50th Annual (2001) Denver X-ray Conference™
Sheraton Steamboat Resort
Steamboat Springs, Colorado, U.S.A.
30 July – 3 August

2001 Denver X-ray Conference™ > Thursday Sessions
Steamboat Springs, Colorado, USA - 30th July - 3rd August 2001

Session, Thursday a.m. (Sunshine Peak)
XRD & XRF

Session C-2 Synchrotron Applications
Organized by: A.T. Macrander, Argonne National Laboratory, Argonne, IL

8:00 D-150 MATERIALS CHARACTERIZATION BY MICROFOCUSSED HIGH ENERGY
X-RAYS – Invited
U. Lienert, Argonne National Laboratory, Argonne, IL
8:30 D-131 INVESTIGATION OF LOAD-TRANSFER IN Ta-REINFORCED BULK METALLIC
GLASSES USING HIGH-ENERGY X-RAY DIFFRACTION
D.K. Balch, D.C. Dunand, Northwestern University, Evanston, IL
E. Ustundag, S.Y. Lee, California Institute of Technology, Pasadena, CA
8:50 D-132 DAMAGE EVOLUTION IN TiSiC UNIDIRECTIONAL FIBER COMPOSITES
G.A. Swift, J.C. Hanan, E. Ustundag, B. Clausen, California Institute of
Technology, Pasadena, CA
I.J. Beyerlein, Los Alamos National Laboratory, Los Alamos, NM
J. Almer, U. Lienert, D. Haeffner, Argonne National Laboratory, Argonne, IL
9:10 D-086 NOVEL X-RAY DIFFRACTION TECHNIQUE FOR STRAIN MEASUREMENTS
USING AREA DETECTOR – Invited
Y.S. Chu, D.C. Mancini, F. de Carlo, J.D. Almer, D.R. Haeffner, Argonne
National Laboratory, Argonne, IL
9:40 D-117 CHARACTERIZATION OF NANOMETER LAYERED STRUCTURES USING
MULTIPLE WAVELENGTH X-RAY REFLECTIVITY AND SIMULATED
ANNEALING DATA ANALYSIS
E. Ziegler, C. Ferrero, C. Chapron, C. Morawe, European Synchrotron
Radiation Facility, Grenoble, France
10:00 D-123 IN SITU HIGH-TEMPERATURE STUDY OF SILVER BEHENATE REDUCTION TO
SILVER METAL USING SYNCHROTRON RADIATION
T. Blanton, M. Lelental, Eastman Kodak Company, Rochester, NY
S. Zdzieszynski, S.T. Misture, NYS College of Ceramics at Alfred University,
Alfred, NY
10:20 BREAK BREAK
10:40 D-062 THE ELECTRON DENSITY DISTRIBUTION OF Ti AND O OCTAHEDORON IN
PEROVSKITE TYPE OXIDE CRYSTALS ANALYSED BY MAXIMUM ENTROPY
METHOD
J. Harada, Rigaku Corporation, Tokyo, Japan
M. Sakata, A. Yoshida, E. Nishibori, M. Takata, Nagoya University, Nagoya, Japan
Y. Akishige, Shimane University, Matsue, Japan
Y. Kuroiwa, Okayama University, Okayama, Japan
11:00 D-006 VARIABLE ENERGY X-RAY REFLECTIVITY AND REFLECTION ABSORPTION
FINE STRUCTURE
B.K. Tanner, T.P.A. Hase, B.D. Fulthorpe, University of Durham, Durham,
United Kingdom
G.M. Luo, Z.H. Mai, Chinese Academy of Sciences, Beijing, China
C.H. Marrows, B.J. Hickey, University of Leeds, Leeds, United Kingdom
11:20 F-11 SYNCHROTRON RADIATION XRF MICROPROBE STUDY OF HUMAN BONE
TUMOR AND HUMAN FEMORAL HEAD SLICES
Y. Huang, W. He, Beijing Synchrotron Radiation Facility, Beijing, China
Y. Zhang, Shanghai Institute of Nuclear Research, Shanghai, China
J. Lu, 306 Hospital of the People’s Liberation Army of China, Beijing, China
W. Liao, Shanghai No. 9 People’s Hospital, Shanghai, China
11:40 F-29 LOW-ENERGY X-RAY FLUORESCENCE ANALYSIS BASED ON
HIGH-RESOLUTION SUPERCONDUCTING TUNNEL JUNCTION DETECTORS
B. Beckhoff, R. Fliegauf, G. Ulm, Physikalisch-Technische Bundesanstalt,
Berlin, Germany
12:00 F-35 SYNCHROTRON RADIATION INDUCED -X-RAY FLUORESCENCE AND
ABSORPTION SPECTROSCOPY ON MUNICIPAL SOLID WASTE FLY ASHES
M.C. Camerani, B.M. Steenari, O. Lindqvist, Chalmers University of
Technology, Göteborg, Sweden
A. Somogyi, University of Antwerp, Antwerp, Belgium
A. Simionovici, S. Ansell, European Synchrotron Radiation Facility, Grenoble,
France

        

Session, Thursday a.m. (Buddy’s Run)
XRD

Session D-3 Industrial Applications – XRD
Organized by: F. Chung, Consultant, The Marson Corporation, Boston, MA

8:00 D-003 NON-TRADITIONAL POWDER CRYSTALLOGRAPHY IN THE PETROCHEMICAL
INDUSTRY – Invited
J.A. Kaduk, BP Amoco Chemicals, Naperville, IL
8:30 D-077 RIETVELD MODELING OF ETA AND GAMMA ALUMINA
R.W. Morton, J.F. Geibel, J.J. Gislason, R.L. Heald, D.E. Lauffer, M.
Sardashti
, Phillips Petroleum Company - Corporate Technology, Bartlesville, OK
D.E. Simon, DES Consulting, Broken Arrow, OK
8:50 D-067 SURFACE AREA DETERMINATION OF INTERSTRATIFIED HYLLOSILICATES IN
ATHABASCA OIL SANDS FROM SYNCHROTRON X-RAY SCATTERING DOMAIN
SIZE
O.E. Omotoso, R.J. Mikula, Natural Resources Canada, Devon AB, Canada
P.W. Stephens, SUNY, Stony Brook, NY
9:10 D-066 CALIBRATION MONITORING OF DIFFRACTOMETERS
G. Berti, M. D’Acunto, University of Pisa, Pisa, Italy
9:30 D-143 X-RAY DIFFRACTION IN THE MICROELECTRONICS INDUSTRY – Invited
C.C. Goldsmith, P. De Haven, T.L. Nunes (retired), IBM Microelectronics, Hopewell Junction, NY
I.C. Noyan, IBM, Yorktown Heights, NY
10:00 BREAK BREAK
10:30 D-073 X-RAY DIFFRACTION IN ALUMINIUM INDUSTRY
K.V. Krishnan, Jawaharlal Nehru Aluminium Research Development & Design
Centre, Nagpur, India
10:50 D-070 ONLINE AND REAL-TIME QUANTIFICATION OF CEMENT CLINKERS USING XRD
A. Kern, R. Schmidt, Bruker AXS GmbH, Karlsruhe, Germany
11:10 D-125 X-RAY DIFFRACTION AS A PROCESS CONTROL TOOL IN SUPERCONDUCTOR
APPLICATIONS
K.J. Kozaczek, R.I. Martin, D.S. Kurtz, P.R. Moran, S.P. O’Leary, Hypernex,
Inc., State College, PA
11:30 D-022 DETERMINATION OF EMITTER PARAMETERS IN GaInP/GaAs HETEROJUNCTION
BIPOLAR TRANSISTORS BY X-RAY DIFFRACTION
A. Shen, E. Griswold, G. Hillier, L. Dang, D. Clark, I. Calder, High
Performance Optical Component Solutions, Nortel Networks, Ontario, Canada

     
  
  
  

Session, Thursday a.m. (Twilight)
XRD

Session D-4 Polymer Structure I: Multi Probe Studies
Organized by: K.H. Gardner, DuPont Company – CRD, Willmington, DE
co-Chair: N.S. Murthy, Honeywell Laboratories, Morristown, NJ

8:00 D-081 ELECTRON DIFFRACTION CHARACTERIZATION OF NASCENT CONDENSATION POLYMERS – Invited
P.H. Geil, University of Illinois at Urbana-Champaign, Urbana, IL
8:30 D-021 EMERGENCE OF POLYMER PROPERTIES IN POLY-DISPERSE CHAIN
ASSEMBLIES — THE STRUCTURAL DISTINCTION BETWEEN LOW
MOLECULAR WEIGHT LINEAR POLYETHYLENE AND PETROLEUM
WAXES REVEALED BY ELECTRON CRYSTALLOGRAPHY – Invited
D.L. Dorset, ExxonMobil Research & Engineering Company, Annandale, NJ
9:00 D-019 LOW DOSE HIGH RESOLUTION ELECTRON MICROSCOPY (HREM) OF
POLY(METAPHENYLENE ISOPHTHALAMIDE) (MPDI) TWISTED CRYSTALS
D.C. Martin, The University of Michigan, Ann Arbor, MI
D.P. Lawrence, Flint Ink, Ann Arbor, MI
C. Kübel, Philips Research Laboratories, Eindhoven, The Netherlands
9:20 D-068 THE STRUCTURE OF POLY(SILYLENEMETHYLENE)S
S.-Y. Park, B.L. Farmer, Air Force Research Laboratory, Wright-Patterson Air
Force Base, OH
T. Zhang, L.V. Interrante, Rensselaer Polytechnic Institute, Troy, NY
9:40 D-138 DNA-LINKED NANOPARTICLE MATERIALS: OPTICAL, ELECTRICAL, AND
STRUCTURAL PROPERTIES
A.A. Lazarides, Northwestern University, Evanston, IL
10:00 BREAK BREAK
10:30 D-126 DOUBLE-TWISTED HELICAL LAMELLAR CRYSTALS IN A SYNTHETIC
MAIN-CHAIN CHIRAL POLYESTER DETERMINED USING DIFFRACTION
METHODS – Invited
S.Z.D. Cheng, C.Y. Li, S. Jin, University of Akron, Akron, OH
11:00 D-041 NEUTRON AND SYNCHROTRON X-RAY FIBER DIFFRACTION STUDIES OF
CELLULOSE POLYMORPHS
Y. Nishiyama, The University of Tokyo, Tokyo, Japan
P. Langan, Los Alamos National Laboratory, Los Alamos, NM
H. Chanzy, CNRS, Grenoble, France
11:20 D-147 X-RAY AND NEUTRON FIBRE DIFFRACTION IN THE CHARACTERISATION OF
BIOLOGICAL & INDUSTRIAL POLYMERS
V.T. Forsyth, I. Parrot, Institute Laue Langevin, Grenoble, France and Keele
University, Staffordshire, United Kingdom
K.H. Gardner, DuPont CR & D, Wilmington, DE
C. Martin, Keele University, Staffordshire, United Kingdom
11:40 D-110 EXCLUDED VOLUME INTERACTIONS BETWEEN CORONAL CHAINS IN BLOCK
COPOLYMER MICELLES: A SANS AND SIMULATION STUDY
J.S. Pedersen, University of Aarhus, Aarhus C, Denmark
C. Svaneborg, M.C. Gerstenberg, K. Almdal, Risø National Laboratory,
Roskilde, Denmark
I.W. Hamley, University of Leeds, Leeds, England
R.N. Young, University of Sheffield, Sheffield, England

        

Session, Thursday a.m. (Rainbow)
XRF

Session F-2 Capillary Optics
Organized by: G.J. Havrilla, Los Alamos National Laboratory, Los Alamos, NM

8:00 F-64 POLY-CAPILLARY BASED MICRO-XRF AND MICRO-XANES BY MEANS OF
CONVENTIONAL AND SYNCHROTRON RADIATION – Invited
K. Janssens, University of Antwerp (UIA), Antwerp, Belgium
8:30   POLYCAPILLARY OPTICS: AN ENABLING TECHNOLOGY FOR NEW
APPLICATIONS – Invited
D. Gibson, X-ray Optical Systems, Albany, NY
9:00 F-14 DUAL-CAPILLARY OPTIC MXRF
G.J. Havrilla, Los Alamos National Laboratory, Los Alamos, NM
N. Gao, X-ray Optical Systems, Albany, NY
9:20 F-19 POLYCAPILLARY OPTICS AND X-RAY ANALYTICAL TECHNIQUES
Y. Yan, X-ray Optical Systems, Inc., Albany, NY and Beijing Normal University,
Beijing, P.R. China
W.M. Gibson, X-ray Optical Systems, Inc., Albany, NY and University at Albany,
SUNY, NY
9:40 F-09 X-RAY FLUORESCENCE MICROANALYSIS OF BIOMEDICAL AND ENVIRONMENTAL
SAMPLES – Invited
M. Lankosz, M. Boruchowska, J. Ostachowicz, University of Mining & Metallurgy, Kraków, Poland
10:10 F-52 MICRO X-RAY FLUORESCENCE SPECTROSCOPY FOR QUALITY CONTROL OF
LAYERED MATERIAL
A. Wittkopp, F. Ferrandino, NeXray, Ronkonkoma, NY
10:30  BREAK BREAK
10:50 F-39 A COMPACT, POLYCAPILLARY-BASED MICRO X-RAY FLUORESCENCE
ANALYSIS SYSTEM
N. Gao, I. Ponomarev, D. Gibson, X-ray Optical Systems, Inc., Albany, NY
11:10 F-43 NON-DESTRUCTIVE ANALYSIS OF COMPLEX LAYER STRUCTURES USING
MICRO X-RAY FLUORESCENCE
B. Scruggs, EDAX, Inc., Mahwah, NJ
M. Haschke, A. Wittkopp, Röntgenanalytik Messtechnik GmbH, Taunusstein,
Germany
11:30 F-53 X-RAY MICROBEAM FOR CHARACTERIZATION OF COMBINATORIAL THIN FILMS
W. Chang, J. Kerner, E. Franco, ARACOR, Sunnyvale, CA
X.D. Xiang, Y.Q. Li, Intematix Corporation, Moraga, CA

    

Session, Thursday p.m. (Sunshine Peak)
XRD & XRF

Session C-3 Electron Beam
Organized by: R. Goehner, Sandia National Laboratories, Albuquerque, NM

2:00 F-60 STEM/SEM X-RAY SPECTRUM IMAGES: FINDING THE NEEDLE IN THE
HAYSTACK – Invited
P.G. Kotula, M.R. Keenan, Sandia National Laboratories, Albuquerque, NM
2:30 D-020 A REVIEW OF CONVERGENT-BEAM ELECTRON DIFFRACTION (CBED) – Invited
A. Eades, Lehigh University, Bethlehem, PA
3:00 D-116 ELECTRON BACKSCATTER DIFFRACTION – Invited
A.J. Schwartz, Lawrence Livermore National Laboratory, Livermore, CA
J.R. Michael, Sandia National Laboratories, Albuquerque, NM
3:30 BREAK BREAK
4:00 D-064 PRACTICAL DESIGN CONSIDERATIONS OF EBSD SYSTEMS
P.P. Camus, D.B. Rohde, Thermo NORAN, Middleton, WI
4:20 D-048 EBSD CAMERA CALIBRATION: THE MOVING SCREEN TECHNIQUE REVISITED
D.A. Carpenter, G.D. Richardson, L.R. Mooney, Y-12 National Security
Complex, Oak Ridge, Tennessee
4:40 D-075 MICRODIFFRACTION ANALYSIS OF FIBROUS TALC: ASBESTOS IN CRAYONS
J.R. Verkouteren, National Institute of Standards & Technology, Gaithersburg, MD
A.G. Wylie, University of Maryland, College Park, MD

  

Session, Thursday p.m. (Rainbow)
XRD

Session D-5 Stress Analysis I
Organized by: C.C. Goldsmith, IBM Microelectronics, Hopewell Junction, NY
co-Chair: T. Sasaki, Kanazawa University, Kanazawa, Japan

2:00 D-018 MINIATURIZATION OF X-RAY STRESS ANALYZER
T. Goto, Y. Gong, Fukui University of Technology, Nara, Japan
2:20 D-029 STRAIN AND STRESS CHARACTERISATION IN THIN FILMS AND SANDWICH
STRUCTURES AT ELEVATED TEMPERATURES
J. Keckes, University of Leoben, Leoben, Austria
2:40 D-027 SELFCONSISTENT DETERMINATION OF THE X-RAY ELASTIC CONSTANTS OF
POLYCRYSTALLINE MATERIALS FOR ARBITRARY CRYSTAL SYMMETRY
N. Koch, H. Wern, HTW des Saarlandes, Saarbrücken, Germany
3:00 D-112 MICRO-STRAIN IN Y0.5R0.5Ba2Cu3O7-x (R=Yb, Tm, Er, Ho, Dy, Gd, Eu, Sm, AND Nd)
E.J. Peterson, W.L. Hults, M. Simpson, J.L. Smith, Los Alamos National Laboratory, Los Alamos, NM
3:20 BREAK BREAK
3:40 D-129 STRAIN EVOLUTION AFTER FIBER FAILURE IN SINGLE FIBER METAL
MATRIX COMPOSITES
J.C. Hanan, E. Ustundag, G.A. Swift, B. Clausen, California Institute of
Technology, Pasadena, CA
I.J. Beyerlein, D.W. Brown, M.A.M. Bourke, Los Alamos National Laboratory,
Los Alamos, NM
4:00 D-083 MEASUREMENT OF RESIDUAL STRESSES IN FIBER REINFORCED
COMPOSITES BASED ON X-RAY DIFFRACTION
B. Benedikt, P.K. Predecki, L. Kumosa, M. Kumosa, University of Denver,
Denver, CO
4:20 D-004 COMPACT X-RAY DIFFRACTION TECHNIQUE
A. Mozelev, Small Scale Research & Production Company RADICAL, Friedrichsdorf, Germany

 

Session, Thursday p.m. (Twilight)
XRD

Session D-6 Polymer Structure II & III: IN SITU STRUCTURE
DEVELOPMENT/2D WAXS AND SAXS DATA ANALYSIS
Organized by: R. Barton, Jr., DuPont Experimental Station, Wilmington, DE
co-Chair: J.D. Londono, DuPont Company – CRD, Wilmington, DE

1:30 D-002 RECENT WORK ON STRAIN-INDUCED CRYSTALLIZATION – Invited
J. Kornfield, California Institute of Technology, Pasadena, CA
2:00 D-124 X-RAY SCATTERING STUDIES OF THE EARLY STAGES OF CRYSTALLIZATION
IN POLYMER FIBERS – Invited
J.M. Schultz, University of Delaware, Newark, DE
2:30 D-108 SAXS STUDIES OF POLYMER MELTING
B. Crist, Northwestern University, Evanston, IL
2:50 D-061 UNFOLDING OF ULTRA-LONG ALKANES BY X-RAY DIFFRACTION
A.E. Terry, European Synchrotron Radiation Facility, Grenoble, France
J.K. Hobbs, T.L. Phillips, University of Bristol, Bristol, United Kingdom
3:10 D-107 IN-SITU SAXS ON A PERFLUOROSULFONATE IONOMER
J.D. Londono, S. Mazur, R.V. Davidson, E.I. DuPont De Nemours, DuPont
CR&D, Wilmington, DE
3:30 BREAK BREAK
3:50 D-140 APPLICATION OF SYNCHROTRON RADIATION IN THE STUDIES OF UNIAXIAL
AND BIAXIAL DEFORMATION OF POLYMERS – Invited
A. Mahendrasingam, C. Martin, S. Bingham, A.K. Wright, D.J. Blundell, W.
Fuller
, Keele University, Staffordshire, United Kingdom
4:20 D-121 FULL-PATTERN PARAMETERIZATION OF 2-D SMALL-ANGLE SCATTERING
DATA FROM ORIENTED POLYMERS AND SIGNIFICANCE OF THESE
PARAMETERS – Invited
N.S. Murthy, Honeywell Laboratories, Morristown, NJ
D.T. Grubb, Cornell University, Ithaca, NY
4:50  D-047 CHARACTERIZATION OF CRYSTALLINITY IN POLYPROPYLENE BY WIDE
ANGLE X-RAY DIFFRACTION
J.H. Butler, ExxonMobil Chemical Company, Baytown, TX
D.J. Winter, R.B. Ortega, AMIA Laboratories, The Woodlands, TX
5:10 D-035 TEXTURE EVOLUTION IN ETHYLENE-OCTANE COPOLYMER DURING
UNIAXIAL TENSION
D. Li, H. Garmestani, FAMU-FSU College of Engineering, Tallahassee, FL
5:30 D-134 THREE-DIMENSIONAL MICROSTRUCTURE BY SAS AND WAD USING
TEMPERATURE-INDUCED CONTRAST VARIATION
J.D.Barnes, JDB Science, Chevy Chase, MD
R. Kolb, Exxon-Mobil Corp.
W. Bras, Dubble ESRF

 

Session, Thursday p.m. (Buddy’s Run)
XRF

Session F-3 TXRF
Organized by: M.A. Zaitz, IBM Microelectronics, Hopewell Junction, NY

1:40 F-28 TXRF ANALYSIS OF LOW Z ELEMENTS ON SILICON WAFER SURFACES
EXCITED BY MONOCHROMATIZED UNDULATOR RADIATION
B. Beckhoff, R. Fliegauf, G. Ulm, J. Weser, Physikalisch-Technische
Bundesanstalt, Berlin, Germany
G. Pepponi, C. Streli, P. Wobrauschek, Atominstitut der Österreichischen
Universitäten, Wien, Austria
L. Fabry, S. Pahlke, Wacker Siltronic AG, Burghausen, Germany
2:00 F-50 SYNCHROTRON RADIATION TXRF: NEW RESULTS
P. Pianetta, K. Baur, S. Brennan, A. Singh, Stanford Synchrotron Radiation
Laboratory, Stanford, CA
2:20 F-08 TXRF FOR SEMICONDUCTOR APPLICATIONS – Invited
Y. Mori, Nippon Steel Corporation, Yamaguchi, Japan
2:50 F-22 TOTAL REFLECTION X-RAY FLUORESCENCE FOR ENVIRONMENTAL
SAMPLES – Invited
M. Schmeling, Loyola University Chicago, Chicago, IL
3:20 BREAK BREAK
3:40 F-48 FOCUSED BEAM TOTAL REFLECTION X-RAY FLUORESCENCE ANALYSIS
USING DOUBLY CURVED CRYSTAL OPTICS
Z.W. Chen, X-ray Optical Systems, Inc., Albany, NY
4:00 F-12 STUDY OF THE DIFFUSING BEHAVIOR OF MoO3 and ZnO ON OXIDE THIN
FILMS BY SYNCHROTRON RADIATION TXRF
Y. Huang, W. He, Beijing Synchrotron Radiation Facility, Beijing, China
W. Xu, J. Xu, N. Wu, J. Yan, Y. Xie, Institute of Physical Chemistry, Peking
University, Beijing, China
Y. Zhu, Analysis Center, Tsinghua University, Beijing, China
4:20 F-17 INVESTIGATION OF ADSORBED MERCURY DISTRIBUTION IN SILVER COATED
FILTERS BY X-RAY FLUORESCENCE METHODS
S. Kurunczi, Sz. Török, KFKI - Atomic Energy Research Institute, Budapest, Hungary
J.W. Beal, Fairfield University, Fairfield, CT
4:40 C-1 PHYSICS AND PRACTICAL USING OF A PLANAR X-RAY WAVEGUIDE
V.K. Egorov, IPMT RAS, Chernogolovka, Moscow Dist., Russia
E.V. Egorov, MEPhI, Moscow, Russia

For more information please contact Denise Zulli - zulli@icdd.com