Keep "in the know" by following our TwitterFacebookLinkedIn, and Instagram
Use #dxc2019 as your hashtag!

2019 DXC Program - See ICXOM-25 Program

Program-at-a-Glance (PDF)

Quick Links:

Monday Morning Workshops          
Monday Afternoon Workshops
Monday Evening - XRF Poster Session

Tuesday Morning Workshops          
Tuesday Morning Student Presentations
       
Tuesday Afternoon Workshops
Tuesday Evening - XRD Poster Session

Wednesday Morning Plenary Session            
Wednesday Afternoon Sessions

Thursday Morning Sessions              
Thursday Afternoon Sessions

Friday Morning Sessions

ICXOM-25 Sessions


Session Chairs and Invited Speakers are listed below. The complete Program will be announced on this website before May 2019.

DXC WORKSHOP TOPICS      

Monday am Workshops

Special Topics in X-ray Analysis

Introduction to X-ray Computed Tomography
Organizers & Instructors:
A. Takase, J. Ferrara Rigaku Americas Corporation, USA, aya.takase@rigaku.com; joseph.ferrara@rigaku.com
F. De Carlo, Argonne National Laboratory, USA, decarlo@anl.gov
E. Yen, Object Research Systems, Canada, eyen@theobjects.com

This workshop provides an introduction to X-ray computed tomography (CT) and is designed to help beginners learn how X-ray CT works and how it can be applied to materials science research. It will include an introduction to the technique, an overview of instrumentation and application examples. The advantages of using synchrotron radiation and its unique applications will also be discussed. Data analysis is one of the most involved aspects of the X-ray CT technique, so the last half of the workshop will cover an overview of the data analysis techniques such as basic image processing, segmentation and machine learning. Commonly used data analysis and visualization programs will be discussed and demonstrated to help beginners to get an idea of where to start and select the right analysis tool for their needs. There will be hands-on training of ImageJ and participants are encouraged to bring their laptops to practice image processing under guidance from the instructors.

Sample Preparation and Experimental Conditions for XRF and XRD
Organizers & Instructors:
J. Kawai, R. Tanaka,Kyoto University, kawai.jun.3x@kyoto-u.ac.jp; tanaka.ryohei.5r@kyoto-u.ac.jp
S. Ichikawa, Fukuoka University, Japan, sichikawa@fukuoka-u.ac.jp
A. Ohbuchi, Applied Rigaku Technologies, Inc., USA, atsushi.ohbuchi@rigaku.com

This workshop provides a basic introduction to (i) XRF sample preparations: (a) estimation of escape depth of fluorescent X-ray, (b) appropriate sample condition (flatness, particle size, homogeneity, and thickness) based on the depth for reliable quantitative analysis, (c) pulverization and mixing of heterogeneous solid sample, and (d) characteristics and examples of typical XRF specimen such as loose powder, powder pellet and glass bead; (ii) the processing of XRF spectra in fundamental parameter method for quantitative analysis using ED-XRF (smoothing, Gaussian fitting, peak separation, background subtraction, the energy resolution, Compton effect on the incident X-rays, the intensity correction based on the energy-wavelength relation, etc.); and (iii) sample preparation and quantitative analysis for XRD: (a) appropriate sample preparation of powder and bulk samples (grinding, flatness and particle size), (b) optics configurations (Bragg-Brentano, parallel beam, transmission, Gandolfi and Ka-1 systems), (c) quantitative methods (RIR method, internal standard method, standard addition method and Rietveld refinement).

 

X-ray Fluorescence

Handheld XRF – The Silver Bullet or Fools Gold?
Organizer & Instructors:
M. Loubser, GeoMagGeoChem, South Africa, maggi.loubser@gmail.com
A. Seyfarth, SGS Minerals, Canada, Alexander.Seyfarth@sgs.com
N. Brand, Geochemical Services Pty Ltd, Australia, nwbrand@bigpond.net.au
L. Lee, Getty Conservation Institute, USA, LYlee@getty.edu

X-ray fluorescence spectroscopy is a mature technique with the theory well described and routinely applied in process control, exploration, mining and manufacturing apart from research and development applications.  The “big shrink” as in most analytical technologies was the result of improved electronics and computer chips, and together with the advance of the SDD detector, Energy Dispersive XRF was ready to enter the playground.  Handheld XRF moved from a metal sorting scanner to an actual quantitative analytical tool.  But here lies the biggest challenge, because of reduced cost and ease of operation this tool is now more accessible to people who often do not have the insight in the limitations.

In this workshop, firstly the differences between analysis in the field vs. the laboratory would be explained, and methods to improve accuracy or interpret the data based on the known inaccuracies.  Practical issues like safety of operation will be discussed. A set of geological “exploration” based studies show how to get fit for purpose data in various scenarios will be given by Nigel Brand.  Taking the applications, a step further is the approach of quantitative analysis of plant material to manure.  Then conservation scientists from the Getty will introduce some case studies in the field of art and conservation where the ability to bring a non-destructive technique to the actual object probably had the biggest impact, but again, not without pitfalls.

Monday pm Workshops

X-ray Diffraction

High-Energy X-ray Diffraction Microscopy
Organizer & Instructors:
J. Almer, Argonne National Laboratory, USA, almer@anl.gov
J.S. Park, Argonne National Laboratory, USA, parkjs@anl.gov
H. Sharma, Argonne National Laboratory, USA, hsharma@anl.gov

High-energy X-ray diffraction microscopy (HEDM) is a 3D imaging technique which yields crystallographic information of individual grains within polycrystalline aggregates.   This information includes the orientation and center of mass of each diffracting grain, and can be obtained non-destructively under a variety of in-situ conditions such as applied stress and temperature.  Additional information includes grain shape and lattice spacing/strains, with the sensitivity to these quantities depending on the (variable) sample to detector distance.  HEDM has been developed and primarily used at synchrotron X-ray sources, although some laboratory versions are now available. In this workshop, we will provide an overview of the HEDM technique and its implementation at the Advanced Photon Source.  We will discuss current limitations of the technique, and share both pitfalls and tips learned from experiences with users over the past ~decade.   We will then work with the participants to process example raw datasets to produce 3D microstructural images, and perform basic visualization and data exploration of the images.

Basic to Intermediate XRD
Organizers & Instructors:
M. Rodriguez, Sandia National Laboratory, USA, marodri@sandia.gov
S. Misture, New York State College of Ceramics at Alfred University, USA, misture@alfred.edu
T. Blanton, ICDD International Centre for Diffraction Data, USA, tblanton@icdd.com

This workshop will discuss the use of XRD for standard qualitative analysis and will detail progressively more challenging means of XRD characterization including: quantitative analysis, profile fitting, lattice parameter refinement, crystallite size and microstrain determination, texture analysis, and structure refinement (Rietveld). Additionally, some discussion shall be dedicated to characterization of nanomaterials and glasses via pair distribution function analysis, as well as thin film techniques such as grazing incidence XRD and X-ray reflectivity (XRR). The workshop is intended to be a survey for the new user of XRD regarding what experiments can be performed and why one would wish to pursue such measurements.

X-ray Fluorescence

Basic XRF
Organizer & Instructors:
J.A. Anzelmo, Anzelmo & Associates, Inc., USA, jaanzelmo@aol.com
M.A. Zaitz, IBM, USA, zaitz@us.ibm.com

This workshop provides a basic introduction to the principles of XRF and is specifically aimed at those new to the field.  It begins with a general overview of the technique and the various instrumentation configurations including their main applications.  This is followed by more specific details of XRF Physics.  Basic WDX instrumentation will be described with its use and applications.  In the second half of the workshop, basic EDX instrumentation including general purpose bulk analyzers (benchtop EDX), TXRF, Micro analyzers, and Handheld analyzers will be reviewed.  Capabilities, and applications in actual practice will be described.

Quantitative Analysis of XRF – Part I
Organizers & Instructors: W.T. Elam, Washington State University, USA, wtelam@uw.edu
B. Vrebos, Malvern Panalytical, The Netherlands, bruno.vrebos@panalytical.com
K. Kawakyu, Rigaku Corporation, Japan, kawakyu@rigaku.co.jp

Part I:
Matrix effects and how to compensate for them: scatter peaks, compensation
methods, semi-quantitative analysis using FP, and fusion.

Part II:
Walkthrough of quantitative analysis for a few XRF spectra.

Tuesday am Workshops

X-ray Diffraction

SAXS Data Reduction and Analysis of Specific Types of Samples – Part I
Organizers & Instructors:
J. Ilavsky, APS-Argonne National Laboratory, USA, ilavsky@aps.anl.gov
F. Zhang, National Institute of Standards and Technology, USA, fan.zhang@nist.gov

Small angle X-ray scattering (SAXS) is a premier technique that captures the statistically significant structural characteristics in the mesoscopic (nanometer to micrometer) regime. Recent developments in both synchrotron-based and lab-based SAXS instruments, as well as the increasing availability of user-friendly small angle scattering (SAS) data reduction and analysis software, have enabled high-quality measurements of a wide range of materials and facilitated the construction of structure-function-property relationship, critical to materials development. In particular, in situ or operando measurements of advanced functional materials in various sample environments, made possible by the high flux and high energy X-rays generated by the synchrotron sources, have played a pivotal role in unveiling the complex materials microstructural pathways under their working conditions.

The SAXS workshop and scientific session, combined, aim to showcase the most recent advancements in both SAS analysis software and the applications of SAXS. The SAXS workshop will provide an in-depth introduction to the capabilities of two leading SAS analysis software suites under active development, Irena and SasView. The scientific session invites contributions from all aspects of SAXS applications in materials science, with emphasis on advanced functional materials of real-life significance.

Rietveld – Part I
Organizer & Instructors:
O. Borkiewicz, B. Toby, R. Von Dreele, K. Wiaderek, A. Yakovenko, Argonne National Laboratory, USA, borkiewicz@anl.gov

This workshop has been designed as a foray to structural analysis of powder X-ray scattering data – one of the most comprehensive and powerful tools for evaluating crystal structures. The primary goal of this workshop will be to discuss and explain all typical steps involved in structural analysis of X-ray scattering data with emphasis on data collected at modern users’ facilities using large-area detectors. First part of the workshop will focus on such aspects of the data analysis process as measurement calibration, data reduction, peak profile fitting, Rietveld refinement. In addition to “classic” single pattern refinement approach, we will explore strategies for handling large data sets, i.e. sequential refinements and parametric fitting to in situ and operando data. The second part of the workshop will be dedicated to the complementary use of pair distribution function (PDF) analysis, which allow extraction of structural information from amorphous and disordered materials, for which classical crystallographic approaches may not yield satisfactory results. All tasks pertaining to the workshop will be carry out and accomplished within General Structure Analysis System (GSAS-II). GSAS-II is a powerful open-source Python-based tool that addresses all types of crystallographic studies and handles all standard activities involved in the reduction and analysis of data acquired with both X-ray and neutron probes. This will be an excellent opportunity to learn how to take full advantage of this powerful software directly from the program authors, Robert Von Dreele and Brian Toby, and how to apply this knowledge to real-world applications and experimental data sets presented by beamline scientists Kamila Wiaderek, Andrey Yakovenko and Olaf Borkiewicz, Advanced Photon Source, Argonne National Laboratory.

X-ray Fluorescence

Micro and Energy Dispersive XRF
Organizer & Instructors:
M.A. Zaitz, IBM, USA, zaitz@us.ibm.com
K. Tsuji, Osaka City University, Japan, tsuji@a-chem.eng.osaka-cu.ac.jp
Description to be announced.

 

TUESDAY am STUDENT SESSION
             

Education in X-ray Analysis – Student Presentations
Chair: M. Schmeling, Loyola University Chicago, USA, mschmel@luc.edu
9:00 F-31 Evaluation of Sample Preparation Methods for Beverages and Condiments for Analysis by TXRF and AAS
E. Jamka*, B. Folga, S. Kasperek, M. Lund, M. Schmeling, Loyola University Chicago, USA
9:20  S-11 Crystal Structure Characterization of Uranium- Silicides Accident Tolerant Fuel by High Temperature Neutron Diffraction
T.L. Wilson*, T.M. Besmann, University of South Carolina, USA
S.C. Vogel, J.T. White, Los Alamos National Laboratory, USA
9:40 D-91 In-Situ Synchrotron X-ray Computed Microtomography and Diffraction Investigation of Deformation and Fracture Behavior in a Laser Powder Bed Fusion Processed 316L Stainless Steel
L. White*, M. Koehler, H. Choo, University of Tennessee, USA
X. Xiao, Y. Ren, Argonne National Laboratory, USA
D. Morin, E. Garlea, CNS/Y-12 National Security Complex, USA
10:00   Break  
10:30 S-37 Using XRF to Identify Multiple Environmental Hazards in St. Joseph County, IN
M. Tighe*, H. Beidinger, C. Knaub, M. Sisk, M. Lieberman, G.F. Peaslee, Univeristy of Notre Dame, USA
10:50  S-7 Genetic Algorithm For Crystal Structure Prediction
K.A. Thasneema, Farook College, Kozhikode, India

 

Tuesday pm Workshops

X-ray Diffraction

SAXS Data Reduction and Analysis of Specific Types of Samples – Part II
Organizers & Instructors:
J. Ilavsky, APS-Argonne National Laboratory, USA, ilavsky@aps.anl.gov
F. Zhang, National Institute of Standards and Technology, USA, fan.zhang@nist.gov

See previous description in Part One.

Rietveld – Part II
Organizer & Instructors:
O. Borkiewicz, B. Toby, R. Von Dreele, K. Wiaderek, A. Yakovenko, Argonne National Laboratory, USA, borkiewicz@anl.gov

See previous description in Part One.

Trace Analysis
Organizers & Instructors:
C. Streli, TU Wien, Atominstitut, Wien, Austria, streli@ati.ac.at
P. Wobrauschek, TU Wien, Atominstitut, Wien, Austria, wobi@ati.ac.at
K. Tsuji, Osaka City University, Japan, tsuji@a-chem.eng.osaka-cu.ac.jp
N. Kawahara, Rigaku Corporation, Japan, kawahara@rigaku.co.jp

Both beginners and experienced X-ray scientists and applicants, physicists and chemists, should gain information by attending the trace analysis workshop. Presentations of most modern techniques and instrumentation for trace element analysis using EDXRS will be given. Physical methods to improve minimum detection limits in XRF by background reduction will be discussed; special emphasis will be on Synchrotron radiation as an excitation source.  Introduction to total reflection XRF (TXRF) and actual instrumentation will show achievable advantages and results in terms of detection limits, sensitivities and detectable elemental range down to light elements (eg. Carbon).  Micro-XRF and Confocal µ-XRF will be presented as methods for 2D and 3D spatial resolved elemental imaging. Applications from fields as environment, microelectronics, forensic, and life science will show the successful use of the various XRF spectrometric techniques. The possibilities of trace analysis using Wavelength Dispersive XRF will also be covered, showing the benefits and limitations of the technique. A comparison of achievable detection limits with the various techniques on some specific samples will be discussed.

Quantitative Analysis of XRF – Part Two
Organizers & Instructors: W.T. Elam, Washington State University, USA, wtelam@uw.edu
B. Vrebos, Malvern Panalytical, The Netherlands, bruno.vrebos@panalytical.com
K. Kawakyu, Rigaku Corporation, Japan, kawakyu@rigaku.co.jp

See previous description in Part One.

 

Monday Evening - XRF Poster Session

5:00 – 7:00 pm Grand Ballroom
Judge: M. Schmeling, Loyola University Chicago, USA

F-1 Development of Synthetic Calibration Standards for X-ray Fluorescence Determination of Japanese Ancient Pottery
S. Ichikawa*, T. Kurisaki, Fukuoka University, Japan

F-2  All-new Electronic System for Combination with Silicon Drift Detector Preamplifiers
N. Willems*, R. Fojt, J. Knobloch, E. Lechner, C. Luckey, R. Stötter, KETEK GmbH, Germany

F-3  Effect of Chemical Environment in La, Lb1, Lb3,4 and Lg2,3 X-ray Emission Lines of 37Rb Compounds with WDXRF Spectrometer
H.S. Kainth*, D. Mehta, J.S. Shahi, T. Singh, Panjab University Chandigarh, India

F-6   Advanced Structural Analysis of Pt-Sn-based Nanoparticles with TXRF and Complementary Methods
C. Gutsche*, H. Till, U. Fittschen, TU Clausthal, Germany
A. Erdt, J. Parisi, J. Kolny-Olesiak, University of Oldenburg, Germany

F-8  Application of Optimize Algorithm in EDXRF Spectrum Unfolding
L. Mingbo, L. Xueliang, NCS, Peoples Republic of China

F-12 Full Field Energy Dispersive X-ray fluorescence Imaging and Compressed Sensing Analysis for Super-Resolution Analysis
K. Tsuji*, A. Yamauchi, T. Matsuyama, Osaka City University, Japan

F-14 Use of Compton to Rayleigh Ratio for the Indirect Analysis of Light Elements in Glass Fragments for Forensic Applications
R. Corzo*, E. Steel, National Institute of Standards and Technology, USA

F-16 2 mm Silicon Drift Detector with Improved Hard X-ray Spectroscopy Performance
M. Zhang*, J. Wang, S. Barkan, E. Tikhomirov, V.D. Saveliev, E.V. Damron, D. Redfern, Hitachi High-Technologies Science America, USA

F-19 Optimization of the Thickness for Target Materials for the Transmission Type X-ray Tube
J.D. Kim*, S.H. Kim, SUNJE, Republic of Korea
D.H. Lee, Pukyung National University, Republic of Korea

F-21 Confocal Line XRF Analysis in Comparison with Confocal Point Micro XRF Analysis
T. Matsuyama*, S. Sonoda, K. Tsuji, Osaka City University, Japan
H. Nakano, HORIBA Ltd., Japan

F-22 Conical Shaped Polycapillary Optics for X-ray Imaging Applications
J. Sachs*, N. Gao, Y. He, I. Ponomarev, XOS, USA

F-23  Beam-shaping Refractive Optics for High-energy X-rays
D. Zverev*, A. Barannikov, A. Snigirev, Immanuel Kant Baltic Federal University, Russia
V. Kohn, National Research Center “Kurchatov Institute”, Russia
V. Yunkin, S. Kuznetsov, Institute of Microelectronics Technology RAS, Russia
I. Snigireva, European Synchrotron Radiation facility, France

F-25 Concept Testing of a Low Power Pyroelectric X-ray Source for Application in Planetary Explorations
H. Munguia-Flores, B. Zhong, K. Uckert, R. Hodyss, C. Heirwegh*, Jet Propulsion Laboratory, USA

F-27 Determination of the Oxidation State of Zinc and Strontium in Mineralized Osteosarcoma Tissue by in Micro X-ray Fluorescence XANES
M. Rauwolf, R. Wanzenböck, A. Turyanskaya, D. Ingerle, TU Wien-Atominstitut, Austria
A.G. Buzanich, M. Radtke, BAM-BESSY, Germany
S. Lang, R. Windhager, Medical University of Vienna, Austria
J.G. Hofstaetter, A. Roschger, P. Roschger, Ludwig Boltzmann Institute of Osteology and AUVA Trauma Centre, Austria
S. Sprio, L. Preti, A. Tampieri, NRC - Institute of Science and Technology for Ceramics, Italy

F-28  Elemental Analysis of Nasolacrimal Duct Tissue using Total Reflection X-ray Fluorescence Spectroscopy
G. Mankovskii, A. Gvozdic*, A. Pejovic-Milic, Ryerson University, Canada
D. Howarth, Mount Sinai Hospital, Canada

F-34 High-Precision Polychromatic XRF System for Valence Evaluation of Cathode Materials in Lithium-ion batteries
T. Yoneda*, T. Omori, T. Izumi, S. Tokuda, S. Adachi, K. Sato, Shimadzu Corporation, Japan
Mi. Kobayashi, T. Mukai, H. Tanaka, M. Yanagida, National Institute of Advanced Industrial Science and Technology, Japan

F-35 Measurement of Continuous X-ray Polarization by 3D-printed Instrument
R. Tanaka*, D. Yamashita, J. Kawai,  Kyoto  University, Japan

F-37  Optimization of the Thickness for Target Materials for the Transmission Type X-ray tube
J. Kim*, S. Kim, SUNJE, Korea
D. Lee, Pukyung National University, Korea

F-42 TXRF Analysis for the Screening of Uranium Surface Contamination on Demolition Debris with Sample Condensation Technique
H. Yoshii*, Y. Izumoto, T. Matsuyama, K. Takamura, National Institutes for Quantum and Radiological Science and Technology, Japan
Y. Sakai, Toho University, Japan

F-43 Iron, Manganese and Sulphur Valence State Determination by Wavelength-Dispersive X-ray Fluorescence Analysis
V. Chubarov, Siberian Branch of Russian Academy of Sciences, Russian Federation

F-47  European Network for Chemical Elemental Analysis by Total Reflection X-ray Fluorescence
D. Eichert, ELETTRA - ST, Italy
L. Borgese, INSTM and Chemistry for Technologies Laboratory, Italy

F-50  Elemental and Trace Element Analysis of PM2.5 Aerosols Collected From a Traffic Site in Sharjah, UAE Using XRF Technique
N.M. Hamdan*, American University of Sharjah, United Arab Emirates
H. Alawadhi, M. Shameer, University of Sharjah, United Arab Emirates

F-51 Automatic Correction of Oil or Water-Based Matrix by Analyzing Scattering Peaks
W. Peng*, X. Zhang, Z. Chen, XOS, USA

F-52 Measure Vanadium, Nickel and Sulfur by HDXRF
X. Zhang, L. Johnson, Z. Chen, X-ray Optical Systems, USA

F-54 Full-field XRF with Square Pore Micro-Channel Plate Optic
P. Sarrazin*, F. Marchis, C. Chalumeau, K. Thompson, SETI Institute, USA
D. Blake, R. Walroth, T. Bristow, NASA ARC, USA
M. Gailhanou, P. Walter, CNRS, France
J. Chen, Baja Technology, USA
E. Schyns, PHOTONIS, France

F-55 Evaluation of EDXRF Detection Limits of Air Samples with Custom Low-Loaded Multi-Elemental Reference Materials
K. Trzepla*, W. White, N. Hyslop, University of California, Davis, USA
S. Yatkin, California Department of Public Health, USA

F-57 From Cathode to Anode — An Adventure of the Elemental Studies
L. Li*, Z. Chen, X. Liu, T. Liu, G. Xu, O. Antipova, Argonne National Laboratory, USA
F. Lin, Virginia Tech, USA

F-60 Analysis of Heavy Metals and Nutrients in Seaweed using pXRF
C. Brand*, N. Potter,Portable XRF Services, Australia
V. Skrzpczyk, Deakin University, Australia


Tuesday Evening - XRD Poster Session

5:00 – 7:00 pm Grand Ballroom (Exhibit Hall)
Judge: T. Watkins, Oak Ridge National Laboratory, USA

D-4   Structural, Optical, and Magnetic Properties of Mn Doped ZnO Thin Films
A.M. Alsmadi*, B. Salameh*, Kuwait University, Kuwait

D-8  Deposition and Structural Characterization of Ag Films
Q. Lin, University of California Irvine, USA

D-9  Crystal Structures of Large-Volume Commercial Pharmaceuticals           
J. Kaduk*, Poly Crystallography Inc., USA
Z. Butler, North Central College, USA
P. Das, Nanomegas, Belgium
A. Gindhart, T. Blanton, ICDD, USA

D-11 Comparison Studies of the Residual Stresses of Metal Cutting Tools with Various Methods
T. Shibata, Kennametal Inc., USA

D-13 Lithium Titanium Phosphate/Pt Composites with Enhanced Li+ Ion Conductivity
R. Forbes, University of the Witwatersrand, South Africa

D-18 Characterization of Synthetic and Biogenic Hydroxyapatite Using Modern Synchrotron Pair Distribution Function Techniques   
E.L Arnold*, K.D. Rogers,Cranfield University, UK
C. Greenwood, University of Keele, UK
D.L. Keeble, Diamond Light Source, UK

D-21 X-ray analysis of MSWI Fly Ash using Multiple Approaches
A. Ohbuchi*, W. Matsuda, Rigaku Corporation, Japan
Y. Koike, Meiji University, Japan

D-22 X-ray Diffraction: Beyond 1D
S. Sohn, LG Chem, Korea

D-23 Shine Bright Like a Diamond: Microfocus X-ray Sealed Tube Sources with Diamond Hybrid Anode Technology
F. Hertlein*, J. Graf, J. Schmidt-May, P. Radcliffe, C. Michaelsen, Incoatec GmbH, Germany

D-24  Beam at all End-Stations in the Brockhouse Beamlines at the Canadian Light Source
B. Moreno, A. Leontowich, N. Appathurai, G. King, Canadian Light Source, Canada
S. Kycia, University of Guelph, Canada

D-26 Bayesian Approach and Fisher Information for Automatic Analysis of X-ray Data and Measurement Planning
A. Ulyanenkov*, Atomicus LLC, USA
A. Mikhalychev, S. Vlasenko, N. Lappo, I. Perapechka, Atomicus OOO, Belarus

D-27 Ultra-High-Speed System - Over 50 kfps Hybrid Pixel Array Detector –
Y. Nakaye*, Y. Sakuma, S. Mikusu, T. Sakumura, Rigaku Corporation, Japan

D-28 Non-Destructive XRD Analysis of Paints for Art Historical Research
G.M. Hansford*, C.I. Hiley, University of Leicester, UK
N. Eastaugh, Art Analysis and Research Inc., UK
G. Cibin, Diamond Light Source, UK

D-30 Operand Measurement of Battery Cell using New SmartLab
T. Kuzumaki, Y. Shiramata, K. Nagao, Rigaku Corporation, Japan

D-32 Commercialization of an Ultra-Wide Dynamic Range Direct X-ray Detection System
B. Martin*, J. Farrington, B. Chan, Sydor Technologies, USA
H. Philipp, M. Tate, K. Skanks, P. Purohit, S. Gruner, Cornell University, USA

D-33 Variable Angle XRF and XRD Studies Using a Lab-based Instrument
S. King, University of Wisconsin - La Crosse, USA

D-34 X-ray Diffraction as a Non-destructive tool in Failure Analysis of Aerospace Hardware
C. Brennan, Collins Aerospace, USA

D-36 State-of-the art Texture Analysis Plugin of SmartLab Studio II
A. Himeda, A. Sasaki, K. Nagao, M. Rusetsky, Rigaku Corporation, Japan

D-38 Approaches towards Phase Quantification with Full Profile Matching and SQUALL
N. Henderson*, S. Rodesney, .J Giencke, B. Jones, Bruker AXS, USA

D-39 3D Visualization of XRD3 Texture Data as a Routine Research Tool and an Intuitive Teaching Aid
V.M. Jarvis, J.F. Britten, W. Guan, McMaster University, Canada

D-40 Local Structure Analysis of Non-Crystalline Materials based on PDFs
A. Sasaki*, A. Himeda, N. Muroyama, Y. Shiramata, Rigaku Corporation, Japan
K. Saito, Rigaku Americas Corporation, USA

D-41 Introducing a New Method for In Situ X-ray Scattering to Quantify Structural and Chemical Controls on Amorphous Calcium Phosphate
A. Hoeher*, S. Mergelsberg, F.M. Michel, Virginia Tech, USA
O. Borkiewicz, APS/Argonne National Laboratory, USA

D-43 The Crystal Structure of CuZIGO Using Neutron and X-ray Diffraction
S. Flynn, K. Poeppelmeier, Northwestern University, USA
A. Adekoya*, G. Gonzalez-Aviles, DePaul University, USA

D-44  Quantitative Microstructural Analysis of Plutonium Oxalate Decomposition over Time
J. Corbey*, L. Sweet, Pacific Northwest National Laboratory, USA

D-45  Diffracted Beam Collimators – Extending the Range of Applications for 2D Detectors
D. Beckers, M. Gateshki, Malvern Panalytical B.V., The Netherlands

D-49  Evolution of Mechanically Formed Bow Due to Surface Waviness and Residual Stress Difference on Sapphire (0001) Substrate
S. Song, I. Jung, C.S. Kim, Korea Research Institute of Standards and Science, Korea

D-51 The Influence of Gas and Humidity on Salt Mineral Compositions Studied by in-situ XRD
A.O.F. Jones*, B. Puhr, Anton Paar GmbH, Austria
B. Strauch, GFZ German Research Centre for Geosciences, Germany

D-60 Structural, Magnetic and Electronic Properties of Magnetic ion Doped Ferroelectric Ceramics
A. Kaur, L. Singh,  Guru Nanak Dev University, India
K. Asokan, Inter-University Accelerator Centre, India

D-65  A High-Precision Measurement of the Molybdenum K-Shell X-ray Spectrum
M.H. Mendenhall*, L.T. Hudson, C.I. Szabo, A. Henins, J.P. Cline, NIST, USA
C. I Szabo, Theiss Research, USA

D-66 NIST Standard Reference Materials for X-ray Metrology
J. Cline*, M. Mendenhall, D. Black, A. Henins, NIST, USA

D-67 BRAGG2D: Rapid Assessment of XRPD Sample Preparation
J. Giencke*, B. Jones, N. Henderson, B. Krueger, Bruker AXS, USA

D-68 Synthesis and Structure Solution of UOP Layered Silicate-1 (ULS-1) with a Layer Comprising [4262] Half-Sodalite Cages
C.P. Nicholas, M.A. Miller, S.R. Miller, R.W. Broach, M.M. Galey, S. Prabhakar, B. Lyons, C.L. Nicholas*, Honeywell UOP, USA

D-69  Synthesis of Li-Sn-Zn Ternary Alloy
C.K. Saw*, B.W. Choi,  Lawrence Livermore National Lab, USA

D-71 Status of the Diamond CRL Development
S. Antipov*, Euclid Techlabs LLC, USA
X. Shi, L. Assoufid, Argonne National Laboratory, USA

D-72 Planetary XRD/XRF Beyond Chemin: New Developments Toward Smaller Instruments
P. Sarrazin*, SETI Institute, USA
T. Bristow, D. Blake, NASA ARC, USA
M. Gailhanou, CNRS, France
J. Chen, Baja Technology, USA
K. Zacny, Honeybee Robotics, USA

D-73 Investigation of the Real Structure Using X-ray Diffraction as a Tool for Laser Welding Optimization
J. Capek*, N. Ganev, Czech Technical University in Prague, Czech Republic
S. Nemecek, RAPTECH s.r.o., Czech Republic

D-75 Residual Stress in 0D, 1D, or 2D? Let the Sample Decide
B. Krueger, B. Jones, J. Giencke, N. Henderson, Bruker AXS, USA

D-80 Spherical Optics by Dislocation of Crystal Structure
J.M. Maj, Marquette University, USA

D-85 ICDD® Polymer Diffraction Data Project – 100+ PDF® Entries AND Growing
T. Blanton*, M. Rost, S. Gates-Rector, ICDD, USA

D-96 Fully Automated Multi-Applications Approach in the Analysis of Material: A Case Study on Heat Treatment Effects on TiN Thin Film Samples
F. Masiello*, Z. Bao, M. Sommariva, M. Fransen, Malvern Panalytical, The Netherlands

S-15  Back-Reflection Energy-Dispersive X-ray Diffraction to Assess the Origin of the “MacGregor Man”
C.I. Hiley,* G.M. Hansford, University of Leicester, UK
L. McNamara, D. Bone, K. Domoney, Ashmolean Museum, University of Oxford, UK
A.J. Shortland, Cranfield University, UK
P. Degryse, K.U. Leuven, Belgium
G. Cibin, Diamond Light Source, UK

Post Deadline Posters:

D-99 Molecular- To Macro- Energy Absorption Mechanisms in a Biological Body Armour Illuminated by in-situ Diffractive Pseudo-Tomographic X-ray Imaging
Y. Zhang*, Chinese Academy of Science, China and Deutsches Elektronen-Synchrotron DESY, Germany
J. Garrevoet, J. Torben Roeh, G. Falkenberg, Deutsches Elektronen-Synchrotron DESY, Germany
Y. Wang, H. Gupta, Queen Mary University of London, UK
N. Terrill, Diamond Light Source, UK
Y. Dong, Chinese Academy of Science, China
                            
D-100 X-ray Diffraction Imaging Techniques for Non-Destructive Characterization of Crystalline Grains Inside Bulk Polycrystalline Alloys
Y. Yang, Institute of High Energy Physics, Chinese Academy of Sciences, China

D-101 Structure and Hirshfeld Surface Analysis of a New Structure of Oxymetazoline Chloride
K.V. Serrano*, R.A. Toro, J.A. Henao, Industrial University of Santander, Columbia

D-102 Synthesis and Characterization of a Nickel Complex of Enalaprilo and Solubility Study
L. Pabón González*, R.A. Toro, J.A. Henao, Universidad Industrial de Santander, Columbia


 

WEDNESDAY MORNING PLENARY SESSION            

PLENARY – New Approaches in Imaging (COMBINED DXC & ICXOM-25 SESSION)
Chairs:    U.E.A. Fittschen, Clausthal University of Technology; Germany; T.G. Fawcett, Emeritus, ICDD, USA
8:30   Opening Remarks and Awards
9:00 I-5 Multimodal Imaging Using Lyncean’s Compact Synchrotron Source
B. Hornberger, Lyncean Technologies, USA
9:45  I-70 Spatial and Temporal Exploration of Heterogeneous Catalysts with Synchrotron Radiation
F. Meirer, University of Utrecht, The Netherlands
10:30     Break
11:00  I-105 X-ray Imaging from Tissues to Cells to Subcellular Structures
G. Woloschak, Northwestern University, Feinberg School of Medicine, USA
11:45 P-2  Nanocrystalline Powder Diffraction Analysis
I.C. Noyan*, H. Öztürk, S. Xiong, Columbia University, USA 

 

WEDNESDAY AFTERNOON SESSIONS

New Developments in XRD/XRF Instrumentation Part One
(vendor/commercial presentations permitted)
Chairs: T. Fawcett, Emeritus, ICDD, USA, dxcfawcett@outlook.com; A. Drews, Ford Motor Company, USA; adrews@ford.com
1:30 S-32 Versatile Benchtop X-ray CT Scanner: CT Lab HX
A. Takase, Rigaku Americas Corporation, United States
1:45 S-26  D8 DISCOVER Plus: Uncompromised Power, Unmatched Accuracy, Unparalleled Efficiency
J. Giencke*, B. Jones, N. Henderson, B. Krueger, Bruker AXS, USA
2:00 S-9  Investigating Coin Cell Processes in Transmission Geometry on a Laboratory Diffractometer
T. Hartmann, Stoe & Cie GmbH, Germany
2:15 S-3 New Developments in Microfocus Sources for X-ray Diffractometry
F. Hertlein*, U. Heidorn, J. Wiesmann, J. Graf, J. Schmidt-May, C. Michaelsen, Incoatec GmbH, Germany
2:30 S-17 Benefits of the MYTHEN Detector for XRF Analysis in Laboratory Spectrometers
D. Šišak Jung*, N. Pilet, DECTRIS, Switzerland
2:45  S-16 News on Silicon Drift Detectors for High-Speed and High Resolution XRF Spectroscopy closed to Room Temperature
A. Niculae*, A. Simsek, H. Schmidt, T. Barros, A. Liebel, R. Lackner, M. Kopetzky, PNDetector GmbH, Germany
3:00   Break  
3:30 S-1    Automate Complex Workflows with HighScore (Plus)
T. Degen*, M. Sadki, E. Bron, Malvern Panalytical B.V., The Netherlands
3:45 S-28 New Innovations in DIFFRAC.EVA v5.0
B. Jones*, N. Henderson, S. Rodesney, J. Giencke, Bruker AXS, USA
4:00 S-22 MOXTEK’S Developments in X-ray Sources
S. Cornaby*, T. Parker, B. Harris, E. Miller, K. Kozaczek, Moxtek, USA
4:15 S-2 New possibilities in non-ambient XRD from Anton Paar
A.O.F. Jones*, B. Puhr, Anton Paar GmbH, Austria

 

Machine Learning Techniques in X-ray Analysis
Chair: A. Mehta, SLAC, SSRL, USA, mehta@slac.stanford.edu
1:30 S-31 WITHDRAWN - Invited-Autonomous Research Systems - Phase Mapping
A.G. Kusne*, National Institute of Standards & Technology and University of Maryland, USA
B. DeCost, J. Hattrick-Simpers, National Institute of Standards & Technology, USA
A. Mehta, Stanford Synchrotron Radiation Lightsource, USA
I. Takeuchi, University of Maryland, USA
2:00  S-35 Invited- Automating Powder Pattern Interpretation with High-Throughput Measurements and Artificial Intelligence
H.S. Stein*, C.P. Gomes, J. Bai, Y. Xue, J. Bjorck, B. Rappazzo, S. Ament, R. Bernstein, S. Kong, S.K. Suram, R.B. van Dover, J.M. Gregoire, California Institute of Technology, USA
2:30 S-4 Machine Learning to Quantify XRF Measurements
M. Radtke, BAM, Germany
2:50   S-6 LCLS Analysis and Automation Advances: Bi-Cross Validation of the Inverted Laplacian for Cluster Number and Generalized Hyper-Parameter Estimation      
S. Zohar, PCDS/LCLS/SLAC, USA
3:10  Break  
3:40   S-12  Automated Feature Extraction for High-Throughput Synchrotron Characterization
R. Tang-Kong*, S. Sarker, A. Mehta, Stanford Synchrotron Radiation Lightsource, USA
J. Scargle, National Aeronautics and Space Administration, USA
4:00    S-19    Interpreting Five Dimensional X-ray Images with Machine Learning
J.M. Davis*, J. Schmidt, M. Huth, H. Soltau, PNDetector, Germany
R. Hartmann, L. Strüder, PNSensor, Germany
4:20    S-23  Deep Convolutional Neural Networks for Real-Time Coherent X-ray Diffraction Inversion
M. Cherukara*, Y. Nashed, R. Harder, Argonne National Laboratory, USA

              

Small Angle X-ray Scattering of Advanced Functional Materials
Chairs: J. Ilavsky, APS, ANL, USA, ilavsky@aps.anl.gov; J. Hammons, Lawrence Livermore National Laboratory, USA, hammons3@llnl.gov
1:30   D-88  Invited- Extracting New Kinds of Information from Scattering Data
K.G. Yager, Brookhaven National Laboratory, USA
2:00  D-57  Invited- USAXS/SAXS/WAXS as a Powerful In-Situ Approach to Understand Helium Bubble Kinetics in Metals; from Crystal Defects to Meso-Scale Bubble Growth
J. Hammons*, Y. Idell, S. Tumey, J. Jeffries, Lawrence Livermore National Laboratory, USA
2:30  D-50 Precise GISAXS Analysis for Advanced Nano-Devices
K. Omote*, Y. Ito, Rigaku Corporation, Japan
2:50     D-83  Intensity Enhancement of Transmission Small Angle X-ray Scattering For Nano-Structure Measurements
W.E Fu*, B.C. He, C.T. Liu, G. Chen, W.L. Wu, Industrial Technology Research Institute, Taiwan
3:10  Break  
3:40  D-95 Invited- From Membranes to Superconductors: Functional Mesostructured Materials Enabled by In-Situ and High-Throughput SAXS
P.A. Beaucage, National Institute of Standards and Technology, USA
4:10 D-15 Characterization of Crystal Size of Palladium Nanoparticles by XRD, SAXS, SP-ICP-MS and SEM
K. Walbrueck, S. Witzleben*, Bonn-Rhein-Sieg University of Applied Sciences, Germany
F. Kuellmer, K. Guenther, University Bonn, Germany
4:30 D-35   An In-situ USAXS Study of Microstructural Evolution in a Ni-Based Alloy
M.G. Frith*, J. Ilavsky, Argonne National Laboratory, USA
G. Muralidharan, Oak Ridge National Laboratory, USA
4:50 D-14 Extended Range Ultra Small-Angle X-ray, Small-Angle, and Wide-Angle Scattering for Materials Characterization at 9ID Beamline
J. Ilavsky*, I. Kuzmenko, M. Frith, APS/ANL, USA
F. Zhang, L. Levine, A.J. Allen, NIST, USA

              

Food Safety and Agriculture Applications
Chair: K. Russell, Bruker Nano Analytics Division, USA, kimberley.russell@bruker.com
2:00 F-30   Invited- Using Portable XRF to Facilitate Nutrient Management Planning
L.M. McDonald*, West Virginia University, USA
Y. Sapkota, Louisiana State University, USA
B.L. Drake, University of New Mexico, USA
2:30  F-58   Analysis of sodium in soils using portable X-ray Fluorescence (pXRF)
C. Brand, Portable XRF Services, Australia

2:50 
F-10   Portable XRF for Plant Material
M. Cameron*, Bruker Handheld, USA
C. Burand, D. Lempuhl, Colorado State University, USA
3:10  Break  
3:40 F-49 Invited- Predicting Crop Root Depth for Improved Nutrient and Water Acquisition and Carbon Sequestration using Handheld X-ray Fluorescence
M. Hanlon*, Penn State University, USA
J. Lynch, Penn State University, USA and University of Nottingham, UK
4:10  F-39 Quantifying Heavy Metals in Vegetables at Low Concentrations Using WD-XRF and ED-XRF
H. Byers*, L. McHenry, T. Grundl, University of Wisconsin Milwaukee, USA

       

Cultural Heritage - A joint session of DXC & ICXOM
Chairs: M. Schmeling, Loyola University Chicago, USA, Mschmel@luc.edu
K. Janssens, University of Antwerp, Belgium, koen.janssens@uantwerpen.be

ICXOM Abstracts:
1:00  I-100  Invited- Innovative Strategies for the use of in-situ and SR-based X-ray Techniques to Reveal Artistic Technology and Relight History
E. Pouyet*, H. Chopp, O. Cossairt, Q. Dai, A. Katsaggelos, M. Walton, Northwestern University, USA
1:30   I-37    Invited- Combining X-ray and Visual Hyperspectral Imaging for the Investigation of Painted Cultural Heritage Objects
M. Alfeld, TU Delft, The Netherlands
2:00 I-38  Simultaneous XRD-XRF Mapping of Daguerreotypes with the Color X-ray Camera
J.M. Davis*, J. Schmidt, M. Huth, H. Soltau , PNDetector, Germany
E. Vicenzi, Smithsonian Museum Conservation Institute, USA
R. Hartmann, L. Strüder, PNSensor, Germany
2:20   I-82 Invited- Vermeer's Discriminating use of Lead White Pigments in Girl with a Pearl Earring, as Revealed by Macroscopic XRPD
S. De Meyer, F. Vanmeert, R. Vertongen, G. Van der Snickt, K. Janssens*, University of Antwerp, Belgium
A. Vandivere, A. Van Loon, Mauritshuis Museum, The Netherlands
V. Gonzalez, Delft University of Technology, The Netherlands
K. Dooley, J. Delaney, National Gallery of Art, USA
2:50 Break  
DXC Abstracts:
3:10   S-27 Invited- Portable XRF for Anthropology Collections and Archaeologogy
L. Dussubieux, Field Museum, USA
3:40     S-36 Invited- Engaging the Non-Specialists in XRF: Reconsidering the Learning Process
L. Lee, Getty Conservation Institute, USA
4:10 S-10 Using X-ray Fluorescence Spectroscopy to verify the authenticity of a portrait attributed to Rembrandt
M. Loubser*, G. de Kamper, I. McGinn, University of Pretoria, South Africa
R. Tagle, Bruker Nano, Germany
4:30  S-29  X-ray Spectroscopies for Mesoamerican Green Stone Characterization: Challenges and Complementary Techniques
J.L. Ruvalcaba-Sil*, M. Manrique-Ortega, A. Mitrani, V. Aguilar-Melo, M.A. García-Bucio, E. Casanova-Gonzalez, Universidad Nacional Autonoma de Mexico, México
4:50    S-30 Analyses of Pigments from Japanese 17th Century Sugito Door Paintings             
T.G. Fawcett*, S. Gates-Rector, M. Rost, T.N. Blanton, ICDD, USA
C.I. Duffy, B.A. Price, P.A. Olley, Philadelphia Museum of Art, USA




THURSDAY MORNING SESSIONS    

New Developments in XRD/XRF Instrumentation - Part Two
(vendor/commercial presentations permitted)
Chairs: T. Fawcett, Emeritus, ICDD, USA, dxcfawcett@outlook.com; A. Drews, Ford Motor Company, USA; adrews@ford.com
9:00  D-20 Analysis of Martian Analogs Using Benchtop XRD and XRF
G. Schmidt, Thermo Fisher Scientific, USA
9:15 S-18 High Speed, Simultaneous XRD-XRF Mapping of Geological Specimens with the Color X-ray Camera
J.M. Davis*, J. Schmidt, M. Huth, H. Soltau, PNDetector, Germany
R. Hartmann, L. Strüder, PNSensor, Germany
 9:30    S-25  Liquid MetalJet X-ray Source for Diffraction and Scattering
A. Adibhatla*, Excillum, Inc., USA
J. Hallstedt, M. Otendal, U. Lundstrom, Excillum AB, Sweden
9:45 S-14  Compact AutoEdge X-ray System to Measure HED Target Areal Density to 1% Precision and Accuracy
H. Huang*, K. Sequoia, J. Walker, K. Boehm, K. Engelhorn, General Atomics, USA
10:00 Break  
10:30   S-8   Latest Generation of Silicon Drift Detectors and Readout Electronics
M. Fraczek*, F. Dams, R. Fojt, J. Knobloch, C. Luckey, N. Miyakawa, A. Pahlke, N. Willems, Ketek GmbH, Germany
10:45  S-20       
A Compact High Solid Angle Annular Silicon Drift Detector System for XRF and Synchrotron Applications
A. Liebel, R. Lackner, D. Steigenhöfer, A. Bechteler, M. Bornschlegl, A. Niculae, H. Soltau, PNDetector GmbH, Germany
11:00   S-21 Can A 44-Year-Old Idea Improve XRF Detection Limits Today?
R. Mott, XrayMaps.Com, USA
11:15    S-33 Newly Developed X-ray Optic: CBO-µ for Micro Beam XRD Applications
K. Saito, Rigaku Americas Corporation, USA
11:30     S-38   Total Pattern Analyses for Non-Crystalline Materials
T.G. Fawcett*, S. Rector-Gates, A.M. Gindhart, M. Rost, S.N. Kabekkodu, J.R. Blanton, T.N. Blanton, ICDD, USA

    

X-ray and Forensic Investigations
Chairs: C. Greenwood, Keele University, UK, c.e.greenwood@keele.ac.uk; K. Rogers, Halo X-ray Technologies, UK; k.d.rogers@cranfield.ac.uk

The following talks are invited:
9:00 S-5  Handheld XRD Methods for Forensic Applications
G. Hansford, University of Leicester, UK
9:30    S-24 High Speed Detection of Narcotics using Novel X-ray Diffraction Methods
K.D. Rogers*, D. Prokopiou, Cranfield University, UK
P. Evans, A. Dicken, Nottingham Trent University, UK
S. Godber, Halo X-ray Technologies Ltd, UK
10:00  S-34   New Insights into the Identification of Bone Fragments in Forensic Science
E.L. Arnold*, K.D. Rogers, Cranfield University, UK
C. Greenwood, University of Keele, UK

        

General XRD – Part One
Chair: C. Murray, IBM T.J. Watson Research Center, USA, conal@us.ibm.com
9:00 D-77  Structural Analysis of Ce Doped Ba(Zr0.8-xCex)Y0.2O3-δ (x: 0.8-0.1, BZCY) Nanoceramic Powder Series As Proton Conductive Anode for IT-PCFC Applications
K. Kucuk*, A. Siqueira, S. Aryal, C.U. Segre, Y. Xu, A.S. Hock,  Illinois Institute of Technology, USA
A.F. de Araújo Maia, Wroclaw University of Science and Technology, Poland
9:20   D-81  In Operando Multimodal X-ray Measurements of Coin Cell Batteries
J. Okasinski*, A. Chuang, Advanced Photon Source, USA
K. Yao, M. Fonseca Rodrigues, D. Abraham, Argonne National Laboratory, USA
9:40     D-29 Influence of Layer Charge on the Hydration Properties of Synthetic Smectites
D. Vinci*, University of Bari, Italy
B. Lanson, M. Lanson, V. Magnin, N. Findling, University of Grenoble Alpes, France
B. Dazas, E. Ferrage, University of Poitiers, France
10:00  Break  
10:30 D-52 Adaptable Web-based Virtual X-ray Powder Diffraction Laboratory for Education and Professional Training
Y. Cherner*, ATeL – Advanced Tools for e-Learning, USA
T. Blanton, International Centre for Diffraction Data, USA
10:50  D-64  Thermal Expansion and Phase Transformation Mechanism in the Lanthanide Di-titanate System
B. Hulbert*, S. McCormack, K. Tseng, W. Kriven, University of Illinois at Urbana Champaign, USA
11:10 D-70 X-ray Diffraction Analysis of PM2.5 and PM10 Aerosols
N.M. Hamdan, American University of Sharjah, United Arab Emirates
H. Alawadhi, University of Sharjah, United Arab Emirates
11:30  D-19  XRD and In-situ Synchrotron Radiation XRD Studies on the phase transition of the Oxidative Coupling of Methane Catalysts
H. Wang, SINOPEC Beijing Research Institute of Chemical Industry, China

 

Quantitative Analysis of XRF
Chair: L.L. Brehm, Dow Chemical Company, USA, LLbrehm@dow.com
8:30  F-59   Invited- Total Reflection Energy Dispersive X-ray Fluorescence for Analysis of Human Samples: From Cells to Tissues
A. Pejovic-Milic*, G. Mankovskii, Ryerson University, Canada
9:00 F-65  Invited- Actinide Characterization using Selective Optics and High Resolution X-ray Spectroscopy
K.G. McIntosh*, M.H. Carpenter, A.S. Hoover, E.R. Batista, K.E. Koehler, M.P. Caffrey, M.P. Wilkerson, P. Yang, S.A. Kozimor, G.L. Wagner, Z.K. Baker, M.P. Croce, M.W. Rabin, G.J. Havrilla, Los Alamos National Laboratory, USA
9:30  F-62  Invited- Matrix Correction Methods for XRF Analysis of Oils
K. Kawakyu, Rigaku Corporation, Japan
10:00 Break  
10:30   F-32  Method, Validation and Optimization Process to Exploit the In Vivo and Ex Vivo Energy Dispersive X-ray Fluorescence Detection Limit in Terms of Digital Signal Processing
D. Crawford*, A. Moslemi, A. Pejovic-Milic, J.L. Gräfe, Ryerson University, Canada
10:50   F-44  Evaluation of Uranium and Plutonium in Simulated Blood Extracted from Wounds by X-ray Fluorescence Analysis
Y. Izumoto*, K. Fukutsu, K. Takamura, H. Yoshii, National Institutes for Quantum and Radiological Science and Technology, Japan
Y. Oguri, Tokyo Institute of Technology, Japan
Y. Sakai, Toho University, Japan
11:10  F-56    M-BLANK: A Program for X-ray Fluorescence Data Analysis and Processing
A.M. Crawford*, G.N. George, I.J. Pickering, University of Saskatchewan, Canada
A. Deb, J.E. Penner-Hahn, University of Michigan, USA
11:30  F-5 Thickness Measurement of Common-element Multilayer
T. He, Bowman Analytic, Inc., USA
11:50    F-9   Kß/Ka Intensity Ratio and Total Vacancy Transfer Probability of Cu through Radioactive Decay of Zn
L.F.M. Anand*, Government First Grade College, India
D. Joseph, Bhabha Atomic Research Centre, India
S.B. Gudennavar, S.G. Bubbly, Christ University, India


THURSDAY AFTERNOON SESSIONS              

General XRD – Part Two

Chair: J. Okasinski, Advanced Photon Source, Argonne National Lab, USA, okasinski@anl.gov

2:00    D-54 Revealing 3D Microstructures using X-ray Scattering Tomography
J. Almer*, J. Okasinski, P. Kenesei, J.S. Park, Argonne National Laboratory, USA
S. Stock, Northwestern University, USA
2:20 D-6 Overview of Two-Dimensional X-ray Powder Diffraction
B. He, Bruker Nano, USA
2:40 D-37 Role of High-Resolution X-ray Diffraction in Calibrating Modern-Day Transmission Electron Microscopes
M. Sunder*, G. Lian, M. Ali, S. Boettcher, IBM Systems, USA
J. Bruley, IBM Research, USA
3:00 Break  

3:30
D-59 The State of High-Energy Diffraction Microscopy Instrument at the Advanced Photon Source – Past, Present and Future
J. Almer, P. Kenesei, J.S. Park, H. Sharma*, APS/Argonne National Laboratory, USA
3:50               D-55 Optical Aberrations from Johansson-type Incident Beam Monochromators on Bragg-Brentano Powder Diffractometers
M. Mendenhall*, J. Cline, National Institute of Standards and Technology, USA
4:10  D-56 Grazing Incidence Diffraction with Single Crystal Diffractometer
A. Vailionis, Stanford University, USA
4:30  D-7 Detection of Low Energy X-rays with High Efficiency and Spectral Resolution
L. Strüder*, PNSensor GmbH and University of Siegen, Germany
S. Aschauer, R. Hartmann, PNSensor GmbH, Germany
H. Soltau, A. Nuculae, J. Davis, PNDetector GmbH, Germany

    

Rietveld
Chair: K.H. Stone, SLAC, SSRL, USA, khstone@slac.stanford.edu
2:00 D-31 Invited- Can We Trust Structures from Powder Diffraction Data?
P. Stephens, Stony Brook University, USA
2:30 D-25  Model-Free Whole-Powder-Pattern Fitting for Quantitative Phase Analysis: A Practical Approach to the Direct Derivation (DD) Method
H. Toraya, Rigaku Corporation, Japan
2:50 D-53   Synthesis and Characterization of Nano-Sized ZSM-5 Zeolite
R. Abdullah Al-Ghamdi*, H. Sitepu, L. Ding, Saudi Aramco, Saudi Arabia
3:10 Break  
3:40  D-61 Rietveld Phase Analysis of Deposits Formed at Different Locations within Electri¬c Submersible Pumps
H. Sitepu*, R. Abdullah Al-Ghamdi, Saudi Aramco, Saudi Arabia
4:00   D-78 X-ray Characterization of Copper Integration into Cu2xHg2-xGeTe4 for Thermoelectric Applications
B. Levy-Wendt*, Stanford University, USA
B.R. Ortiz, E.S. Toberer, Colorado School of Mines, USA
D. Passarello, K.H. Stone, M.F. Toney, SLAC National Accelerator Laboratory, USA
S.H. Lapidus, Argonne National Laboratory, USA
4:20 D-93   Unravelling the Multivalent Charge-Storage Mechanism of NASICON Na3V2(PO4)3 for Rechargeable Zn-ion Batteries
J.S. Ko*, P. Paul, J.N. Weker, SLAC National Accelerator Laboratory, USA
N. Seitzman, Colorado School of Mines, USA
R. DeBlock, B. Dunn, University of California, USA

         

General XRF
Chair: C.G.  Worley, LANL, USA, cworley@lanl.gov
1:30   F-13 Invited- The Critical Role Portable XRF Played in the Discovery and Delineation of the Rarest Economic Mineral Deposit on Earth - Pollucite at Sinclair, Western Australia
N. Brand*, Geochemical Services Pty Ltd, Australia
C. Brand, Portable XRF Services Pty Ltd, Australia
D. Crook, Pioneer Resources Limited, Australia
2:00 F-64 Invited- Environmental XRF and PIXE Applications with Public Health Implications
G. Peaslee*, M. Tighe, H. Beidinger, M. Sisk, M. Lieberman, University Of Notre Dame, USA
2:30 F-29 Flux Comparisons between Types of X-ray Anodes for HHXRF: Transmission and Reflection Anodes
S. Cornaby*, D. Paas, R. Zimmerman, Moxtek, Inc., USA
2:50 F-33 In situ X-ray Absorption Spectroscopy of Li Rich Mn-Ni-Fe Oxide Cathode
S. Aryal*, Argonne National Laboratory and Illinois Institute of Technology, USA
E. Timofeeva, C. Segre, Illinois Institute of Technology, USA
3:10  Break  
3:40   F-40 In Situ EXAFS Study of Tin Sulfide/Graphite Composite Anodes for Lithium-Ion Batteries
Y. Ding*, E. V. Timofeeva, C. U. Segre, Illinois Institute of Technology, USA
4:00 F-48 Practical Guidelines for Distinguishing Minerals with X-ray Scattering    
L.P. O'Neil*, D.C. Catling, W.T. Elam, University of Washington, USA
4:20   F-41 Characterization and Signal Readout from the New Linear Silicon Drift Detector for Soft X-ray Studies
A. Patel*, H.S. Mazumdar, S. Vadawale, Physical Research Laboratory, India

               

Trace Analysis including TXRF
Chair: D. Eichert, Elettra-Sincrotrone Trieste, Italy, diane.eichert@elettra.eu
2:00 F-24  Invited- Trace Analysis: Quantification Problems in 1, 2 or 3 Dimensions
M. Krämer*, R. Dietsch, T. Holz, D. Rogler, D. Weißbach, AXO DRESDEN GmbH, Germany
B. Beckhoff, P. Hönicke, C. Streeck, R. Unterumsberger, Physikalisch-Technische Bundesanstalt (PTB), Germany
U. Fittschen, Technische Universität Clausthal, Germany
A. von Bohlen, Leibniz-Institut für Analyt. Wissenschaften - ISAS - e.V, Germany
2:30 F-45 Invited- Nanoscopic Quantitative X-ray Fluorescence Imaging of Cells with a High Energy X-ray Cryo Nano-probe
S. Bohic*, European Synchrotron Radiation Facility and Université Grenoble Alpes, France
A. Pacureanu, Y. Yang, M. Salomé, J.C. Da Silva, F. Villard, L. Andre, P. Van Der Linden, P. Cloetens, European Synchrotron Radiation Facility, France
3:00 F-53 Studies of Nickel Uptake by Plants Using X-ray Fluorescence Microscopy
O. Antipova*, Q. Jin, Argonne National Laboratory, USA
O. Ponomarenko, University of Saskatoon, Canada
E. Horan, Lemont High School, USA
3:20 Break  
3:50 F-61 Invited- Reliable TXRF Quantification and Standardization Ventures
B. Beckhoff, Physikalisch-Technische Bundesanstalt (PTB), Germany
4:20 F-46 Analysis of Wine Vinegars by TXRF
M. Schmeling*, B. Folga, Loyola University Chicago, USA
4:40 F-20 TXRF Analysis using Carbon Coated Glass Substrate in Comparison with Conventional Sample Preparation
T. Matsuyama*, K. Tsuji, Osaka City University, Japan
H. Yoshii, National Institutes for Quantum and Radiological Science and Technology, Japan
 


FRIDAY MORNING SESSIONS   
          

Applied and Functional Materials
Chairs: I.C. Noyan, Columbia University, USA, icn2@columbia.edu; J.R. Bunn, ORNL, USA, bunnjr@ornl.gov
8:30  D-84 Invited- Microstructural and Micromechanical Insights into Shape Memory Alloys from in situ Neutron Diffraction Experiments at Stress and Temperature
R. Vaidyanathan, University of Central Florida, USA
9:00 D-2 XRD of natural and artificial Pozzolanes - Industrial Residues and Natural Supplementary Cementitious Materials
H. Poellmann*, S. Galluccio, University of Halle, Germany
9:20 D-5   Morphological, Structural, and Chemical Properties of Thermally Stable Ni-Nb2O5 for Catalytic Applications
D. Barrett*, University of the Witwatersrand/LNLS, South Africa
G. Leal, C. Rodella Brazilian Synchrotron Light Laboratory (LNLS), Brazil,
E. Teixeira-Neto, Brazilian Nanotechnology National Laboratory (LNNano), Brazil
9:40 Break  
10:00   D-16  Synthesis and Characterization of Bone Replacement Materials by XRD, µ-CT and SEM
D. Buechner, E. Tobiasch, M. Schulze, S. Witzleben*, Bonn-Rhine-Sieg University of Applied Sciences, Germany
W. Goetz, University of Bonn, Germany
10:20   D-74   Application of Whole Powder Pattern Modeling to Understand Microstructural Properties Evolution of PuO2 as a Function of Process Conditions
L. Sweet, J. Corbey, Pacific Northwest National Laboratory, United States
M. Leoni, University of Trento, Italy
10:40 D-82  The Role of Local Structure in the Optical Properties of Hexagonal YMn1-xGaxO3 and Isostructural Compounds
H. Sun, Illinois Institute of Technology, USA
S. Mukherjee, Uppsala University, Sweden
C. Segre, Illinois Institute of Technology, USA

           

Stress/Texture/In-Situ
Chair: T.R. Watkins, ORNL, USA, watkinstr@ornl.gov
8:30 D-58  Invited- In-situ 3D Strain Mapping in Engineering Materials with X-ray Computed Tomography
E. Cakmak*, M. Gussev, S. Venkatakrishnan, T. Watkins, Oak Ridge National Laboratory, USA
9:00 D-76   Elucidating the Crystallographic Microstructure of Human Tooth Enamel with Sub-micron Resolved Synchrotron X-ray Diffraction
R.F. Free*, K.D. DeRocher, D. Joester, S.R. Stock, Northwestern University, USA
R. Xu, Argonne National Lab/APS, USA
9:20 D-86 Systematic Errors in Phase Fraction Measurements Due to Crystallographic Texture
A. Creuziger*, C. Calhoun, T. Gnaupel-Herold, National Institute of Standards and Technology, USA
W. Poling, NIST and General Motors Research & Development, USA
9:40 D-63  In-Situ Diagram Determination of the HfO2-Ta2O5 Binary Up to 3000 °C
S.J. McCormack*, K.P. Tseng, W.M. Kriven, University of Illinois at Urbana Champaign, USA
R. Weber, Materials Development, USA
S.V. Ushakov, D. Kapush, A. Navrotsky, University of California Davis, USA
10:00 Break  
10:20 D-90  Invited- Deformation and Fracture Behavior during In-Situ Tensile Loading of a Laser Powder Bed Fusion Processed 316L Stainless Steel Alloy
H. Choo*, L. White, M. Koehler, University of Tennessee, USA
X. Xiao, Y. Ren, Argonne National Laboratory, USA
D. Morin, E. Garlea, CNS/Y-12 National Security Complex, USA
10:50     D-79  In-situ Characterization of Laser Additive Manufacturing Process by High-Speed, High-Energy X-ray Diffraction
A. Chuang*, T. Sun, P. Kenesei, N. Parab, C. Zhao, J.S. Park, J. Almer, Argonne National Laboratory, USA
11:10 D-10  Thermal Stresses in Two - Phase Systems
M.H. Seren*, I. C. Noyan, Columbia University, USA
T.R. Watkins, E. Çakmak, Oak Ridge National Laboratory, USA
11:30 D-89  Use of a Be-dome Holder for Texture and Strain Characterization of Li Metal Thin Films via Tilt-a-Whirl Methodology
M.A. Rodriguez*, K.L. Harrison, B. Perdue, J.J.M. Griego, S. Goriparti, B. Boyce, Sandia National Laboratory, USA
11:50 D-17 Effect of Nucleating Agents on Crystalline Orientation and Warpage of Injection-molded Polypropylene
M. Ren*, J. Yin, X. Liu, Y. Tang, M. Guo, T. Zhang, Sinopec Beijing Research Institute of Chemical Industry, China

 

Pair Distribution Function
Chairs: O. Borkiewicz, K. Wiaderek, APS, ANL, USA, borkiewicz@aps.anl.gov; kwiaderek@aps.anl.gov
     
8:30             
D-47  Invited- 3D-Printed Devices for In Situ X-ray Pair Distribution Function Experiments
F.M. Michel*, A. Hoeher, A. Namayandeh, Virginia Tech, USA
B. Raimbault, École Normale Supérieure, France
O. Borkiewicz, APS/Argonne National Laboratory, USA
9:00   D-87  Invited- Pair Distribution Function Analyses of Ultrathin-Films and Molecular Catalysts at Electrode and Functional Interfaces
D. Tiede*, A. Martinson, K. Mulfort, Argonne National Laboratory, USA
G. Kwon, Brookhaven National Laboratory, USA
9:30  D-92 Chemical Short-Range Order in Hollandite Type Phases for Nuclear Waste Form Applications
R. Koch, S.T. Misture*, Alfred University, USA
J. Amoroso, Savannah River National Laboratory, USA
K. Brinkman, M. Zhou, Clemson University, USA
9:50 Break  
10:10  D-94 Invited- High-rate Operando X-ray Studies of Lithium-ion Battery Materials
K.J. Griffith*, Northwestern University, USA and University of Cambridge, UK
K.M. Wiaderek, Advanced Photon Source, USA
G. Cibin, Diamond Light Source, UK
L.E. Marbella, C.P. Grey, University of Cambridge, UK
10:40 D-46 Use of Pattern Correction Algorithm to Remove the Effect of Axial Divergence in Atomic Pair Distribution Function (PDF) Analysis
D. Beckers*, M. Gateshki, Malvern Panalytical B.V., The Netherlands
V.A. Kogan, Dannalab, The Netherlands

             

Industrial Applications of XRF
Chair: D. Broton, CTLGroup, USA, dbroton@ctlgroup.com
8:30     F-38   Invited- How to Use and How Not to Use Certified Reference Materials in Industrial Chemical Metrology Laboratories
J.R. Sieber, National Institute of Standards and Technology, USA
9:00 F-26  Examining Spatial Distributions of Elemental Impurities in Uranium Certified Reference Material 124 (CRM 124) Using Micro-X-ray Fluorescence
C. Worley*, S. Pacheco, Los Alamos National Laboratory, USA
9:20 F-17 A Methodology to Obtain Traceability for Standards for the Mass per Unit Area of Thin Metal Alloy Layers for X-ray Fluorescence Tools
A. Nutsch*, A. Sehorz, M. Schwarzenberger, Helmut Fischer, Germany
M. Krämer, AXO DRESDEN GmbH, Germany
C. Streeck, B. Beckhoff, Physikalisch-Technische Bundesanstalt, Germany
H. Merz, Forschungsinstitut Edelmetalle & Metallchemie, Germany
S. Recknagel, Bundesanstalt für Materialforschung und -prüfung, Germany
9:40 Break  
10:00 F-7 Source of Errors in Sample Preparation for XRF Analysis
F. Davidts, XRF Scientific, Belgium
10:20 F-36   Novel Approaches to quantifying light elements in complex matrices using benchtop Energy Dispersive X-Ray Fluorescence (EDXRF)
P. Dutta, C. McAlpin, Dow Chemical Company, USA
10:40 F-18 A novel method for conducting X-ray fluorescence experiments
B. Ganly*
, CSIRO, Australia
M. Kirkpatrick, University of Wollongong, Australia
S. Armstrong, University of New South Wales, Australia
11:00 F-4  Iteration Convergence of XRF Thickness Measurement Using Coating Substrate as Internal Standard
T. He*, Bowman Analytic, Inc., USA 

 

 

Presentations may be moved among oral sessions, or to a poster session, at the discretion of the Organizing Committee.  Every attempt will be made to contact the submitting author if this is necessary.

The Organizing Committee considers the withdrawal of an abstract after it has been accepted and advertised as highly nonprofessional (except in special circumstances). Please try to secure travel funding and approvals before submitting an abstract.

 

 Abstracts are hereby solicited for oral presentations in any of the sessions listed, or the XRD, XRF or ICXOM-25 poster sessions. Poster sessions will be held on Monday (XRD) and Tuesday (XRF/ICXOM-25) evening of conference week.

SUBMIT ABSTRACT


        

DXC in Chicago