2009 Denver X-ray Conference Information:

Program

DXC Sponsors:

Chemplex

Panalytical

Media Sponsors:

Ios Press

Materials Today

 

 

 

 

The 58th Annual DXC will be held 27-31 July 2009, Crowne Plaza Hotel, Colorado Springs, Colorado, U.S.A.

MONDAY, 27 JULY—XRD POSTER SESSION
SUMMIT BALLROOM, 5:30 P.M. – 7:30 P.M.

Panalytical

The Monday evening Poster session will be held in conjunction with a Wine and Cheese Reception, sponsored by PANalytical.
Chairs: T.R. Watkins, Oak Ridge National Laboratory, Oak Ridge, TN
D. Balzar, University of Denver, Denver, CO

Session chairs will select the three best posters for awards.

D-2 CHARACTERIZATION OF AGING BEHAVIOR OF PRECIPITATES AND DISLOCATIONS IN COPPER-BASED ALLOYS
S. Sato, K. Wagatsuma, S.Suzuki, Tohoku University, Sendai, Miyagi, Japan
Y. Takahashi, NISSAN ARC, LTD., Yokosuka, Kanagawa, Japan
D-3 X-RAY DIFFRACTION STUDIES OF INDIAN COALS
S. Maity, Central Institute of Mining and Fuel Research, Fri, Dhanbad, Jharkhand, India
D-5 STATE-OF-THE-ART MULTILAYER OPTICS FOR X-RAY ANALYTICS
J. Wiesmann, B. Hasse, C. Michaelsen, A. Hembd, U. Heidorn, S. Kroth, F. Hertlein, Incoatec GmbH, Geesthacht, Germany
D-13 GRAZING INCIDENCE DIFFRACTION STUDY OF EPITAXIAL FILMS USING EXTENDED ROCKING CURVE ANALYSIS
A. Takase, K. Omote, Rigaku Americas Corporation, The Woodlands, TX
D-19 INSITU ANALYSIS OF LIFEPO4 BATTERIES: SIGNAL EXTRACTION BY MULTIVARIATE ANALYSIS
M.A. Rodriguez, M.H. Van Benthem, D. Ingersoll, Sandia National Laboratories, Albuquerque, NM
S.C. Vogel, Los Alamos National Laboratory, Los Alamos, NM
D-22 RESIDUAL STRESSES AROUND HOLES CUT IN STEEL RAILSIDES FOR TRUCK FRAMES
C.R. Hubbard, Oak Ridge National Laboratory, Oak Ridge, TN
J. Del Prado Villasana, S. Fleming, Metalsa Roanoke, Inc., Roanoke, VA
D-24 QUANTITATIVE ANALYSIS OF SAMPLES INCLUDING UNKNOWN TRACE PHASES—COMPARISON OF THE RIETVELD AND CALIBRATION CURVE METHODS
E. Kagami, A. Takase
, Rigaku Corporation, Akishima, Tokyo, Japan
D-27 X-RAY DIFFRACTION SPOT OBSERVATION OF TL2BA2CUOX USING FOCUSING COHERENT SYNCHROTRON BEAM WITH A MAGNETIC FIELD CHANGE
D. Miyamoto, T. Oba, T. Suzuki
, The University of Kitakyushu, Fukuoka, Japan
D-29 X-RAY TOPOGRAPHY FOR EVALUATION OF X-RAY MIRRORS THAT FUNCTION BY MEANS OF TOTAL-EXTERNAL REFLECTION
J. Maj, A. Macrander, A. Khounsary, M. Martens
, Argonne National Laboratory, Argonne, IL
D-30 THE COSUBSTITUTION REACTION OF IN2O3 BY ZNO AND SNO2 AS CHARACTERIZED WITH X-RAY SPECTROSCOPY
C.A. Hoel, K.R. Poeppelmeier, J.-F. Gaillard
, Northwestern University, Evanston, IL
D-35 DEVELOPMENT OF XRD BASED ON-LINE CHARACTERIZATION OF SEMICRYSTALLINE PLASTICS
H. Huang, A. Verchinine, M. Cusack, W. Gibson
, X-ray Optical Systems, Inc., East Greenbush, NY
D-36 CRYSTAL STRUCTURE REFINEMENTS OF THE THREE-LAYER AURIVILLIUS PHASE BI2LNTI3O12 (LN = LA2, LAPR, LAND, PR2, PRND, ND2) UTILIZING COMBINED X-RAY AND NEUTRON POWDER DIFFRACTION
E.J. Nichols, S.T. Misture
, Alfred University, Alfred, NY
D-37 MICRO-STRUCTURAL ANALYSIS OF HIGH MANGANESE STEELS USINGMULTIPLE LINE PROFILE ANALYSIS
J.S. Joung, Y.-M. Koo
, Pohang University of Science & Technology, Pohang, Korea
I.K. Jeong, Pusan National University, Pusan, Korea
S.-K. Kim, Technical Research Lab/POSCO, Pohang, Korea
D-41 STRUCTURAL STUDY ON THE FERROELECTRIC TRANSITION INYMNO3 BY RIETVELD METHOD
J.Y. Kim,
Y.M. Koo, Pohang University of Science and Technology, Pohang, Korea
N.S. Shin, Pohang Accelerator Laboratory, Pohang, Korea
D-46 PREDICTION AND XRDMEASURING OF RESIDUAL STRESSES IN MACHINED WELDED PARTS
I. Dahan, G. Refaelov, J. Sariel,
Ben-Gurion University of the Negev, Beer-Sheva, Israel
M. Santo, I. Gilad, Nuclear Research Center of the Negev, Israel
D-50 X-RAY AND RAMAN SPECTRA STUDIES ON THERMAL ENERGY STORAGEMATERIALS— TRIS(HYDROXYMETHYL)AMINOMETHANE
W.-M. Chien, V.K. Kamisetti, J.C. Fallas, D. Chandra, A.M. Covington,
University of Nevada - Reno, Reno, NV
E.D. Emmons, U.S. Army Edgewood Chemical Biological Center, Aberdeen Proving Ground, MD
R.S. Chellappa, Carnegie Institution of Washington, Washington, DC
S. Clark, ALS - Lawrence Berkeley National Laboratory, Berkeley, CA
D-55 XRD STUDY OF SOL-GEL PREPARATION OF THEMATERIALS WITH RADIOLUMINESCENT PROPERTIES
D. Havlicek, J. Ruzicka, D. Niznansky
, Charles University of Prague, Praha 2, Czech Republic
D-56 TRANSITION IN CRYSTAL STRUCTURE OF ETHYLENE-OCTENE FIBER DURING HEAT TREATMENT
L.-Z. Liu, R. Paradkar, S. Bensason, D. Chiu,
The Dow Chemical Company, Freeport, TX
D-60 COMPARISON OF RETAINED AUSTENITE STANDARDS USING XRD AND OIM
T.R. Watkins,
E.A. Kenik, Oak Ridge National Laboratory, Oak Ridge, TN
O.B. Cavin, The University of Tennessee, Knoxville, TN
J.A. Cooke, Graham High School, Bluefield, VA
K.M. Everett, Bath County High School, Hot Springs, VA
J.L. Leisner, Bald Eagle Area High School, Wingate, PA
Y. Picazo, West Carter High School, Olive Hill, KY
A.M. Wright, Tupelo High School, Tupelo, MS
J. Carpenter, TSL/EDAX, Draper UT
D-62 REDISTRIBUTION OFMICROSTRESSES IN SHEETS FROM ZR-BASED ALLOYS UNDER ANNEALING
M. Isaenkova, Y. Perlovich,
Moscow Engineering Physics Institute, Moscow, Russia
D-63 HIGH TEMPERATURE X-RAY DIFFRACTION (HT-XRD) ANALYSIS OF SIMULATED DEFENSEWASTE PROCESS FACILITY (DWPF) GLASSES
D.M. Missimer, A.R. Jurgensen, R.L. Rutherford,
Savannah River National Laboratory, Aiken, SC
D-64 A NEW PROMISING SCINTILLATION CRYSTAL YBA3B9O18: STRUCTURE, CRYSTAL GROWTH AND ITS PROPERTIES
W.Y. Wang, M. He, X.L. Chen,
Chinese Academy of Sciences, Beijing, PR China
D-69 SYNCHROTRON POWDER DIFFRACTION SIMPLIFIED: A NEWMAIL-IN SERVICE FOR THE 11-BM HIGH-RESOLUTION DIFFRACTOMETER AT THE ADVANCED PHOTON SOURCE
B.H. Toby, L. Ribaud, M.R. Suchomel, J. Doebbler, R.B. Von Dreele,
Argonne National Laboratory, Argonne IL
D-70 HYBRID X-RAY DIFFRACTION FOR ANALYSIS OF UNPREPARED SAMPLES IN PLANETARY EXPLORATION
P. Sarrazin,
inXitu, Inc., Mountain View, CA
P. Dera, Argonne National Laboratory, Argonne, IL
R.T. Downs, University of Arizona, Tucson, AZ
D. Blake, NASA Ames Research Center, Moffett Field, CA
D.L. Bish, Indiana University, Bloomington, IN
M. Gailhanou, Université Paul Cézanne, Marseille, France
D-76 MULTILAYER OPTICS FOR NANOSTRUCTURE INVESTIGATION IN THE LAB, THE EXAMPLE OF HIGH Z ELEMENTS
V. Roger, P. Panine, P. Høghøj,
XENOCS SA, Sassenage, France
O. Diat, ICSM, Bagnols sur Céze, France
D-77 NEW LANTANUM TANTALATE PHASES INVESTIGATED BY HIGH TEMPERATURE XRD AND HIGH RESOLUTION POWDER DIFFRACTION
M.A. Rodriguez, M.D. Nyman, Sandia National Laboratories, Albuquerque, NM
D-81 HYDROSTATIC PRESSURE CELL INTEGRATED IN A LABORATORY BASED SAXS SYSTEM
M. Kriechbaum, P. Herrnegger, P. Laggner, Austrian Academy of Sciences, Graz, Austria and Hecus X-ray Systems GmbH, Graz, Austria
S. Bodner, Hecus X-ray Systems GmbH, Graz, Austria
H. Amenitsch, Austrian Academy of Sciences, Graz, Austriam
D-82 STRUCTURAL STABILITY STUDY FOR ULTRA-THIN HFO2 FILMS BASED ON GIXRR AND GIXRD
W.-E. Fu, Y.-Q. Chang, Y.-C. Chen, Industrial Technology Research Institute, Hsinchu, Taiwan
D-83 DO Q!
K.-D. Liss, Australian Nuclear Science and Technology Organisation, NSW, Australia
D-93 CRYSTAL STRUCTURE DETERMINATION OF THE SILVER CARBOXYLATE DIMER [AG(O2C22H43)]2, SILVER BEHENATE, USING POWDER X-RAY DIFFRACTION METHODS
T.N. Blanton, M. Rajeswaran, Eastman Kodak Company, Research Laboratories, Rochester, NY
P.W. Stephens, Stony Brook University, Stony Brook, NY
D.R. Whitcomb, Carestream Health, Oakdale, MN
S.T. Misture, NYS College of Ceramics at Alfred University, Alfred, NY
J.A. Kaduk, INEOS Technologies, Naperville, IL
D-94 AN APPROACH TO QUANTITATIVE INTERPRETATION OF XRD PATTERNS OF CLAYMIXTURES USING CLAY MINERAL SOCIETY CLAYS AND THEIR FWHM IN THE GLYCOLATED DIFFRACTOGRAMS
D. Alaygut, B. Canga, Turkish Petroleum Corporation, Research Center, Ankara, Turkey
D-97 X-RAY DIFFRACTION AND STRUCTURAL BEHAVIOR STUDIES OF LI-BASED HYDRIDES
W.-M. Chien, J.H. Lamb, D. Chandra, University of Nevada - Reno, Reno, NV
D-99 DISLOCATION GENERATION RELATED TOMICROCRACKS IN SI-WAFER: IN-SITU STUDY AT HIGH TEMPERATURE WITH WHITE BEAM X-RAY TOPOGRAPHY
A. Danilewsky, J. Wittge, A. Hess, A. Cröll, University Freiburg, Freiburg, Germany
D. Allen, P. McNally, Dublin City University, Dublin, Ireland
P. Vagovic, A. Cecilia, Z. Li, T. Baumbach, Research Centre Karlsruhe/Institut für Synchrotronstrahlung, Karlsruhe, Germany
E. Gorostegui–Colinas, J. Garagorri, M.R. Elizalde, Centro de Estudios e Investigaciones Tecnicas de Gipuzkoa, San Sebastian, Spain
D. Jacques, Jordan Valley Semiconductor, Durham, United Kingdom
M.C. Fossati, D.K. Bowen, B.K. Tanner, Durham University, Durham, United Kingdom
D-102 RESIDUAL STRESS ANALYSIS OF A CO-EXTRUDED SOLID OXIDE FUEL CELL PLATFORM
I. Cernatescu, S. Rekhi, PANalytical, Westborough, MA
R. Oh, J. Cochran, R.L. Snyder, Georgia Institute of Technology, Atlanta, GA
D-103 WHY YOU SHOULD CARE ABOUT AREA DETECTORS—AN INTRODUCTION
K.W. Kirchner, K.A. Jones, U.S. Army Research Laboratory, Adelphi, MD
Post Deadline Abstracts:  
D-104

PHASE EQUILIBRIA DETERMINATION OF TRIS(HYDROXYMETHYL)AMINOMETHANE AND 2-AMINO-2METHYL-1,3-PROPANEDIOL BINARY SYTEM
V.K. Kamisetty*, W.M. Chien, D. Chandra, University of Nevada, Reno, Reno, NV

D-107 MICROXRD AND XPS STUDY OF THE DYNAMIC NATURE OF CERIUM OXIDE NANOPARTICLES – INFLUENCE OF AGING AND CHEMICAL ENVIRONMENT
T. Varga, P. Nachimuthu, S.V.N.T. Kuchibhatla, C.F. Windisch Jr., S. Thevuthasan, D.R. Baer, Pacific Northwest National Laboratory, Richland, WA
A.S. Karakoti, S. Seal, University of Central Florida, Orlando, FL
D-109 REGISTRATION OF STRUCTURAL DISORDER PROFILE OF CRYSTALLINE MATERIAL WITH PARTICLE-INDUCED DAMAGED DOMAINS VIA GRAZING-ANGLE INCIDENCE HARD X-RAY NANOSCOPE
H.P. Bezirganyan*, V Group, Inc., Iselin, NJ
S.E. Bezirganyan, Yerevan State Medical Univ., Yerevan, Armenia
D-111

FoM PROPOSALS FOR INDEXING POWDER DIFFRACTION PATTERNS OF HIGH-SYMMETRY LATTICES
O.A. Smirnova, Kyoto University, Kyoto, Japan