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ADDRESSING CHALLENGES IN MATERIALS ENGINEERING AND BIOTECHNOLOGY THROUGH COMBINED SAXS AND SANS MEASUREMENTS Andrew J. Allen, Andrew J. Allen |
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PROBING THE MICRO-MECHANICAL BEHAVIOR OF BONE VIA HIGH-ENERGY X-RAYS Jonathan Almer, Jonathan Almer Stuart Stock, Stuart Stock |
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ANALYSIS OF ELEMENTS IN ENVIRONMENTAL SAMPLES BY MICRO-XRF Y. Araki, Y. Araki S. Maeo, M. Krämer, S. Maeo, M. Krämer T. Utaka and K. Taniguchi, T. Utaka and K. Taniguchi |
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X-RAY DIFFRACTOMETRIC DETERMINATION OF CHRYSOTILE ASBESTOS IN BUILDING MATERIALS WITH RIETVELD REFINEMENT T. Asahi*, S. Kobayashi, T. Matsudaira, K. Nakayama, M. Kitano, T. Nakamura, T. Asahi*, S. Kobayashi, T. Matsudaira, K. Nakayama, M. Kitano, T. Nakamura |
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Thin Film Technology for Preparation of X-ray Waveguide-Resonators E.V. Egorov, V.K. Egorov, E.V. Egorov, V.K. Egorov R.E. Ayala-Jiménez, R.E. Ayala-Jiménez M.S. Afanas’ev, M.S. Afanas’ev |
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Simultaneous Determination of Main, Minor and Trace Elements in Fertilizers by Total Reflection X-Ray Fluorescence R.E. Ayala-Jimenez*, C.H. Alvarado, R.E. Ayala-Jimenez*, C.H. Alvarado |
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PRECONCENTRATION, QUANTITATION, AND SPECIATION OF SUB-PPM LEVELS OF ARSENIC (III) AND (V) IN WATER VIA HAND-HELD XRF P.E. Baker*, R. Johnson, P.T. Palmer, P.E. Baker*, R. Johnson, P.T. Palmer R.R. Jacobs, R.R. Jacobs |
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HEALTHY PHARMACEUTICAL DRUGS – CONTROL OF IMPURITIES IN ACTIVE PHARMACEUTICAL INGREDIENTS BY EDXRF K. Behrens, A. Scothern, H. Ress, K. Behrens, A. Scothern, H. Ress A. Seyfarth, A. Seyfarth |
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LinkIn – THE WAY TO BETTER RESULTS K. Behrens, K. Behrens L. Arias, A. Seyfarth, L. Arias, A. Seyfarth |
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EXPANDING THE ANALYTICAL RANGE OF WDXRF - NEW XRF ANALYZER CRYSTALS K. Behrens, K. Behrens A. Seyfarth, A. Seyfarth |
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IRON ORE ANALYSIS A NEW APPROACH FOR NEW REQUIREMENTS K. Behrens, K. Behrens A. Seyfarth, A. Seyfarth |
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TURN-KEY SOLUTIONS WITH INTEGRATED FLEXIBILITY FROM PACKAGE TO REAL SOLUTION K. Behrens, K. Behrens K. Roscoe, A. Seyfarth, K. Roscoe, A. Seyfarth |
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NEW DEVELOPMENT FOR THE AUTOMATION OF BORATE FUSION SAMPLE PREPARATION FOR XRF L. Bérubé, L. Bérubé |
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Analysis of focused beam powder x-ray diffraction using curved crystal optics Ayhan Bingölbali and C. A. MacDonald, Ayhan Bingölbali and C. A. MacDonald |
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CHARACTERIZATION OF ZnSe FILMS DEPOSITED ON (100) GaAs USING CONVENTIONAL AND HIGH RESOLUTION DIFFRACTOMETERS T.N. Blanton, C.L. Barnes, M. Holland, K.B. Kahen, T.N. Blanton, C.L. Barnes, M. Holland, K.B. Kahen V. Gupta, F.Bai, V. Gupta, F.Bai |
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Choosing XRF for RoHS Applications Jame R. Bogert, Jame R. Bogert |
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OPTIMIZING THE BALANCE OF QUALITY AND TURNAROUND TIME FORA PROCESS CONTROL XRF LABORATORY S.W. Bowe, S.W. Bowe |
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EVALUATION OF X-RAY FLUORESCENCE SPECTROMETERS FOR POSSIBLE IMPLEMENTATION IN A MANFACTURING LABORATORY – METALS IN ALUMINA L.L. Brehm, D.W. Burns, L.L. Brehm, D.W. Burns |
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XRF AND XRD ANALYSIS OF CONVERTED LEAD PIGMENT ON A GEORGIA O’KEEFE PASTEL DRAWING Lynn B. Brostoff, Lynn B. Brostoff Catherine Maynor, Catherine Maynor R. Jeff Speakman, R. Jeff Speakman |
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XAFS STUDIES OF NANOSYSTEMS: HOW X-RAY, ELECTRON MICROSCOPY, AND OPTICAL TECHNIQUES EACH CONTRIBUTE TO STRUCTURAL CHARACTERIZATION B. A. Bunker, B. A. Bunker |
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ELEMENTAL ANALYSIS OF POLYOFELINS BY X-RAY FLUORESCENCE USING CHARACTERIZED POLYMER STANDARDS Donald W. Burns, Donald W. Burns Terri L. Lewis, Terri L. Lewis Tammy Bradley, Tammy Bradley Towhid Hasan, Towhid Hasan Ward Rigot, Ward Rigot Fran Franklin, Fran Franklin |
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ANALYSIS OF SHEAR STRESS DISTRIBUTION IN AL (CU) INTERCONNECTS INDUCED BY ELECTROMIGRATION BASED ON SCHMIDT’S LAW AND STUDIED BY SYNCHROTRON POLYCHROMATIC X-RAY MICRODIFFRACTION K. Chen*, K. Chen* N. Tamura, B. C. Valek, N. Tamura, B. C. Valek K. N. Tu, K. N. Tu |
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SMALL SPOT MONOCHROMATIC BEAMS FOR XRD APPLICATIONS USING DOUBLY CURVED CRYSTAL OPTICS AND LOW POWER SOURCES Danhong Li, Z. W. Chen, Danhong Li, Z. W. Chen |
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High Sensitivity, Low Power, Grazing Incidence X-Ray Fluorescence Analyzer for Remote, In Situ, Groundwater Analysis K. Xin, B. Gallagher, Z. W. Chen, A. Verchinine, N. Gao, F. Wei, D. Li, M. Cusack, S. Madison, K. Xin, B. Gallagher, Z. W. Chen, A. Verchinine, N. Gao, F. Wei, D. Li, M. Cusack, S. Madison |
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3-D TOMOGRAPHIC STUDIES OF ANNEALED NANOPOROUS GOLD USING TRANSMISSION X-RAY MICROSCOPE (TXM) AT ADVANCED PHOTON SOURCE Y.-c. Chen, Q. Shen, Y.-c. Chen, Q. Shen |
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PORTABLE XRD/XRF INSTRUMENTATION FOR THE STUDY OF WORKS OF ART G. Chiari, G. Chiari P. Sarrazin, P. Sarrazin M. Gailhanou, M. Gailhanou |
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PHASE TRANSFORMATION AND STRUCTURAL BEHAVIOR STUDIES OF Li-BASED HYDRIDES AFTER PRESSURE HYDRIDING/DE-HYDRIDING CYCLING Wen-Ming Chien, Joshua H. Lamb and Dhanesh Chandra, Wen-Ming Chien, Joshua H. Lamb and Dhanesh Chandra |
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X-RAY DIFFRACTION AND HIGH PRESSURE STUDIES ON ORGANIC THERMAL ENERGY STORAGE MATERIALS – TRIS(HYDROXYMETHYL) AMINOMETHANE (TRIS) W.-M. Chien, V.K. Kamisetti, J.C. Fallas, E.D. Emmons, D. Chandra, A.M. Covington, W.-M. Chien, V.K. Kamisetti, J.C. Fallas, E.D. Emmons, D. Chandra, A.M. Covington R.S. Chellappa, R.S. Chellappa M. Kunz, S. Clark, M. Kunz, S. Clark |
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BIFOCAL MINIATURE TOROIDAL X-RAY MIRRORS Sterling Cornaby, Sterling Cornaby Detlef Smilgies , Detlef Smilgies Donald Bilderback, Donald Bilderback |
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Study of combustion syntheses by time-resolved X-ray diffraction: Comparison of synthesis mechanisms for different combustion modes C. Curfs, J. Wright, G.B.M. Vaughan, C. Curfs, J. Wright, G.B.M. Vaughan H. Boutefnouchet, H. Boutefnouchet |
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NEW DEVELOPMENT IN LITHIUM BORATE FUSION FOR FERROALLOYS Philippe Daigle, Philippe Daigle |
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A TOP-DOWN APPROACH USING X-RAY IMAGING TECHNIQUES: INSTRUMENTAL DEVELOPMENTS AND APPLICATIONS IN LIFE SCIENCE B. De Samber, T. Schoonjans, G. Silversmit, B. Vekemans, L. Vincze, R. Evens, K. De Schamphelaere, C. Janssen,B. Masschaele, L. Van Hoorebeke, B. De Samber, T. Schoonjans, G. Silversmit, B. Vekemans, L. Vincze, R. Evens, K. De Schamphelaere, C. Janssen,B. Masschaele, L. Van Hoorebeke S. Bohic, S. Bohic K. Rickers, G. Falkenberg, K. Rickers, G. Falkenberg |
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USAGE OF PROBABILITY SCORING TO SORT XRPD SCANS OF DYING PROTEIN ON SIMILARITY Thomas Degen, Thomas Degen Irene Margiolaki, Jonathan P. Wright, Irene Margiolaki, Jonathan P. Wright |
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USING FOCUSED HARD X-RAYS FOR INVESTIGATIONS RELATED TO NUCLEAR WASTE DISPOSAL M.A. Denecke, M.A. Denecke |
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APPLICATIONS OF POLARIZED EDXRF SYSTEM FOR LIGHT MATRIX SAMPLES T. Nakamura, T. Moriyama, M. Doi, H. Kohno, T. Nakamura, T. Moriyama, M. Doi, H. Kohno H. Inoue, H. Inoue |
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AN INNOVATIVE EDXRD PROBE Charles M. Dozier, Charles M. Dozier Noureddine Anibou, Noureddine Anibou |
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KINETICS OF PARTICLE GROWTH FOR SUPPORTED PT AND PT/PD DETERMINED USING HTXRD A.R. Drews* and R.J. Kudla, A.R. Drews* and R.J. Kudla |
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IMPROVING TRACE ELEMENT DETECTION IN EDXRF BY REDUCING PILEUP ARTIFACTS W. T. Elam*, Bruce Scruggs, Michael Solazzi, and Joseph Nicolosi, W. T. Elam*, Bruce Scruggs, Michael Solazzi, and Joseph Nicolosi |
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STUDY ON THE X-RAY DIFFRACTION BEHAVIOR OF A BIG CRYSTAL GRAIN IN ORIENTED 3% SILICON STEEL J. F. Fang*, Zh.L.Tian, J. Huo, J.Y. Zhang, Y. Zhang, J. F. Fang*, Zh.L.Tian, J. Huo, J.Y. Zhang, Y. Zhang |
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DEVELOPMENT OF A NOVEL MULTI-ELEMENT SILICON DRIFT DETECTOR ARRAY L. Feng, V. D. Saveliev, C. R. Tull, S. Barkan, M. Takahashi, E.V. Damron, L. Feng, V. D. Saveliev, C. R. Tull, S. Barkan, M. Takahashi, E.V. Damron |
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ULTRAFAST X-RAY FULL-FIELD MICRO-IMAGING OF TRANSIENT FLUID DYNAMICS Kamel Fezzaa, Kamel Fezzaa |
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PICOLITER DEPOSITION FOR MXRF CALIBRATION AND QUANTIFICATION USING PROTOTYPE THERMAL INKJET TECHNOLOGY George J. Havrilla, George J. Havrilla |
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POSSIBILITIES AND LIMITATIONS OF X-RAY DIFFRACTION USING HIGH ENERGY X-RAYS ON A LABORATORY SYSTEM Hans te Nijenhuis, Milen Gateshki and Martijn Fransen, Hans te Nijenhuis, Milen Gateshki and Martijn Fransen |
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RESIDUAL STRESSES AFTER CMP ON THIN FILMS Wei-En Fu, Wei-En Fu Meng-Ke Chen, Meng-Ke Chen Chao-Chang A. Chen, Chao-Chang A. Chen |
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LATEST DEVELOPMENTS OF ADVANCED X-RAY OPTICS AND THEIR APPLICATIONS IN X-RAY MICROANALYSIS Ning Gao, Ning Gao Zewu Chen, Zewu Chen Igor Ponomarev, Igor Ponomarev Yejun He, Yejun He Walter M. Gibson, Walter M. Gibson |
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MCLLS Approach to EDXRF Analysis on XOS Devices Robin P. Gardner, Robin P. Gardner Fusheng Li, Fusheng Li Zewu Chen, Zewu Chen Matthew Cusack, Matthew Cusack |
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X-RAY FLUORESCENCE OF A MEDIEVAL MOSAN RELIQUARY OF SAINT AMANDUS J. Giaccai, J. Giaccai |
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HIGH-DEFINITION X-RAY FLUORESCENCE: PRINCIIPLES AND APPLICATIONS Walter M. Gibson, Walter M. Gibson Danhong Li, Danhong Li Huapeng Huang, Huapeng Huang Zewu Chen, Zewu Chen |
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New analytical expression of the threshold limit of the mixing prameter of pseudo-Voigt function Khereddine Yazid, Bradai Djamel, Khereddine Yazid, Bradai Djamel |
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CULTURAL HERITAGE STUDIES WITH HIGH-ENERGY X-RAYS AT THE APS 1-ID BEAMLINE D. R. Haeffner*, J. D. Almer, D. R. Haeffner*, J. D. Almer F. Casadio, F. Casadio D. C. Dunand, D. C. Dunand B. D. Newbury, B. D. Newbury M. L. Young, M. L. Young |
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IN SITU HEATING STUDIES ON THE INTERNAL STRESSES OF MULTILAYER ENVIRONMENTAL BARRIER COATINGS Bryan J Harder*, Bryan J Harder* Katherine T Faber, Katherine T Faber Jon Almer, Jon Almer Kang N Lee, Kang N Lee |
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X-RAY DIFFRACTOMETRY WITH A MICROFOCUS SOURCE B. Hasse*, C. Michaelsen, B. Hasse*, C. Michaelsen U. Preckwinkel, H. Cordes, N. Yang, U. Preckwinkel, H. Cordes, N. Yang |
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STATE-OF-THE-ART MULTILAYER OPTICS FOR DIFFRACTOMETRY B. Hasse*, C. Michaelsen, A. Oehr, F. Hertlein, S. Kroth, B. Hasse*, C. Michaelsen, A. Oehr, F. Hertlein, S. Kroth |
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APPLICATIONS OF CONFOCAL MICRO X-RAY FLUORESCENCE 3-DIMENSIONAL ELEMENTAL IMAGING Brian M. Patterson, Brian M. Patterson |
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SEARCHING FOR PURE TIN ON ELECTRONIC COMPONENTS:TIN WHISKER PREVENTION Martin Sweet, Martin Sweet |
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HEAVY METAL ANALYSIS OF WATER SAMPLES DOWN TO SUB-PPB LEVEL BY USING X-RAY FLUORESCENCE ANALYSIS COMBINED WITH THE CONCENTRATION TECHNIQUES S. Hayakawa, M. Iwaki, Y. Nishimoto, K. Yamane and T. Hirokawa, S. Hayakawa, M. Iwaki, Y. Nishimoto, K. Yamane and T. Hirokawa |
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MICROFOCUS LIQUID-METAL-JET X-RAY TUBES AND APPLICATIONS O. Hemberg*, M. Otendal , O. Hemberg*, M. Otendal T. Tuohimaa, H.M. Hertz, T. Tuohimaa, H.M. Hertz |
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INVESTIGATION OF CO-CRYSTALLIZED PHARMACEUTICAL INGREDIENTS USING SYNCHROTRON RADIATION M. Herrmann, U. Förter-Barth, H. Kröber, P.B. Kempa, M. Herrmann, U. Förter-Barth, H. Kröber, P.B. Kempa S. Doyle, S. Doyle |
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QUANTITATIVE IN-SITU X-RAY DIFFRACTION ANALYSIS OF EARLY HYDRATION OF PORTLAND CEMENT AT DEFINED TEMPERATURES Christoph Hesse, Christoph Hesse Friedlinde Goetz-Neunhoeffer, Friedlinde Goetz-Neunhoeffer Juergen Neubauer, Juergen Neubauer Michael Braeu, Michael Braeu Peter Gaeberlein, Peter Gaeberlein Mathias Degenkolb, Mathias Degenkolb |
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PULSED LASER DEPOSITION TECHNIQUE FOR THE SYNTHESIS OF NANOSTRUCTURES J.-I. Hong, M. Kirkham, J. Bae, Z.L. Wang, R.L. Snyder, J.-I. Hong, M. Kirkham, J. Bae, Z.L. Wang, R.L. Snyder |
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HIGH VOLUME SCRAP MATERIAL SORTING USING XRF E. Brown, D. Carolan, X. Chen, J. Egan, B. Hubbard-Nelson, R. Nasella, I. Rosmarin, R. Russell, D. Sackett, C. Weaver, E. Brown, D. Carolan, X. Chen, J. Egan, B. Hubbard-Nelson, R. Nasella, I. Rosmarin, R. Russell, D. Sackett, C. Weaver |
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Finding an Element Tracer for use in the Early Detection of 4 ˝ bearing Failure in J52P408 Engines by EDXRF G.R. Humphrey, G.R. Humphrey |
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QUANTITATIVE MEASUREMENT OF NANOPARTICLE HALO FORMATION AROUND COLLOIDAL MICROSPHERES IN BINARY MIXTURES USING SMALL-ANGLE X-RAY SCATTERING J. Ilavsky*, F. Zhang, G. G. Long, P. R. Jemian, J. Ilavsky*, F. Zhang, G. G. Long, P. R. Jemian V. T. Milam, V. T. Milam J. A. Lewis, J. A. Lewis |
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Determination of Crystallographic Polarity of Thin Films using High Resolution XRD |
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FDA REGULATORY APPLICATIONS OF FIELD PORTABLE EDXRF R.M.Jacobs, R.M.Jacobs P. T. Palmer, P. T. Palmer |
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Residual Stress Analysis of Non-Polar GaN Epi-layers by GIXRD Y.-i. Jang, K.-h. Park, Y.-i. Jang, K.-h. Park S.-r. Cho, H.-k. Kwon, S.-r. Cho, H.-k. Kwon |
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DISCOVERY OF A HIDDEN VAN GOGH PAINTING BY MEANS OF HIGH-ENERGY XRF MAPPING J. Dik, J. Dik K. Janssens, K. Janssens G. Van der Snickt, G. Van der Snickt L. Van der Loeff, L. Van der Loeff |
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COMBINED MICRO-XRF/XRPD TOMOGRAPHY FOR THE CHARACTERIZATION OF FeCrAlY-FOAM-BASED CATALYSTS K. Janssens, W. De Nolf, K. Janssens, W. De Nolf F. Basile, P. Benito, S. Bugani, G. Fornasari, L. Morselli, E. Scavetta, D. Tonelli, A. Vaccari, F. Basile, P. Benito, S. Bugani, G. Fornasari, L. Morselli, E. Scavetta, D. Tonelli, A. Vaccari |
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MEASUREMENT CONDITIONS FOR QUANTITATIVE ANALYSIS USING THE RIETVELD METHOD E. Kagami, A. Takase, E. Kagami, A. Takase |
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THE YIN AND YAN OF XRF ANALYSIS AS A TOOL IN THE INVESTIGATION OF CULTURAL HERITAGE WORKS BJKaiser, BJKaiser |
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ANALYSIS OF ORES AND CONCENTRATES BY USING BENCHTOP WDXRF Y. Kataoka, H. Homma, Y. Yamada, H. Kohno, Y. Kataoka, H. Homma, Y. Yamada, H. Kohno H. Inoue, H. Inoue |
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La/Lb INTENSITY RATIO DEPENDS ON THE SPECTROMETER RESOLUTION Jun Kawai, Ryosuke Shioi, Nobuharu Sasaki, Kenji Okada, Goro Kinugawa, Shinsuke Kunimura, Takashi Yamamoto, Jun Kawai, Ryosuke Shioi, Nobuharu Sasaki, Kenji Okada, Goro Kinugawa, Shinsuke Kunimura, Takashi Yamamoto |
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Local Residual Stresses and Thermal Fatigue in CrN Coatings on Steel Characterized by High-Temperature Synchrotron X-ray Diffraction K.J. Martinschitz, K.J. Martinschitz Ch. Kirchlechner, Ch. Kirchlechner R. Daniel, R. Daniel Ch. Mitterer, Ch. Mitterer J. Keckes, J. Keckes |
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High-Temperature Characterization of Three-Dimensional Distribution of Residual Stresses in CrN Coatings on Steel K.J. Martinschitz, K.J. Martinschitz Ch. Kirchlechner, Ch. Kirchlechner R. Daniel, R. Daniel Ch. Mitterer, Ch. Mitterer J. Keckes, J. Keckes |
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QUANTITATIVE DETERMINATION OF ASBESTOS IN BULK INSULATION BY XRD D.S. Kendall*, R.A. Martinez, D.S. Kendall*, R.A. Martinez |
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IN-SITU XRD ANALYSIS OF THE GROWTH OF ZnO NANOWIRES M Kirkham, M Kirkham Z L Wang, Z L Wang R L Snyder, R L Snyder |
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DETECTORS FOR DEMANDING X-RAY DIFFRACTION K. Knorr*, B. Hinrichsen, G. Vanhoyland, K. Knorr*, B. Hinrichsen, G. Vanhoyland |
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A NEW HIGH-THROUGHPUT SAXS SCREENING TOOL P. Kotnik, H. Schnablegger, P. Kotnik, H. Schnablegger G. Langenbucher, G. Langenbucher |
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Automated SAXS Measurements of Protein Solutions with a Laboratory Based SAXS System M. Kriechbaum*, P. Laggner, P. Herrnegger, M. Kriechbaum*, P. Laggner, P. Herrnegger |
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GRAIN GROWTH AND TEXTURE SHARPENING IN COPPER, NICKEL AND PALLADIUM THIN FILMS, INVESTIGATED BY NON-AMBIENT X-RAY DIFFRACTION MEASUREMENTS Yener, Kuru, Yener, Kuru Markus, Wohlschlögel, Markus, Wohlschlögel Udo, Welzel, Udo, Welzel Eric, Mittemeijer, Eric, Mittemeijer |
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SYNTHESIS, STRUCTURAL AND CHEMICAL CHARACTERIZATION OF Ca(HO3PCH2)2-N(H)-(CH2)6-N(H)-(CH2PO3H)2•2H2O L. Leon-Reina*, L. Leon-Reina* A. Cabeza, R.M.P. Colodrero, M.A.G. Aranda, A. Cabeza, R.M.P. Colodrero, M.A.G. Aranda E. Barouda, K.D. Demadis, E. Barouda, K.D. Demadis |
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TISSUE ELEMENTAL MAPPING USING HDXRF WITH DOUBLY CURVED CRYSTALS Danhong Li, Zewu Chen, Danhong Li, Zewu Chen Arnulf Koeppen, Susan Michael, Arnulf Koeppen, Susan Michael |
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STRUCTURE AND KINETICS OF SELF-ASSEMBLED NANOCYRSTAL SYSTEMS PROBED BY SMALL ANGLE X-RAY SCATTERING TECHNIQUES X.-M. Lin, J. Wang, X.-M. Lin, J. Wang |
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ANCIENT WARRIORS AND THE ORIGIN OF CHINESE PURPLE |
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FURTHER STUDIES OF THE BORATE FUSION METHOD OF SAMPLE PREPARATION M Loubser, M Loubser P H van Rooyen, P H van Rooyen J P R de Villiers, J P R de Villiers |
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Further studies of the Borate Fusion Method of Sample Preparation: The applications Maggi Loubser* Peet H van Rooyen and Johan PR de Villiers, Maggi Loubser* Peet H van Rooyen and Johan PR de Villiers |
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FORENSICS APPLICATIONS OF X-RAY FLUORESCENCE MICROSCOPE. Sergey Mamedov, Sergey Mamedov Jon Goldey, Jon Goldey George Setola, George Setola Andrew Whitley, Andrew Whitley |
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XRF BY SIMULTANEOUS USE OF K- AND L-LINES OF AN ELEMENT Michael Mantler*, Michael Mantler* Burkhard Beckhoff, Burkhard Beckhoff |
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QUANTIFICATION OF RETAINED AUSTENITE IN ASTM A743 GRADE CA6NM CAST MARTENSITIC STAINLESS STEEL THROUGH X-RAY DIFFRACTION J.V. Rojas Marín, A. Toro Betancur, J.V. Rojas Marín, A. Toro Betancur |
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THE SYNERGY OF XRD AND XRF IN A SHALE AND SLATE ANALYSIS L.Fields*, M. Martin, L.Fields*, M. Martin |
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Mechanical Properties of Thin Films Characterized by a Combination of sin2ψ and X-ray Diffraction Substrate Techniques K.J. Martinschitz, K.J. Martinschitz J. Keckes, J. Keckes |
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A Novel Diffraction Technique to Determine Mechanical Moduli of Fibre-Textured Thin Films K.J. Martinschitz, K.J. Martinschitz J. Keckes, J. Keckes |
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CONFOCAL X-RAY FLUORESCENCE OF PAINTINGS: DECONSTRUCTING AN ATYPICAL 17TH C. COLLABORATION FROM ANTWERP, ASSESSING A 14TH C. CATALONIAN PANEL, AND IMAGING A LOST N.C. WYETH Jennifer Mass, Jennifer Mass Arthur Woll, Arthur Woll Christina Bisulca, Christina Bisulca Matt Cushman, Matt Cushman Noelle Ocon, Noelle Ocon |
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NOVEL PROCESSING OF NICKEL CONTAINING CORDIERITE GLASS-CERAMICS FOR MICROPOROUS GAS SEPARATION MEMBRANES Michelene E, Miller, Michelene E, Miller Scott T. Misture*, Scott T. Misture* |
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X-RAY FLUORESCENCE (XRF) ANALYSIS OF HANFORD LOW ACTIVITY WASTE SIMULANTS: METHOD DEVELOPMENT D.M. Missimer, A.R. Jurgensen, R.L. Rutherford, D.M. Missimer, A.R. Jurgensen, R.L. Rutherford |
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NANOSCALE PHOTOCATALYSTS DERIVED FROM LAYERED PHASES: FORMATION AND CHARACTERIZATION E.J. Nichols, S.T. Misture, E.J. Nichols, S.T. Misture |
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STUDY OF MICROHETEROGENEITY USING µXRF, INAA, AND CHEMOMETRIC METHODS J. L. Molloy*, J. R. Sieber, R. Zeisler, J. L. Molloy*, J. R. Sieber, R. Zeisler |
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Analysis of the Crystalline Structure and Magnetic Properties of Fe Nanoparticles Todd C. Monson, Todd C. Monson Dale L. Huber, Dale L. Huber Judith M. Lavin, Judith M. Lavin Valeri Petkov, Valeri Petkov Yang Ren, Yang Ren |
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CHEMOMETRIC APPLICATIONS IN QUANTITATIVE X-RAY POWDER DIFFRACTION OF INTACT CONSOLIDATED SAMPLES Michael D. Moore, Colleen Hair, Peter L.D. Wildfong, Michael D. Moore, Colleen Hair, Peter L.D. Wildfong |
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THE USE OF NET ANALYTE SIGNAL ORTHOGONALIZATION IN THE SEPARATION OF MULTI-COMPONENT DIFFRACTION PATTERNS OBTAINED FROM X-RAY POWDER DIFFRACTION OF INTACT COMPACTS Michael D. Moore, Robert P. Cogdill, Steven M. Short, Colleen Hair, Peter L.D. Wildfong, Michael D. Moore, Robert P. Cogdill, Steven M. Short, Colleen Hair, Peter L.D. Wildfong |
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STRUCTURE ANALYSIS AND EXTINCTION COEFFICIENT OF PbSe COLLOIDAL NANOCRYSTALS I. Moreels, D. De Muynck, F. Vanhaecke, Z. Hens, I. Moreels, D. De Muynck, F. Vanhaecke, Z. Hens |
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Applications of XRF in the Oil Industry R.W. Morton, R.W. Morton |
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ANALYSIS OF HEAVY AND LIGHT ELEMENTS BY COMPACT X-RAY FLUORESCENCE SPECTROMETER K. Muraoka, Y. Araki, T. Utaka, K. Taniguchi, K. Muraoka, Y. Araki, T. Utaka, K. Taniguchi |
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PARTICLE SIZE ANALYSIS OF SUB MICRON MATERIALS USING ULTRA SMALL ANGLE X-RAY SCATTERING Keigo Nagao*, Takayuki Konya, Ryuji Matsuo, Yoshio Iwasaki, Keigo Nagao*, Takayuki Konya, Ryuji Matsuo, Yoshio Iwasaki |
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Preconcentration of the Environmental Water by Agar for XRF Analysis Kazuhiko NAKANO, Kazuhiko NAKANO Kenta OKUBO, Kenta OKUBO Kouichi TSUJI, Kouichi TSUJI |
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Preparation of the Multi-Layered Plastic Reference Materials for Confocal 3D-Micro X-ray Fluorescence Analysis Kazuhiko NAKANO, Kazuhiko NAKANO Kouichi TSUJI, Kouichi TSUJI |
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DETERMINATION OF STRONTIUM CONCENTRATIONS IN CALCIUM-BASED GROUNDS WITH XRF & ICP-MS C. Namowicz, M. Walton, K. Trentelman, C. Namowicz, M. Walton, K. Trentelman |
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X-RAY AND THERMAL ANALYSIS OF CEMENTS AND CONCRETE FOR EVALUATION OF CEMENT ADDITIVES AND CONCRETE ADMIXTURES J.P. Nicolich, D.R. Brown, F.G. Serafin, U.B. Latosiewicz, J.H. Cheung, P.J. Sandberg, J.P. Nicolich, D.R. Brown, F.G. Serafin, U.B. Latosiewicz, J.H. Cheung, P.J. Sandberg |
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Expanding the Detector Efficiency of Silicon Drift Detectors with Optimized Radiation Entrance Window A. Niculae*, H. Soltau, G. Lutz, P. Lechner, A. Bechteler, R. Eckhardt, K. Hermenau, A. Niculae*, H. Soltau, G. Lutz, P. Lechner, A. Bechteler, R. Eckhardt, K. Hermenau O. Jaritschin, A. Liebel, A. Simsek, O. Jaritschin, A. Liebel, A. Simsek G. Schaller, F. Schopper, L. Strüder, G. Schaller, F. Schopper, L. Strüder |
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Crystalline phase analysis and elemental analysis of alkali-washed fly ash and activated sludge ash Atsushi, Atsushi Masaru, Masaru Toshihiro, Toshihiro |
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LARGE AREA SILICON DRIFT DETECTORS A. Pahlke, T. Eggert, S. Pahlke, R. Stoetter, F. Wiest, A. Pahlke, T. Eggert, S. Pahlke, R. Stoetter, F. Wiest |
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X-RAY DIFFRACTION STUDY OF ANISOTROPIC STATE OF RESIDUAL STRESS AFTER DOWN-CUT AND UP-CUT FACE GRINDING Zdenek Pala, Zdenek Pala Nikolaj Ganev, Nikolaj Ganev Jan Drahokoupil, Jan Drahokoupil |
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ON THE USE OF HANDHELD XRF FOR DETERMINATION OF ARSENIC AND MERCURY IN A MUSEUM COLLECTION K. Cross, P.T. Palmer, K. Cross, P.T. Palmer |
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GENERATING RELIABLE QUALITATIVE AND QUANTITATIVE XRF RESULTS TO SUPPORT FDA LAB AND FIELD INVESTIGATIONS Peter T. Palmer, Peter T. Palmer Peter Baker, Peter Baker Kara Cross, Kara Cross Richard Jacobs, Richard Jacobs |
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Grazing-incidence diffraction applied as a crosscutting tool in the nanobio regime Brian D. Pate, Brian D. Pate Xue Han, Xue Han Denis Keane, Denis Keane |
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ALUMINA-SUPPORTED PALLADIUM CATALYST CRYSTALLITE SIZE DETERMINATION BY EXAFS, XRD, AND TEM E.J. Peterson*, T.R. Conant, P. Burton, A. De La Riva, J.P. Gabaldon, L.R. Houk, H. Pham, K. Lovato, J. Paiz, A.K. Datye, E.J. Peterson*, T.R. Conant, P. Burton, A. De La Riva, J.P. Gabaldon, L.R. Houk, H. Pham, K. Lovato, J. Paiz, A.K. Datye |
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ANALYSIS OF SAPPHIRE AND RUBY BY EDXRF Richard E. Phillips, Richard E. Phillips Christopher M. Breeding, Christopher M. Breeding |
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A HIGH RESOLUTION HARD X-RAY BIOIMAGING FACILITY AT SSRL P. Pianetta*, J. Andrews, S. Brennan, P. Pianetta*, J. Andrews, S. Brennan E. Almeida, E. Almeida M. van der Meulen, M. van der Meulen Tkachuk , J. Gelb, J. Rudati, M. Feser, W. Yun, Tkachuk , J. Gelb, J. Rudati, M. Feser, W. Yun |
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SCREENING TOYS AND CONSUMER GOODS WITH HANDHELD XRF Stanislaw Piorek, Stanislaw Piorek |
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Mg-based multilayer XRF analyzers with two- and three-layers structure design Y. Platonov*, J. Rodriguez, G. Fournier, Y. Platonov*, J. Rodriguez, G. Fournier K. Shimizu, K. Shimizu |
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ISSUES, TRANSITIONS AND COLLABORATIONS ASSOCIATED WITH USE OF HAND-HELD XRF IN NATURAL HISTORY MUSEUMS C. Podsiki, C. Podsiki |
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Synchrotron XRF and PIXE Analyses of Element Distribution in Fossilized Sauropod Dinosaur Bones Anke R. Pyzalla, Anke R. Pyzalla Maitena Dumont, Maitena Dumont Norbert Zoeger, Norbert Zoeger Christina Streli, Christina Streli Peter Wobrauschek, Peter Wobrauschek Martin Sander, Martin Sander |
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BENEFITS OF IMPROVED RESOLUTION FOR EDXRF R. Redus, T. Pantazis, J. Pantazis, A. Huber, R. Redus, T. Pantazis, J. Pantazis, A. Huber B. Cross, B. Cross |
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DOSAGE OF SILICA IN POLYMERS BY X-RAY FLUORESCENCE P. Ricou, S. Kodjie, X. Shen, P. Ricou, S. Kodjie, X. Shen |
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DETERMINATION OF ACTIVATION ENERGY IN TEXTURED METAL-METAL MULTILAYER FILMS VIA 2D XRD Mark A. Rodriguez*, David P. Adams, Ralph G. Tissot, Mark A. Rodriguez*, David P. Adams, Ralph G. Tissot |
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WAVELET ANALYSIS OF X-RAY DIFFRACTION SIGNAL FROM MEASUREMENTS OF STRESS AND AUSTENITE George, Roy, George, Roy |
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HANDHELD XRF FOR ARCHAEOMETALLURGICAL STUDIES: IN-SITU ALLOY AND METAL ANALYSIS OF A PRIVATE SWORD COLLECTION J. Feuer*, T. Turner, K. Russell, J. Feuer*, T. Turner, K. Russell |
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SANDRA: A PORTABLE XRF SYSTEM FOR NON DESTRUCTIVE STUDIES OF MEXICAN CULTURAL HERITAGE J.L. Ruvalcaba, J.L. Ruvalcaba |
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HIGH-RESOLUTION XRF IN 35-60 KEV:-LANTHANIDES’ K-SPECTRA M. Mizusawa, K. Sakurai, M. Mizusawa, K. Sakurai Y. Terada, Y. Terada |
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REALTIME XRF AND XRD IMAGING –THE INSTRUMENTATION AND THE APPLICATIONS K. Sakurai, K. Sakurai |
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PORTABLE FIELD XRD/XRF INSTRUMENT: APPLICATION TO THE STUDY OF MARS ANALOG MATERIALS P. Sarrazin, W.Brunner, P. Sarrazin, W.Brunner D. Blake, D. Blake M. Gailhanou, M. Gailhanou D. L. Bish, D. L. Bish D.Vaniman, D.Vaniman S. Chipera, S. Chipera |
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A STUDY ON TNE TOTAL EVALUATION OF PHARMANOCEUTICAL PRODUCTS USING GENERAL PURPOSE XRD EQUIPMENT Miho Sasaki*, Tomikatsu Kubo, Akira Kishi, Miho Sasaki*, Tomikatsu Kubo, Akira Kishi |
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X-RAY PROBE ANALYSES OF COMPLICATED PRECIPITATES FORMED IN COPPER-BASE ALLOYS S.Sato*, Y.Takahashi, T.Sanada, S.Sato*, Y.Takahashi, T.Sanada K.Shinoda, K.Wagatsuma, S.Suzuki, K.Shinoda, K.Wagatsuma, S.Suzuki |
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APPLICATION OF 2-DIMENSIONAL XRD FOR THE CHARACTERIZATION OF MICROSTRUCTURE OF SELF-LEVELING COMPOUNDS (SLC) S. Seifert*, J. Neubauer, F. Goetz-Neunhoeffer, S. Seifert*, J. Neubauer, F. Goetz-Neunhoeffer H. Motzet, H. Motzet |
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NEW S2 PICOFOX BENCHTOP TXRF A. Seyfarth, M. Rider, A. Seyfarth, M. Rider H. Stosnach, A. Gross, H. Stosnach, A. Gross |
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ROHS COMPLIANCE IN PAINTS AND RESINS A. Seyfarth, A. Seyfarth A. Buehler, K. Behrens, A. Buehler, K. Behrens J. Sardisco, J. Sardisco |
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The Rietveld Refinement of The Rare Earth Orthoborates S. Seyyidoglu, S. Seyyidoglu A. Yilmaz, A. Yilmaz |
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DEVELOPMENT OF SOIL STANDARD MATERIALS CONTAINING HAZARDOUS METALS FOR X-RAY FLUORESCENCE ANALYSIS Y. Shibata*, J. Suyama, M. Kitano, T. Nakamura, Y. Shibata*, J. Suyama, M. Kitano, T. Nakamura |
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XRF DETECTION OF HEAVY METAL PESTICIDES IN ARCHAEOLOGICAL AND ANTHROPOLOGICAL ARTIFACTS. |
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2008 dxc abstract second, poster yuming si, yuming si |
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IN-SITU CHARACTERISATION OF NOVEL FUEL CELL MATERIALS Stephen J. Skinner, Stephen J. Skinner |
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AUTOMATED PICOLITER SOLUTION DEPOSITION FOR TXRF ANALYSIS OF SEMICONDUCTOR SAMPLES Chris M. Sparks*, Chris M. Sparks* Ursula Fittschen, George Havrilla, Ursula Fittschen, George Havrilla |
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RADIOISOTOPE RH-101 AS X-RAY SOURCE FOR INSTRUMENTS ON SPACE MISSIONS C. Stenzel, C. Stenzel C. Schroer, C. Schroer B. Lengeler, B. Lengeler R. Vianden, R. Vianden |
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ANALYSIS OF PLATINUM GROUP ELEMENTS (PGE) BY MEANS OF TOTAL REFLECTION X-RAY FLUORESCENCE (TXRF) SPECTROMETRY H., Stosnach, H., Stosnach |
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SAMPLE MORPHOLOGY: INFLUENCE ON TOTAL REFLECTION X-RAY FLUORESCENCE ANALYSIS Christine Horntrich, Christine Horntrich Florian Meirer, Florian Meirer Christina Streli*, Christina Streli* Peter Wobrauschek, Peter Wobrauschek nobert Zoeger, nobert Zoeger Giancarlo Pepponi, Giancarlo Pepponi |
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MICRO X-RAY FLUORESCENCE SPECTROMETER FOR LIGHT ELEMENT ANALYSIS WITH LOW POWER TUBE EXCITATION Stefan Smolek, Stefan Smolek Norbert Zoeger, Norbert Zoeger Christina Streli*, Christina Streli* Peter Wobrauschek, Peter Wobrauschek florian Meirer, florian Meirer |
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TABLETOP SPECTROMETER FOR GRAZING INCIDENCE XRF Norbert Zoeger, Norbert Zoeger Dieter Ingerle, Dieter Ingerle Christina Streli*, Christina Streli* Florian Meirer, Florian Meirer Peter Wobrauschek, Peter Wobrauschek giancarlo Pepponi, giancarlo Pepponi |
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GRAZING-EXIT-XRF EXPERIMENTS AT HASYLAB BEAMLINE L Florian Meirer, Florian Meirer Giancarlo Pepponi, Giancarlo Pepponi Christina Streli*, Christina Streli* Peter Wobrauschek, Peter Wobrauschek nobert Zoeger, nobert Zoeger |
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RESEARCH IN THE IDENTIFICATION AND PROVENANCING OF 20TH CENTURY PHOTOGRAPHS D.C. Stulik, A. Kaplan, D.C. Stulik, A. Kaplan D. Miller, D. Miller |
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HIGH-PERFORMANCE SILICON STRIP DETECTOR FOR IN-HOUSE XRD SYSTEM T. Taguchi, H. Toraya, M. Kuribayashi, T. Taguchi, H. Toraya, M. Kuribayashi P. Grybos, R. Szczygiel, P. Maj, P. Grybos, R. Szczygiel, P. Maj |
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NANOSTRUCTURE ANALYSIS OF METALLIC MATERIALS BY COHERENT X-RAY DIFFRACTION MICROSCOPY Y. Takahashi, H. Furukawa, H. Kubo, K. Yamauchi, Y. Takahashi, H. Furukawa, H. Kubo, K. Yamauchi Y. Nishino, T. Ishikawa, Y. Nishino, T. Ishikawa E. Matsubara, E. Matsubara |
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HARD X-RAY FULL FIELD 3D IMAGING WITH sub-50 nm RESOLUTION A. Tkachuk, M. Feser, F. Duewer, J. Gelb, G. Hsu, S. Wang, Wenbing Yun, A. Tkachuk, M. Feser, F. Duewer, J. Gelb, G. Hsu, S. Wang, Wenbing Yun |
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NEW HIGH-PERFORMANCE DEVICE FOR PARALLEL-BEAM X-RAY DIFFRACTOMETER SCAN Hideo Toraya, Hideo Toraya |
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APPLICATIONS OF POLYCAPILLARY OPTICS TO MICRO AND TWO DIMENSIONAL XRF ANALYSIS K.Tsuji, A. Matsuda, K. Nakano, K.Tsuji, A. Matsuda, K. Nakano K. Nakano, K. Nakano S. Komatani, S. Ohzawa, H. Uchihara, S. Komatani, S. Ohzawa, H. Uchihara |
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SAMPLE PREPARATION FOR TOTAL-REFLECTION X-RAY FLUORESCENCE ANALYSIS OF BLOOD SAMPLES K. Tsuji, H. Matsui, M. Hino, H. Wanibuchi, K. Tsuji, H. Matsui, M. Hino, H. Wanibuchi H. Kohno, K. Aranami, Y. Shimizu, T. Yamada, H. Kohno, K. Aranami, Y. Shimizu, T. Yamada |
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LONG-RANGE SCANS AND MANY-BEAM EFFECTS FOR HIGH-RESOLUTION X-RAY DIFFRACTION FROM MULTILAYERED STRUCTURES T.A. Ulyanenkova, T. Baumbach, T.A. Ulyanenkova, T. Baumbach A.I. Benediktovich, I. Feranchuk, A.I. Benediktovich, I. Feranchuk A. Ulyanenkov, A. Ulyanenkov |
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QUANTITATIVE ANALYSIS OF NANO-PARTICLE BY XRF T. Utaka, N. Kawada, K. Taniguchi, T. Utaka, N. Kawada, K. Taniguchi S. Maeo, M. Kurakado, S. Maeo, M. Kurakado Y. Araki, K. Muraoka, T. Itoh, Y. Araki, K. Muraoka, T. Itoh |
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CHARACTERIZATION OF NANOMATERIALS FOR LASER FUSION TARGETS T. van Buuren, T. Willey, S. Kucheyev, C. Saw, T. Baumann, A. Hamza, T. van Buuren, T. Willey, S. Kucheyev, C. Saw, T. Baumann, A. Hamza J. Ilavsky, J. Ilavsky A. Nikroo, A. Nikroo |
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FORMATION OF NOVEL OXIDE NANOSTRUCTURES Z.L. Wang, Z.L. Wang |
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NATURAL NANOPARTICLE SHAPE, STRUCTURE, PROPERTIES AND REACTIVITY FROM X-RAY STUDIES G.A. Waychunas*, B. Gilbert, G.A. Waychunas*, B. Gilbert H. Zhang, Y.-S. Jun, J.F. Banfield, H. Zhang, Y.-S. Jun, J.F. Banfield C. Kim, C. Kim |
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FLEXIBILITY AND HIGH THROUGHPUT: SUPPORTING SAXS USERS AT A JOINT INDUSTRIAL ACADEMIC BEAMLINE. S. Weigand*, D.T. Keane, S. Weigand*, D.T. Keane |
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PROBING THIN-LAYERED AND NANO-STRUCTURED MATERIALS - X-RAY SCATTERING TOOLS Joachim F. Woitok, Joachim F. Woitok |
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RADIOACTIVE SAMPLE EFFECTS ON EDXRF SPECTRA Christopher G. Worley, Christopher G. Worley |
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NANODIFFRACTION FROM PERFECT/WEAKLY-DEFORMED SINGLE CRYSTALS H. Yan, H. Yan O. Kalenci, C. Noyan, O. Kalenci, C. Noyan C. Murray, C. Murray J. Maser, J. Maser |
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THE X-RAY DIFFRACTION CHARACTERISTICS OF DIFFERENT MATERIALS Yiliang Zhang*, Jinyan Liu, Xuedong Xu, Yiliang Zhang*, Jinyan Liu, Xuedong Xu |
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In situ study of crystallization from amorphous to cubic zirconium oxide: Rietveld and Reverse Monte Carlo Analyses Feng Zhang, Siu Lun Alan Lui, Siu-Wai Chan, Feng Zhang, Siu Lun Alan Lui, Siu-Wai Chan Peter J. Chupas, Peter L. Lee, Peter J. Chupas, Peter L. Lee Jonathan C. Hanson, Wolfgang A, Caliebe, Jonathan C. Hanson, Wolfgang A, Caliebe |
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Ultra-Small-Angle X-ray Scattering (USAXS) Imaging, Contrast Mechanism and Applications F. Zhang*, G. G. Long, J.Ilavsky, P. R. Jemian, F. Zhang*, G. G. Long, J.Ilavsky, P. R. Jemian L. E. Levine, L. E. Levine |