60th Annual Conference on Applications of X-ray Analysis
Providing a unique mixture of sessions on training, education, and applications and papers containing details about state-of-the-art techniques and future developments in X-ray analysis.
List of Abstracts of the 2011 DXC
198 of 2011 DXC abstracts sorted by correspondent author's last name
Search the Abstract PDF files click here
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INVESTIGATING THE DETECTION LIMITS OF A ROTATING ANODE X-RAY DIFFRACTOMETER FOR OIL SANDS SAMPLES M.R., Afara, Natural Resources Canada, Devon, AB, Canada R.J., Mikula, Natural Resources Canada, Devon, AB, Canada |
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AN APPROACH TO QUANTITATIVE INTERPRETATION OF XRD PATTERNS OF MINERAL MIXTURES USING STANDARD REFERENCE MINERALS AND THEIR FWHM IN THE PXRD-WHOLE ROCK DIFRACTOGRAMS D. Alaygut*, B. Canga, Turkish Petroleum Corp. Research Center, Ankara, Turkey |
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RE-CONFIGURABLE DIGITAL PULSE PROCESSOR FOR HIGH-RATE HIGH-RESOLUTION X-RAY SPECTROSCOPY R. Alberti, L. Bombelli, T. Frizzi, S. Moser, XGLab SRL, via Moretto da Brescia 23, I-20133, Milano, Italy, ph. +390249660460, email info@xglab.it A. Abba, A. Geraci, Politecnico di Milano, Dip. Elettronica e Informazione, Piazza L. da Vinci 32, I-20133, Milano, Italy |
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X-RAY AND NEUTRON SCATTERING CHARACTERIZATION OF NANOMATERIALS TO ADDRESS MEASUREMENT CHALLENGES IN CARBON CAPTURE Andrew J. Allen, NIST, Gaithersburg, MD, USA Laura Espinal, NIST, Gaithersburg, MD, USA Winnie Wong-Ng, NIST, Gaithersburg, MD, USA Martin L. Green, NIST, Gaithersburg, MD, USA |
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ABSORPTION EDGE MODELING IN LINE PROFILE FITTING APPLICATIONS Arnt Kern*, Alan Coelho, Karsten Knorr, Bruker AXS, Karlsruhe, Germany |
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FABRICATION, METROLOGY AND PERFORMANCE OF PROFILE-COATED KB MIRRORS FOR HARD X-RAY NANOFOCUSING L. Assoufid, B. Shi, W. Liu, J. Qian, C. Liu, P. Zchack, R. Khachataryan, A.M. Khounsary, APS, Argonne National Laboratory, Argonne IL J. Tischler, G. Ice, Oak Ridge National Laboratory, Oak Ridge, TN |
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ELECTROLYTIC PHASE EXTRACTION: AN OLD TECHNIQUE TO EVALUATE PRECIPITATES IN NITINOL Roy G. Baggerly, The Boeing Co., Seattle, WA USA |
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DISLOCATION DENSITY, CHARACTER AND BURGERS VECTOR TYPES IN CUBIC AND HEXAGONAL CLOSE PACKED CRYSTALS DETERMINED TOGETHER WITH OTHER DEFECTS BY DIFFRACTION LINE PROFILE ANALYSIS USING TIME OF FLIGHT NEUTRON DIFFRACTION MEASUREMENTS Levente Balogh, Materials Science & Technology Division, Los Alamos National Laboratory, Los Alamos, NM 87545, USA Donald W. Brown, Materials Science & Technology Division, Los Alamos National Laboratory, Los Alamos, NM 87545, USA Bjorn Clausen, Los Alamos Neutron Science Center, Los Alamos National Laboratory, Los Alamos, NM 87545, USA Carlos N. Tome, Materials Science & Technology Division, Los Alamos National Laboratory, Los Alamos, NM 87545, USA |
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3D MEASUREMENTS OF DISLOCATIONS AND STRAIN GRADIENTS IN THE NEAR SURFACE MICROSTRUCTURES VIA POLYCHROMATIC MICRODIFFRACTION Rozaliya I. Barabash, ORNL, Oak Ridge TN, USA |
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NEAR REAL TIME AEROSOL METALS MONITORING AT pg/m3 CONCENTRATIONS USING LARGE AREA SILICON DRIFT DETECTORS Shaul Barkan, SII NanoTechnology USA Inc. Northridge, CA, USA John A. Cooper, Cooper Environmental Services LLC, Portland, OR, USA Valeri D. Saveliev, SII NanoTechnology USA Inc. Northridge, CA, USA Krag A. Petterson, Cooper Environmental Services LLC, Portland, OR, USA Masanory Takahashi, SII NanoTechnology USA Inc. Northridge, CA, USA Troy C. Pittenger, Cooper Environmental Services LLC, Portland, OR, USA |
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ANALYTICAL DETERMINATION OF SELENIUM IN MEDICAL SAMPLES, FOOD, AND DIETARY SUPPLEMENTS BY MEANS OF TOTAL REFLECTION X-RAY SPECTROSCOPY (TXRF) M. Beauchaine*, Bruker AXS Inc., Madison, WI, USA H. Stosnach, Bruker AXS Microanalysis GmbH, Berlin, Germany |
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ELEMENTAL ANALYSIS OF FRESH AND WASTE WATER FROM INDUSTRIAL SOURCES USING TOTAL REFLECTION X-RAY FLOURESCENCE (TXRF) SPECTROSCOPY M. Beauchaine, Bruker AXS Inc., Madison, WI, USA |
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FLEXIBILITY AND PERFORMANCE FOR PROCESS AND QUALITY CONTROL IN METAL PRODUCTION Dr. Kai Behrens, Bruker AXS, Karlsruhe, Germany Alexander Seyfarth, Bruker AXS, Madison, Wisconsin, USA Dr. Dominique Porta, Bruker AXS, Karlsruhe, Germany |
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PICKING UP THE CHALLENGE FOR BEST PRECISION AND ACCURACY IN FERRO ALLOY ANALYSIS Dr. Kai Behrens, Bruker AXS, Karlsruhe, Germany Alexander Seyfarth, Bruker AXS, Madison, Wisconsin, USA John Anzelmo, Corp Claisse Scientifique, Quebec, Quebec, Canada Mathieu Bouchard, Corp Claisse Scientifique, Quebec, Quebec, Canada Marie-Ève Provencher, Corp Claisse Scientifique, Quebec, Quebec, Canada Renata Zucic, Bruker AXS, Karlsruhe, Germany |
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PEAK PROFILES FROM FAULTING IN SMALL DOMAINS K.R. Beyerlein, Georgia Institute of Technology, Department of Materials Science & Engineering, Atlanta, GA, USA R.L. Snyder, Georgia Institute of Technology, Department of Materials Science & Engineering, Atlanta, GA, USA P. Scardi, University of Trento, Department of Materials Engineering and Industrial Technology, Trento, TN, Italy |
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STUDY OF MICROSTRUCTURE AND HYDRAULIC PROPERTIES OF GEOLOGICAL SAMPLES BY MEANS OF MICROFOCUS X-RAY COMPUTED TOMOGRAPHY AND LATTICE BOLTZMANN METHOD J. Bielecki,S. Bozek,J. Lekki,Z. Stachura ,W. M. Kwiatek, The Henryk Niewodniczański Institute of Nuclear Physics, Polish Academy of Sciences (IFJ PAN) ul. Radzikowskiego 152, 31-342 Krakow, Poland J. Jarzyna, AGH University of Science and Technology, Faculty of Geology, Geophysics and Environment Protection, al. Mickiewicza 30, 30-059 Krakow, Poland |
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X-RAY DIFFRACTION CHARACTERIZATION OF POLYMER INTERCALATED GRAPHITE OXIDE T.N. Blanton*, D. Majumdar, Eastman Kodak Company, Rochester, NY,USA |
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SIMULATION OF ELECTRON DIFFRACTION PATTERNS WITH THE POWDER DIFFRACTION FILE DATABASE J. Blanton, J. Reid, D. Crane, C. Crowder, S. Kabekkodu, T. Fawcett, International Centre for Diffraction Data, Newtown Square, PA |
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STRUCTURE DETERMINATION OF THE SILVER CARBOXYLATE DIMER [Ag(O2C20H39)]2, SILVER ARACHIDATE, USING POWDER X-RAY DIFFRACTION METHODS James Kaduk *, Illinois Institute of Technology, 3101 S. Dearborn, Chicago IL 60616, USA Peter Stephens, Stony Brook University, Department of Physics and Astronomy, Stony Brook, New York 11794-3800, USA Thomas Blanton, Eastman Kodak Company, Research Laboratories, Rochester, New York 14650-2106, USA David Whitcomb, Carestream Health, 1 Imation Way, Oakdale, MN 55128, USA Scott Misture, Alfred University, New York State College of Ceramics, Alfred, NY 14802, USA Manju Rajeswaran, Eastman Kodak Company, Research Laboratories, Rochester, New York 14650-2106, USA |
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MICRO X-RAY DIFFRACTION ORIENTATION ANALYSIS OF DIAMONDS USED FOR METAL ROLLER PATTERNING T. Blanton*, C. Barnes, Eastman Kodak Company, Rochester, NY,USA |
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XRS for Li-ion batteries U. Boesenberg*, J. Cabana, T. Richardson, R. Kostecki, LBNL, Berkeley, CA, USA D. Sokaras, T.C. Weng, D. Nordlund, SSRL, Menlo Park, CA, USA |
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EDXRF ANALYSIS OF CU(IN,GA)(S,SE)2 PHOTOVOLTAIC FILMS (THE S-MO CONUNDRUM) J.R. Bogert, Solar Metrology / PFT, Holbrook, NY, USA |
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“CUBE”, A LOW-NOISE CMOS PREAMPLIFIER AS ALTERNATIVE TO JFET FRONT-END FOR SILICON DRIFT DETECTORS L. Bombelli*, C. Fiorini, A. Longoni, Politecnico di Milano, Milano, Italy T. Frizzi, R. Nava, XGLab SRL, Milano, Italy |
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X-RAY DIFFRACTION NANO-TOMOGRAPHY: APPLICATION TO THE LOW ENRICHED NUCLEAR FUELS. A. Bonnin , H. Palancher, CEA, DEN, DEC, Cadarache, F-13108 Saint Paul lez Durance, France R. Tucoulou, P. Cloetens, ESRF, ID22/ID22Ni, BP220, F-38043 Grenoble Cedex, France P. Bleuet, CEA, LETI, MINATEC, F-38054 Grenoble, France V. Honkimäki, ESRF, ID15, BP220, F-38043 Grenoble Cedex, France |
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APPLICATIONS OF X-RAY FLUORESCENCE IN THE COPPER MINING INDUSTRY S. W. Bowe, Kennecott Utah Copper, South Jordan, UT, USA |
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WAVELENGTH DISPERSIVE XRF FOR ANALYSIS OF SMALL AMOUNTS OF CATALYST – HOW SMALL CAN WE GO? L. L. Brehm*, D. W. Burns, S. O. Yusuf, T. Hasan, C. G. Simon, Dow Chemical Company, Midland, MI, USA |
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CHARACTERIZATION OF STRUCTURE CHANGES IN MICROPOROUS MATERIALS BY IN SITU X-RAY DIFFRACTION Robert W. Broach, UOP LLC |
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RESIDUAL STRESSES IN ALUMINUM CLAD URANIUM-10WT%MOLYBDENUM FUEL PLATES Donald W. Brown, Los Alamos National Lab Bjorn Clausen, Los Alamos National Lab Maria A Okuniewski, Idaho National Lab |
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Applications of X-ray Fluorescence for the Electronics Industry W.W. Brubaker, DuPont Central Research & Development, Wilmington, DE |
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THE BTX BENCH-TOP XRD ANALYSIS FOR FEED & FERTILIZER FORMULATIONS Jose Brum, Olympus Innov-X Systems, Inc. 100 Sylvan Rd., Suite 500 Woburn, MA 01801 |
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NON-DESTRUCTIVE FINGERPRINTING OF PHARMACEUTICAL COMPOUNDS WITH A LOW-COST, SMALL FOOTPRINT BENCH-TOP XRD SYSTEM, THE BTX Jose Brum, Olympus InnovX |
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EVALUATION OF PORTABLE XRF AND XRD ANALYZERS FOR IDENTIFICATION OF COUNTERFEIT PHARMACEUTICAL PRODUCTS Charles R. Bupp, San Francisco State University, San Francisco, CA Tyler Jennison, InXitu, Campbell, CA Heather Gregory, San Francisco State University, San Francisco, CA Peter T. Palmer, San Francisco State University, San Francisco, CA |
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X-RAY MEASUREMENTS OF NANOMETER THICK TaxO1-x ON SILICON SUBSTRATES FOR THICKNESS AND COMPOSITION DETERMINATION F. J. Cadieu*, I. Vander, Y. Rong, and R. W. Zuneska, Physics Dept., Queens College of CUNY, Flushing, NY 11367 |
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CEMENT APPLICATIONS WITH HANDHELD XRF M, Cameron, Bruker Elemental, Kennewick, WA, USA |
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COMPOSITION-DEPENDENT NEGATIVE THERMAL EXPANSION IN TETRACYANIDOBORATE MATERIALS Jessica J. Chadbourne*, David J. Price, Cameron J. Kepert, School of Chemistry, University of Sydney, NSW, Australia Vanessa K. Peterson, The Bragg Institute, Australian Nuclear Science and Technology Organisation, NSW, Australia |
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COMPUTER-AIDED ENGINEERING DESIGN OF HTXRD RESISTIVE HEATING STRIPS TO MINIMIZE SAMPLE TEMPERATURE GRADIENT R.Chandrasekaran, A.Drews*, Ford Research and Advanced Engineering, Ford Motor Company, Dearborn, MI 48124, USA |
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4D Materials Science: In Situ X-ray Synchrotron Tomography of Deformation in Metallic Materials N. Chawla, Arizona State University, Tempe, AZ USA J.J. Williams, Arizona State University, Tempe, AZ USA N.C. Chapman, Arizona State University, Tempe, AZ USA M.Y. Wang, Arizona State University, Tempe, AZ USA X. Xiao, Advanced Photon Source, Argonne National Laboratory, Argonne, IL, USA F. De Carlo, Advanced Photon Source, Argonne National Laboratory, Argonne, IL, USA |
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QUANTITATIVE ANALYSIS OF TOXIC ELEMENTS IN CONSUMER PRODUCTS AND ENVIRONMENTAL SAMPLES BY HIGH DEFINITION XRF Z. W. Chen*, Shenghua Song, Danhong Li, and Alex Vershinin, XOS, East Greenbush, NY, USA |
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DETECTION LIMITS OF OPTIC-ENABLED FIELD-PORTABLE XRF SYSTEMS Berry Beumer*, Z. W. Chen, XOS, East Greenbush, NY, USA |
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Phase Equilibrium and Thermal Studies of Thermal Energy Storage Materials W. Chien*, I. Gantan, A. Mishra, V. K. Kamisetti, P. Mekala, D. Chandra, Uinversity of Nevada, Reno, Reno, NV, USA |
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USING IN-SITU TECHNIQUES TO PROBE HIGH TEMPERATURE REACTIONS: THERMOCHEMICAL CYCLES FOR THE PRODUCTION OF SYNTHETIC FUELS FROM CO2 AND WATER Eric N. Coker, Mark A. Rodriguez, Andrea Ambrosini, James E. Miller, Sandia National Labs., Albuquerque, NM USA |
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MULTILAYER LAUE LENS FABRICATION FOR X-RAY NANOFOCUSING; CURRENT STATUS AND FUTURE PERSPECTIVES R. Conley*, N. Bouet, H. Yan, Y. S. Chu, NSLS-II, Brookhaven National Laboratory, Upton, NY, USA A.T. Macrander, J. Maser, R. Divan, G.B. Stephenson, B. Shi, C. Liu, L. Assoufid, Advanced Photon Source, Argonne National Laboratory, Argonne, IL, USA H. Kang, Chosun University, Gwangju, 501-759, Republic of Korea |
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TRACE ELEMENT BACKGROUND CORRECTION AND SMALL SPOT ANALYSIS FOR GEOLOGICAL SAMPLES WITH A NEW 4.2 KW XRF SPECTROMETER Richard M. Conrey, GeoAnalytical Laboratory, School of Earth and Environmental Sciences, Box 642812, Washington State University, Pullman, WA 99164 |
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ULTRA-COMPACT X-RAY SOURCE FOR HANDHELD AND PORTABLE XRF APPLICATIONS D. Wang, Moxtek, Inc. Orem, UT, USA S.Cornaby, Moxtek, Inc. Orem, UT, USA D. Reynolds, Moxtek, Inc. Orem, UT, USA J. Smith, Moxtek, Inc. Orem, UT, USA C. Jensen, Moxtek, Inc. Orem, UT, USA |
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PERFORMANCE IMPROVEMENTS IN MINIATURE X-RAY TUBES S. Cornaby, Moxtek, Inc. Orem, UT, USA D. Reynolds, Moxtek, Inc. Orem, UT, USA V. Jones, Moxtek, Inc. Orem, UT, USA M. Heber, Moxtek, Inc. Orem, UT, USA C. Jensen, Moxtek, Inc. Orem, UT, USA |
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QUANTITATIVE COMBINED XRF AND EPMA ANALYSIS IN THE SEM Brian J. Cross*, CrossRoads Scientific, El Granada, CA, USA Kenny C. Witherspoon, iXRF Systems Inc., Houston, TX, USA |
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QUANTITATIVE CHARACTERIZATION OF STRATIFIED MATERIALS BY CONFOCAL 3D MICRO-BEAM X-RAY FLUORESCENCE SPECTROSCOPY. MONTE CARLO SIMULATION VS. FUNDAMENTAL PARAMETERS MODEL M. Czyzycki*, D. Wegrzynek, P. Wrobel, M. Lankosz, AGH University of Science and Technology, Cracow, PL-MA, Poland |
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X-Ray Diffraction Characterization of new Ternary Yttrium–Rare Earth Oxides Formed by the Sol–Gel Technique G. Rafailov, Z. Porat, I. Dahan, Nuclear Research Center, Negev, PO Box 9001, Beer-Sheva, 84190 Z. Porat J. Zabicky, D. Moglyanski, K. Rechav, G. Kimmel, Ben-Gurion University of the Negev PO Box 653, Beer-Sheva, 84105 |
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DETERMINATION OF DOPING LEVELS OF TWO-DOPANT PHOSPHOR MATERIALS FROM X-RAY SIGNAL INTENSITY RATIOS AND INTENSITY CORRECTION ANALYSIS Gary Darsey, Cabot Superior MicroPowders, Albuquerque, NM, USA Randy Cone, Thermo Fisher Scientific, Madison, WI, USA |
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MULTILAYER MIRRORS – POTENTIALS FOR MONOCHROMATING, COLLIMATING OR FOCUSING OPTICS R. Dietsch*, M. Kraemer, T. Holz, D. Weissbach, AXO DRESDEN GmbH, Dresden, Germany A. Rack, ESRF, Grenoble, France |
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NOVEL (SUB)-NANOMETER XRF AND TXRF REFERENCE SAMPLES M. Kraemer*, R. Dietsch, T. Holz, D. Weissbach, AXO DRESDEN GmbH, Dresden, Germany |
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ADVANCED GUINIER-TYPE POWDER INSTRUMENTATION R.Dietsch*, T.Holz, AXO DRESDEN GmbH, Dresden, Germany S.J.H.Griessl, N.Huber, Huber Diffraktionstechnik GmbH & Co. KG, Rimsting, Germany H.Borrmann, Max Planck Institute for Chemical Physics of Solids, Dresden, Germany |
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STRUCTURAL ANALYSIS OF INHOMOGENEOUS SnOx THIN FILMS Igor, Djerdj, Rudjer Boskovic Institute, Zagreb, Croatia Davor, Gracin, Rudjer Boskovic Institute, Zagreb, Croatia Krunoslav, Juraić, Rudjer Boskovic Institute, Zagreb, Croatia Daniel, Meljanac, Rudjer Boskovic Institute, Zagreb, Croatia Davor, Balzar, University of Denver, University Blvd., 222 MRB, Denver, CO 80208 USA |
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X-RAY DIFFRACTION ANALYSES OF LITHIUM BATTERY MATERIALS Andy Drews, Ford Motor Company, Dearborn MI USA |
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HIGH-EFFICIENCY LABORATORY SAXS/GISAXS/WAXS INSTRUMENT FOR NANOMATERIALS CHARACTERIZATION Lixin Fan, Rigaku Innovative Technologies Inc., Auburn Hills, MI 48326, USA Mike Degen, Rigaku Innovative Technologies Inc., Auburn Hills, MI 48326, USA Scott Bendle, Rigaku Innovative Technologies Inc., Auburn Hills, MI 48326, USA Paul Pennartz, Rigaku Innovative Technologies Inc., Auburn Hills, MI 48326, USA Nick Grupido, Rigaku Innovative Technologies Inc., Auburn Hills, MI 48326, USA |
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ROUTINE ANALYSIS OF BORON IN GLASS USING WAVELENGTH DISPERSIVE X-RAY FLUORESCENCE SPECTROSCOPY E.M. Fanning, A.S. Nached, M.P. Carson, J.L. Tubbs, D.A. Sternquist, B.R. Wheaton, Corning Incorporated |
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REFERENCE MATERIALS FOR THE STUDY OF POLYMORPHISM AND CRYSTALLINITY IN CELLULOSICS T.G. Fawcett, C.E. Crowder, S.N. Kabekkodu, F. Needham, J.W. Reid, International Centre for Diffraction Data, Newtown Square, PA J.A. Kaduk, Illinois Institute of Technology, Naperville, IL T.N. Blanton, Eastman Kodak Company, Rochester, NY V. Petkov, Central Michigan University, Mt. Pleasant, MI R. Shpenchanko, Moscow State University, Moscow, Russia |
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BREAKING THE 10NM NANOFOCUS SPOT SIZE BARRIER WITH NEW APPROACHES FOR FRESNEL ZONE PLATES M. Feser, E. Snyder, Y. Feng, A. Lyon, S. Chen, Xradia Inc., Pleasanton, CA |
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HIGH-SPEED X-RAY FULL-FIELD IMAGING APPLICATIONS AT THE APS Kamel, Fezzaa, Argonne National Laboratory, Argonne, IL, USA |
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CHARACTERIZATION OF ELECTROCHEMICALLY DEPOSITED THERMOELECTRIC FILMS U.E.A. Fittschen, K. Reinsberg, M. Menzel, J.A.C. Broekaert, University of Hamburg, Hamburg, Germany K. Appel, Deutsches Elektronen Synchrotron, Hamburg, Germany |
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DXC at ICDD D. Flaherty, ICDD |
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ULTRA-FAST COMPACT MULTI-CHANNEL READOUT SYSTEM FOR SDDs R. Alberti, L. Bombelli, T. Frizzi*, S. Moser, XGLab SRL, Milano, Italy C. Fiorini, R. Quaglia, Politecnico di Milano, Dip. Elettronica e Informazione, Milano, Italy |
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RIETVELD QUANTITATIVE ANALYSIS OF SUPER DUPLEX STAINLESS STEEL J.L. Garin*, Universidad de Santiago de Chile, Santiago, Chile R.L. Mannheim, Universidad de Santiago de Chile, Santiago, Chile M.A. Camus, Universidad de Antofagasta, Antofagasta, Chile |
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THE EXCAVATIONS AT CORIGLIA, CASTEL VISCARDO, ITALY: USE OF X PORTABLE XRF FOR PHASING OF WALLS ACROSS TRENCHS D.B. George, L. Rulman, M.K. Donais, Saint Anselm College, Manchester, NH |
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A Software Program for Calculating Diffraction Elastic Constants of Textured Materials Thomas Gnäupel-Herold, University of Maryland, NIST Center for Neutron Research, Giathersburg |
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An Investigation of the Accuracy of Diffraction Stress Evaluation of Textured Materials Thomas Gnäupel-Herold, University of Maryland, NIST Center for Neutron Research, Giathersburg |
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COMBINED RIETVELD ANALYS OF X-RAY AND NEUTRON DIFFRACTION DATA OF ZINC OXIDE TRANSPARENT CONDUCTORS GB González Avilés*, R Mansourian, B Hardnacke, A Wesolik, J Gardner, DePaul University, Chicago IL, USA JS Okasinski, Argonne National Laboratory, Argonne, IL, USA |
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NEW FAST IN-SITU XRD SYSTEM ALLOWS GROWTH STUDIES OF THIN FILMS FOR PHOTOVOLTAICS A. Haase*, M, Klatt, A. Schafmeister, R. Stabenow, GE Sensing & Inspection Technologies, Ahrensburg, Germany I. Kötschau, centrotherm photovoltaics AG, Blaubeuren, Germany |
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FAST X-RAY IMAGING „ON-THE-FLY“ WITH A BENCHTOP µ-XRF INSTRUMENT M.Haschke, U.Waldschläger, U.Rossek, R.Tagle, R.Erler, Bruker Nano GmbH, Berlin, Germany |
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MULTILAYER OPTICS FOR X-RAY ANALYTICS A. Kleine, B. Hasse, C. Michaelsen, J. Wiesmann, A. Hembd, U. Heidorn, S. Kroth, F. Hertlein, Incoatec GmbH, Max-Planck-Strasse 2, 21502 Geesthacht, Germany |
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HIGH-BRILLIANCE LOW-MAINTANACE MICROFOCUS SOURCES FOR DIFFRACTOMETRY Bernd Hasse, Andreas Kleine, Jürgen Graf, Jörg Wiesmann, Carsten Michaelsen, Incoatec GmbH, Max-Planck-Strasse 2, 21502 Geesthacht, Germany |
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Calibration of X-ray Imaging Devices for Accurate Intensity Measurement M. J. Haugh*, P. W. Ross, National Security Technologies N. Palmer, M. B. Schneider, Lawrence Livermore National Laboratory |
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HIGH RESOLUTION X-RAY (HIRX) DETECTION OF PLUTONIUM George Havrilla, Michael Collins, Los Alamos National Laboratory, Los Alamos, NM USA Velma Montoya, Los Alamos National Laboratory, Los Alamos, NM USA Zewu Chen, X-ray Optical Systems, East Greenbush, NY USA Fuzhong Wei, X-ray Optical Systems, East Greenbush, NY USA Matthew Cusack, X-ray Optical Systems, East Greenbush, NY USA |
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ACTINIDE CHARACTERIZATION USING ULTRA HIGH ENERGY X-RAY FLUORESCENCE George Havrilla, Michael Collins, Los Alamos National Laboratory, Los Alamos, NM USA Velma Montoya, Los Alamos National Laboratory, Los Alamos, NM USA Zewu Chen, X-ray Optical Systems, East Greenbush, NY USA Fuzhong Wei, X-ray Optical Systems, East Greenbush, NY USA Matthew Cusack, X-ray Optical Systems, East Greenbush, NY USA |
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TRACE ANALYSIS OF CADMIUM IN RICE BY THE SELECTIVE EXCITATION OF L SHELL X-RAY FLUORESCENCE Shinjiro Hayakawa, Yuko Sugihara, Takeshi Hirokawa, Department of Applied Chemistry, Graduate School of Engineering, Hiroshima University, Hiroshima 739-8527, Japan Hirofumi Namatame, Hiroshima Synchrotron Radiation Center (HSRC), Hiroshima University, Hiroshima 739-0046, Japan |
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ALGORITHM AND STRATEGY OF STRESS ANALYSIS WITH 2D DETECTOR Bob B. He, Bruker AXS Inc |
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MICROSTRUCTURE OF PLASTIC BONDED EXPLOSVES PBX M. Herrmann, P.B. Kempa, U. Förter-Barth, Fraunhofer Institute Chemical Technology ICT, Pfinztal, Germany W. Arnold, MBDA-TDW, Schrobenhausen, Germany |
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PHASE STABILITY STUDY OF NixMg1-xAl2O4 VIA XRD AND COMPLEMENTARY TECHNIQUES S. T. Misture*, B. E. Hill, Alfred University, Alfred, NY, USA M. E. Miller, Excelerant Ceramics, Alfred, NY, USA |
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STRATEGY OF FUSION BEAD CORRECTION IN XRF ANALYSIS OF POWDERS H. Homma*, H. Inoue, Y. Yamada, Y. Kataoka, Rigaku Corporation, Takatsuki, Osaka, Japan M. Feeney, L. Oelofse, Rigaku Americas Corporation, The Woodlands, Texas, USA |
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APPLICATION OF FUSION BEAD CORRECTION IN XRF ANALYSIS OF POWDERS H. Homma, H. Inoue, Y. Kataoka, Rigaku Corporation, Takatsuki, Osaka, Japan M. Feeney, L. Oelofse, L.A. Fields, Rigaku Americas Corporation, The Woodlands, Texas, USA |
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COMBINING u-XRD2 AND DTA: DEEPER INSIGHTS IN TEMPERATURE-DEPENDENT PROCESSES N. Huber, C. Berthold, K.G. Nickel, University of Tuebingen, Tuebingen, Germany A. Kern, Bruker AXS, Karlsruhe, Germany |
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SYNCHROTRON X-RAY MICROBEAM CHARACTERIZATION OF LIQUID CRYSTAL A.Iida*, Institute of Materials Structure Science, Tsukuba, Ibaraki, Japan Y.Takanishi, Kyoto University, Sakyo, Kyoto, Japan |
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Applications of Ultra-small angle X-ray scattering in the characterization of nanomaterials Jan Ilavsky, X-ray Science Division, APS, ANL, Argonne, IL, USA |
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DEVELOPMENT OF A PALM-SIZED ELECTRON PROBE X-RAY ANALYZER S. Terada, Department of Materials Science and Engineering, Kyoto University, Kyoto, Japan S. Imashuku, Department of Materials Science and Engineering, Kyoto University, Kyoto, Japan J. Kawai, Department of Materials Science and Engineering, Kyoto University, Kyoto, Japan |
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IMPROVEMENT OF DETECTION LIMITS OF A PORTABLE TXRF BY REDUCING ELECTRICAL NOISE Susumu Imashuku, Kyoto University, Kyoto, Kyoto, Japan Deh Ping Tee, Kyoto University, Kyoto, Kyoto, Japan Yasukazu Nakae, Kyoto University, Kyoto, Kyoto, Japan Jun Kawai, Kyoto University, Kyoto, Kyoto, Japan |
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Evaluating XRF Na and Cl Measurements in Particulate Matter Samples H., Indresand*, A.M., Dillner, IMPROVE Program, Crocker Nuclear Laboratory, University of California, Davis, CA, 95616, United States |
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Spectral Interferences of Sulfur on Light Elements in XRF Analysis of Particulate Matter Samples H., Indresand*, A.M., Dillner, IMPROVE Program, Crocker Nuclear Laboratory, University of California, Davis, CA, 95616, United States M., Shen, Department of Environmental Engineering, Zhejiang University, Hangzhou, 310029, P.R. China |
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RAPID TRIGLYCERIDE POLYMORPH ANALYSIS USING A NEW GENERATION OF 2D BENCHTOP pXRD Tyler C. Jennison, Inxitu inc., Campbell, CA, USA |
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APPLICATIONS FOR X-RAY MICRODIFFRACTION Brian Jones*, Holger Cordes, Madhana Sunder, Jon Giencke, Bob He, Bruker AXS – 5465 East Cheryl Pkwy – Madison, WI - US |
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DATA VALIDATION OF MODULATED AND COMPOSITE STRUCTURES S.N. Kabekkodu, D. Sagnella, International Centre for Diffraction Data, Newtown Square, PA V. Petricek, Institute of Physics, Prague, Czech Republic |
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CRYSTAL STRUCTURE OF MONOCLINIC SR2.4CA0.6AL2O6 James Kaduk, IIT, Chicago IL USA Winnie Wong-Ng, NIST, Gaithersburg MD USA Joseph Golab, Ineos Technologies, Naperville IL USA |
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ANALYSIS OF TCLP EXTRACTS BY X-RAY FLUORESCENCE D.S. Kendall*, U.S. EPA, Denver, CO, USA |
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LIQUID METAL JET MICRO-FOCUS X-RAY SOURCE: HIGHEST BRILLIANCE FOR HOME LAB INSTRUMENTATION Christoph Ollinger, Arnt Kern*, Bruker AXS, Karlsruhe, Germany |
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PILATUS DETECTORS - NEXT GENERATION INSTRUMENTS FOR ADVANCED X-RAY DIFFRACTION STUDIES. M. KOBAS, DECTRIS Ltd., Baden, Switzerland |
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POWDER X-RAY DIFFRACTOMETER WITH EASILY MOUNT/DISMOUNTABLE Ka1 OPTICS UNIT Takayuki Konya, Takeshi Osakabe, Keigo Nagao, Tomikatsu Kubo, Yoshinori Ueji, Ryuji Matsuo, Tetsuya Ozawa, 1) Rigaku Corporation, 3 - 9 - 12 Akishima-shi Matsubara-cho, Tokyo 196-8666, Japan Licai Jiang, Boris Verman, 2) Rigaku Innovative Technologies Inc., 1900 Taylor Road, Auburn Hills, Michigan 48326, USA |
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PAIR DISTRIBUTION FUNCTION STUDIES OF GOLD NANOPARTICLE ENSEMBLES: THE CHALLENGE AND IMPORTANCE OF MOVING BEYOND ENSEMBLE AVERAGED STRUCTURAL DESCRIPTIONS J. A., Kurzman*; R., Seshadri, University of California Santa Barbara, Santa Barbara, CA USA K., Page, Lujan Neutron Scattering Center, Los Alamos National Laboratory, Los Alamos, NM USA |
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INVESTIGATION OF PATHOLOGICAL MECHANISMS IN BRAIN CANCERS WITH THE USE OF TECHNIQUES BASED ON SYNCHROTRON RADIATION M. Czyzycki, M. Szczerbowska-Boruchowska, A. Wandzilak, M. Czyzycki, K. Wolska, M.Lankosz, 1AGH-University of Science and Technology, Faculty of Physics and Applied Computer Science, Al. Mickiewicza 30, 30-059 Krakow, Poland D. Adamek, E. Radwanska, Department of Pathomorphology, Collegium Medicum, Jagiellonian University, Krakow, Poland |
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Structure/microstructure relationships in defective and nanostructured materials Matteo,Leoni, Università di Trento, Trento, Italy |
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CHARACTERIZING LOCAL STRAIN TENSORS, CRYSTALLOGRAPHIC ORIENTATIONS AND DEFECTS USING SUB-MICROMETER X-RAY BEAMS, AND COMPARISON WITH CONVENTIONAL LINE PROFILE ANALYSIS L.E. Levine, NIST, Gaithersburg, MD, USA B.C. Larson, ORNL, Oak Ridge, TN, USA P. Geantil, USC, Los Angeles, CA, USA J.Z. Tischler, ORNL, Oak Ridge, TN, USA W. Liu, ANL, Argonne, IL, USA M.E. Kassner, USC, Los Angeles, CA, USA |
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AN IN-SITU X-RAY DIFFRACTION STUDY OF REDUCTION OF NICKLE OXIDE BY HYDROGEN J.H. Li, A. Tripathi, A. Takase, L. Fields, T. McNulty, Rigaku Americas Corporation, The Woodlands, TX, USA |
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Use of Monte Carlo Simulation Methods to Improve X-ray Detector Response Function Fusheng Li, Baker Hughes, 2001 Rankin Rd., Houston, TX 77073 Xiaogang Han, Baker Hughes, 2001 Rankin Rd., Houston, TX 77073 Robin Gardner, North Carolina State University, Raleigh, NC 27695 |
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ON THE USE OF MONTE CARLO BASED METHODS TO EDXRF QUALITATIVE ANALYSIS Fusheng Li, Baker Hughes, 2001 Rankin Rd., Houston, TX 77073 Jiaxin Wang, North Carolina State University, Raleigh, NC 27695 Robin Gardner, North Carolina State University, Raleigh, NC 27695 |
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EXPERIMENT VERIFICATION FOR THE DEPENDENCE OF THE X-RAY DIFFRACTION LINE PROFILE WITH THE ABSORPTION OF SAMPLE Kejia Liu, Shanghai Institute of Tech. Huifen Chen, Shanghai Institute of Tech. |
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DEVELOPMENT OF A NEW DIFFRACTOMETER FOR THE EVALUATION OF A VERY MICRO AREA M. Maeyama*, S. Yasukawa, D. Iino, K. Itoh, T. Yoshida, H. Kawasaki, S. Yoshihara, K. Wakasaya, Rigaku Corporation, Akishima-shi, Tokyo, JAPAN |
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THE EFFECT OF GRAIN SIZE ON THE SEMICONDUCTING, ELECTRICAL, AND STRUCTURAL PROPERTIES OF ZINC OXIDE R. Mansourian *, GB. González Avilés, Department of Physics, DePaul University, Chicago, IL, USA |
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Edible nanostructutes – the pleasures of chocolate Alejandro G. Marangoni, University of Guelph, Guelph, ON, Canada |
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SAMPLE PREPARATION STRATEGIES FOR TRACE AND SPECIATION ANALYSIS BY TXRF SPECTROMETRY: PAST, PRESENT AND FUTURE E.Marguí, M.Hidalgo, University of Girona, Girona, Spain I.Queralt, Institute of Earth Sciences “Jaume Almera”, CSIC, Barcelona, Spain C.Streli, Atominstitut TU Wien, Wien, Austria |
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ANALYTICAL POSSIBILITIES OF TOTAL REFLECTION X-RAY SPECTROMETRY (TXRF) FOR TRACE SELENIUM DETERMINATION IN SOILS AND LEACHING SOLUTIONS E, Margui, University of Girona, Girona, Spain G.H.Floor, University of Girona, Girona, Spain M.Hidalgo, University of Girona, Girona, Spain G.Roman-Ross, University of Girona, Girona, Spain C.Streli, Atominstitut, Vienna, Austria I.Queralt, Institute of Earth Sciences "Jaume Almera", CSIC, Barcelona, Spain |
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DETERMINATION OF CATALYST RESIDUES IN ACTIVE PHARMACEUTICAL INGREDIENTS BY MEANS OF TOTAL REFLECTION X-RAY SPECTROMETRY (TXRF) E, Margui, University of Girona, Girona, Spain M, Hidalgo, University of Girona, Girona, Spain P, De Pape, Bruker AXS GmbH, Karlsruhe, Germany I, Queralt, Institute of Earth Sciences "Jaume Almera", CSIC, Barcelona, Spain |
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CORE-SHEATH SIZE OF NANOPARTICLE DISPERSIONS STUDIED BY SAXS AND COMPLEMENTARY TECHNIQUES M.N, Martin*, A.J. Allen, R.I. MacCuspie, NIST, Gaithersburg, MD, USA |
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TRIADS XRPD INDEXING ALGORITHM AND ITS USE IN PHARMACEUTICAL DEVELOPMENT Richard B. McClurg, SSCI, a Division of Aptuit, West Lafayette, IN, USA |
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SOLEX: A COMPREHENSIVE TOOL FOR ENERGY-DISPERSIVE DETECTORS CHARACTERIZATION Yves Ménesguen, CEA-Saclay, FRANCE Marie-Christine Lépy, CEA-Saclay, FRANCE |
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Comparison of Sample Preparation Approaches for TXRF Using Different pL Pipetting Systems M. Menzel*, U.E.A. Fittschen, Chemistry Department, Hamburg, Hamburg, Germany G. Havrilla, National Laboratory, Los Alamos, NM, USA U. Waldschläger, Bruker nano GmbH, Berlin, Berlin, Germany |
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X-ray Fluorescence Analysis of Round Robin Samples: Andesite, MGL-AND and Ordinary Portland Cement, OPC-1 D.M. Missimer, R.L. Rutherford, Savannah River National Laboratory, Aiken, SC |
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GRATINGS WITH EXTREME ASPECT RATIO FOR X-RAY PHASE CONTRAST TOMOGRAPHY at HIGH ENERGIES J. Mohr, T. Grund, J. Kenntner, Karlsruhe Institute of Technology, Institute of Microstrucutre Technology, Karlsruhe, Germany V. Altapova, T. Baumbach, Karlsruhe Institute of Technology, Institute of Synchrotron Radiation, Karlsruhe, Germany I. Zanette, European Synchrotron Radiation Facility, Grenoble, France T. Weitkamp, Synchrotron Soleil, Gif-sur-Yvette, France |
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Validation of Fundamental Parameters Approach Software for Use in NIST SRM Certification Katharine M. Mullen, National Institute of Standards and Technology (NIST) David L. Gil, Princeton University Donald Windover, National Institute of Standards and Technology (NIST) James P. Cline, National Institute of Standards and Technology (NIST) |
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FUNDAMENTAL PARAMETER DETERMINATION FOR IMPROVED XRF QUANTIFICATION IN THE SOFT X-RAY RANGE M. Müller, B. Beckhoff, Physikalisch-Technische Bundesanstalt, Berlin, Germany Birgit, Kanngießer, Technical University of Berlin, Berlin Germany |
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UNDERSTANDING STRESS GRADIENTS IN MICROELECTRONIC METALLIZATION C.E. Murray, I.B.M. T.J. Watson Research Center, Yorktown Heights, NY |
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A NOISE REDUCTION ALGORITHM FOR DIGITAL SIGNAL PROCESSERS Y. Nakaye, J. Kawai, Kyoto University, Kyoto, Kyoto, Japan |
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Determining the synergistic effect of organoclay and carbon black on the morphology structure, and mechanical properties of epoxy-polymer using X-ray and AFM P. Nawani*, L. S. Faraji, R. P. Singh, Oklahoma State University, Tulsa, Ok, USA |
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Correlative Characterization of Li-S Batteries with In situ TXM and XRD J. Nelson*, S. Misra, J.C. Andrews, M.F Toney, Stanford Synchrotron Radiation Lightsource, SLAC National Accelerator Laboratory, Menlo Park, CA 94025, USA Y. Yang, A. Jackson, Y. Cui, Materials Science and Engineering, Stanford University, Stanford, CA 94305, USA |
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IS ONSET OF GAMMA-ALUMINA RECRYSTALLIZATION DEPENDENT ON CRYSTALLITE SIZE? A COMPARISON OF IN-SITU CALCINATIONS BY HIGH TEMPERATURE XRD AND CONVENTIONAL EX-SITU CALCINATIONS WITH STANDARD POWDER XRD. C.L. Nicholas*, C.K. Costello, A.Z. Ringwelski, M.A. Vanek, UOP LLC A Honeywell Company, Des Plaines, IL, USA |
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MOVING TO HIGH DETECTION EFFICIENCY, LOW BACKGROUND SILICON DRIFT DETECTORS A.Niculae*, J.Herrmann, M.Bornschlegl, O.Jaritschin, PNDetector GmbH, Munich, Germany R.Eckhardt, S.Jeschke, P.Lechner, L.Mungenast, B.Schweinfest, H.Soltau, PNSensor GmbH, Munich, Germany L.Andricek, L.Strüder, MPI Halbleiterlabor, Munich, Germany |
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ADDRESSING INDUSTRIAL PROBLEMS USING X-RAY DIFFRACTION AT THE ADVANCED PHOTON SOURCE John Okasinski*, M. Suchomel, , J. Almer, L. Ribaud, and B. H. Toby, Argonne National Laboratory, Argonne, IL USA |
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IN-SITU X-RAY DIFFRACTION FROM LITHIUM ION BATTERIES John Okasinski*, Argonne National Laboratory, Argonne, IL USA Cary Hayner, Harold Kung, Northwestern Univeristy, Evanston, IL USA |
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DESIGN AND MEASUREMENT WITH A NEW PORTABLE X-RAY CAMERA I.Ordavo*, U.Weber, PNDetector GmbH, Munich, Germany S. Ihle, R.Hartmann, H.Soltau, M.Lang, A.Liebel, PNSensor GmbH, Munich, Germany G.Schaller, L.Strueder, C.Thamm, MPI Halbleiterlabor, Munich, Germany |
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RIETVELD REFINEMENT WITH A MODEL THAT CONSIDERS CRYSTALLITE SIZE DISTRIBUTION AND ANISOTROPIC CRYSTALLITE SHAPE O. Ovalle, X. Bokhimi, Instituto de Física, Universidad Nacional Autónoma de México, Coyoacan, D.F., Mexico |
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560 mm² SDD ARRAY A. Pahlke, T. Eggert, R. Fojt, L. Höllt, J. Knobloch, S. Pahlke, O. Scheid, R. Stötter, F. Wiest, KETEK GmbH |
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FROM THE FIELD TO THE LAB – FDA USE OF XRF TO MONITOR FOODS, DRUGS, AND OTHER CONSUMER PRODUCTS Peter T. Palmer, San Francisco State University, San Francisco, CA Richard Jacobs, FDA Sally Yee, FDA Christina Qiu, FDA Michael Nausin, FDA Consuelo Castro, FDA |
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SEARCHING FOR A REFINABLE MODEL OF A NANOCRYSTAL B.F.Palosz, Institute of High Pressure Physics, Polish Academy of Sciences, Warsaw, Poland |
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THE CHALLENGES IN DESIGNING, OPTIMIZING, AND MANUFACTURING X-RAY DETECTORS FOR HAND-HELD XRF J. Pantazis, A. Huber, T.Pantazis, R. Redus, Amptek Inc, Bedford, MA, USA |
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IMPROVED QUANTIFICATION OF OBJECTS IMAGED IN 3D USING X-RAY MICRO-TOMOGRAPHY B.M. Patterson*, C.E. Hamilton, E.K. Cerreta, J.P. Escobedo-Diaz, D. Dennis-Koller, Los Alamos National Laboratory, Los Alamos, NM, USA |
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NOVEL ACOUSTIC EMISSION AND XRD IN-SITU CELL FOR CHARACTERIZATION OF LITHIUM ION BATTERIES K. Rhodes, University of Tennessee, Knoxville, TN, USA M.J. Kirkham, R.A. Meisner, E.A. Payzant*, N. Dudney, C. Daniel, Oak Ridge National laboratory, Oak Ridge, TN, USA |
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Grazing Incidence X-ray Fluorescence Analysis in Shallow Dopant Distributions and Thin Film Analysis G. Pepponi, Centre for Materials and Microsystems, Fondazione Bruno Kessler, Trento, Italy |
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EVOLUTION OF HANDHELD ED-XRF ANALYZERS AND THEIR IMPACT ON QUALITY OF OUR LIVES Stanislaw Piorek, Thermo Niton Analyzers, LLC, Billerica, MA, USA |
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CHARACTERIZATION OF SUB-MICRON THIN FILMS AND MULTILAYERS BY ENERGY DISPERSIVE X-RAY FLUORESCENCE I. Queralt*, Laboratory of X-ray Analytical Applications (LARX). Institute of Earth Sciences “Jaume Almera”, CSIC. Solé Sabarís s/n.ES- 08028 Barcelona, Spain. E. Margui, Department of Chemistry, University of Girona, Campus Montilivi, ES-17071 Girona, Spain X. Llovet, Universitat de Barcelona, Serveis Científico-Tècnics, Lluís Solé i Sabarís, 1-3, ES-08028 Barcelona, Spain J. Pujol, Fischer Instruments SA, Almogàvers St., 157, ES-08018, Barcelona, Spain F.J. Piniella, Autonomous University of Barcelona, Crystallography Unit. ES-08193 Cerdanyola del Vallès, Barcelona, Spain |
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RIETVELD QUANTITATIVE PHASE ANALYSIS OF MINERALOGICAL MATERIALS Mati Raudsepp, University of British Columbia, Vancouver, BC, Canada |
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NEW INSTRUMENTATION FOR X-RAY MICRO DIFFRACTION Heiko R Ress, Bruker AXS – 5465 East Cheryl Pkwy – Madison, WI - US Christoph Ollinger, Bruker AXS – Oestliche Rheinbrueckenstrasse 49 - Karlsruhe - Germany Geert Vanhoyland, Bruker AXS – Oestliche Rheinbrueckenstrasse 49 - Karlsruhe - Germany Bob He, Bruker AXS – 5465 East Cheryl Pkwy – Madison, WI - US Brian Jones, Bruker AXS – 5465 East Cheryl Pkwy – Madison, WI - US |
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Investigation of the structure of aluminum and gallium doped zinc oxide chemical vapor deposited thin films on glass using XRD and TEM P. Ricou*, R. Korotkov, L. Fang, Arkema Inc., 900 First avenue, King of Prussia, PA 19406, USA |
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IMPROVED SOURCE AND MULTILAYER OPTICS INTEGRATION FOR FAST AND LOCAL XRD MEASUREMENTS Sergio, Rodrigues, Xenocs, France Pierre, Panine, Xenocs, France Peter Høghøj, Xenocs, France |
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ADVANTAGES OF COUPLING SCATTERLESS COLLIMATION WITH HIGH BRILLIANCE MICROFOCUS SOURCES FOR SAXS APPLICATIONS S. Rodrigues, P. Panine, P. Høghøj, Xenocs SA, Sassenage, France |
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MULTIVARIATE STATISTICAL ANALYSIS of MICRO-XRF SPECTRAL IMAGES FROM A BRUKER M4 TORNADO SYSTEM M.A. Rodriguez, P.G. Kotula, D.E. Wesolowski, J.E. Heath, S.J. Bauer, Sandia National Laboratories, Albuquerque, NM |
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HANDHELD XRF SCREENING FOR DANGEROUSLY HIGH LEVELS OF TOXIC METALS IN DEVELOPING COUNTRIES David Couto, Olympus Innov-X, Woburn, MA, USA |
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HANDHELD XRF SOIL ANALYSIS FOR PRECISION AGRICULTURE AND PERI-URBAN FARMING APPLICATIONS David Couto, Olympus Innov-X, Woburn, MA, USA |
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MINIATURE TUBE AND DETECTOR MODELING OF PORTABLE XRF INSTRUMENTATION David Couto, Olympus Innov-X, Woburn, MA, USA |
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X-RAY REFLECTION TOMOGRAPHY –FIRST RESULTS ON SURFACE IMAGING K. Sakurai, University of Tsukuba, Ibaraki, Japan and National Institute for Materials Science, Ibaraki, Japan V.A. Innis-Samson, University of Tsukuba, Ibaraki, Japan M. Mizusawa, National Institute for Materials Science, Ibaraki, Japan |
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STRUCTURE AND DYNAMICS AT THE NANOSCALE PROBED BY X-RAY PHOTON CORRELATION SPECTROSCOPY A. R. Sandy*, S. Narayanan, M. Sikorski, Argonne National Laboratory, Argonne, IL USA X. Lu, Brookhaven National Laboratory, Upton, NY USA S. G. J. Mochrie, Yale University, New Haven, CT USA |
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The development and evaluation of a new SAXS system for biological samples. Katsunari Sasaki*, Angela Criswell, Joseph Ferrara, Rigaku Americas Corporation, The Woodlands, TX, USA Nanao Suzuki, Chiba University, Chiba, Chiba, Japan Licai Jiang, Mike Degen, Rigaku Innovative Technologies, Auburn Hills, MI, USA |
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APPLICATION OF LINE PROFILE ANALYSIS TO EVALUATION OF MICROSTRUCTURAL RECOVERY ACCOMPANIED WITH PRECIPITATION IN AGED ALLOYS S. Sato*, A. Hasegawa, K. Wagatsuma, Institute for Materials Reserach, Tohoku University, Sendai, Japan Y. Takahashi, 2) Research Department, NISSAN ARC, LTD., Yokosuka, Japan S. Suzuki, Institute of Multidisciplinary Research for Advanced Materials, Tohoku University, Sendai, Japan |
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TOWARDS ACCURATE ANALYZES OF GENESIS SOLAR WIND SAMPLES: EVALUATION OF SURFACE CLEANING METHODS USING TOTAL REFLECTION X-RAY FLUORESCENCE SPECTROMETRY Martina Schmeling, Loyola University Chicago, Chicago, Illinois 60660, U.S.A. Munir Humayun, Florida State University, Tallahassee, Florida 32306, U.S.A. Amy J.G. Jurewicz, Arizone State University, Tempe, Arizona 85287, U.S.A. Igor V. Veryovkin, Argonne National Laboratory, Argonne, Illinois 60439, U.S.A. Donald S. Burnett, California Institute of Technology, Pasadena, California 91125, U.S.A. |
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A MECHANANICAL TESTING CAPABILITY FOR MEASURING MICROSCALE DEFORMATION BEHAVIOR OF STRUCTURAL MATERIALS J.C. Schuren*, Materials and Manufacturing Directorate - Air Force Research Laboratory, Wright-Patterson Air Force Base, OH, USA M.P. Miller, Cornell University, Ithaca, NY, USA A. Kazimirov, Cornell High Energy Synchrotron Source, Ithaca, NY, USA |
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X-RAY ANALYSIS OF PULSED LASER DEPOSTION OF Bi2Te3 THIN FILM LAYER L. Seyed Faraji, R.P. Singh, Oklahoma State University, Tulsa, OK |
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HH XRF, from the Lab to the Field and back! Using the right calibration for the job at hand A. Seyfarth, Bruker AXS Inc., Madison, WI E. Nummi, M. Cameron, Bruker Elemental, Kennewick, WA |
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USING NEUTRON SCATTERING TO STUDY LITHIUM-ION BATTERIES N. Sharma*, V. K. Peterson, The Bragg Institute, Australian Nuclear Science and Technology Organisation, Kirrawee DC, NSW, Australia C. Feng, H. Li, Key Laboratory for Synthesis and Applications of Organic Functional Molecules, Hubei University, Wuhan 430062, China G. Du, Z. Guo, H. Liu, Institute for Superconducting & Electronic Materials, University of Wollongong, NSW 2522, Australia |
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THE CRYSTAL-STRUCTURE OF Mn-DOPED LiFePO4: A COMBINED NEUTRON AND X-RAY DIFFRACTION STUDY N. Sharma*, V. K. Peterson, The Bragg Institute, Australian Nuclear Science and Technology Organisation, Kirrawee DC, NSW, Australia C. Feng, H. Li, Key Laboratory for Synthesis and Applications of Organic Functional Molecules, Hubei University, Wuhan 430062, China G. Du, Z. Guo, H. Liu, Institute for Superconducting & Electronic Materials, University of Wollongong, NSW 2522, Australia |
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X-RAY DIFFRACTION MEASUREMENT OF RESIDUAL STRESS IN THE DAMAGED BLADE SAMPLE OF GAS TURBINE ENGINE Shouwen Shen, Saudi Aramco, Dhahran, Saudi Arabia Alaaeldin H. Mustafa, Saudi Aramco, Dhahran, Saudi Arabia Ihsan Taie, Saudi Aramco, Dhahran, Saudi Arabia Gasan Alabedi, Saudi Aramco, Dhahran, Saudi Arabia Syed R. Zaidi, Saudi Aramco, Dhahran, Saudi Arabia |
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QUANTITATIVE XRD BULK AND CLAY MINERALOGICAL DETERMINATION OF PALEOSOL SECTION OF UNAYZAH AND BASAL KHUFF CLASTICS IN SAUDI ARABIA S. Shen*, S. R. Zaidi, B. A. Mutairi, S. A. Hamoud, F. S. Khaldi, F. A. Edhaim, Saudi Aramco, Dhahran, Saudi Arabia |
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RESIDUAL STRESS ANALYSIS OF COPPER-INDIUM-GALLIUM-SELENIUM/MOLYBDENUM THIN FILM ON STAINLESS STEEL SUBSTRATE Ying Shi, The Dow Chemical Company, Analytical Science, Midland, MI48764, USA Steve Rozeveld, The Dow Chemical Company, Analytical Science, Midland, MI48764, USA |
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Order and disorder in layered oxide photocatalysts via X-ray and Neutron Powder Diffraction Jiawanjun Shi, Eric J. Nichols, Scott T. Misture*, Alfred University, Alfred, NY, USA |
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STANDARD REFERENCE MATERIAL 2569 LEAD IN PAINT FOR CONSUMER PRODUCTS J.R. Sieber*, J. Mahlerbe, P.E. Stutzman, W.C. Davis, R.P. Watson, S.E. Long, National Inst. Stand. & Tech., Gaithersburg, MD, USA M.P. Isaure, O.F.X. Donard, Université de Pau et des Pays de l’Adour, Pau, France F. Séby, Ultra Traces Analyses Aquitaine, Pau, France P. Rodriguez-Gonzalez, Universidad Oviedo, Oviedo, Spain C. Maurizio, European Synchrotron Radiation Facility N. Unceta, University of the Basque Country, Vitoria-Gasteiz, Spain |
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EVALUATION OF HEXAVALENT CHROMIUM EXTRACTION FROM SOLIDS USING XANES AND XRD J.R. Sieber*, J. Mahlerbe, P.E. Stutzman, W.C. Davis, R.P. Watson, S.E. Long, National Inst. Stand. & Tech., Gaithersburg, MD, USA M.P. Isaure, O.F.X. Donard, Université de Pau et des Pays de l’Adour, Pau, France F. Séby, Ultra Traces Analyses Aquitaine, Pau, France P. Rodriguez-Gonzalez, Universidad Oviedo, Oviedo, Spain C. Maurizio, European Synchrotron Radiation Facility N. Unceta, University of the Basque Country, Vitoria-Gasteiz, Spain |
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USE OF THE RIETVELD METHOD FOR DESCRIBING STRUCTURE AND TEXTURE IN X-RAY DIFFRACTION DATA OF HUNTITE [CaMg3(CO3)4], DOLOMITE [CaMg(CO3)2] AND MAGNESITE [MgCO3] POWDERS Husin Sitepu, Research and Development Center, Saudi Aramco, P.O. Box 62, Dhahran 31311, Saudi Arabia |
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A MEANS FOR ASSESSSING THE EFFECTIVENESS OF THE SHOT PEENING PROCESS AS IT RELATES TO FATIGUE PERFORMANCE Daniel J. Snoha* and Scott M. Grendahl, U.S. Army Research Laboratory, Aberdeen Proving Ground, MD, U.S.A. Beth S. Matlock, Technology for Energy Corporation, Knoxville, TN, U.S.A. |
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SURFACE RELAXATION IN NANO-DIAMONDS EXAMINED WITH APPLICATION OF REAL AND RECIPROCAL SPACE METHODS S.Stelmakh*, E.Grzanka, S.Gierlotka, B.Palosz, Institute of High Pressure Physics, Polish Academy of Sciences, Warsaw, Poland |
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X-RAY POWDER DIFFRACTION IN THE PHARMACEUTICAL INDUSTRY G.A. Stephenson, Eli Lilly and Company, Indianapolis, IN |
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X-RAY FLUORESCENCE AND DIFFRACTION MAPPING OF DENTIN AT 200 NM Stuart R. Stock*, Northwestern University, Chicago, IL, USA Alix C. Deymier-Black, Northwestern University, Chicago, IL, USA Arthur Veis, Northwestern University, Chicago, IL, USA Elizabeth Lux, Northwestern University, Chicago, IL, USA Alvin Telser, Northwestern University, Chicago, IL, USA Zhonghou Cai, Advanced Photon Source, Argonne National Laboratory, Argonne, IL, USA |
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HIGH-ENERGY X-RAY SCATTERING TOMOGRAPHY Stuart R. Stock, Northwestern Univ., Chicago, IL, USA Jonathan D. Almer, the Advanced Photon Source, Argonne National Lab., Argonne, IL, USA |
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STRESSES IN YTTERBIUM SILICATE MULTILAYER ENVIRONMENTAL BARRIER COATINGS F. Stolzenburg*, B.J. Harder, J. Ramirez-Rico, K.T. Faber, Northwestern University, Chicago, IL, US K.N.Lee, Rolls Royce Corporation, Indianapolis, IN, US J.D. Almer, Advanced Photon Source, Argonne National Laboratory, Argonne, IL, US |
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IMPROVEMENT OF CALIBRATION PROCESSES IN TXRF OF WAFER SURFACE ANALYSIS: INVESTIGATION OF SATURATION EFFECTS IN TXRF BY COMPARING DIFFERENT SAMPLE SHAPES F. Meirer, B. Pemmer, N. Zoeger, C. Streli*,, Atominstitut, Technische Universitaet Wien, Stationallee 2, 1020 Vienna, Austria F. Meirer, G. Pepponi, MiNALab, CMM-Irst, Fondazione Bruno Kessler, Via Sommarive 18, 38123 Trento Italy J. Goettlicher, R. Steininger, S. Mangold, Karlsruhe Institute of Technology, Institute for Synchrotron Radiation, Hermann-von-Helmholtz-Platz 1, D-76344 Eggenstein-Leopoldshafen, Germany A. Tampieri, S. Sprio, Istituto di Scienza e Tecnologia dei Materiali Ceramici CNR, Faenca, Italy J. G. Hofstaetter, P. Roschger, K. Klaushofer, Ludwig Boltzmann Institute of Osteology at the Hanusch Hospital of WGKK and AUVA Trauma Centre Meidling, 4th Med. Dept., Hanusch Hospital, 1140 Vienna, Austria J. G. Hofstaetter, Department of Orthopaedic Surgery, Vienna General Hospital, Medical Univ. of Vienna, Austria |
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INFLUENCE OF THE EXCITATION ENERGY ON ABSORPTION EFFECTD IN TXRF ANALYSIS F. Meirer, B. Pemmer, N. Zoeger, C. Streli*,, Atominstitut, Technische Universitaet Wien, Stationallee 2, 1020 Vienna, Austria F. Meirer, G. Pepponi, MiNALab, CMM-Irst, Fondazione Bruno Kessler, Via Sommarive 18, 38123 Trento Italy J. Goettlicher, R. Steininger, S. Mangold, Karlsruhe Institute of Technology, Institute for Synchrotron Radiation, Hermann-von-Helmholtz-Platz 1, D-76344 Eggenstein-Leopoldshafen, Germany A. Tampieri, S. Sprio, Istituto di Scienza e Tecnologia dei Materiali Ceramici CNR, Faenca, Italy J. G. Hofstaetter, P. Roschger, K. Klaushofer, Ludwig Boltzmann Institute of Osteology at the Hanusch Hospital of WGKK and AUVA Trauma Centre Meidling, 4th Med. Dept., Hanusch Hospital, 1140 Vienna, Austria J. G. Hofstaetter, Department of Orthopaedic Surgery, Vienna General Hospital, Medical Univ. of Vienna, Austria |
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DIFFERENTIAL ACCUMULATION OF LEAD IN DOUBLE-TIDEMARKS IN ARTICULAR CARTILAGE OF OSTEOARTHRITIC HUMAN JOINTS F. Meirer, B. Pemmer, N. Zoeger, C. Streli*,, Atominstitut, Technische Universitaet Wien, Stationallee 2, 1020 Vienna, Austria F. Meirer, G. Pepponi, MiNALab, CMM-Irst, Fondazione Bruno Kessler, Via Sommarive 18, 38123 Trento Italy J. Goettlicher, R. Steininger, S. Mangold, Karlsruhe Institute of Technology, Institute for Synchrotron Radiation, Hermann-von-Helmholtz-Platz 1, D-76344 Eggenstein-Leopoldshafen, Germany A. Tampieri, S. Sprio, Istituto di Scienza e Tecnologia dei Materiali Ceramici CNR, Faenca, Italy J. G. Hofstaetter, P. Roschger, K. Klaushofer, Ludwig Boltzmann Institute of Osteology at the Hanusch Hospital of WGKK and AUVA Trauma Centre Meidling, 4th Med. Dept., Hanusch Hospital, 1140 Vienna, Austria J. G. Hofstaetter, Department of Orthopaedic Surgery, Vienna General Hospital, Medical Univ. of Vienna, Austria |
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TRACE ELEMENT DISTRIBUTION IN TRABECULAR AND CORTICAL BONE OF FRACTURED FEMORAL NECKS OF POSTMENOPAUSAL OSTEOPOROTIC WOMEN: A SYNCHROTRON MICRO X-RAY FLUORESCENCE IMAGING STUDY F. Meirer, B. Pemmer, N. Zoeger, C. Streli*,, Atominstitut, Technische Universitaet Wien, Stationallee 2, 1020 Vienna, Austria F. Meirer, G. Pepponi, MiNALab, CMM-Irst, Fondazione Bruno Kessler, Via Sommarive 18, 38123 Trento Italy J. Goettlicher, R. Steininger, S. Mangold, Karlsruhe Institute of Technology, Institute for Synchrotron Radiation, Hermann-von-Helmholtz-Platz 1, D-76344 Eggenstein-Leopoldshafen, Germany A. Tampieri, S. Sprio, Istituto di Scienza e Tecnologia dei Materiali Ceramici CNR, Faenca, Italy J. G. Hofstaetter, P. Roschger, K. Klaushofer, Ludwig Boltzmann Institute of Osteology at the Hanusch Hospital of WGKK and AUVA Trauma Centre Meidling, 4th Med. Dept., Hanusch Hospital, 1140 Vienna, Austria J. G. Hofstaetter, Department of Orthopaedic Surgery, Vienna General Hospital, Medical Univ. of Vienna, Austria |
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SPECIATION OF PB AT THE TIDEMARK OF ARTICULAR CARTILAGE AND IN TRABECULAR BONE F. Meirer, B. Pemmer, N. Zoeger, C. Streli*,, Atominstitut, Technische Universitaet Wien, Stationallee 2, 1020 Vienna, Austria F. Meirer, G. Pepponi, MiNALab, CMM-Irst, Fondazione Bruno Kessler, Via Sommarive 18, 38123 Trento Italy J. Goettlicher, R. Steininger, S. Mangold, Karlsruhe Institute of Technology, Institute for Synchrotron Radiation, Hermann-von-Helmholtz-Platz 1, D-76344 Eggenstein-Leopoldshafen, Germany A. Tampieri, S. Sprio, Istituto di Scienza e Tecnologia dei Materiali Ceramici CNR, Faenca, Italy J. G. Hofstaetter, P. Roschger, K. Klaushofer, Ludwig Boltzmann Institute of Osteology at the Hanusch Hospital of WGKK and AUVA Trauma Centre Meidling, 4th Med. Dept., Hanusch Hospital, 1140 Vienna, Austria J. G. Hofstaetter, Department of Orthopaedic Surgery, Vienna General Hospital, Medical Univ. of Vienna, Austria |
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EFFECT OF SYSTEMATIC ERRORS ON LATTICE PARAMETER REFINEMENT Aya Takase, Rigaku Americas Corp., The Woodlands, TX, USA |
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XRF PEAK DECONVOLUTION USING PEAK RATIOS REFINED BY FUNDAMENTAL PARAMETERS Shinichi Terada, X-Bridge Technologies Co., Ltd., Uji, Kyoto, Japan Hiroki Yamashita, X-tec. Co., Ltd., Osaka, Osaka, Japan Yoshie Araki, X-tec. Co., Ltd., Osaka, Osaka, Japan |
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SOFTWARE AND INSTRUMENTATION FOR RIETVELD ANALYSIS: WHAT'S NEW AND SOME PROGNOSTICATION B. H. Toby, APS, Argonne National Lab |
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Coupling X-ray Spectroscopy and Scanning Probe Microscopy for Simultaneous Sample Topography and Chemical mapping Didier Tonneau, CNRS-CINaM, Marseille, France Carole Fauquet, CNRS-CINaM, Marseille, France Franck Jandard, CNRS-CINaM, Marseille, France Maël Dehlinger, CNRS-CINaM, Marseille, France |
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DETECTORS FOR X-RAY IMAGING AT THE NEW FREE ELECTRON LASER SOURCES J.Treis*, PNDetector GmbH, Munich, Germany S.Aschauer, R.Hartmann, K.Hermenau, P.Lechner, G.Lutz, P.Majewski, C.Sandow, H.Soltau, C.Thamm, PNSensor GmbH, Munich, Germany L.Andricek, S.Herrmann, M.Porro, R.Richter, G.Schaller, F.Schopper, L.Strüder, G.de Vita, MPI Halbleiterlabor, Munich, Germany |
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3D-XRF ANALYSIS OF SEVERAL FORENSIC AND INDUSTRIAL SAMPLES K.Tsuji, C. Nishi, T. Nakazawa, K. Nakano, Osaka City University, Osaka, Japan K. Otsuki, Y. Nishiwaki, Forensic Science Laboratory, Hyogo, Japan H. Takenaka, NTT-AT, Atsugi, Japan |
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High Energy Photon (X-ray) use to Modern Radiotherapy Cancer Treatment. Md Tofiz Uddin, Medical Physicist, National Institute of Cancer Research and hospital, Mohakhali, Dhaka-1212, Bangladesh. |
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FLUXES WITH INTERNAL STANDARDS – THE FUTURE FOR HIGH PRECISION XRF ANALYSIS OF COPPER, IRON AND NICKEL MATERIALS S. Ulitzka, TWOTHETA XRF Services, Sydney, Australia D. Brown, XRF Scientific Ltd, Perth, Australia |
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COHERENT AND INCOHERENT X-RAY SCATTERING FROM PARTLY RELAXED SEMICONDUCTOR STRUCTURES POSSESSING DISLOCATIONS A. Ulyanenkov, T. Ulyanenkova, Rigaku Europe SE, Berlin, Germany A. Benediktovitch, A. Zhilik, I. Feranchuk, Belarusian State University, Minsk, Belarus K. Saito, Rigaku Corporation, Tokyo, Japan |
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ON-STREAM XRF FOR REAL-TIME MONITORING OF TRACE ELEMENTS AT SUB-PARTS-PER MILLION LEVELS Y. Van Haarlem*, G. Roach, J. Tickner, CSIRO, Lucas Heights, NSW, Australia |
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FROM SUB-MONOLAYER TO MONOLAYER TRANSITION OF SILVER NANOPARTICLE LANGMUIR FILM AT THE AIR-WATER INTERFACE – PILOT APPLICATION OF A NEW GISAXS LABORATORY SET-UP K. Vegso, P. Siffalovic, M. Weis, E. Majkova, M. Jergel, M. Benkovicova, S. Luby, Institute of Physics SAS, Bratislava, Slovakia J. Wiesmann, Incoatec GmbH, Geesthacht, Germany T. Kocsis, Polymer Institute SAS, Bratislava, Slovakia K. Nygard, O. Konovalov, European Synchrotron Radiation Facility (ESRF), Grenoble, France |
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INVESTIGATION OF PORCELAIN CARDS USING COMBINED SPECTROSCOPIC TECHNIQUES A. Deneckere, B. Vekemans*, L. de Vries, L. Van de Voorde, P. De Paepe, L. Vincze, L. Moens, P. Vandenabeele, Ghent University, Ghent, Belgium (Europe) |
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HIGH RESOLUTION ZONE-DOUBLED FRESNEL ZONE PLATES FOR THE MULTI-keV REGIME J. Vila-Comamala, Paul Scherrer Institut, Villigen, Switzerland and Argonne National Laboratory, Argonne IL A. Diaz, M. Guizar-Sicairos, V.A. Guzenko, P. Karvinen, C. David, Paul Scherrer Institut, Villigen, Switzerland R. Barrett, ESRF, Grenoble, France S. Gorelick, VTT Technical Research Centre of Finland, VTT, Finland C.M. Kewish, Synchrotron SOLEIL, Gif-sur-Yvette, France E. Färm, M. Ritala, University of Helsinki, Helsinki, Finland |
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APPLICATIONS OF FULL FIELD MICRO-XRF ANALYSIS USING A PROTOTYPE X-RAY COLOUR CAMERA L. Vincze (*), B. De Samber, K. De Schamphelaere, C. Janssen, Ghent University, Gent, Belgium O. Scharf, A. Bjeoumikhov, N. Langhoff, IfG-Institute for Scientific Instruments GmbH, Berlin, Germany R. Wedell, Institut für Angewandte Photonik e.V. (IAP), Berlin, Germany H. Riesemeier, M. Radtke, BAM Federal Institute for Materials Research and Testing, Berlin, Germany |
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RAMAN AND X-RAY DIFFRACTION STUDIES ON BAREH9: HIGH VOLUMETRIC CAPACITY HYDROGEN STORAGE MATERIAL Wilson K. Wanene and Dhanesh Chandra, Materials Science & Engineering Division, Department of Chemical & Metallurgical Engineering (MS 388), University of Nevada, Reno, Nevada 89557 Maddury Somayazulu, Stephen A. Gramsch, and Russell J. Hemley, Geophysical Laboratory, Carnegie Institution of Washington, 5251 Broad Branch Road NW, Washington, DC 20015 Raja S. Chellappa, Shock & Detonation Physics (WX-9), Los Alamos National Laboratory, Los Alamos, NM Selva Vennila Raju and Simon M. Clark, Advanced Light Source, Lawrence Berkeley National Laboratory, Berkeley, CA, USA |
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BACKGROUND AND BOUNDARY CORRECTIONS IN MICRO-XRD PHASE SCANNING C. Kong, Analytical Centre, UNSW, Sydney, Australia Q. X. Liu, ALS Mineral, Vancouver Branch, Canada |
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GUNSHOT RESIDUE INVESTIGATIONS WITH TXRF A. Wastl, P. Kregsamer, P.Wobrauschek, C.Streli, Atominstitut, TU Wien, Vienna, Austria B. Bogner, Kriminalpolizeilichen Untersuchungsstelle, Vienna, Austria |
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DECOMPOSING SAMPLES INTO THEIR PARTS WITH MULTIVARIATE STATISTICS G. Wellenreuther*, DESY, Hamburg, Germany G. Silversmit, Ghent University, Gent, Belgium |
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Fourier X-Ray Scattering Imaging and Biological Applications Han Wen*, Vinay Pai, Susanna K. Lynch, Camille K. Kemble, Eric Bennett, National Heart, Lung and Blood Institute, National Institutes of Health, Bethesda, MD, US Wah Keat Lee, Xianghui Xiao, Lahsen Assoufid, Chian Liu, Advanced Photon Source, Argonne National Laboratory, Argonne, IL, US |
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MINIMIZING THE EFFECTS OF PREFERRED ORIENTATION IN X-RAY POWDER DIFFRACTION G.R. Williams, F. Kang, GlaxoSmithKline, King of Prussia, PA B. Litteer, R. Kerstens, PANalytical, Inc., Westborough, MA J. Smith, PANalytical, Inc., Richboro, PA |
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THE STUDY OF MICRONIZATION INDUCED DISORDER AND ENVIRONMENTAL ANNEALING OF AN ACTIVE PHARMACEUTICAL INGREDIENT (API) BY XRPD LINE BROADENING ANALYSES G.R. Williams, J. Brum, GlaxoSmithKline, King of Prussia, PA |
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What Else are you Drinking when you Drink Whiskey or Wine? Peter Wobrauschek, TU WIEN, ATOMINSTITUT, VIENNA, AUSTRIA |
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ANALYSIS OF MINOR AND TRACE ELEMENTS IN PLUTONIUM USING POLARIZED ENERGY DISPERSIVE X-RAY FLUORESCENCE Christopher G. Worley, Los Alamos National Laboratory |
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APPLICATION OF XRF TO MONITORING HEAVY METALS IN SOILS AND SEDIMENTS Shangjun Zhuo*, Ang Ji, Shanghai Institute of Ceramics, Chinese Academy of Sciences, Shanghai 200050, China |
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Coherent Diffractive Imaging of Individual Nanostructures Jian Min Zuo, University of Illinois, Urbana, IL, USA Jiong Zhang, University of Illinois, Urbana, IL, USA Ke Ran, University of Illinois, Urbana, IL, USA |
For more information, please contact Denise Flaherty