50th Annual (2001) Denver X-ray Conference™
Sheraton Steamboat Resort
Steamboat
Springs, Colorado, U.S.A.
30 July – 3 August
2001
Denver X-ray Conference™ > Thursday Sessions
Steamboat Springs,
Colorado, USA - 30th July - 3rd August 2001
Session, Thursday a.m. (Sunshine Peak) Session C-2 Synchrotron Applications |
||
| 8:00 | D-150 | MATERIALS CHARACTERIZATION BY MICROFOCUSSED HIGH ENERGY X-RAYS – Invited U. Lienert, Argonne National Laboratory, Argonne, IL |
| 8:30 | D-131 | INVESTIGATION OF LOAD-TRANSFER IN Ta-REINFORCED BULK
METALLIC GLASSES USING HIGH-ENERGY X-RAY DIFFRACTION D.K. Balch, D.C. Dunand, Northwestern University, Evanston, IL E. Ustundag, S.Y. Lee, California Institute of Technology, Pasadena, CA |
| 8:50 | D-132 | DAMAGE EVOLUTION IN TiSiC UNIDIRECTIONAL FIBER COMPOSITES G.A. Swift, J.C. Hanan, E. Ustundag, B. Clausen, California Institute of Technology, Pasadena, CA I.J. Beyerlein, Los Alamos National Laboratory, Los Alamos, NM J. Almer, U. Lienert, D. Haeffner, Argonne National Laboratory, Argonne, IL |
| 9:10 | D-086 | NOVEL X-RAY DIFFRACTION TECHNIQUE FOR STRAIN MEASUREMENTS USING AREA DETECTOR – Invited Y.S. Chu, D.C. Mancini, F. de Carlo, J.D. Almer, D.R. Haeffner, Argonne National Laboratory, Argonne, IL |
| 9:40 | D-117 | CHARACTERIZATION OF NANOMETER LAYERED STRUCTURES USING MULTIPLE WAVELENGTH X-RAY REFLECTIVITY AND SIMULATED ANNEALING DATA ANALYSIS E. Ziegler, C. Ferrero, C. Chapron, C. Morawe, European Synchrotron Radiation Facility, Grenoble, France |
| 10:00 | D-123 | IN SITU HIGH-TEMPERATURE STUDY OF SILVER BEHENATE REDUCTION
TO SILVER METAL USING SYNCHROTRON RADIATION T. Blanton, M. Lelental, Eastman Kodak Company, Rochester, NY S. Zdzieszynski, S.T. Misture, NYS College of Ceramics at Alfred University, Alfred, NY |
| 10:20 | BREAK | BREAK |
| 10:40 | D-062 | THE ELECTRON DENSITY DISTRIBUTION OF Ti AND O OCTAHEDORON
IN PEROVSKITE TYPE OXIDE CRYSTALS ANALYSED BY MAXIMUM ENTROPY METHOD J. Harada, Rigaku Corporation, Tokyo, Japan M. Sakata, A. Yoshida, E. Nishibori, M. Takata, Nagoya University, Nagoya, Japan Y. Akishige, Shimane University, Matsue, Japan Y. Kuroiwa, Okayama University, Okayama, Japan |
| 11:00 | D-006 | VARIABLE ENERGY X-RAY REFLECTIVITY AND REFLECTION
ABSORPTION FINE STRUCTURE B.K. Tanner, T.P.A. Hase, B.D. Fulthorpe, University of Durham, Durham, United Kingdom G.M. Luo, Z.H. Mai, Chinese Academy of Sciences, Beijing, China C.H. Marrows, B.J. Hickey, University of Leeds, Leeds, United Kingdom |
| 11:20 | F-11 | SYNCHROTRON RADIATION XRF MICROPROBE STUDY OF HUMAN BONE TUMOR AND HUMAN FEMORAL HEAD SLICES Y. Huang, W. He, Beijing Synchrotron Radiation Facility, Beijing, China Y. Zhang, Shanghai Institute of Nuclear Research, Shanghai, China J. Lu, 306 Hospital of the People’s Liberation Army of China, Beijing, China W. Liao, Shanghai No. 9 People’s Hospital, Shanghai, China |
| 11:40 | F-29 | LOW-ENERGY X-RAY FLUORESCENCE ANALYSIS BASED ON HIGH-RESOLUTION SUPERCONDUCTING TUNNEL JUNCTION DETECTORS B. Beckhoff, R. Fliegauf, G. Ulm, Physikalisch-Technische Bundesanstalt, Berlin, Germany |
| 12:00 | F-35 | SYNCHROTRON RADIATION INDUCED -X-RAY FLUORESCENCE AND ABSORPTION SPECTROSCOPY ON MUNICIPAL SOLID WASTE FLY ASHES M.C. Camerani, B.M. Steenari, O. Lindqvist, Chalmers University of Technology, Göteborg, Sweden A. Somogyi, University of Antwerp, Antwerp, Belgium A. Simionovici, S. Ansell, European Synchrotron Radiation Facility, Grenoble, France |
Session, Thursday a.m. (Buddy’s Run) Session D-3 Industrial Applications – XRD |
||
| 8:00 | D-003 | NON-TRADITIONAL POWDER CRYSTALLOGRAPHY IN THE PETROCHEMICAL INDUSTRY – Invited J.A. Kaduk, BP Amoco Chemicals, Naperville, IL |
| 8:30 | D-077 | RIETVELD MODELING OF ETA AND GAMMA ALUMINA R.W. Morton, J.F. Geibel, J.J. Gislason, R.L. Heald, D.E. Lauffer, M. Sardashti, Phillips Petroleum Company - Corporate Technology, Bartlesville, OK D.E. Simon, DES Consulting, Broken Arrow, OK |
| 8:50 | D-067 | SURFACE AREA DETERMINATION OF INTERSTRATIFIED HYLLOSILICATES
IN ATHABASCA OIL SANDS FROM SYNCHROTRON X-RAY SCATTERING DOMAIN SIZE O.E. Omotoso, R.J. Mikula, Natural Resources Canada, Devon AB, Canada P.W. Stephens, SUNY, Stony Brook, NY |
| 9:10 | D-066 | CALIBRATION MONITORING OF DIFFRACTOMETERS G. Berti, M. D’Acunto, University of Pisa, Pisa, Italy |
| 9:30 | D-143 | X-RAY DIFFRACTION IN THE MICROELECTRONICS INDUSTRY –
Invited C.C. Goldsmith, P. De Haven, T.L. Nunes (retired), IBM Microelectronics, Hopewell Junction, NY I.C. Noyan, IBM, Yorktown Heights, NY |
| 10:00 | BREAK | BREAK |
| 10:30 | D-073 | X-RAY DIFFRACTION IN ALUMINIUM INDUSTRY K.V. Krishnan, Jawaharlal Nehru Aluminium Research Development & Design Centre, Nagpur, India |
| 10:50 | D-070 | ONLINE AND REAL-TIME QUANTIFICATION OF CEMENT CLINKERS USING
XRD A. Kern, R. Schmidt, Bruker AXS GmbH, Karlsruhe, Germany |
| 11:10 | D-125 | X-RAY DIFFRACTION AS A PROCESS CONTROL TOOL IN
SUPERCONDUCTOR APPLICATIONS K.J. Kozaczek, R.I. Martin, D.S. Kurtz, P.R. Moran, S.P. O’Leary, Hypernex, Inc., State College, PA |
| 11:30 | D-022 | DETERMINATION OF EMITTER PARAMETERS IN GaInP/GaAs
HETEROJUNCTION BIPOLAR TRANSISTORS BY X-RAY DIFFRACTION A. Shen, E. Griswold, G. Hillier, L. Dang, D. Clark, I. Calder, High Performance Optical Component Solutions, Nortel Networks, Ontario, Canada |
Session, Thursday a.m. (Twilight) Session D-4 Polymer Structure I: Multi Probe Studies |
||
| 8:00 | D-081 | ELECTRON DIFFRACTION CHARACTERIZATION OF NASCENT
CONDENSATION POLYMERS – Invited P.H. Geil, University of Illinois at Urbana-Champaign, Urbana, IL |
| 8:30 | D-021 | EMERGENCE OF POLYMER PROPERTIES IN POLY-DISPERSE CHAIN ASSEMBLIES — THE STRUCTURAL DISTINCTION BETWEEN LOW MOLECULAR WEIGHT LINEAR POLYETHYLENE AND PETROLEUM WAXES REVEALED BY ELECTRON CRYSTALLOGRAPHY – Invited D.L. Dorset, ExxonMobil Research & Engineering Company, Annandale, NJ |
| 9:00 | D-019 | LOW DOSE HIGH RESOLUTION ELECTRON MICROSCOPY (HREM) OF POLY(METAPHENYLENE ISOPHTHALAMIDE) (MPDI) TWISTED CRYSTALS D.C. Martin, The University of Michigan, Ann Arbor, MI D.P. Lawrence, Flint Ink, Ann Arbor, MI C. Kübel, Philips Research Laboratories, Eindhoven, The Netherlands |
| 9:20 | D-068 | THE STRUCTURE OF POLY(SILYLENEMETHYLENE)S S.-Y. Park, B.L. Farmer, Air Force Research Laboratory, Wright-Patterson Air Force Base, OH T. Zhang, L.V. Interrante, Rensselaer Polytechnic Institute, Troy, NY |
| 9:40 | D-138 | DNA-LINKED NANOPARTICLE MATERIALS: OPTICAL, ELECTRICAL, AND STRUCTURAL PROPERTIES A.A. Lazarides, Northwestern University, Evanston, IL |
| 10:00 | BREAK | BREAK |
| 10:30 | D-126 | DOUBLE-TWISTED HELICAL LAMELLAR CRYSTALS IN A SYNTHETIC MAIN-CHAIN CHIRAL POLYESTER DETERMINED USING DIFFRACTION METHODS – Invited S.Z.D. Cheng, C.Y. Li, S. Jin, University of Akron, Akron, OH |
| 11:00 | D-041 | NEUTRON AND SYNCHROTRON X-RAY FIBER DIFFRACTION STUDIES OF CELLULOSE POLYMORPHS Y. Nishiyama, The University of Tokyo, Tokyo, Japan P. Langan, Los Alamos National Laboratory, Los Alamos, NM H. Chanzy, CNRS, Grenoble, France |
| 11:20 | D-147 | X-RAY AND NEUTRON FIBRE DIFFRACTION IN THE CHARACTERISATION
OF BIOLOGICAL & INDUSTRIAL POLYMERS V.T. Forsyth, I. Parrot, Institute Laue Langevin, Grenoble, France and Keele University, Staffordshire, United Kingdom K.H. Gardner, DuPont CR & D, Wilmington, DE C. Martin, Keele University, Staffordshire, United Kingdom |
| 11:40 | D-110 | EXCLUDED VOLUME INTERACTIONS BETWEEN CORONAL CHAINS IN BLOCK COPOLYMER MICELLES: A SANS AND SIMULATION STUDY J.S. Pedersen, University of Aarhus, Aarhus C, Denmark C. Svaneborg, M.C. Gerstenberg, K. Almdal, Risø National Laboratory, Roskilde, Denmark I.W. Hamley, University of Leeds, Leeds, England R.N. Young, University of Sheffield, Sheffield, England |
Session, Thursday a.m. (Rainbow) Session F-2 Capillary Optics |
||
| 8:00 | F-64 | POLY-CAPILLARY BASED MICRO-XRF AND MICRO-XANES BY MEANS OF CONVENTIONAL AND SYNCHROTRON RADIATION – Invited K. Janssens, University of Antwerp (UIA), Antwerp, Belgium |
| 8:30 | POLYCAPILLARY OPTICS: AN ENABLING TECHNOLOGY FOR NEW APPLICATIONS – Invited D. Gibson, X-ray Optical Systems, Albany, NY |
|
| 9:00 | F-14 | DUAL-CAPILLARY OPTIC MXRF G.J. Havrilla, Los Alamos National Laboratory, Los Alamos, NM N. Gao, X-ray Optical Systems, Albany, NY |
| 9:20 | F-19 | POLYCAPILLARY OPTICS AND X-RAY ANALYTICAL TECHNIQUES Y. Yan, X-ray Optical Systems, Inc., Albany, NY and Beijing Normal University, Beijing, P.R. China W.M. Gibson, X-ray Optical Systems, Inc., Albany, NY and University at Albany, SUNY, NY |
| 9:40 | F-09 | X-RAY FLUORESCENCE MICROANALYSIS OF BIOMEDICAL AND
ENVIRONMENTAL SAMPLES – Invited M. Lankosz, M. Boruchowska, J. Ostachowicz, University of Mining & Metallurgy, Kraków, Poland |
| 10:10 | F-52 | MICRO X-RAY FLUORESCENCE SPECTROSCOPY FOR QUALITY CONTROL
OF LAYERED MATERIAL A. Wittkopp, F. Ferrandino, NeXray, Ronkonkoma, NY |
| 10:30 | BREAK | BREAK |
| 10:50 | F-39 | A COMPACT, POLYCAPILLARY-BASED MICRO X-RAY FLUORESCENCE ANALYSIS SYSTEM N. Gao, I. Ponomarev, D. Gibson, X-ray Optical Systems, Inc., Albany, NY |
| 11:10 | F-43 | NON-DESTRUCTIVE ANALYSIS OF COMPLEX LAYER STRUCTURES USING MICRO X-RAY FLUORESCENCE B. Scruggs, EDAX, Inc., Mahwah, NJ M. Haschke, A. Wittkopp, Röntgenanalytik Messtechnik GmbH, Taunusstein, Germany |
| 11:30 | F-53 | X-RAY MICROBEAM FOR CHARACTERIZATION OF COMBINATORIAL THIN
FILMS W. Chang, J. Kerner, E. Franco, ARACOR, Sunnyvale, CA X.D. Xiang, Y.Q. Li, Intematix Corporation, Moraga, CA |
Session, Thursday p.m. (Sunshine Peak) Session C-3 Electron Beam |
||
| 2:00 | F-60 | STEM/SEM X-RAY SPECTRUM IMAGES: FINDING THE NEEDLE IN THE HAYSTACK – Invited P.G. Kotula, M.R. Keenan, Sandia National Laboratories, Albuquerque, NM |
| 2:30 | D-020 | A REVIEW OF CONVERGENT-BEAM ELECTRON DIFFRACTION (CBED) –
Invited A. Eades, Lehigh University, Bethlehem, PA |
| 3:00 | D-116 | ELECTRON BACKSCATTER DIFFRACTION – Invited A.J. Schwartz, Lawrence Livermore National Laboratory, Livermore, CA J.R. Michael, Sandia National Laboratories, Albuquerque, NM |
| 3:30 | BREAK | BREAK |
| 4:00 | D-064 | PRACTICAL DESIGN CONSIDERATIONS OF EBSD SYSTEMS P.P. Camus, D.B. Rohde, Thermo NORAN, Middleton, WI |
| 4:20 | D-048 | EBSD CAMERA CALIBRATION: THE MOVING SCREEN TECHNIQUE
REVISITED D.A. Carpenter, G.D. Richardson, L.R. Mooney, Y-12 National Security Complex, Oak Ridge, Tennessee |
| 4:40 | D-075 | MICRODIFFRACTION ANALYSIS OF FIBROUS TALC: ASBESTOS IN
CRAYONS J.R. Verkouteren, National Institute of Standards & Technology, Gaithersburg, MD A.G. Wylie, University of Maryland, College Park, MD |
Session, Thursday p.m. (Rainbow) Session D-5 Stress Analysis I |
||
| 2:00 | D-018 | MINIATURIZATION OF X-RAY STRESS ANALYZER T. Goto, Y. Gong, Fukui University of Technology, Nara, Japan |
| 2:20 | D-029 | STRAIN AND STRESS CHARACTERISATION IN THIN FILMS AND
SANDWICH STRUCTURES AT ELEVATED TEMPERATURES J. Keckes, University of Leoben, Leoben, Austria |
| 2:40 | D-027 | SELFCONSISTENT DETERMINATION OF THE X-RAY ELASTIC CONSTANTS
OF POLYCRYSTALLINE MATERIALS FOR ARBITRARY CRYSTAL SYMMETRY N. Koch, H. Wern, HTW des Saarlandes, Saarbrücken, Germany |
| 3:00 | D-112 | MICRO-STRAIN IN Y0.5R0.5Ba2Cu3O7-x (R=Yb, Tm, Er, Ho, Dy,
Gd, Eu, Sm, AND Nd) E.J. Peterson, W.L. Hults, M. Simpson, J.L. Smith, Los Alamos National Laboratory, Los Alamos, NM |
| 3:20 | BREAK | BREAK |
| 3:40 | D-129 | STRAIN EVOLUTION AFTER FIBER FAILURE IN SINGLE FIBER METAL MATRIX COMPOSITES J.C. Hanan, E. Ustundag, G.A. Swift, B. Clausen, California Institute of Technology, Pasadena, CA I.J. Beyerlein, D.W. Brown, M.A.M. Bourke, Los Alamos National Laboratory, Los Alamos, NM |
| 4:00 | D-083 | MEASUREMENT OF RESIDUAL STRESSES IN FIBER REINFORCED COMPOSITES BASED ON X-RAY DIFFRACTION B. Benedikt, P.K. Predecki, L. Kumosa, M. Kumosa, University of Denver, Denver, CO |
| 4:20 | D-004 | COMPACT X-RAY DIFFRACTION TECHNIQUE A. Mozelev, Small Scale Research & Production Company RADICAL, Friedrichsdorf, Germany |
Session, Thursday p.m. (Twilight) Session D-6 Polymer Structure II & III: IN SITU
STRUCTURE |
||
| 1:30 | D-002 | RECENT WORK ON STRAIN-INDUCED CRYSTALLIZATION – Invited J. Kornfield, California Institute of Technology, Pasadena, CA |
| 2:00 | D-124 | X-RAY SCATTERING STUDIES OF THE EARLY STAGES OF
CRYSTALLIZATION IN POLYMER FIBERS – Invited J.M. Schultz, University of Delaware, Newark, DE |
| 2:30 | D-108 | SAXS STUDIES OF POLYMER MELTING B. Crist, Northwestern University, Evanston, IL |
| 2:50 | D-061 | UNFOLDING OF ULTRA-LONG ALKANES BY X-RAY DIFFRACTION A.E. Terry, European Synchrotron Radiation Facility, Grenoble, France J.K. Hobbs, T.L. Phillips, University of Bristol, Bristol, United Kingdom |
| 3:10 | D-107 | IN-SITU SAXS ON A PERFLUOROSULFONATE IONOMER J.D. Londono, S. Mazur, R.V. Davidson, E.I. DuPont De Nemours, DuPont CR&D, Wilmington, DE |
| 3:30 | BREAK | BREAK |
| 3:50 | D-140 | APPLICATION OF SYNCHROTRON RADIATION IN THE STUDIES OF
UNIAXIAL AND BIAXIAL DEFORMATION OF POLYMERS – Invited A. Mahendrasingam, C. Martin, S. Bingham, A.K. Wright, D.J. Blundell, W. Fuller, Keele University, Staffordshire, United Kingdom |
| 4:20 | D-121 | FULL-PATTERN PARAMETERIZATION OF 2-D SMALL-ANGLE SCATTERING DATA FROM ORIENTED POLYMERS AND SIGNIFICANCE OF THESE PARAMETERS – Invited N.S. Murthy, Honeywell Laboratories, Morristown, NJ D.T. Grubb, Cornell University, Ithaca, NY |
| 4:50 | D-047 | CHARACTERIZATION OF CRYSTALLINITY IN POLYPROPYLENE BY WIDE ANGLE X-RAY DIFFRACTION J.H. Butler, ExxonMobil Chemical Company, Baytown, TX D.J. Winter, R.B. Ortega, AMIA Laboratories, The Woodlands, TX |
| 5:10 | D-035 | TEXTURE EVOLUTION IN ETHYLENE-OCTANE COPOLYMER DURING UNIAXIAL TENSION D. Li, H. Garmestani, FAMU-FSU College of Engineering, Tallahassee, FL |
| 5:30 | D-134 | THREE-DIMENSIONAL MICROSTRUCTURE BY SAS AND WAD USING TEMPERATURE-INDUCED CONTRAST VARIATION J.D.Barnes, JDB Science, Chevy Chase, MD R. Kolb, Exxon-Mobil Corp. W. Bras, Dubble ESRF |
Session, Thursday p.m. (Buddy’s Run) Session F-3 TXRF |
||
| 1:40 | F-28 | TXRF ANALYSIS OF LOW Z ELEMENTS ON SILICON WAFER SURFACES EXCITED BY MONOCHROMATIZED UNDULATOR RADIATION B. Beckhoff, R. Fliegauf, G. Ulm, J. Weser, Physikalisch-Technische Bundesanstalt, Berlin, Germany G. Pepponi, C. Streli, P. Wobrauschek, Atominstitut der Österreichischen Universitäten, Wien, Austria L. Fabry, S. Pahlke, Wacker Siltronic AG, Burghausen, Germany |
| 2:00 | F-50 | SYNCHROTRON RADIATION TXRF: NEW RESULTS P. Pianetta, K. Baur, S. Brennan, A. Singh, Stanford Synchrotron Radiation Laboratory, Stanford, CA |
| 2:20 | F-08 | TXRF FOR SEMICONDUCTOR APPLICATIONS – Invited Y. Mori, Nippon Steel Corporation, Yamaguchi, Japan |
| 2:50 | F-22 | TOTAL REFLECTION X-RAY FLUORESCENCE FOR ENVIRONMENTAL SAMPLES – Invited M. Schmeling, Loyola University Chicago, Chicago, IL |
| 3:20 | BREAK | BREAK |
| 3:40 | F-48 | FOCUSED BEAM TOTAL REFLECTION X-RAY FLUORESCENCE ANALYSIS USING DOUBLY CURVED CRYSTAL OPTICS Z.W. Chen, X-ray Optical Systems, Inc., Albany, NY |
| 4:00 | F-12 | STUDY OF THE DIFFUSING BEHAVIOR OF MoO3 and ZnO ON OXIDE
THIN FILMS BY SYNCHROTRON RADIATION TXRF Y. Huang, W. He, Beijing Synchrotron Radiation Facility, Beijing, China W. Xu, J. Xu, N. Wu, J. Yan, Y. Xie, Institute of Physical Chemistry, Peking University, Beijing, China Y. Zhu, Analysis Center, Tsinghua University, Beijing, China |
| 4:20 | F-17 | INVESTIGATION OF ADSORBED MERCURY DISTRIBUTION IN SILVER
COATED FILTERS BY X-RAY FLUORESCENCE METHODS S. Kurunczi, Sz. Török, KFKI - Atomic Energy Research Institute, Budapest, Hungary J.W. Beal, Fairfield University, Fairfield, CT |
| 4:40 | C-1 | PHYSICS AND PRACTICAL USING OF A PLANAR X-RAY WAVEGUIDE V.K. Egorov, IPMT RAS, Chernogolovka, Moscow Dist., Russia E.V. Egorov, MEPhI, Moscow, Russia |
For more information please contact Denise Flaherty - flaherty@icdd.com