New Developments in XRD & XRF Instrumentation (vendor/commercial presentations permitted)

Chairs:
Tim Fawcett, Emeritus, ICDD, USA, dxcfawcett@outlook.com
Andy Drews, Ford Motor Company, USA, adrews@ford.com

Abstracts should be submitted by technical representatives of a manufacturer. They should discuss specifications, and applications concerning one of their newest and most important products. Talks should include comments about software, XRD and XRF equipment, and accessories. No mention of prices or a comparison with competitors’ products can be included.

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Mining, Recycling, and Sustainable Materials

Chairs:
Kouichi Tsuji, Osaka Metropolitan University (OMU), Japan, k-tsuji@omu.ac.jp
Brian Patterson, Los Alamos National Laboratory, USA, bpatterson@lanl.gov

The Mining, Recycling, and Sustainable Materials session welcomes presentations on X-ray analysis at mine sites, online X-ray analysis in recycling processes, and applications of handheld X-ray analyzers. X-ray analysis of rare earth and rare metal elements are also important in the industrial field and will be discussed.

Invited Speakers:
In situ Damage and Deformation of Allende Meteorite and Tuff Materials during Synchrotron based High-Speed 3D Tomography
Brian Patterson, Los Alamos National Laboratory, USA

Development and Applications of Non-Destructive Elemental Analysis Using Muon-Induced X-ray Emission (MIXE)
Akira Sato, Osaka University, Japan

X-ray Fluorescence Analysis of Lithium-Ion Battery Black Mass
Hikari Takahara, Rigaku Co., Japan

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Early Career Researchers: Spotlight on the Next Generation

Chair: Sarah Gosling, Keele University, United Kingdom, s.b.gosling@keele.ac.uk

A session for early career researchers to present their work to their peers and hone their presentation skills in a friendly environment. Abstracts are welcome from across the range of topics covered at DXC.

Early career researchers are typically defined as students, post-docs, and academics in their first independent post, or industry equivalents, but please get in contact with the organizers if you are not sure.

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Machine Learning Techniques in X-ray Analysis

Chairs:
Mathew Cherukara, Argonne National Laboratory, USA, mcherukara@anl.gov
Apurva Mehta, SLAC, SSRL, USA, mehta@slac.stanford.edu

The capabilities provided by next generation light sources along with the development of new characterization techniques and detector advances are expected to revolutionize science across disciplines but also dramatically increase the complexity and volume of data generated by instruments at the new light sources. Traditional techniques of data reduction and analysis will not be able to keep pace. Machine learning methods applied to a variety of X-ray characterization techniques have shown promise in accelerating, and in some cases improving the accuracy of X-ray data inversion, abstraction and inference. Concurrently, AI-driven experimental automation is accelerating and expanding the capabilities of x-ray instruments. Large language models (LLMs) are being explored as AI-assistants to guide scientific users in experiment design, instrument operation and data analysis.

Invited Speakers:
DiffractGPT: Atomic Structure Determination from X-ray Diffraction Patterns Using a Generative Pretrained Transformer
Kamal Choudhary, NIST, USA

The Future of Autonomous Science
Kevin Yager, Brookhaven National Laboratory, USA

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Biological & Forensics Applications

Chair: Sarah Gosling, Keele University, United Kingdom, s.b.gosling@keele.ac.uk

X-ray analysis is an increasingly diverse field with a range of applications, which will be explored in the Biological & Forensic Applications session.  Abstracts for this session should be focused on the use of X-ray analysis in research in biological or forensic science. 

Invited Speakers:
Portable X-ray Fluorescence as a Tool for the Analysis of Osteological Remains
Letizia Bonizzoni, Università degli Studi di Milano, Italy

Basics and Applications of X-Ray Fluorescence Imaging (XFI)
Theresa Staufer, University of Hamburg, Germany

General XRD

Chair: John Okasinski, Argonne National Laboratory, USA, okasinski@anl.gov

Welcoming abstracts in all areas of X-ray diffraction and related techniques.

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Industrial Applications of XRD

Chair: Tim Fawcett, Emeritus, ICDD, USA, dxcfawcett@outlook.com

The Industrial Applications session includes both X-ray fluorescence and X-ray diffraction analyses as used by industry scientists. The idea behind this session is to showcase the general approaches used in X-ray analyses for a variety of applications and material types.

Invited Speaker:
Difficult Pharmaceutical Crystal Structures
Jim Kaduk, North Central College, USA

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Stress and Texture Analysis

Chair: Tom Watkins, Oak Ridge National Laboratory, USA, watkinstr@ornl.gov

The Stress and Texture Analysis session seeks to provide a forum to display and discuss the latest techniques and analyses for stress and texture work using diffraction across a broad range of applications.  Contributions are also sought from related areas that impact these analyses including but not limited to elasticity, statistics, validation, modelling, etc.

Invited Speakers:
XRD Stress Measurements from Multi-axial Deformation of 3rd Generation Advanced High Strength Steels
Adam Creuziger, NIST, USA

Chris Fancher, Oak Ridge National Laboratory, USA

The Surface Effect and XEC Model Fidelity in X-ray Stress Analysis
Thomas Gnaupel Herold, NIST, USA

Dunji Yu, Oak Ridge National Laboratory, USA

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Non-ambient Measurements

Chair: Andy Drews, Ford Motor Company, USA, adrews@ford.com

Abstracts are sought for X-ray, neutron or electron measurements of specimens in non-ambient conditions. Examples include measurements at high temperatures, high pressures or any unconventional specimen environment. Talks should focus on the unique opportunities and challenges of such measurement conditions as well as analysis methods that are uniquely tailored to those conditions.

Invited Speaker:
The High-Pressure BioSANS Platform at the NIST Center for Neutron Research
Susana Marujo Teixeira, NIST, USA

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XRD Methods for Complex Multi-Phase Identification

Chair: Tim Fawcett, Emeritus, ICDD, USA, dxcfawcett@outlook.com

Invited Speaker:
XRD Methods for Complex Multi-Phase Identification
Jessica Lzya, Alfred University, USA

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Structure Elucidation via PDF

Chair: Yuanpeng Zhang, Oak Ridge National Laboratory, USA, zhangy3@ornl.gov

Total scattering encompasses both Bragg and diffuse scattering, enabling data analysis and modeling to extract structural information from both an average and local perspective. Since the resurgence of total scattering in the late 1980s, there has been a continuous emphasis on studying local disorder in various functional materials. This session aims to showcase recent applications of total scattering in investigating local disorder in energy storage materials, catalysts, magnetic systems, and other areas of interest. Furthermore, the session will explore recent and future advancements and challenges in instrumentation, data processing, analysis methodologies, and software tools. As the total scattering community continues to expand, this platform seeks to foster education, communication, and envision the future of the field.

Invited Speakers:
RMCProfile: Local Structure of Disordered Crystalline Materials
Matt Tucker, Oak Ridge National Laboratory, USA

Local Structures in Crystalline Oxides and Molten Salts
Xin Wang, Oak Ridge National Laboratory, USA

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Informatics for Powder Diffraction

Chair: TBD

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Quantitative Analysis of XRD

Chair: Scott Misture, Alfred University, USA, misture@alfred.edu

General XRF

Chair: Ursula Fittschen, TU Clausthal, Clausthal-Zellerfeld, Germany, ursula.fittschen@tu-clausthal.de

Authors are invited to submit X-ray fluorescence and related X-ray technique papers to the general XRF session. Such papers on topics that do not fit well into other specific sessions can be submitted to the General XRF session.

Invited Speakers:
Operando Chemical Analysis of Batteries by Quantitative X-ray Spectrometry
Burkhard Beckhoff, Physikalisch-Technische Bundesanstalt, Germany

Development of a Multi-Modal Laboratory Setup for Performance Mapping of Semiconductor Devices
Sven Hampel, Deutsches Elektronen-Synchrotron DESY, Germany

GIMOXS: A Versatile X-ray Spectrometer for TXRF (C to U) and Grazing Incidence XRF for Nanomaterial Characterization in the Lab
Dieter Ingerle, TU Wien, Austria

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Industrial Applications XRF

Chair: Poulami Dutta, Dow Chemical Company, USA, pdutta1@dow.com

This session will consist of presentations where EDXRF and/or WDXRF are used either for routine elemental characterization or to help solve problems in industry or other settings such as government or academia. Submissions can entail quantitative and/or qualitative XRF applications.

Invited Speakers:
A Robust Ten-element XRF Calibration – How Far Can We Push Fundamental Parameters Approach?
Ying Shi, UL Materials Discovery Research Institute, USA

Evaluation of the Bruker S2 PUMA XRF for Analyzing Air Filters in the Chemical Speciation Network
Jiayuan Wang, University of California, Davis, USA

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Spatially-Resolved Benchtop Micro-XRF

Chair: Tina Hill, Bruker, USA, tina.hill@bruker.com

This session, focused solely on the possibilities and current analytical performance of benchtop micro-XRF, will emphasize a wide range of applications demonstrating how recent technological advancements have significantly enhanced the performance and data yield of micro-XRF. These enhancements include better excitation sources, improved detection capabilities, and better signal processing, which have served to elevate this technique to higher prominence in recent years. Even so, micro-XRF isn’t yet part of many industrial and academic standard analytical techniques despite its relatively universal application possibilities. Examples from a wide variety of applications is encouraged, highlighting the broad use of the fast non-destructive analysis and ability to study well-defined small sample areas and inhomogeneous materials at high spatial resolution.

Invited Speakers:
Application of Micro-XRF: Key Stages in Novel Dry Electrode Production
Danielle DeCapito, Dragonfly Energy, USA

Development and Application of Nano-Pellets as Reference Materials for Micro-XRF
Simon Norstad, myStandards, USA

Implementation of Micro X-Ray Fluorescence Spectroscopy for Astromaterial Curation and Research
Evan O’Neal, NASA Johnson Space Center, USA

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Trace Environmental, including TXRF

Chair: Martina Schmeling, Loyola University Chicago, USA, mschmel@luc.edu

The Trace Environmental Analysis Session aims to present an overview of the current status and evolving trends in research related to trace analysis of samples in the broader environmental context using X-ray based methods. Applications in all fields related to the environment including papers describing instrumentation, research methodology or monitoring aspects are welcome. This includes also those which address angle resolved approaches like GIXRF, TXRF, and GEXRF as well as papers combining different techniques. Papers describing novel applications are particularly encouraged.

Invited Speaker:
Total Reflection X-Ray Fluorescence: A Green Approach for Multi-Element Analysis of Biological Fluids
Jasna Jablan, University of Zagreb, Croatia

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Quantitative Analysis of XRF

Chair: TBD

Papers accepted for presentation in the Quantitative XRF Session should discuss applications of quantitative XRF (any type of XRF technology), and/or in general key parameters or novel ideas related to improving methods for quantitative XRF.