2010 Denver X-ray Conference Information:

Program

Thermo Scientific

Chemplex

Sponsors Polymer Workshop

Blake Industries, Inc.

Bruker AXS, Inc.

PANalytical Inc.

Rigaku Americas Corporation

Cultural Heritage

 

2010 Denver X-ray Conference Information:

call for papers 2010

Read the Summary

The 59th Annual DXC was held 2-6 August 2010 at the Denver Marriott Tech Center Hotel, Denver, Colorado, U.S.A.
The 60th Annual DXC will be held 1-5 August 2011, Crowne Plaza Hotel, Colorado Springs, Colorado, U.S.A.

Pre-registration for the Denver X-ray Conference & the North American Core Shell Spectroscopy Conference has ended.
Registration reopened at the conference.

All on-site registrations were conducted at the Conference Registration Desk, located on the ground floor (level one) of the Denver Marriott Tech Center Hotel, outside the Evergreen Ballroom.

Registration Times:
Sunday, 1 August 4:00 pm–7:00 pm
Monday, 2 August 8:00 am–3:00 pm
Tuesday, 3 August 8:00 am–3:00 pm
Wednesday, 4 August 8:00 am–2:00 pm
Thursday, 5 August 8:00 am–2:00 pm

Joint Meeting with the North American Core Shell Spectroscopy Conference

See the complete 2010 DXC Program (PDF) or view Workshops, XRD Poster Session, XRF/XRD Poster Session, and Sessions.

Special Notices for Workshops:
Pair Distribution Function
Texture Analysis
Using FEFF to Model Real-World Systems

 

Denver X-ray Conference Program-at-a-Glance - Monday, 2 August - Friday, 6 August 2010
Monday Morning Workshops 9am - 12 Noon
  Evergreen A Evergreen B Evergreen C Evergreen D
XRD Survey of Basic XRD Applications (Misture)   Trace Phase Identification using Chemical Information (Kaduk/Fawcett) Texture Analysis I (Schaeben)
XRF   Standards and Advanced Sample Prep for XRD Analysis (Tsuji)    
Monday Afternoon Workshops 2pm - 5pm
XRD Two-Dimensional Detectors (Blanton/He)     Texture Analysis II (Schaeben)
XRF   Trace Analysis (Heckel) Basic XRF (Elam)  
Monday Evening - XRD Poster Session & Reception 5:30 - 7:30 pm - Sponsored by Thermo Scientific & ICDD; Exhibit hall/Atrium (Kaduk/Watkins)
Tuesday Morning Workshops 9am - 12 noon
XRD & XRF Cultural Heritage I (Walton/Eremin)     Using FEFF to Model Real-world Systems (Segre)
Held in rooms Evergreen E&F.
XRD   Pair Distribution Function (Petkov) Polymers I (Murthy/Landes)  
XRF       Quantitative Analysis I (Mantler)
Tuesday Afternoon Workshops 2pm - 5pm
XRD & XRF Cultural Heritage II (Walton/Eremin)      
XRD     Polymers II (Murthy/Landes)  
XRF   Specimen Preparation XRF (Anzelmo)   Quantitative Analysis II (Mantler)
Tuesday Evening - XRF/XRD Poster Session & Reception 5:30 - 7:30 pm Sponsored by Chemplex; Exhibit hall/Atrium (Rosenfeld/Van Grieken)
Wednesday Morning - Plenary Session 8:15am - 12:30pm The Greening of X-rays: X-rays & Renewable Energy (Toby/Snyder) Evergreen Ballroom
Wednesday Afternoon Sessions
XRD & XRF     New Developments in XRD & XRF Instrumentation (Fawcett)  
XRD Polymers/SAXS (Murthy/Landes)     Hanawalt Award Session - Nanostructure Studies using the Atomic PDF (Bozin)
XRF   Fusion & Industrial Applications of XRF (Anzelmo)    
Thursday Morning Sessions
XRD     Rietveld Analysis I (Kaduk/Misture)  
XRF   Envirionmental & Handheld XRF (Anzelmo/Van Grieken)   Quantitiative Analysis (Elam)
Thursday Afternoon Sessions
XRD & XRF Cultural Heritage I (Walton/Eremin)      
XRD     Rietveld Analysis II (Kaduk/Misture) Micro Diffraction 1/4 day (Murray)
Mile High Resolution 1/4 day (Evans-Lutterodt)
XRF   X-ray Images (Havrilla)    
Thursday Evening - Off Site Event. Details to be posted.
Friday Morning Sessions
XRD & XRF Cultural Heritage II (Walton/Eremin)      
XRD   Stress Analysis (Goldsmith/Watkins)    
XRF     Trace Analysis (Wobrauschek)  

 

2010 DENVER X-RAY CONFERENCE ORGANIZING COMMITTEE

Robert L. Snyder, Chair
Georgia Institute of Technology, Atlanta, GA
W. Tim Elam, Co-Chair
EDAX, Inc., Mahwah, NJ and University of Washington, Redmond, WA
John A. Anzelmo
Anzelmo & Associates, Inc., Madison, WI
Thomas Blanton
Eastman Kodak Company Research Labs, Rochester, NY
Victor E. Buhrke, Past Chair
Consultant, Portola Valley, CA
Tim Fawcett
International Centre for Diffraction Data, Newtown Square, PA
Denise Zulli
International Centre for Diffraction Data, Newtown Square, PA
George J. Havrilla
Los Alamos National Laboratory, Los Alamos, NM
Ting C. Huang
Emeritus, IBM Almaden Research Center, San Jose, CA
James A. Kaduk
INEOS Technologies, Naperville, IL
Terry Maguire
International Centre for Diffraction Data, Newtown Square, PA
Scott T. Misture
NYS College of Ceramics at Alfred University, Alfred, NY
I. Cev Noyan
Columbia University, New York, NY
Brian Toby
APS—Argonne National Laboratory, Argonne, IL
René Van Grieken
University of Antwerp, Antwerp, Belgium
Mary Ann Zaitz
IBM, Hopewell Junction, NY

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Download the DXC Program (PDF)

 

dates


Advances in X-ray Analysis

dxc

Volume 51, Advances in X-ray Analysis, proceedings of the 2007 Denver X-ray Conference, is now available on CD-ROM.

Advances in X-ray Analysis - proceedings of the 2007 Denver X-ray Conference and previous years are available on CD-ROM and through the ICDD website.

Have an idea for a workshop or session? - Submit your suggestion to the Denver X-ray Conference Organizing Committee for consideration. 

Authors - Please remember to read the updated Preparation of Manuscripts for Electronic Publication Page for Advances in X-ray Analysis

Denver X-ray Conference Awards - learn how to earn the Jenkins, Barrett, Birks, and Jerome B. Cohen awards