2012 Call for Papers
2012 Program
The 61st Annual Conference on Applications of X-ray Analysis - The Denver X-ray Conference will be held 6-10 August 2012, at the Denver Marriott Tech Center Hotel, Denver, CO. The 2012 Program is now available! Please check back often for changes made to the program.
Plenary session: “New Frontiers in X-ray Analysis - Dedicated to the life and work of Robert L. Snyder”
2011 Information
Thank you for another successful Denver X-ray Conference! Check out the slide show of photos from our time in Colorado Springs, CO.
Read the Summary of Events
View the Abstracts
Search the Abstracts
Have an idea for a workshop or session?
If there is a topic missing from the DXC Program that would make for a great workshop or session, please let the DXC Organizing Committee know. Submit your ideas for consideration for the 2013 Conference Program.
Providing a unique mixture of sessions on training, education, and applications and papers containing details about state-of-the-art techniques and future developments in X-ray analysis.
Dates to Remember
Opening of the “Call for Papers” |
January 2012 |
Opening of Exhibit Space |
1 February 2012 |
Deadline for submission of abstracts |
1 March 2012 |
Conference Program available on-line |
May 2012 |
Deadline for Pre-registration discount fee |
2 July 2012 |
Deadline to submit for Cohen Student Award |
2 July 2012 |
Deadline to apply for a Student Room |
2 July 2012 |
Deadline to book host hotel room at conference rate |
20 July 2012 |
| Deadline to buy tickets for A Taste of Colorado Tour | 25 July 2012 |
Deadline for submission of manuscripts |
4 September 2012 |
All are invited on Thursday, 9 August, for a night of sampling Colorado’s finest microbrews and spirits. Visit Stranahan’s Colorado Whiskey Distillery and the Rackhouse Pub for a tour, tasting and more! Tickets cost $60.00 per person and include round-trip transportation via motor coach, a tour of the distillery, a microbrew tasting and whiskey sampling, and a pub-style pizza dinner. Sign-up by 25 July; tickets cannot be purchased at the conference or at the event.
Denver X-ray Conference Organizing Committee
W. Tim Elam, Chair
Univ. of Washington, APL, Seattle, WA
wtelam@apl.washington.edu
John Anzelmo
Anzelmo & Associates, Inc., Madison, WI
jaanzelmo@aol.com
Thomas Blanton
Eastman Kodak Co. Research Labs, Rochester, NY
thomas.blanton@kodak.com
Lora L. Brehm
Dow Chemical Company, Midland, MI
llbrehm@dow.com
Tim Fawcett
ICDD, Newtown Square, PA
fawcett@icdd.com
Denise Flaherty
ICDD, Newtown Square, PA
flaherty@icdd.com
George Havrilla
Los Alamos National Laboratory, Los Alamos, NM
havrilla@lanl.gov
James A. Kaduk
Poly Crystallography Inc., Naperville, IL
kaduk@polycrystallography.com
Terry Maguire
ICDD, Newtown Square, PA
maguire@icdd.com
Scott Misture
NYS College of Ceramics at Alfred University, Alfred, NY
misture@alfred.edu
Conal Murray
IBM T.J. Watson Research Center, Yorktown Heights, NY
conal@us.ibm.com
Cev Noyan
Columbia University, New York, NY
icn2@columbia.edu
Brian Toby
Argonne National Laboratory, Advanced Photon Source, Argonne, IL
brian.toby@anl.gov
Rene van Grieken
University of Antwerp, Antwerp, Belgium
rene.vangrieken@ua.ac.be
Mary Ann Zaitz
IBM, Hopewell Junction, NY
zaitz@us.ibm.com
