The 58th Annual DXC will be held 27-31 July 2009, Crowne Plaza Hotel, Colorado Springs, Colorado, U.S.A.
Hotel Information: www.cpcoloradosprings.com
Hotel Reservations: https://resweb.passkey.com/Resweb.do?mode=welcome_ei_new&eventID=80423
2009 Denver X-ray Conference Preliminary Program |
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Plenary |
Special Sessions |
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Getting the Lead Out - Again!! (Van Grieken/Havrilla/Elam) |
Joint XRD & XRF |
XRD |
XRF |
New Developments in XRD & XRF Instrumentation (Buhrke) X-ray Imaging (Goebel/de Carlo) High Energy X-ray Optics for Synchrotron Radiation (50-150 keV (Shastri) Bioenabled Materials (Snyder) |
Stress Analysis – full day (Watkins/Goldsmith) Rietveld Analysis – full day (Kaduk/Snyder) High Energy Synchrotron Applications (Almer/Haeffner) Line Profile Analysis (Balzar) High Resolution XRD (organizer to be confirmed) High Throughput XRD (Takeuchi) |
Environmental Applications (Van Grieken) Fusion and Industrial Applications of XRF (Anzelmo) Trace Analysis (organizer to be confirmed) Quantitative Analysis (Elam) |
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Workshops |
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Joint XRD & XRF |
XRD |
XRF |
X-ray Sources/Optics Development and Integration (Khounsary/Havrilla) Advances in Detector Technology (Blanton) |
Quantitative Analysis via Rietveld Analysis – full day (to be confirmed) Phase Identification (Fawcett) Line Profile Analysis (Noyan/co-chair to be confirmed) Structure Solution (Misture) Pair Distribution Function (to be confirmed) Line Profile Analysis (Noyan/Balzar) |
Benefits and Limitations of Handheld XRF (organizer to be confirmed) Strategies for Advanced Materials Analysis with Lab & SR X-ray Spectroscopy (Hayakawa) Quantitative Analysis – full day (Mantler) Basic XRF (Elam) Specimen Preparation – full day (Anzelmo) Trace Analysis (Zaitz) Benefits and Limitations of Handheld XRF (Russell)
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