Providing a unique mixture of sessions on training, education, and applications and papers containing details about state-of-the-art techniques and future developments in X-ray analysis.
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Submissions for
AM WORKSHOPS 9:00 AM–12:00 PM || PM WORKSHOPS 1:30 PM–4:30 PM
MONDAY AM - XRD - 5 AUGUST 2013
INTRODUCTION TO THE NEW GSAS-II CRYSTALLOGRAPHIC ANALYSIS SYSTEM - FULL DAY || Standley Ballroom II
Organizers & Instructors:
B. Toby, R. Von Dreele, Argonne National Laboratory, Argonne, IL, USA, brian.toby@anl.gov, vondreele@anl.gov
The workshop will introduce the attendees to the use of the new GSAS-II software package for the reduction, solution and refinement with all types of X-ray and neutron crystallographic data. The workshop will emphasize work with powder diffraction data. All software needed to install and run the software is freely available. Attendees will be expected to bring their own laptops with the software already downloaded. The workshop will be targeted towards individuals with some experience with Rietveld analysis and to experienced single-crystal crystallographers with some knowledge of powder diffraction. Areas to be covered include use of GSAS-II for: area detector data integration, indexing patterns, structure solution by charge-flipping, and Rietveld refinement with constraints and restraints.
BASIC TO INTERMEDIATE XRD ANALYSIS || Meadowbrook
Organizers & Instructors:
Thomas N. Blanton, Eastman Kodak Company, Rochester, NY, USA, thomas.blanton@kodak.com
Scott T. Misture, New York State College of Ceramics at Alfred University, Alfred, NY, USA, misture@alfred.edu
Thomas R. Watkins, Oak Ridge National Laboratory, Oak Ridge, TN, USA
Mark A. Rodriguez, Sandia National Laboratory, Albuquerque, NM, USA
The use of XRD in routine qualitative and non-Rietveld quantitative analysis will be presented. The use of XRD in phase identification
will be covered, including introductory remarks on sample preparation and a discussion of common XRD geometries. Next, we will
cover profile fitting and lattice parameter refinement for determination of the composition of solid solutions via Vegard's law. Finally,
we will cover the use of the reference intensity ratio method for semi-quantitative analysis and full quantification using the internal
standard method.
MONDAY AM - XRF
BASIC XRF || Standley Ballroom I
Organizer & Instructors:
W.T. Elam, University of Washington, Seattle, WA, USA, wtelam@apl.washington.edu
G.J. Havrilla, Los Alamos National Laboratory, Los Alamos, NM, USA
A.R. Drews, Ford Motor Company, Dearborn, MI, USA
This workshop provides a basic introduction to the principles of XRF, and is specifically aimed at those new to the field. It will start with a general overview of the technique, followed by more specific details of the basic principles. The emphasis will be on understanding how to use XRF and what its capabilities are. In the second half of the workshop, a few selected applications will be presented. The focus of this segment will be to provide an understanding of how the basic principles affect actual practice.
TRACE ANALYSIS || Cotton Creek
Organizers & Instructors:
C. Streli, TU Wien, Atominstitut, Wien, Austria, streli@ati.ac.at
P. Wobrauschek, TU Wien, Atominstitut, Wien, Austria, wobi@ati.ac.at
K.Tsuji, Osaka City University, Osaka, Japan
A. Martin, Thermo Fisher Scientific, Sugarland, TX, USA
Both beginners and experienced X-ray physicists will gain information by attending the Trace Analysis workshop. Presentations of most modern techniques and instrumentation for trace element analysis using WDXRF, EDXRS, and more will be given. Physical methods to improve minimum detection limits in XRF by background reduction will be discussed; examples of synchrotron radiation as an excitation source, as well as standard WDXRF laboratory instrumentation. Introduction to total reflection XRF (TXRF) and actual instrumentation will show achievable advantages and results in terms of detection limits, sensitivities and detectable elemental range down to light elements (e.g., Carbon). Confocal μ-XRF will be presented as a method for 2D and 3D spatial resolved elemental imaging. Applications from interesting scientific fields as environment, microelectronics, forensic, and life science will show the successful use and the importance of the various XRF spectrometric techniques. Trace analysis techniques by WDXRF - methods and pitfalls: background selection, crystal and collimator options, sample types, and more will be discussed.
MONDAY PM - XRD & XRF
X-RAY OPTICS || Cotton Creek
Organizers & Instructors:
U. Fittschen, Universität Hamburg, Hamburg, Germany, ursula.fittschen@chemie.uni-hamburg.de
G.J. Havrilla, Los Alamos National Laboratory, Los Alamos, NM, USA, havrilla@lanl.gov
G. Wellenreuther, HASYLAB at DESY, Hamburg, Germany
M. Kraemer, AXO Dresden GmbH, Dresden, Germany
This workshop will focus on the different state-of-the-art focusing X-ray optics. Capillary optics, DCC-Optics, Fresnel Zone Plates,
KB-mirrors and compound refractive lenses will be covered. Their capability and performance will be illustrated with examples from
latest research results from laboratory-based instrumentation and synchrotron facilities. The workshop level will be appropriate for
beginners and advanced beginners addressing also the underlying physical principles like refraction, diffraction and total reflection.
MONDAY PM - XRD
INTRODUCTION TO THE NEW GSAS-II CRYSTALLOGRAPHIC ANALYSIS SYSTEM—CONTINUED
Organizers & Instructors: || Standley Ballroom II
B. Toby, R. Von Dreele, Argonne National Laboratory, Argonne, IL, USA, brian.toby@anl.gov, vondreele@anl.gov
TOTAL PATTERN ANALYSIS || Meadowbrook
Organizers & Instructors:
T. Fawcett, International Centre for Diffraction Data, Newtown Square, PA, USA, fawcett@icdd.com
J.A. Kaduk, Poly Crystallography, Inc., Naperville, IL, USA, kaduk@polycrystallography.com
Total pattern analysis (TPA) is fundamentally a concept whereby all possible available information can be derived from a powder diffraction pattern. This would include the identification of all materials present in the specimen, information about the crystalline state of each material, the crystallite size, stress, strain, particle size, shape, etc. Several different approaches have been used to perform TPA analyses. One approach is to mathematically deconvolute the pattern and analyze each contributing component by using fundamental parameters and diffraction physics. This approach has been commonly used for highly crystalline materials. TPA can also be performed empirically by using simulations of digitized experimental components and this approach is frequently used for non-crystalline materials, mixtures having a noncrystalline component, or in cases where the fundamental parameters are not known. Several recent methods give the user a choice of several approaches that can be mixed depending upon the nature of the specimen being analyzed and information being sought. In this workshop we will review various methods for performing TPA analyses and discuss the fundamental strengths and weaknesses of various approaches.
MONDAY PM - XRF
ENERGY DISPERSIVE XRF || Standley Ballroom I
Organizer & Instructors:
R. Phillips, Thermo Scientific, West Palm Beach, FL, USA, rich.phillips@thermofisher.com
R. Cone, Consultant, Orlando, FL, USA
A. McWilliams, RTI International, Research Triangle Park, NC, USA
This workshop is designed to provide a discussion of the theoretical and practical aspects of EDXRF spectrometry providing a
comprehensive review of the basic fundamentals for both the beginner and experienced X-ray spectroscopist. Topics to be covered
include instrumentation, components, and applicability of EDXRF; ease of use; rapid qualitative analysis and material screening; calibration
techniques for quantitative analysis; standard-less analysis; sensitivity of EDXRF for a wide variety of elements in various matrices; and
sample preparation. A variety of applications will be presented as real-life examples where EDXRF is being used to solve complex
analytical problems. The major emphases will be applicability of EDXRF and the optimal protocol for generating and reporting of reliable
experimental results.
TUESDAY AM - XRD & XRF - 6 AUGUST 2013
FUNDAMENTALS OF DIGITAL SIGNAL PROCESSING AND X-RAY DETECTORS || Standley Ballroom I
Organizer & Instructors:
S. Hayakawa, Hiroshima University, Hiroshima, Japan, hayakawa@hiroshima-u.ac.jp
J. Kawai, K. Ohira, Kyoto University, Kyoto, Japan
S. Terada, X-Bridge Technologies, Kyoto, Japan
T. Papp, Cambridge Scientific, Ontario, Canada
This workshop will introduce various X-ray detectors (Si, Ge, and CdTe SSD, SDD, Si-PIN, proportional counter) and explain what is
done in the digital signal processors of X-ray spectrometers is explained. The workshop covers (1) basics of DSP (digital signal processor)
and digital oscilloscope, (2) deadtime correction, (3) peak stability and calibration, (4) linear and nonlinear response, (5) low-energy tail,
(6) trade-offs among energy resolution, throughput and effective area, (7) escape peaks, sum peaks, and pile-up signals, (8) Fano factor,
(9) how to determine the best set of parameters, and (10) near room temperature operation.
TUESDAY AM - XRD
HANDS-ON RIETVELD ANALYSIS || Cotton Creek
Organizer & Instructors:
E.A. Payzant, Oak Ridge National Laboratory, Oak Ridge, TN, USA, payzanta@ornl.gov
P. Zavalij, University of Maryland, College Park, MD, USA
Objective:Attendees will have the opportunity to refine experimental X-ray and neutron data sets. The instructors will present a series of worked examples to illustrate important issues in Rietveld refinement.
Topics to be addressed will include:
• Recommended refinement strategies
• Structure models and instrumental parameters
• How to refine: lattice parameters, site occupancy factors, thermal parameters, preferred orientation
• How to properly consider instrumental parameters
• Accuracy and precision
• Refinement indices and what they mean
• How to use the program to model a hypothetical pattern
• Quantitative analysis and amorphous content
• What to do for an incomplete structure model
Attendees are encouraged to bring laptop computers with Rietveld software installed. Data files will be provided. In the workshop,
these data files will be refined using the free program GSAS with the EXPGUI, but other popular programs (FullProf, Topas, Jade, High-Score, MAUD, Rietan, etc.) will be discussed during the workshop.
Software: GSAS with EXPGUI is available from: <https://subversion.xor.aps.anl.gov/trac/EXPGUI>
Reference (optional): Fundamentals of Powder Diffraction and Structural Characterization of Materials, VK Pecharsky and PY Zavalij, Springer
MODELING & ANALYSIS OF SMALL-ANGLE SCATTERING—FULL DAY // Meadowbrook
Organizer & Instructor:
B. Landes, Dow Chemical Company, Midland, MI, USA, bglandes@dow.com
J. Ilavsky, Argonne National Laboratory, Argonne, IL, USA, ilavsky@aps.anl.gov
Successful small-angle X-ray and neutron scattering (SAXS & SANS) experiments require appropriate data analysis tools. Various tools were developed over the years, for example ATSAS, mostly applicable for biological systems and NIST Analysis package for Igor Pro. For complex problems in materials science, physics, and chemistry, Igor Pro based package Irena was developed during the last 12 years at the APS. It is being widely used for support of SAXS and USAXS beamlines at the APS and number of other facilities worldwide. Six courses on how to use this package were made available to the SAXS/SANS community just during the last 12 months in the US, Australia, and Brazil. The course will be taught by the software author, Jan Ilavsky, APS staff member. The course will walk users through the use of the selected tools in this package from data import, manipulation & graphing, to different methods of analysis and export of the results. Theories behind the tools and their correct applicability to various problems will be discussed. Participants are expected to bring their computers (Windows or Mac OS). A demo version of Igor 6 will be provided to users (if needed) as well as CD with copy of the latest SAXS software version and other materials. In addition, participants are encouraged to bring their own SAXS experimental results for discussions if time is available.
About the software: Irena is a package of tools for analysis of small-angle scattering (SAXS, SANS, USAXS, USANS) data. For more details on this software package please visit: http://usaxs.xray.aps.anl.gov/staff/ilavsky/irena.html
TUESDAY AM - XRF
QUANTITATIVE ANALYSIS—FULL DAY || Standley Ballroom II
Organizer & Instructors:
M. Mantler, Rigaku Corporation, Japan, michael.mantler@rigaku.com
W.T. Elam, University of Washington, Seattle, WA, USA
B. Vrebos, PANalytical B.V, Almelo, The Netherlands
Morning: Basic methods and resources
1. Classical fundamental parameters and mathematical models.
2. Empirical and theoretical influence coefficients.
3. Fundamental parameter collections and tube spectra: Sources, availability, and reliability.
4. A free Excel-tool for comparison of fundamental parameter data and simple computations.
Afternoon: Advanced methods.
1. Compensation methods (standard addition, internal standard, heavy absorber, Compton scattering).
2. Layered materials, inhomogeneous samples, and rough surfaces.
3. Light elements. Heavy elements in a light matrix. Trace element analysis. Analysis using L- and M-lines (including Coster Kronig
contributions, cascade effects).
4. Interpretation of spectra: Obtaining net intensities; artifacts.
TUESDAY PM - XRD
INTRODUCTION TO VOLUME H || Cotton Creek
Organizer & Instructor:
J.A. Kaduk, Illinois Institute of Technology, Naperville, IL, USA, jkaduk@iit.edu
A new volume of the International Tables for Crystallography, Volume H on powder diffraction is being prepared. This volume will
include chapters on fundamental topics in powder diffraction, including specimen preparation, data processing, structure solution and
refinement, and structure validation, as well as topical chapters on many different applications of powder diffraction. Volume H will be
the first International Tables volume for which the on-line version should be considered the primary, and the print volume the secondary
publication. The editors anticipate that the topical chapters will include raw data and instructions for processing, to help make Volume
H the ultimate powder diffraction textbook. This workshop will detail the organization and content of the Volume, and provide a "sneak
peek" at selected chapters.
MODELING & ANALYSIS OF SMALL-ANGLE SCATTERING - CONTINUED || Meadowbrook
Organizer & Instructors:
B. Landes, Dow Chemical Company, Midland, MI, USA, bglandes@dow.com
J. Ilavsky, Argonne National Laboratory, Argonne, IL, USA, ilavsky@aps.anl.gov
TUESDAY PM - XRF
SAMPLE PREPARATION OF XRF || Standley Ballroom I
Organizer & Instructors:
J.A. Anzelmo, Anzelmo & Associates, Inc., Madison, WI, USA, jaanzelmo@aol.com
J. Libal, Cliffs Natural Resources, Silver Bay, MN, USA
M. Bouchard, Corporation Scientifique Claisse, Quebec City, Quebec, Canada
This workshop will discuss fundamental physics and basic laboratory operations involved in the specimen preparation for XRF of pressed powders and fusion beads, with a special session devoted to the preparation of iron ore, concentrates and pellets.
QUANTITATIVE ANALYSIS - CONTINUED || Standley Ballroom II
Organizer & Instructors:
M. Mantler, Rigaku Corporation, Japan, michael.mantler@rigaku.com
W.T. Elam, University of Washington, Seattle, WA, USA
B. Vrebos, PANalytical B.V, Almelo, The Netherlands
XRD POSTER SESSION - MONDAY, 5 AUGUST
The Monday evening XRD Poster Session will be held 5:30 – 7:30 pm in the Westminster Foyer, outside the exhibit
hall (Westminster Ballroom). It will be held in conjunction with a Wine & Cheese Reception sponsored by ICDD.
Chair: T.R. Watkins, Oak Ridge National Laboratory, Oak Ridge, TN, USA
D-5 |
KINETIC STUDY OF NANOSTRUCTURED CR80CO20 ALLOY BY THE RIETVELD REFINEMENT |
D-12 |
USAGE OF THE X-RAY TOPOGRAPHY UNIT FOR PRODUCING HIGH-QUALITY CONCAVE OPTICS |
D-14 |
BALL-MILLING EFFECT ON SIZE AND STRAIN OF PT-ZRO2 POWDER |
D-16 |
AN IN-SITU XRD AND H2-D2 EXCHANGE STUDY ON NI-BASED AMORPHOUS AND CRYSTALLINE
MEMBRANES |
D-17 |
THE SALTS OF 1,2-DIAMINOCYCLOHEXANE AND H2PTCL6 AND ITS CRYSTAL STRUCTURES
FROM X-RAY POWDER DIFFRACTION DATA |
D-21 |
OPTICAL ELEMENTS FOR ANALYTICAL X-RAY APPLICATIONS |
D-24 |
IMPROVEMENT OF SURFACE AND INTERFACE ROUGHNESS ESTIMATION ON X-RAY
REFLECTIVITY ANALYSIS |
D-27 |
COMBINING REFLECTION / TRANSMISSION MEASUREMENTS TO ELIMINATE PREFERRED ORIENTATION |
D-33 |
IN-PLANE SIN2Ψ TECHNIQUE FOR LABORATORY HIGH-TEMPERATURE
CHARACTERIZATION OF RESIDUAL STRESSES |
D-44 |
PRACTICAL METHODS IN THIN FILM ANALYSIS BY X-RAY REFLECTIVITY |
D-50 |
SYNTHESIS AND CRYSTAL STRUCTURAL STUDY OF INDIUM-SCANDIUM-TITANIUM OXIDE: A NEW
TRANSPARENT QUATERNARY COMPOUND |
D-52 |
X-RAY DIFFRACTION EXPERIMENTS FOR UPPER-LEVEL UNDERGRADUATE LABORATORIES |
D-53 |
X-RAY DIFFRACTION STUDY FOR THE COMPARISON OF STANDARD AND SYNTHESIZED CALIBRATION
MATERIALS FOR HUMAN BONE |
D-56 |
NEW FORMS OF THIOCOLCHICOSIDE, AN ANTI-INFLAMATORY AND ANALGESIC MUSCLE RELAXANT |
D-59 |
THE BIG PICTURE OF THE VERY SMALL - A GALLERY OF SAXS MEASUREMENTS ON
NANO-MATERIALS |
D-61 |
APPLICABILITY OF TRADITIONAL DATA ANALYSIS METHODS TO DIFFRACTION PROFILES FROM
NANOMATERIALS |
D-63 |
IN-SITU X-RAY AND NEUTRON CHARACTERIZATION OF SPINEL-SUPPORTED NANOPARTICULATE |
D-64 |
CHARACTERIZATION OF RECRYSTALLIZATION KINETICS USING COMPLEMENTARY TECHNIQUES |
D-68 |
NEW DOUBLE AND TRIPLE ALKALI METAL - CHALCOGENIDE LAYERED PEROVSKITES |
D-69 |
WITHDRAWN - X-RAY OPTICS AND PRECISION REQUIREMENTS FOR RESIDUAL STRESS ANALYSES WITH
HIGH SPATIAL RESOLUTION |
D-70 |
ICDD AND ASM DATABASE SURVEY OF THE THERMOELECTRIC HALF-HEUSLER MATERIAL SYSTEMS |
D-76 |
STRUCTURAL AND THEORETICAL STUDIES OF [(MX)1+Y]M[TX2]N THIN FILM FERECRYSTALS |
D-78 |
CRYSTAL STRUCTURE AND PHOTOCATALYTIC STUDIES OF 2, 3, 4, AND 5-LAYER AURIVILLIUS OXIDES |
D-80 |
CANDI-X, SWEET PROGRESS WITH A FULL PATTERN SEARCH APPROACH |
D-82 |
COMBINED X-RAY AND NEUTRON DIFFRACTION STUDY OF Mo5Re2Si SIGMA PHASE |
D-83 |
INVESTIGATION OF SYNTHESIS PARAMETERS ON GROWTH OF SEMICONDUCTING NANOPARTICLES |
D-84 |
DIFFRACTED BEAM COLLIMATORS - EXTENDING THE RANGE OF APPLICATIONS FOR 2D DETECTORS |
D-86 |
X-RAY DIFFRACTION IDENTIFICATION OF FATTY ACIDS AND THEIR MIXTURES IN HOMOLOGOUS SERIES CnH2nO2 (n = 11–24) |
D-87 |
X-RAY MICROBEAM DIFFRACTION STUDY OF ELECTOCHMICALLY AND CHEMICALLY DELITHIATED LixCoO2 SINGLE CRYSTALS |
D-88 |
STRUCTURAL AND THERMAL EQUILIBRIUM STUDIES OF PENTAGLYCERINE AND TRIS(HYDROXYMETHYL)AMINOMETHANE BINARY SYSTEM |
D-89 |
STUDY OF HIGH TEMPERATURE PHASE OF TITANATE NANOTUBES |
D-90 |
STRUCTURAL CHARACTERIZATION OF NEW TERNARY YTTRIUM-RARE EARCH SESQUIOXIDES FORMED BY THE SOL-GEL TECHNIQUE |
D-91 |
ANALYTICAL CALCULATION OF THE RADIUS OF GYRATION OF POLYHEDRA AND PLATONIC SOLIDS IN SMALL-ANGLE SCATTERING |
XRF POSTER SESSION - TUESDAY, 6 AUGUST
The Tuesday evening XRF Poster Session will be held 5:30 – 7:30 pm in the Westminster Foyer, outside the exhibit
hall (Westminster Ballroom). It will be held in conjunction with a Wine & Cheese Reception sponsored by Chemplex Industries, Inc.
Chairs: R. Van Grieken, University of Antwerp, Antwerp, Belgium
M.A. Zaitz, IBM, Hopewell Junction, NY, USA
C-4 |
KETEK SILICON DRIFT DETECTORS WITH ASIC AND READOUT ELECTRONICS |
C-6 |
FACTORS INFLUENCING CHARACTERISTICS OF POWDER SAMPLE PREPARED FOR X-RAY EMISSION
SPECTROMTERY |
F-5 |
TRACE METAL POLLUTION ASSESSMENT AND DISTRIBUTION IN SOILS USING ED-XRF
SPECTROMETRY |
F-9 |
CHARACTERIZING FUNDAMENTAL PARAMETERS BASED ANALYSIS FOR SOIL-CERAMIC MATRICES
IN POLARIZED ENERGY DISPERSIVE X-RAY FLUORESCENCE SPECTROMETRY (PEDXRF) |
F-10 |
EXAMINING ELEMENTAL DISTRIBUTIONS IN THREE DIMENSIONS USING TWO-DIMENSIONAL
MICRO-XRF IMAGING |
F-18 |
ABSORPTION OF THE PRIMARY BEAM IN SR-TXRF ANALYSIS: EXPERIMENTAL VISUALIZATION USING
A COLOR X-RAY CAMERA |
F-23 |
LONG TERM INTER-INSTRUMENTAL EDXRF COMPARISON ON THE MEASUREMENTS OF
PM2.5 SAMPLES COLLECTED IN IMPROVE (INTERAGENCY MONITORING OF PROTECTED VISUAL
ENVIRONMENTS) AT CROCKER NUCLEAR LABORATORY, UC DAVIS |
F-25 |
SIGNAL PROCESSORS PARAMETER SETTING EFFECT ON THE SOLID STATE DETECTOR TAILING |
F-27 |
THE IDEAL SPECIMEN FOR TOTAL REFLECTION X-RAY FLUORESCENCE (TXRF) ANALYSIS:
RESULTS FROM SIMULATIONS AND EXPERIMENTAL EVALUATION |
F-28 |
DETERMINATION OF IODINE IN DIETARY SUPPLEMENTS USING TOTAL REFLECTION
X-RAY FLUORESCENCE |
F-30 |
INVESTIGATION ON THE NI OXIDATION STATE IN LINI0.5MN1.5O4 LI-ION BATTERY CATHODES AT
DIFFERENT CYCLE STATES: PRISTINE, DISCHARGED, AFTER QUICK CHARGING AND SLOW CHARGING |
F-31 |
MTCA.4 PLATFORM BASED DIGITAL PULSE PROCESSOR FOR DEMANDING
SPECTROSCOPY EXPERIMENTS |
F-36 |
MEASUREMENT OF PM10 LOADED FILTERS USING STANDARDLESS EDXRF ANALYSIS AND LINEAR
CALIBRATION: AN INTER-LABORATORY COMPARISON |
F-45 |
DISTRIBUTION OF S, CA, FE AND ZN IN HUMAN OSTEOSARCOMA TISSUE DETERMINED WITH
SYNCHROTRON AND LABORATORY M-XRF ANALYSIS |
F-46 |
CHARACTERIZATION OF THIN FILMS ON SI WAFERS BY GIXRF IN COMBINATION WITH XRR |
F-48 |
A SIMULATION MODEL FOR CONFOCAL MICRO-XRF OF LAYER STRUCTURES |
F-49 |
PREPARATION OF REFERENCE MATERIALS OF LEAD (PB) AND SILICON (SI) FOR XRF ANALYSIS
OF AMBIENT PARTICULATE MATTER |
F-52 |
MOXTEK MXDPP-50: FUNCTIONALITY AND PERFORMANCE CHARACTERIZATIONS |
F-54 |
X-RAY FLUORESCENCE INSTRUMENTATIONS FOR RAPID DETECTION AND DISCRIMINATION OF
FORENSIC FRAGMENTS AT SPRING-8 BL05SS |
F-55 |
NEW INVESTIGATIONS WITH NANOGRAM MULTI-ELEMENT REFERENCE SAMPLES FOR
XRF AND TXRF ANALYSIS |
F-56 |
FORENSIC INVESTIGATIONS WITH DIFFERENT CONFOCAL MICRO-XRF SPECTROMETERS |
F-57 |
HIRX PERFORMANCE IN THE CHARACTERIZATION OF PLUTONIUM |
F-65 |
FAST ELEMENTAL IMAGING BY WAVELENGTH DISPERSIVE X-RAY FLUORESCENCE
IMAGING SPECTROMETER |
F-66 |
UNDER FILM CORROSION PROCESS OF STEEL SHEETS OBSERVED BY CONFOCAL
MICRO XRF TECHNIQUE |
2013 ORAL SESSION WEDNESDAY AM - 7 AUGUST 2013PLENARY SESSION: THE 100TH ANNIVERSARY OF X-RAY SPECTROSCOPY || Standley Ballroom
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9:00 |
CHAIRMAN OF THE DENVER X-RAY CONFERENCE OPENING REMARKS |
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PRESENTATION OF AWARDS: 2013 BARRETT AWARD PRESENTATION 2013 JENKINS AWARD PRESENTED TO RENE VAN GRIEKEN, University of Antwerp, Antwerp, Belgium 2013 JEROME B. COHEN STUDENT AWARD 2013 HANAWALT AWARD PRESENTED TO ROBERT B. VON DREELE, Argonne National Laboratory, Lemont, IL, USA PLENARY SESSION REMARKS BY THE CHAIR |
9:30 |
INVITED TALK: F-68 - WDX: FROM ROENTGEN TO MOSELEY TO BRAGG TO SHERMAN TO JENKINS |
10:15 |
BREAK |
10:45 |
INVITED TALK: F-72 - THE ELECTRONIC AGE - EDX AND OTHER MODERN TECHNIQUES TO THE
PRESENT AND BEYOND |
11:30 |
INVITED TALK: D-74 - HANAWALT AWARD LECTURE: PROTEIN POLYCRYSTALLOGRAPHY |
WEDNESDAY PM - XRD & XRF SESSIONSNEW DEVELOPMENTS IN XRD & XRF INSTRUMENTATION || Standley Ballroom I
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1:15 |
C-9 - REAL-TIME MONITORING OF PROCESS STREAM MINERALOGY AND ELEMENTAL COMPOSITION
WITH THE XRDF SYSTEM |
1:30 |
C-12 - REAL-TIME DUAL QUANTITATIVE ELEMENTAL AND MINERALOGICAL ANALYSIS OF
GAS BEARING SHALE |
1:45 |
F-38 - NEW DESKTOP TYPE XRF FOR ON-SITE ELEMENTAL ANALYSIS |
2:00 |
F-12 - TRACE ELEMENT ANALYSIS IN GEOLOGICAL, COAL, AND COKE SAMPLES USING EDXRF |
2:15 |
C-3 - 150 MM2 SILICON DRIFT DETECTOR MODULES |
2:30 |
C-14 - THE NEXT GENERATION: HIGHSCORE PLUSV4.0 |
2:45 |
BREAK |
3:15 |
D-58 - THE INSIDE VIEW ON NANO-MATERIALS WITH THE XEUSS SAXS-WAXS SYSTEM |
3:30 |
D-30 - THE N8 HORIZON FOR DEDICATED SAXS, WAXS, AND GISAXS |
3:45 |
C-11 - MOXTEK'S NEW 60 KV, 12W X-RAY SOURCE: PERFORMANCE CHARACTERIZATIONS |
4:00 |
D-20 - THE VERSATILITY OF THE INCOATEC MICROFOCUS SOURCE |
4:15 |
D-10 - LOW COST ROLLED X-RAY PRISM LENSES TO INCREASE PHOTON FLUX DENSITY IN
DIFFRACTOMETRY EXPERIMENTS |
4:30 |
D-18 - A NOVEL X-RAY DETECTOR FOR IN-HOUSE XRD |
4:45 |
D-79 - SCATTERX78 - A HIGH-PERFORMANCE SAXS/WAXS MODULE INTEGRATED ON A
MULTI-PURPOSE X-RAY DIFFRACTOMETER PLATFORM |
WEDNESDAY PM - XRD SESSIONSHIGH ENERGY XRD || Cotton Creek
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1:30 |
D-75 - INVITED - HIGH ENERGY X-RAY DIFFRACTION MICROSCOPY: DIRECT OBSERVATION OF 3D
MATERIALS RESPONSE |
2:00 |
D-49 - INVITED - A NEW HIGH ENERGY X-RAY STATION AT THE CORNELL HIGH ENERGY
SYNCHROTRON SOURCE |
2:30 |
D-46 - IN SITU CHARACTERIZATION OF GRADE 92 STEEL DURING TENSILE DEFORMATION USING
HIGH ENERGY X-RAY DIFFRACTION AND SMALL ANGLE X-RAY SCATTERING |
2:50 |
D-48 - UNDERSTANDING CYCLIC PLASTICITY AND FATIGUE USING HIGH ENERGY X-RAY
DIFFRACTION AND CRYSTAL-BASED FINITE ELEMENT MODELS |
3:10 |
BREAK |
3:30 |
D-77 - INVITED - A COMBINED APPROACH TO MAPPING ORIENTATIONS, STRAINS, AND
VOIDS/CRACKS/INCLUSIONS DURING LOADING USING HIGH ENERGY X-RAYS |
4:00 |
D-67 - DECOMPOSITION OF THE ALPHA"/BETA DUPLEX-PHASE MICROSTRUCTURE DURING
CONTINUOUS HEATING OF A NEAR-BETATITANIUM ALLOY |
4:20 |
D-47 - UNDERSTANDING SLIP PROCESSES IN SILICON USING HIGH ENERGY X-RAYS |
WEDNESDAY PM - XRF SESSIONSQUANTITATIVE ANALYSIS || Standley Ballroom II
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1:30 |
F-7 - INVITED - QUANTITATIVE ANALYSIS OF AMBIENT AND SOURCE AIR FILTERS |
2:00 |
F-17 - INVITED - STUDIES USING TXRF FOR ANALYSIS OF AEROSOLS CONTAINING NANOPARTICLES
WITH DESIGNED SHAPES AND THOSE PRODUCED FROM FABRIC TESTING |
2:30 |
F-59 - TRACE ANALYSIS FOR METALS IN NAIL POLISH BY WAVELENGTH DISPERSIVE
X-RAY FLUORESCENCE (WDXRF) |
2:50 |
F-15 - REVISIT OF FORENSIC ANALYSIS OF ARSENIC POISONING CASE 1998 |
3:10 |
BREAK |
3:30 |
F-8 - INVITED - EVALUATION OF FUNDAMENTAL PARAMETERS FOR QUANTITATIVE X-RAY
FLUORESCENCE OF POLYOLEFINS |
4:00 |
F-39 - COMPARISON OF CALCULATION METHODS FOR ANALYSIS OF SOIL SAMPLES |
4:20 |
F-24 - NECESSARY CONDITIONS FOR ROBUST FUNDAMENTAL PARAMETER ANALYSIS IN EDXRF |
4:40 |
F-22 - USE OF SURROGATE MODEL ELEMENTS FOR ACCURATE PLUTONIUM QUANTIFICATION
WITH HIRX |
THURSDAY AM - XRD & XRF SESSIONS - 8 AUGUST 2013APPLICATIONS OF XRD & XRF IN THE PETROLEUM INDUSTRY || Standley Ballroom II
|
|
9:00 |
F-3 - INVITED - DETERMINATION OF CHLORINE IN CRUDE OIL BY ENERGY DISPERSIVE X-RAY
FLUORESCENCE SPECTROMETRY |
9:30 |
F-34 - BENEFITS USING WDXRF FOR PROCESS CONTROL IN POLYMER PRODUCTION: THE
ACCURATE ANALYSIS OF IMPURITIES AND ADDITIVES IN PE AND PP |
9:50 |
F-60 - ADVANCED GEOLOGICAL APPLICATIONS USING WDXRF ELEMENTAL
MAPPING/SMALL SPOT ANALYSIS AND STANDARDLESS QUANTIFICATION |
10:10 |
F-63 - INVITED - SOME APPLICATIONS OF XRF IN THE PETROLEUM INDUSTRY |
10:40 |
BREAK |
11:00 |
D-72 - INVITED - CRYSTALLITE DOMAIN SIZE AND THE LONG-RANGE ORDER INDEX |
11:30 |
D-73 - DETERMINATION OF BA/SR RATIO IN THE BARITE/CELESTITE SOLID SOLUTION SERIES |
THURSDAY AM - XRD SESSIONSSTRESS ANALYSIS || Cotton Creek
|
|
8:00 |
D-36 - INVITED - HIGH-ENERGY X-RAY STUDIES OF MICROSTRUCTURE AND STRAIN EVOLUTION |
8:30 |
D-51 - A METHOD TO MEASURE 3D RESIDUAL STRESS FIELDS USING HIGH ENERGY X-RAYS AND |
8:50 |
D-65 - DUCTILITY OF BERYLLIUM SUBJECTED TO SHEAR-COMPRESSION INVESTIGATED
USING SYNCHROTRON X-RAY DIFFRACTION |
9:10 |
D-55- SPATIALLY RESOLVED RESIDUAL STRAINS AND STRESSES IN AS-FABRICATED NUCLEAR
FUEL PLATES |
9:30 |
D-11 - SUB-MICRONIC PHASE, STRAIN AND TEXTURE IN DEPTH GRADIENT MEASUREMENT IN
POLYCRYSTALLINE THIN FILM: A NANO-PENCIL BEAM DIFFRACTION APPROACH |
9:50 |
D-23 - PHASE REVERSION DURING COMPRESSIVE LOADING OF SHOCKED ALPHA/OMEGA ZIRCONIUM |
10:10 |
BREAK |
10:40 |
D-66 - INVITED - GRINDING BURN - A RESIDUAL STRESS PROBLEM |
11:10 |
D-13 - THE GENERALIZED SIN2Ψ METHOD: ANADVANCED SOLUTION FOR X-RAY STRESS ANALYSIS
IN TEXTURED MATERIALS |
11:30 |
D-43- RESIDUAL STRESS AND QUANTITATIVE PHASE MAPPING ON COMPLEX GEOMETRIES
|
PAIR DISTRIBUTION FUNCTION || Meadowbrook
|
|
9:00 |
D-22 - INVITED - APPLICATION OF PAIR DISTRIBUTION FUNCTION ANALYSIS IN ENVIRONMENTAL
NANOSCIENCE |
9:30 |
D-26 - INVITED - HIGH PRESSURE INVESTIGATIONS OF LIQUID AND POLYMERIZED CO UP TO 20 GPa
USING PAIR DISTRIBUTION FUNCTION ANALYSIS |
10:00 |
D-25 - HIGH ENERGY X-RAY POWDER DIFFRACTION AT PETRA III – REAL SPACE DATA IN
REALTIME UNDER REAL CONDITIONS |
10:20 |
BREAK |
10:50 |
D-15 - NEUTRON PAIR DISTRIBUTION FUNCTION STUDY OF HYDROGEN LOADED Pu-Ga ALLOYS |
11:10 |
D-81 - AMBIENT AND VARIABLE-TEMPERATURE PDF STUDIES ON A LABORATORY INSTRUMENT |
THURSDAY AM - XRF SESSIONSAPPLICATIONS FOR PORTABLE XRF || Standley Ballroom I
|
|
9:10 |
F-71 - INVITED - USE OF HANDHELD XRF ANALYSES IN THE CHARACTERIZATION,
ASSESSMENT, REMEDIAL DESIGN, AND CLEANUP OF LEAD CONTAMINATED SITES
IN DEVELOPING COUNTRIES |
9:40 |
F-41 - PERFORMANCE COMPARISON OF PORTABLE XRF INSTRUMENTS: A MINERAL EXPLORATION
INDUSTRY PROSPECTIVE |
10:00 |
BREAK |
10:30 |
F-4 - RAPID SCREENING OF LIQUID DIETARY SUPPLEMENTS FOR NANOSCALE SILVER USING A
PORTABLE X-RAY FLUORESCENCE ANALYZER (p-XRF) |
10:50 |
F-6 - PORTABLE X-RAY FLUORESCENCE FOR SEED TREATMENT TECHNOLOGY |
11:10 |
F-37 - THE ROLE OF HANDHELD XRF IN DELINEATING THE EXTENT AND DEGREE OF LEAD
CONTAMINATION IN SOILS ASSOCIATED WITH ARTISANAL GOLD MINING,
NORTHWESTERN NIGERIA |
THURSDAY PM - XRD & XRF SESSIONSAPPLIED MATERIAL ANALYSIS || Cotton Creek
|
|
1:00 |
D-57 - INVITED - STRUCTURE DESIGN OF NEW CATHODE MATERIALS FOR Li-ION BATTERIES |
1:30 |
D-38 - IN-SITU MONITORING OF VANADIUM OXIDE FORMATION USING HIGH TEMPERATURE XRD |
1:50 |
D-45 - STRUCTURE DETERMINATION AND REFINEMENT OF HIGH SYMMETRIC LED PHOSPHOR
MATERIALS USING XRD POWDER DIFFRACTION |
2:10 |
D-31 - MACROSCOPIC METROLOGY OF NANOSCALE MATERIALS |
2:30 |
D-9 - IN SITU OBSERVATION OF LIQUID SINTERING OF CALCIUM-FERRITE BY QUICK X-RAY
DIFFRACTION SYSTEM |
2:50 |
C-8 - HAPG MOSAIC CRYSTALS AND THEIR APPLICATION IN HIGH RESOLUTION X-RAY
SPECTROSCOPY |
3:10 |
BREAK |
3:30 |
D-7 - DIFFRACTION STUDIES OF SELECTED MOLECULAR SIEVES AND METAL ORGANIC FRAMEWORK
MATERIALS FOR CO2 CAPTURE APPLICATIONS |
3:50 |
D-19 - X-RAY INVESTIGATIONS OF SOLID SOLUTIONS OF MONOCALCIUMALUMINATE AND MONOSTRONTIUMALUMINATE
IMPORTANT PHASES IN CEMENT AND PHOSPHORESCENCE MATERIALS |
4:10 |
C-5 - DEVELOPMENT OF GRATING-BASED STROBOSCOPIC X-RAY PHASE IMAGING USING
POLYCHROMATIC LABORATORY AND SYNCHROTRON X-RAY SOURCES |
4:30 |
C-2 - CHARACTERIZATION OF MATERIALS USING COMBINED X-RAY MICROANALYSIS AND
DIFFRACTION METHODS |
4:50 |
D-8 - MATERIALS CHARACTERIZATION FROM DIFFRACTION INTENSITY DISTRIBUTION IN
GAMMA DIRECTION |
THURSDAY PM - XRD SESSIONSPOLYMERS || Meadowbrook
|
|
1:30 |
D-41 - INVITED - USAXS/SAXS/WAXS INSTRUMENT FOR MATERIALS RESEARCH |
2:15 |
D-42 - ORIENTATION, CRYSTALLINITY, AND MECHANICAL PROPERTIES OF BIAXIALLY STRETCHED
POLYETHYLENE TEREPHTHALATE FILMS USING X-RAY DIFFRACTION |
2:45 |
D-34 - A NEW "CHAIN" OF EVENTS: POLYMERS IN THE POWDER DIFFRACTION FILE™ (PDF®) |
3:15 |
BREAK |
3:45 |
D-2 - CHARACTERIZING PROCESS INDUCED CRYSTAL MODIFICATIONS IN
POLY(ETHERKETONEKETONE) (PEKK) BY SCATTERING TECHNIQUES |
4:15 |
D-6 - X-RAY SCATTERING ON CASEIN MICELLES AND HIGH DENSITY LIPOPROTEIN (HDL)
GRANULES DURING PROCESSING OF FOODS |
THURSDAY PM - XRF SESSIONSFUSION & INDUSTRIAL APPLICATIONS OF XRF || Standley Ballroom I
|
|
1:30 |
F-67 - INVITED - APPLICATION OF XRF TO COMBUSTION RESIDUES |
2:00 |
F-53 - MERCURY EMISSIONS MONITORING BY TXRF |
2:20 |
F-51 - HIGH-PRECISION ANALYSIS OF IRON ORE BY WAVELENGTH-DISPERSIVE X-RAY
FLUORESCENCE SPECTROMETRY |
2:40 |
F-20 - ISO 9615-1 SIMPLIFIED BORATE FUSION / WDXRF ANALYTICAL METHOD FOR IRON ORE
INCLUDING TOTAL IRON ANALYSIS: PART 2 |
3:00 |
BREAK |
3:30 |
F-19 - THE STUDY OF CHLORINE ANALYSIS BY XRF USING SAMPLE PREPARATION BY BORATE
FUSION FOR CEMENT INDUSTRY RELATED MATERIALS |
3:50 |
F-29 - AEROSOL FILTER ANALYSIS USING POLARIZED OPTICS EDXRF WITH THIN FILM FP METHOD |
4:10 |
F-40 - EXTREMELY HIGH COUNT-RATE PERFORMANCE OF SILICON DRIFT DETECTOR |
4:30 |
F-33 - EFFECTIVE GRADE CONTROL IN MINING BY ENERGY-DISPERSIVE X-RAY FLUORESCENCE - ADVANTAGES WITH NEW TECHNOLOGY |
MICRO XRF || Standley Ballroom II
|
|
1:50 |
F-61 - INVITED - SUPERCONDUCTING MICROCALORIMETERS FOR TIME-RESOLVED AND OTHER
PHOTON-STARVED X-RAY SPECTROSCOPIES |
2:20 |
F-11 - CHARACTERIZATION OF METAL DOPED POLYMER CAPSULES USING CONFOCAL MICRO X-RAY
FLUORESCENCE SPECTROSCOPY AND X-RAY COMPUTED TOMOGRAPHY |
2:40 |
F-69 - INVITED - HIGH RESOLUTION X-RAY FLUORESCENCE MICROSCOPY: CHALLENGES
AND OPPORTUNITIES |
3:10 |
BREAK |
3:40 |
F-44 - INVITED - CONFOCAL MICROXRF IN VACUUM: SETUP AND APPLICATIONS |
4:10 |
F-21 - MICRO X-RAY FLUORESCENCE IN FOOD FORENSICS & FOOD SAFETY |
4:30 |
F-14 - FORENSIC APPLICATION OF MICRO-XRF: DETERMINATION OF UNIQUE COMPOSITIONAL
PATTERNS IN GLASSES: MULTIVARIATE APPROACH AND STATISTICAL ANALYSIS |
4:50 |
F-50 - THICKNESS AND COMPOSITION ANALYSIS OF THIN-FILM SOLAR CELLS VIA MICRO-XRF |
FRIDAY AM - XRD SESSIONS - 9 AUGUST 2013NEW DEVELOPMENTS IN RIETVELD ANALYSIS || Standley Ballroom II
|
|
8:30 |
D-32 - INVITED - REPRESENTATIONAL ANALYSIS OF EXTENDED DISORDER IN LARGE ATOMISTIC
ENSEMBLES GENERATED FROM DIFFRACTION DATA |
9:00 |
D-4 - STRUCTURAL STUDY OF NANOSTRUCTURED Cr-Co BASED ALLOYS BY X-RAY DIFFRACTION
LINE PROFILE ANALYSIS |
9:20 |
D-62 - A REAL SPACE RIGID BODY APPROACH TO QUANTIFYING INCOMMENSURATE STACKING FAULTS IN LAYERED OXIDES |
9:40 |
BREAK |
10:00 |
D-60 -INVITED - COMBINING POWDER DIFFRACTION WITH SOLID STATE NMR SPECTROSCOPY FOR STRUCTURE ELUCIDATION VIA RIETVELD ANALYSIS |
10:30 |
D-29 -CRYSTAL STRUCTURES OF SrR2SC2O7, R = Pr, Nd, Sm, Eu, AND Gd |
10:50 |
D-54 - IN SITU XRD STUDIES OF PDZN METHANOL STEAM REFORMING CATALYST |
FRIDAY AM - XRF SESSIONSTRACE ANALYSIS || Standley Ballroom I
|
|
8:30 |
F-70 - INVITED - GIXRF AND GIXAS AT TRACE LEVELS |
9:00 |
C-7 - INVITED - THE HARD X-RAY MICRO/NANO-PROBE BEAMLINE P06 AT PETRA III/DESY:
THE FIRST YEAR OF USER OPERATION |
9:30 |
F-58 - ULTRA HIGH ENERGY X-RAY FLUORESCENCE DIRECT DETECTION OF PLUTONIUM AND
URANIUM THROUGH CONTAINER WALLS |
9:50 |
F-35 - XRS FOR PREVENTIVE CONSERVATION IN EUROPEAN MUSEUMS |
10:10 |
BREAK |
10:30 |
F-43 - HEAVY METAL ANALYSIS IN LENS AND AQUEOUS HUMOR OF CATARACT PATIENTS BY TOTAL
REFLECTION X-RAY FLUORESCENCE SPECTROMETRY |
10:50 |
F-64 - USE OF X-RAY SPECTROSCOPY FOR ELEMENTAL ANALYSIS OF COMPLEX
BIOLOGICAL SAMPLES |
11:10 |
F-42 - APPLICATION OF TOTAL REFLECTION X-RAY FLUORESCENCE SPECTROMETRY AND GRAZING
INCIDENCE X-RAY FLUORESCENCE TO GENESIS SOLAR WIND SAMPLES |
11:30 |
F-26 - MICROANALYSIS OF RARE EARTH ELEMENTS USING PYROELECTRIC CRYSTAL |
For more information, please contact Denise Flaherty
