166 of 2008 DXC abstracts sorted by correspondent author's last name

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ADDRESSING CHALLENGES IN MATERIALS ENGINEERING AND BIOTECHNOLOGY THROUGH COMBINED SAXS AND SANS MEASUREMENTS
Andrew J. Allen, Andrew J. Allen
PROBING THE MICRO-MECHANICAL BEHAVIOR OF BONE VIA HIGH-ENERGY X-RAYS
Jonathan Almer, Jonathan Almer
Stuart Stock, Stuart Stock
ANALYSIS OF ELEMENTS IN ENVIRONMENTAL SAMPLES BY MICRO-XRF
Y. Araki, Y. Araki
S. Maeo, M. Krämer, S. Maeo, M. Krämer
T. Utaka and K. Taniguchi, T. Utaka and K. Taniguchi
X-RAY DIFFRACTOMETRIC DETERMINATION OF CHRYSOTILE ASBESTOS IN BUILDING MATERIALS WITH RIETVELD REFINEMENT
T. Asahi*, S. Kobayashi, T. Matsudaira, K. Nakayama, M. Kitano, T. Nakamura, T. Asahi*, S. Kobayashi, T. Matsudaira, K. Nakayama, M. Kitano, T. Nakamura
Simultaneous Determination of Main, Minor and Trace Elements in Fertilizers by Total Reflection X-Ray Fluorescence
R.E. Ayala-Jimenez*, C.H. Alvarado, R.E. Ayala-Jimenez*, C.H. Alvarado
Thin Film Technology for Preparation of X-ray Waveguide-Resonators
E.V. Egorov, V.K. Egorov, E.V. Egorov, V.K. Egorov
R.E. Ayala-Jiménez, R.E. Ayala-Jiménez
M.S. Afanas’ev, M.S. Afanas’ev
PRECONCENTRATION, QUANTITATION, AND SPECIATION OF SUB-PPM LEVELS OF ARSENIC (III) AND (V) IN WATER VIA HAND-HELD XRF
P.E. Baker*, R. Johnson, P.T. Palmer, P.E. Baker*, R. Johnson, P.T. Palmer
R.R. Jacobs, R.R. Jacobs
HEALTHY PHARMACEUTICAL DRUGS – CONTROL OF IMPURITIES IN ACTIVE PHARMACEUTICAL INGREDIENTS BY EDXRF
K. Behrens, A. Scothern, H. Ress, K. Behrens, A. Scothern, H. Ress
A. Seyfarth, A. Seyfarth
LinkIn – THE WAY TO BETTER RESULTS
K. Behrens, K. Behrens
L. Arias, A. Seyfarth, L. Arias, A. Seyfarth
EXPANDING THE ANALYTICAL RANGE OF WDXRF - NEW XRF ANALYZER CRYSTALS
K. Behrens, K. Behrens
A. Seyfarth, A. Seyfarth
IRON ORE ANALYSIS A NEW APPROACH FOR NEW REQUIREMENTS
K. Behrens, K. Behrens
A. Seyfarth, A. Seyfarth
TURN-KEY SOLUTIONS WITH INTEGRATED FLEXIBILITY FROM PACKAGE TO REAL SOLUTION
K. Behrens, K. Behrens
K. Roscoe, A. Seyfarth, K. Roscoe, A. Seyfarth
NEW DEVELOPMENT FOR THE AUTOMATION OF BORATE FUSION SAMPLE PREPARATION FOR XRF
L. Bérubé, L. Bérubé
Analysis of focused beam powder x-ray diffraction using curved crystal optics
Ayhan Bingölbali and C. A. MacDonald, Ayhan Bingölbali and C. A. MacDonald
CHARACTERIZATION OF ZnSe FILMS DEPOSITED ON (100) GaAs USING CONVENTIONAL AND HIGH RESOLUTION DIFFRACTOMETERS
T.N. Blanton, C.L. Barnes, M. Holland, K.B. Kahen, T.N. Blanton, C.L. Barnes, M. Holland, K.B. Kahen
V. Gupta, F.Bai, V. Gupta, F.Bai
Choosing XRF for RoHS Applications
Jame R. Bogert, Jame R. Bogert
OPTIMIZING THE BALANCE OF QUALITY AND TURNAROUND TIME FORA PROCESS CONTROL XRF LABORATORY
S.W. Bowe, S.W. Bowe
EVALUATION OF X-RAY FLUORESCENCE SPECTROMETERS FOR POSSIBLE IMPLEMENTATION IN A MANFACTURING LABORATORY – METALS IN ALUMINA
L.L. Brehm, D.W. Burns, L.L. Brehm, D.W. Burns
XRF AND XRD ANALYSIS OF CONVERTED LEAD PIGMENT ON A GEORGIA O’KEEFE PASTEL DRAWING
Lynn B. Brostoff, Lynn B. Brostoff
Catherine Maynor, Catherine Maynor
R. Jeff Speakman, R. Jeff Speakman
XAFS STUDIES OF NANOSYSTEMS: HOW X-RAY, ELECTRON MICROSCOPY, AND OPTICAL TECHNIQUES EACH CONTRIBUTE TO STRUCTURAL CHARACTERIZATION
B. A. Bunker, B. A. Bunker
ELEMENTAL ANALYSIS OF POLYOFELINS BY X-RAY FLUORESCENCE USING CHARACTERIZED POLYMER STANDARDS
Donald W. Burns, Donald W. Burns
Terri L. Lewis, Terri L. Lewis
Tammy Bradley, Tammy Bradley
Towhid Hasan, Towhid Hasan
Ward Rigot, Ward Rigot
Fran Franklin, Fran Franklin
ANALYSIS OF SHEAR STRESS DISTRIBUTION IN AL (CU) INTERCONNECTS INDUCED BY ELECTROMIGRATION BASED ON SCHMIDT’S LAW AND STUDIED BY SYNCHROTRON POLYCHROMATIC X-RAY MICRODIFFRACTION
K. Chen*, K. Chen*
N. Tamura, B. C. Valek, N. Tamura, B. C. Valek
K. N. Tu, K. N. Tu
SMALL SPOT MONOCHROMATIC BEAMS FOR XRD APPLICATIONS USING DOUBLY CURVED CRYSTAL OPTICS AND LOW POWER SOURCES
Danhong Li, Z. W. Chen, Danhong Li, Z. W. Chen
High Sensitivity, Low Power, Grazing Incidence X-Ray Fluorescence Analyzer for Remote, In Situ, Groundwater Analysis
K. Xin, B. Gallagher, Z. W. Chen, A. Verchinine, N. Gao, F. Wei, D. Li, M. Cusack, S. Madison, K. Xin, B. Gallagher, Z. W. Chen, A. Verchinine, N. Gao, F. Wei, D. Li, M. Cusack, S. Madison
3-D TOMOGRAPHIC STUDIES OF ANNEALED NANOPOROUS GOLD USING TRANSMISSION X-RAY MICROSCOPE (TXM) AT ADVANCED PHOTON SOURCE
Y.-c. Chen, Q. Shen, Y.-c. Chen, Q. Shen
PORTABLE XRD/XRF INSTRUMENTATION FOR THE STUDY OF WORKS OF ART
G. Chiari, G. Chiari
P. Sarrazin, P. Sarrazin
M. Gailhanou, M. Gailhanou
PHASE TRANSFORMATION AND STRUCTURAL BEHAVIOR STUDIES OF Li-BASED HYDRIDES AFTER PRESSURE HYDRIDING/DE-HYDRIDING CYCLING
Wen-Ming Chien, Joshua H. Lamb and Dhanesh Chandra, Wen-Ming Chien, Joshua H. Lamb and Dhanesh Chandra
X-RAY DIFFRACTION AND HIGH PRESSURE STUDIES ON ORGANIC THERMAL ENERGY STORAGE MATERIALS – TRIS(HYDROXYMETHYL) AMINOMETHANE (TRIS)
W.-M. Chien, V.K. Kamisetti, J.C. Fallas, E.D. Emmons, D. Chandra, A.M. Covington, W.-M. Chien, V.K. Kamisetti, J.C. Fallas, E.D. Emmons, D. Chandra, A.M. Covington
R.S. Chellappa, R.S. Chellappa
M. Kunz, S. Clark, M. Kunz, S. Clark
BIFOCAL MINIATURE TOROIDAL X-RAY MIRRORS
Sterling Cornaby, Sterling Cornaby
Detlef Smilgies , Detlef Smilgies
Donald Bilderback, Donald Bilderback
Study of combustion syntheses by time-resolved X-ray diffraction: Comparison of synthesis mechanisms for different combustion modes
C. Curfs, J. Wright, G.B.M. Vaughan, C. Curfs, J. Wright, G.B.M. Vaughan
H. Boutefnouchet, H. Boutefnouchet
NEW DEVELOPMENT IN LITHIUM BORATE FUSION FOR FERROALLOYS
Philippe Daigle, Philippe Daigle
A TOP-DOWN APPROACH USING X-RAY IMAGING TECHNIQUES: INSTRUMENTAL DEVELOPMENTS AND APPLICATIONS IN LIFE SCIENCE
B. De Samber, T. Schoonjans, G. Silversmit, B. Vekemans, L. Vincze, R. Evens, K. De Schamphelaere, C. Janssen,B. Masschaele, L. Van Hoorebeke, B. De Samber, T. Schoonjans, G. Silversmit, B. Vekemans, L. Vincze, R. Evens, K. De Schamphelaere, C. Janssen,B. Masschaele, L. Van Hoorebeke
S. Bohic, S. Bohic
K. Rickers, G. Falkenberg, K. Rickers, G. Falkenberg
USAGE OF PROBABILITY SCORING TO SORT XRPD SCANS OF DYING PROTEIN ON SIMILARITY
Thomas Degen, Thomas Degen
Irene Margiolaki, Jonathan P. Wright, Irene Margiolaki, Jonathan P. Wright
USING FOCUSED HARD X-RAYS FOR INVESTIGATIONS RELATED TO NUCLEAR WASTE DISPOSAL
M.A. Denecke, M.A. Denecke
APPLICATIONS OF POLARIZED EDXRF SYSTEM FOR LIGHT MATRIX SAMPLES
T. Nakamura, T. Moriyama, M. Doi, H. Kohno, T. Nakamura, T. Moriyama, M. Doi, H. Kohno
H. Inoue, H. Inoue
AN INNOVATIVE EDXRD PROBE
Charles M. Dozier, Charles M. Dozier
Noureddine Anibou, Noureddine Anibou
KINETICS OF PARTICLE GROWTH FOR SUPPORTED PT AND PT/PD DETERMINED USING HTXRD
A.R. Drews* and R.J. Kudla, A.R. Drews* and R.J. Kudla
IMPROVING TRACE ELEMENT DETECTION IN EDXRF BY REDUCING PILEUP ARTIFACTS
W. T. Elam*, Bruce Scruggs, Michael Solazzi, and Joseph Nicolosi, W. T. Elam*, Bruce Scruggs, Michael Solazzi, and Joseph Nicolosi
STUDY ON THE X-RAY DIFFRACTION BEHAVIOR OF A BIG CRYSTAL GRAIN IN ORIENTED 3% SILICON STEEL
J. F. Fang*, Zh.L.Tian, J. Huo, J.Y. Zhang, Y. Zhang, J. F. Fang*, Zh.L.Tian, J. Huo, J.Y. Zhang, Y. Zhang
DEVELOPMENT OF A NOVEL MULTI-ELEMENT SILICON DRIFT DETECTOR ARRAY
L. Feng, V. D. Saveliev, C. R. Tull, S. Barkan, M. Takahashi, E.V. Damron, L. Feng, V. D. Saveliev, C. R. Tull, S. Barkan, M. Takahashi, E.V. Damron
ULTRAFAST X-RAY FULL-FIELD MICRO-IMAGING OF TRANSIENT FLUID DYNAMICS
Kamel Fezzaa, Kamel Fezzaa
PICOLITER DEPOSITION FOR MXRF CALIBRATION AND QUANTIFICATION USING PROTOTYPE THERMAL INKJET TECHNOLOGY
George J. Havrilla, George J. Havrilla
POSSIBILITIES AND LIMITATIONS OF X-RAY DIFFRACTION USING HIGH ENERGY X-RAYS ON A LABORATORY SYSTEM
Hans te Nijenhuis, Milen Gateshki and Martijn Fransen, Hans te Nijenhuis, Milen Gateshki and Martijn Fransen
RESIDUAL STRESSES AFTER CMP ON THIN FILMS
Wei-En Fu, Wei-En Fu
Meng-Ke Chen, Meng-Ke Chen
Chao-Chang A. Chen, Chao-Chang A. Chen
LATEST DEVELOPMENTS OF ADVANCED X-RAY OPTICS AND THEIR APPLICATIONS IN X-RAY MICROANALYSIS
Ning Gao, Ning Gao
Zewu Chen, Zewu Chen
Igor Ponomarev, Igor Ponomarev
Yejun He, Yejun He
Walter M. Gibson, Walter M. Gibson
MCLLS Approach to EDXRF Analysis on XOS Devices
Robin P. Gardner, Robin P. Gardner
Fusheng Li, Fusheng Li
Zewu Chen, Zewu Chen
Matthew Cusack, Matthew Cusack
X-RAY FLUORESCENCE OF A MEDIEVAL MOSAN RELIQUARY OF SAINT AMANDUS
J. Giaccai, J. Giaccai
HIGH-DEFINITION X-RAY FLUORESCENCE: PRINCIIPLES AND APPLICATIONS
Walter M. Gibson, Walter M. Gibson
Danhong Li, Danhong Li
Huapeng Huang, Huapeng Huang
Zewu Chen, Zewu Chen
New analytical expression of the threshold limit of the mixing prameter of pseudo-Voigt function
Khereddine Yazid, Bradai Djamel, Khereddine Yazid, Bradai Djamel
CULTURAL HERITAGE STUDIES WITH HIGH-ENERGY X-RAYS AT THE APS 1-ID BEAMLINE
D. R. Haeffner*, J. D. Almer, D. R. Haeffner*, J. D. Almer
F. Casadio, F. Casadio
D. C. Dunand, D. C. Dunand
B. D. Newbury, B. D. Newbury
M. L. Young, M. L. Young
IN SITU HEATING STUDIES ON THE INTERNAL STRESSES OF MULTILAYER ENVIRONMENTAL BARRIER COATINGS
Bryan J Harder*, Bryan J Harder*
Katherine T Faber, Katherine T Faber
Jon Almer, Jon Almer
Kang N Lee, Kang N Lee
X-RAY DIFFRACTOMETRY WITH A MICROFOCUS SOURCE
B. Hasse*, C. Michaelsen, B. Hasse*, C. Michaelsen
U. Preckwinkel, H. Cordes, N. Yang, U. Preckwinkel, H. Cordes, N. Yang
STATE-OF-THE-ART MULTILAYER OPTICS FOR DIFFRACTOMETRY
B. Hasse*, C. Michaelsen, A. Oehr, F. Hertlein, S. Kroth, B. Hasse*, C. Michaelsen, A. Oehr, F. Hertlein, S. Kroth
APPLICATIONS OF CONFOCAL MICRO X-RAY FLUORESCENCE 3-DIMENSIONAL ELEMENTAL IMAGING
Brian M. Patterson, Brian M. Patterson
SEARCHING FOR PURE TIN ON ELECTRONIC COMPONENTS:TIN WHISKER PREVENTION
Martin Sweet, Martin Sweet
HEAVY METAL ANALYSIS OF WATER SAMPLES DOWN TO SUB-PPB LEVEL BY USING X-RAY FLUORESCENCE ANALYSIS COMBINED WITH THE CONCENTRATION TECHNIQUES
S. Hayakawa, M. Iwaki, Y. Nishimoto, K. Yamane and T. Hirokawa, S. Hayakawa, M. Iwaki, Y. Nishimoto, K. Yamane and T. Hirokawa
MICROFOCUS LIQUID-METAL-JET X-RAY TUBES AND APPLICATIONS
O. Hemberg*, M. Otendal , O. Hemberg*, M. Otendal
T. Tuohimaa, H.M. Hertz, T. Tuohimaa, H.M. Hertz
INVESTIGATION OF CO-CRYSTALLIZED PHARMACEUTICAL INGREDIENTS USING SYNCHROTRON RADIATION
M. Herrmann, U. Förter-Barth, H. Kröber, P.B. Kempa, M. Herrmann, U. Förter-Barth, H. Kröber, P.B. Kempa
S. Doyle, S. Doyle
QUANTITATIVE IN-SITU X-RAY DIFFRACTION ANALYSIS OF EARLY HYDRATION OF PORTLAND CEMENT AT DEFINED TEMPERATURES
Christoph Hesse, Christoph Hesse
Friedlinde Goetz-Neunhoeffer, Friedlinde Goetz-Neunhoeffer
Juergen Neubauer, Juergen Neubauer
Michael Braeu, Michael Braeu
Peter Gaeberlein, Peter Gaeberlein
Mathias Degenkolb, Mathias Degenkolb
PULSED LASER DEPOSITION TECHNIQUE FOR THE SYNTHESIS OF NANOSTRUCTURES
J.-I. Hong, M. Kirkham, J. Bae, Z.L. Wang, R.L. Snyder, J.-I. Hong, M. Kirkham, J. Bae, Z.L. Wang, R.L. Snyder
HIGH VOLUME SCRAP MATERIAL SORTING USING XRF
E. Brown, D. Carolan, X. Chen, J. Egan, B. Hubbard-Nelson, R. Nasella, I. Rosmarin, R. Russell, D. Sackett, C. Weaver, E. Brown, D. Carolan, X. Chen, J. Egan, B. Hubbard-Nelson, R. Nasella, I. Rosmarin, R. Russell, D. Sackett, C. Weaver
Finding an Element Tracer for use in the Early Detection of 4 ˝ bearing Failure in J52P408 Engines by EDXRF
G.R. Humphrey, G.R. Humphrey
QUANTITATIVE MEASUREMENT OF NANOPARTICLE HALO FORMATION AROUND COLLOIDAL MICROSPHERES IN BINARY MIXTURES USING SMALL-ANGLE X-RAY SCATTERING
J. Ilavsky*, F. Zhang, G. G. Long, P. R. Jemian, J. Ilavsky*, F. Zhang, G. G. Long, P. R. Jemian
V. T. Milam, V. T. Milam
J. A. Lewis, J. A. Lewis
Determination of Crystallographic Polarity of Thin Films using High Resolution XRD
FDA REGULATORY APPLICATIONS OF FIELD PORTABLE EDXRF
R.M.Jacobs, R.M.Jacobs
P. T. Palmer, P. T. Palmer
Residual Stress Analysis of Non-Polar GaN Epi-layers by GIXRD
Y.-i. Jang, K.-h. Park, Y.-i. Jang, K.-h. Park
S.-r. Cho, H.-k. Kwon, S.-r. Cho, H.-k. Kwon
DISCOVERY OF A HIDDEN VAN GOGH PAINTING BY MEANS OF HIGH-ENERGY XRF MAPPING
J. Dik, J. Dik
K. Janssens, K. Janssens
G. Van der Snickt, G. Van der Snickt
L. Van der Loeff, L. Van der Loeff
COMBINED MICRO-XRF/XRPD TOMOGRAPHY FOR THE CHARACTERIZATION OF FeCrAlY-FOAM-BASED CATALYSTS
K. Janssens, W. De Nolf, K. Janssens, W. De Nolf
F. Basile, P. Benito, S. Bugani, G. Fornasari, L. Morselli, E. Scavetta, D. Tonelli, A. Vaccari, F. Basile, P. Benito, S. Bugani, G. Fornasari, L. Morselli, E. Scavetta, D. Tonelli, A. Vaccari
MEASUREMENT CONDITIONS FOR QUANTITATIVE ANALYSIS USING THE RIETVELD METHOD
E. Kagami, A. Takase, E. Kagami, A. Takase
THE YIN AND YAN OF XRF ANALYSIS AS A TOOL IN THE INVESTIGATION OF CULTURAL HERITAGE WORKS
BJKaiser, BJKaiser
ANALYSIS OF ORES AND CONCENTRATES BY USING BENCHTOP WDXRF
Y. Kataoka, H. Homma, Y. Yamada, H. Kohno, Y. Kataoka, H. Homma, Y. Yamada, H. Kohno
H. Inoue, H. Inoue
La/Lb INTENSITY RATIO DEPENDS ON THE SPECTROMETER RESOLUTION
Jun Kawai, Ryosuke Shioi, Nobuharu Sasaki, Kenji Okada, Goro Kinugawa, Shinsuke Kunimura, Takashi Yamamoto, Jun Kawai, Ryosuke Shioi, Nobuharu Sasaki, Kenji Okada, Goro Kinugawa, Shinsuke Kunimura, Takashi Yamamoto
Local Residual Stresses and Thermal Fatigue in CrN Coatings on Steel Characterized by High-Temperature Synchrotron X-ray Diffraction
K.J. Martinschitz, K.J. Martinschitz
Ch. Kirchlechner, Ch. Kirchlechner
R. Daniel, R. Daniel
Ch. Mitterer, Ch. Mitterer
J. Keckes, J. Keckes
High-Temperature Characterization of Three-Dimensional Distribution of Residual Stresses in CrN Coatings on Steel
K.J. Martinschitz, K.J. Martinschitz
Ch. Kirchlechner, Ch. Kirchlechner
R. Daniel, R. Daniel
Ch. Mitterer, Ch. Mitterer
J. Keckes, J. Keckes
QUANTITATIVE DETERMINATION OF ASBESTOS IN BULK INSULATION BY XRD
D.S. Kendall*, R.A. Martinez, D.S. Kendall*, R.A. Martinez
IN-SITU XRD ANALYSIS OF THE GROWTH OF ZnO NANOWIRES
M Kirkham, M Kirkham
Z L Wang, Z L Wang
R L Snyder, R L Snyder
DETECTORS FOR DEMANDING X-RAY DIFFRACTION
K. Knorr*, B. Hinrichsen, G. Vanhoyland, K. Knorr*, B. Hinrichsen, G. Vanhoyland
A NEW HIGH-THROUGHPUT SAXS SCREENING TOOL
P. Kotnik, H. Schnablegger, P. Kotnik, H. Schnablegger
G. Langenbucher, G. Langenbucher
Automated SAXS Measurements of Protein Solutions with a Laboratory Based SAXS System
M. Kriechbaum*, P. Laggner, P. Herrnegger, M. Kriechbaum*, P. Laggner, P. Herrnegger
GRAIN GROWTH AND TEXTURE SHARPENING IN COPPER, NICKEL AND PALLADIUM THIN FILMS, INVESTIGATED BY NON-AMBIENT X-RAY DIFFRACTION MEASUREMENTS
Yener, Kuru, Yener, Kuru
Markus, Wohlschlögel, Markus, Wohlschlögel
Udo, Welzel, Udo, Welzel
Eric, Mittemeijer, Eric, Mittemeijer
SYNTHESIS, STRUCTURAL AND CHEMICAL CHARACTERIZATION OF Ca(HO3PCH2)2-N(H)-(CH2)6-N(H)-(CH2PO3H)2•2H2O
L. Leon-Reina*, L. Leon-Reina*
A. Cabeza, R.M.P. Colodrero, M.A.G. Aranda, A. Cabeza, R.M.P. Colodrero, M.A.G. Aranda
E. Barouda, K.D. Demadis, E. Barouda, K.D. Demadis
TISSUE ELEMENTAL MAPPING USING HDXRF WITH DOUBLY CURVED CRYSTALS
Danhong Li, Zewu Chen, Danhong Li, Zewu Chen
Arnulf Koeppen, Susan Michael, Arnulf Koeppen, Susan Michael
STRUCTURE AND KINETICS OF SELF-ASSEMBLED NANOCYRSTAL SYSTEMS PROBED BY SMALL ANGLE X-RAY SCATTERING TECHNIQUES
X.-M. Lin, J. Wang, X.-M. Lin, J. Wang
ANCIENT WARRIORS AND THE ORIGIN OF CHINESE PURPLE
FURTHER STUDIES OF THE BORATE FUSION METHOD OF SAMPLE PREPARATION
M Loubser, M Loubser
P H van Rooyen, P H van Rooyen
J P R de Villiers, J P R de Villiers
Further studies of the Borate Fusion Method of Sample Preparation: The applications
Maggi Loubser* Peet H van Rooyen and Johan PR de Villiers, Maggi Loubser* Peet H van Rooyen and Johan PR de Villiers
FORENSICS APPLICATIONS OF X-RAY FLUORESCENCE MICROSCOPE.
Sergey Mamedov, Sergey Mamedov
Jon Goldey, Jon Goldey
George Setola, George Setola
Andrew Whitley, Andrew Whitley
XRF BY SIMULTANEOUS USE OF K- AND L-LINES OF AN ELEMENT
Michael Mantler*, Michael Mantler*
Burkhard Beckhoff, Burkhard Beckhoff
QUANTIFICATION OF RETAINED AUSTENITE IN ASTM A743 GRADE CA6NM CAST MARTENSITIC STAINLESS STEEL THROUGH X-RAY DIFFRACTION
J.V. Rojas Marín, A. Toro Betancur, J.V. Rojas Marín, A. Toro Betancur
THE SYNERGY OF XRD AND XRF IN A SHALE AND SLATE ANALYSIS
L.Fields*, M. Martin, L.Fields*, M. Martin
Mechanical Properties of Thin Films Characterized by a Combination of sin2ψ and X-ray Diffraction Substrate Techniques
K.J. Martinschitz, K.J. Martinschitz
J. Keckes, J. Keckes
A Novel Diffraction Technique to Determine Mechanical Moduli of Fibre-Textured Thin Films
K.J. Martinschitz, K.J. Martinschitz
J. Keckes, J. Keckes
CONFOCAL X-RAY FLUORESCENCE OF PAINTINGS: DECONSTRUCTING AN ATYPICAL 17TH C. COLLABORATION FROM ANTWERP, ASSESSING A 14TH C. CATALONIAN PANEL, AND IMAGING A LOST N.C. WYETH
Jennifer Mass, Jennifer Mass
Arthur Woll, Arthur Woll
Christina Bisulca, Christina Bisulca
Matt Cushman, Matt Cushman
Noelle Ocon, Noelle Ocon
NOVEL PROCESSING OF NICKEL CONTAINING CORDIERITE GLASS-CERAMICS FOR MICROPOROUS GAS SEPARATION MEMBRANES
Michelene E, Miller, Michelene E, Miller
Scott T. Misture*, Scott T. Misture*
X-RAY FLUORESCENCE (XRF) ANALYSIS OF HANFORD LOW ACTIVITY WASTE SIMULANTS: METHOD DEVELOPMENT
D.M. Missimer, A.R. Jurgensen, R.L. Rutherford, D.M. Missimer, A.R. Jurgensen, R.L. Rutherford
NANOSCALE PHOTOCATALYSTS DERIVED FROM LAYERED PHASES: FORMATION AND CHARACTERIZATION
E.J. Nichols, S.T. Misture, E.J. Nichols, S.T. Misture
STUDY OF MICROHETEROGENEITY USING µXRF, INAA, AND CHEMOMETRIC METHODS
J. L. Molloy*, J. R. Sieber, R. Zeisler, J. L. Molloy*, J. R. Sieber, R. Zeisler
Analysis of the Crystalline Structure and Magnetic Properties of Fe Nanoparticles
Todd C. Monson, Todd C. Monson
Dale L. Huber, Dale L. Huber
Judith M. Lavin, Judith M. Lavin
Valeri Petkov, Valeri Petkov
Yang Ren, Yang Ren
CHEMOMETRIC APPLICATIONS IN QUANTITATIVE X-RAY POWDER DIFFRACTION OF INTACT CONSOLIDATED SAMPLES
Michael D. Moore, Colleen Hair, Peter L.D. Wildfong, Michael D. Moore, Colleen Hair, Peter L.D. Wildfong
THE USE OF NET ANALYTE SIGNAL ORTHOGONALIZATION IN THE SEPARATION OF MULTI-COMPONENT DIFFRACTION PATTERNS OBTAINED FROM X-RAY POWDER DIFFRACTION OF INTACT COMPACTS
Michael D. Moore, Robert P. Cogdill, Steven M. Short, Colleen Hair, Peter L.D. Wildfong, Michael D. Moore, Robert P. Cogdill, Steven M. Short, Colleen Hair, Peter L.D. Wildfong
STRUCTURE ANALYSIS AND EXTINCTION COEFFICIENT OF PbSe COLLOIDAL NANOCRYSTALS
I. Moreels, D. De Muynck, F. Vanhaecke, Z. Hens, I. Moreels, D. De Muynck, F. Vanhaecke, Z. Hens
Applications of XRF in the Oil Industry
R.W. Morton, R.W. Morton
ANALYSIS OF HEAVY AND LIGHT ELEMENTS BY COMPACT X-RAY FLUORESCENCE SPECTROMETER
K. Muraoka, Y. Araki, T. Utaka, K. Taniguchi, K. Muraoka, Y. Araki, T. Utaka, K. Taniguchi
PARTICLE SIZE ANALYSIS OF SUB MICRON MATERIALS USING ULTRA SMALL ANGLE X-RAY SCATTERING
Keigo Nagao*, Takayuki Konya, Ryuji Matsuo, Yoshio Iwasaki, Keigo Nagao*, Takayuki Konya, Ryuji Matsuo, Yoshio Iwasaki
Preconcentration of the Environmental Water by Agar for XRF Analysis
Kazuhiko NAKANO, Kazuhiko NAKANO
Kenta OKUBO, Kenta OKUBO
Kouichi TSUJI, Kouichi TSUJI
Preparation of the Multi-Layered Plastic Reference Materials for Confocal 3D-Micro X-ray Fluorescence Analysis
Kazuhiko NAKANO, Kazuhiko NAKANO
Kouichi TSUJI, Kouichi TSUJI
DETERMINATION OF STRONTIUM CONCENTRATIONS IN CALCIUM-BASED GROUNDS WITH XRF & ICP-MS
C. Namowicz, M. Walton, K. Trentelman, C. Namowicz, M. Walton, K. Trentelman
X-RAY AND THERMAL ANALYSIS OF CEMENTS AND CONCRETE FOR EVALUATION OF CEMENT ADDITIVES AND CONCRETE ADMIXTURES
J.P. Nicolich, D.R. Brown, F.G. Serafin, U.B. Latosiewicz, J.H. Cheung, P.J. Sandberg, J.P. Nicolich, D.R. Brown, F.G. Serafin, U.B. Latosiewicz, J.H. Cheung, P.J. Sandberg
Expanding the Detector Efficiency of Silicon Drift Detectors with Optimized Radiation Entrance Window
A. Niculae*, H. Soltau, G. Lutz, P. Lechner, A. Bechteler, R. Eckhardt, K. Hermenau, A. Niculae*, H. Soltau, G. Lutz, P. Lechner, A. Bechteler, R. Eckhardt, K. Hermenau
O. Jaritschin, A. Liebel, A. Simsek, O. Jaritschin, A. Liebel, A. Simsek
G. Schaller, F. Schopper, L. Strüder, G. Schaller, F. Schopper, L. Strüder
Crystalline phase analysis and elemental analysis of alkali-washed fly ash and activated sludge ash
Atsushi, Atsushi
Masaru, Masaru
Toshihiro, Toshihiro
LARGE AREA SILICON DRIFT DETECTORS
A. Pahlke, T. Eggert, S. Pahlke, R. Stoetter, F. Wiest, A. Pahlke, T. Eggert, S. Pahlke, R. Stoetter, F. Wiest
X-RAY DIFFRACTION STUDY OF ANISOTROPIC STATE OF RESIDUAL STRESS AFTER DOWN-CUT AND UP-CUT FACE GRINDING
Zdenek Pala, Zdenek Pala
Nikolaj Ganev, Nikolaj Ganev
Jan Drahokoupil, Jan Drahokoupil
ON THE USE OF HANDHELD XRF FOR DETERMINATION OF ARSENIC AND MERCURY IN A MUSEUM COLLECTION
K. Cross, P.T. Palmer, K. Cross, P.T. Palmer
GENERATING RELIABLE QUALITATIVE AND QUANTITATIVE XRF RESULTS TO SUPPORT FDA LAB AND FIELD INVESTIGATIONS
Peter T. Palmer, Peter T. Palmer
Peter Baker, Peter Baker
Kara Cross, Kara Cross
Richard Jacobs, Richard Jacobs
Grazing-incidence diffraction applied as a crosscutting tool in the nanobio regime
Brian D. Pate, Brian D. Pate
Xue Han, Xue Han
Denis Keane, Denis Keane
ALUMINA-SUPPORTED PALLADIUM CATALYST CRYSTALLITE SIZE DETERMINATION BY EXAFS, XRD, AND TEM
E.J. Peterson*, T.R. Conant, P. Burton, A. De La Riva, J.P. Gabaldon, L.R. Houk, H. Pham, K. Lovato, J. Paiz, A.K. Datye, E.J. Peterson*, T.R. Conant, P. Burton, A. De La Riva, J.P. Gabaldon, L.R. Houk, H. Pham, K. Lovato, J. Paiz, A.K. Datye
ANALYSIS OF SAPPHIRE AND RUBY BY EDXRF
Richard E. Phillips, Richard E. Phillips
Christopher M. Breeding, Christopher M. Breeding
A HIGH RESOLUTION HARD X-RAY BIOIMAGING FACILITY AT SSRL
P. Pianetta*, J. Andrews, S. Brennan, P. Pianetta*, J. Andrews, S. Brennan
E. Almeida, E. Almeida
M. van der Meulen, M. van der Meulen
Tkachuk , J. Gelb, J. Rudati, M. Feser, W. Yun, Tkachuk , J. Gelb, J. Rudati, M. Feser, W. Yun
SCREENING TOYS AND CONSUMER GOODS WITH HANDHELD XRF
Stanislaw Piorek, Stanislaw Piorek
Mg-based multilayer XRF analyzers with two- and three-layers structure design
Y. Platonov*, J. Rodriguez, G. Fournier, Y. Platonov*, J. Rodriguez, G. Fournier
K. Shimizu, K. Shimizu
ISSUES, TRANSITIONS AND COLLABORATIONS ASSOCIATED WITH USE OF HAND-HELD XRF IN NATURAL HISTORY MUSEUMS
C. Podsiki, C. Podsiki
Synchrotron XRF and PIXE Analyses of Element Distribution in Fossilized Sauropod Dinosaur Bones
Anke R. Pyzalla, Anke R. Pyzalla
Maitena Dumont, Maitena Dumont
Norbert Zoeger, Norbert Zoeger
Christina Streli, Christina Streli
Peter Wobrauschek, Peter Wobrauschek
Martin Sander, Martin Sander
BENEFITS OF IMPROVED RESOLUTION FOR EDXRF
R. Redus, T. Pantazis, J. Pantazis, A. Huber, R. Redus, T. Pantazis, J. Pantazis, A. Huber
B. Cross, B. Cross
DOSAGE OF SILICA IN POLYMERS BY X-RAY FLUORESCENCE
P. Ricou, S. Kodjie, X. Shen, P. Ricou, S. Kodjie, X. Shen
DETERMINATION OF ACTIVATION ENERGY IN TEXTURED METAL-METAL MULTILAYER FILMS VIA 2D XRD
Mark A. Rodriguez*, David P. Adams, Ralph G. Tissot, Mark A. Rodriguez*, David P. Adams, Ralph G. Tissot
WAVELET ANALYSIS OF X-RAY DIFFRACTION SIGNAL FROM MEASUREMENTS OF STRESS AND AUSTENITE
George, Roy, George, Roy
HANDHELD XRF FOR ARCHAEOMETALLURGICAL STUDIES: IN-SITU ALLOY AND METAL ANALYSIS OF A PRIVATE SWORD COLLECTION
J. Feuer*, T. Turner, K. Russell, J. Feuer*, T. Turner, K. Russell
SANDRA: A PORTABLE XRF SYSTEM FOR NON DESTRUCTIVE STUDIES OF MEXICAN CULTURAL HERITAGE
J.L. Ruvalcaba, J.L. Ruvalcaba
HIGH-RESOLUTION XRF IN 35-60 KEV:-LANTHANIDES’ K-SPECTRA
M. Mizusawa, K. Sakurai, M. Mizusawa, K. Sakurai
Y. Terada, Y. Terada
REALTIME XRF AND XRD IMAGING –THE INSTRUMENTATION AND THE APPLICATIONS
K. Sakurai, K. Sakurai
PORTABLE FIELD XRD/XRF INSTRUMENT: APPLICATION TO THE STUDY OF MARS ANALOG MATERIALS
P. Sarrazin, W.Brunner, P. Sarrazin, W.Brunner
D. Blake, D. Blake
M. Gailhanou, M. Gailhanou
D. L. Bish, D. L. Bish
D.Vaniman, D.Vaniman
S. Chipera, S. Chipera
A STUDY ON TNE TOTAL EVALUATION OF PHARMANOCEUTICAL PRODUCTS USING GENERAL PURPOSE XRD EQUIPMENT
Miho Sasaki*, Tomikatsu Kubo, Akira Kishi, Miho Sasaki*, Tomikatsu Kubo, Akira Kishi
X-RAY PROBE ANALYSES OF COMPLICATED PRECIPITATES FORMED IN COPPER-BASE ALLOYS
S.Sato*, Y.Takahashi, T.Sanada, S.Sato*, Y.Takahashi, T.Sanada
K.Shinoda, K.Wagatsuma, S.Suzuki, K.Shinoda, K.Wagatsuma, S.Suzuki
APPLICATION OF 2-DIMENSIONAL XRD FOR THE CHARACTERIZATION OF MICROSTRUCTURE OF SELF-LEVELING COMPOUNDS (SLC)
S. Seifert*, J. Neubauer, F. Goetz-Neunhoeffer, S. Seifert*, J. Neubauer, F. Goetz-Neunhoeffer
H. Motzet, H. Motzet
NEW S2 PICOFOX BENCHTOP TXRF
A. Seyfarth, M. Rider, A. Seyfarth, M. Rider
H. Stosnach, A. Gross, H. Stosnach, A. Gross
ROHS COMPLIANCE IN PAINTS AND RESINS
A. Seyfarth, A. Seyfarth
A. Buehler, K. Behrens, A. Buehler, K. Behrens
J. Sardisco, J. Sardisco
The Rietveld Refinement of The Rare Earth Orthoborates
S. Seyyidoglu, S. Seyyidoglu
A. Yilmaz, A. Yilmaz
DEVELOPMENT OF SOIL STANDARD MATERIALS CONTAINING HAZARDOUS METALS FOR X-RAY FLUORESCENCE ANALYSIS
Y. Shibata*, J. Suyama, M. Kitano, T. Nakamura, Y. Shibata*, J. Suyama, M. Kitano, T. Nakamura
XRF DETECTION OF HEAVY METAL PESTICIDES IN ARCHAEOLOGICAL AND ANTHROPOLOGICAL ARTIFACTS.
IN-SITU CHARACTERISATION OF NOVEL FUEL CELL MATERIALS
Stephen J. Skinner, Stephen J. Skinner
AUTOMATED PICOLITER SOLUTION DEPOSITION FOR TXRF ANALYSIS OF SEMICONDUCTOR SAMPLES
Chris M. Sparks*, Chris M. Sparks*
Ursula Fittschen, George Havrilla, Ursula Fittschen, George Havrilla
RADIOISOTOPE RH-101 AS X-RAY SOURCE FOR INSTRUMENTS ON SPACE MISSIONS
C. Stenzel, C. Stenzel
C. Schroer, C. Schroer
B. Lengeler, B. Lengeler
R. Vianden, R. Vianden
ANALYSIS OF PLATINUM GROUP ELEMENTS (PGE) BY MEANS OF TOTAL REFLECTION X-RAY FLUORESCENCE (TXRF) SPECTROMETRY
H., Stosnach, H., Stosnach
SAMPLE MORPHOLOGY: INFLUENCE ON TOTAL REFLECTION X-RAY FLUORESCENCE ANALYSIS
Christine Horntrich, Christine Horntrich
Florian Meirer, Florian Meirer
Christina Streli*, Christina Streli*
Peter Wobrauschek, Peter Wobrauschek
nobert Zoeger, nobert Zoeger
Giancarlo Pepponi, Giancarlo Pepponi
MICRO X-RAY FLUORESCENCE SPECTROMETER FOR LIGHT ELEMENT ANALYSIS WITH LOW POWER TUBE EXCITATION
Stefan Smolek, Stefan Smolek
Norbert Zoeger, Norbert Zoeger
Christina Streli*, Christina Streli*
Peter Wobrauschek, Peter Wobrauschek
florian Meirer, florian Meirer
TABLETOP SPECTROMETER FOR GRAZING INCIDENCE XRF
Norbert Zoeger, Norbert Zoeger
Dieter Ingerle, Dieter Ingerle
Christina Streli*, Christina Streli*
Florian Meirer, Florian Meirer
Peter Wobrauschek, Peter Wobrauschek
giancarlo Pepponi, giancarlo Pepponi
GRAZING-EXIT-XRF EXPERIMENTS AT HASYLAB BEAMLINE L
Florian Meirer, Florian Meirer
Giancarlo Pepponi, Giancarlo Pepponi
Christina Streli*, Christina Streli*
Peter Wobrauschek, Peter Wobrauschek
nobert Zoeger, nobert Zoeger
RESEARCH IN THE IDENTIFICATION AND PROVENANCING OF 20TH CENTURY PHOTOGRAPHS
D.C. Stulik, A. Kaplan, D.C. Stulik, A. Kaplan
D. Miller, D. Miller
HIGH-PERFORMANCE SILICON STRIP DETECTOR FOR IN-HOUSE XRD SYSTEM
T. Taguchi, H. Toraya, M. Kuribayashi, T. Taguchi, H. Toraya, M. Kuribayashi
P. Grybos, R. Szczygiel, P. Maj, P. Grybos, R. Szczygiel, P. Maj
NANOSTRUCTURE ANALYSIS OF METALLIC MATERIALS BY COHERENT X-RAY DIFFRACTION MICROSCOPY
Y. Takahashi, H. Furukawa, H. Kubo, K. Yamauchi, Y. Takahashi, H. Furukawa, H. Kubo, K. Yamauchi
Y. Nishino, T. Ishikawa, Y. Nishino, T. Ishikawa
E. Matsubara, E. Matsubara
HARD X-RAY FULL FIELD 3D IMAGING WITH sub-50 nm RESOLUTION
A. Tkachuk, M. Feser, F. Duewer, J. Gelb, G. Hsu, S. Wang, Wenbing Yun, A. Tkachuk, M. Feser, F. Duewer, J. Gelb, G. Hsu, S. Wang, Wenbing Yun
NEW HIGH-PERFORMANCE DEVICE FOR PARALLEL-BEAM X-RAY DIFFRACTOMETER SCAN
Hideo Toraya, Hideo Toraya
APPLICATIONS OF POLYCAPILLARY OPTICS TO MICRO AND TWO DIMENSIONAL XRF ANALYSIS
K.Tsuji, A. Matsuda, K. Nakano, K.Tsuji, A. Matsuda, K. Nakano
K. Nakano, K. Nakano
S. Komatani, S. Ohzawa, H. Uchihara, S. Komatani, S. Ohzawa, H. Uchihara
SAMPLE PREPARATION FOR TOTAL-REFLECTION X-RAY FLUORESCENCE ANALYSIS OF BLOOD SAMPLES
K. Tsuji, H. Matsui, M. Hino, H. Wanibuchi, K. Tsuji, H. Matsui, M. Hino, H. Wanibuchi
H. Kohno, K. Aranami, Y. Shimizu, T. Yamada, H. Kohno, K. Aranami, Y. Shimizu, T. Yamada
LONG-RANGE SCANS AND MANY-BEAM EFFECTS FOR HIGH-RESOLUTION X-RAY DIFFRACTION FROM MULTILAYERED STRUCTURES
T.A. Ulyanenkova, T. Baumbach, T.A. Ulyanenkova, T. Baumbach
A.I. Benediktovich, I. Feranchuk, A.I. Benediktovich, I. Feranchuk
A. Ulyanenkov, A. Ulyanenkov
QUANTITATIVE ANALYSIS OF NANO-PARTICLE BY XRF
T. Utaka, N. Kawada, K. Taniguchi, T. Utaka, N. Kawada, K. Taniguchi
S. Maeo, M. Kurakado, S. Maeo, M. Kurakado
Y. Araki, K. Muraoka, T. Itoh, Y. Araki, K. Muraoka, T. Itoh
CHARACTERIZATION OF NANOMATERIALS FOR LASER FUSION TARGETS
T. van Buuren, T. Willey, S. Kucheyev, C. Saw, T. Baumann, A. Hamza, T. van Buuren, T. Willey, S. Kucheyev, C. Saw, T. Baumann, A. Hamza
J. Ilavsky, J. Ilavsky
A. Nikroo, A. Nikroo
FORMATION OF NOVEL OXIDE NANOSTRUCTURES
Z.L. Wang, Z.L. Wang
NATURAL NANOPARTICLE SHAPE, STRUCTURE, PROPERTIES AND REACTIVITY FROM X-RAY STUDIES
G.A. Waychunas*, B. Gilbert, G.A. Waychunas*, B. Gilbert
H. Zhang, Y.-S. Jun, J.F. Banfield, H. Zhang, Y.-S. Jun, J.F. Banfield
C. Kim, C. Kim
FLEXIBILITY AND HIGH THROUGHPUT: SUPPORTING SAXS USERS AT A JOINT INDUSTRIAL ACADEMIC BEAMLINE.
S. Weigand*, D.T. Keane, S. Weigand*, D.T. Keane
PROBING THIN-LAYERED AND NANO-STRUCTURED MATERIALS - X-RAY SCATTERING TOOLS
Joachim F. Woitok, Joachim F. Woitok
RADIOACTIVE SAMPLE EFFECTS ON EDXRF SPECTRA
Christopher G. Worley, Christopher G. Worley
NANODIFFRACTION FROM PERFECT/WEAKLY-DEFORMED SINGLE CRYSTALS
H. Yan, H. Yan
O. Kalenci, C. Noyan, O. Kalenci, C. Noyan
C. Murray, C. Murray
J. Maser, J. Maser
THE X-RAY DIFFRACTION CHARACTERISTICS OF DIFFERENT MATERIALS
Yiliang Zhang*, Jinyan Liu, Xuedong Xu, Yiliang Zhang*, Jinyan Liu, Xuedong Xu
In situ study of crystallization from amorphous to cubic zirconium oxide: Rietveld and Reverse Monte Carlo Analyses
Feng Zhang, Siu Lun Alan Lui, Siu-Wai Chan, Feng Zhang, Siu Lun Alan Lui, Siu-Wai Chan
Peter J. Chupas, Peter L. Lee, Peter J. Chupas, Peter L. Lee
Jonathan C. Hanson, Wolfgang A, Caliebe, Jonathan C. Hanson, Wolfgang A, Caliebe
Ultra-Small-Angle X-ray Scattering (USAXS) Imaging, Contrast Mechanism and Applications
F. Zhang*, G. G. Long, J.Ilavsky, P. R. Jemian, F. Zhang*, G. G. Long, J.Ilavsky, P. R. Jemian
L. E. Levine, L. E. Levine


 

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