48th Annual (1999) Denver X-ray Conference™ 1999 Program at a Glance Meeting Rooms: SP = Sunshine Peak, BR = Buddy’s Run, TWI = Twilight, RB = Rainbow, SKY = Skyline, SUN = Sunset Sun. eve.: 5:30–7:30 Welcoming Reception Sponsored by: Bede Scientific, SPEX CertiPrep & Claisse Scientifique (SP) Day & Time XRD & XRF XRD XRF MON. am: Workshops W-1 Use of the Web as a Resource Kottenhahn/Faber (TWI) W-2 ISO 9000 and Standards—XRD Goldsmith (SP) W-3 How to Set Up an XRF Analytical Process Jenkins MON. pm: Workshops   W-4 Two-dimensional Detectors Blanton (BR) W-5 Quantitative XRF—Standardless Methods Anzelmo (SP) MON. eve.: 6:30–8:30 - Bruker AXS, Inc. Reception and XRF Poster Session (Chairs: Havrilla/Ebel) Sponsored by: Bruker AXS, Inc. (SP) TUE. am: Workshops W-6 Accuracy Through Optimum Calibration Jenkins/Snyder (SP) W-7 Public Domain Software Faber/Huang (RB) W-8 ISO 9000 and Standards—XRF Zaitz/Havrilla (BR) W-9 Surface Analysis Ebel/Ebel/Streli (TWI) TUE. pm: Workshops   W-10 Rietveld Analysis Young/Bish (BR) W-11 Polymer Data Analysis Murthy (TWI) W-12 Computational Method for XRF Lachance/Criss (RB) W-13 Specimen Preparation—XRF Buhrke et al (SP) TUE. eve.: 6:30–8:30 - MDI and Rigaku/USA Reception and XRD Poster Session (Chairs: Predecki/Snyder) Sponsored by: MDI & Rigaku/USA (SP) WED. am.: 8:30–12:00 noon - Plenary Session: "X-rays in Space" Barton/Buhrke (Upper Gondola Terminal) WED. pm: Sessions C-1 Grazing Beam X-ray Analysis Snyder/Huang (BR) C-2 Topography & Absorption Analysis Stock/Ebel (SKY) 1/4 day D-1 Applications of Diffraction to Pharmaceutical Analysis Rendle/Stephenson (SKY) 1/4 day D-2 Rietveld Applications I Bish/Smith (SP) D-3 Polymers I: Diffraction Studies of Industrial Polymer-Based Materials Platforms Schwartz/Blanton (RB) F-1 Applications of XRF to Industrial Problems Jenkins/Hagopian-Babikian (TWI)   THURS. am: Sessions C-3 Synchrotron Applications Jordan-Sweet/O’Connor (BR) D-4 Rietveld Applications II Misture/McCarthy (SP) D-5 Polymers II: In Situ Scattering/Diffraction Characterization of Polymers Hsiao/Barton (RB) D-6 Diffraction Stress Analysis I Noyan/Sasaki (SKY) F-2 Analysis of Thin Films by XRF Wilson/Havrilla (TWI) F-3 Mathematical Methods for XRF Mantler/Criss (SUN) THURS. pm: Sessions   D-7 High Resolution XRD Mooney/Kavanagh (SP) D-8 Polymers III: Characterization of Complex Mesostructures Using Small Angle Scattering Bunning/Vaia (RB) D-9 Diffraction Stress Analysis II Kämpfe/Hirose (BR) F-4 TXRF: Semiconductor Applications,Micro/Chemical Applications, Instrumentation/Thin Films Wobrauschek/Zaitz/Prange (TWI) THURS. eve.: 7:00 Conference Dinner (SP) FRI. am: Sessions C-4 Non-traditional Paradigms in Data Processing Noyan/Wern (TWI) C-5 X-ray Instrumentation & Other Applications Berti/Broton (SP)   F-5 Applications of XRF: Environmental Problems, Low Detection Limits Gohshi/Dando (BR) Any changes to be reflected in the Book of Abstracts.