SESSIONS
Bio-Medical Imaging
Chair: S. Misture, NYS College of Ceramics at Alfred University, USA, misture@alfred.edu
Invited Speakers:
X-ray Fluorescence Microscopy Brightens up Biological and Medical Research
Olga Antipova, Argonne National Laboratory, USA
Paleobiomedical Imaging: The Use of X-ray and CT to Study Egyptian and Peruvian Mummies
Andrew Nelson, University of Western Ontario, Canada
Beyond Jaws: The Mineralized Cartilage of Shark Vertebral Centra
Stuart Stock, Northwestern University, USA
New Developments in XRD/XRF Instrumentation (vendor/commercial presentations permitted)
Chairs:
T. Fawcett, Emeritus, ICDD, USA, dxcfawcett@outlook.com
A. Drews, Ford Motor Company, USA, adrews@ford.com
Abstracts should be submitted by technical representatives of a manufacturer. They should discuss specifications, and applications concerning one of their newest and most important products. Talks should include comments about software, XRD and XRF equipment, and accessories. No mention of prices or a comparison with competitors’ products can be included.
Cultural Heritage
Chair: M. Schmeling, Loyola University of Chicago, USA, mschmel@luc.edu
This session covers all aspects of X-ray analysis related to objects of cultural heritage such as paintings, sculptures, manuscripts, and buildings. Presentations involving multiple methods like XRF and XRD or XRF and Raman Spectroscopy are highly encouraged.
Invited Speakers:
Synchrotron Radiation Techniques in the Cultural Heritage Analyst’s Toolkit
Diane Eichert, Elettra – Sincrotrone Trieste, Italy
Use of XRF at the Canadian Conservation Institute to Support Cultural Heritage Science Research
Maeve Moriarty, Canadian Conservation Institute, Canada
Machine Learning Techniques in X-ray Analysis
Chairs:
M. Cherukara, Argonne National Laboratory, USA, mcherukara@anl.gov
A. Mehta, SLAC, SSRL, USA, mehta@slac.stanford.edu
The capabilities provided by next generation light sources along with the development of new characterization techniques and detector advances are expected to revolutionize science across disciplines but also dramatically increase the complexity and volume of data generated by instruments at the new light sources. Traditional techniques of data reduction and analysis will not be able to keep pace. Machine learning methods applied to a variety of X-ray characterization techniques have shown promise in accelerating, and in some cases improving the accuracy of X-ray data inversion, abstraction and inference. Concurrently,
AI-driven experimental automation is accelerating and expanding the capabilities of x-ray instruments. Large language models (LLMs) are being explored as
AI-assistants to guide scientific users in experiment design, instrument operation and data analysis. This workshop is being organized to discuss the current state and potential of machine learning methods to accelerate and enhance synchrotron and XFEL science and operation.
Invited Speakers:
Advancing Materials Characterization through Physics-Guided Machine Learning
Nina Andrejevic, Argonne National Laboratory, USA
PtychoPINN: Physics-Informed Machine Learning for High-Resolution Lensless Imaging
Oliver Hoidn, SLAC National Accelerator Laboratory, USA
Virtual Scientific Companion for Synchrotron X-ray Experimentation
Esther Tsai, Brookhaven National Laboratory, USA
Mining, Recycling, and Sustainable Materials
Chair: K. Tsuji, Osaka Metropolitan University (OMU), Japan, k-tsuji@omu.ac.jp
The Mining, Recycling, and Sustainable Materials session welcomes presentations on X-ray analysis at mine sites, online X-ray analysis in recycling processes, and applications of handheld X-ray analyzers. X-ray analysis of rare earth and rare metal elements are also important in the industrial field and will be discussed.
Invited Speakers:
XRF Analysis in Recycling Fields
Daisuke Matsunaga, Horiba Co. Ltd, Japan
Exploring the Benefits of Using Handheld XRF to Support Lithium-Ion Battery Recycling Process
Jordan Rose, Hitachi Hightech Analytical Science, USA
Determination of Abundances, Distribution, and Species of Rare Earth Elements in Natural Samples Using Advanced X-ray Spectroscopy
Yoshio Takahashi, University of Tokyo, Japan
Bio-Medical
Chair: C. Greenwood, Keele University, United Kingdom, c.e.greenwood@keele.ac.uk
Open to all participants.
The bio-medical session will feature a comprehensive exploration of biomaterials using advanced techniques such as X-ray fluorescence, X-ray diffraction, and vibrational spectroscopy. Attendees can expect to gain insights into the general methodologies employed in X-ray analyses, covering a diverse range of material types with specific emphasis on their applications in biomedicine.
Invited Speakers:
Innovations in Soft Tissue Characterisation: Harnessing X-ray Diffraction and Machine Learning for Early Cancer Detection
Ash Ajeer, Keele University, United Kingdom
Accurate Analysis of Nanocrystalline Hydroxyapatite: Local Order from Total Scattering
Emily Arnold, Diamond Lightsource, United Kingdom
Tabletop X-ray Transmission + Diffraction Imaging Systems for Task-Specific Sample Analysis
Joel Greenberg, Quadridox USA, USA
Energy Materials Characterization
Chair: M. Rodriguez, Sandia National Laboratories, USA, marodri@sandia.gov
The Energy Materials Characterization sessionserves as an opportunity to present recent developments in characterization tools and methodologies employed in the understanding and development of Energy related materials. Presenters are encouraged to showcase use of X-ray diagnostic methods, but additional characterization methods are also encouraged to highlight how best to approach challenges related to Energy materials.
Invited Speakers:
Multi-scale X-ray CT for Characterization of Energy Materials
Donal Finegan, National Renewable Energy Laboratory, USA
Examples of X-ray Characterization Techniques in Energy Storage Research
Katie Harrison, National Renewable Energy Laboratory, USA
General XRD
Chair: J. Okasinski, Argonne National Laboratory, USA, okasinski@anl.gov
Welcoming abstracts in all areas of X-ray diffraction and related techniques.
Rietveld and PDF Applications
Chair: K. Stone, SLAC National Accelerator Laboratory, USA, khstone@slac.stanford.edu
The session on Rietveld and PDF Applications will focus on the use of Rietveld refinement of powder diffraction data, pair distribution function analysis, or a combination of the two to provide insight into material structure. Abstracts where structural information from powder diffraction or total scattering data provide important insight are encouraged for any class of materials or application.
Industrial Applications of XRD
Chair: T. Fawcett, Emeritus, ICDD, USA, dxcfawcett@outlook.com
The Industrial Applications session includes both X-ray fluorescence and X-ray diffraction analyses as used by industry scientists. The idea behind this session is to showcase the general approaches used in X-ray analyses for a variety of applications and material types.
Invited Speaker:
Industrial Application of XRD
Bryan Wheaton, Corning, USA
Stress and Texture Analysis
Chair: T.R. Watkins, Oak Ridge National Laboratory, USA, watkinstr@ornl.gov
The Stress and Texture Analysis session seeks to provide a forum to display and discuss the latest techniques and analyses for stress and texture work using diffraction across a broad range of applications. Contributions are also sought from related areas that impact these analyses including but not limited to elasticity, statistics, validation, modelling, etc.
Invited Speakers:
Mapping Full Stress Tensors in Advanced Manufactured Mock-Up of the Spallation Neutron Source Second Target Station’s Target using Neutron Diffraction
Jeffrey Bunn, Oak Ridge National Laboratory, USA
Multi-Scale, Multi-Modal Stress and Structure Characterization Using High-Energy Synchrotron Radiation at the Upgraded Advanced Photon Source
Jun-Sang Park, Argonne National Laboratory, USA
Non-ambient Measurements
Chair: A. Drews, Ford Motor Company, USA, adrews@ford.com
Abstracts are sought for X-ray, neutron or electron measurements of specimens in non-ambient conditions. Examples include measurements at high temperatures, high pressures or any unconventional specimen environment. Talks should focus on the unique opportunities and challenges of such measurement conditions as well as analysis methods that are uniquely tailored to those conditions.
Invited Speaker:
Thinking Outside the Crucible: Containerless Processing for Science at Extremes
Dante Quirinale, Oak Ridge National Laboratory, USA
General XRF
Chair: U. Fittschen, TU Clausthal, Clausthal-Zellerfeld, Germany, ursula.fittschen@tu-clausthal.de
Authors are invited to submit X-ray fluorescence and related X-ray technique papers to the general XRF session. Such papers on topics that do not fit well into other specific sessions can be submitted to the General XRF session.
Invited Speakers:
The Fate of Macro, Micro and Trace Elements in Soil Ecosystems: A TXRF Story
Ignazio Allegretta, Università del Salento, Italy
Continuous X-ray Fluorescence Core Scanning in the Mining Industry: Application Examples and Method Developments
Thomas Monecke, Colorado School of Mines, USA
Multi-Modal Scanning X-ray Microscopy: From Material Properties to Nanoscopic Solar-Cell Performance
Michael Stueckelberger, DESY Photon Science, Germany
Trace Analysis
Chair: M. Schmeling, Loyola University Chicago, USA, mschmel@luc.edu
The Trace Analysis Session aims to present an overview of the current status and trends in research related to trace elemental analysis by EDXRF and/or WDXRF. Papers describing instrumentation, research methodology or applications in trace analysis are welcome. This includes those which address angle resolved approaches like GIXRF, TXRF, and GEXRF. Papers describing novel applications are particularly encouraged.
Invited Speakers:
Evaluation of Toxic Elements Uptake by Plants using X-ray Fluorescence Microscopy
Olga Antipova, Argonne National Laboratory, USA
Next Generation Elemental Analyses in the Chemical Speciation Network: Investigation of Current X-ray Fluorescence Technology
Jason Giacomo, UC Davis, USA
Quantitative Analysis of XRF
Chair: C. Heirwegh, Jet Propulsion Laboratory, California Institute of Technology, christopher.m.heirwegh@jpl.nasa.gov
Papers accepted for presentation in the Quantitative XRF Session should discuss applications of quantitative XRF (any type of XRF technology), and/or in general key parameters or novel ideas related to improving methods for quantitative XRF.
Invited Speakers:
Ultimate Portability: Design and Operation of X-ray Analysis Instruments on Mars
Ben Clark, Space Science Institute, USA
Cryogenic Microcalorimeters for Quantitative X-ray Fluorescence Analysis
Joe Fowler, NIST, USA
Quantifying Gold Nanoparticle Bio-Distribution Using Total Reflection X-ray Fluorescence
Gabriella Mankovskii, Ryerson University, Canada
Micro XRF and Synchrotron Applications
Chair: P. Wobrauschek, Atominstitut – TU Wien, Austria, wobi@ati.ac.at
This session will accept contributions dealing with research work and practical applications in the field of micro-XRF using lab sources as well as synchrotron radiation sources. Papers presenting results of X-ray elemental imaging in general with micro and macro dimensions with various sources are also accepted.
Invited Speaker:
Decoding the Elemental Fingerprints of Ancient Gold: A Synchrotron-based Approach
Martin Radtke, Federal Institute for Materials Research and Testing (BAM), Germany
Industrial Applications XRF
Chair: P. Dutta, Dow Chemical Company, USA, pdutta1@dow.com
This session will consist of presentations where EDXRF and/or WDXRF are used either for routine elemental characterization or to help solve problems in industry or other settings such as government or academia. Submissions can entail quantitative and/or qualitative XRF applications.
Invited Speakers:
Examination of Material Failure using In Situ X-ray Tomography
Brian M. Patterson, Los Alamos National Laboratory, USA
The Adaptive Role of XRF from Material Discovery to Production
Britt Vanchura, Dow, USA
WORKSHOPS
- Machine Learning / Automated Analysis
- X-ray Sources and Optics
- Practical Microcomputed Tomography
- 2D Detectors
- XRD Sample Preparation
- Stress Analysis
- Non-ambient XRD
- Basic XRF
- Micro XRF
- Sample Preparation for XRF
- Quantitative XRF
- XRF of Layered Structure
- XRF Trace Analysis