The Denver X-ray Conference
- Plenary Session "Stress Analysis"
4 - 8 August 2008
Denver Marriott Tech Center Hotel
A joint meeting of the 57th Annual Denver X-ray Conference (DXC), and the 8th International Conference on Residual Stresses was held in Denver, Colorado from 4-8 August 2008. Held at the Denver Marriott Tech Center Hotel, the joint meeting attracted over 500 registered attendees and more than 200 exhibit personnel.
Conference week began with 17 tutorial workshops, held on Monday and Tuesday. Topics included:
XRD & XRF: • Cultural Heritage I & II • Nanomaterials and their Applications
XRD: • Texture Analysis with Area Detectors • Introduction to Rietveld • Non-ambient XRD • Combined Use of X-rays & Neutrons • High-throughput X-rays
XRF: • Quantitative Analysis I & II • Basic XRF • Energy Dispersive XRF • Specimen Preparation I & II • Trace Analysis
ICRS Workshop: • Stress Analysis I & II
Thirty-eight special sessions filled the remaining two and one-half days of the conference. Topics included:
XRD & XRF: • New Developments in XRD & XRF Instrumentation • Analysis of Nanomaterials • Cultural Heritage I & II
• Industrial Applications • X-ray Microimaging • Microbeam X-ray Analysis I & II
XRD: • Thin Films • High Temperature In-situ Analysis • Small Angle Scattering
XRF: • Fusion & Industrial Applications of XRF • Regulatory Applications • Trace Analysis • Quantitative Analysis
ICRS Sessions: • Fatigue & Fracture • Modeling I & II • Materials Engineering I & II • Other Measurement Techniques • Diffraction Techniques: Synchrotrons – Macrobeam and High Energy I & II; Laboratory Applications; Neutron – I & II; General Methods; Synchrotrons – Microbeam • Industrial Applications: Layers and Composites; Thermal Processing; Engineered Stresses; Welding; Distortion and Machining; Friction Stir Welding; Miscellaneous
• Relaxation Techniques: Hole Drilling; Slitting; Deep Hole and Contour.
The Plenary Session, Stress and Society, took place on Wednesday morning and was organized by I.C. Noyan, Columbia University, New York, NY; M. Prime, Los Alamos National Laboratory, Los Alamos, NM; E. Üstündag, Iowa State University, Ames, IA. The four invited talks that took place during the plenary session were:
• “Materials State Awareness: Dealing with Uncertainty in Design and Service”
R.B. Thompson, Iowa State University, Ames, IA
• “Dental Stress, Mechanical Not Psychological, Even Some Residual Stress”
M. Bagby, West Virginia University School of Dentistry, Morgantown, WV
• “Residual Stresses in U.S. Nuclear Power Systems”
A.A. Csontos, U.S. Nuclear Regulatory Commission, Washington, D.C.
• “More Miles for Tired Iron: The Application of Engineered Compressive Residual Stresses in Aging Aircraft”
M. Shepard, US Air Force Research Laboratory, WPAFB, OH
Awards were presented during the Plenary Session to honor a variety of significant contributions to the field of X-ray materials analysis. The 2008 Birks Award was presented to Rene Van Grieken, University of Antwerp, Antwerp, Belgium; the 2008 McMurdie Award was presented to Jeffrey Dann, OSRAM Sylvania, Towanda, PA and the 2008 Jerome B. Cohen Student Award was presented to Sterling Cornaby, Cornell University, Ithaca, NY.
(Click photo to see larger version)
Figure 1. Rene Van Grieken (left), University of Antwerp, Antwerp, Belgium, receives the 2008 Birks Award from Tim Elam (right), EDAX/University of Washington, Redmond, WA.
Figure 2. Sterling Cornaby (left), Cornell University, Ithaca, NY, receives the 2008 Cohen Award from Cev Noyan (right), Columbia University, New York, NY.
Figure 3. Jeffrey Dann (left), OSRAM Sylvania, Towanda, PA, receives the 2008 McMurdie Award from Thomas Blanton (right), Eastman Kodak Company, Rochester, NY
Poster sessions were held on Monday, Tuesday and Thursday of conference week. Judges were appointed each night to select the best posters. The following posters were selected as the best:
• “X-ray Probe Analyses of Complicated Precipitates Formed in Copper-Base Alloys”
S. Sato, Y. Takahashi, T. Sanada, NISSAN ARC, LTD., Kanagawa, Japan; K. Shinoda, K. Wagatsuma, S. Suzuki, Tohoku University, Miyagi, Japan
• “Grazing-Incidence Diffraction Applied as a Crosscutting Tool in the Nanobio Regime”
B.D. Pate, X. Han, The Dow Chemical Company, Midland, MI; D. Keane, Northwestern University, Evanston, IL; S. Wargacki, R. Vaia, M. Durstock, Air Force Research Laboratoy; H-S. Kim, S-M. Choi, Korea Advanced Institute of Science and Technology
• “Characterizing X-ray Mirrors in Reciprocal Space: Preliminary Results from the NIST X-ray Optics Evaluation Double-crystal Diffractometer”
D.L. Gil, Coruscavi Software, Washington, DC; D. Windover, A. Henins, J.P. Cline, NIST, Gaithersburg, MD
• “Grazing-Exit-XRF Experiments at Hasylab Beamline L”
F. Meirer, C. Streli, P. Wobrauschek, N. Zoeger, Atominstitut, Tu Wien, Vienna, Austria; G. Pepponi, Fondazione Bruno Kessler-irst, Povo, Italy
• “Development of Soil Standard Materials Containing Hazardous Metals for X-ray Fluorescence Analysis”
Y. Shibata, J. Suyama, M. Kitano, T. Nakamura, Meiji University, Kawasaki, Kanagawa, Japan
• “Tissue Elemental Mapping Using HDXRF with Doubly Curved Crystals”
D. Li, Z. Chen, X-ray Optical System, Inc., East Greenbush, NY; A.H. Koeppen, S.C. Michael, V.A. Medical Center, Albany, NY
• “Finite Element Modeling of Residual Stress Profile Patterns in Hard Turning”
Y.B. Guo, The University of Alabama, Tuscaloosa, AL
• “Interface Residual Stresses in Dental Zirconia Using Laue Micro-Diffraction”
H.A. Bale, J.C. Hanan, Oklahoma State University, Stillwater, OK; N. Tamura, M. Kunz, Advanced Light Source, Berkeley, CA; P. Coelho, V. Thompson, New York University, New York, NY.
Exhibits at the conference ran from Monday to Thursday with 45 companies displaying their various products and services for X-ray powder diffraction, X-ray fluorescence spectrometry and residual stress analysis. The following companies participated at the exhibits:
American Stress Technologies
International Centre for Diffraction Data
Materials Data, Inc.
Mike Handley Analytical Services
Photonic Science Ltd.
PREMIER Lab Supply, Inc.
Proto Manufacturing Inc.
SII NanoTechnology USA, Inc.
Skyray Instrument Co. Ltd.
SPEX Sample Prep LLC
To see a complete list of the products and services that the exhibitors displayed at the DXC, please visit the website: http://www.dxcicdd.com/08/exhibit.htm.
Social events at the conference included a Welcoming Reception sponsored by Thermo Scientific and ICDD; PANalytical was the sole sponsor of Monday evening’s poster session and reception; Tuesday evening’s event was sponsored by Chemplex and GE Inspection Technologies; exhibits remained open Wednesday evening for a Vendor Sponsored Reception and Thursday was a conference dinner for the ICRS attendees.
The Organizing Committee would like to acknowledge the workshop instructors, invited speakers and session chairs, for all of the time and effort that they volunteered to make this conference a great success. They would also like to send their appreciation to the above mentioned sponsors. For a preview of the 2009 Program, visit www.dxcicdd.com.
The Denver Marriott Tech Center has currently sold out of rooms.
Information is listed below on area hotels. Please be sure to check with the Denver Marriott Tech Center as the conference approaches to see if there have been any cancellations. Traditionally, there are a moderate number of cancellations the week preceding the conference.
Hotels with in walking distance of The Marriott Tech Center:
- Hyatt Denver Tech Center - techcenter.hyatt.com
- The Hilton Garden Inn (previously Wyndham), this hotel is in the process of changing brands and may be undergoing renovations. - hiltongardeninn.hilton.com
Hotels not with in walking distance, but are still nearby:
- Doubletree Denver Tech Center - doubletree1.hilton.com
- Courtyard Denver Tech Center - marriott.com
Deadline for Submission of Abstracts has been extended until March 7
Exhibit Space Details – includes floor plan, application form and sponsorship information
For an overview of things to see and do in Denver, please visit this site: www.denver.org