2001 Denver X-ray Conference™ > Thursday Sessions Steamboat Springs, Colorado, USA - 30th July - 3rd August 2001 2001 DXC - Quick Links Choose One DXC 2001 Home 2001 DXC Summary Accommodations and Travel Registration Information Exhibitor Information Evening Technical Sessions and Social Functions General Information Monday Workshops Tuesday Workshops Monday XRD Poster Session I Tuesday XRD Poster Session II Wednesday XRF Poster Session Thursday 50th Anniversary Poster Session Wednesday Sessions - including Plenary Thursday Sessions Friday Sessions Summer Activities in Steamboat Springs Directions to Sheraton Steamboat Resort Hotel Layout and Local Maps Travel Form Program at a Glance DXC Main Home Session, Thursday a.m. (Sunshine Peak) XRD & XRF Session C-2 Synchrotron Applications Organized by: A.T. Macrander, Argonne National Laboratory, Argonne, IL 8:00 D-150 MATERIALS CHARACTERIZATION BY MICROFOCUSSED HIGH ENERGY X-RAYS – Invited U. Lienert, Argonne National Laboratory, Argonne, IL 8:30 D-131 INVESTIGATION OF LOAD-TRANSFER IN Ta-REINFORCED BULK METALLIC GLASSES USING HIGH-ENERGY X-RAY DIFFRACTION D.K. Balch, D.C. Dunand, Northwestern University, Evanston, IL E. Ustundag, S.Y. Lee, California Institute of Technology, Pasadena, CA 8:50 D-132 DAMAGE EVOLUTION IN TiSiC UNIDIRECTIONAL FIBER COMPOSITES G.A. Swift, J.C. Hanan, E. Ustundag, B. Clausen, California Institute of Technology, Pasadena, CA I.J. Beyerlein, Los Alamos National Laboratory, Los Alamos, NM J. Almer, U. Lienert, D. Haeffner, Argonne National Laboratory, Argonne, IL 9:10 D-086 NOVEL X-RAY DIFFRACTION TECHNIQUE FOR STRAIN MEASUREMENTS USING AREA DETECTOR – Invited Y.S. Chu, D.C. Mancini, F. de Carlo, J.D. Almer, D.R. Haeffner, Argonne National Laboratory, Argonne, IL 9:40 D-117 CHARACTERIZATION OF NANOMETER LAYERED STRUCTURES USING MULTIPLE WAVELENGTH X-RAY REFLECTIVITY AND SIMULATED ANNEALING DATA ANALYSIS E. Ziegler, C. Ferrero, C. Chapron, C. Morawe, European Synchrotron Radiation Facility, Grenoble, France 10:00 D-123 IN SITU HIGH-TEMPERATURE STUDY OF SILVER BEHENATE REDUCTION TO SILVER METAL USING SYNCHROTRON RADIATION T. Blanton, M. Lelental, Eastman Kodak Company, Rochester, NY S. Zdzieszynski, S.T. Misture, NYS College of Ceramics at Alfred University, Alfred, NY 10:20 BREAK BREAK 10:40 D-062 THE ELECTRON DENSITY DISTRIBUTION OF Ti AND O OCTAHEDORON IN PEROVSKITE TYPE OXIDE CRYSTALS ANALYSED BY MAXIMUM ENTROPY METHOD J. Harada, Rigaku Corporation, Tokyo, Japan M. Sakata, A. Yoshida, E. Nishibori, M. Takata, Nagoya University, Nagoya, Japan Y. Akishige, Shimane University, Matsue, Japan Y. Kuroiwa, Okayama University, Okayama, Japan 11:00 D-006 VARIABLE ENERGY X-RAY REFLECTIVITY AND REFLECTION ABSORPTION FINE STRUCTURE B.K. Tanner, T.P.A. Hase, B.D. Fulthorpe, University of Durham, Durham, United Kingdom G.M. Luo, Z.H. Mai, Chinese Academy of Sciences, Beijing, China C.H. Marrows, B.J. Hickey, University of Leeds, Leeds, United Kingdom 11:20 F-11 SYNCHROTRON RADIATION XRF MICROPROBE STUDY OF HUMAN BONE TUMOR AND HUMAN FEMORAL HEAD SLICES Y. Huang, W. He, Beijing Synchrotron Radiation Facility, Beijing, China Y. Zhang, Shanghai Institute of Nuclear Research, Shanghai, China J. Lu, 306 Hospital of the People’s Liberation Army of China, Beijing, China W. Liao, Shanghai No. 9 People’s Hospital, Shanghai, China 11:40 F-29 LOW-ENERGY X-RAY FLUORESCENCE ANALYSIS BASED ON HIGH-RESOLUTION SUPERCONDUCTING TUNNEL JUNCTION DETECTORS B. Beckhoff, R. Fliegauf, G. Ulm, Physikalisch-Technische Bundesanstalt, Berlin, Germany 12:00 F-35 SYNCHROTRON RADIATION INDUCED -X-RAY FLUORESCENCE AND ABSORPTION SPECTROSCOPY ON MUNICIPAL SOLID WASTE FLY ASHES M.C. Camerani, B.M. Steenari, O. Lindqvist, Chalmers University of Technology, Göteborg, Sweden A. Somogyi, University of Antwerp, Antwerp, Belgium A. Simionovici, S. Ansell, European Synchrotron Radiation Facility, Grenoble, France          Session, Thursday a.m. (Buddy’s Run) XRD Session D-3 Industrial Applications – XRD Organized by: F. Chung, Consultant, The Marson Corporation, Boston, MA 8:00 D-003 NON-TRADITIONAL POWDER CRYSTALLOGRAPHY IN THE PETROCHEMICAL INDUSTRY – Invited J.A. Kaduk, BP Amoco Chemicals, Naperville, IL 8:30 D-077 RIETVELD MODELING OF ETA AND GAMMA ALUMINA R.W. Morton, J.F. Geibel, J.J. Gislason, R.L. Heald, D.E. Lauffer, M. Sardashti, Phillips Petroleum Company - Corporate Technology, Bartlesville, OK D.E. Simon, DES Consulting, Broken Arrow, OK 8:50 D-067 SURFACE AREA DETERMINATION OF INTERSTRATIFIED HYLLOSILICATES IN ATHABASCA OIL SANDS FROM SYNCHROTRON X-RAY SCATTERING DOMAIN SIZE O.E. Omotoso, R.J. Mikula, Natural Resources Canada, Devon AB, Canada P.W. Stephens, SUNY, Stony Brook, NY 9:10 D-066 CALIBRATION MONITORING OF DIFFRACTOMETERS G. Berti, M. D’Acunto, University of Pisa, Pisa, Italy 9:30 D-143 X-RAY DIFFRACTION IN THE MICROELECTRONICS INDUSTRY – Invited C.C. Goldsmith, P. De Haven, T.L. Nunes (retired), IBM Microelectronics, Hopewell Junction, NY I.C. Noyan, IBM, Yorktown Heights, NY 10:00 BREAK BREAK 10:30 D-073 X-RAY DIFFRACTION IN ALUMINIUM INDUSTRY K.V. Krishnan, Jawaharlal Nehru Aluminium Research Development & Design Centre, Nagpur, India 10:50 D-070 ONLINE AND REAL-TIME QUANTIFICATION OF CEMENT CLINKERS USING XRD A. Kern, R. Schmidt, Bruker AXS GmbH, Karlsruhe, Germany 11:10 D-125 X-RAY DIFFRACTION AS A PROCESS CONTROL TOOL IN SUPERCONDUCTOR APPLICATIONS K.J. Kozaczek, R.I. Martin, D.S. Kurtz, P.R. Moran, S.P. O’Leary, Hypernex, Inc., State College, PA 11:30 D-022 DETERMINATION OF EMITTER PARAMETERS IN GaInP/GaAs HETEROJUNCTION BIPOLAR TRANSISTORS BY X-RAY DIFFRACTION A. Shen, E. Griswold, G. Hillier, L. Dang, D. Clark, I. Calder, High Performance Optical Component Solutions, Nortel Networks, Ontario, Canada                Session, Thursday a.m. (Twilight) XRD Session D-4 Polymer Structure I: Multi Probe Studies Organized by: K.H. Gardner, DuPont Company – CRD, Willmington, DE co-Chair: N.S. Murthy, Honeywell Laboratories, Morristown, NJ 8:00 D-081 ELECTRON DIFFRACTION CHARACTERIZATION OF NASCENT CONDENSATION POLYMERS – Invited P.H. Geil, University of Illinois at Urbana-Champaign, Urbana, IL 8:30 D-021 EMERGENCE OF POLYMER PROPERTIES IN POLY-DISPERSE CHAIN ASSEMBLIES — THE STRUCTURAL DISTINCTION BETWEEN LOW MOLECULAR WEIGHT LINEAR POLYETHYLENE AND PETROLEUM WAXES REVEALED BY ELECTRON CRYSTALLOGRAPHY – Invited D.L. Dorset, ExxonMobil Research & Engineering Company, Annandale, NJ 9:00 D-019 LOW DOSE HIGH RESOLUTION ELECTRON MICROSCOPY (HREM) OF POLY(METAPHENYLENE ISOPHTHALAMIDE) (MPDI) TWISTED CRYSTALS D.C. Martin, The University of Michigan, Ann Arbor, MI D.P. Lawrence, Flint Ink, Ann Arbor, MI C. Kübel, Philips Research Laboratories, Eindhoven, The Netherlands 9:20 D-068 THE STRUCTURE OF POLY(SILYLENEMETHYLENE)S S.-Y. Park, B.L. Farmer, Air Force Research Laboratory, Wright-Patterson Air Force Base, OH T. Zhang, L.V. Interrante, Rensselaer Polytechnic Institute, Troy, NY 9:40 D-138 DNA-LINKED NANOPARTICLE MATERIALS: OPTICAL, ELECTRICAL, AND STRUCTURAL PROPERTIES A.A. Lazarides, Northwestern University, Evanston, IL 10:00 BREAK BREAK 10:30 D-126 DOUBLE-TWISTED HELICAL LAMELLAR CRYSTALS IN A SYNTHETIC MAIN-CHAIN CHIRAL POLYESTER DETERMINED USING DIFFRACTION METHODS – Invited S.Z.D. Cheng, C.Y. Li, S. Jin, University of Akron, Akron, OH 11:00 D-041 NEUTRON AND SYNCHROTRON X-RAY FIBER DIFFRACTION STUDIES OF CELLULOSE POLYMORPHS Y. Nishiyama, The University of Tokyo, Tokyo, Japan P. Langan, Los Alamos National Laboratory, Los Alamos, NM H. Chanzy, CNRS, Grenoble, France 11:20 D-147 X-RAY AND NEUTRON FIBRE DIFFRACTION IN THE CHARACTERISATION OF BIOLOGICAL & INDUSTRIAL POLYMERS V.T. Forsyth, I. Parrot, Institute Laue Langevin, Grenoble, France and Keele University, Staffordshire, United Kingdom K.H. Gardner, DuPont CR & D, Wilmington, DE C. Martin, Keele University, Staffordshire, United Kingdom 11:40 D-110 EXCLUDED VOLUME INTERACTIONS BETWEEN CORONAL CHAINS IN BLOCK COPOLYMER MICELLES: A SANS AND SIMULATION STUDY J.S. Pedersen, University of Aarhus, Aarhus C, Denmark C. Svaneborg, M.C. Gerstenberg, K. Almdal, Risø National Laboratory, Roskilde, Denmark I.W. Hamley, University of Leeds, Leeds, England R.N. Young, University of Sheffield, Sheffield, England          Session, Thursday a.m. (Rainbow) XRF Session F-2 Capillary Optics Organized by: G.J. Havrilla, Los Alamos National Laboratory, Los Alamos, NM 8:00 F-64 POLY-CAPILLARY BASED MICRO-XRF AND MICRO-XANES BY MEANS OF CONVENTIONAL AND SYNCHROTRON RADIATION – Invited K. Janssens, University of Antwerp (UIA), Antwerp, Belgium 8:30   POLYCAPILLARY OPTICS: AN ENABLING TECHNOLOGY FOR NEW APPLICATIONS – Invited D. Gibson, X-ray Optical Systems, Albany, NY 9:00 F-14 DUAL-CAPILLARY OPTIC MXRF G.J. Havrilla, Los Alamos National Laboratory, Los Alamos, NM N. Gao, X-ray Optical Systems, Albany, NY 9:20 F-19 POLYCAPILLARY OPTICS AND X-RAY ANALYTICAL TECHNIQUES Y. Yan, X-ray Optical Systems, Inc., Albany, NY and Beijing Normal University, Beijing, P.R. China W.M. Gibson, X-ray Optical Systems, Inc., Albany, NY and University at Albany, SUNY, NY 9:40 F-09 X-RAY FLUORESCENCE MICROANALYSIS OF BIOMEDICAL AND ENVIRONMENTAL SAMPLES – Invited M. Lankosz, M. Boruchowska, J. Ostachowicz, University of Mining & Metallurgy, Kraków, Poland 10:10 F-52 MICRO X-RAY FLUORESCENCE SPECTROSCOPY FOR QUALITY CONTROL OF LAYERED MATERIAL A. Wittkopp, F. Ferrandino, NeXray, Ronkonkoma, NY 10:30  BREAK BREAK 10:50 F-39 A COMPACT, POLYCAPILLARY-BASED MICRO X-RAY FLUORESCENCE ANALYSIS SYSTEM N. Gao, I. Ponomarev, D. Gibson, X-ray Optical Systems, Inc., Albany, NY 11:10 F-43 NON-DESTRUCTIVE ANALYSIS OF COMPLEX LAYER STRUCTURES USING MICRO X-RAY FLUORESCENCE B. Scruggs, EDAX, Inc., Mahwah, NJ M. Haschke, A. Wittkopp, Röntgenanalytik Messtechnik GmbH, Taunusstein, Germany 11:30 F-53 X-RAY MICROBEAM FOR CHARACTERIZATION OF COMBINATORIAL THIN FILMS W. Chang, J. Kerner, E. Franco, ARACOR, Sunnyvale, CA X.D. Xiang, Y.Q. Li, Intematix Corporation, Moraga, CA      Session, Thursday p.m. (Sunshine Peak) XRD & XRF Session C-3 Electron Beam Organized by: R. Goehner, Sandia National Laboratories, Albuquerque, NM 2:00 F-60 STEM/SEM X-RAY SPECTRUM IMAGES: FINDING THE NEEDLE IN THE HAYSTACK – Invited P.G. Kotula, M.R. Keenan, Sandia National Laboratories, Albuquerque, NM 2:30 D-020 A REVIEW OF CONVERGENT-BEAM ELECTRON DIFFRACTION (CBED) – Invited A. Eades, Lehigh University, Bethlehem, PA 3:00 D-116 ELECTRON BACKSCATTER DIFFRACTION – Invited A.J. Schwartz, Lawrence Livermore National Laboratory, Livermore, CA J.R. Michael, Sandia National Laboratories, Albuquerque, NM 3:30 BREAK BREAK 4:00 D-064 PRACTICAL DESIGN CONSIDERATIONS OF EBSD SYSTEMS P.P. Camus, D.B. Rohde, Thermo NORAN, Middleton, WI 4:20 D-048 EBSD CAMERA CALIBRATION: THE MOVING SCREEN TECHNIQUE REVISITED D.A. Carpenter, G.D. Richardson, L.R. Mooney, Y-12 National Security Complex, Oak Ridge, Tennessee 4:40 D-075 MICRODIFFRACTION ANALYSIS OF FIBROUS TALC: ASBESTOS IN CRAYONS J.R. Verkouteren, National Institute of Standards & Technology, Gaithersburg, MD A.G. Wylie, University of Maryland, College Park, MD    Session, Thursday p.m. (Rainbow) XRD Session D-5 Stress Analysis I Organized by: C.C. Goldsmith, IBM Microelectronics, Hopewell Junction, NY co-Chair: T. Sasaki, Kanazawa University, Kanazawa, Japan 2:00 D-018 MINIATURIZATION OF X-RAY STRESS ANALYZER T. Goto, Y. Gong, Fukui University of Technology, Nara, Japan 2:20 D-029 STRAIN AND STRESS CHARACTERISATION IN THIN FILMS AND SANDWICH STRUCTURES AT ELEVATED TEMPERATURES J. Keckes, University of Leoben, Leoben, Austria 2:40 D-027 SELFCONSISTENT DETERMINATION OF THE X-RAY ELASTIC CONSTANTS OF POLYCRYSTALLINE MATERIALS FOR ARBITRARY CRYSTAL SYMMETRY N. Koch, H. Wern, HTW des Saarlandes, Saarbrücken, Germany 3:00 D-112 MICRO-STRAIN IN Y0.5R0.5Ba2Cu3O7-x (R=Yb, Tm, Er, Ho, Dy, Gd, Eu, Sm, AND Nd) E.J. Peterson, W.L. Hults, M. Simpson, J.L. Smith, Los Alamos National Laboratory, Los Alamos, NM 3:20 BREAK BREAK 3:40 D-129 STRAIN EVOLUTION AFTER FIBER FAILURE IN SINGLE FIBER METAL MATRIX COMPOSITES J.C. Hanan, E. Ustundag, G.A. Swift, B. Clausen, California Institute of Technology, Pasadena, CA I.J. Beyerlein, D.W. Brown, M.A.M. Bourke, Los Alamos National Laboratory, Los Alamos, NM 4:00 D-083 MEASUREMENT OF RESIDUAL STRESSES IN FIBER REINFORCED COMPOSITES BASED ON X-RAY DIFFRACTION B. Benedikt, P.K. Predecki, L. Kumosa, M. Kumosa, University of Denver, Denver, CO 4:20 D-004 COMPACT X-RAY DIFFRACTION TECHNIQUE A. Mozelev, Small Scale Research & Production Company RADICAL, Friedrichsdorf, Germany   Session, Thursday p.m. (Twilight) XRD Session D-6 Polymer Structure II & III: IN SITU STRUCTURE DEVELOPMENT/2D WAXS AND SAXS DATA ANALYSIS Organized by: R. Barton, Jr., DuPont Experimental Station, Wilmington, DE co-Chair: J.D. Londono, DuPont Company – CRD, Wilmington, DE 1:30 D-002 RECENT WORK ON STRAIN-INDUCED CRYSTALLIZATION – Invited J. Kornfield, California Institute of Technology, Pasadena, CA 2:00 D-124 X-RAY SCATTERING STUDIES OF THE EARLY STAGES OF CRYSTALLIZATION IN POLYMER FIBERS – Invited J.M. Schultz, University of Delaware, Newark, DE 2:30 D-108 SAXS STUDIES OF POLYMER MELTING B. Crist, Northwestern University, Evanston, IL 2:50 D-061 UNFOLDING OF ULTRA-LONG ALKANES BY X-RAY DIFFRACTION A.E. Terry, European Synchrotron Radiation Facility, Grenoble, France J.K. Hobbs, T.L. Phillips, University of Bristol, Bristol, United Kingdom 3:10 D-107 IN-SITU SAXS ON A PERFLUOROSULFONATE IONOMER J.D. Londono, S. Mazur, R.V. Davidson, E.I. DuPont De Nemours, DuPont CR&D, Wilmington, DE 3:30 BREAK BREAK 3:50 D-140 APPLICATION OF SYNCHROTRON RADIATION IN THE STUDIES OF UNIAXIAL AND BIAXIAL DEFORMATION OF POLYMERS – Invited A. Mahendrasingam, C. Martin, S. Bingham, A.K. Wright, D.J. Blundell, W. Fuller, Keele University, Staffordshire, United Kingdom 4:20 D-121 FULL-PATTERN PARAMETERIZATION OF 2-D SMALL-ANGLE SCATTERING DATA FROM ORIENTED POLYMERS AND SIGNIFICANCE OF THESE PARAMETERS – Invited N.S. Murthy, Honeywell Laboratories, Morristown, NJ D.T. Grubb, Cornell University, Ithaca, NY 4:50  D-047 CHARACTERIZATION OF CRYSTALLINITY IN POLYPROPYLENE BY WIDE ANGLE X-RAY DIFFRACTION J.H. Butler, ExxonMobil Chemical Company, Baytown, TX D.J. Winter, R.B. Ortega, AMIA Laboratories, The Woodlands, TX 5:10 D-035 TEXTURE EVOLUTION IN ETHYLENE-OCTANE COPOLYMER DURING UNIAXIAL TENSION D. Li, H. Garmestani, FAMU-FSU College of Engineering, Tallahassee, FL 5:30 D-134 THREE-DIMENSIONAL MICROSTRUCTURE BY SAS AND WAD USING TEMPERATURE-INDUCED CONTRAST VARIATION J.D.Barnes, JDB Science, Chevy Chase, MD R. Kolb, Exxon-Mobil Corp. W. Bras, Dubble ESRF   Session, Thursday p.m. (Buddy’s Run) XRF Session F-3 TXRF Organized by: M.A. Zaitz, IBM Microelectronics, Hopewell Junction, NY 1:40 F-28 TXRF ANALYSIS OF LOW Z ELEMENTS ON SILICON WAFER SURFACES EXCITED BY MONOCHROMATIZED UNDULATOR RADIATION B. Beckhoff, R. Fliegauf, G. Ulm, J. Weser, Physikalisch-Technische Bundesanstalt, Berlin, Germany G. Pepponi, C. Streli, P. Wobrauschek, Atominstitut der Österreichischen Universitäten, Wien, Austria L. Fabry, S. Pahlke, Wacker Siltronic AG, Burghausen, Germany 2:00 F-50 SYNCHROTRON RADIATION TXRF: NEW RESULTS P. Pianetta, K. Baur, S. Brennan, A. Singh, Stanford Synchrotron Radiation Laboratory, Stanford, CA 2:20 F-08 TXRF FOR SEMICONDUCTOR APPLICATIONS – Invited Y. Mori, Nippon Steel Corporation, Yamaguchi, Japan 2:50 F-22 TOTAL REFLECTION X-RAY FLUORESCENCE FOR ENVIRONMENTAL SAMPLES – Invited M. Schmeling, Loyola University Chicago, Chicago, IL 3:20 BREAK BREAK 3:40 F-48 FOCUSED BEAM TOTAL REFLECTION X-RAY FLUORESCENCE ANALYSIS USING DOUBLY CURVED CRYSTAL OPTICS Z.W. Chen, X-ray Optical Systems, Inc., Albany, NY 4:00 F-12 STUDY OF THE DIFFUSING BEHAVIOR OF MoO3 and ZnO ON OXIDE THIN FILMS BY SYNCHROTRON RADIATION TXRF Y. Huang, W. He, Beijing Synchrotron Radiation Facility, Beijing, China W. Xu, J. Xu, N. Wu, J. Yan, Y. Xie, Institute of Physical Chemistry, Peking University, Beijing, China Y. Zhu, Analysis Center, Tsinghua University, Beijing, China 4:20 F-17 INVESTIGATION OF ADSORBED MERCURY DISTRIBUTION IN SILVER COATED FILTERS BY X-RAY FLUORESCENCE METHODS S. Kurunczi, Sz. Török, KFKI - Atomic Energy Research Institute, Budapest, Hungary J.W. Beal, Fairfield University, Fairfield, CT 4:40 C-1 PHYSICS AND PRACTICAL USING OF A PLANAR X-RAY WAVEGUIDE V.K. Egorov, IPMT RAS, Chernogolovka, Moscow Dist., Russia E.V. Egorov, MEPhI, Moscow, Russia For more information please contact Denise Flaherty - flaherty@icdd.com 2001 DXC Home | Call for Papers | CfP in Adobe PDF Form   Guidelines for Preparing Abstracts | Submitted Abstracts Listing