The 58th Annual DXC will be held 27-31 July 2009, Crowne Plaza Hotel, Colorado Springs, Colorado, U.S.A.
SESSIONS - WEDNESDAY, THURSDAY, & FRIDAY, 28 - 31 JULY
PLENARY SESSION: GETTING THE LEAD OUT—AGAIN! |
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| Chairs: | R. Van Grieken, University of Antwerp, Antwerp, Belgium G.J. Havrilla, Los Alamos National Laboratory, Los Alamos, NM W.T. Elam, Ametek/EDAX Research Group and Univ. of Washington APL, Seattle, WA |
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| 8:30 | CHAIRMAN OF THE DENVER X-RAY CONFERENCE, WELCOMING REMARKS Robert L. Snyder, Georgia Institute of Technology, Atlanta, GA |
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| PRESENTATION OF AWARDS | ||
| 2009 Barrett Award presented to Robert Von Dreele, Argonne National Laboratory, Argonne, IL Presented by Cev Noyan, Columbia University, New York, NY 2009 Jenkins Award presented to Tim Fawcett, International Centre for Diffraction Data, Newtown Square, PA Presented by Victor Buhrke, Consultant, Portola Valley, CA 2009 Jerome B. Cohen Student Award (winner announced at the plenary session) Presented by Cev Noyan, Columbia University, New York, NY |
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| 8:50 | PLENARY SESSION REMARKS BY THE CHAIRS |
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| The following are the invited papers to be presented during the plenary session: | ||
| 9:00 | F-80 | HUMAN EXPOSURE TO LEAD AND NEW EVIDENCE OF ADVERSE HEALTH EFFECTS: IMPLICATIONS FOR
ANALYTICAL MEASUREMENTS P.J. Parsons, New York State Dept of Health, Albany, NY |
| 9:45 | F-67 | GETTING THE LEAD OUT—AGAIN: LEAD IN FDA REGULATED PRODUCTS R. Jacobs, Consultant, FDA, San Francisco District Laboratory, Alameda, CA P.T. Palmer, San Francisco State University, San Francisco, CA |
| 10:30 | BREAK |
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| 11:00 | F-79 | THE TRUTHS AND MYTHS OF TOYS’ TESTING FOR LEAD—XRF TO THE RESCUE S. Piorek, Thermo Scientific Niton Analyzers, Billerica, MA |
| 11:45 | SYSTEM OVERLOAD!!!—RESTORING ORDER WITH XRF M. Fry, Intertek Ageus Solutions, Ontario, Canada |
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XRD & XRF: NEW DEVELOPMENTS IN XRD & XRF INSTRUMENTATION |
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| Chairs: | V.E. Buhrke, Consultant, Portola Valley, CA T. Fawcett, International Centre for Diffraction Data, Newtown Square, PA |
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| 1:00 | C-4 | MICROFOCUS LIQUID-METAL-JET X-RAY TUBES AND APPLICATIONS O. Hemberg, M. Otendal, T. Tuohimaa, Excillum AB, Stockholm, Sweden |
| 1:15 | C-6 | PERFORMANCE OF BEAM SHAPING X-RAY OPTICS IN COMBINATION WITH LABORATORY X-RAY SOURCES R. Dietsch, Th. Holz, M. Kraemer, D. Weissbach, AXO Dresden GmbH, Heidenau, Germany St. Braun, Fraunhofer IWS, Dresden, Germany |
| 1:30 | D-8 | THE VERSATILITY OF THE INCOATEC MICROFOCUS SOURCE IN X-RAY DIFFRACTOMETRY B. Hasse, J. Wiesmann, J. Graf, C. Michaelsen, Incoatec GmbH, Geesthacht, Germany |
| 1:45 | D-16 | A MAJOR UPDATE OF X’PERT HIGHSCORE PLUS T. Degen, J. van den Oever, PANalytical B.V., Almelo, The Netherlands |
| 2:00 | F-21 | MINIATURE X-RAY SOURCES AND THE EFFECTS OF SPOT SIZE ON SYSTEM PERFORMANCE D.J. Caruso, M. Dinsmore, TWX, LLC., Concord, MA S. Cornaby, S. Liddiard, M. Heber, C. Jensen, Moxtek, Inc., Orem, UT |
| 2:15 | F-22 | BRIDGING THE PRICE/PERFORMANCE GAP BETWEEN SILICON DRIFT AND SILICON PIN DIODE DETECTORS D. Hullinger, K. Decker, J. Smith, C. Carter, Moxtek, Inc., Orem, UT |
| 2:30 | D-25 | OBSERVATIONS OF SHOCKED METALLIC SURFACES WITH SINGLE-PULSE X-RAY DIFFRACTION D.V. Morgan, M. Grover, D. Macy, M. Madlener, G. Stevens, W.D. Turley, L. Veeser, National Security Technologies, LLC, Los Alamos, NM |
| 2:45 | F-26 | NEW DETECTOR ARCHITECTURES WITH SILICON DRIFT DETECTORS FOR XRF APPLICATIONS A. Simsek, O. Jaritschin, A. Liebel, P. Lechner, G. Lutz, PNDetector GmbH, Munich, Germany A. Bechteler, A. Niculae, H. Soltau, R. Echkardt, K. Hermenau, PNSensor GmbH, Munich, Germany F. Schopper, L. Strüder, MPI Halbleiterlabor, Munich, Germany |
| 3:00 | BREAK | |
| 3:30 | F-28 | CAPABILITIES OF 50 MICRON MONO-CAPILLARY Y. Yokota, S. Mamedov, A. Whitley, HORIBA Jobin Yvon Inc., Edison, NJ S. Ohzawa, HORIBA, Ltd., Kyoto, Japan |
| 3:45 | D-32 | NEW INSTRUMENTATION FOR X-RAY POWDER DIFFRACTION H.R. Ress, Bruker AXS Inc., Madison, WI A. Kern, K. Knorr, R. Schmidt, Bruker AXS GmbH, Karlsruhe, Germany |
| 4:00 | D-34 | DEVELOPMENT OF X-RAY INSPECTION TECHNOLOGY FOR TURBINE BLADES H. Huang, A. Verchinine, M. Cusack, W. Gibson, X-ray Optical Systems, Inc., East Greenbush, NY |
| 4:15 | F-34 | COMPACT MICRO-CT/MICRO-XRF SYSTEM FOR NON-DESTRUCTIVE 3D ANALYSIS OF INTERNAL CHEMICAL
COMPOSITION A. Sasov, X. Liu, P. Bruyndonckx, J. Van Geert, SkyScan, Kontich, Belgium |
| 4:30 | F-37 | ASPHERIC MULTILAYER OPTICS FORMICRO XRF APPLICATIONS S. Rodrigues, P. Panine, P. Høghøj, B. Lantz, Xenocs SA, Sassenage, France |
| 4:45 | F-49 | NEW PRODUCT FOR BORATE FUSION L. Bérubé, Corporation Scientifique Claisse, Quebec, Canada |
| 5:00 | F-50 | THE NEW BRUKER S8 LION MULTICHANNEL XRF A. Seyfarth, A. Buman, Bruker AXS Inc., Madison,WI K. Behrens, Bruker AXS GmbH, Karlsruhe, Germany |
| 5:15 | F-52 | THE NEW ORBIS MICRO-EDXRF ELEMENTAL ANALYZER J. Hardy, B. Scruggs, EDAX/a unit of Ametek, Inc., Mahwah, NJ |
| 5:30 | F-69 | MICRO-X-RAY FLUORESCENCE WITH THE M4 TORNADO M. Haschke, W. Malzer, U. Rossek, U. Waldschläger, H. Wagenknecht, Bruker AXS Microanalysis GmbH, Berlin, Germany |
XRD & XRF: HIGH ENERGY X-RAY OPTICS AND HIGH THROUGHPUT ANALYSIS |
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| Chairs: | S.D. Shastri, APS - Argonne National Laboratory, Argonne, IL I. Takeuchi, University of Maryland, College Park, MD |
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| 1:10 | D-95 | INVITED—HIGH-THROUGHPUT XRD AND ANALYSIS FOR RAPID DETERMINATION OF PHASE DISTRIBUTION ACROSS
COMBINATORIAL LIBRARIES I. Takeuchi, University of Maryland, College Park, MD |
| 1:40 | D-74 | INVITED—STRUCTURAL INVESTIGATION OF COMBINATORIAL GE-CO-MN EPITAXIAL THIN-FILM SYSTEM
USING SYNCHROTRON X-RAY MICROPROBE Y.S. Chu, APS/Argonne National Laboratory, Argonne, IL and Brookhaven National Laboratory, Upton, NY B.A. Collins, L. He, F. Tsui, University of North Carolina, Chapel Hill, NC |
| 2:10 | D-9 | INVITED—TIME-RESOLVED STRUCTURAL STUDIES: STRATEGIES FOR RAPIDLY IMAGING AND ANALYZING
LARGE DATA SETS M.J. Kramer, Ames Laboratory/Iowa State University, Ames IA |
| 2:40 | C-16 | HIGH ENERGY XRD/XRF FOR HIGH-THROUGHPUT ANALYSIS OF COMPOSITION SPREAD THIN FILMS J.M. Gregoire, R.B. van Dover, Cornell University, Ithaca, NY |
| 3:00 | BREAK | |
| 3:20 | D-45 | HIGH-ENERGY X-RAY OPTICS AT THE ADVANCED PHOTON SOURCE S.D. Shastri, APS/Argonne National Laboratory, Argonne, IL |
| 3:40 | C-14 | WITHDRAWN - INVITED—HIGH ENERGY X-RAY OPTICS FOR SYNCHROTRON RADIATION B. Lengeler, RWTH Aachen University, Aaachen, Germany |
| 4:10 | C-12 | INVITED—OPTICS FOR NUCLEAR RESONANT SCATTERING AT HIGH ENERGIES T.S. Toellner, APS/Argonne National Laboratory, Argonne, IL |
| 4:40 | D-88 | INVITED—SAGITTAL FOCUSING OF HIGH-ENERGY X-RAYS BY SAGITTALLY BENT LAUE CRYSTALS: DESIGN
AND PERFORMANCE AT NSLS X7B BEAMLINE Z. Zhong, D.M. Connor, A. Lenhard, H. Zhong, NSLS/Brookhaven National Laboratory, Upton, NY J. Hanson, Chemistry Dept/Brookhaven National Laboratory, Upton, NY |
| 5:10 | D-101 | HIGH-ENERGY MICRO-FOCUSING BYMERIDIONALLY-BENT LAUE CRYSTALS U. Lienert, Argonne National Laboratory, Argonne, IL |
XRD: LINE PROFILE ANALYSIS |
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| Chair: | D. Balzar, University of Denver, Denver, CO | |
| 1:30 | C-1 | INVITED—SINGLE-GRAINMICROSTRUCTURE FROM POLYCRYSTALLINE SPECIMENS T. Ungár, Eötvös University, Budapest, Hungary |
| 2:00 | D-17 | INVITED—ANALYSIS OF HIERARCHICAL DISLOCATION ARRANGEMENTS AT DIFFERENT LENGTH SCALES R.I. Barabash, Oak Ridge National Laboratory, Oak Ridge, TN and The University of Tennessee, Knoxville, TN G.E. Ice, Oak Ridge National Laboratory, Oak Ridge, TN |
| 2:30 | D-14 | UTILIZING THE DEBYE EQUATION IN NANOMATERIAL LINE PROFILE ANALYSIS K. Beyerlein, Georgia Institute of Technology, Atlanta, GA and University of Trento, Trento, Italy R.L. Snyder, Georgia Institute of Technology, Atlanta, GA P. Scardi, University of Trento, Trento, Italy |
| 2:50 | BREAK | |
| 3:20 | D-6 | INVITED—DIFFERENT ASPECTS OFMICROSTRAIN BROADENING A. Leineweber, E.J. Mittemeijer, Max Planck Institute for Metals Research, Stuttgart, Germany |
| 3:50 | D-52 | THERMAL STABILITY AND CRYSTALLIZATION OF AMORPHOUS AND NANOCRYSTALLINE TIO2 THIN FILMS
AND POWDERS STUDIED BY XRD R. Kužel, Z. Matěj, L. Nichtová, Charles University in Prague, Prague, Czech Republic |
| 4:10 | D-71 | HIGH-TEMPERATURE X-RAY DIFFRACTION OF ASTM A743 GRADE CA6NM CAST MARTENSITIC
STAINLESS STEEL J. Rojas, A. Toro, National University of Colombia, Antioquia, Columbia |
| 4:30 | D-91 | CHARACTERIZING X-RAYMIRRORS IN RECIPROCAL SPACE: RESULTS FROM THE NIST X-RAY OPTICS
EVALUATION DOUBLE-CRYSTAL DIFFRACTOMETER D.L. Gil, D. Windover, A. Henins, J. Cline, National Institute of Standards and Technology, Gaithersburg, MD |
XRF: ENVIRONMENTAL APPLICATIONS |
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| Chair: | R. Van Grieken, University of Antwerp, Antwerp, Belgium | |
| 1:30 | F-4 | INVITED—SIMULTANEOUS X-RAY AND ION BEAM TECHNIQUES FOR THE CHARACTERISATION AND
FINGERPRINTING OF FINE PARTICLE AIR POLLUTION AND ITS SOURCES IN THE ASIAN REGION D.D. Cohen, Australian Nuclear Science & Technology Organisation, Menai, Australia |
| 2:00 | F-29 | INVITED—DISTRIBUTION AND CHARACTERISTICS OF TOXIC ELEMENTS IN SOIL AND MINERALS BASED ON
X-RAY ANALYTICAL TECHNIQUES L. Luo, B. Chu, X. Wang, Y. Liu, National Research Center of Geoanalysis, Beijing, China |
| 2:30 | F-77 | INVITED—TXRF ANALYSIS OF ULTRAFINE ATMOSPHERIC PARTICLES FROM MOBILE SOURCES J. Osán, S. Török, KFKI Atomic Energy Research Institute, Budapest, Hungary |
| 3:00 | F-25 | THE TOXIC EFFECTS OF CALIFORNIA’S GOLD RUSH LEGACY: PROFILING A MAJOR NORTHERN CALIFORNIA
WATERSHED FOR ARSENIC USING HAND-HELD XRF P.E. Baker, P.T. Palmer, R. Johnson, San Francisco State University, San Francisco, CA |
| 3:20 | BREAK | |
| 3:40 | F-68 | QUANTITATIVE ANALYSIS OF LOW LEVEL TOXIC ELEMENTS IN SURFACE LAYER USING HDXRF Z.W. Chen, D. Li, K. Xin, A. Verchinine, W.M. Gibson, D. Gibson, X-ray Optical Systems, East Greenbush, NY |
| 4:00 | F-13 | EVALUATION OF SAMPLING METHODS FORMEASUREMENT OF ELEMENTS DEFINED BY THE
ROHS/WEEE DIRECTIVES J.E. Martin, L.L. Anderson-Smith, Spex SamplePrep, Metuchen, NJ |
| 4:20 | D-66 | SEM-EDS ANALYSIS OF FORENSIC/ENVIRONMENTAL SAMPLES BY UTILIZING TRANSITION-EDGE SENSOR
MICROCALORIMETER DETECTOR I. Nakai, Y. Ono, R. Suzuki, Q. Li, Tokyo University of Science, Tokyo, Japan K. Tanaka, S. Nakayama, H. Takahashi, SII NanoTechnology Inc., Shizuoka, Japan |
| 4:40 | F-47 | TXRF AND MICRO-XRF ANALYSIS OF PLASTIC TOYS AND SOILS K. Tsuji, M. Kawamata, Osaka City University, Osaka, Japan K. Nakano, Osaka City University, Osaka, Japan and JST Innovation Plaza, Osaka, Japan |
| 5:00 | F-2 | SOIL HEAVY METAL POLLUTION ALONG SUBIN RIVER IN KUMASI, GHANA: USING X-RAY FLUORESCENCE
(XRF) ANALYSIS K. Kodom, J. Wiafe-Akenten, Kwame Nkrumah University of Science and Technology, Kumasi, Ghana D. Boamah, Geological Survey Department, Accra, Ghana |
XRD & XRF: BIOENABLED MATERIALS |
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| Chairs: | R.L. Snyder, Georgia Institute of Technology, Atlanta, GA V. Petkov, Central Michigan University, Mt. Pleasant, MI |
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| 8:30 | D-43 | INVITED—CHEMICAL TAILORING OF BIOLOGICALLY-ASSEMBLED NANOSTRUCTURED 3-D MICROASSEMBLIES:
THE POTENTIAL FOR GENETICALLY ENGINEERED MATERIALS ANDMICRODEVICES (GEMS) K.H. Sandhage, Z. Bao, S. Shian, S. Davis, M.R. Weatherspoon, Y. Fang, Y. Cai, G. Wang, S.C. Jones, S.R. Marder, Georgia Institute of Technology, Atlanta, GA |
| 9:00 | D-4 | INVITED—NATURE-MADE NANOCRYSTALS: PDF STUDY ON BACTERIAL AND FUNGAL MNO V. Petkov, Central Michigan University, Mt. Pleasant, MI |
| 9:30 | D-10 | INVITED—NANOTECHNOLOGY AND THE STRUCTURE OF EDIBLE FATS A.G. Marangoni, N. Acevedo, M.F. Peyronel, University of Guelph, Guelph, ON, Canada |
| 10:00 | BREAK | |
| 10:30 | D-72 | INVITED—LATTICE DISTORTIONS, STRAIN AND STRESS IN BIOLOGICALLY FORMED CRYSTALS B. Pokroy, Harvard University, Cambridge, MA |
| 11:00 | D-92 | INVITED—NANOSTRUCTURING OF BIOMATERIALS—A PATHWAY TO OPTIMIZING BONE GRAFTING Th. Gerber, Rostock University, Rostock, Germany |
| 11:30 | C-15 | INVITED—BIOMINERAL ULTRASTRUCTURES REVEALED BY SYNCHROTRON SPECTROMICROSCOPY P. Gilbert, R. Metzler, C.E. Killian, S.N. Coppersmith, Y. Ma, Y. Politi, S. Weiner, L. Addadi, University of Wisconsin, Madison, WI |
| 12:00 | C-10 | SYNCHROTRON BASED SPECTRO-MICROSCOPY FOR CELL BIOLOGY S. Bohic, INSERM U-836, Grenoble, France and X-ray Imaging Group ESRF, Grenoble, France R. Tucoulou, G. Martinez-Criado, S. Labouré, M. Salomé, P. Cloetens, X-ray Imaging Group ESRF, Grenoble, France |
XRD & XRF: X-RAY IMAGING I |
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| Chairs: | H. Goebel, Siemens AG, Corp. Tech. and LabXA, Munich, Germany F. de Carlo, APS - Argonne National Laboratory, Argonne, IL |
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| 8:30 | C-3 | INVITED—LATEST DEVELOPMENTS IN MICRO AND NANO TOMOGRAPHY AT PETRA III A. Haibel, F. Beckmann, T. Dose, J. Herzen, S. Utcke, A. Schreyer, GKSS Research Centre, Geesthacht, Germany |
| 9:00 | D-44 | TOWARDS SUB-100 NM X-RAY MICROSCOPY FOR TOMOGRAPHIC APPLICATIONS P. Bruyndonckx, A. Sasov, B. Pauwels, SkyScan, Kontich, Belgium |
| 9:20 | C-11 | NANOTOMOGRAPHY AT THE ARGONNE HARD X-RAY NANOPROBE BEAMLINE R.P. Winarski, M.V. Holt, V. Rose, F. DeCarlo, J.M. Maser, Argonne National Laboratory, Argonne, IL |
| 9:40 | D-12 | MULTI-LENGTH-SCALE X-RAY COMPUTED TOMOGRAPHY WITH SUB-50 NM RESOLUTION FOR
NON-DESTRUCTIVE 3D VISUALIZATION AND ANALYSIS J. Gelb, A. Tkachuk, M. Feser, H. Chang, S. Chen, T. Fong, L. Hunter, I. Goldberger, S.H. Lau, W. Yun, Xradia, Inc., Concord, CA |
| 10:00 | BREAK | |
| 10:30 | C-8 | INVITED—GRATING BASED X-RAY PHASE CONTRAST IMAGING USING LABORATORY X-RAY SOURCES M. Schuster, Siemens AG Corporate Technology, Munich, Germany |
| 11:00 | D-39 | MONTE-CARLO SIMULATIONS FOR EVALUATION OF DIFFERENT INFLUENCES ON PROJECTIONS IN COMPUTED
TOMOGRAPHY B. Chyba, M. Mantler, Technische Universität Wien, Wien, Austria M. Reiter, Fachhochschule Wels, Austria |
| 11:20 | F-59 | X-RAY IMAGING ON BIOLOGICALMODEL ORGANISMS USING MICRO AND NANO X-RAY FLUORESCENCE B. De Samber, K. De Schamphelaere, B. Masschaele, S. Vanblaere, F. Vanhaecke, L. Van Hoorebeke, C. Janssen, L. Vincze, Ghent University, Ghent, Germany S. Bohic, G. Martinez-Criado, R. Tuculou, P. Cloetens, European Synchrotron Radiation Facility, Grenoble, France G. Falkenberg, Hamburger Synchrotronstrahlungslabor at DESY, Hamburg, Germany |
| 11:40 | F-17 | DEVELOPMENT OF A 3D ELEMENTAL REFERENCE MATERIAL FOR CONFOCALMICRO X-RAY FLUORESCENCE G.J. Havrilla, U.E. Fittschen, Los Alamos National Laboratory, Los Alamos, NM |
XRD: MATERIALS DEFORMATION STUDIES USING HIGH-ENERGY X-RAY DIFFRACTION I |
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| Chairs: | J. Almer, APS - Argonne National Laboratory, Argonne, IL D. Haeffner, APS - Argonne National Laboratory, Argonne, IL |
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| 9:00 | C-2 | INVITED—SINGLE GRAIN DEFORMATION EXPERIMENTS AT THE APS 1-ID BEAMLINE U. Lienert, Argonne National Laboratory, Argonne, IL |
| 9:30 | D-7 | INVITED—DEFORMATION MECHANISMS IN AMORPHOUS AND NANOCRYSTALLINE METALS MEASURED BY
IN SITU X-RAY DIFFRACTION R.T. Ott, Ames Laboratory (USDOE), Ames, IA |
| 10:00 | D-48 | INVESTIGATION OF SURFACE STRUCTURES BY POWDER DIFFRACTION: A DIFFERENTIAL PAIR DISTRIBUTION
FUNCTION (PDF) STUDY INTO ARSENATE SORPTION ON FERRIHYDRITE R. Harrington, D. Middlemiss, J. Parise, State University of New York at Stony Brook, Stony Brook, NY D. Hausner, D. Strongin, Temple University, Philadelphia, PA P. Chupas, K. Chapman, APS/Argonne National Laboratory, IL |
| 10:20 | BREAK | |
| 10:50 | D-80 | IN-SITU OBSERVATION OF DYNAMIC RECRYSTALLIZATION AND RELATED PHENOMENA IN THE BULK OF
ZIRCONIUM ALLOY K.-D. Liss, U. Garbe, H. Li, Australian Nuclear Science & Technology Organisation, NSW, Australia K. Yan, Australian Nuclear Science & Technology Organisation, NSW, Australia and University of Wollongong, NSW, Australia T. Schambron, University of Wollongong, NSW, Australia J. Almer, APS/Argonne National Laboratory, Argonne, IL |
| 11:10 | D-75 | MEASURING AND MODELING DEFORMATION PARTITIONING IN TITANIUM ALLOYS M.P. Miller, C. Efstathiou, P.R. Dawson, D.E. Boyce, Cornell University, Ithaca, NY U. Lienert, APS/Argonne National Lab., Argonne, IL |
XRF: TRACE ANALYSIS AND TXRF |
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| Chair: | M.A. Zaitz, IBM, Hopewell Junction, NY | |
| 8:30 | F-39 | INVITED—TXRF-XANES AND GI-XAS: X-RAY ABSORPTION SPECTROSCOPY IN TRACE ANALYSIS F. Meirer, Atominstitut/Vienna University of Technology, Vienna, Austria and Stanford Synchrotron Radiation Lightsource, Menlo Park, CA C. Streli, P. Wobrauschek, Atominstitut/Vienna University of Technology, Vienna, Austria G. Pepponi, D. Giubertoni, Fondazione Bruno Kessler, Povo (Trento), Italy P. Pianetta, Stanford Synchrotron Radiation Lightsource, Menlo Park, CA |
| 9:00 | F-60 | PORTABLE XRF FOR FDA FIELD INVESTIGATORS: A REVIEW OF SOME RECENT INVESTIGATIONS AND APPLICATIONS P.E. Baker, R.R. Jacobs, Consultant, U.S. FDA/San Francisco District Laboratory, Alameda, CA P.T. Palmer, San Francisco State University, San Francisco, CA |
| 9:20 | F-24 | SOLVING FORENSICS MYSTERIES WITH THE XRF MICROSCOPE S. Mamedov, F. Adar, E. Lee, A. Whitley, J. Goldey, G. Setola, Y. Yokota, HORIBA Jobin Yvon Inc., Edison, NJ D. Ward, xk, Inc., Clackamas, OR |
| 9:40 | F-27 | WATER ANALYSIS USING A PROTOTYPE MONOCHROMATIC MICROFOCUS GRAZING INCIDENCE X-RAY FLUORESCENCE
DEVICE COMPARING PICOLITER AND NANOLITER DEPOSITION AS SAMPLE PREPARATION APPROACH U.E.A. Fittschen, G.J. Havrilla, Los Alamos National Laboratory, Los Alamos, NM |
| 10:00 | F-75 | TRACE ELEMENT ANALYSIS OFMICRO-XRF BY PINPOINT CONCENTRATION METHOD A. Bando, H. Ono, K. Tsujita, H. Uchihara, HORIBA, Ltd., Kyoto, Japan |
| 10:20 | BREAK | |
| 10:40 | F-5 | PORTABLE TOTAL REFLECTION X-RAY FLUORESCENCE SPECTROMETER: COMPARISON BETWEEN
NON-MONOCHROMATIC AND MONOCHROMATIC X-RAY SOURCES J. Kawai, Y. Ueda, Y. Morikawa, N. Sasaki, S. Kunimura, T. Yamamoto, Kyoto University, Kyoto, Japan |
| 11:00 | F-33 | FILTERED TWO COLOR X-RAY MICROBEAMS FOR ENHANCEMENT IN SENSITIVITY OF LIGHT ELEMENTS S. Hayakawa, K. Izawa, T. Hirokawa, Hiroshima University, Hiroshima, Japan |
| 11:20 | F-48 | TXRF ANALYSIS OF MULTIPLE DROPLET RESIDUES K. Nakano, Osaka City University, Osaka, Japan and JST-Innovation Plaza, Osaka, Japan M. Kawamata, K. Tsuji, Osaka City University, Osaka, Japan |
| 11:40 | F-51 | TRACE ELEMENT ANALYSIS OF DIETARY SUPPLEMENTS AND NUTRIENTS BY TXRF H. Stosnach, A. Buman, Bruker AXS Microanalysis GmbH, Berlin, Germany M. Rider, A. Seyfarth, Bruker AXS Inc., Madison, WI J. Neil-Kababick, Flora Research, Grants Pass, OR |
| 12:00 | F-56 | DEPTH ANALYSIS WITH BENCH-TOP TXRF INSTRUMENT T. Yamada, Y. Shimizu, H. Kobayashi, H. Kohno, Rigaku Corporation, Osaka, Japan |
XRD & XRF: X-RAY IMAGING II |
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| Chairs: | H. Goebel, Siemens AG, Corp. Tech. and LabXA, Munich, Germany F. de Carlo, APS - Argonne National Laboratory, Argonne, IL |
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| 2:00 | C-13 | INVITED— OVERVIEW OF X-RAY IMAGING AT NSLS-II Y. Chu, NSLS II/Brookhaven National Laboratory, Upton, NY |
| 2:30 | C-7 | SYNCHROTRON-BASED RADIOSCOPY WITH SPATIO-TEMPORALMICRO-RESOLUTION USING HARD X-RAYS A. Rack, European Synchrotron Radiation Facility, Grenoble, France and Forschungszentrum Karlsruhe GmbH – ANKA, Karlsruhe, Germany F. García-Moreno, J. Banhart, Helmholtz Centre Berlin, Berlin, Germany O. Betz, Universität Tübingen, Germany S. Zabler, Technische Universität Berlin, Germany T. Baumbach, Forschungszentrum Karlsruhe GmbH – ANKA, Karlsruhe, Germany |
| 2:50 | C-9 | UTILIZATION OF SYNCHROTRON RADIATION IN NEUROCHEMICAL RESEARCH M. Szczerbowska-Boruchowska, J. Chwiej, S. Wójcik, Z. Stegowski, M. Lankosz, AGH-University of Science and Technology, Kraków, Poland D. Adamek, A. Krygowska-Wajs, B. Tomik, Z. Setkowicz, Jagiellonian University, Kraków, Poland K. Rickers, D. Zajac, HASYLAB-DESY, Hamburg, Germany J. Susini, European Synchrotron Radiation Facility, Grenoble, France |
| 3:10 | BREAK | |
| 3:40 | F-8 | X-RAYS IN 3D B.M. Patterson, G.J. Havrilla, K.A. Defriend Obrey, J.M. Campbell, Los Alamos National Laboratory, Los Alamos, NM |
| 4:00 | F-61 | POLYCAPILLARY BASED CONFOCAL DETECTION SCHEMES FOR XRF MICRO AND NANO-SPECTROSCOPY B. Vekemans, B. De Samber, T. Schoonjans, G. Silversmit, L. Vincze, R. Evens, K. De Schamphelaere, C.R. Janssen, B. Masschaele, L. Van Hoorebeeke, Ghent University, Ghent, Belgium S. Schmitz, F. Brenker, JWG University, Frankfurt, Germany R. Tucoulou, P. Cloetens, M. Burghammer, J. Susini, C. Riekel, European Synchrotron Radiation Facility, Grenoble, France |
| 4:20 | D-49 | RECENT DEVELOPMENT OF HARD X-RAY TRANSMISSIONMICROSCOPY AT THE 32ID BEAMLINE AT THE APS J.M. Yi, W.-K. Lee, F. De Carlo, APS/ Argonne National Laboratory, Argonne, IL Y.S. Chu, APS/Argonne National Laboratory, Argonne, IL and NSLS II/Brookhaven National Laboratory, Upton, NY W. Yun, Xradia Inc., Concord, CA Y. Hwu, Academia Sinica, Taipei, Taiwan |
| 4:40 | F-36 | PROTRUSIONS IN A PAINTING OFMAX BECKMANN EXAMINED WITH CONFOCAL XRF R. Simon, Forschungszentrum Karlsruhe/ISS, Karlsruhe, Germany W. Faubel, Forschungszentrum Karlsruhe/IFG, Karlsruhe, Germany H. Becker, Kunsthalle Mannheim, Mannheim, Germany W. Schmidt, Landesmuseum für Technik und Arbeit Mannheim, Germany |
XRD: STRESS ANALYSIS |
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| Chairs: | C. Goldsmith, IBM, Hopewell Junction, NY T. Watkins, Oak Ridge National Laboratory, Oak Ridge, TN |
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| 1:30 | D-11 | INVITED— NANOSCALE STRAIN CHARACTERIZATION IN MICROELECTRONICMATERIALS USING
X-RAY DIFFRACTION C.E. Murray, IBM T.J. Watson Research Center, Yorktown Heights, NY |
| 2:00 | D-21 | DIFFRACTION GEOMETRY AND THE DETERMINATION OF STRAIN FREE LATTICE PARAMETERS FOR RESIDUAL
STRESS MEASUREMENTS J.M. Shackleton, P.J. Withers, M. Preuss, University of Manchester, Manchester, United Kingdom |
| 2:20 | D-40 | GROWTH STRESSES AND TEXTURE OF NANO-STRUCTURED OXIDE LAYERS GROWING ON IRON ALUMINIDES P. Brito, H. Pinto, Max-Planck-Institut für Eisenforschung, Germany M. Klaus, Technische Universität Berlin, Berlin, Germany Ch. Genzel, A. Pyzalla, Helmholtz-Zentrum Berlin für Materialien und Energie, Berlin, Germany |
| 2:40 | D-68 | APPLICATION OF DIFFERENT METHODS FOR RESIDUAL STRESS MEASUREMENT OF A CASTING COMPONENT
OF AN EN-AC 44000 ALLOY S.M. Sadrossadat, S. Johansson, R.L. Peng, Linköping University, Linköping, Sweden |
| 3:00 | BREAK | |
| 3:30 | D-58 | INVITED— HIGH-PERFORMANCE XRPD WITH A NEW CHROMIUM MICRO FOCUS SOURCE H.E. Goebel, U. Hermeking-Goebel, LabXA, Munich, Germany B. Hasse, Incoatec GmbH, Geesthacht, Germany M. Honal, Siemens AG, Munich, Germany |
| 4:00 | D-23 | BENDING ZNO NANOWIRES WITH ATOMIC BOMBARDMENT J.I. Hong, Y. Shen, Z.L. Wang, R.L. Snyder, Georgia Institute of Technology, Atlanta, GA |
| 4:20 | D-79 | FROM SINGLE GRAINS TO TEXTURE K.-D. Liss, U. Garbe, The Bragg Institute/Australian Nuclear Science & Technology Organisation, NSW, Australia K. Yan, The Bragg Institute/Australian Nuclear Science & Technology Organisation, NSW, Australia and University of Wollongong, NSW, Australia R. Dippenaar, University of Wollongong, NSW, Australia J. Daniels, European Synchrotron Radiation Facility, Grenoble, France |
| 4:40 | D-61 | DISTRIBUTION OF RESIDUAL MICROSTRESSES IN ROLLED TI-NI SINGLE CRYSTALS Y. Perlovich, M. Isaenkova, V. Fesenko, Moscow Engineering Physics Institute, Moscow, Russia |
| 5:00 | D-53 | PRINCIPLES OF MICROSTRESS EQUILIBRIUM IN TEXTURED METAL MATERIALS Y. Perlovich, M. Isaenkova, V. Fesenko, Moscow Engineering Physics Institute (State University), Moscow, Russia |
| 5:20 | D-105 | APPLICATION OF X-RAY DIFFRACTION FOR RESIDENTIAL STRESS ANALYSIS ON CANADIAN NAVAL PLATFORMS |
XRD: MATERIALS DEFORMATION STUDIES USING HIGH-ENERGY X-RAY DIFFRACTION II |
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| Chairs: | J. Almer, APS - Argonne National Laboratory, Argonne, IL D. Haeffner, APS - Argonne National Laboratory, Argonne, IL |
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| 1:30 | D-73 | INVITED— IMPACT OF ZIRCONIUM HYDRIDE PRECIPITATES ON FRACTURE OF A ZIRCONIUM ALLOY M. Kerr, M.R. Daymond, R.A. Holt, Queen’s University, Kingston, ON, Canada S. Stafford, Kinectrics Inc., Toronto, ON, Canada J.D. Almer, APS/Argonne National Laboratory, Argonne, IL K. Colas, The Pennsylvania State University, University Park, PA |
| 2:00 | D-96 | INVITED— SYNCHROTRON X-RAY STUDIES OF DEFORMATION OF HEXAGONAL METALS D.W. Brown, W.R. Blumenthal, B. Clausen, T.A. Sisneros, C.N. Tomé, S.C. Vogel, Los Alamos National Laboratory, Los Alamos, NM S.R. Agnew, University of Virginia, Charlottesville, VA |
| 2:30 | D-84 | OBSERVATIONS OF RETAINED AUSTENITE STABILITY AND STRESS PARTITIONING IN TRANSFORMATION-INDUCED
PLASTICITY STEEL DURING IN SITU TENSILE TESTING USING SYNCHROTRON X-RAY DIFFRACTION K.-D. Liss, U. Garbe, Australian Nuclear Science and Technology Organisation, Lucas Heights, NSW, Australia L.C. Zhang, T. Schambron, E.V. Pereloma, University of Wollongong, Wollongong, NSW, Australia J. Almer, APS/Argonne National Laboratory, Argonne, IL |
| 2:50 | BREAK | |
| 3:20 | D-85 | 3D MEASUREMENTS OF POLYCRYSTAL RESPONSE TO ANNEALING C.M. Hefferan, S.F. Li, R.M. Suter, Carnegie Mellon University, Pittsburgh, PA U. Lienert, APS/Argonne National Laboratory, Argonne, IL |
| 3:40 | D-98 | MICROSTRUCTURE EVOLUTION IN COLD ROLLED NANOCRYSTALLINE NI-FE ALLOYS DETERMINED BY
SYNCHROTRON X-RAY DIFFRACTION L. Li, G.J. Fan, H. Choo, P.K. Liaw, The University of Tennessee, Knoxville, TN T. Ungar, G. Tichy, J. Lendvai, Eötvös University, Budapest, Hungary Y.D. Wang, N. Jia, Y.L. Yang, Northeastern University, Shenyang, P.R. China Y. Ren, Argonne National Laboratory, Argonne, IL |
| 4:00 | D-100 | BIOMECHANICS STUDIES AT APS USING HIGH-ENERGY X-RAYS J. Almer, APS/Argonne National Laboratory, Argonne, IL S. Stock, Northwestern University, Chicago, IL |
XRF: QUANTITATIVE ANALYSIS |
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| Chair: | W.T. Elam, Ametek/EDAX Research Group and Univ. of Washington APL, Seattle, WA | |
| 1:30 | F-57 | INVITED— CONSIDERATIONS ON CALIBRATION AND PREDICTION IN QUANTITATIVE X-RAY FLUORESCENCE
ANALYSIS P. Van Espen, University of Antwerp, Antwerp, Belgium |
| 2:00 | F-66 | COMPARISON OF VARIOUS XRF QUANTITATIVEMETHODS FOR DETERMINATION OF TOXIC ELEMENTS
IN SUPPLEMENTS P.T. Palmer, J. Hamdani, San Francisco State University, San Francisco, CA R. Jacobs, Consultant, FDA, San Francisco District Laboratory, Alameda, CA |
| 2:20 | F-44 | ASTM D 6247 DETERMINATION ELEMENTAL CONTENT OF POLYOLEFINS BY X-RAY FLUORESCENCE
SPECTROMETRY— VALIDATION OF THE REVISED STANDARD J.R. Sieber, National Institute of Standards and Technology, Gaithersburg, MD |
| 2:40 | F-42 | TRADITIONAL EMPIRICAL WDXRF CALIBRATION COMPARED WITH USING THE CALIBRATION TOOL
MULTISCAT®: APPLICATIONS SHOWN ON FOR METAL BASES S. Bäckman, I. Bernhardsson, XRF Analytical AB, Örsundsbro, Sweden |
| 3:00 | F-9 | COMBINED MULTIPLE-EXCITATION FP METHOD FORMICRO-XRF ANALYSIS OF DIFFICULT SAMPLES W.T. Elam, B. Scruggs, J. Nicolosi, EDAX, a unit of Ametek Inc., Mahwah, NJ |
| 3:20 | BREAK | |
| 3:40 | F-45 | SRM 2855 ADDITIVE ELEMENTS IN POLYETHYLENE WDXRF ANALYSES AND CERTIFICATION APPROACH J.R. Sieber, National Institute of Standards and Technology, Gaithersburg, MD |
| 4:00 | F-43 | OXIDIC CALIBRATION USING WDXRF-MULTISCAT®: APPLICATIONS SHOWN FOR MINERALS,
ORE CONCENTRATES AND SLAGS S. Bäckman, I. Bernhardsson, XRF Analytical AB, Sweden |
| 4:20 | F-31 | CLASSES OF MATERIALS (COM)—A TOOL FOR ANALYSIS AND MATERIAL IDENTIFICATION J. Kessler, V. Roßiger, Helmut Fischer GmbH+Co.KG, Sindelfingen, Germany M. Haller, Fischer Technology, Windsor, CT |
| 4:40 | F-54 | STARDUST COMETARY MATTER ANALYZED BY SYNCHROTRON NANO-XRF: NEW RESULTS AND DEVELOPMENTS T. Schoonjans, B. Vekemans, G. Silversmit, L. Vincze, Ghent University, Gent, Belgium S. Schmitz, F. Brenker, Institut für Geowissenschaften, Frankfurt, Germany |
| 5:00 | F-64 | L SHELL X-RAY FLUORESCENCE CROSS-SECTIONS FOR ELEMENTS WITH 33 ≤ Z ≤ 50 V. Sharma, N. Singh, S. Kumar, Panjab University, Chandigarh, India |
XRD: HIGH RESOLUTION XRD |
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| Chair: | B. Tanner, University of Durham, Durham, United Kingdom | |
| 8:30 | D-15 | INVITED— LABORATORY-BASED CHARACTERIZATION OF HETEROEPITAXIAL STRUCTURES: ADVANCED EXPERIMENTS
NOT NEEDING SYNCHROTRON RADIATION P. Zaumseil, IHP, Frankfurt, Germany |
| 9:00 | D-67 | HIGH-RESOLUTION X-RAY DIFFRACTION DATA ANALYSIS FROM THE PARTLY RELAXED SEMICONDUCTOR
STRUCTURES A. Ulyanenkov, Bruker AXS GmbH, Karlsruhe, Germany A. Benediktovitch, I. Feranchuk, Belarussian State University, Minsk, Belarus B. He, H. Ress, Bruker AXS, Inc., Madison, WI |
| 9:20 | D-59 | SPATIALLY RESOLVED DETERMINATION OF STRESS IN THIN FILMS AND DEVICES FROM
CURVATURE MEASUREMENTS N. Herres, Interstate University of Applied Sciences, Buchs, Switzerland |
| 9:40 | D-57 | NIST SRM 2000—A HIGH RESOLUTION X-RAY DIFFRACTION STANDARD REFERENCEMATERIAL D. Windover, D.L. Gil, A. Henins, J.P. Cline, National Institute of Standards & Technology, Gaithersburg, MD |
| 10:00 | BREAK | |
| 10:20 | D-89 | INVITED— SIX WAYS OF DETERMINING FILM THICKNESS FROM HIGH RESOLUTION XRD DATA A.J. Ying, I.C. Noyan, Columbia University, New York, NY C.E. Murray, IBM T. J. Watson Research Laboratory, Yorktown Heights, NY |
| 10:50 | D-28 | HIGH-RESOLUTION X-RAY SCATTERING METHODS FOR THE STRUCTURAL CHARACERTIZATION OF EPITAXIAL
NITRIDE STRUCTURES J.F. Woitok, PANalytical B.V., Almelo, Netherlands |
| 11:10 | D-87 | GRAZING INCIDENCE IN-PLANE X-RAY DIFFRACTION FROM EPITAXIAL FE/MGO/FE AND FE/AU/MGO/FE TUNNEL
JUNCTIONS D.S. Eastwood, M. Abes, B.K. Tanner, University of Durham, Durham, United Kingdom T.P.A. Hase, University of Warwick, Coventry, United Kingdom M. Ali, B.J. Hickey, University of Leeds, Leeds, United Kingdom |
XRD: RIETVELD ANALYSIS |
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| Chairs: | S.T. Misture, NYS College of Ceramics at Alfred University, Alfred, NY R.L. Snyder, Georgia Institute of Technology, Atlanta, GA |
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| 8:30 | D-86 | INVITED— STRUCTURE SOLUTION AND REFINEMENT APPROACHES FOR OXIDE CERAMICS S.T. Misture, Alfred University, Alfred, NY |
| 9:00 | D-54 | CHARGE-FLIPPING STRUCTURE SOLUTION FROM SINGLE CRYSTAL AND POWDER DIFFRACTION DATA A. Kern, A.A. Coelho, Bruker AXS, Karlsruhe, Germany |
| 9:20 | D-65 | POWDER DIFFRACTION FOR CHARACTERIZATION AND DEVELOPMENT OF OXIDE FUELS H.M. Volz, C.R. Stanek, E.P. Luther, J.T. Dunwoody, R.M. Dickerson, K.J. McClellan, S.C. Vogel, D.A. Weldon, D.R. Coughlin, D.D. Byler, Los Alamos National Laboratory, Los Alamos, NM |
| 9:40 | D-26 | QUANTITATIVE ANALYSIS OF PHASES WITH PARTIAL OR NO KNOWN CRYSTAL STRUCTURE H. Cordes, Bruker AXS, Inc., Madison, WI A. Kern, Bruker AXS GmbH, Karlsruhe, Germany |
| 10:00 | BREAK | |
| 10:20 | D-47 | INVITED— STUDYING OXIDES, ALLOYS, GAS HYDRATES, BOROHYDRIDES, ANDMETAL-ORGANIC-FRAMEWORK
STRUCTURES USING THE RIETVELD METHOD C.J. Rawn, Oak Ridge National Laboratory/University of Tennessee, Oak Ridge, TN |
| 10:50 | D-90 | ADDRESSING THE AMORPHOUS CONTENT ISSUE IN QUANTITATIVE PHASE ANALYSIS: THE CERTIFICATION
OF NIST SRM 676A J.P. Cline, J.J. Filliben, National Institute of Standards & Technology, Gaithersburg, MD R.B. Von Dreele, Argonne National Laboratory, Argonne, IL R. Winburn, Minot State University, Minot, ND P.W. Stephens, State University of New York at Stony Brook, Stony Brook, NY |
| 11:10 | D-18 | CRYSTAL STRUCTURES OF THE MINERALS STICHTITE ANDWOODALLITE USING RIETVELD REFINEMENT P.S. Whitfield, National Research Council Canada, Ottawa ON, Canada S.A. Wilson, S.J. Mills, G.M. Dipple, M. Raudsepp, University of British Columbia, Vancouver BC, Canada |
XRF: FUSION AND INDUSTRIAL APPLICATIONS OF XRF |
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| Chair: | J.A. Anzelmo, Anzelmo & Associates, Inc., Madison, WI | |
| 8:30 | F-78 | INVITED— APPLICATIONS OF X-RAY FLUORESCENCE (XRF) IN THE GLASS INDUSTRY L.M. Schurter, Owens Corning, Science and Technology Center, Granville, OH |
| 9:00 | F-58 | INVITED— ESTABLISHING PERFORMANCE CRITERIA FOR AN ASTM XRF STANDARD TEST METHOD FOR
PORTLAND CEMENTS P. Stutzman, National Institute of Standards and Technology, Gaithersburg, MD |
| 9:30 | F-53 | GLOBAL CEMENT AND RAWMATERIALS FUSION/XRF ANALYTICAL SOLUTION M. Bouchard, S. Rivard, J. Anzelmo, Corporation Scientifique Claisse, Quebec, Canada A. Seyfarth, L. Arias, Bruker-AXS, Madison, WI K. Behrens, Bruker-AXS GmbH, Karlsruhe, Germany |
| 9:50 | F-18 | ANALYSIS OF IRON ORE USING X–RAY FLUORESCENCE SPECTROMETER P. Sharma, N.C. Lakshman, B.K. Choudhary, N.K. Nanda, NMDC Limited, Hyderabad, India |
| 10:10 | BREAK | |
| 10:30 | F-10 | MOLYBDENUM CONCENTRATES - BORATE FUSION WITH NIOBIUM INTERNAL STANDARD J.R. Sieber, National Institute of Standards & Technology, Gaithersburg, MD |
| 10:50 | F-15 | OPTIMIZING XRF CALIBRATION PROTOCOLS FOR ELEMENTAL QUANTIFICATION OF MINERAL SOLIDS
FROM ATHABASCA OIL SANDS B. Patarachao, P.H.J. Mercier, J. Kung, J.R. Woods, L.S. Kotlyar, T. McCracken, National Research Council Canada, Ottawa ON, Canada B.D. Sparks, V. Bede Technical Associates, Ottawa ON, Canada |
| 11:10 | C-5 | ABSOLUTE THICKNESS DETERMINATION OF SMCO FILMS ON SILICON SUBSTRATES UTILIZING X-RAY
DIFFRACTION AND THEIR COMPOSITION MEASUREMENTS BY EXRF I. Vander, F.J. Cadieu, Queens College CUNY, Flushing, NY |