangaswamy, Los Alamos National Laboratory, Los Alamos, NM
D066 X-RAY CHARACTERIZATION OF WC SURFACE COATINGS
T.R. Watkins, P.G. Engleman, C.A. Blue, Oak Ridge National Laboratory, Oak Ridge, TN
O.B. Cavin, University of Tennessee, Knoxville, TN
D074 THE COMPARATIVE INVESTIGATIONS OF SURFACE RESIDUAL STRESSES IN STEEL
AFTER STATIC AND CYCLIC DEFORMATION
B. Kucharska, Czestochowa University of Technology, Cze˛stochowa, Poland
D081 ‘GALAXY XRD’—INSPECTION OF SINGLE CRYSTAL TURBINE BLADES
A. Haase, SEIFERT Analytical X-Ray, Ahrensburg, Germany
D047 ANALYSIS AND EVALUATION ON RESIDUAL STRESS OF FINE GRAIN STEEL
USING X-RAY
Z. Huang, M. Gotoh, Y. Hirose, Kanazawa University, Ishikawa, Japan
D044 SHOT PEENING EFFICIENCY FOR FINE GRAIN STEEL
Y. Horimoto, M. Gotoh, L. Che, Y. Hirose, Kanazawa University, Ishikawa, Japan
D040 RESIDUAL STRESS STATE OF HYDROXYAPATITE GRADED COATING ON CERAMIC
SUBSTRATE
L. Che, M. Gotoh, Y. Hirose, Kanazawa University, Ishikawa, Japan
L.Yang, Dalian Institute of Light Industry, Liaoning, China
D025 RAPID DETERMINATION OF STRESS FACTORS AND RESIDUAL STRESSES IN
ANISOTROPIC THIN FILMS
K.J. Martinschitz, E. Eiper, J. Keckes, Erich Schmid Institute, Leoben, Austria
D024 TEXTURE CHANGES IN CYCLICALLY DEFORMED CELLULOSICS CHARACTERIZED
BY IN-SITU SYNCHROTRON DIFFRACTION COUPLED WITH TENSILE TESTS
K.J. Martinschitz, J. Keckes, Erich Schmid Institute, Leoben, Austria
P. Boesecke, ESRF, Grenoble, Austria
W. Gindl, University of Natural Resources and Applied Life Sciences, Vienna, Austria
D008 STRESS MITIGATION OF X-RAY BEAMLINE MONOCHROMATORS USING
TOPOGRAPHY TEST UNIT
J. Maj, G. Waldschmidt, I. Koshelew, R. Huang, P. Baldo, A. Macrander, Argonne National
Laboratory, Argonne, IL
L. Maj, Northeastern Ohio Universities College of Medicine, Rootstown, OH
D002 DETERMINATION OF POISSON’S RATIO AND YOUNG’S MODULUS OF NITRIDE
THIN FILMS
H.-Y. Chen, Asia University, Taichung County, Taiwan
J.-H. Chen, F.-H. Lu, National Chung Hsing University, Taichung, Taiwan
 

In-Situ
D020 HIGH TEMPERATURE X-RAY DIFFRACTION ANALYSIS OF DEFENSE WASTE
PROCESSING FACILITY GLASS FRITS
D.M. Missimer, A.R. Jurgensen, R.L. Rutherford, Savannah River National Laboratory,
Aiken, SC
D026 SIZE EFFECT IN METALLIC THIN FILMS CHARACTERIZED BY LOW-TEMPERATURE
X-RAY DIFFRACTION
E. Eiper, K.J. Martisnchitz, G. Dehm, J. Keckes, Erich Schmid Institute, Leoben, Austria
D045 TEMPERATURE ACCURACY IN HIGH TEMPERATURE XRD—INFLUENCING FACTORS
AND CALIBRATION
C. Resch, Anton Paar GmbH, Graz, Austria
D093 NEUTRON AND SYNCHROTRON STRUCTURE EVALUATION OF Li3N DURING
HYDRIDING AND DEHYDRIDING
W.-M. Chien, D. Chandra, University of Nevada—Reno, Reno, NV
A. Huq, J. Richardson, Jr., E. Maxey, Argonne National Laboratories, IPNS, Argonne, IL
M. Kunz, S. Fakra, Lawrence Berkeley National Laboratories, Berkeley, CA
D088 HIGH TEMPERATURE DIFFRACTION TO DEVELOP SOLID OXIDE FUEL CELL
SEALING GLASSES
M.D. Dolan, J.S. White, E.I. Henriques, K.B. Stallone, S.T. Misture, NYS College of Ceramics at Alfred University, Alfred, NY
 

Miscellaneous
D089 A METHOD FOR CELL GAP MEASUREMENT OF REFLECTIVE TWISTED NEMATIC
LIQUID CRYSTAL DISPLAY
C.-F. Chang, Y.-C. Chan, Z.-N. Wan, Kun Shan University, Yilan City, Taiwan
D091 AN EXAFS STUDY OF PHOTOGRAPHIC DEVELOPMENT IN PHOTOTHERMOGRAPHIC
FILMS
T.N. Blanton, Eastman Kodak Company, Rochester, NY
D.R. Whitcomb, Eastman Kodak Company, Oakdale, MN
S.T. Misture, NYS College of Ceramics at Alfred University, Alfred, NY
D059 CORRECTING FOR MICROABSORPTION—BRINDLEY REVISITED
A. Brayko, R.S. Winburn, Minot State University, Minot, ND
D054 RADIATION DAMAGE IN POWDER SAMPLES PREPARED WITH BINDER
V. Radovic, F. Safar, Sisak Tube Mill Ltd, Sisak, Croatia
N. Radovic, University of Zagreb, Zagreb, Croatia
D041 CHARACTERIZATION AND OPTICAL PROPERTIES OF CdS:Cu NANOCRYSTALS
PREPARED BY CHEMICAL SYNTHESIS
O. Portillo-Moreno, H. Lima-Lima, R. Lozada-Morales, J. Martínez, E. Rosendo, H. Juárez,
T. Díaz, Benemérita Universidad Autónoma de Puebla, Puebla, México
G. Juárez, O. Zelaya-Angel, Centro de Investigación y de Estudios Avanzados, México
D036 INFLUENCE OF SAMARIUM ON THE CRYSTAL STRUCTURE AND MICROSTRUCTURE OF
PHOTOLUMESCENT SrTiO3
M.G.S. Costa, M.M. de Jesus, A.B. Campos, E. Longo, J.A. Varela, C.O. Paiva-Santos,
Instituto de Quimica-UNESP, Araraquara, Brazil
D012 RIETVELD ANALYSIS: CHOOSING X-RAY POWDER DIFFRACTION DATA OBTAINED
FROM PARALLEL AND FOCUSING BEAM GEOMETRY
A. Tripathi, T. Ely, L. Fields, T.F. McNulty, Rigaku Americas, Inc., The Woodlands, TX
D005 INTERACTIVE DATA LANGUAGE VISUALIZATIONS AND CALCULATIONS FROM FULL
DATASETS
C.S. Frazer, M.A. Rodriguez, R.G. Tissot, Sandia National Laboratories, Albuquerque, NM
D096 UNIT CELL EXPANSION IN ErT2 FILMS
M.A. Rodriguez, J.F. Browning, C.S. Snow, C.S. Frazer, R.G. Tissot, Sandia National Laboratories, Albuquerque, NM
C5 CAPTURING AND SHAPING X-RAYS WITH FREE-FORM MULTILAYER OPTICS
E. Dova, E. Cela, S. Hedacq, B. Lantz, C. Montcalm, P Høghøj, Xenocs SA,
Sassenage, France
D063 QUANTITATIVE XRD ANALYSIS FOR PROCESS CONTROL AT ALUMINUM SMELTERS
L. Espinoza-Nava, Alcoa, Monroeville, PA
 

Tuesday, 8 August -
XRF Poster Session
Evergreen Ballroom
6:00 p.m.–8:00 p.m.

The XRF Poster Session will be held in conjunction with the evening mixer. Sponsor to be announced.

Chairs: M.A. Zaitz, IBM, Hopewell Junction, NY
G.J. Havrilla, Los Alamos National Laboratory, Los Alamos, NM

Session chairs will select the three best posters for awards.
 

Applications
F28 NON-DESTRUCTIVE ANALYSIS OF A PAINTING, NATIONAL TREASURE IN JAPAN
Y. Hayakawa , S. Shirono, S. Miura, National Research Institute for Cultural Properties, Tokyo, Japan
T. Matsushima, Tokyo National University of Fine Arts and Music, Tokyo, Japan
T. Uchida, MOA Museum of Art, Shizuoka, Japan
F38 X-RAY PHASE-CONTRAST TOMOGRAPHY OF MALARIA TRANSMITTING MOSQUITOES
FOR MORPHOLOGY STUDIES
D. Wegrzynek, A. Markowicz, International Atomic Energy Agency, Vienna, Austria and University of Science and Technology, Krakow, Poland
E. Chinea-Cano, S. Bamford, B. Knols, M. Helinski, International Atomic Energy Agency,
Vienna, Austria
P. Wobrauschek, C. Streli, N. Zoeger, Technische Universitaet Wien, Vienna, Austria
R. Simon, T. Weitkamp, C. Frieh, FZK Research Centre, Karlsruhe, Germany
F39 DETERMINATION OF LOW Z ELEMENTS WITH TXRF IN BIOFILMS DIRECTLY
CULTIVATED ON QUARTZ CARRIER PLATES
H. Hoefler, C. Streli, P. Wobrauschek, Atominstitut, TU Wien, Vienna, Austria
M. Óvári, Gy. Záray, Eötvös Loránd University, Budapest, Hungary
F40 LEAD IN HUMAN CARTILAGE: IMAGING AND SPECIATION BY MICRO-XRF AND
MICRO-XANES
N. Zoeger, P. Wobrauschek, C. Streli, Atominstitut, TU-Wien, Vienna, Austria
G. Pepponi, ITC-irst, Trento, Italy
P. Roschger, Ludwig Bolzmann-Institut für Osteologie, Vienna, Austria
G. Falkenberg, HASYLAB at DESY, Hamburg, Germany
A. Tampieri, ISTEC, Faenza, Italy
F47 CARBON NANOTUBE ELEMENTAL CHARACTERIZATION USING MICRO X-RAY
FLUORESCENCE
V.M. Montoya, S.B. Chikkannanavar, S.K. Doorn, G.J. Havrilla, Los Alamos National
Laboratory, Los Alamos, NM
F51 ARSENIC SPECIATION IN CUCUMBER (Cucumis sativus L.) XYLEM SAP BY K-EDGE
TXRF-XANES
G. Pepponi, ITC-irst, Povo (Trento), Italy
F. Meirer, C. Streli, P. Wobrauschek, Atominstitut, Vienna University of Technology, Wien, Austria
V.G. Mihucz, G. Zaray, V. Czech, Eötvös University, Budapest, Hungary
J. Broekaert, U. Fittschen, University of Hamburg, Hamburg, Germany
G. Falkenberg, Hamburger Synchrotronstrahlungslabor at DESY, Hamburg, Germany
F57 NON DESTRUCTIVE EDXRF ANALYSIS OF ARCHAEOLOGICAL SAMPLES
J.L. Ferrero Calabuig, C. Roldan García, S. Murcia Mascarós, ICMUV, Universidad de Valencia, Valencia, Spain
F73 AT-LINE BIOSENSOR PRODUCTION MONITORING USING XRF SPECTROMETRY
S.E. Carpenter, T.A. Rey, H.G.Spradlin, Bayer Healthcare, Elkhart, IN
 

Instrumentation
F09 DESIGN OF A BOREHOLE XRF SPECTROMETER FOR THE MARS REGOLITH
W.T. Elam, University of Washington, Seattle, WA
W.C. Kelliher, I.A. Carlberg, NASA Langley Research Center, Hampton, VA
F37 PORTABLE XRF SYSTEM INCLUDING LIGHT ELEMENT ANALYSIS WITH POLYCAPILLARY
OPTICS FOR THE INVESTIGATION OF ART OBJECTS
G. Buzanich, P. Wobrauschek, C. Streli, Atominstitut, TU Wien, Vienna, Austria
A. Markowicz, D. Wegrzynek, E. Chinea-Cano, S. Bamford, IAEA Laboratories, Seibersdorf, Austria
F48 BENCHTOP WDXRF ULTRA-LOW SULFUR ANALYSER FOR FUEL OIL
M. Doi, N. Yamashita, Y. Kataoka, S. Gonsui, H. Kohno, Rigaku Industrial Corporation,
Osaka, Japan
A. Martin, H. Inoue, Rigaku Corporation, The Woodlands, TX
C1 APPLICATION OF TOTAL REFLECTION MIRRORS FOR RADIATION GATHERING
IMPROVEMENT OF X-RAY PLANAR WAVEGUIDE-RESONATOR
V.K. Egorov, E.V. Egorov, IMT RAS, Chernogolovka, Moscow District, Russia
C4 ANALYTICAL APPLICATION OF MULTILAYER X-RAY OPTICS
R. Dietsch, Th. Holz, AXO DRESDEN GmbH, Heidenau, Germany
St. Braun, Fraunhofer IWS, Dresden, Germany
T.Leisegang, D.C.Meyer, Dresden University of Technology, Dresden, Germany
 

Quantitative
F06 THE RATIO OF LINES INTENSITIES AS AN ANALYTICAL PARAMETER IN XRF
I.A. Brytov, R.I. Plotnikov, Bourevestnik, Inc., Saint-Petersburg, Russia
S.L. Dudik, B.D. Kalinin, Spectron, Inc., Saint-Petersburg, Russia
F14 ESTIMATING THE HYDROCARBON OR OXIDE FRACTION OF BULK SAMPLES USING
SCATTERED RADIATION
W.T. Elam, B. Shen, B. Scruggs, J. Nicolosi, EDAX, Inc., Mahwah, NJ
 

Plenary Session: Medical Applications of X-ray Analysis
Wednesday, 9 August
8:30 a.m. - 12:30 p.m.
Evergreen Ballroom
Organized by: M.A. Zaitz, IBM, Hopewell Junction, NY
J.A. Kaduk, Innovene USA LLC, Naperville, IL
8:30

Chairman of the Denver X-ray Conference, Welcoming Remarks

Victor E. Buhrke, Consultant, Portola Valley, CA
8:35

Presentation of Awards

2006 Birks Award presented to Peter Wobrauschek
Atominstitut, Vienna University of Technology, Vienna, Austria
presented by M.A. Zaitz, IBM, Hopewell Junction, NY

2006 Jerome B. Cohen Student Award (winner announced at the plenary session)
presented by I.C. Noyan, Columbia University, New York, NY

2006 McMurdie Award presented to Peter Wallace
Dos Arroyos Enterprises, Oro Valley, AZ
presented by J.A. Kaduk, Innovene USA LLC, Naperville, IL
8:55

Plenary Session Remarks

M.A. Zaitz, IBM, Hopewell Junction, NY
J.A. Kaduk, Innovene USA LLC, Naperville, IL
The following are the invited papers to be presented during the plenary session:
9:00
P2		 MEDICAL APPLICATIONS OF X-RAY FLUORESCENCE: A STATUS REPORT
RELATED TO TRACE ELEMENT RESEARCH
J. Börjesson, Department of Diagnostic Radiology, County Hospital, Halmstad, Sweden
S. Mattsson, Department of Radiation Physics, Malmö University Hospital,
Malmö, Sweden
9:45
P3		 IN VIVO MEASUREMENT OF TOXIC ELEMENTS USING X-RAY FLUORESCENCE
ANALYSIS
F.E. McNeill, D.R. Chettle, L. Nie, M. Popovic, R.C.N. Studinski, McMaster University,
Hamilton, Ontario, Canada
J.M. O’Meara, University of Guelph, Guelph, Ontario, Canada
10:30 Break
11:00
P4		 A REVIEW: XRF ANALYSIS OF Pb IN BONE
P. Wobrauschek, Atominstitut, Vienna University of Technology, Vienna, Austria
11:45
P1		 CANCER DIAGNOSIS USING SAXS IMAGING
K.D. Rogers, S. Wilkinson, A. Round, Cranfield University, Wiltshire, U.K.
C.J. Hall, Daresbury Laboratory, Cheshire, U.K.
 

Wednesday p.m. Session
Evergreen A
XRD & XRF
C1 - New Developments in XRD & XRF Instrumentation

Organized by: J.A. Anzelmo, Anzelmo & Associates, Inc., Madison, WI
1:30 D099 THE BENEFITS OF AN INTEGRATED FULL PATTERN PXRD ANALYSIS APPROACH
T. Degen, PANalytical, Almelo, The Netherlands
1:50 D104 X-RAY TUBE WITH IMPROVED FOCAL SPOT SHAPE
V.A. Kogan, PANalytical B.V. & DANNALAB, Almelo, The Netherlands
G.E. van Dorssen, PANalytical B.V., Eindhoven, The Netherlands
M.J. Fransen, PANalytical B.V., Almelo, The Netherlands
2:10 D102 WELCOME TO THE NEW WORLD OF MINI X-RAY SYSTEMS
T. McNulty, S. Bird, A. Martin, L. Daniels, Rigaku Americas, The Woodlands, TX
2:30 D069 REFINEMENT OF NASA’S MARS XRD INSTRUMENT USING RAY TRACING
AND COMBINATORIAL OPTIMIZATION
M. Gailhanou, Université Paul Cézanne, Marseille, France
P. Sarrazin, inXitu, Inc., Mountain View, CA
D. Blake, NASA Ames Research Center, Moffett Field, CA
D. Bish, Indiana University, Bloomington, IN
S. Collins, Jet Propulsion Laboratory, Pasadena, CA
D. Vaniman, S. Chipera, Los Alamos National Laboratory, Los Alamos, NM
2:50 D101 ZSX 400—A NEW WDXRF SPECTROMETER BY RIGAKU
A. Martin, Rigaku Americas, The Woodlands, TX
3:10 Break  
3:30 F68 NEW LEVELS OF PERFORMANCE IN BENCHTOP EDPXRF
N. Kirkpatrick, J. Heckel, D. Wissmann, SPECTRO Analytical Instruments, Inc.,
Marlborough, MA
3:50 F04 IMPROVING AND STREAMLINING THE SAMPLE PREPARATION AND HANDLING
PROCESS OF ASSAY SAMPLES PRIOR TO XRF ANALYSIS, USING AUTOMATION
AND ROBOTICS
J. Tully, Glen Mills, Inc., Clifton, NJ
A. Nicholson, Essa Australia Ltd, Bassendean, Australia
4:10 F72 NEW DEVELOPMENTS IN X-RAY TECHNOLOGY FROM THERMO ELECTRON
A. Buman, S. Pomerantz, R. Yellepeddi, Thermo Electron, Dearborn, MI
4:30 F70 BEYOND THE LIMITS—EXPANDING THE ANALYTICAL PERFORMANCE OF
WDXRF WITH NOVEL DEVELOPMENTS
L. Arias, A. Larsen, K. Behrens, Bruker AXS, Inc., Madison, WI
4:50 F54 OPTIMIZED PROCEDURES FOR TRACE ANALYSIS IN LIQUID OR LOOSE
POWDER SAMPLES OF LIGHT MATRICES
B. Burton, L. Arias, D. Pecard, Bruker AXS Inc., Madison, WI
 

Wednesday p.m. Session
Evergreen B
XRD & XRF
C2 - In-Situ Characterization

Organized by: S.T. Misture, NYS College of Ceramics at Alfred University, Alfred, NY
2:00 D094 IN SITU HTXRD ANALYSIS OF DISPLACEMENT REACTIONS USING GRAPHITE
REACTION VESSELS—Invited
M.S. Haluska, R.L. Snyder, K. Sandhage, Georgia Institute of Technology, Atlanta, GA
2:30 D006 AN ENVIRONMENTAL STAGE FOR IN-SITU STUDIES OF BIOPOLYMERS IN
HIGH PRESSURE CO2
V. Nawaby, P. Whitfield, X. Liao, National Research Council, Ottawa, Ontario, Canada
2:50 D034 HIGH-TEMPERATURE X-RAY STUDIES OF TRANSIENT PHASES IN COATED
CONDUCTORS USING THE “BaF2 PROCESS”
W. Wong-Ng, I. Levin, L.P. Cook, National Institute of Standards and Technology,
Gaithersburg, MD
R. Feenstra, Oak Ridge National Laboratory, Oak Ridge, TN
3:10 Break  
3:40 D043 TIME-RESOLVED X-RAY MICRODIFFRACTION IMAGING OF NANOSECOND
STRUCTURAL TRANSFORMATIONS IN THIN FERROELECTRIC FILMS
A. Grigoriev, D.-H. Do, D.M. Kim, C.-B. Eom, P.G. Evans, University of Wisconsin—
Madison, Madison, WI
B. Adams, E.M. Dufresne, APS, Argonne National Laboratory, Argonne, IL
4:00 D087 PHASE INSTABILITY OF SrXLa1-XCoO3-D: A HIGH TEMPERATURE
DIFFRACTION STUDY
J.S. White, X. Chen, S. Adler, S.T. Misture, NYS College of Ceramics at Alfred University,
Alfred, NY
4:20 D097 CONTROLLED-TEMPERATURE DIFFRACTION EXPERIMENTS ON SAMPLES IN
GLASS CAPILLARIES
M. Fransen, PANalytical, Almelo, The Netherlands
R. Glazer, Oxford Cryosystems, Oxford, UK
J. van Mechelen, University of Amsterdam, Amsterdam, The Netherlands
 

Wednesday p.m. Session
Evergreen C
XRD
D1 - Structure Solution & Refinement

Organized by: J.A. Kaduk, Innovene USA LLC, Naperville, IL
1:30 D018 CHLORARTINITE: A VOLCANIC EXHALATION PRODUCT AS AN INDICATOR
FOR PROBLEMATIC MAGNESIA FLOOR PAVEMENTS—Invited
K. Sugimoto, R.E. Dinnebier, Max-Planck-Institute for Solid State Research, Stuttgart,
Germany
T. Schlecht, Wilhelm-Röntgen-Straße 25/1, Ostfildern, Germany
2:00 D050 ANALYSIS OF X-RAY DIFFRACTION DATA FROM AGED U-Nb ALLOYS
H.M. Volz, R.E. Hackenberg, A.M. Kelly, W.L. Hults, A.C. Lawson, R.D. Field, D.F.
Teter, D.J. Thoma, Los Alamos National Laboratory, Los Alamos, NM
2:20 D015 NEW IRON FLUORIDE CRYSTAL STRUCTURES
J.A. Kaduk, Innovene USA LLC, Naperville, IL
2:40 D010 MICRO X-RAY POWDER DIFFRACTION. AB-INITIO STRUCTURE
DETERMINATION FROM MICROGRAM SAMPLES
N. Bhuvanesh, J. Reibenspies, Texas A & M University, College Station, TX
3:00 D014 THREE-DIMENSIONAL STRUCTURE OF NANOPHASE MATERIALS FROM
HIGH-ENERGY X-RAY DIFFRACTION AND ATOMIC PAIR DISTRIBUTION
FUNCTION ANALYSIS
V. Petkov, Central Michigan University, Mt. Pleasant, MI
3:20 Break  
3:40 D072 APPLICATION OF POWDER DIFFRACTION FOR SOLVING CRYSTAL
STRUCTURES CONTAINING LIGHT ELEMENTS—Invited
R.V. Shpanchenko, Moscow State University, Moscow, Russia
4:00 D048 LOCATING ADSORBED HYDROGEN MOLECULES IN Cu2(BTC)4/3 BY
POWDER NEUTRON DIFFRACTION
S.C. Vogel, J. Rowsell, J. Eckert, Los Alamos National Laboratory, Los Alamos, NM
4:20 D030 STRUCTURE DETERMINATION FROM POWDER DIFFRACTION DATA OF SOME
MOISTURE-SENSITIVE, NETWORK COORDINATION COMPOUNDS
P.S. Whitfield, A. Abouimrane, I. Davidson, ICPET, National Research Council Canada,
Ottawa, Ontario, Canada
4:40 D019 SIMULTANEOUS REFINEMENTS WITH COMPLEX COMPOSITIONAL CONSTRAINTS - EXAMPLE OF SINGULAR VALUE DECOMPOSITION TO
DIAGNOSE POOR MATRIX CONDITIONING
P.S. Whitfield, I. Davidson, P. Mercier, Y. Le Page, L. Mitchell, National Research
Council Canada, Ottawa, Ontario, Canada
P. Stephens, SUNY, Stoney Brook, New York
L. Cranswick, I. Swainson, Chalk River Laboratories, Chalk River, Ontario, Canada
5:00 D079 HYPOTHESES TEST USING Ns
J. Ihringer, Universität Tübingen, Tübingen, Germany
 

Wednesday p.m. Session
Evergreen D
XRF
F1 - Quantitative XRF

Organized by: W.T. Elam, EDAX, Inc., Mahwah, NJ and University of Washington, Seattle, WA
1:40 F02 SIMULTANEOUS PIXE AND XRF: PROCESSING THE SPECTRA FROM THE
MARS EXPLORATION ROVERS—Invited
J.L. Campbell, C.L. Mallett, J.M. O’Meara, J.A. Maxwell, University of Guelph,
Guelph, Ontario, Canada
2:10 F21 STANDARDLESS EDS ANALYSIS—THE INFLUENCE OF X-RAY DETECTOR
MODELS—Invited
B.J. Cross, CrossRoads Scientific, El Granada, CA
2:40 F10 PERFORMANCE LIMITATIONS IN EDPXRF USING SDD’S
J. Heckel, SPECTRO A.I., Kleve, Germany
3:00 F22 QUANTITATIVE ANALYSIS ON AN ELECTRON PROBE WITH THE NIST
TRANSITION EDGE SENSOR MICROCALORIMETER X-RAY DETECTOR
T. Jach, N. Ritchie, National Institute of Standards and Technology, Gaithersburg, MD
J. Ullom, J. Beall, National Institute of Standards and Technology, Boulder, CO
3:20 Break  
3:50 F13 FUNDAMENTAL PARAMETERS ANALYSIS OF ROHS ELEMENTS IN PLASTICS
W.T. Elam, B. Shen, B. Scruggs, J. Nicolosi, EDAX, Inc., Mahwah, NJ
4:10 F26 EVALUATION OF ANALYTICAL FIGURES OF MERIT FOR RAPID SCREENING
OF TOXIC ELEMENTS IN FOOD VIA EDXRF
P. Palmer, K. Yamamoto, S. Webber, K. Ferguson, San Francisco State University,
San Francisco, CA
R. Jacobs, FDA, San Francisco District Laboratory, Alameda, CA
4:30 F27 APPLICATION OF EDXRF TO RAPID SCREENING FOR TOXIC ELEMENTS IN
FOODS AND ASIAN PATENT MEDICINES
R. Jacobs, FDA, San Francisco District Laboratory, Alameda, CA
P.T. Palmer, San Francisco State University, San Francisco, CA
4:50 F49 SIMULTANEOUS ANALYSIS OF NICKEL ALLOYS AND HIGH ALLOY STEELS
USING THE FUNDAMENTAL PARAMETER METHOD
Y. Kataoka, E. Furusawa, H. Kohno, T. Arai, Rigaku Industrial Corporation, Osaka, Japan
A. Martin, H. Inoue, Rigaku Corporation, The Woodlands, TX
M. Mantler, Vienna University of Technology, Vienna, Austria
 

Thursday a.m. Session
Evergreen A
XRD & XRF
C3 - Thin Films

Organized by: T.N. Blanton, Eastman Kodak Company, Rochester, NY
T.C. Huang, Emeritus, IBM Almaden Research Center, San Jose, CA
9:00 D095 HIGH RESOLUTION X-RAY DIFFRACTOMETRY AND REFLECTOMETRY IN
MODERN SEMICONDUCTOR MANUFACTURING—Invited
R.J. Matyi, University at Albany—SUNY, Albany, NY
9:30 D056 INVESTIGATION OF STRAIN, RELAXATION DEGREE, INTERFACE ROUGHNESS
AND POROSITY OF SiGe/Si MODFET HETEROSTRUCTURES—Invited
A. Ulyanenkov, Bruker AXS GmbH, Karlsruhe, Germany
M. Myronov, Y. Shiraki, Musashi Institute of Technology, Tokyo, Japan
K. Saito, Bruker AXS K.K., Kanagawa, Japan
10:00 D100 SYSTEM FOR SPATIALLY RESOLVED HRXRD
V.A. Kogan, PANalytical & DANNALAB, Almelo, The Netherlands
A.V. Kharchenko, PANalytical, Almelo, The Netherlands
10:20 Break  
10:50 D033 KINETICS AND PHASE EQUILIBRIA OF THE INTERACTIONS OF THE
Ba2YCu3O6+x SUPERCONDUCTOR WITH CeO2 BUFFER LAYER
W. Wong-Ng, Z. Yang, L.P. Cook, I. Levin, Q. Huang, J. Frank, National Institute of
Standards and Technology, Gaithersburg, MD
11:10 F34 APPLICATIONS OF X-RAY REFLECTIVITY TO DEVELOP AND MONITOR
FEOL AND BEOL PROCESSES FOR SUB-65NM TECHNOLOGY NODES
E. Nolot, CEA-DRT—LETI—CEA/GRE, Grenoble, France
 

Thursday a.m. Session
Evergreen B
XRD
D2 - Applications of High-Energy X-rays I


Organized by: J. Almer, Argonne National Laboratory, Argonne, IL
L. Margulies, European Synchrotron Radiation Facility, Grenoble, France and Risø National Laboratory, Roskilde, Denmark
9:00 D017 HIGH-ENERGY X-RAY METHODS FOR STUDYING BURIED INTERFACES—Invited
H. Reichert, Max-Planck-Institute for Metals Research, Stuttgart, Germany
9:30 D049 HIGH PRESSURE DEFORMATION STUDY OF ZIRCONIUM
S.C. Vogel, D.W. Brown, H. Reiche, T.A. Sisneros, H.M. Volz, J. Zhang, Y. Zhao,
Los Alamos National Laboratory, Los Alamos, NM
N. Nishiyama, Y. Wang, APS, Argonne National Laboratory, Argonne, IL
9:50 D037 IN-SITU TENSILE LOADING STUDY OF GRAIN SIZE EFFECT ON
DEFORMATION MECHANISM IN NICKEL
A.D. Stoica, X.-L. Wang, C.T. Liu, D. Ma, Y. Ren, Oak Ridge National Laboratory,
Oak Ridge, TN
J. Almer, Argonne National Laboratory, Argonne, IL
10:10 Break  
10:40 D051 INVESTIGATION OF NANO-SCALE DEFORMATION MECHANISMS IN
METALLIC MULTILAYERS BY IN-SITU SYNCHROTRON X-RAY DIFFRACTION
C.C. Aydiner, D.W. Brown, S. Vogel, Y.C. Wang, A. Misra, Los Alamos National
Laboratory, Los Alamos, NM
J. Almer, Argonne National Laboratory, Argonne, IL
11:00 D077 USING HIGH ENERGY X RAYS AND IN SITU LOADING TO UNDERSTAND
CRYSTAL STRESSES IN POLYCRYSTALLINE METALS
M. Miller, J.-S. Park, A. Kazimirov, P. Revesz, Cornell University, Ithaca, NY
J. Bernier, APS, Argonne National Laboratory, Argonne, IL
11:20 D083 DEPTH-RESOLVED STRAIN DETERMINATION OF HYDROXYAPATITE
COATINGS USING HIGH ENERGY X-RAY DIFFRACTION
T.P. Ntsoane, University of Cape Town, Rondebosch, South Africa and iThemba LABS,
Somerset West, South Africa
M.Topic, iThemba LABS, Somerset West, South Africa
T. Thovhogi, M. Härting, University of Cape Town, Rondebosch, South Africa
D. Robinson, APS, Argonne National Laboratory, Argonne, IL
R.B. Heimann, TU Bergakademie Freiberg, Freiberg, Germany
 

Thursday a.m. Session
Evergreen C
XRF
F2 - New Developments in Instrumentation and Industrial
Applications of XRF

Organized by: J.A. Anzelmo, Anzelmo & Associates, Inc., Madison, WI
8:30 F53 TUBE-BASED PORTABLE XRF MEETS THE CHALLENGES OF RoHS/WEEE
COMPLIANCE
B. Connors, B. Hubbard-Nelson, R. Koch, D. Sackett, B. Tannian, G. Waksman,
Innov-X Systems, Inc., Woburn, MA
8:50 F64 IMPROVED BEAM COLLIMATION IN PORTABLE XRF ANALYZER FOR
ANALYSIS OF SMALL ELECTRONIC COMPONENTS
S. Piorek, Thermo Niton Analyzers LLC, Billerica, MA
9:10 F66 NEED FOR NEW X-RAY FLUORESCENCE STANDARDS
J.B. Sardisco, B.H. Clampitt, Analytical Services, Inc., The Woodlands, TX
9:30 F69 CERTIFIED REFERENCE MATERIALS: THE HEART OF ACCURATE XRF ANALYSIS
D. Geist, B. Britt, P. Dalager, Analytical Reference Materials International (ARMI),
Golden, CO
9:50 F33 FORENSICS APPLICATIONS OF X-RAY FLUORESCENCE SPECTROSCOPY
IN COMBINATION WITH ADVANCED LIGHT SOURCE SAMPLE DISCOVERY
S. Mamedov, J. Goldey, A. Whitley, N. Verzard, Horiba Jobin Yvon Inc.,
Edison, NJ
10:10 F61 USING A MONOCHROMATIC-EXCITATION EDXRF ANALYZER TO MEASURE
TRACE ELEMENTS IN AIR PARTICULATES
N. Gao, Z. Chen, W.M. Gibson, X-ray Optical Systems, Inc., East Greenbush, NY
10:30 Break  
10:50 F56 A REVIEW OF TWO U.S. SILICA IN-HOUSE XRF ANALYTICAL ROUTINE ASSESSMENTS
—Invited
M.L. Paige, U.S. Silica Co., Berkeley Springs, WV
11:20 F59 XRF USE IN THE PHOSPHATE INDUSTRY—Invited
T. Holland, PCS Phosphate, Aurora, NC
11:50 F67 DEVELOPMENT OF A QUANTITATIVE EDXRF METHOD FOR DETERMINING THE
CONCENTRATION OF PALLADIUM APPLIED TO TOBACCO
J. Lipscomb, M. Chang, T. Danielson, C. Connell, S. Zimmermann, Philip Morris USA
Research Center, Richmond, VA
12:10 F45 FILTER DEBRIS ANALYSIS BY ENERGY DISPERSIVE X-RAY FLUORESCENCE
APPLIED TO J52 ENGINES
G.R. Humphrey, JOAP-TSC, Pensacola, FL
12:30 F05 OPTIMIZATION OF A DRIED RESIDUE SPECIMEN PREPARATION METHOD FOR
QUANTIFYING ANALYTES IN PLUTONIUM METAL USING WDXRF
C.G. Worley, L.P. Colletti, Los Alamos National Laboratory, Los Alamos, NM
 

Thursday a.m.
Session Evergreen D
XRF
F3 - Trace Analysis

Organized by: C. Streli, Atominstitut, Vienna University of Technology, Vienna, Austria
8:30 F50 SPECIATION OF TRACES BY MEANS OF X-RAY ABSORPTION SPECTROSCOPY
WITH TOTAL REFLECTION X-RAY FLUORESCENCE ACQUISITION—Invited
G. Pepponi, ITC-irst, Povo (Trento), Italy
9:00 F32 RECENT DEVELOPMENTS IN TRACE ELEMENT- AND MICRO-ANALYSIS AT
THE IAEA XRF LABORATORY—Invited
A. Markowicz, D. Wegrzynek, S. Bamford, E. Chinea-Cano, International Atomic Energy
Agency, IAEA Laboratories, Seibersdorf, Austria
9:30 F60 TRACE ELEMENT ANALYSIS AT HASYLAB—Invited
G. Falkenberg, HASYLAB at DESY, Hamburg, Germany
10:00 F29 APPLICATIONS OF SYNCHROTRON X-RAY FLUORESCENCE MICROPROBE AT
KARLSRUHE RESEARCH CENTER
R. Simon, U. Kerdpin, Institute for Synchrotron Radiation (ISS), Karlsruhe, Germany
F. Friedrich, W. Faubel, P. Weidler, R. Nüesch, Institute for Technical Chemistry (ITC-WGT),
Karlsruhe, Germany
M. Grosse, Institute for Material Research (IMF), Karlsruhe, Germany
10:20 Break  
10:50 F07 MICRO-XRF ANALYSIS USING NEEDLE-TYPE COLLIMATORS
K. Tsuji, Osaka City University, Osaka, Japan and PRESTO, JST, Saitama, Japan
A. Matsuda, Osaka City University, Osaka, Japan
11:10 F12 HIGH SENSITIVITY, NONDESTRUCTIVE DETERMINATION OF TOXIC TRACE HEAVY
METALS IN FOOD BY EDXRF USING A HIGH THROUGHPUT SILICON MULTICATHODE
DETECTOR
Y. Matoba, T. Fukai, K. Tamura, SII NanoTechnology Inc., Shizuoka, Japan
M.Takahashi, SII NanoTechnology USA Inc., Northridge, CA
11:30 F16 ANALYSIS OF ATMOSPHERIC AEROSOLS AND CELL CULTURES WITH SR-TXRF:
NEW DIRECT CALIBRATION USING PICO-DROPLETS (pL) GENERATED BY
INK-JET PRINTERS AND SPECIATION OF IRON WITH SR-TXRF XANES
U. Fittschen, J. Broekaert, S. Hauschild, D. Rehder, S. Förster, University of Hamburg,
Hamburg, Germany
C. Streli, P. Wobrauschek, C. Jokubonis, F. Meirer, Vienna University of Technology,
Wien, Austria
G. Pepponi, ITC-irst, Povo, Trento, Italy
G. Lammel, Max Plank Institut for Meteorology, Hamburg, Germany
G. Falkenberg, Hamburger Synchrotronstrahlungslabor at DESY, Hamburg, Germany
11:50 F43 EVALUATION OF THE CONTAMINATION MAPPING CAPABILITIES WITH A TXRF
C.M. Sparks, A. Martinez, ATDF, Austin, TX
D.K. Michelson, ISMI, Austin, TX
 

Thursday p.m. Session
Evergreen A
XRD & XRF
C4 - X-ray Optics

Organized by: T.C. Miller, ConocoPhillips, Bartlesville, OK
2:00 F65 THREE DIMENSIONAL TRACE ELEMENT MICROANALYSIS BY X-RAY FLUORESCENCE TOMOGRAPHY AND CONFOCAL XRF IMAGING—Invited
L. Vincze, Ghent University, Ghent, Belgium
2:30 F44 CONFOCAL MICRO X-RAY FLUORESCENCE: 3-DIMENSIONAL DENSITY MAPPING
B.M. Patterson, G.J. Havrilla, K. Defriend, Los Alamos National Laboratory,
Los Alamos, NM
2:50 F62 RECENT DEVELOPMENTS OF POLYCAPILLARY X-RAY OPTICS AND ITS INDUSTRIAL APPLICATIONS
N. Gao, I. Ponomarev, Y. He, X-ray Optical Systems, Inc., East Greenbush, NY
3:10 C2 DESIGN OF SINGLE-BOUNCE MONOCAPILLARY X-RAY OPTICS
S. Cornaby, Cornell University, Ithaca, NY
T. Szebenyi, CHESS, Ithaca, NY
R. Huang, APS, Argonne, IL
D. Bilderback, Cornell University and CHESS, Ithaca, NY
3:30 Break  
4:00 F46 X-RAY OPTICS ENABLING NEW CAPABILITIES IN MATERIALS CHARACTERIZATION
—Invited
G.J. Havrilla, Los Alamos National Laboratory, Los Alamos, NM
4:30 F63 TRACE ELEMENT DETECTION USING DOUBLY CURVED CRYSTAL OPTICS
Z. Chen, W. Gibson, XOS, East Greenbush, NY
4:50 D103 GENERATING HIGH BRILLIANCE X-RAY BEAMS FOR ANALYTICAL AND
METROLOGY APPLICATIONS
P. Boulée, D. Cenda, P. Høghøj, Xenocs SA, Sassenage, France
 

Thursday p.m. Session
Evergreen B
XRD
D3 - Applications of High-Energy X-rays II

Organized by: J. Almer, Argonne National Laboratory, Argonne, IL
L. Margulies, European Synchrotron Radiation Facility, Grenoble, France and Risø National Laboratory, Roskilde, Denmark
1:30 D105 VISUALIZING THE DYNAMICS OF GRAINS AND DISLOCATIONS STRUCTURES—
Invited
H.F. Poulsen, Risø National Laboratory, Roskilde, Denmark
2:00 D001 STUDIES OF LOCAL AND INTERMEDIATE RANGE STRUCTURE IN CRYSTALLINE,
NANOCRYSTALLINE AND AMORPHOUS MATERIALS AT HIGH PRESSURE
USING HIGH-ENERGY X-RAYS—Invited
J.B. Parise, S. Antao, F.M. Michel, C.D. Martin, L. Ehm, Stony Brook University,
Stony Brook, NY
P.L. Lee, P.J. Chupas, S.D. Shastri, Argonne National Laboratory, Argonne, IL
2:30 D029 TIME/TEMPERATURE VARIATIONS IN THE REDUCED DISTRIBUTION
FUNCTION OF LIQUID METALS AND METALLIC GLASSES
M.J. Kramer, Ames Laboratory (USDOE) and Iowa State University, Ames, IA
2:50 D009 GRAIN NUCLEATION AND GRAIN GROWTH DURING PHASE
TRANSFORMATIONS IN STEEL
S.E. Offerman, N.H. van Dijk, J. Sietsma, S. van der Zwaag, Delft University of
Technology, Delft, The Netherlands
E.M. Lauridsen, H.F. Poulsen, Risoe National Laboratory, Roskilde, Denmark
L. Margulies, Risoe National Laboratory, Roskilde, Denmark and ESRF,
Grenoble, France
3:10 Break  
3:40 D067 HIGH ENERGY X-RAY DIFFRACTION INVESTIGATION OF FERROELECTRIC CONSTITUTIVE
BEHAVIOR
G. Tütüncü, E. Üstündag, R.C. Rogan, X. Tan, Iowa State University, Ames, IA
D. Robinson, APS, Argonne National Laboratory, Argonne, IL
4:00 D064 DOMAIN SWITCHING IN CRACK-TIP PROCESS ZONES OF FERROELECTRIC
CERAMICS
J.L. Jones, University of Florida, Gainesville, FL and Iowa State University, Ames, IA
E. Üstündag, M. Varlioglu, Iowa State University, Ames, IA
U. Lienert, J. Bernier, APS, Argonne National Laboratory, Argonne, IL
4:20 D038 PHASE TRANSFORMATION IN FERROMAGNETIC SHAPE-MEMORY ALLOYS
Y.D. Wang, Northeastern University, Shenyang, China and The University of Tennessee,
Knoxville, TN
Y. Ren, Argonne National Laboratory, Argonne, IL
M.L. Benson, H. Choo, P.K. Liaw, The University of Tennessee, Knoxville, TN
Y.D. Liu, L. Zuo, Northeastern University, Shenyang, China
D. Brown, Los Alamos National Laboratory, Los Alamos, NM
4:40 D076 DAMAGE AND INTERFACE STRESS IN DENTAL RECONSTRUCTION
MATERIALS FROM COMBINED TOMOGRAPHY AND DIFFRACTION
J.C. Hanan, H. Bale, Oklahoma State University, Stillwater, OK
Y.S. Chu, F. DeCarlo, APS, Argonne National Laboratory, Argonne, IL
 

Thursday p.m. Session
Evergreen C
XRD
D4 - Industrial Applications of XRD

Organized by: R.L. Snyder, Georgia Institute of Technology, Atlanta, GA
E.A. Payzant, Oak Ridge National Laboratory, Oak Ridge, TN
1:30 D053 NEW DEVELOPMENT OF IN-SITU, COMPACT, LOW-POWER XRD
SYSTEMS—Invited
H. Huang, W.M. Gibson, X-ray Optical Systems, Inc., East Greenbush, NY
2:00 D021 SALT FOR OIL: QUANTITATIVE X-RAY DIFFRACTION AND UNDERGROUND
PETROLEUM STORAGE
R.G. Tissot, S.J. Bauer, Sandia National Laboratories, Albuquerque, NM
2:20 D022 COMPARING RIETVELD XRD PROGRAMS IN THE CEMENT INDUSTRY AND EVALUATING AUTOMATED SAMPLE PREPARATION
I. Juel, FLSmidth Automation, Valby, Denmark
2:40 D057 COMPARISON OF THE RIETVELD METHOD AND STANDARD METHOD OF INTENSITY RATIOS FOR MEASUREMENT OF RETAINED AUSTENITE IN
BEARING STEEL SAE 52100
D.B. Witkin, The Aerospace Corporation, El Segundo, CA
3:00 D016 X-RAY DIFFRACTION STUDIES OF POLY(ETHYLENE TEREPHTHALATE)—
REACTIVE SYSTEMS
N. Moghe, K. Tandon, A. Dhanabalan, GE India Technology Centre Pvt. Ltd.,
Bangalore, India
3:20 Break  
3:40 D003 RESIDUAL STRESS MEASUREMENTS ON CURVED SPECIMENS USING THE SIN2C METHOD—Invited
J. Shackleton, University of Manchester, Manchester, UK
G. Bibby, Rolls-Royce plc, Derby, UK
4:10 D052 IN-SITU & IN-PLANT APPLICATIONS OF XRD IN THE MINERALS INDUSTRY—Invited
N.V.Y. Scarlett, I.C. Madsen, CSIRO Minerals, Victoria, Australia
4:40 D092 COMBINING HTXRD WITH MASS SPECTROMETRY FOR CHARACTERIZATION OF DESORPTION MECHANISMS IN HYDROGEN STORAGE MATERIALS
A.R. Drews, A. Sudik, J. Yang, C. Wolverton, Ford Motor Company, Dearborn, MI
5:00 D090 X-RAY DIFFRACTION STUDIES OF ALIGNED ZnO NANOBELTS
I. Dragomir-Cernatescu, J.P. Nicolich, PANalytical, Inc., Natick, MA
R. Yang, Z.L. Wang, R.L. Snyder, Georgia Institute of Technology, Atlanta, GA
 

Thursday p.m. Session
Evergreen D
XRF
F4 - Fusion Applications

Organized by: J.A. Anzelmo, Anzelmo & Associates, Inc., Madison, WI
2:00 F11 ELEMENTAL ANALYSIS OF SOILS BY X-RAY FLUORESCENCE USING GLASS
DISKS—Invited
Z. Zhang, P.A. Helmke, University of Wisconsin, Madison, WI
2:30 F31 XRF ANALYSIS USING LOW-DILUTION GRAPHITE FUSIONS AND A 4 KW WAVELENGTH
DISPERSIVE SPECTROMETER: A SINGLE METHOD FOR NEARLY ALL EARTH MATERIALS—Invited
R.M. Conrey, D.J. Cornelius, J.A. Wolff, Washington State University, Pullman, WA
3:00 Break  
3:30 F41 X-RAY FLUORESCENCE SPECTROMETRY: DEVELOPMENT OF EFFECTIVE FUSION
PROCEDURES FOR LIME PRODUCTS
J.P. Gagnon, Corporation Scientifique Claisse, Inc., Québec, Canada
3:50 F03 DEVELOPMENT AND APPLICATION OF A FUSION-XRF METHOD USING A THULIUM
© BASED INTERNAL STANDARD FOR HIGH ACCURACY NICKEL ANALYSIS
S.J. Reeves, Leinster Nickel Operation, Leinster, Australia and Energy Resources of Australia, Jabiru, Australia
D. Brown, X-ray Flux P.L., Perth, Australia
J. Metz, XRF Scientific Ltd, Victoria, Australia
4:10 F08 VALIDATION OF AN ALKALI REACTION, BORATE FUSION X-RAY FLUORESCENCE
METHOD FOR SILICON METAL
J.R. Sieber, E.A. Mackey, A.F. Marlow, R. Paul, S.D. Leigh, National Institute of Standards
and Technology, Gaithersburg, MD
R. Martin, Globe Metallurgical, Inc., Beverly, OH
4:30 F30 THE CLAISSE-CALCULATOR FOR THE DETERMINATION OF ACIDITY INDEXES AND “OPTIMAL FLUX” IN BORATE FUSION
F. Claisse, Fernand CLAISSE, Inc., Québec, Canada
 

Friday a.m. Session
Evergreen A
XRD & XRF
C5 - Detectors & Sources

Organized by: H. Toraya, Rigaku Corporation, Tokyo, Japan
T.C. Huang, Emeritus, IBM Almaden Research Center, San Jose, CA
8:30 D068 NEW SYNCHROTRON INSTRUMENTS+NEW DETECTORS=NEW SCIENCE—
Invited
B.H. Toby, APS, Argonne National Laboratory, Argonne, IL
9:00 F15 ARRAYS OF LARGE-AREA SILICON DRIFT DETECTORS FOR ADVANCED ANALYTICAL TECHNIQUES
O. Boslau, A. Pahlke, S. Pahlke, J. Kemmer, F. Wiest, T. Eggert, R. Stoetter, P.
Goldstrass, Ketek GmbH, Munich, Germany
M. Mikhailov, Institute for Nuclear Research and Nuclear Energy, Sofia, Bulgaria
9:20 F17 BORON X-RAY DETECTION WITH A SILICON MULTI-CATHODE DETECTOR
C.R. Tull, S. Barkan, V.D. Saveliev, L. Feng, M. Takahashi, N. Matsumori,
SII NanoTechnology, Northridge, CA
D.E. Newbury, J.A. Small, National Institute of Standards and Technology,
Gaithersburg, MD
J.S. Iwanczyk, Photon Imaging, Inc., Northridge, CA
9:40 F19 DETECTION OF TRACE HEAVY ELEMENTS IN THE 20–40 KEV ENERGY RANGE
USING A THICK SILICON MULTI-CATHODE DETECTOR
L. Feng, C.R. Tull, S. Barkan, V.D. Saveliev, M. Takahashi, N. Matsumori,
SII NanoTechnology, Northridge, CA
J.S. Iwanczyk, Photon Imaging, Inc., Northridge, CA
10:00 Break  
10:20 F23 OPTIMIZATION OF THE PEAK-TO-BACKGROUND RATIO AND THE LOW ENERGY
RESPONSE OF SILICON DRIFT DETECTORS FOR HIGH RESOLUTION X-RAY
SPECTROSCOPY
A. Niculae, H. Soltau, P. Lechner, A. Liebl, R. Eckhard, PNSensor GmbH, München,
Germany
G. Lutz, L. Strüder, G. Schaller, F. Schopper, MPI Halbleiterlabor, München, Germany
10:40 F42 PARALLEL PULSE-HEIGHT X-RAY SPECTROMETER (PPSX)
F. Goldin, Bechtel Nevada, Livermore, CA
S. Mitchel, Bechtel Nevada, Las Vegas, NV
 

Friday a.m. Session
Evergreen B
XRD & XRF
C6 - Environmental & Archaeological Applications

Organized by: W.T. Elam, EDAX, Inc., Mahwah, NJ & University of Washington, Seattle, WA
K.M. Kemner, Argonne National Laboratory, Argonne, IL
9:00 F55 DATING PETROGLYPHS WITH XRF: DEVELOPMENT OF THE TECHNIQUE AND
INITIAL RESULTS—Invited
F.W. Lytle, The EXAFS Company, Pioche, NV
N.E. Pingitore, The University of Texas at El Paso, El Paso, TX
9:30 F01 MICRO- AND LOCAL BASED XRF ANALYSIS IN CULTURAL HERITAGE—Invited
A. von Bohlen, ISAS-Institute for Analytical Sciences, Dortmund, Germany
10:00 F24 CT IMAGING APPLIED TO CAPILLARY WATER ABSORPTION IN SICILIAN
SEDIMENTARY ROCKS USED IN CULTURAL HERITAGES
T. Schillaci, M. Brai, D. Cascio, F. Fauci, G. Raso, A. Lo Casto, F. Sorrentino, Università
di Palermo, Palermo, Italy
10:20 Break  
10:40 C3 PROBING THE DEFECT STRUCTURE OF NATURAL NANOPARTICLES WITH
MICROMETER-SIZED SYNCHROTRON X-RAY BEAMS—Invited
A. Manceau, CNRS, Grenoble, France
11:10 F35 APPLICATION OF LOW-POWER ENERGY-DISPERSIVE X-RAY FLUORESCENCE
SPECTROMETERS TO ANALYSIS OF SOILS AND OTHER MATERIALS OF
GEOLOGICAL ORIGIN
M.N. Ingham, L. Grimsley, British Geological Survey, Nottingham, UK
B. Vrebos, PANalytical, Almelo, The Netherlands
 

Friday a.m. Session
Evergreen C
XRD
D5 - Stress Analysis

Organized by: C. Goldsmith, IBM, Hopewell Junction, NY
T.R. Watkins, Oak Ridge National Laboratory, Oak Ridge, TN
8:30 D007 PROPERTIES AND THE GENERAL USE OF THE X-RAY ELASTIC FACTORS—Invited
B. Ortner, University Leoben, Leoben, Austria and Austrian Academy of Sciences,
Vienna, Austria
9:00 D075 4-D XRD FOR STRAIN IN MANY GRAINS USING TRIANGULATION
H.A. Bale, J.C. Hanan, Oklahoma State University, Stillwater, OK
N. Tamura, ALS, Lawrence Berkeley National Laboratory, Berkeley, CA
9:20 D032 X-RAY STRESS ANALYSIS EMPLOYING THE LATTICE PARAMETER ELLIPSOID
R.E. Ogilvie, Massachusetts Institute of Technology, Cambridge, MA
9:40 D013 SURFACE AND BULK INTERNAL STRESSES IN Li2O-2SiO2 GLASS-CERAMICS
H. Pinto, A. Pyzalla, Technical University of Vienna, Vienna, Austria and Max-Planck-Institute for Iron Research, Düsseldorf, Germany
L. Ito, M. Crovace, E.B. Ferreira, Technical University of Vienna, Vienna, Austria and Federal
University of Sao Carlos, Sao Carlos, Brazil
F. Fauth, European Synchrotron Radiation Facility (ESRF), Grenoble, France
T. Wroblewski, HASYLAB at DESY, Hamburg, Germany
E.D. Zanotto, Federal University of Sao Carlos, Sao Carlos, Brazil
10:00 Break  
10:20 D062 MECHANICS OF MICROELECTRONIC STRUCTURES AS REVEALED BY X-RAY
DIFFRACTION—Invited
C.E. Murray, IBM T.J. Watson Research Center, Yorktown Heights, NY
10:50 D058 DETERMINATION OF LOCAL STRAIN FIELD IN SOI LINES USING HIGH
RESOLUTION X-RAY DIFFRACTION
A. Loubens, Université Paul Cézanne, Marseille, France and Ecole Nationale Supérieure des
Mines de Saint-Etienne, Gardanne, France
M. Gailhanou, O. Thomas, Université Paul Cézanne, Marseille, France
J.-S. Micha, CEA-Grenoble/DRFMC/SI3M/PCM, Grenoble, France
R. Fortunier, Ecole Nationale Supérieure des Mines de Saint-Etienne, Gardanne, France
B. Charlet, CEA Leti, Grenoble, France
11:10 D023 RESIDUAL STRESSES IN THIN FILMS CHARACTERIZED BY THE COMBINATION
OF sin2C AND CURVATE METHODS: POSSIBILITIES AND LIMITATIONS
J. Keckes, K.J. Martinschitz, E. Eiper, Erich Schmid Institute, Leoben, Austria
     






 

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