47th Annual  (1998) Denver X-ray Conference™
Antlers Doubletree Hotel
Colorado Springs, CO

August 3-7, 1998


47th Annual Denver X-ray Conference™
1998 Denver X-ray Conference™ Program Information

Summary Report
Exhibitor Information
Evening Technical Sessions and Social Functions
Hotel Layout


General Information:

ICDD Meetings:
ICDD Subcommittee and Task Group meetings will take place during conference week. Please stop at the ICDD Meeting Desk near The Carson Room for meeting schedules and information.

Employment Clearinghouse:
We will have a separate bulletin board for this purpose. Prospective employers and employees should bring announcements with them for posting.

Book of Abstracts:
Available at the conference registration desk.


1998 Denver X-ray Conference™ Report
August 3-7, 1998
Colorado Springs, CO

Characterized by its traditional friendly atmosphere, the 1998 Denver X-ray Conference™ took place August 3-7 at the Antlers Doubletree Hotel, Colorado Springs, Colorado. The conference hosted 389 registered attendees and 275 exhibitors who represented 39 companies. Fifty-three exhibit booths, where vendors displayed products and services relating to X-ray powder diffraction and X-ray fluorescence spectrometry, were available to attendees.


The technical program offered two days of tutorial workshops, followed by three days of special, contributed, and poster sessions on a variety of topics. The workshops included:




W-1 Specimen Prep. I: Methods in XRD & XRF
W-2 The Design, Alignment, Calibration & Performance Characteristics of the Conventional Laboratory Diffractometer
W-3 XRF Standards
W-4 Specimen Prep. II: Methods in XRD & XRF
W-5 Use of Total Pattern Fitting for Quantitative Phase Analysis

W-6 Reflectometry for Surface & Thin-Film Characterization-

W-7 Working Close to Detection Limits: XRF
Sieber/Holynska/Currie/Van Grieken
W-8 Principles & Use of Microdiffraction & Microfluorescence I
W-9 Conclusions from the Intensity Round Robin: XRD
W-10 Applications of TXRF
W-11 Principles & Use of Microdiffraction & Microfluorescence II
W-12 Diffractometer Optics

W-13 High Temperature XRD

W-14 Quantitative Techniques & Errors in XRF

The plenary session, "XRD/XRF — Now What?" , began this year’s technical sessions. Chaired by Bob Snyder, The Ohio State University, and Mary Ann Zaitz, IBM, the plenary session included the following invited presentations:

  • X-ray Optics — E. Spiller, Spiller X-ray Optics, Mt. Kisco, NY
  • Microcalorimeter EDS with 3 eV Energy Resolution — J. Martinis, D.A. Wollman, K.D. Irwin, G.C. Hilton, L.L. Dulcie and N.F. Bergren, National Institute of Standards and Technology, Boulder, CO
  • XRF Detection Limits: How Low Can We Go? — G. Havrilla, Los Alamos National Lab., Los Alamos, NM
  • Synchrotron Applications of Powder Diffraction and X-ray Absorption Spectroscopy, R. Harlow, (representing the Braggnet Group) The DuPont Company, Wilmington, DE

Other technical sessions included:




C-1 Synchrotron Applications of XRD & XRF

C-2 Developments in Detectors for X-ray Analysis

D-1 Residual Stresses

D-2 Diffraction Applications

F-1 Application of XRF to the Analysis of Thin Films
C-3 Recent Advances in X-ray Optics 1

C-4 Recent Developments in Instrumentation & Data Treatment I

D-3 Thin Films I: Orientation, Stress, Thickness

D-4 Innovative Applications of Rietveld Analysis

F-2 Practical Problems in XRF 1
C-5 Recent Advances in X-ray Optics II

C-6 Recent Developments in Instrumentation & Data Treatment II

D-5 Thin Films II: Orientation, Stress Thickness

D-6 Impact of Rietveld Analysis & Use of Calculated Patterns in Quantitative Phase Analysis

F-3 Practical Problems in XRF II
C-7 Micro XRF/XRD
D-7 Materials Process Characterization by Diffraction
F-4 Environmental Applications of XRF

Three poster award winners were selected for XRF and XRD (respectively):

XRF: High Resolution X-ray Detectors based on Al/AlxOy/Al Tunnel Junctions and Superconducting Ir/Au Phase Transition Thermometers — J. Höhne, M. Altmann, G. Angloher, P. Hettl, J. Jochum, T. Nüßle, S. Pfnür, M.L. Sarsa, J. Schnagl, S. Wänninger and F.v. Feilitzsch, Technical University Munich, Germany

XRF: CHEMIN: A Miniaturized CCD-Based Instrument for Simultaneous X-ray Diffraction (XRD) and X-ray Fluorescence (XRF) Analysis — D.L. Bish, D.T. Vaniman, S.J. Chipera, Los Alamos National Laboratory, Los Alamos, NM, S.A. Collins, T. Elliott, Jet Propulsion Lab, Pasadena, CA and D.F. Blake, NASA Ames Research Center, Moffett Field, CA

XRF: XEFS and EXEFS — J. Kawai and K. Hayashi, Kyoto University, Japan

XRD: Residual Stress Measurement of Diamond Thin Film — H. Hirose, The Ohio State University, Columbus, OH and T. Sasaki, Kanazawa University, Japan

XRD: Ab Initio Synchrotron Powder Structures of Metal Phosphonates A. Cabeza, M.A.G. Aranda and S. Bruque, Universidad de Málaga, Spain

XRD: An XRD Morphology Index for Talcs — H.J. Holland and M.J. Murtagh, Corning Incorporated, Corning, NY

Honorable Mention:

XRD: Quantitative XRD Analysis of Coal Combustion By-products by the Rietveld MethodS. Lerach, M.

Wisdom, D.G. Grier, R. Winburn and G.J. McCarthy, North Dakota State University, Fargo, ND


Presentation of awards preceded the plenary session. The 1998 Birks Award was presented to Dr. Horst Ebel of Technische Universität Wien, Austria, recognizing his excellence in the field of X-ray fluorescence spectrometry. Dr. Herbert Göbel of Siemens AG, Germany, received the J.D. Hanawalt Award for his important recent contribution to the field of X-ray powder diffraction. Dr. Göbel also presented a lecture on his recognized work entitled "High Temperature Studies with Oven Cameras" at the conference.

Gobel  Snyder

T. Maguire Snyder and Jenkins



Social activities included several evening mixers sponsored by various vendors. On Sunday, Bede Scientific, Claisse Scientifique, and SPEX CertiPrep sponsored the welcoming reception. Monday’s social was sponsored by Bruker AXS, which was held in conjunction with the XRF Poster Session. The XRD Poster Session, held on Tuesday, was held in conjunction with a reception given by Rigaku/USA and MDI. ICDD sponsored some refreshments, following its Technical Committee Meeting, on Wednesday evening.

The social activities culminated with the conference dinner on Thursday evening, where attendees were entertained by humorous travel, laboratory, or conference stories presented by volunteer victims.


A meeting of the Denver X-ray Conference™ Organizing Committee took place at the conference, where the step was taken to form a new society dedicated to the use of ionizing radiations for materials analysis. The society will be known as the International X-ray Analysis Society (IXAS). The eleven members of the Organizing Committee have formed the basis of the steering committee and about thirteen non-US members are being solicited to join the committee. Ron Jenkins will chair the Steering Committee and Greg McCarthy from North Dakota State University will serve as secretary/treasurer. It is anticipated that after a period of two years, the IXAS will hold their own elections to ensure the ongoing viability of the IXAS.


ICDD held its task group, subcommittee, and technical committee meetings during the week, in conjunction with the conference.


Exhibitor Information

Exhibitor booths were located in the Heritage Ballroom.

Exhibit Hours:
Monday 10:00 a.m. to 5:00 p.m.
Tuesday 10:00 a.m. to 5:00 p.m.
Wednesday 10:00 a.m. to 5:00 p.m.
Thursday 10:00 a.m. to 2:00 p.m.


Accurel-Mag  LND, Inc.
Advanced Ceramics Corp.  Materials Data, Inc. (MDI) 
AMIA Laboratories  Moxtek, Inc.
AMPTEK, Inc.  Newport Corporation 
Angstrom, Inc. Osmic, Inc. 
ARL Oxford Instruments, Inc. 
Bede Scientific, Inc. Philips Analytical
Blake Industries Polycrystal Book Service
Bruker AXS, Inc.
(formerly known as Siemens Analytical X-ray Systems, Inc.)
Precious Metals Engineering
Rigaku/USA, Inc
Chemplex Industries, Inc.  Scintag, Inc.
Del Global Power Conversion Products Seifert X-ray Corporation
Diffraction Technology PTY LTD Sigma Chemicals 
EDAX Inc Spectrace Inst. 
International Centre for Diffraction Data (ICDD) Spectro Analytical Instruments 
INEL  SPEX CertiPrep
Jordan Valley AR, Inc.  John Wiley and Sons, Inc.
Kevex Instruments, Inc.  VHG Labs, Inc. 
Kratos Analytical X-ray Instrumentation Association
K-TEK International, Inc.  X-ray Optical Systems, Inc


Evening Technical Sessions and Social Functions
Spouses were welcome to attend all social functions
All Evening Mixers and Poster Sessions were held in the Summit Ballroom  

Sun., August 2 5:30 – 7:30 Welcoming Reception
Sponsored by Bede Scientific, SPEX CertiPrep and Claisse Scientifique

Mon., August 3 6:30 – 8:30 Bruker AXS, Inc. Reception & XRF Poster Session
Sponsored by Bruker AXS, Inc.

Tues., August 4 6:30 – 8:30 MDI and Rigaku/USA Reception & XRD Poster Session
Sponsored by Materials Data, Inc. and Rigaku/USA

Wed., August 5 6:30 – 8:30 ICDD Technical Committee Meeting
All are invited to attend. Refreshments will be served.

Thurs., August 6 7:00 Conference  Dinner*
Tickets will be sold at the conference registration desk, located outside the Heritage Ballroom, until Wednesday at noon. Cost: $30 per ticket.

*Conference Dinner Entertainment:
Practitioners in the gentle art of X-ray analysis are known for their dedication, creativity and their ability to embroider a story or situation to unbelievable proportions. The organizing committee for the 1998 Denver X-ray Conference provided an after-dinner forum which allowed a panel of judges to evaluate genuine, tall and unlikely stories presented by volunteer victims. The stories involved the victim him/herself, and had some conference, laboratory or travel connotation. A prize was presented to the best story - a hotel escapade by Dr. Ron Jenkins!

Spouses’ Coffee Hour:

All spouses were invited to attend a complimentary coffee hour, sponsored by the Denver X-ray Conference. Coffee, tea and pastries were served in the Hayden Room at 9:30 to 10:30 a.m. on Monday through Thursday. Information on local attractions and activities of interest were provided.