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2019 DXC Preliminary Program

The Westin Lombard Yorktown Center, Lombard, Illinois, USA, 5 – 9 August 2019
Workshop Organizers & Instructors, Session Chairs and Invited Speakers to be announced.

DXC WORKSHOP Topics

Special Topics in X-ray Analysis

XRD

XRF

Imaging & Microscopy

Combined  XRD & XRF (EDS) Applications

Sample Preparation and Experimental Conditions for XRF and XRD

Basic to Intermediate XRD

Rietveld – Full Day

SAXS Data Reduction and Analysis of Specific Types of Samples – Full Day

Micro Strain Mapping

Basic XRF

Quantitative Analysis of XRF – Full Day

Micro and Energy Dispersive XRF

Trace XRF

Handheld XRF

                                                                                                                     


DXC & ICXOM SESSION Topics

       

Plenary Session: Multi-modal Imaging

 
       

Special Topics in X-ray Analysis

XRD

XRF

ICXOM

New Developments in XRD & XRF Instrumentation – vendor/commercial session

Imaging & Microscopy

Education in X-ray Analysis

X-ray and Forensic Investigations

Machine Learning Techniques in X-ray Analysis 

 

General XRD

Rietveld

Stress/Texture/In Situ

Pair Distribution Function

Applied and Functional Materials

SAXS

 

General XRF

Industrial Apps of XRF

Cultural Heritage

Quantitative Analysis of XRF

Trace Analysis including TXRF

Agriculture

X-ray Optics

New Detectors

SR Nanoprobes

Data Analysis

Application: Bio

Application: Environmental

Application: Cultural Heritage

Application: Materials

 


        

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