More 2009 Denver X-ray Conference information coming soon!

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The 58th Annual DXC will be held 27-31 July 2009, Crowne Plaza Hotel, Colorado Springs, Colorado, U.S.A.

Hotel Information: www.cpcoloradosprings.com
Hotel Reservations: https://resweb.passkey.com/Resweb.do?mode=welcome_ei_new&eventID=80423

2009 Denver X-ray Conference Preliminary Program
Crowne Plaza, Colorado Springs, 27 – 31 July

Plenary

Special Sessions

Getting the Lead Out  - Again!! (Van Grieken/Havrilla/Elam)

Joint XRD & XRF
XRD
XRF

New Developments in XRD & XRF Instrumentation (Buhrke)

X-ray Imaging (Goebel/de Carlo)

High Energy X-ray Optics for Synchrotron Radiation (50-150 keV (Shastri)

Bioenabled Materials (Snyder)

Stress Analysis – full day (Watkins/Goldsmith)

Rietveld Analysis – full day (Kaduk/Snyder)

High Energy Synchrotron Applications (Almer/Haeffner)

Line Profile Analysis (Balzar)

High Resolution XRD (organizer to be confirmed)

High Throughput XRD (Takeuchi)

Environmental Applications (Van Grieken)

Fusion and Industrial Applications of XRF (Anzelmo)

Trace Analysis (organizer to be confirmed)

Quantitative Analysis (Elam)

 

Workshops
Joint XRD & XRF
XRD
XRF

X-ray Sources/Optics Development and Integration (Khounsary/Havrilla)

Advances in Detector Technology (Blanton)

Quantitative Analysis via Rietveld Analysis – full day (to be confirmed)

Phase Identification (Fawcett)

Line Profile Analysis (Noyan/co-chair to be confirmed)

Structure Solution (Misture)

Pair Distribution Function (to be confirmed)

Line Profile Analysis (Noyan/Balzar)

Benefits and Limitations of Handheld XRF (organizer to be confirmed)

Strategies for Advanced Materials Analysis with Lab & SR X-ray Spectroscopy (Hayakawa)

Quantitative Analysis – full day (Mantler)

Basic XRF (Elam)

Specimen Preparation – full day (Anzelmo)

Trace Analysis (Zaitz)

Benefits and Limitations of Handheld XRF (Russell)