47th Annual (1998) Denver X-ray Conference™ Friday Sessions Friday, 7 August,1998 am XRD & XRF - XRD - XRF XRD & XRF: Session, Friday a.m. (Summit III) Session C-7 Micro XRF/XRD Organized by: D. Carpenter, Martin Marietta Energy Systems, Inc., Oak Ridge, TN C. Goldsmith, IBM, Hopewell Junction, NY 8:10 F-65 Microanalysis by Means of X-ray Beams Generated in Laboratory and Synchrotron Sources – Invited K. Janssens, University of Antwerp (UIA), Belgium 8:40 F-29 Optimizing the Focal Spot Size and Elemental Sensitivity of a Monolithic Polycapillary Optic C.G. Worley, L.P. Colletti and G.J. Havrilla, Los Alamos National Laboratory, Los Alamos, NM 9:00 F-41 A Modified Approach to Homogeneity Testing at Microscale M. Mattiuzzi and A. Markowicz, IAEA Laboratories, Austria 9:20 F-33 XRF Mapping: New Tools for Distribution Analyses B. Scruggs, L. Herczeg, J. Nicolosi, EDAX Inc., Mahwah, NJ, and M. Haschke, Röntgenanalytik Messtechnik GmbH, Germany 9:40 F-45 Use of Kumakhov Lenses in MXRFA A.S. Scherbakov, S.V. Nikitina and N.S. Ibraimov, Institute for Roentgen Optics, Russia 10:00 Break 10:20 D-92 An Overview of Microbeam X-ray Diffraction Below 20 Microns – Invited B. York, IBM Materials Laboratory, San Jose, CA 10:50 D-67 Polychromatic Synchrotron X-ray Diffraction Quantification of Grain Subdivision Accompanying Large Deformations of Copper G.C. Butler, R. Morano, D.L. McDowell and S.R. Stock, Georgia Institute of Technology, Atlanta, GA 11:10 D-66 Mesotexture, Crack Deflection and Fatigue Crack Closure in Al-Li 2090 J.D. Haase and S.R. Stock, Georgia Institute of Technology, Atlanta, GA 11:30 D-58 Diffracted X-rays Mapping and Distribution of Grains in Aluminum Using a Scanning X-ray Analytical Microscope Y. Hosokawa, Horiba, Ltd., Japan, Y. Miyoshi, The University of Shiga Prefecture, Japan, D. Carpenter, Oak Ridge Centers for Manufacturing Tech., Oak Ridge, TN, H. Corry, Oxford Instruments UK, United Kingdom and P.R. Mainwaring, Oxford Instruments America, Inc., Concord, MA   XRD: Session, Friday a.m. (Freemont) Session D-7 Materials Process Characterization by Diffraction Organized by: C.R. Hubbard, Oak Ridge National Laboratories, Oak Ridge, TN S.T. Misture, New York State College of Ceramics at Alfred University, Alfred, NY 8:30 D-112 High-Temperature Studies with Oven Cameras – Hanawalt Award Lecture H.E. Göbel, Siemens AG, Germany 9:10 D-39 Phase Transformations in Ceramic Fast-Ion Conductors – Invited S.T. Misture, New York State College of Ceramics at Alfred University, Alfred, NY 9:35 D-107 Time Resolved Characterization of Crystallization and Phase Transformations by HTXRD – Invited E.A. Payzant, Oak Ridge National Laboratory, Oak Ridge, TN 10:00 Break 10:20 D-103 In Situ Texture Analysis and Process Control – Invited J.A. Szpunar and P. Blandford, McGill University, Canada 10:50 D-70 Non-ambient m-diffraction – Invited T. Wroblewski, HASYLAB, Germany 11:20 D-114 High Pressure and Temperature diffraction at ESRF – Invited D. Heusermann, ESRF, France   XRF: Session, Friday a.m. (Summit I) Session F-4 Environmental Applications of XRF Organized by: B. Holynska, University of Mining & Metallurgy, Poland J.V. Gilfrich, SFA, Inc./NRL, Washington, DC 8:30 F-63 Application of EDXRF Techniques in Aquatic Environment – Invited B. Holynska, University of Mining and Metallurgy, Poland 9:00 F-56 Applications of Synchrotron Radiation-Based XRF and Micro-XANES Spectroscopies to Environmental Problems P.M. Bertsch and D.B. Hunter, The University of Georgia, Aiken, SC 9:20 F-72 Use of XRF in an Ultra Clean Environment – Invited Y. Gohshi, National Institute for Environmental Studies, Japan 9:50 F-48 Development of an Automated Sampling and Measuring Device for Airbourne Particulate Matter Using an EDXRF C. Schäfer, Spectro Analytical Instruments, Germany, O. Haupt, R. Harmel and W. Dannecker, University of Hamburg, Germany 10:10 Break 10:30 F-5 Specimen Preparation for Analysis of Natural and Drinking Waters Y.N. Makarovska, L.P. Eksperiandova, A.B. Blank and I.I. Fokina, Institute for Single Crystals of National Acad. Sci., Ukraine 10:50 F-58 Application of Micro X-ray Fluorescence for Analysis of Trace Elements in Waste Water and Industrial Streams R. Nelson and D. Kloos, Veeco Instruments, Westminster, CA 11:10 F-7 Automated Monitoring of Stack Gas Emissions by EDXRF O. Haupt, R. Harmel, W. Dannecker, University of Hamburg, Germany, J.Heckel and C. Schäfer, Spectro Analytical Instruments, Germany 11:30 F-16 In-situ Environmental XRF W.T. Elam, Naval Research Laboratory, Washington, DC, J.W. Adams, US Army Engineer Waterways Experiment Station, Vicksburg, MS, K.R. Hudson, J.V. Gilfrich, SFA, Inc., Landover, MD and B.J. McDonald, University of Toledo, Toledo, OH 11:50 F-54 A Comprehensive Particulate Pollution Study in the Work-Zones of a Sponge Iron Plant Using XRF & XRD H.D. Pandey, C.D. Mishra and S.R. Mediratta, Steel Authority of India Limited, India