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48th Annual (1999) Denver X-ray Conference™
Wednesday, 4 August Sessions including Plenary
p.m. Sessions: Buddy's Run | Skyline | Sunshine Peak | Rainbow | Twilight

Plenary Session - X-rays in Space
Upper Gondola Terminal (take gondola from outside hotel to upper gondola terminal)
Organized by: Victor E. Buhrke, The Buhrke Company, Portola Valley, CA
Randolph Barton, Jr., DuPont Experimental Station, Wilmington, DE
8:30 - 12:00 noon   -Welcoming Remarks – Ron Jenkins, Chairman, Denver X-ray Conference™ ICDD, Newtown Square, PA

-Presentation of Awards
1999 Barrett Award to Howard F. McMurdie, National Institute of Standards and Technology, Gaithersburg, MD
Presented by: Camden R. Hubbard, Oak Ridge National Laboratories, Oak Ridge, TN

-Plenary Session Remarks – Victor E. Buhrke, The Buhrke Company, Portola Valley, CA
Randolph Barton, Jr., DuPont Experimental Station, Wilmington, DE

The following are invited papers:
9:00 P-1 THE ORIGIN OF X-RAYS IN SPACE
H. Gursky, Naval Research Laboratory, Washington, DC
9:40 P-2 REMOTE X-RAY DIFFRACTION AND X-RAY FLUORESCENCE ANALYSIS ON PLANETARY SURFACES
D.F. Blake, NASA Ames Research Center, Moffett Field, CA
10:20 Break  
10:40 P-3 THE INTERNATIONAL SPACE STATION X-RAY CRYSTALLOGRAPHY FACILITY
L.J. DeLucas, University of Alabama–Birmingham, Birmingham, AL
11:20 P-4 RECENT PROGRESS IN HIGH-RESOLUTION X-RAY SPECTROSCOPY OF ASTROPHYSICAL SOURCES
S.M. Kahn, Columbia University, New York, NY
Afternoon Sessions

Session, Wednesday p.m. (Buddy’s Run)

XRD & XRF
Session C-1
GRAZING BEAM X-RAY ANALYSIS

Organized by: R.L. Snyder, The Ohio State University, Columbus, OH
T.C. Huang, Consultant/IBM, San Jose, CA
1:30   A NOVEL METHOD OF AUTOMATED FITTING OF X-RAY SCATTERING DATA — Invited
M. Wormington, Bede Scientific, Inc., Englewood, CO
2:00 D-004 X-RAY SCATTERING FROM Si SURFACES AND THIN OXIDES ON Si SUBSTRATES — Invited
R. Stömmer, Bruker AXS GmbH, Germany
2:30 F-52 ROLE OF UNCERTAINTIES AND SURFACE ROUGHNESS ON GRAZING INCIDENCE X-RAY PHOTOELECTRON SPECTROSCOPY
E. Landree, T. Jach, National Institute of Standards and Technology, Gaithersburg, MD
2:50 Break  
3:20 D-101 APPLICATION OF Ni/C GÖBEL MIRRORS AS PARALLEL BEAM X-RAY OPTICS FOR CuKa AND MoKa RADIATION
T. Holz, R. Dietsch, H. Mai, FhG-IWS, Germany
3:40 D-007 EVALUATION OF THE INTERFACE MORPHOLOGY IN Mo/Si SUPERLATTICES BY X-RAY SPECULAR AND DIFFUSE SCATTERING
A. Ulyanenkov, R. Matsuo, K. Omote, J. Harada, Rigaku Corporation, Japan
M. Ishino, M. Nishii, O. Yoda, Advanced Photon Research Center, Kansai Research Establishment, Japan
4:00 D-077 GRAZING INCIDENCE IN-PLANE DIFFRACTOMETER FOR ANALYZING SURFACES AND THIN-FILMS
K. Omote, K. Inaba, R. Matsuo, Rigaku Corporation, Japan
S.Y. Matsuno, Asahi Chemical Industry Co. LTD, Japan
4:20 D-076 X-RAY DIFFRACTION STUDIES OF MnAs FERROMAGNETIC THIN FILMS GROWN ON Si(111) SUBSTRATES
K. Inaba, J. Harada, K. Omote, Rigaku Corporation, Japan
A.G. Banshchikov, N.S. Sokolov, A.F. Ioffe Physical Technical Institute of RAS, Russia
 

Session, Wednesday p.m. (Skyline)

XRD & XRF
Session C-2
TOPOGRAPHY & ABSORPTION ANALYSIS — 1/4 day

Organized by: S.R. Stock, Georgia Institute of Technology, Atlanta, GA
M.F. Ebel, Technische Universität Wien, Austria
1:30 F-16 QUANTITATIVE ABSORPTIOMETRY BY TOTAL ELECTRON YIELD (TEY) — Invited
H. Ebel, Technische Universität Wien, Austria
2:00 D-110 X-RAY MICROBEAMS AND THREE-DIMENSIONAL MICROTEXTURE MAPPING — Invited
S.R. Stock, Georgia Institute of Technology, Atlanta, GA
2:30 D-075 TOPOGRAPHIC OBSERVATIONS OF POLYCRYSTALLINE ALUMINUM BY MEANS OF SCANNING WITH MICRO-XRD
Y. Hosokawa, Horiba, Ltd., Japan
Y. Miyoshi, The University of Shiga Pre., Japan
2:50 Break  
XRD:
Session D-1
APPLICATIONS OF DIFFRACTION TO PHARMACEUTICAL ANALYSIS — 1/4 day

Organized by: D.F. Rendle, The Metropolitan Police Forensic Science Lab, UK
G.A. Stephenson, Eli Lilly & Company, Indianapolis, IN
3:10 D-117 EXAMINATION OF PHASE TRANSFORMATIONS DURING FREEZE-DRYING USING LOW TEMPERATURE X-RAY POWDER DIFFRACTION — Invited
R.G. Suryanarayanan, University of Minnesota, Minneapolis, MN
3:40 D-132 X-RAY DIFFRACTION STUDIES OF ISOSTRUCTURAL PHARMACEUTICAL SYSTEMS — Invited
G.A. Stephenson, Eli Lilly & Company, Indianapolis, IN
4:10 D-131 APPLICATIONS OF SYNCHROTRON RADIATION TO PROBLEMS IN PHARMACEUTICAL SCIENCES — Invited
P.W. Stephens, State University of New York at Stony Brook, Stony Brook, NY
4:40 D-001 CRYSTAL AND MOLECULAR STRUCTURES OF C-NITRO HETEROCYCLES FROM LABORATORY POWDER DIFFRACTION DATA
V.V. Chernyshev, Moscow State University, Russia
A.N. Fitch, ESRF, France
E.J. Sonneveld, University of Amsterdam, The Netherlands
V.A. Makarov, State Scientific Center “NIOPIK”, Russia
 

Session, Wednesday p.m. (Sunshine Peak)

XRD:
Session D-2
RIETVELD APPLICATIONS I

Organized by: D.L. Bish, Los Alamos National Laboratory, Los Alamos, NM
D.K. Smith, Emeritus, The Pennsylvania State University, University Park, PA
2:00 D-104 APPLICATION OF RIETVELD REFINEMENT TO ENGINEERING STRAIN-RELATED PROBLEMS — Invited
M.A.M. Bourke, Los Alamos National Laboratory, Los Alamos, NM
2:30 D-092 AB INITIO STRUCTURE SOLUTION AS PART OF THE RIETVELD REFINE-MENT PROCESS
A. Kern, A. Coelho, Bruker AXS GmbH, Germany
P.J. LaPuma, Bruker AXS, Inc., Madison, WI
2:50 Break  
3:20 D-048 RIETVELD SIMULATIONS OF COMPLEX Y-PSZ MIXTURES
J.R. Verkouteren, J.M. Conny, National Institute of Standards and Technology, Gaithersburg, MD
3:40 D-033 CRYSTALLOGRAPHIC STUDIES OF THE SrR 2 CuO 5 SERIES (R=LAN-THANIDES) WITH RIETVELD REFINEMENTS
W. Wong-Ng, T. Haugan, National Institute of Standards and Technology, Gaithersburg, MD
J. Dillingham, University of Maryland, Gaithersburg, MD
R.A. Young, Georgia Institute of Technology, Atlanta, GA
4:00 D-014 EVOLUTION OF ATOMIC STRUCTURE IN SOME FERROELECTRIC COM-PLEX METAL OXIDES
S. Ivanov, Karpov’ Institute of Physical Chemistry, Russia
R. Tellgren, H. Rundlöf, Uppsala University, Sweden
S.-G. Eriksson, University of Gothenburg, Sweden
 

Session, Wednesday p.m. (Rainbow)

XRD:
Session D-3
POLYMERS I: DIFFRACTION STUDIES OF INDUSTRIAL POLYMER-BASED MATERIALS PLATFORMS

Organized by: K.B. Schwartz, Raychem Corporation, Menlo Park, CA
T.N. Blanton, Eastman Kodak Company, Rochester, NY
2:00 D-026 IN-SITU STUDIES OF POLYMER PROCESSING, CRYSTALLIZATION, AND DEFORMATION USING SYNCHROTRON RADIATION — Invited
B.G. Landes, R.A. Bubeck, G.H. Barnes, R.A. Newman, M.T. Bishop, C.F. Broomall, R.L. Scott, D.H. Parker, The Dow Chemical Company, Midland, MI
2:30 D-028 LINE PROFILE ANALYSIS OF POLYMERIC FIBERS
R. Barton, Jr., R.L. Harlow, DuPont Company — Central Research & Development, Wilmington, DE
2:50 D-025 THE INFLUENCE OF POLYETHYLENE AND CARBON BLACK MORPHOLOGY ON VOID FORMATION IN CONDUCTIVE COMPOSITE MATERIALS — A SANS STUDY
J. Oakey, D.W.M. Marr, Colorado School of Mines, Golden, CO
K.B. Schwartz, M. Wartenberg, Raychem Corporation, Menlo Park, CA
3:10 Break  
3:40 D-055 QUANTITATIVE POLE FIGURE ANALYSIS OF ORIENTED POLYETHYLENE FILMS — Invited
J.H. Butler, S.M. Wapp, F.H. Chambon, Exxon Chemical Company, Baytown, TX
4:10 D-122 MAGNETIC FIELD ALIGNMENT OF TRANSITION-METAL AND LANTHANIDE ION DOPED POLYMERIZABLE LIQUID CRYSTALS
E. Juang, D.L. Gin, J.A. Reimer, University of California, Berkeley, CA
K.B. Schwartz, Raychem Corporation, Menlo Park, CA
4:30 D-003 CHARACTERIZATION OF ORGANOCLAY/POLYMER NANOCOMPOSITE MORPHOLOGY BY X-RAY DIFFRACTION
M.W. Ellsworth, K.B. Schwartz, Raychem Corporation, Menlo Park, CA
 

Session, Wednesday p.m. (Twilight)

XRF:
Session F-1
APPLICATIONS OF XRF TO INDUSTRIAL PROBLEMS

Organized by: R. Jenkins, ICDD, Newtown Square, PA
S. Hagopian-Babikian, Lafarge Canada, Inc., Canada
1:30 F-58 THE HISTORICAL ROLE OF XRF IN THE SOLUTION OF INDUSTRIAL PROBLEMS — Invited
R. Jenkins, ICDD, Newtown Square, PA
2:00 F-41 BORATE FUSION OF FERRO-ALLOYS — FUNDAMENTAL PRINCIPLES
F. Claisse, Corporation Scientifique Claisse, Inc., Canada
2:20 F-51 XRF ANALYSIS OF CEMENT — ASTM C-114 QUALIFICATION
J. Anzelmo, A. Seyfarth, L. Arias, A. Larsen, Bruker AXS, Inc., Madison, WI
2:40 F-01 XRF IDENTIFICATION OF ALLOYS USING LOTUS APPROACH 97® DATABASE WITH ASM INTERNATIONAL® DATA
A.J. Klimasara, Osram Sylvania, Inc., Beverly, MA
3:00 Break  
3:30 F-20 CHARACTERIZATION OF DRUM VENT FILTER CORROSION WITH MXRF IMAGING
G.J. Havrilla, J. Bridgewater, K. Huchton, S. Chipera, S. Mecklenburg, J.
Schoonover, W. Connor, Los Alamos National Laboratory, Los Alamos, NM
3:50 F-06 ANALYSIS OF METAL ALLOYS BY EDXRF, ITS ACCURACY AND RELIABILITY
V.I. Smolniakov, I.A. Koltoun, Russian Academy of Sciences, Russia
4:10 F-05 EXPERIMENTAL INVESTIGATIONS OF POSSIBILITIES OF HIGH-ACCURACY ANALYSIS OF THE GOLD JEWELS
V.I. Smolniakov, I.A. Koltoun, Russian Academy of Sciences, Russia