2010 Denver X-ray Conference Information:

Program

Thermo Scientific

Chemplex

Sponsors Polymer Workshop

Blake Industries, Inc.

Bruker AXS, Inc.

PANalytical Inc.

Rigaku Americas Corporation

Cultural Heritage

 

2010 Denver X-ray Conference Information:

call for papers 2010

DXC 2010 Summary

The 59th Annual Denver X-ray Conference (DXC) was held in Denver, Colorado from 2-6 August 2010 at the Denver Marriott Tech Center Hotel, and was a joint meeting with the North American Core Shell Spectroscopy Conference (NACSSC). The meetings attracted more than 300 attendees, and close to 160 exhibit staff.

Conference week began with 16 tutorial workshops for DXC, held on Monday and Tuesday, and one workshop for NACSSC held on Tuesday morning. The topic for the NACSSC workshop was Using FEFF to Model Real-World Systems. Topics for the DXC workshops included:

XRD & XRF –
Cultural Heritage I & II

XRD –  
Survey of Basic XRD Applications
Trace Phase Identification using Chemical Information
Texture Analysis I & II
Two-Dimensional Detectors
Polymers I & II
Pair Distribution Function

XRF –
Standards & Advanced Sample Preparation for XRF Analysis
Trace Analysis
Basic XRF
Quantitative Analysis I & II
Specimen Preparation XRF

Sessions for DXC were held Wednesday, Thursday and Friday morning. Session topics included:

XRD & XRF – 
New Developments in XRD & XRF Instrumentation
Cultural Heritage I & II

XRD –
Polymers/SAXS
Hanawalt Award Session: Nanostructure Studies using the Atomic Pair Distribution Function
Rietveld Analysis I & II
Micro Diffraction
Mile High Resolution
Stress Analysis

XRF –
Fusion & Industrial Applications of XRF
Environmental & Handheld XRF
Quantitative Analysis
X-ray Imaging
Trace Analysis

The Plenary Session, The Greening of X-rays: X-rays and Renewable Energy, took place on Wednesday morning and was organized by Robert L. Snyder, Georgia Institute of Technology, Atlanta, GA and Brian Toby, APS, Argonne National Laboratory, Argonne, IL. Five invited talks were given during the plenary session:

Investigations of the Defect Structure of Transparent Conductors Using X-ray and Neutron Scattering Techniques
Gabriela B. González Avilés, DePaul University, Chicago, IL
T.O. Mason, J.S. Okasinski, O. Warschkow, D.E. Ellis, Northwestern University, Evanston, IL
J.P. Hodges, Oak Ridge National Laboratory, Oak Ridge, TN
T. Buslaps, V. Honkimäki, European Synchrotron Radiation Facility, Grenoble, France

Insights into Thermoelectric Materials: New Structures and Properties
Paul Zschack, Argonne National Laboratory, Argonne, IL
C. Heideman, Q. Lin, N. Nguyen, M. Smeller, C. Mortensen, D.C. Johnson, University of Oregon, Eugene, OR

In-Situ Diffraction: An Important Tool for the Development of Renewable Energy Technologies
Mark A. Rodriguez, Sandia National Laboratories, Albuquerque, NM

Unraveling the Inner Workings of Energy-Related Materials Using In-Situ X-ray Absorption Techniques
Faisal M. Alamgir, Georgia Institute of Technology, Atlanta, GA

FP-Based EDXRF Characterization of Thin Film Solar Cells
Volker Rößiger, J. Kessler, Helmut Fischer GmbH, Sindelfingen, Germany
M. Haller, Fischer Technology, Inc., Windsor, CT

At the Plenary session, the 2010 Birks Award was presented to Victor Buhrke, Consultant, Portola Valley, CA to honor his significant contributions to the field of X-ray spectrometry. Dr. Buhrke had announced at an earlier date his retirement from the DXC Organizing Committee, and was surprised with an additional plaque, thanking him for his service to the conference. The citation read:

This plaque is presented to Victor E. Buhrke on the occasion of his retirement from the Denver X-ray Conference. This not only recognizes the all time record of attendance at 52 Denver Conferences but also his decades of dedicated service and contributions to the Denver X-ray Conference as a Session Chairman, Workshop Instructor and, both Chairman and Member of the Organizing Committee. A true scientist and a dear friend, we thank Dr. Buhrke for sharing his expertise, exceptional talent, and positive spirit.

The Hanawalt Award was also given at this year’s conference. The award is presented every three years for an important, recent contribution to the field of powder diffraction. The 2010 recipients were Takeshi Egami, University of Tennessee, Knoxville, TN and Simon Billinge, Columbia University, New York, NY. The awards were presented during a special Hanawalt Award Session: Nanostructure Studies Using the Atomic Pair Distribution Function, and were presented by Thomas Blanton, ICDD Chairman of the Board, Eastman Kodak Company, Rochester, NY.

There was no winner for the 2010 Jerome B. Cohen Student Award.

The Plenary Session also provided a venue to memorialize the passing of Gordon S. Smith. A tribute poster was created with the help of Bob Snyder, Georgia Institute of Technology, Atlanta, GA and Quintin Johnson, MDI, Livermore, CA. The following is an excerpt from the tribute:

Many of us have memories of Gordon participating in a large number of Denver X-ray Conferences over the years. Gordon was one of the scientists who initiated the renaissance of powder diffraction in the 1970s.  This began with the development of laboratory computers allowing the automation of the powder diffractometer and the simultaneous evolution of large computers allowing in depth evaluation of powder diffraction standards.  In 1978 he was a co-author of “An Analysis of the Powder Diffraction File”, an extensive study that led ultimately to the adoption by the ACA and the IUCr of “The Standard Form for Powder Diffraction Data”.  This laid the groundwork for the expansion of the Powder Diffraction File from ~40,000 to over 600,000 today.

The NACSSC began their sessions on Tuesday afternoon with the Stern Symposium, chaired by Daniel Haskel, APS – Argonne National Laboratory, Argonne, IL. The honoree, Edward A. Stern, was present and gave the closing remarks at the end of the session. The following invited talks were given during the symposium:

Studies of Li-Ion Battery Materials Using Synchrotron Methods
M. Balasubramanian, Argonne National Laboratory, Argonne, IL

XAS Studies of Phase Change Memory Materials in the Ge-Sb-Te System
M. Paesler, J. Washington, G. Lucovsky, North Carolina State University, Raleigh, NC

Perfecting the EXAFS Equation
J.J. Rehr, University of Washington, Seattle, WA

Standardizing Novel Core-Shell Spectroscopies
G. Seidler, University of Washington, Seattle, WA

Electronic, Structural and Thermal Properties of Nanocatalysts: Non-Metal, Non-Bulk and Non-Debye
A.I. Frenkel, Yeshiva University, New York, NY

The Use of XAS Processes for Environmental Science
K. Kemner, M. Boyanov, E. O’Loughlin, K. Skinner, D. Sholto-Douglas, B. Lai, F. DeCarlo, D. Mancini, Argonne
National Laboratory, Argonne, IL
E. Carpenter, Virginia Commonwealth University, Richmond, VA
W. Walsh, Naperville, IL
K. Nealson, University of Southern California, Los Angeles, CA

In addition to the Stern Symposium, the NACSSC hosted five special sessions that included 26 oral presentations.

Poster sessions were held on Monday and Tuesday of conference week. Judges were appointed each night to select the best posters. The following posters were selected as the best:

XRD:
An Alternative Voyage Through Reciprocal Space
K.D. Rogers, J. Rogers, A. Dicken, Cranfield University, Cranfield, Bedfordshire, UK
P. Evans, J.W. Chan, X. Wang, Nottingham Trent University, Nottingham, UK

Nano-Beam X-ray Diffraction Reveals Structural and Mechanical Gradients in Nano-Crystalline Thin Films
J. Keckes, M. Bartosik, University Leoben, Leoben, Austria
G. Maier, Materials Centre Leoben, Leoben, Austria
M. Burghammer, ESRF, Grenoble, France

XRD Winning Smiles: Analysis of Dental Calculus in Bioarchaeology
S. Beckett, C. Greenwood, S. Ralph, K.D. Rogers, Cranfield University, Shrivenham, UK
K. Hardy, BioArch, University of York, York, UK
J.G. Clement, The University of Melbourne, Melbourne, Australia

XRF:
Levels and Spatial Distribution of Trace Elements in Bone Following Strontium Treatment in Calcium Deficient Rats
F. Meirer, Atominstitut, Technische Universitaet Wien, Vienna, Austria and Stanford Synchrotron Radiation Lightsource, Menlo Park, CA
J.G. Hofstaetter, Hanusch Hospital, Vienna, Austria and Vienna General Hospital, Vienna, Austria
S. Smolek, B. Pemmer, P. Wobrauschek, C. Streli, Atominstitut, Technische Universitaet Wien, Vienna, Austria
R. Simon, Forschungszentrum Karlsruhe GmbH, Eggenstein-Leopoldshafen, Germany
R.K. Fuchs, M.R. Allen, K.W. Condon, S. Reinwald, D.B. Burr, Indiana University, Indianapolis, IN
D. McClenathan, B. Keck, R.J. Phipps, Proctor and Gamble Pharmaceuticals, Mason, OH

Analytical Performance of Newly Developed 2D/3D-XRF Instruments
T. Nakazawa, K. Nakano, K. Tsuji, Osaka City University, Osaka, Japan

The Determination of Copper Speciation in Breast Tumor Tissue Using a Compact, Short Focal Distance Bent Crystal Laue Analyzer
N. Kujala, R. Barrea, BioCAT, Illinois Institute of Technology, Chicago, IL
C. Karanfil, Mugla University, Kotekli-Mugla, Turkey
D. Chen, Q.P. Dou, Wayne State University, Detroit, MI

Exhibits at the conference ran from Monday to Thursday with 46 companies displaying their various products and services for X-ray powder diffraction and X-ray fluorescence spectrometry. The following companies participated at the exhibits:
Alfa Aesar, a Johnson Matthey Co.
AMPTEK Inc.
Angstrom, Inc.
Anton Paar
Blake Industries, Inc.
Bruker AXS
Brush Wellman Electrofusion Products
Chemplex Industries
Corporation Scientifique Claisse, Inc.
e2v Scientific Instruments
Hecus X-Ray Systems
Heraeus Platinum Labware
Herzog Automation Corporation
Horiba Scientific
Huber Diffraktionstechnik - AXO DRESDEN GmbH
IMP Group PTY LTD
INCOATEC GmbH
Innov-X Systems, Inc.
International Centre for Diffraction Data (ICDD)
KETEK GmbH
Kitco Metals, Inc.
Materials Data Inc (MDI)
Micro Photonics, Inc.
Micromatter (AAPS)
MOXTEK, Inc.
Opti Temp, Inc.
Oxford Cryosystems
PANalytical
Panasonic Corporation
PNDetector GmbH
Premier Lab Supply, Inc.
Proto Manufacturing Inc.
Rigaku Americas Corp.
Rigaku Innovative Technologies, Inc.
Rocklabs Limited
Roenalytic GmbH
Sietronics Pty Ltd
SII Nanotechnology USA, Inc.
SPEX Sample Prep LLC
Thermo Scientific - Niton XRF Analyzers
Thermo Scientific - Scientific Instruments
Wiley-Blackwell
Xenocs SA
XGLab S.R.L.
XIA LLC
X-ray Optical Systems, Inc.


To see a complete list of the products and services that the exhibitors displayed at the DXC, please visit the website: http://www.dxcicdd.com/10/exhibitors.htm.

Social events were also held during conference week. Thermo Scientific and ICDD sponsored the Monday evening poster session and Wine & Cheese Reception. Tuesday evening’s reception and poster session was sponsored by Chemplex. Exhibits remained open on both nights. On Thursday evening, an off-site event was held in lower downtown Denver, the “Historical Hauntings – LoDo Ghost Tour”. The night began with dinner in one of the Mile High City’s former “Red Light District” brothels, the Rox Room, formerly known as Mattie’s House of Mirrors. Following dinner, a professional historian and “ghost guide” took attendees on a walking tour of the restored 100-year old buildings and warehouses of LoDo.

The Organizing Committee would like to acknowledge the workshop instructors, invited speakers and session chairs for all the time and effort they volunteered to make this conference a great success. They would also like to send their appreciation to Thermo Scientific and Chemplex for supporting the poster sessions. For a preview of the 2011 Program, visit www.dxcicdd.com.