60th Annual Conference on Applications of X-ray Analysis

Providing a unique mixture of sessions on training, education, and applications and papers containing details about state-of-the-art techniques and future developments in X-ray analysis.

List of Abstracts of the 2011 DXC


198 of 2011 DXC abstracts sorted by correspondent author's last name

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INVESTIGATING THE DETECTION LIMITS OF A ROTATING ANODE X-RAY DIFFRACTOMETER FOR OIL SANDS SAMPLES
M.R., Afara, Natural Resources Canada, Devon, AB, Canada
R.J., Mikula, Natural Resources Canada, Devon, AB, Canada
AN APPROACH TO QUANTITATIVE INTERPRETATION OF XRD PATTERNS OF MINERAL MIXTURES USING STANDARD REFERENCE MINERALS AND THEIR FWHM IN THE PXRD-WHOLE ROCK DIFRACTOGRAMS
D. Alaygut*, B. Canga, Turkish Petroleum Corp. Research Center, Ankara, Turkey
RE-CONFIGURABLE DIGITAL PULSE PROCESSOR FOR HIGH-RATE HIGH-RESOLUTION X-RAY SPECTROSCOPY
R. Alberti, L. Bombelli, T. Frizzi, S. Moser, XGLab SRL, via Moretto da Brescia 23, I-20133, Milano, Italy, ph. +390249660460, email info@xglab.it
A. Abba, A. Geraci, Politecnico di Milano, Dip. Elettronica e Informazione, Piazza L. da Vinci 32, I-20133, Milano, Italy
X-RAY AND NEUTRON SCATTERING CHARACTERIZATION OF NANOMATERIALS TO ADDRESS MEASUREMENT CHALLENGES IN CARBON CAPTURE
Andrew J. Allen, NIST, Gaithersburg, MD, USA
Laura Espinal, NIST, Gaithersburg, MD, USA
Winnie Wong-Ng, NIST, Gaithersburg, MD, USA
Martin L. Green, NIST, Gaithersburg, MD, USA
ABSORPTION EDGE MODELING IN LINE PROFILE FITTING APPLICATIONS
Arnt Kern*, Alan Coelho, Karsten Knorr, Bruker AXS, Karlsruhe, Germany
FABRICATION, METROLOGY AND PERFORMANCE OF PROFILE-COATED KB MIRRORS FOR HARD X-RAY NANOFOCUSING
L. Assoufid, B. Shi, W. Liu, J. Qian, C. Liu, P. Zchack, R. Khachataryan, A.M. Khounsary, APS, Argonne National Laboratory, Argonne IL
J. Tischler, G. Ice, Oak Ridge National Laboratory, Oak Ridge, TN
ELECTROLYTIC PHASE EXTRACTION: AN OLD TECHNIQUE TO EVALUATE PRECIPITATES IN NITINOL
Roy G. Baggerly, The Boeing Co., Seattle, WA USA
DISLOCATION DENSITY, CHARACTER AND BURGERS VECTOR TYPES IN CUBIC AND HEXAGONAL CLOSE PACKED CRYSTALS DETERMINED TOGETHER WITH OTHER DEFECTS BY DIFFRACTION LINE PROFILE ANALYSIS USING TIME OF FLIGHT NEUTRON DIFFRACTION MEASUREMENTS
Levente Balogh, Materials Science & Technology Division, Los Alamos National Laboratory, Los Alamos, NM 87545, USA
Donald W. Brown, Materials Science & Technology Division, Los Alamos National Laboratory, Los Alamos, NM 87545, USA
Bjorn Clausen, Los Alamos Neutron Science Center, Los Alamos National Laboratory, Los Alamos, NM 87545, USA
Carlos N. Tome, Materials Science & Technology Division, Los Alamos National Laboratory, Los Alamos, NM 87545, USA
3D MEASUREMENTS OF DISLOCATIONS AND STRAIN GRADIENTS IN THE NEAR SURFACE MICROSTRUCTURES VIA POLYCHROMATIC MICRODIFFRACTION
Rozaliya I. Barabash, ORNL, Oak Ridge TN, USA
NEAR REAL TIME AEROSOL METALS MONITORING AT pg/m3 CONCENTRATIONS USING LARGE AREA SILICON DRIFT DETECTORS
Shaul Barkan, SII NanoTechnology USA Inc. Northridge, CA, USA
John A. Cooper, Cooper Environmental Services LLC, Portland, OR, USA
Valeri D. Saveliev, SII NanoTechnology USA Inc. Northridge, CA, USA
Krag A. Petterson, Cooper Environmental Services LLC, Portland, OR, USA
Masanory Takahashi, SII NanoTechnology USA Inc. Northridge, CA, USA
Troy C. Pittenger, Cooper Environmental Services LLC, Portland, OR, USA
ELEMENTAL ANALYSIS OF FRESH AND WASTE WATER FROM INDUSTRIAL SOURCES USING TOTAL REFLECTION X-RAY FLOURESCENCE (TXRF) SPECTROSCOPY
M. Beauchaine, Bruker AXS Inc., Madison, WI, USA
ANALYTICAL DETERMINATION OF SELENIUM IN MEDICAL SAMPLES, FOOD, AND DIETARY SUPPLEMENTS BY MEANS OF TOTAL REFLECTION X-RAY SPECTROSCOPY (TXRF)
M. Beauchaine*, Bruker AXS Inc., Madison, WI, USA
H. Stosnach, Bruker AXS Microanalysis GmbH, Berlin, Germany
PICKING UP THE CHALLENGE FOR BEST PRECISION AND ACCURACY IN FERRO ALLOY ANALYSIS
Dr. Kai Behrens, Bruker AXS, Karlsruhe, Germany
Alexander Seyfarth, Bruker AXS, Madison, Wisconsin, USA
John Anzelmo, Corp Claisse Scientifique, Quebec, Quebec, Canada
Mathieu Bouchard, Corp Claisse Scientifique, Quebec, Quebec, Canada
Marie-Ève Provencher, Corp Claisse Scientifique, Quebec, Quebec, Canada
Renata Zucic, Bruker AXS, Karlsruhe, Germany
FLEXIBILITY AND PERFORMANCE FOR PROCESS AND QUALITY CONTROL IN METAL PRODUCTION
Dr. Kai Behrens, Bruker AXS, Karlsruhe, Germany
Alexander Seyfarth, Bruker AXS, Madison, Wisconsin, USA
Dr. Dominique Porta, Bruker AXS, Karlsruhe, Germany
PEAK PROFILES FROM FAULTING IN SMALL DOMAINS
K.R. Beyerlein, Georgia Institute of Technology, Department of Materials Science & Engineering, Atlanta, GA, USA
R.L. Snyder, Georgia Institute of Technology, Department of Materials Science & Engineering, Atlanta, GA, USA
P. Scardi, University of Trento, Department of Materials Engineering and Industrial Technology, Trento, TN, Italy
STUDY OF MICROSTRUCTURE AND HYDRAULIC PROPERTIES OF GEOLOGICAL SAMPLES BY MEANS OF MICROFOCUS X-RAY COMPUTED TOMOGRAPHY AND LATTICE BOLTZMANN METHOD
J. Bielecki,S. Bozek,J. Lekki,Z. Stachura ,W. M. Kwiatek, The Henryk Niewodniczański Institute of Nuclear Physics, Polish Academy of Sciences (IFJ PAN) ul. Radzikowskiego 152, 31-342 Krakow, Poland
J. Jarzyna, AGH University of Science and Technology, Faculty of Geology, Geophysics and Environment Protection, al. Mickiewicza 30, 30-059 Krakow, Poland
MICRO X-RAY DIFFRACTION ORIENTATION ANALYSIS OF DIAMONDS USED FOR METAL ROLLER PATTERNING
T. Blanton*, C. Barnes, Eastman Kodak Company, Rochester, NY,USA
X-RAY DIFFRACTION CHARACTERIZATION OF POLYMER INTERCALATED GRAPHITE OXIDE
T.N. Blanton*, D. Majumdar, Eastman Kodak Company, Rochester, NY,USA
SIMULATION OF ELECTRON DIFFRACTION PATTERNS WITH THE POWDER DIFFRACTION FILE DATABASE
J. Blanton, J. Reid, D. Crane, C. Crowder, S. Kabekkodu, T. Fawcett, International Centre for Diffraction Data, Newtown Square, PA
STRUCTURE DETERMINATION OF THE SILVER CARBOXYLATE DIMER [Ag(O2C20H39)]2, SILVER ARACHIDATE, USING POWDER X-RAY DIFFRACTION METHODS
James Kaduk *, Illinois Institute of Technology, 3101 S. Dearborn, Chicago IL 60616, USA
Peter Stephens, Stony Brook University, Department of Physics and Astronomy, Stony Brook, New York 11794-3800, USA
Thomas Blanton, Eastman Kodak Company, Research Laboratories, Rochester, New York 14650-2106, USA
David Whitcomb, Carestream Health, 1 Imation Way, Oakdale, MN 55128, USA
Scott Misture, Alfred University, New York State College of Ceramics, Alfred, NY 14802, USA
Manju Rajeswaran, Eastman Kodak Company, Research Laboratories, Rochester, New York 14650-2106, USA
XRS for Li-ion batteries
U. Boesenberg*, J. Cabana, T. Richardson, R. Kostecki, LBNL, Berkeley, CA, USA
D. Sokaras, T.C. Weng, D. Nordlund, SSRL, Menlo Park, CA, USA
EDXRF ANALYSIS OF CU(IN,GA)(S,SE)2 PHOTOVOLTAIC FILMS (THE S-MO CONUNDRUM)
J.R. Bogert, Solar Metrology / PFT, Holbrook, NY, USA
“CUBE”, A LOW-NOISE CMOS PREAMPLIFIER AS ALTERNATIVE TO JFET FRONT-END FOR SILICON DRIFT DETECTORS
L. Bombelli*, C. Fiorini, A. Longoni, Politecnico di Milano, Milano, Italy
T. Frizzi, R. Nava, XGLab SRL, Milano, Italy
X-RAY DIFFRACTION NANO-TOMOGRAPHY: APPLICATION TO THE LOW ENRICHED NUCLEAR FUELS.
A. Bonnin , H. Palancher, CEA, DEN, DEC, Cadarache, F-13108 Saint Paul lez Durance, France
R. Tucoulou, P. Cloetens, ESRF, ID22/ID22Ni, BP220, F-38043 Grenoble Cedex, France
P. Bleuet, CEA, LETI, MINATEC, F-38054 Grenoble, France
V. Honkimäki, ESRF, ID15, BP220, F-38043 Grenoble Cedex, France
APPLICATIONS OF X-RAY FLUORESCENCE IN THE COPPER MINING INDUSTRY
S. W. Bowe, Kennecott Utah Copper, South Jordan, UT, USA
WAVELENGTH DISPERSIVE XRF FOR ANALYSIS OF SMALL AMOUNTS OF CATALYST – HOW SMALL CAN WE GO?
L. L. Brehm*, D. W. Burns, S. O. Yusuf, T. Hasan, C. G. Simon, Dow Chemical Company, Midland, MI, USA
CHARACTERIZATION OF STRUCTURE CHANGES IN MICROPOROUS MATERIALS BY IN SITU X-RAY DIFFRACTION
Robert W. Broach, UOP LLC
RESIDUAL STRESSES IN ALUMINUM CLAD URANIUM-10WT%MOLYBDENUM FUEL PLATES
Donald W. Brown, Los Alamos National Lab
Bjorn Clausen, Los Alamos National Lab
Maria A Okuniewski, Idaho National Lab
Applications of X-ray Fluorescence for the Electronics Industry
W.W. Brubaker, DuPont Central Research & Development, Wilmington, DE
THE BTX BENCH-TOP XRD ANALYSIS FOR FEED & FERTILIZER FORMULATIONS
Jose Brum, Olympus Innov-X Systems, Inc. 100 Sylvan Rd., Suite 500 Woburn, MA 01801
NON-DESTRUCTIVE FINGERPRINTING OF PHARMACEUTICAL COMPOUNDS WITH A LOW-COST, SMALL FOOTPRINT BENCH-TOP XRD SYSTEM, THE BTX
Jose Brum, Olympus InnovX
EVALUATION OF PORTABLE XRF AND XRD ANALYZERS FOR IDENTIFICATION OF COUNTERFEIT PHARMACEUTICAL PRODUCTS
Charles R. Bupp, San Francisco State University, San Francisco, CA
Tyler Jennison, InXitu, Campbell, CA
Heather Gregory, San Francisco State University, San Francisco, CA
Peter T. Palmer, San Francisco State University, San Francisco, CA
X-RAY MEASUREMENTS OF NANOMETER THICK TaxO1-x ON SILICON SUBSTRATES FOR THICKNESS AND COMPOSITION DETERMINATION
F. J. Cadieu*, I. Vander, Y. Rong, and R. W. Zuneska, Physics Dept., Queens College of CUNY, Flushing, NY 11367
CEMENT APPLICATIONS WITH HANDHELD XRF
M, Cameron, Bruker Elemental, Kennewick, WA, USA
COMPOSITION-DEPENDENT NEGATIVE THERMAL EXPANSION IN TETRACYANIDOBORATE MATERIALS
Jessica J. Chadbourne*, David J. Price, Cameron J. Kepert, School of Chemistry, University of Sydney, NSW, Australia
Vanessa K. Peterson, The Bragg Institute, Australian Nuclear Science and Technology Organisation, NSW, Australia
COMPUTER-AIDED ENGINEERING DESIGN OF HTXRD RESISTIVE HEATING STRIPS TO MINIMIZE SAMPLE TEMPERATURE GRADIENT
R.Chandrasekaran, A.Drews*, Ford Research and Advanced Engineering, Ford Motor Company, Dearborn, MI 48124, USA
4D Materials Science: In Situ X-ray Synchrotron Tomography of Deformation in Metallic Materials
N. Chawla, Arizona State University, Tempe, AZ USA
J.J. Williams, Arizona State University, Tempe, AZ USA
N.C. Chapman, Arizona State University, Tempe, AZ USA
M.Y. Wang, Arizona State University, Tempe, AZ USA
X. Xiao, Advanced Photon Source, Argonne National Laboratory, Argonne, IL, USA
F. De Carlo, Advanced Photon Source, Argonne National Laboratory, Argonne, IL, USA
QUANTITATIVE ANALYSIS OF TOXIC ELEMENTS IN CONSUMER PRODUCTS AND ENVIRONMENTAL SAMPLES BY HIGH DEFINITION XRF
Z. W. Chen*, Shenghua Song, Danhong Li, and Alex Vershinin, XOS, East Greenbush, NY, USA
DETECTION LIMITS OF OPTIC-ENABLED FIELD-PORTABLE XRF SYSTEMS
Berry Beumer*, Z. W. Chen, XOS, East Greenbush, NY, USA
Phase Equilibrium and Thermal Studies of Thermal Energy Storage Materials
W. Chien*, I. Gantan, A. Mishra, V. K. Kamisetti, P. Mekala, D. Chandra, Uinversity of Nevada, Reno, Reno, NV, USA
USING IN-SITU TECHNIQUES TO PROBE HIGH TEMPERATURE REACTIONS: THERMOCHEMICAL CYCLES FOR THE PRODUCTION OF SYNTHETIC FUELS FROM CO2 AND WATER
Eric N. Coker, Mark A. Rodriguez, Andrea Ambrosini, James E. Miller, Sandia National Labs., Albuquerque, NM USA
MULTILAYER LAUE LENS FABRICATION FOR X-RAY NANOFOCUSING; CURRENT STATUS AND FUTURE PERSPECTIVES
R. Conley*, N. Bouet, H. Yan, Y. S. Chu, NSLS-II, Brookhaven National Laboratory, Upton, NY, USA
A.T. Macrander, J. Maser, R. Divan, G.B. Stephenson, B. Shi, C. Liu, L. Assoufid, Advanced Photon Source, Argonne National Laboratory, Argonne, IL, USA
H. Kang, Chosun University, Gwangju, 501-759, Republic of Korea
TRACE ELEMENT BACKGROUND CORRECTION AND SMALL SPOT ANALYSIS FOR GEOLOGICAL SAMPLES WITH A NEW 4.2 KW XRF SPECTROMETER
Richard M. Conrey, GeoAnalytical Laboratory, School of Earth and Environmental Sciences, Box 642812, Washington State University, Pullman, WA 99164
ULTRA-COMPACT X-RAY SOURCE FOR HANDHELD AND PORTABLE XRF APPLICATIONS
D. Wang, Moxtek, Inc. Orem, UT, USA
S.Cornaby, Moxtek, Inc. Orem, UT, USA
D. Reynolds, Moxtek, Inc. Orem, UT, USA
J. Smith, Moxtek, Inc. Orem, UT, USA
C. Jensen, Moxtek, Inc. Orem, UT, USA
PERFORMANCE IMPROVEMENTS IN MINIATURE X-RAY TUBES
S. Cornaby, Moxtek, Inc. Orem, UT, USA
D. Reynolds, Moxtek, Inc. Orem, UT, USA
V. Jones, Moxtek, Inc. Orem, UT, USA
M. Heber, Moxtek, Inc. Orem, UT, USA
C. Jensen, Moxtek, Inc. Orem, UT, USA
QUANTITATIVE COMBINED XRF AND EPMA ANALYSIS IN THE SEM
Brian J. Cross*, CrossRoads Scientific, El Granada, CA, USA
Kenny C. Witherspoon, iXRF Systems Inc., Houston, TX, USA
QUANTITATIVE CHARACTERIZATION OF STRATIFIED MATERIALS BY CONFOCAL 3D MICRO-BEAM X-RAY FLUORESCENCE SPECTROSCOPY. MONTE CARLO SIMULATION VS. FUNDAMENTAL PARAMETERS MODEL
M. Czyzycki*, D. Wegrzynek, P. Wrobel, M. Lankosz, AGH University of Science and Technology, Cracow, PL-MA, Poland
X-Ray Diffraction Characterization of new Ternary Yttrium–Rare Earth Oxides Formed by the Sol–Gel Technique
G. Rafailov, Z. Porat, I. Dahan, Nuclear Research Center, Negev, PO Box 9001, Beer-Sheva, 84190
Z. Porat J. Zabicky, D. Moglyanski, K. Rechav, G. Kimmel, Ben-Gurion University of the Negev PO Box 653, Beer-Sheva, 84105
DETERMINATION OF DOPING LEVELS OF TWO-DOPANT PHOSPHOR MATERIALS FROM X-RAY SIGNAL INTENSITY RATIOS AND INTENSITY CORRECTION ANALYSIS
Gary Darsey, Cabot Superior MicroPowders, Albuquerque, NM, USA
Randy Cone, Thermo Fisher Scientific, Madison, WI, USA
MULTILAYER MIRRORS – POTENTIALS FOR MONOCHROMATING, COLLIMATING OR FOCUSING OPTICS
R. Dietsch*, M. Kraemer, T. Holz, D. Weissbach, AXO DRESDEN GmbH, Dresden, Germany
A. Rack, ESRF, Grenoble, France
ADVANCED GUINIER-TYPE POWDER INSTRUMENTATION
R.Dietsch*, T.Holz, AXO DRESDEN GmbH, Dresden, Germany
S.J.H.Griessl, N.Huber, Huber Diffraktionstechnik GmbH & Co. KG, Rimsting, Germany
H.Borrmann, Max Planck Institute for Chemical Physics of Solids, Dresden, Germany
NOVEL (SUB)-NANOMETER XRF AND TXRF REFERENCE SAMPLES
M. Kraemer*, R. Dietsch, T. Holz, D. Weissbach, AXO DRESDEN GmbH, Dresden, Germany
STRUCTURAL ANALYSIS OF INHOMOGENEOUS SnOx THIN FILMS
Igor, Djerdj, Rudjer Boskovic Institute, Zagreb, Croatia
Davor, Gracin, Rudjer Boskovic Institute, Zagreb, Croatia
Krunoslav, Juraić, Rudjer Boskovic Institute, Zagreb, Croatia
Daniel, Meljanac, Rudjer Boskovic Institute, Zagreb, Croatia
Davor, Balzar, University of Denver, University Blvd., 222 MRB, Denver, CO 80208 USA
X-RAY DIFFRACTION ANALYSES OF LITHIUM BATTERY MATERIALS
Andy Drews, Ford Motor Company, Dearborn MI USA
HIGH-EFFICIENCY LABORATORY SAXS/GISAXS/WAXS INSTRUMENT FOR NANOMATERIALS CHARACTERIZATION
Lixin Fan, Rigaku Innovative Technologies Inc., Auburn Hills, MI 48326, USA
Mike Degen, Rigaku Innovative Technologies Inc., Auburn Hills, MI 48326, USA
Scott Bendle, Rigaku Innovative Technologies Inc., Auburn Hills, MI 48326, USA
Paul Pennartz, Rigaku Innovative Technologies Inc., Auburn Hills, MI 48326, USA
Nick Grupido, Rigaku Innovative Technologies Inc., Auburn Hills, MI 48326, USA
ROUTINE ANALYSIS OF BORON IN GLASS USING WAVELENGTH DISPERSIVE X-RAY FLUORESCENCE SPECTROSCOPY
E.M. Fanning, A.S. Nached, M.P. Carson, J.L. Tubbs, D.A. Sternquist, B.R. Wheaton, Corning Incorporated
REFERENCE MATERIALS FOR THE STUDY OF POLYMORPHISM AND CRYSTALLINITY IN CELLULOSICS
T.G. Fawcett, C.E. Crowder, S.N. Kabekkodu, F. Needham, J.W. Reid, International Centre for Diffraction Data, Newtown Square, PA
J.A. Kaduk, Illinois Institute of Technology, Naperville, IL
T.N. Blanton, Eastman Kodak Company, Rochester, NY
V. Petkov, Central Michigan University, Mt. Pleasant, MI
R. Shpenchanko, Moscow State University, Moscow, Russia
BREAKING THE 10NM NANOFOCUS SPOT SIZE BARRIER WITH NEW APPROACHES FOR FRESNEL ZONE PLATES
M. Feser, E. Snyder, Y. Feng, A. Lyon, S. Chen, Xradia Inc., Pleasanton, CA
HIGH-SPEED X-RAY FULL-FIELD IMAGING APPLICATIONS AT THE APS
Kamel, Fezzaa, Argonne National Laboratory, Argonne, IL, USA
CHARACTERIZATION OF ELECTROCHEMICALLY DEPOSITED THERMOELECTRIC FILMS
U.E.A. Fittschen, K. Reinsberg, M. Menzel, J.A.C. Broekaert, University of Hamburg, Hamburg, Germany
K. Appel, Deutsches Elektronen Synchrotron, Hamburg, Germany
DXC at ICDD
D. Flaherty, ICDD
ULTRA-FAST COMPACT MULTI-CHANNEL READOUT SYSTEM FOR SDDs
R. Alberti, L. Bombelli, T. Frizzi*, S. Moser, XGLab SRL, Milano, Italy
C. Fiorini, R. Quaglia, Politecnico di Milano, Dip. Elettronica e Informazione, Milano, Italy
RIETVELD QUANTITATIVE ANALYSIS OF SUPER DUPLEX STAINLESS STEEL
J.L. Garin*, Universidad de Santiago de Chile, Santiago, Chile
R.L. Mannheim, Universidad de Santiago de Chile, Santiago, Chile
M.A. Camus, Universidad de Antofagasta, Antofagasta, Chile
THE EXCAVATIONS AT CORIGLIA, CASTEL VISCARDO, ITALY: USE OF X PORTABLE XRF FOR PHASING OF WALLS ACROSS TRENCHS
D.B. George, L. Rulman, M.K. Donais, Saint Anselm College, Manchester, NH
A Software Program for Calculating Diffraction Elastic Constants of Textured Materials
Thomas Gnäupel-Herold, University of Maryland, NIST Center for Neutron Research, Giathersburg
An Investigation of the Accuracy of Diffraction Stress Evaluation of Textured Materials
Thomas Gnäupel-Herold, University of Maryland, NIST Center for Neutron Research, Giathersburg
COMBINED RIETVELD ANALYS OF X-RAY AND NEUTRON DIFFRACTION DATA OF ZINC OXIDE TRANSPARENT CONDUCTORS
GB González Avilés*, R Mansourian, B Hardnacke, A Wesolik, J Gardner, DePaul University, Chicago IL, USA
JS Okasinski, Argonne National Laboratory, Argonne, IL, USA
NEW FAST IN-SITU XRD SYSTEM ALLOWS GROWTH STUDIES OF THIN FILMS FOR PHOTOVOLTAICS
A. Haase*, M, Klatt, A. Schafmeister, R. Stabenow, GE Sensing & Inspection Technologies, Ahrensburg, Germany
I. Kötschau, centrotherm photovoltaics AG, Blaubeuren, Germany
FAST X-RAY IMAGING „ON-THE-FLY“ WITH A BENCHTOP µ-XRF INSTRUMENT
M.Haschke, U.Waldschläger, U.Rossek, R.Tagle, R.Erler, Bruker Nano GmbH, Berlin, Germany
MULTILAYER OPTICS FOR X-RAY ANALYTICS
A. Kleine, B. Hasse, C. Michaelsen, J. Wiesmann, A. Hembd, U. Heidorn, S. Kroth, F. Hertlein, Incoatec GmbH, Max-Planck-Strasse 2, 21502 Geesthacht, Germany
HIGH-BRILLIANCE LOW-MAINTANACE MICROFOCUS SOURCES FOR DIFFRACTOMETRY
Bernd Hasse, Andreas Kleine, Jürgen Graf, Jörg Wiesmann, Carsten Michaelsen, Incoatec GmbH, Max-Planck-Strasse 2, 21502 Geesthacht, Germany
Calibration of X-ray Imaging Devices for Accurate Intensity Measurement
M. J. Haugh*, P. W. Ross, National Security Technologies
N. Palmer, M. B. Schneider, Lawrence Livermore National Laboratory
HIGH RESOLUTION X-RAY (HIRX) DETECTION OF PLUTONIUM
George Havrilla, Michael Collins, Los Alamos National Laboratory, Los Alamos, NM USA
Velma Montoya, Los Alamos National Laboratory, Los Alamos, NM USA
Zewu Chen, X-ray Optical Systems, East Greenbush, NY USA
Fuzhong Wei, X-ray Optical Systems, East Greenbush, NY USA
Matthew Cusack, X-ray Optical Systems, East Greenbush, NY USA
ACTINIDE CHARACTERIZATION USING ULTRA HIGH ENERGY X-RAY FLUORESCENCE
George Havrilla, Michael Collins, Los Alamos National Laboratory, Los Alamos, NM USA
Velma Montoya, Los Alamos National Laboratory, Los Alamos, NM USA
Zewu Chen, X-ray Optical Systems, East Greenbush, NY USA
Fuzhong Wei, X-ray Optical Systems, East Greenbush, NY USA
Matthew Cusack, X-ray Optical Systems, East Greenbush, NY USA
TRACE ANALYSIS OF CADMIUM IN RICE BY THE SELECTIVE EXCITATION OF L SHELL X-RAY FLUORESCENCE
Shinjiro Hayakawa, Yuko Sugihara, Takeshi Hirokawa, Department of Applied Chemistry, Graduate School of Engineering, Hiroshima University, Hiroshima 739-8527, Japan
Hirofumi Namatame, Hiroshima Synchrotron Radiation Center (HSRC), Hiroshima University, Hiroshima 739-0046, Japan
ALGORITHM AND STRATEGY OF STRESS ANALYSIS WITH 2D DETECTOR
Bob B. He, Bruker AXS Inc
MICROSTRUCTURE OF PLASTIC BONDED EXPLOSVES PBX
M. Herrmann, P.B. Kempa, U. Förter-Barth, Fraunhofer Institute Chemical Technology ICT, Pfinztal, Germany
W. Arnold, MBDA-TDW, Schrobenhausen, Germany
PHASE STABILITY STUDY OF NixMg1-xAl2O4 VIA XRD AND COMPLEMENTARY TECHNIQUES
S. T. Misture*, B. E. Hill, Alfred University, Alfred, NY, USA
M. E. Miller, Excelerant Ceramics, Alfred, NY, USA
STRATEGY OF FUSION BEAD CORRECTION IN XRF ANALYSIS OF POWDERS
H. Homma*, H. Inoue, Y. Yamada, Y. Kataoka, Rigaku Corporation, Takatsuki, Osaka, Japan
M. Feeney, L. Oelofse, Rigaku Americas Corporation, The Woodlands, Texas, USA
APPLICATION OF FUSION BEAD CORRECTION IN XRF ANALYSIS OF POWDERS
H. Homma, H. Inoue, Y. Kataoka, Rigaku Corporation, Takatsuki, Osaka, Japan
M. Feeney, L. Oelofse, L.A. Fields, Rigaku Americas Corporation, The Woodlands, Texas, USA
COMBINING u-XRD2 AND DTA: DEEPER INSIGHTS IN TEMPERATURE-DEPENDENT PROCESSES
N. Huber, C. Berthold, K.G. Nickel, University of Tuebingen, Tuebingen, Germany
A. Kern, Bruker AXS, Karlsruhe, Germany
SYNCHROTRON X-RAY MICROBEAM CHARACTERIZATION OF LIQUID CRYSTAL
A.Iida*, Institute of Materials Structure Science, Tsukuba, Ibaraki, Japan
Y.Takanishi, Kyoto University, Sakyo, Kyoto, Japan
Applications of Ultra-small angle X-ray scattering in the characterization of nanomaterials
Jan Ilavsky, X-ray Science Division, APS, ANL, Argonne, IL, USA
DEVELOPMENT OF A PALM-SIZED ELECTRON PROBE X-RAY ANALYZER
S. Terada, Department of Materials Science and Engineering, Kyoto University, Kyoto, Japan
S. Imashuku, Department of Materials Science and Engineering, Kyoto University, Kyoto, Japan
J. Kawai, Department of Materials Science and Engineering, Kyoto University, Kyoto, Japan
IMPROVEMENT OF DETECTION LIMITS OF A PORTABLE TXRF BY REDUCING ELECTRICAL NOISE
Susumu Imashuku, Kyoto University, Kyoto, Kyoto, Japan
Deh Ping Tee, Kyoto University, Kyoto, Kyoto, Japan
Yasukazu Nakae, Kyoto University, Kyoto, Kyoto, Japan
Jun Kawai, Kyoto University, Kyoto, Kyoto, Japan
Spectral Interferences of Sulfur on Light Elements in XRF Analysis of Particulate Matter Samples
H., Indresand*, A.M., Dillner, IMPROVE Program, Crocker Nuclear Laboratory, University of California, Davis, CA, 95616, United States
M., Shen, Department of Environmental Engineering, Zhejiang University, Hangzhou, 310029, P.R. China
Evaluating XRF Na and Cl Measurements in Particulate Matter Samples
H., Indresand*, A.M., Dillner, IMPROVE Program, Crocker Nuclear Laboratory, University of California, Davis, CA, 95616, United States
RAPID TRIGLYCERIDE POLYMORPH ANALYSIS USING A NEW GENERATION OF 2D BENCHTOP pXRD
Tyler C. Jennison, Inxitu inc., Campbell, CA, USA
APPLICATIONS FOR X-RAY MICRODIFFRACTION
Brian Jones*, Holger Cordes, Madhana Sunder, Jon Giencke, Bob He, Bruker AXS – 5465 East Cheryl Pkwy – Madison, WI - US
DATA VALIDATION OF MODULATED AND COMPOSITE STRUCTURES
S.N. Kabekkodu, D. Sagnella, International Centre for Diffraction Data, Newtown Square, PA
V. Petricek, Institute of Physics, Prague, Czech Republic
CRYSTAL STRUCTURE OF MONOCLINIC SR2.4CA0.6AL2O6
James Kaduk, IIT, Chicago IL USA
Winnie Wong-Ng, NIST, Gaithersburg MD USA
Joseph Golab, Ineos Technologies, Naperville IL USA
ANALYSIS OF TCLP EXTRACTS BY X-RAY FLUORESCENCE
D.S. Kendall*, U.S. EPA, Denver, CO, USA
LIQUID METAL JET MICRO-FOCUS X-RAY SOURCE: HIGHEST BRILLIANCE FOR HOME LAB INSTRUMENTATION
Christoph Ollinger, Arnt Kern*, Bruker AXS, Karlsruhe, Germany
PILATUS DETECTORS - NEXT GENERATION INSTRUMENTS FOR ADVANCED X-RAY DIFFRACTION STUDIES.
M. KOBAS, DECTRIS Ltd., Baden, Switzerland
POWDER X-RAY DIFFRACTOMETER WITH EASILY MOUNT/DISMOUNTABLE Ka1 OPTICS UNIT
Takayuki Konya, Takeshi Osakabe, Keigo Nagao, Tomikatsu Kubo, Yoshinori Ueji, Ryuji Matsuo, Tetsuya Ozawa, 1) Rigaku Corporation, 3 - 9 - 12 Akishima-shi Matsubara-cho, Tokyo 196-8666, Japan
Licai Jiang, Boris Verman, 2) Rigaku Innovative Technologies Inc., 1900 Taylor Road, Auburn Hills, Michigan 48326, USA
PAIR DISTRIBUTION FUNCTION STUDIES OF GOLD NANOPARTICLE ENSEMBLES: THE CHALLENGE AND IMPORTANCE OF MOVING BEYOND ENSEMBLE AVERAGED STRUCTURAL DESCRIPTIONS
J. A., Kurzman*; R., Seshadri, University of California Santa Barbara, Santa Barbara, CA USA
K., Page, Lujan Neutron Scattering Center, Los Alamos National Laboratory, Los Alamos, NM USA
INVESTIGATION OF PATHOLOGICAL MECHANISMS IN BRAIN CANCERS WITH THE USE OF TECHNIQUES BASED ON SYNCHROTRON RADIATION
M. Czyzycki, M. Szczerbowska-Boruchowska, A. Wandzilak, M. Czyzycki, K. Wolska, M.Lankosz, 1AGH-University of Science and Technology, Faculty of Physics and Applied Computer Science, Al. Mickiewicza 30, 30-059 Krakow, Poland
D. Adamek, E. Radwanska, Department of Pathomorphology, Collegium Medicum, Jagiellonian University, Krakow, Poland
Structure/microstructure relationships in defective and nanostructured materials
Matteo,Leoni, Università di Trento, Trento, Italy
CHARACTERIZING LOCAL STRAIN TENSORS, CRYSTALLOGRAPHIC ORIENTATIONS AND DEFECTS USING SUB-MICROMETER X-RAY BEAMS, AND COMPARISON WITH CONVENTIONAL LINE PROFILE ANALYSIS
L.E. Levine, NIST, Gaithersburg, MD, USA
B.C. Larson, ORNL, Oak Ridge, TN, USA
P. Geantil, USC, Los Angeles, CA, USA
J.Z. Tischler, ORNL, Oak Ridge, TN, USA
W. Liu, ANL, Argonne, IL, USA
M.E. Kassner, USC, Los Angeles, CA, USA
Use of Monte Carlo Simulation Methods to Improve X-ray Detector Response Function
Fusheng Li, Baker Hughes, 2001 Rankin Rd., Houston, TX 77073
Xiaogang Han, Baker Hughes, 2001 Rankin Rd., Houston, TX 77073
Robin Gardner, North Carolina State University, Raleigh, NC 27695
AN IN-SITU X-RAY DIFFRACTION STUDY OF REDUCTION OF NICKLE OXIDE BY HYDROGEN
J.H. Li, A. Tripathi, A. Takase, L. Fields, T. McNulty, Rigaku Americas Corporation, The Woodlands, TX, USA
ON THE USE OF MONTE CARLO BASED METHODS TO EDXRF QUALITATIVE ANALYSIS
Fusheng Li, Baker Hughes, 2001 Rankin Rd., Houston, TX 77073
Jiaxin Wang, North Carolina State University, Raleigh, NC 27695
Robin Gardner, North Carolina State University, Raleigh, NC 27695
EXPERIMENT VERIFICATION FOR THE DEPENDENCE OF THE X-RAY DIFFRACTION LINE PROFILE WITH THE ABSORPTION OF SAMPLE
Kejia Liu, Shanghai Institute of Tech.
Huifen Chen, Shanghai Institute of Tech.
DEVELOPMENT OF A NEW DIFFRACTOMETER FOR THE EVALUATION OF A VERY MICRO AREA
M. Maeyama*, S. Yasukawa, D. Iino, K. Itoh, T. Yoshida, H. Kawasaki, S. Yoshihara, K. Wakasaya, Rigaku Corporation, Akishima-shi, Tokyo, JAPAN
THE EFFECT OF GRAIN SIZE ON THE SEMICONDUCTING, ELECTRICAL, AND STRUCTURAL PROPERTIES OF ZINC OXIDE
R. Mansourian *, GB. González Avilés, Department of Physics, DePaul University, Chicago, IL, USA
Edible nanostructutes – the pleasures of chocolate
Alejandro G. Marangoni, University of Guelph, Guelph, ON, Canada
ANALYTICAL POSSIBILITIES OF TOTAL REFLECTION X-RAY SPECTROMETRY (TXRF) FOR TRACE SELENIUM DETERMINATION IN SOILS AND LEACHING SOLUTIONS
E, Margui, University of Girona, Girona, Spain
G.H.Floor, University of Girona, Girona, Spain
M.Hidalgo, University of Girona, Girona, Spain
G.Roman-Ross, University of Girona, Girona, Spain
C.Streli, Atominstitut, Vienna, Austria
I.Queralt, Institute of Earth Sciences "Jaume Almera", CSIC, Barcelona, Spain
DETERMINATION OF CATALYST RESIDUES IN ACTIVE PHARMACEUTICAL INGREDIENTS BY MEANS OF TOTAL REFLECTION X-RAY SPECTROMETRY (TXRF)
E, Margui, University of Girona, Girona, Spain
M, Hidalgo, University of Girona, Girona, Spain
P, De Pape, Bruker AXS GmbH, Karlsruhe, Germany
I, Queralt, Institute of Earth Sciences "Jaume Almera", CSIC, Barcelona, Spain
SAMPLE PREPARATION STRATEGIES FOR TRACE AND SPECIATION ANALYSIS BY TXRF SPECTROMETRY: PAST, PRESENT AND FUTURE
E.Marguí, M.Hidalgo, University of Girona, Girona, Spain
I.Queralt, Institute of Earth Sciences “Jaume Almera”, CSIC, Barcelona, Spain
C.Streli, Atominstitut TU Wien, Wien, Austria
CORE-SHEATH SIZE OF NANOPARTICLE DISPERSIONS STUDIED BY SAXS AND COMPLEMENTARY TECHNIQUES
M.N, Martin*, A.J. Allen, R.I. MacCuspie, NIST, Gaithersburg, MD, USA
TRIADS XRPD INDEXING ALGORITHM AND ITS USE IN PHARMACEUTICAL DEVELOPMENT
Richard B. McClurg, SSCI, a Division of Aptuit, West Lafayette, IN, USA
SOLEX: A COMPREHENSIVE TOOL FOR ENERGY-DISPERSIVE DETECTORS CHARACTERIZATION
Yves Ménesguen, CEA-Saclay, FRANCE
Marie-Christine Lépy, CEA-Saclay, FRANCE
Comparison of Sample Preparation Approaches for TXRF Using Different pL Pipetting Systems
M. Menzel*, U.E.A. Fittschen, Chemistry Department, Hamburg, Hamburg, Germany
G. Havrilla, National Laboratory, Los Alamos, NM, USA
U. Waldschläger, Bruker nano GmbH, Berlin, Berlin, Germany
X-ray Fluorescence Analysis of Round Robin Samples: Andesite, MGL-AND and Ordinary Portland Cement, OPC-1
D.M. Missimer, R.L. Rutherford, Savannah River National Laboratory, Aiken, SC
GRATINGS WITH EXTREME ASPECT RATIO FOR X-RAY PHASE CONTRAST TOMOGRAPHY at HIGH ENERGIES
J. Mohr, T. Grund, J. Kenntner, Karlsruhe Institute of Technology, Institute of Microstrucutre Technology, Karlsruhe, Germany
V. Altapova, T. Baumbach, Karlsruhe Institute of Technology, Institute of Synchrotron Radiation, Karlsruhe, Germany
I. Zanette, European Synchrotron Radiation Facility, Grenoble, France
T. Weitkamp, Synchrotron Soleil, Gif-sur-Yvette, France
Validation of Fundamental Parameters Approach Software for Use in NIST SRM Certification
Katharine M. Mullen, National Institute of Standards and Technology (NIST)
David L. Gil, Princeton University
Donald Windover, National Institute of Standards and Technology (NIST)
James P. Cline, National Institute of Standards and Technology (NIST)
FUNDAMENTAL PARAMETER DETERMINATION FOR IMPROVED XRF QUANTIFICATION IN THE SOFT X-RAY RANGE
M. Müller, B. Beckhoff, Physikalisch-Technische Bundesanstalt, Berlin, Germany
Birgit, Kanngießer, Technical University of Berlin, Berlin Germany
UNDERSTANDING STRESS GRADIENTS IN MICROELECTRONIC METALLIZATION
C.E. Murray, I.B.M. T.J. Watson Research Center, Yorktown Heights, NY
A NOISE REDUCTION ALGORITHM FOR DIGITAL SIGNAL PROCESSERS
Y. Nakaye, J. Kawai, Kyoto University, Kyoto, Kyoto, Japan
Determining the synergistic effect of organoclay and carbon black on the morphology structure, and mechanical properties of epoxy-polymer using X-ray and AFM
P. Nawani*, L. S. Faraji, R. P. Singh, Oklahoma State University, Tulsa, Ok, USA
Correlative Characterization of Li-S Batteries with In situ TXM and XRD
J. Nelson*, S. Misra, J.C. Andrews, M.F Toney, Stanford Synchrotron Radiation Lightsource, SLAC National Accelerator Laboratory, Menlo Park, CA 94025, USA
Y. Yang, A. Jackson, Y. Cui, Materials Science and Engineering, Stanford University, Stanford, CA 94305, USA
IS ONSET OF GAMMA-ALUMINA RECRYSTALLIZATION DEPENDENT ON CRYSTALLITE SIZE? A COMPARISON OF IN-SITU CALCINATIONS BY HIGH TEMPERATURE XRD AND CONVENTIONAL EX-SITU CALCINATIONS WITH STANDARD POWDER XRD.
C.L. Nicholas*, C.K. Costello, A.Z. Ringwelski, M.A. Vanek, UOP LLC A Honeywell Company, Des Plaines, IL, USA
MOVING TO HIGH DETECTION EFFICIENCY, LOW BACKGROUND SILICON DRIFT DETECTORS
A.Niculae*, J.Herrmann, M.Bornschlegl, O.Jaritschin, PNDetector GmbH, Munich, Germany
R.Eckhardt, S.Jeschke, P.Lechner, L.Mungenast, B.Schweinfest, H.Soltau, PNSensor GmbH, Munich, Germany
L.Andricek, L.Strüder, MPI Halbleiterlabor, Munich, Germany
ADDRESSING INDUSTRIAL PROBLEMS USING X-RAY DIFFRACTION AT THE ADVANCED PHOTON SOURCE
John Okasinski*, M. Suchomel, , J. Almer, L. Ribaud, and B. H. Toby, Argonne National Laboratory, Argonne, IL USA
IN-SITU X-RAY DIFFRACTION FROM LITHIUM ION BATTERIES
John Okasinski*, Argonne National Laboratory, Argonne, IL USA
Cary Hayner, Harold Kung, Northwestern Univeristy, Evanston, IL USA
DESIGN AND MEASUREMENT WITH A NEW PORTABLE X-RAY CAMERA
I.Ordavo*, U.Weber, PNDetector GmbH, Munich, Germany
S. Ihle, R.Hartmann, H.Soltau, M.Lang, A.Liebel, PNSensor GmbH, Munich, Germany
G.Schaller, L.Strueder, C.Thamm, MPI Halbleiterlabor, Munich, Germany
RIETVELD REFINEMENT WITH A MODEL THAT CONSIDERS CRYSTALLITE SIZE DISTRIBUTION AND ANISOTROPIC CRYSTALLITE SHAPE
O. Ovalle, X. Bokhimi, Instituto de Física, Universidad Nacional Autónoma de México, Coyoacan, D.F., Mexico
560 mm² SDD ARRAY
A. Pahlke, T. Eggert, R. Fojt, L. Höllt, J. Knobloch, S. Pahlke, O. Scheid, R. Stötter, F. Wiest, KETEK GmbH
FROM THE FIELD TO THE LAB – FDA USE OF XRF TO MONITOR FOODS, DRUGS, AND OTHER CONSUMER PRODUCTS
Peter T. Palmer, San Francisco State University, San Francisco, CA
Richard Jacobs, FDA
Sally Yee, FDA
Christina Qiu, FDA
Michael Nausin, FDA
Consuelo Castro, FDA
SEARCHING FOR A REFINABLE MODEL OF A NANOCRYSTAL
B.F.Palosz, Institute of High Pressure Physics, Polish Academy of Sciences, Warsaw, Poland
THE CHALLENGES IN DESIGNING, OPTIMIZING, AND MANUFACTURING X-RAY DETECTORS FOR HAND-HELD XRF
J. Pantazis, A. Huber, T.Pantazis, R. Redus, Amptek Inc, Bedford, MA, USA
IMPROVED QUANTIFICATION OF OBJECTS IMAGED IN 3D USING X-RAY MICRO-TOMOGRAPHY
B.M. Patterson*, C.E. Hamilton, E.K. Cerreta, J.P. Escobedo-Diaz, D. Dennis-Koller, Los Alamos National Laboratory, Los Alamos, NM, USA
NOVEL ACOUSTIC EMISSION AND XRD IN-SITU CELL FOR CHARACTERIZATION OF LITHIUM ION BATTERIES
K. Rhodes, University of Tennessee, Knoxville, TN, USA
M.J. Kirkham, R.A. Meisner, E.A. Payzant*, N. Dudney, C. Daniel, Oak Ridge National laboratory, Oak Ridge, TN, USA
Grazing Incidence X-ray Fluorescence Analysis in Shallow Dopant Distributions and Thin Film Analysis
G. Pepponi, Centre for Materials and Microsystems, Fondazione Bruno Kessler, Trento, Italy
EVOLUTION OF HANDHELD ED-XRF ANALYZERS AND THEIR IMPACT ON QUALITY OF OUR LIVES
Stanislaw Piorek, Thermo Niton Analyzers, LLC, Billerica, MA, USA
CHARACTERIZATION OF SUB-MICRON THIN FILMS AND MULTILAYERS BY ENERGY DISPERSIVE X-RAY FLUORESCENCE
I. Queralt*, Laboratory of X-ray Analytical Applications (LARX). Institute of Earth Sciences “Jaume Almera”, CSIC. Solé Sabarís s/n.ES- 08028 Barcelona, Spain.
E. Margui, Department of Chemistry, University of Girona, Campus Montilivi, ES-17071 Girona, Spain
X. Llovet, Universitat de Barcelona, Serveis Científico-Tècnics, Lluís Solé i Sabarís, 1-3, ES-08028 Barcelona, Spain
J. Pujol, Fischer Instruments SA, Almogàvers St., 157, ES-08018, Barcelona, Spain
F.J. Piniella, Autonomous University of Barcelona, Crystallography Unit. ES-08193 Cerdanyola del Vallès, Barcelona, Spain
RIETVELD QUANTITATIVE PHASE ANALYSIS OF MINERALOGICAL MATERIALS
Mati Raudsepp, University of British Columbia, Vancouver, BC, Canada
NEW INSTRUMENTATION FOR X-RAY MICRO DIFFRACTION
Heiko R Ress, Bruker AXS – 5465 East Cheryl Pkwy – Madison, WI - US
Christoph Ollinger, Bruker AXS – Oestliche Rheinbrueckenstrasse 49 - Karlsruhe - Germany
Geert Vanhoyland, Bruker AXS – Oestliche Rheinbrueckenstrasse 49 - Karlsruhe - Germany
Bob He, Bruker AXS – 5465 East Cheryl Pkwy – Madison, WI - US
Brian Jones, Bruker AXS – 5465 East Cheryl Pkwy – Madison, WI - US
Investigation of the structure of aluminum and gallium doped zinc oxide chemical vapor deposited thin films on glass using XRD and TEM
P. Ricou*, R. Korotkov, L. Fang, Arkema Inc., 900 First avenue, King of Prussia, PA 19406, USA
IMPROVED SOURCE AND MULTILAYER OPTICS INTEGRATION FOR FAST AND LOCAL XRD MEASUREMENTS
Sergio, Rodrigues, Xenocs, France
Pierre, Panine, Xenocs, France
Peter Høghøj, Xenocs, France
ADVANTAGES OF COUPLING SCATTERLESS COLLIMATION WITH HIGH BRILLIANCE MICROFOCUS SOURCES FOR SAXS APPLICATIONS
S. Rodrigues, P. Panine, P. Høghøj, Xenocs SA, Sassenage, France
MULTIVARIATE STATISTICAL ANALYSIS of MICRO-XRF SPECTRAL IMAGES FROM A BRUKER M4 TORNADO SYSTEM
M.A. Rodriguez, P.G. Kotula, D.E. Wesolowski, J.E. Heath, S.J. Bauer, Sandia National Laboratories, Albuquerque, NM
HANDHELD XRF SCREENING FOR DANGEROUSLY HIGH LEVELS OF TOXIC METALS IN DEVELOPING COUNTRIES
David Couto, Olympus Innov-X, Woburn, MA, USA
HANDHELD XRF SOIL ANALYSIS FOR PRECISION AGRICULTURE AND PERI-URBAN FARMING APPLICATIONS
David Couto, Olympus Innov-X, Woburn, MA, USA
MINIATURE TUBE AND DETECTOR MODELING OF PORTABLE XRF INSTRUMENTATION
David Couto, Olympus Innov-X, Woburn, MA, USA
X-RAY REFLECTION TOMOGRAPHY –FIRST RESULTS ON SURFACE IMAGING
K. Sakurai, University of Tsukuba, Ibaraki, Japan and National Institute for Materials Science, Ibaraki, Japan
V.A. Innis-Samson, University of Tsukuba, Ibaraki, Japan
M. Mizusawa, National Institute for Materials Science, Ibaraki, Japan
STRUCTURE AND DYNAMICS AT THE NANOSCALE PROBED BY X-RAY PHOTON CORRELATION SPECTROSCOPY
A. R. Sandy*, S. Narayanan, M. Sikorski, Argonne National Laboratory, Argonne, IL USA
X. Lu, Brookhaven National Laboratory, Upton, NY USA
S. G. J. Mochrie, Yale University, New Haven, CT USA
The development and evaluation of a new SAXS system for biological samples.
Katsunari Sasaki*, Angela Criswell, Joseph Ferrara, Rigaku Americas Corporation, The Woodlands, TX, USA
Nanao Suzuki, Chiba University, Chiba, Chiba, Japan
Licai Jiang, Mike Degen, Rigaku Innovative Technologies, Auburn Hills, MI, USA
APPLICATION OF LINE PROFILE ANALYSIS TO EVALUATION OF MICROSTRUCTURAL RECOVERY ACCOMPANIED WITH PRECIPITATION IN AGED ALLOYS
S. Sato*, A. Hasegawa, K. Wagatsuma, Institute for Materials Reserach, Tohoku University, Sendai, Japan
Y. Takahashi, 2) Research Department, NISSAN ARC, LTD., Yokosuka, Japan
S. Suzuki, Institute of Multidisciplinary Research for Advanced Materials, Tohoku University, Sendai, Japan
TOWARDS ACCURATE ANALYZES OF GENESIS SOLAR WIND SAMPLES: EVALUATION OF SURFACE CLEANING METHODS USING TOTAL REFLECTION X-RAY FLUORESCENCE SPECTROMETRY
Martina Schmeling, Loyola University Chicago, Chicago, Illinois 60660, U.S.A.
Munir Humayun, Florida State University, Tallahassee, Florida 32306, U.S.A.
Amy J.G. Jurewicz, Arizone State University, Tempe, Arizona 85287, U.S.A.
Igor V. Veryovkin, Argonne National Laboratory, Argonne, Illinois 60439, U.S.A.
Donald S. Burnett, California Institute of Technology, Pasadena, California 91125, U.S.A.
A MECHANANICAL TESTING CAPABILITY FOR MEASURING MICROSCALE DEFORMATION BEHAVIOR OF STRUCTURAL MATERIALS
J.C. Schuren*, Materials and Manufacturing Directorate - Air Force Research Laboratory, Wright-Patterson Air Force Base, OH, USA
M.P. Miller, Cornell University, Ithaca, NY, USA
A. Kazimirov, Cornell High Energy Synchrotron Source, Ithaca, NY, USA
X-RAY ANALYSIS OF PULSED LASER DEPOSTION OF Bi2Te3 THIN FILM LAYER
L. Seyed Faraji, R.P. Singh, Oklahoma State University, Tulsa, OK
HH XRF, from the Lab to the Field and back! Using the right calibration for the job at hand
A. Seyfarth, Bruker AXS Inc., Madison, WI
E. Nummi, M. Cameron, Bruker Elemental, Kennewick, WA
USING NEUTRON SCATTERING TO STUDY LITHIUM-ION BATTERIES
N. Sharma*, V. K. Peterson, The Bragg Institute, Australian Nuclear Science and Technology Organisation, Kirrawee DC, NSW, Australia
C. Feng, H. Li, Key Laboratory for Synthesis and Applications of Organic Functional Molecules, Hubei University, Wuhan 430062, China
G. Du, Z. Guo, H. Liu, Institute for Superconducting & Electronic Materials, University of Wollongong, NSW 2522, Australia
THE CRYSTAL-STRUCTURE OF Mn-DOPED LiFePO4: A COMBINED NEUTRON AND X-RAY DIFFRACTION STUDY
N. Sharma*, V. K. Peterson, The Bragg Institute, Australian Nuclear Science and Technology Organisation, Kirrawee DC, NSW, Australia
C. Feng, H. Li, Key Laboratory for Synthesis and Applications of Organic Functional Molecules, Hubei University, Wuhan 430062, China
G. Du, Z. Guo, H. Liu, Institute for Superconducting & Electronic Materials, University of Wollongong, NSW 2522, Australia
X-RAY DIFFRACTION MEASUREMENT OF RESIDUAL STRESS IN THE DAMAGED BLADE SAMPLE OF GAS TURBINE ENGINE
Shouwen Shen, Saudi Aramco, Dhahran, Saudi Arabia
Alaaeldin H. Mustafa, Saudi Aramco, Dhahran, Saudi Arabia
Ihsan Taie, Saudi Aramco, Dhahran, Saudi Arabia
Gasan Alabedi, Saudi Aramco, Dhahran, Saudi Arabia
Syed R. Zaidi, Saudi Aramco, Dhahran, Saudi Arabia
QUANTITATIVE XRD BULK AND CLAY MINERALOGICAL DETERMINATION OF PALEOSOL SECTION OF UNAYZAH AND BASAL KHUFF CLASTICS IN SAUDI ARABIA
S. Shen*, S. R. Zaidi, B. A. Mutairi, S. A. Hamoud, F. S. Khaldi, F. A. Edhaim, Saudi Aramco, Dhahran, Saudi Arabia
RESIDUAL STRESS ANALYSIS OF COPPER-INDIUM-GALLIUM-SELENIUM/MOLYBDENUM THIN FILM ON STAINLESS STEEL SUBSTRATE
Ying Shi, The Dow Chemical Company, Analytical Science, Midland, MI48764, USA
Steve Rozeveld, The Dow Chemical Company, Analytical Science, Midland, MI48764, USA
Order and disorder in layered oxide photocatalysts via X-ray and Neutron Powder Diffraction
Jiawanjun Shi, Eric J. Nichols, Scott T. Misture*, Alfred University, Alfred, NY, USA
EVALUATION OF HEXAVALENT CHROMIUM EXTRACTION FROM SOLIDS USING XANES AND XRD
J.R. Sieber*, J. Mahlerbe, P.E. Stutzman, W.C. Davis, R.P. Watson, S.E. Long, National Inst. Stand. & Tech., Gaithersburg, MD, USA
M.P. Isaure, O.F.X. Donard, Université de Pau et des Pays de l’Adour, Pau, France
F. Séby, Ultra Traces Analyses Aquitaine, Pau, France
P. Rodriguez-Gonzalez, Universidad Oviedo, Oviedo, Spain
C. Maurizio, European Synchrotron Radiation Facility
N. Unceta, University of the Basque Country, Vitoria-Gasteiz, Spain
STANDARD REFERENCE MATERIAL 2569 LEAD IN PAINT FOR CONSUMER PRODUCTS
J.R. Sieber*, J. Mahlerbe, P.E. Stutzman, W.C. Davis, R.P. Watson, S.E. Long, National Inst. Stand. & Tech., Gaithersburg, MD, USA
M.P. Isaure, O.F.X. Donard, Université de Pau et des Pays de l’Adour, Pau, France
F. Séby, Ultra Traces Analyses Aquitaine, Pau, France
P. Rodriguez-Gonzalez, Universidad Oviedo, Oviedo, Spain
C. Maurizio, European Synchrotron Radiation Facility
N. Unceta, University of the Basque Country, Vitoria-Gasteiz, Spain
USE OF THE RIETVELD METHOD FOR DESCRIBING STRUCTURE AND TEXTURE IN X-RAY DIFFRACTION DATA OF HUNTITE [CaMg3(CO3)4], DOLOMITE [CaMg(CO3)2] AND MAGNESITE [MgCO3] POWDERS
Husin Sitepu, Research and Development Center, Saudi Aramco, P.O. Box 62, Dhahran 31311, Saudi Arabia
A MEANS FOR ASSESSSING THE EFFECTIVENESS OF THE SHOT PEENING PROCESS AS IT RELATES TO FATIGUE PERFORMANCE
Daniel J. Snoha* and Scott M. Grendahl, U.S. Army Research Laboratory, Aberdeen Proving Ground, MD, U.S.A.
Beth S. Matlock, Technology for Energy Corporation, Knoxville, TN, U.S.A.
SURFACE RELAXATION IN NANO-DIAMONDS EXAMINED WITH APPLICATION OF REAL AND RECIPROCAL SPACE METHODS
S.Stelmakh*, E.Grzanka, S.Gierlotka, B.Palosz, Institute of High Pressure Physics, Polish Academy of Sciences, Warsaw, Poland
X-RAY POWDER DIFFRACTION IN THE PHARMACEUTICAL INDUSTRY
G.A. Stephenson, Eli Lilly and Company, Indianapolis, IN
X-RAY FLUORESCENCE AND DIFFRACTION MAPPING OF DENTIN AT 200 NM
Stuart R. Stock*, Northwestern University, Chicago, IL, USA
Alix C. Deymier-Black, Northwestern University, Chicago, IL, USA
Arthur Veis, Northwestern University, Chicago, IL, USA
Elizabeth Lux, Northwestern University, Chicago, IL, USA
Alvin Telser, Northwestern University, Chicago, IL, USA
Zhonghou Cai, Advanced Photon Source, Argonne National Laboratory, Argonne, IL, USA
HIGH-ENERGY X-RAY SCATTERING TOMOGRAPHY
Stuart R. Stock, Northwestern Univ., Chicago, IL, USA
Jonathan D. Almer, the Advanced Photon Source, Argonne National Lab., Argonne, IL, USA
STRESSES IN YTTERBIUM SILICATE MULTILAYER ENVIRONMENTAL BARRIER COATINGS
F. Stolzenburg*, B.J. Harder, J. Ramirez-Rico, K.T. Faber, Northwestern University, Chicago, IL, US
K.N.Lee, Rolls Royce Corporation, Indianapolis, IN, US
J.D. Almer, Advanced Photon Source, Argonne National Laboratory, Argonne, IL, US
SPECIATION OF PB AT THE TIDEMARK OF ARTICULAR CARTILAGE AND IN TRABECULAR BONE
F. Meirer, B. Pemmer, N. Zoeger, C. Streli*,, Atominstitut, Technische Universitaet Wien, Stationallee 2, 1020 Vienna, Austria
F. Meirer, G. Pepponi, MiNALab, CMM-Irst, Fondazione Bruno Kessler, Via Sommarive 18, 38123 Trento Italy
J. Goettlicher, R. Steininger, S. Mangold, Karlsruhe Institute of Technology, Institute for Synchrotron Radiation, Hermann-von-Helmholtz-Platz 1, D-76344 Eggenstein-Leopoldshafen, Germany
A. Tampieri, S. Sprio, Istituto di Scienza e Tecnologia dei Materiali Ceramici CNR, Faenca, Italy
J. G. Hofstaetter, P. Roschger, K. Klaushofer, Ludwig Boltzmann Institute of Osteology at the Hanusch Hospital of WGKK and AUVA Trauma Centre Meidling, 4th Med. Dept., Hanusch Hospital, 1140 Vienna, Austria
J. G. Hofstaetter, Department of Orthopaedic Surgery, Vienna General Hospital, Medical Univ. of Vienna, Austria
IMPROVEMENT OF CALIBRATION PROCESSES IN TXRF OF WAFER SURFACE ANALYSIS: INVESTIGATION OF SATURATION EFFECTS IN TXRF BY COMPARING DIFFERENT SAMPLE SHAPES
F. Meirer, B. Pemmer, N. Zoeger, C. Streli*,, Atominstitut, Technische Universitaet Wien, Stationallee 2, 1020 Vienna, Austria
F. Meirer, G. Pepponi, MiNALab, CMM-Irst, Fondazione Bruno Kessler, Via Sommarive 18, 38123 Trento Italy
J. Goettlicher, R. Steininger, S. Mangold, Karlsruhe Institute of Technology, Institute for Synchrotron Radiation, Hermann-von-Helmholtz-Platz 1, D-76344 Eggenstein-Leopoldshafen, Germany
A. Tampieri, S. Sprio, Istituto di Scienza e Tecnologia dei Materiali Ceramici CNR, Faenca, Italy
J. G. Hofstaetter, P. Roschger, K. Klaushofer, Ludwig Boltzmann Institute of Osteology at the Hanusch Hospital of WGKK and AUVA Trauma Centre Meidling, 4th Med. Dept., Hanusch Hospital, 1140 Vienna, Austria
J. G. Hofstaetter, Department of Orthopaedic Surgery, Vienna General Hospital, Medical Univ. of Vienna, Austria
INFLUENCE OF THE EXCITATION ENERGY ON ABSORPTION EFFECTD IN TXRF ANALYSIS
F. Meirer, B. Pemmer, N. Zoeger, C. Streli*,, Atominstitut, Technische Universitaet Wien, Stationallee 2, 1020 Vienna, Austria
F. Meirer, G. Pepponi, MiNALab, CMM-Irst, Fondazione Bruno Kessler, Via Sommarive 18, 38123 Trento Italy
J. Goettlicher, R. Steininger, S. Mangold, Karlsruhe Institute of Technology, Institute for Synchrotron Radiation, Hermann-von-Helmholtz-Platz 1, D-76344 Eggenstein-Leopoldshafen, Germany
A. Tampieri, S. Sprio, Istituto di Scienza e Tecnologia dei Materiali Ceramici CNR, Faenca, Italy
J. G. Hofstaetter, P. Roschger, K. Klaushofer, Ludwig Boltzmann Institute of Osteology at the Hanusch Hospital of WGKK and AUVA Trauma Centre Meidling, 4th Med. Dept., Hanusch Hospital, 1140 Vienna, Austria
J. G. Hofstaetter, Department of Orthopaedic Surgery, Vienna General Hospital, Medical Univ. of Vienna, Austria
DIFFERENTIAL ACCUMULATION OF LEAD IN DOUBLE-TIDEMARKS IN ARTICULAR CARTILAGE OF OSTEOARTHRITIC HUMAN JOINTS
F. Meirer, B. Pemmer, N. Zoeger, C. Streli*,, Atominstitut, Technische Universitaet Wien, Stationallee 2, 1020 Vienna, Austria
F. Meirer, G. Pepponi, MiNALab, CMM-Irst, Fondazione Bruno Kessler, Via Sommarive 18, 38123 Trento Italy
J. Goettlicher, R. Steininger, S. Mangold, Karlsruhe Institute of Technology, Institute for Synchrotron Radiation, Hermann-von-Helmholtz-Platz 1, D-76344 Eggenstein-Leopoldshafen, Germany
A. Tampieri, S. Sprio, Istituto di Scienza e Tecnologia dei Materiali Ceramici CNR, Faenca, Italy
J. G. Hofstaetter, P. Roschger, K. Klaushofer, Ludwig Boltzmann Institute of Osteology at the Hanusch Hospital of WGKK and AUVA Trauma Centre Meidling, 4th Med. Dept., Hanusch Hospital, 1140 Vienna, Austria
J. G. Hofstaetter, Department of Orthopaedic Surgery, Vienna General Hospital, Medical Univ. of Vienna, Austria
TRACE ELEMENT DISTRIBUTION IN TRABECULAR AND CORTICAL BONE OF FRACTURED FEMORAL NECKS OF POSTMENOPAUSAL OSTEOPOROTIC WOMEN: A SYNCHROTRON MICRO X-RAY FLUORESCENCE IMAGING STUDY
F. Meirer, B. Pemmer, N. Zoeger, C. Streli*,, Atominstitut, Technische Universitaet Wien, Stationallee 2, 1020 Vienna, Austria
F. Meirer, G. Pepponi, MiNALab, CMM-Irst, Fondazione Bruno Kessler, Via Sommarive 18, 38123 Trento Italy
J. Goettlicher, R. Steininger, S. Mangold, Karlsruhe Institute of Technology, Institute for Synchrotron Radiation, Hermann-von-Helmholtz-Platz 1, D-76344 Eggenstein-Leopoldshafen, Germany
A. Tampieri, S. Sprio, Istituto di Scienza e Tecnologia dei Materiali Ceramici CNR, Faenca, Italy
J. G. Hofstaetter, P. Roschger, K. Klaushofer, Ludwig Boltzmann Institute of Osteology at the Hanusch Hospital of WGKK and AUVA Trauma Centre Meidling, 4th Med. Dept., Hanusch Hospital, 1140 Vienna, Austria
J. G. Hofstaetter, Department of Orthopaedic Surgery, Vienna General Hospital, Medical Univ. of Vienna, Austria
EFFECT OF SYSTEMATIC ERRORS ON LATTICE PARAMETER REFINEMENT
Aya Takase, Rigaku Americas Corp., The Woodlands, TX, USA
XRF PEAK DECONVOLUTION USING PEAK RATIOS REFINED BY FUNDAMENTAL PARAMETERS
Shinichi Terada, X-Bridge Technologies Co., Ltd., Uji, Kyoto, Japan
Hiroki Yamashita, X-tec. Co., Ltd., Osaka, Osaka, Japan
Yoshie Araki, X-tec. Co., Ltd., Osaka, Osaka, Japan
SOFTWARE AND INSTRUMENTATION FOR RIETVELD ANALYSIS: WHAT'S NEW AND SOME PROGNOSTICATION
B. H. Toby, APS, Argonne National Lab
Coupling X-ray Spectroscopy and Scanning Probe Microscopy for Simultaneous Sample Topography and Chemical mapping
Didier Tonneau, CNRS-CINaM, Marseille, France
Carole Fauquet, CNRS-CINaM, Marseille, France
Franck Jandard, CNRS-CINaM, Marseille, France
Maël Dehlinger, CNRS-CINaM, Marseille, France
DETECTORS FOR X-RAY IMAGING AT THE NEW FREE ELECTRON LASER SOURCES
J.Treis*, PNDetector GmbH, Munich, Germany
S.Aschauer, R.Hartmann, K.Hermenau, P.Lechner, G.Lutz, P.Majewski, C.Sandow, H.Soltau, C.Thamm, PNSensor GmbH, Munich, Germany
L.Andricek, S.Herrmann, M.Porro, R.Richter, G.Schaller, F.Schopper, L.Strüder, G.de Vita, MPI Halbleiterlabor, Munich, Germany
3D-XRF ANALYSIS OF SEVERAL FORENSIC AND INDUSTRIAL SAMPLES
K.Tsuji, C. Nishi, T. Nakazawa, K. Nakano, Osaka City University, Osaka, Japan
K. Otsuki, Y. Nishiwaki, Forensic Science Laboratory, Hyogo, Japan
H. Takenaka, NTT-AT, Atsugi, Japan
High Energy Photon (X-ray) use to Modern Radiotherapy Cancer Treatment.
Md Tofiz Uddin, Medical Physicist, National Institute of Cancer Research and hospital, Mohakhali, Dhaka-1212, Bangladesh.
FLUXES WITH INTERNAL STANDARDS – THE FUTURE FOR HIGH PRECISION XRF ANALYSIS OF COPPER, IRON AND NICKEL MATERIALS
S. Ulitzka, TWOTHETA XRF Services, Sydney, Australia
D. Brown, XRF Scientific Ltd, Perth, Australia
COHERENT AND INCOHERENT X-RAY SCATTERING FROM PARTLY RELAXED SEMICONDUCTOR STRUCTURES POSSESSING DISLOCATIONS
A. Ulyanenkov, T. Ulyanenkova, Rigaku Europe SE, Berlin, Germany
A. Benediktovitch, A. Zhilik, I. Feranchuk, Belarusian State University, Minsk, Belarus
K. Saito, Rigaku Corporation, Tokyo, Japan
ON-STREAM XRF FOR REAL-TIME MONITORING OF TRACE ELEMENTS AT SUB-PARTS-PER MILLION LEVELS
Y. Van Haarlem*, G. Roach, J. Tickner, CSIRO, Lucas Heights, NSW, Australia
FROM SUB-MONOLAYER TO MONOLAYER TRANSITION OF SILVER NANOPARTICLE LANGMUIR FILM AT THE AIR-WATER INTERFACE – PILOT APPLICATION OF A NEW GISAXS LABORATORY SET-UP
K. Vegso, P. Siffalovic, M. Weis, E. Majkova, M. Jergel, M. Benkovicova, S. Luby, Institute of Physics SAS, Bratislava, Slovakia
J. Wiesmann, Incoatec GmbH, Geesthacht, Germany
T. Kocsis, Polymer Institute SAS, Bratislava, Slovakia
K. Nygard, O. Konovalov, European Synchrotron Radiation Facility (ESRF), Grenoble, France
INVESTIGATION OF PORCELAIN CARDS USING COMBINED SPECTROSCOPIC TECHNIQUES
A. Deneckere, B. Vekemans*, L. de Vries, L. Van de Voorde, P. De Paepe, L. Vincze, L. Moens, P. Vandenabeele, Ghent University, Ghent, Belgium (Europe)
HIGH RESOLUTION ZONE-DOUBLED FRESNEL ZONE PLATES FOR THE MULTI-keV REGIME
J. Vila-Comamala, Paul Scherrer Institut, Villigen, Switzerland and Argonne National Laboratory, Argonne IL
A. Diaz, M. Guizar-Sicairos, V.A. Guzenko, P. Karvinen, C. David, Paul Scherrer Institut, Villigen, Switzerland
R. Barrett, ESRF, Grenoble, France
S. Gorelick, VTT Technical Research Centre of Finland, VTT, Finland
C.M. Kewish, Synchrotron SOLEIL, Gif-sur-Yvette, France
E. Färm, M. Ritala, University of Helsinki, Helsinki, Finland
APPLICATIONS OF FULL FIELD MICRO-XRF ANALYSIS USING A PROTOTYPE X-RAY COLOUR CAMERA
L. Vincze (*), B. De Samber, K. De Schamphelaere, C. Janssen, Ghent University, Gent, Belgium
O. Scharf, A. Bjeoumikhov, N. Langhoff, IfG-Institute for Scientific Instruments GmbH, Berlin, Germany
R. Wedell, Institut für Angewandte Photonik e.V. (IAP), Berlin, Germany
H. Riesemeier, M. Radtke, BAM Federal Institute for Materials Research and Testing, Berlin, Germany
RAMAN AND X-RAY DIFFRACTION STUDIES ON BAREH9: HIGH VOLUMETRIC CAPACITY HYDROGEN STORAGE MATERIAL
Wilson K. Wanene and Dhanesh Chandra, Materials Science & Engineering Division, Department of Chemical & Metallurgical Engineering (MS 388), University of Nevada, Reno, Nevada 89557
Maddury Somayazulu, Stephen A. Gramsch, and Russell J. Hemley, Geophysical Laboratory, Carnegie Institution of Washington, 5251 Broad Branch Road NW, Washington, DC 20015
Raja S. Chellappa, Shock & Detonation Physics (WX-9), Los Alamos National Laboratory, Los Alamos, NM
Selva Vennila Raju and Simon M. Clark, Advanced Light Source, Lawrence Berkeley National Laboratory, Berkeley, CA, USA
BACKGROUND AND BOUNDARY CORRECTIONS IN MICRO-XRD PHASE SCANNING
C. Kong, Analytical Centre, UNSW, Sydney, Australia
Q. X. Liu, ALS Mineral, Vancouver Branch, Canada
GUNSHOT RESIDUE INVESTIGATIONS WITH TXRF
A. Wastl, P. Kregsamer, P.Wobrauschek, C.Streli, Atominstitut, TU Wien, Vienna, Austria
B. Bogner, Kriminalpolizeilichen Untersuchungsstelle, Vienna, Austria
DECOMPOSING SAMPLES INTO THEIR PARTS WITH MULTIVARIATE STATISTICS
G. Wellenreuther*, DESY, Hamburg, Germany
G. Silversmit, Ghent University, Gent, Belgium
Fourier X-Ray Scattering Imaging and Biological Applications
Han Wen*, Vinay Pai, Susanna K. Lynch, Camille K. Kemble, Eric Bennett, National Heart, Lung and Blood Institute, National Institutes of Health, Bethesda, MD, US
Wah Keat Lee, Xianghui Xiao, Lahsen Assoufid, Chian Liu, Advanced Photon Source, Argonne National Laboratory, Argonne, IL, US
MINIMIZING THE EFFECTS OF PREFERRED ORIENTATION IN X-RAY POWDER DIFFRACTION
G.R. Williams, F. Kang, GlaxoSmithKline, King of Prussia, PA
B. Litteer, R. Kerstens, PANalytical, Inc., Westborough, MA
J. Smith, PANalytical, Inc., Richboro, PA
THE STUDY OF MICRONIZATION INDUCED DISORDER AND ENVIRONMENTAL ANNEALING OF AN ACTIVE PHARMACEUTICAL INGREDIENT (API) BY XRPD LINE BROADENING ANALYSES
G.R. Williams, J. Brum, GlaxoSmithKline, King of Prussia, PA
What Else are you Drinking when you Drink Whiskey or Wine?
Peter Wobrauschek, TU WIEN, ATOMINSTITUT, VIENNA, AUSTRIA
ANALYSIS OF MINOR AND TRACE ELEMENTS IN PLUTONIUM USING POLARIZED ENERGY DISPERSIVE X-RAY FLUORESCENCE
Christopher G. Worley, Los Alamos National Laboratory
APPLICATION OF XRF TO MONITORING HEAVY METALS IN SOILS AND SEDIMENTS
Shangjun Zhuo*, Ang Ji, Shanghai Institute of Ceramics, Chinese Academy of Sciences, Shanghai 200050, China
Coherent Diffractive Imaging of Individual Nanostructures
Jian Min Zuo, University of Illinois, Urbana, IL, USA
Jiong Zhang, University of Illinois, Urbana, IL, USA
Ke Ran, University of Illinois, Urbana, IL, USA


 

 

 

 

For more information, please contact Denise Zulli