Read the Summary
The 59th Annual DXC was held 2-6 August 2010 at the Denver Marriott Tech Center Hotel, Denver, Colorado, U.S.A.
The 60th Annual DXC will be held 1-5 August 2011, Crowne Plaza Hotel, Colorado Springs, Colorado, U.S.A.
Pre-registration for the Denver X-ray Conference & the North American Core Shell Spectroscopy Conference has ended.
Registration reopened at the conference.
All on-site registrations were conducted at the Conference Registration Desk, located on the ground floor (level one) of the Denver Marriott Tech Center Hotel, outside the Evergreen Ballroom.
Registration Times:
Sunday, 1 August 4:00 pm–7:00 pm
Monday, 2 August 8:00 am–3:00 pm
Tuesday, 3 August 8:00 am–3:00 pm
Wednesday, 4 August 8:00 am–2:00 pm
Thursday, 5 August 8:00 am–2:00 pm
See the complete 2010 DXC Program (PDF) or view Workshops, XRD Poster Session, XRF/XRD Poster Session, and Sessions.
Pair Distribution Function
Texture Analysis
Using FEFF to Model Real-World Systems
2010 DENVER X-RAY CONFERENCE ORGANIZING COMMITTEE
Robert L. Snyder, Chair
Georgia Institute of Technology, Atlanta, GA
W. Tim Elam, Co-Chair
EDAX, Inc., Mahwah, NJ and University of Washington, Redmond, WA
John A. Anzelmo
Anzelmo & Associates, Inc., Madison, WI
Thomas Blanton
Eastman Kodak Company Research Labs, Rochester, NY
Victor E. Buhrke, Past Chair
Consultant, Portola Valley, CA
Tim Fawcett
International Centre for Diffraction Data, Newtown Square, PA
Denise Flaherty
International Centre for Diffraction Data, Newtown Square, PA
George J. Havrilla
Los Alamos National Laboratory, Los Alamos, NM
Ting C. Huang
Emeritus, IBM Almaden Research Center, San Jose, CA
James A. Kaduk
INEOS Technologies, Naperville, IL
Terry Maguire
International Centre for Diffraction Data, Newtown Square, PA
Scott T. Misture
NYS College of Ceramics at Alfred University, Alfred, NY
I. Cev Noyan
Columbia University, New York, NY
Brian Toby
APS—Argonne National Laboratory, Argonne, IL
René Van Grieken
University of Antwerp, Antwerp, Belgium
Mary Ann Zaitz
IBM, Hopewell Junction, NY
Download the DXC Program (PDF)
Advances in X-ray Analysis
Volume 51, Advances in X-ray Analysis, proceedings of the 2007 Denver X-ray Conference, is now available on CD-ROM.
Advances in X-ray Analysis - proceedings of the 2007 Denver X-ray Conference and previous years are available on CD-ROM and through the ICDD website.
Have an idea for a workshop or session? - Submit your suggestion to the Denver X-ray Conference Organizing Committee for consideration.
Authors - Please remember to read the updated Preparation of Manuscripts for Electronic Publication Page for Advances in X-ray Analysis
Denver X-ray Conference Awards - learn how to earn the Jenkins, Barrett, Birks, and Jerome B. Cohen awards