The 2008 Denver X-ray Conference would like to thank the following sponsors:

Panalytical

Chemplex

Ge Inspection Technologies

Thermo

Thank you to our Media Sponsor:

Materials Today

Journal of X-Ray Science & Technology

Call for Papers:

call for papers

ANNOUNCING. ICRS-8 - The Eighth International Conference on Residual Stresses 6-8 August 2008 - Marriott Denver Tech Center Hotel - Denver, Colorado, U.S.A.

A joint meeting of the 57th Annual Denver X-ray Conference (DXC), and the 8th International Conference on Residual Stresses was held in Denver, Colorado from 4-8 August 2008. Held at the Denver Marriott Tech Center Hotel, the joint meeting attracted over 500 registered attendees and more than 200 exhibit personnel.

Conference week began with 17 tutorial workshops, held on Monday and Tuesday. Topics included:
DXC Workshops:
XRD & XRF: • Cultural Heritage I & II • Nanomaterials and their Applications
XRD: • Texture Analysis with Area Detectors • Introduction to Rietveld • Non-ambient XRD • Combined Use of X-rays & Neutrons • High-throughput X-rays
XRF: • Quantitative Analysis I & II • Basic XRF • Energy Dispersive XRF • Specimen Preparation I & II • Trace Analysis
ICRS Workshop: • Stress Analysis I & II

Thirty-eight special sessions filled the remaining two and one-half days of the conference. Topics included:
DXC Sessions:
XRD & XRF: • New Developments in XRD & XRF Instrumentation • Analysis of Nanomaterials • Cultural Heritage I & II
• Industrial Applications • X-ray Microimaging • Microbeam X-ray Analysis I & II
XRD: • Thin Films • High Temperature In-situ Analysis • Small Angle Scattering
XRF: • Fusion & Industrial Applications of XRF • Regulatory Applications • Trace Analysis • Quantitative Analysis
ICRS Sessions: • Fatigue & Fracture • Modeling I & II • Materials Engineering I & II • Other Measurement Techniques • Diffraction Techniques: Synchrotrons – Macrobeam and High Energy I & II; Laboratory Applications; Neutron – I & II; General Methods; Synchrotrons – Microbeam • Industrial Applications: Layers and Composites; Thermal Processing; Engineered Stresses; Welding; Distortion and Machining; Friction Stir Welding; Miscellaneous
• Relaxation Techniques: Hole Drilling; Slitting; Deep Hole and Contour.

The Plenary Session, Stress and Society, took place on Wednesday morning and was organized by I.C. Noyan, Columbia University, New York, NY; M. Prime, Los Alamos National Laboratory, Los Alamos, NM; E. Üstündag, Iowa State University, Ames, IA. The four invited talks that took place during the plenary session were:
• “Materials State Awareness: Dealing with Uncertainty in Design and Service”
R.B. Thompson, Iowa State University, Ames, IA
• “Dental Stress, Mechanical Not Psychological, Even Some Residual Stress”
M. Bagby, West Virginia University School of Dentistry, Morgantown, WV
• “Residual Stresses in U.S. Nuclear Power Systems”
A.A. Csontos, U.S. Nuclear Regulatory Commission, Washington, D.C.
• “More Miles for Tired Iron: The Application of Engineered Compressive Residual Stresses in Aging Aircraft”
M. Shepard, US Air Force Research Laboratory, WPAFB, OH

Awards were presented during the Plenary Session to honor a variety of significant contributions to the field of X-ray materials analysis. The 2008 Birks Award was presented to Rene Van Grieken, University of Antwerp, Antwerp, Belgium; the 2008 McMurdie Award was presented to Jeffrey Dann, OSRAM Sylvania, Towanda, PA and the 2008 Jerome B. Cohen Student Award was presented to Sterling Cornaby, Cornell University, Ithaca, NY.

birkscohenmcmurdie

(Click photo to see larger version)
Figure 1. Rene Van Grieken (left), University of Antwerp, Antwerp, Belgium, receives the 2008 Birks Award from Tim Elam (right), EDAX/University of Washington, Redmond, WA.
Figure 2. Sterling Cornaby (left), Cornell University, Ithaca, NY, receives the 2008 Cohen Award from Cev Noyan (right), Columbia University, New York, NY.
Figure 3. Jeffrey Dann (left), OSRAM Sylvania, Towanda, PA, receives the 2008 McMurdie Award from Thomas Blanton (right), Eastman Kodak Company, Rochester, NY

Poster sessions were held on Monday, Tuesday and Thursday of conference week. Judges were appointed each night to select the best posters. The following posters were selected as the best:
DXC Winners:
XRD:
• “X-ray Probe Analyses of Complicated Precipitates Formed in Copper-Base Alloys”
S. Sato, Y. Takahashi, T. Sanada,  NISSAN ARC, LTD., Kanagawa, Japan; K. Shinoda, K. Wagatsuma, S. Suzuki, Tohoku University, Miyagi, Japan
 • “Grazing-Incidence Diffraction Applied as a Crosscutting Tool in the Nanobio Regime”
B.D. Pate, X. Han,  The Dow Chemical Company, Midland, MI; D. Keane,  Northwestern University, Evanston, IL; S. Wargacki, R. Vaia, M. Durstock, Air Force Research Laboratoy; H-S. Kim, S-M. Choi, Korea Advanced Institute of Science and Technology
• “Characterizing X-ray Mirrors in Reciprocal Space: Preliminary Results from the NIST X-ray Optics Evaluation Double-crystal Diffractometer”
D.L. Gil, Coruscavi Software, Washington, DC; D. Windover,  A. Henins, J.P. Cline, NIST, Gaithersburg, MD
XRF:
• “Grazing-Exit-XRF Experiments at Hasylab Beamline L”
F. Meirer, C. Streli, P. Wobrauschek, N. Zoeger, Atominstitut, Tu Wien, Vienna, Austria; G. Pepponi,  Fondazione Bruno Kessler-irst, Povo, Italy
• “Development of Soil Standard Materials Containing Hazardous Metals for X-ray Fluorescence Analysis”
Y. Shibata, J. Suyama, M. Kitano, T. Nakamura, Meiji University, Kawasaki, Kanagawa, Japan
• “Tissue Elemental Mapping Using HDXRF with Doubly Curved Crystals”
D. Li, Z. Chen,  X-ray Optical System, Inc., East Greenbush, NY; A.H. Koeppen, S.C. Michael, V.A. Medical Center, Albany, NY

ICRS Winners:
• “Finite Element Modeling of Residual Stress Profile Patterns in Hard Turning”
Y.B. Guo, The University of Alabama, Tuscaloosa, AL
• “Interface Residual Stresses in Dental Zirconia Using Laue Micro-Diffraction”
H.A. Bale, J.C. Hanan, Oklahoma State University, Stillwater, OK; N. Tamura, M. Kunz, Advanced Light Source, Berkeley, CA; P. Coelho, V. Thompson, New York University, New York, NY.

Exhibits at the conference ran from Monday to Thursday with 45 companies displaying their various products and services for X-ray powder diffraction, X-ray fluorescence spectrometry and residual stress analysis. The following companies participated at the exhibits:

American Stress Technologies
AMPTEK, Inc.
Analytical Services, Inc.
Anton Paar USA
Australian X-ray Tubes Pty Ltd.
Blake Industries, Inc.
Bruker AXS, Inc.
Brush Wellman Electrofusion Products
Chemplex Industries, Inc.
Corporation Scientifique Claisse Inc.
e2v Scientific Instruments Ltd
Edax Inc.
GE Inspection Technologies
Hecus X-ray Systems GmbH
Herzog Automation Corp
HORIBA Jobin Yvon
Incoatec GmbH
Inel
Innov-X Systems

International Centre for Diffraction Data
Kitco Inc.
Materials Data, Inc.
Micro Photonics
Mike Handley Analytical Services
Moxtek, Inc.
PANalytical
Photonic Science Ltd.
PREMIER Lab Supply, Inc.
Princeton Instruments
Proto Manufacturing Inc.
Rigaku
Rocklabs Ltd.
SCT/Euro-Industries
Sigma Chemicals
SII NanoTechnology USA, Inc.
Skyray Instrument Co. Ltd.
Spectro
SPEX Sample Prep LLC
TEC
Thermo Scientific
UltraVolt, Inc.
Wiley-Blackwell
Xenocs
XIA LLC
XOS

 

To see a complete list of the products and services that the exhibitors displayed at the DXC, please visit the website: http://www.dxcicdd.com/08/exhibit.htm.

Social events at the conference included a Welcoming Reception sponsored by Thermo Scientific and ICDD; PANalytical was the sole sponsor of Monday evening’s poster session and reception; Tuesday evening’s event was sponsored by Chemplex and GE Inspection Technologies; exhibits remained open Wednesday evening for a Vendor Sponsored Reception and Thursday was a conference dinner for the ICRS attendees.

The Organizing Committee would like to acknowledge the workshop instructors, invited speakers and session chairs, for all of the time and effort that they volunteered to make this conference a great success. They would also like to send their appreciation to the above mentioned sponsors. For a preview of the 2009 Program, visit www.dxcicdd.com.

 

08 program

Pre registration for the Denver X-ray Conference and ICRS-8 is no longer available.

On-site registration at the Denver Marriott Tech Center Hotel will be held:

Registration Times:
Sun., 3 August            4:00 p.m.–7:00 p.m.
Mon., 4 August            8:00 a.m.–3:00 p.m.
Tues., 5 August           8:00 a.m.–3:00 p.m.
Wed., 6 August           8:00 a.m.–2:00 p.m.
Thurs., 7 August         8:00 a.m.–2:00 p.m.

The Denver Marriott Tech Center has currently sold out of rooms.
Information is listed below on area hotels. Please be sure to check with the Denver Marriott Tech Center as the conference approaches to see if there have been any cancellations. Traditionally, there are a moderate number of cancellations the week preceding the conference.

Hotels with in walking distance of The Marriott Tech Center:

  • The Hilton Garden Inn (previously Wyndham), this hotel is in the process of changing brands and may be undergoing renovations. - hiltongardeninn.hilton.com

Hotels not with in walking distance, but are still nearby:

See 2008 DXC Program (PDF)

icrs

The Eighth International Conference on Residual Stresses (ICRS-8) will take place concurrently with the Denver X-ray Conference (www.dxcicdd.com) from 6 -8 August 2008 at the Marriott Denver Tech Center Hotel, located in Denver, Colorado, U.S.A. ICRS is now held every four years; previous meetings were held in Germany (1987), France (1988), Japan (1991), U.S.A. (1994), Sweden (1997), UK (2000) and China (2004).

The conference provides a forum for scientists, academicians, students, and engineers interested in the prediction, evaluation, control, and application of residual stresses. The aim of this conference is to give equal emphasis to the measurement, modeling, and utilization of residual stress/strain data. Both the engineering and scientific aspects of these topics, such as the influence of residual stress fields on distortion, damage initiation, propagation, component lifetimes, and failure, will be addressed. Presentations on all stress determination techniques: diffraction, hole-drilling, slitting and contour, indentation, eddy current measurements, Barkhausen noise analysis, acoustic, and thermal mapping, etc., are welcome, as well as papers on the mechanics and modeling of residual stresses. Contributions from industry on residual stress applications and unsolved problems are especially encouraged.

The program will consist of invited and contributed oral presentations and posters. The conference proceedings will include most of the papers and posters presented, and will be available after the meeting on a CD-ROM.

Please visit this site often for updated information, including details on the program, registration, housing, travel and other necessary information. For information on the concurrent Denver X-ray Conference, please visit: www.dxcicdd.com.

CALL FOR PAPERS -

Deadline for abstract submission
15 March 2008

Online abstract submission now available - SUBMIT ABSTRACT HERE

Exhibit Space Details – includes floor plan, application form and sponsorship information

Registration

Online registration for ICRS-8 is now available. The registration fee will include access to the Denver X-ray Conference Program, including workshops, sessions, exhibits and evening receptions/poster sessions, as well as, an exclusive dinner reception for attendees of ICRS-8 on Thursday evening, August 7th.

ICRS-8 Registration Fees (includes conference dinner and proceedings on CD-ROM):

Full week: Monday & Tuesday workshops, Wednesday–Friday sessions, Monday–Thursday exhibits - $585

Half week: Wednesday–Friday sessions, Wednesday–Thursday exhibits - $535

Students: Full or half week (Identification is required) - $235

                                

CONFERENCE ORGANIZATION

The conference organization will be undertaken by the ICDD Conference Services Group, under the direction of Terry Maguire, ICDD Corporate Secretary, (maguire@icdd.com) and Denise Zulli, ICDD Conference Coordinator, (zulli@icdd.com), 12 Campus Boulevard, Newtown Square, PA, 19073-3273 U.S.A.

ICRS-8 Advisory Board

I. Cev Noyan
Columbia University
New York, NY, U.S.A.
E-mail: icn2@columbia.edu

Aaron Krawitz
University of Missouri
Columbia, MO, U.S.A.
E-mail: krawitza@missouri.edu

Camden R. Hubbard
Oak Ridge National Lab
Oak Ridge, TN, U.S.A.
E-mail: hubbardcr@ornl.gov

Mark Bourke
Los Alamos National Lab
Los Alamos, NM, U.S.A.
E-mail: bourke@lanl.gov

Tom Holden
Northern Stress Technologies
Deep River, Ontario, Canada
E-mail: holdent@magma.ca

ICRS-8 International Board

Prof. Zbigniew L. Kowalewski
Institute of Fundamental Technological Research P.A.S.
Warsaw, Poland
E-mail: zkowalew@ippt.gov.pl

Prof.  E.J. Mittemeijer
University of Stuttgart
Stuttgart, Germany
E-mail: e.j.mittemeijer@mf.mpg.de

Prof. Walter Reimers
Technical University Berlin
Berlin, Germany
E-mail: walter.reimers@tu-berlin.de

Prof. Berthold Scholtes (Chair)
Universität Kassel
34125 Kassel, Germany
E-mail: scholtes@uni-kassel.de

Prof. Philip J. Withers
Manchester Materials Science Center
Manchester, England, United Kingdom
E-mail: philip.withers@umist.ac.uk

Prof.  Sabine Denis
LSG2M, École des Mines de Nancy
Nancy, FRANCE
E-mail: sabine.denis@mines.inpl-nancy.fr

Dr. Jean Lou Lebrun 
LPMI, L'ecole Nationale Supérieure D'Arts et Métiers
Angers, France
E-mail: lebrun@angers.ensam.fr

Dr. Ru Lin Peng
Linköping University, Sweden
Linköping, Sweden
E-mail: rulin@ikp.liu.se

Prof. KeWei Xu
Xi’an Jiaotong University
Xi’an, P.R. China
E-mail: kwxu@mail.xjtu.edu.cn

Prof. Yoshiaki Akiniwa
Nagoya University
Nagoya, Japan
E-mail: akiniwa@mech.nagoya-u.ac.jp

Prof. Takao Hanabusa
Tokushima University
Tokushima, Japan
E-mail: hanabusa@me.tokushima-u.ac.jp

Prof. I. C. Noyan
Columbia University
New York, NY, U.S.A.
E-mail: icn2@columbia.edu

Prof. Aaron Krawitz
Univeristy of Missouri
Columbia, MO, U.S.A.
E-mail: krawitza@missouri.edu

Dr. Camden Hubbard
Oak Ridge National Lab
Oak Ridge, TN, U.S.A.
E-mail: hubbardcr@ornl.gov

Prof. Lyndon Edwards
The Open University
Milton Keynes, United Kingdom
E-mail: led@ansto.gov.au

ICRS-8 Program Committee

Michael Prime
Los Alamos National Laboratory
Los Alamos, NM, U.S.A.
E-mail: prime@lanl.gov

Ersan Ustundag
Iowa State University
Ames, IA, U.S.A.
E-mail: ustundag@iastate.edu

Mike Hill
University of California
Davis, CA, U.S.A.
E-mail: mrhill@ucdavis.edu

Jeffrey  Bunch
Boeing Integrated Defense Systems
E-mail: jeffrey.o.bunch@f22.boeing.com

Carlos Tome
Los Alamos National Laboratories
Los Alamos, NM, U.S.A.
E-mail: tome@lanl.gov

Irene Beyerlein
Los Alamos National Laboratories
Los Alamos, NM, U.S.A.
E-mail: irene@lanl.gov

Gene Ice
Oak Ridge National Laboratory
Oak Ridge, TN, U.S.A.
E-mail: icege@ornl.gov

Nobumichi Tamura
Lawrence Berkeley National Laboratory
Berkeley, CA, U.S.A.
E-mail: ntamura@lbl.gov

Joe Gray
Iowa State University
Ames, IA, U.S.A.
E-mail: jngray@iastate.edu

Thomas Watkins
Oak Ridge National Laboratory
Oak Ridge, TN, U.S.A.
E-mail: watkinstr@ornl.gov

Charles Goldsmith
IBM Corporation
Hopewell Junction, NY, U.S.A.
E-mail: cgoldsmi@us.ibm.com

Conal Murray
IBM, T.J. Watson Research Center
Yorktown Heights, NY, U.S.A.
E-mail: conal@us.ibm.com

Thomas Gnaupel-Herold
NIST, Center for Neutron Research
Gaithersburg, MD, U.S.A.
E-mail: tg-h@nist.gov

Donald Brown
Los Alamos National Laboratory
Los Alamos, NM, U.S.A.
E-mail: dbrown@lanl.gov

Xun-Li Wang
Oak Ridge National Laboratory
Oak Ridge, TN, U.S.A.
E-mail: wangxl@ornl.gov

Jon Almer
Argonne National Laboratory
Argonne, IL, U.S.A.
E-mail: almer@aps.anl.gov

Mark Daymond
Queen's University
Kingston, Ontario, CANADA
E-mail: daymond@me.queensu.ca

Jeremy Robinson
University of Limerick
Limerick, Ireland
jeremy.robinson@ul.ie

 

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