New Developments in XRD/XRF Instrumentation (vendor/commercial presentations permitted)

Chairs:
T. Fawcett, Emeritus, ICDD, USA, dxcfawcett@outlook.com
A. Drews, Ford Motor Company, USA, adrews@ford.com

Abstracts should be submitted by technical representatives of a manufacturer. They should discuss specifications, and applications concerning one of their newest and most important products. Talks should include comments about software, XRD and XRF equipment, and accessories. No mention of prices or a comparison with competitors’ products can be included.

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Cultural Heritage

Chair: M. Schmeling, Loyola University of Chicago, USA, mschmel@luc.edu

This session covers all aspects of X-ray analysis related to objects of cultural heritage such as paintings, sculptures, manuscripts, and buildings. Presentations involving multiple methods like XRF and XRD or XRF and Raman Spectroscopy are highly encouraged.

Invited Speaker:
Look but Don’t Touch: Non-Invasive Analysis Strategies for Archaeological Glass
Monica Ganio, The Getty Conservation Institute, USA

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Machine Learning Techniques in X-ray Analysis

Chairs:
M. Cherukara, Argonne National Laboratory, USA, mcherukara@anl.gov
A. Mehta, SLAC, SSRL, USA, mehta@slac.stanford.edu

The capabilities provided by next generation light sources along with the development of new characterization techniques and detector advances are expected to dramatically increase the complexity and volume of data generated by instruments at the new light sources. Traditional techniques of data reduction and analysis will not be able to keep pace. Machine learning (ML) methods applied to a variety of X-ray characterization techniques have shown promise in accelerating, and in some cases improving the accuracy of X-ray data inversion, abstraction and inference. ML methods are also finding increasing use in the autonomous operation of increasingly complex instruments and experiments. This workshop is being organized to discuss the current state and potential of machine learning methods applied to synchrotron and XFEL data.

Invited Speakers:
Andi Barbour, Brookhaven National Laboratory, USA
Auralee Edelen, SLAC National Laboratory, USA
Chris Wolverton, Northwestern University, USA

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Energy Storage and Harvesting

Chair: U. Fittschen, TU Clausthal, Clausthal-Zellerfeld, Germany, ursula.fittschen@tu-clausthal.de

Papers studying energy storage and harvesting materials e.g. their performance, aging etc. are welcome; as well are papers studying processes and phenomenoms related to energy storage and harvesting devises, such as batteries and solar cells.

Invited Speakers:
Acceleration of Li-ion Battery Cathode Development with Laboratory X-ray Absorption Spectroscopy
Zach Lebens-Higgins, easyXAFS, LLC, USA

Imaging Chemistry in Space and Time Using Synchrotron Light
Dario Ferreira Sanchez, Paul Scherrer Institut, Switzerland

Multi-Modal Scanning X-ray Microscopy: From Material Properties to Nanoscopic Solar-Cell Performance
Michael Stuckelberger, DESY Photon Science, Germany

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Imaging

Chair: P. Wobrauschek, Atominstitut – TU Wien, Vienna, Austria, wobi@ati.ac.at

Description coming soon.

Industrial Applications of XRD

Chair: T. Fawcett, Emeritus, ICDD, USA, dxcfawcett@outlook.com

The Industrial Applications session includes both X-ray fluorescence and X-ray diffraction analyses as used by industry scientists. The idea behind this session is to showcase the general approaches used in X-ray analyses for a variety of applications and material types.

Invited Speakers:
Powder Crystallography: Providing Basic Scientific Infrastructure for Industry
Jim Kaduk, Poly Crystallography, Inc., USA

Obtaining Accurate QPA on Highly Complex Materials like Iron Slag, Steel Slag, and Cement
Jessica Lyza, Edward C. Levy, USA

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Non-ambient XRD & PDF

Chair: S. Misture, NYS College of Ceramics at Alfred University, USA, misture@alfred.edu

Description coming soon.

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Stress and Texture Analysis

Chair: T.R. Watkins, Oak Ridge National Laboratory, USA, watkinstr@ornl.gov

The Stress and Texture Analysis session seeks to provide a forum to display and discuss the latest techniques and analyses for stress and texture work using diffraction across a broad range of applications.  Contributions are also sought from related areas that impact these analyses including but not limited to elasticity, statistics, validation, modelling, etc.

Keywords: Stress, Strain, Texture, Preferred Orientation, in-situ, X-ray, neutron.

Invited Speakers:
Stress Measurements Across Length Scales
Adam Creuziger, NIST, USA

On the Estimation of Elastic Constants in Low Symmetry Materials with In-situ Neutron Diffraction Measurements
Nathan Peterson, Colorado School of Mines, USA

Texture and Stress-state Evolution during Dynamic Compression in Titanium Characterized with the XFEL at LCLS-2
Dan Savage, Los Alamos National Laboratory, USA

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Applications of Rietveld Analysis

Chair: S. Lapidus, Argonne National Laboratory, USA, slapidus@aps.anl.gov

Description coming soon.

Invited Speakers:
Understanding the Structure and Properties of the Elusive Non-stoichiometry Lead dioxide
Tiffany Kinnibrugh, Argonne National Laboratory, USA

Mechanistic Understanding of High-Rate Battery Cycling using Operando Synchrotron X-ray Diffraction
Molleigh Preefer, Stanford Linear Accelerator Center, USA

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Synchrotron Applications in XRD

Chairs:
J. Almer, Argonne National Laboratory, USA, almer@anl.gov
M. Miller, Cornell University, USA, mpm4@cornell.edu

This session highlights the use of synchrotron X-ray diffraction to non-destructively probe materials, particularly under in-situ conditions.  Presentations focused on current and future capabilities as well as scientific and/or engineering applications are encouraged.

Invited Speakers:
Multi-Modal Materials Characterization At The P21.2 High-Energy Beamline At PETRA III (DESY)
Ulrich Lienert, DESY, Germany

Microstructure Imaging for Engineering Materials Using High-Energy X-rays After the Advanced Photon Source – Upgrade (APS-U)
Jun-Sang Park, Argonne National Laboratory, USA

X-ray Diffraction-Based Tools For Structural Materials Characterization At CHESS
Kate Shanks, Cornell High Energy Synchrotron Source, USA

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General XRD

Chair: C. Murray, IBM T.J. Watson Research Center, USA, conal@us.ibm.com

Welcoming abstracts in all areas of X-ray diffraction and related techniques.

Trace Analysis

Chair: D. Eichert, Elettra – Sincrotrone Trieste, Italy, diane.eichert@elettra.eu

The Trace Analysis session aims to present an overview of the current trends in trace and ultra-trace elemental analysis research using both EDXRF and WDXRF. This includes for instance the various XRF angle resolved domains such as TXRF, GIXRF, and general XRF geometries. Papers dealing with state-of-the-art technique, methodology, and instrumentation are welcome. Recent breakthroughs may report on aspects improving the various sensitivities of XRF analysis such as limits of detection, reliability in XRF measurements, detectable elemental range, elemental imaging, or unravelling chemical speciation, all within a qualitative, quantitative, or screening framework. Application delineating needs and new aspects in trace element characterisation expanding from high tech and novel materials, to medical, biological, environmental, food, cultural heritage, and forensic science, and comparison with other elemental techniques, are of interest.

Invited Speakers:
Using X-rays to Study the Fate of Nanoparticles in Fuel Conversion Processes and Environmental Samples
Laura Torrent Fàbrega, Paul Scherrer Institut, Switzerland

Elemental Analysis and Mapping of Biological Tissues
Po-Wah So, King’s College London, United Kingdom

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Industrial Applications XRF

Chair: C.G. Worley, Los Alamos National Laboratory, USA, cworley@lanl.gov

This session will consist of presentations where EDXRF and/or WDXRF are used either for routine elemental characterization or to help solve problems in industry or other settings such as government or academia. Submissions can entail quantitative and/or qualitative XRF applications.

Invited Speakers:
Unraveling the Power of X-ray Fluorescence for Accurate Inorganic Quantitative Analysis in Industrial Applications
Poulami Dutta, Dow, USA

Trace Heavy Metal Analysis in Food Products by X-ray Fluorescence Spectroscopy, the Disruptive Nature of Introducing X-ray Fluorescence into the World of Atomic Spectroscopy
Joel Langford, Shimadzu Scientific Instruments, USA

XRF Assays for Critical Minerals in Mining and Processing: Comparison of WDXRF, EDXRF and PXRF Capabilities for Cobalt in Ore, Tails and Concentrates
Alexander Seyfarth, SGS North America, USA

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Quantitative Analysis of XRF

Chair: M. Loubser, University of Pretoria, South Africa, maggi.loubser@gmail.com

Papers accepted for presentation in the Quantitative XRF Session should discuss applications of quantitative XRF (any type of XRF technology), and/or in general key parameters or novel ideas related to improving methods for quantitative XRF.

Invited Speakers:
Quantitative Analysis of Materials at the Nanoscale by X-ray Spectrometry
Burkhard Beckhoff, Physikalisch-Technische Bundesanstalt (PTB), Germany

Thickness Measurement and Shape Correction of Resin Thin Films Using Theoretical Intensity of Scattered X-rays
Rie Ogawa, Shimadzu Corporation, Japan

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Micro XRF using Imaging

Chair: P. Wobrauschek, Atominstitut – TU Wien, Vienna, Austria, wobi@ati.ac.at

New brilliant sources available in laboratories both, small scale as low power x-ray tubes or as compact Synchrotron as well as large scale at special beamlines of Synchrotron radiation facilities offer new dimensions in the research at µm and nm scale. The brilliant flux is a requirement to have after the x-ray optics enough photons in the beam of this size for the experiment in mind.

Together with a variation of optics – and detectors of recent developments for single pixel by pixel measurements or all in one by a pixelized large area detectors imaging can be fulfilled and the spatial resolved elemental distribution is unveiled in the samples of interest.

Researchers in the field are invited to present their recent results during the session to let the community know the fascination this scientific branch in the manifold applications.

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General XRF

Chair: U. Fittschen, TU Clausthal, Clausthal-Zellerfeld, Germany, ursula.fittschen@tu-clausthal.de

Authors are invited to submit X-ray fluorescence and related X-ray technique papers to the general XRF session. Such papers on topics that do not fit well into other specific sessions can be submitted to the General XRF session.

Invited Speakers:
The Role of MA-XRF in the Concert of Methods for the Investigation of Cultural Heritage Artefacts
Matthias Alfeld, TU Delft, TU Delft

Illuminating BOF Slags by µ-XRF – Vanadium Distribution and Its Structural Influences
Sophie Wunderlich, TU Clausthal, Germany