CALL FOR PAPERS
Welcoming papers in all areas of X-ray analysis. The size and congeniality of the conference make it ideal for
presenting your work, interacting with colleagues, and seeking the advice of experts. All participants are invited to submit their abstract for an in-person presentation.
Session Chairs, Invited Speakers, and Session Descriptions are listed below. Updates will be posted as they become available. The complete Program will be announced by May 2024.
New Developments in XRD/XRF Instrumentation (vendor/commercial presentations permitted)
Abstracts should be submitted by technical representatives of a manufacturer. They should discuss specifications, and applications concerning one of their newest and most important products. Talks should include comments about software, XRD and XRF equipment, and accessories. No mention of prices or a comparison with competitors’ products can be included.
Chair: M. Schmeling, Loyola University of Chicago, USA, firstname.lastname@example.org
This session covers all aspects of X-ray analysis related to objects of cultural heritage such as paintings, sculptures, manuscripts, and buildings. Presentations involving multiple methods like XRF and XRD or XRF and Raman Spectroscopy are highly encouraged.
Diane Eichert, Elettra – Sincrotrone Trieste, Italy
Maeve Moriarty, Canadian Conservation Institute, Canada
Machine Learning Techniques in X-ray Analysis
The capabilities provided by next generation light sources along with the development of new characterization techniques and detector advances are expected to revolutionize science across disciplines but also dramatically increase the complexity and volume of data generated by instruments at the new light sources. Traditional techniques of data reduction and analysis will not be able to keep pace. Machine learning methods applied to a variety of X-ray characterization techniques have shown promise in accelerating, and in some cases improving the accuracy of X-ray data inversion, abstraction and inference. Concurrently,
AI-driven experimental automation is accelerating and expanding the capabilities of x-ray instruments. Large language models (LLMs) are being explored as
AI-assistants to guide scientific users in experiment design, instrument operation and data analysis. This workshop is being organized to discuss the current state and potential of machine learning methods to accelerate and enhance synchrotron and XFEL science and operation.
Mining, Recycling, and Sustainable Materials
Chair: K. Tsuji, Osaka Metropolitan University (OMU), Japan, email@example.com
The Mining, Recycling, and Sustainable Materials session welcomes presentations on X-ray analysis at mine sites, online X-ray analysis in recycling processes, and applications of handheld X-ray analyzers. X-ray analysis of rare earth and rare metal elements are also important in the industrial field and will be discussed.
Daisuke Matsunaga, Horiba Co. Ltd, Japan
Jordan Rose, Hitachi Hightech Analytical Science, USA
Yoshio Takahashi, University of Tokyo, Japan
Chair: C. Greenwood, Keele University, United Kingdom, firstname.lastname@example.org
Open to all participants.
The bio-medical session will feature a comprehensive exploration of biomaterials using advanced techniques such as X-ray fluorescence, X-ray diffraction, and vibrational spectroscopy. Attendees can expect to gain insights into the general methodologies employed in X-ray analyses, covering a diverse range of material types with specific emphasis on their applications in biomedicine.
Ash Ajeer, Keele University, United Kingdom
Joel Greenberg, Quadridox USA, USA
Energy Materials Characterization
Chair: M. Rodriguez, Sandia National Laboratories, USA, email@example.com
The Energy Materials Characterization sessionserves as an opportunity to present recent developments in characterization tools and methodologies employed in the understanding and development of Energy related materials. Presenters are encouraged to showcase use of X-ray diagnostic methods, but additional characterization methods are also encouraged to highlight how best to approach challenges related to Energy materials.
Multi-scale X-ray CT for Characterization of Energy Materials
Donal Finegan, National Renewable Energy Laboratory, USA
Examples of X-ray Characterization Techniques in Energy Storage Research
Katie Harrison, National Renewable Energy Laboratory, USA
Amy Marschilok, Stony Brook University, USA
Chair: J. Okasinski, Argonne National Laboratory, USA, firstname.lastname@example.org
Welcoming abstracts in all areas of X-ray diffraction and related techniques.
Rietveld and PDF Applications
Chair: K. Stone, SLAC National Accelerator Laboratory, USA, email@example.com
The session on Rietveld and PDF Applications will focus on the use of Rietveld refinement of powder diffraction data, pair distribution function analysis, or a combination of the two to provide insight into material structure. Abstracts where structural information from powder diffraction or total scattering data provide important insight are encouraged for any class of materials or application.
Industrial Applications of XRD
Chair: T. Fawcett, Emeritus, ICDD, USA, firstname.lastname@example.org
The Industrial Applications session includes both X-ray fluorescence and X-ray diffraction analyses as used by industry scientists. The idea behind this session is to showcase the general approaches used in X-ray analyses for a variety of applications and material types.
Stress and Texture Analysis
Chair: T.R. Watkins, Oak Ridge National Laboratory, USA, email@example.com
The Stress and Texture Analysis session seeks to provide a forum to display and discuss the latest techniques and analyses for stress and texture work using diffraction across a broad range of applications. Contributions are also sought from related areas that impact these analyses including but not limited to elasticity, statistics, validation, modelling, etc.
Chair: A. Drews, Ford Motor Company, USA, firstname.lastname@example.org
Abstracts are sought for X-ray, neutron or electron measurements of specimens in non-ambient conditions. Examples include measurements at high temperatures, high pressures or any unconventional specimen environment. Talks should focus on the unique opportunities and challenges of such measurement conditions as well as analysis methods that are uniquely tailored to those conditions.
Chair: U. Fittschen, TU Clausthal, Clausthal-Zellerfeld, Germany, email@example.com
Authors are invited to submit X-ray fluorescence and related X-ray technique papers to the general XRF session. Such papers on topics that do not fit well into other specific sessions can be submitted to the General XRF session.
Ignazio Allegretta, Università del Salento, Italy
Michael Stueckelberger, DESY Photon Science, Germany
Chair: M. Schmeling, Loyola University Chicago, USA, firstname.lastname@example.org
The Trace Analysis Session aims to present an overview of the current status and trends in research related to trace elemental analysis by EDXRF and/or WDXRF. Papers describing instrumentation, research methodology or applications in trace analysis are welcome. This includes those which address angle resolved approaches like GIXRF, TXRF, and GEXRF. Papers describing novel applications are particularly encouraged.
Olga Antipova, Argonne National Laboratory, USA
Jason Giacomo, UC Davis, USA
Quantitative Analysis of XRF
Chair: C. Heirwegh, Jet Propulsion Laboratory, California Institute of Technology, email@example.com
Papers accepted for presentation in the Quantitative XRF Session should discuss applications of quantitative XRF (any type of XRF technology), and/or in general key parameters or novel ideas related to improving methods for quantitative XRF.
Ben Clark, Space Science Institute, USA
Gabriella Mankovskii, Ryerson University, Canada
Micro XRF and Synchrotron Applications
Chair: P. Wobrauschek, Atominstitut – TU Wien, Austria, firstname.lastname@example.org
This session will accept contributions dealing with research work and practical applications in the field of micro-XRF using lab sources as well as synchrotron radiation sources. Papers presenting results of X-ray elemental imaging in general with micro and macro dimensions with various sources are also accepted.
Industrial Applications XRF
Chair: P. Dutta, Dow Chemical Company, USA, email@example.com
This session will consist of presentations where EDXRF and/or WDXRF are used either for routine elemental characterization or to help solve problems in industry or other settings such as government or academia. Submissions can entail quantitative and/or qualitative XRF applications.
Brian M. Patterson, Los Alamos National Laboratory, USA
Britt Vanchura, Dow, USA
Abstracts are hereby solicited for oral presentations in any of the sessions listed, or the XRD or XRF poster sessions. Poster sessions will be held on Monday (XRD) and Tuesday (XRF) evening of conference week.
- Machine Learning / Automated Analysis
- X-ray Sources and Optics
- Practical Microcomputed Tomography
- 2D Detectors
- XRD Sample Preparation
- Stress Analysis
- Non-ambient XRD
- Basic XRF
- Micro XRF
- Sample Preparation for XRF
- Quantitative XRF
- XRF of Layered Structure
- XRF Trace Analysis