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2020 DXC Program Quick View

 


Bethesda North Marriott Hotel and Conference Center, Maryland, USA, 3 – 7 August 2020


Monday and Tuesday Workshops

Special Topics in X-ray Analysis

XRD

XRF

Thin Films
(Zaitz/Sunder)

X-ray Optics
(Gao)

SAS
(Organizer pending)

Polymers
(Murthy/Landes)

Machine Learning Techniques in X-ray Analysis
(Mehta/Cherukara)

Two-dimensional Detectors
(Blanton/He)

XRD Sample Preparation
(Fawcett/Rodriguez/Quick)

Stress Analysis
(Watkins)

Understanding your Diffractometer – Tips and Tricks
(Blanton/Watkins)

 

 

XRF Sample Prep
(Anzelmo)

Basic XRF
(Anzelmo)

Quantitative Analysis of XRF I & II
(Elam/Vrebos)

Trace Analysis
(Wobrauschek)

Micro XRF
(Zaitz/Tsuji)

Handheld XRF
(Seyfarth)

 

Wednesday am Plenary Session: Secrets of the Smithsonian (Blanton)

 


Wednesday pm, Thursday and Friday am Special Sessions

Special Topics in X-ray Analysis

XRD

XRF

New Developments in XRD & XRF Instrumentation –commercial presentations permitted
(Fawcett/Drews)

Cultural Heritage
(Schmeling)

SAS
(Chair pending)

Polymers
(Murthy/Landes)

Machine Learning Techniques in X-ray Analysis
(Mehta)

Imaging
(Cakmak)

X-ray Absorption Spectroscopy (XAS)
(Seshadri)

General XRD
(Murray)

Ceramics
(Misture)

Neutron Diffraction
(Payzant/Wu)

Rietveld
(Degen)

Materials for Sustainability and Energy Applications
(Wong-ng)

Industrial Applications of XRD
(Broton)

Stress Analysis
(Watkins)

General XRF
(Worley)

Trace Analysis
(Wobrauschek)

Food, Environment
(Russell)

Quantitative Analysis
(Brehm)

Industrial Applications of XRF
(Broton)

Advanced Fundamental Parameters
(Szabo-Foster)

 

 


        

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