XRD Poster Session II, Tuesday, 5 August (Evergreen)
6:30 p.m. - 8:30 p.m., authors present

The XRD Poster Session II will be held in conjunction with the MDI and Rigaku/MSC, Inc. Mixer.
Chairs:  R. Barton, Jr., Emeritus, Dupont Experimental Station, Wilmington, DE
T.C. Huang, Emeritus, IBM Almaden Research Center, San Jose, CA

Session chairs will select the two best papers for awards.


Metals
D090 CHARACTERIZATION OF CRYOGENICALLY TREATED ALLOYS

T.R. Watkins, O.B. Cavin, G.M. Ludtka, W.H. Elliott, Jr., L. Riester, Oak Ridge National
Laboratory, Oak Ridge, TN
R.D. England, Cummins Engine Company, Inc., Columbus, IN

D054 A PORTABLE X-RAY STRESS INSTRUMENT FOR INSPECTING RAILS

T. Sasaki, K. Seki, Y. Hirose, Kanazawa University, Kanazawa, Japan
Y. Sato, Railway Technical Research Institute, Tokyo, Japan
K. Hiratsuka, Kyushyu Polytechnic University, Fukuoka, Japan
T. Yamane, Fuji Photo Film Co., LTD., Tokyo, Japan

D103 A FUNDAMENTAL STUDY ON STRESS MEASUREMENTS USING PULSED SPALLATION
NEUTRON DIFFRACTION

M. Gotoh, T. Sasaki, Y. Hirose, Kanazawa University, Kanazawa, Japan
T. Kawasaki, Tohoku University, Miyagi, Japan

D102 A FUNDAMENTAL STUDY ON RESIDUAL STRESS MEASUREMENT OF THIN FILM
MATERIALS USING SYNCHROTRON RADIATION

M. Gotoh, T. Sasaki, Y. Hirose, Kanazawa University, Kanazawa, Japan
S. Takago, Industrial Research Institute of Ishikawa, Ishikawa, Japan

D101 EVALUATION OF (α + γ) DUAL PHASE STAINLESS STEELS USING MISFIT OF PLASTIC
STRAIN Δ∈P
H. Hirose, Kinjo University, Ishikawa, Japan
T. Yano, M. Gotoh, T. Sasaki, Kanazawa University, Kanazawa, Japan
D100 APPLICATIONS OF X-RAY STRESS MEASUREMENT FOR INTERFACE AREA OF Ni3Al
INTERMETALLIC COMPOUND COATING

T. Murotani, Dalian University, China
T. Yano, Kanazawa University, Kanazawa, Japan
A. Ikenaga, Osaka Prefecture University, Sakai, Japan
H. Hirose, Kinjo University, Ishikawa, Japan

D079 X-RAY STUDY OF RESIDUAL STRESSES IN FERRITE AND AUSTENITE OF DUPLEX STEEL
AFTER SHOT PEENING TREATMENT

V.I. Monine, J.T. Assis, S.A. Filippov, Rio de Janeiro State University,
Rio de Janeiro, Brasil
J.R. Teodósio, T. Gurova, Rio de Janeiro Federal University,
Rio de Janeiro, Brasil

D078 STUDY OF MICROSTRESSES IN COLD-DRAWN PEARLITE

N.Yu. Zolotorevsky, D.M. Vasiliev, Yu.F. Titovets, St. Petersburg State Polytechnical
University, St. Petersburg, Russia
J.T. Assis, V.I. Monine, S.A. Filippov, Rio de Janeiro State University, Rio de Janeiro, Brasil

D070 APPLICATION OF IMAGE PLATE TO X-RAY STRESS MEASUREMENT OF DUAL PHASE
STAINLESS STEEL WITH Cr-K/211 AND Cr-K/311 DIFFRACTIONS

S. Takago, Industrial Research Institute of Ishikawa, Ishikawa, Japan
H. Hirose, Kinjo College, Ishikawa, Japan
T. Sasaki, Kanazawa University, Ishikawa, Japan

D034 RESIDUAL STRESS DISTRIBUTION IN GRAIN-ORIENTED SILICON STEEL

M. Imafuku, T. Suzuki, Nippon Steel Corporation, Chiba, Japan
H. Suzuki, Tokyo Metropolitan University, Tokyo, Japan
K. Akita, Musashi Institute of Technology, Tokyo, Japan

D038  STRESS ANALYSIS OF VARIOUS MATERIALS BY PRD PORTABLE DIFFRACTOMETR

A.V. Lutsao, A.V. Kotelkin, D.V. Matveev, A.D. Zvonkov, MISIS, Moscow, Russia
B.N. Kodess, ICSE, Denver, CO and VNIIMS, Moscow, Russia

 
Layers 
D028 X-RAY MICRO-DIFFRACTION STUDY OF THE HALF-V SHAPED SWITCHING
FERROELECTRIC LIQUID CRYSTAL

K. Takada, T. Noma, T. Togano, T.Mukaide, Canon Research Center, Atsugi, Kanagawa,
Japan
A. Iida, Institute of Materials Structure Science, Tsukuba, Ibaraki, Japan

D081 X-RAY DIFFRACTION FOR PROCESS DEVELOPMENT AND CONTROL IN
SEMICONDUCTOR INDUSTRY

K.J. Kozaczek, HyperNex, Inc., State College, PA

D025 STRUCTURE CHARACTERIZATION OF LANGMUIR-BLODGETT FILMS OF
PHTHALOCYANINE MATERIALS

W. Xia, M.D. Carducci, N.R. Armstrong, University of Arizona, Tucson, AZ

D027 DIFFUSE X-RAY SCATTERING IN THE NANOMETROLOGY OF THIN FILM SYSTEMS
AND INTERFACES

I. Busch, J. Stümpel, Physikalisch-Technische Bundesanstalt, Braunnschweig, Germany

D026 MICROSTRUCTURES AND STRAIN RELAXATION IN MODULATION-DOPED
AlxGa1-xN/GaN HETEROSTRUCTURES

W.S. Tan, X.S. Wu, H. Sha, H.L. Cai, S.S. Jiang, Nanjing University, Nanjing, China
W.L. Zheng, Q.J. Jia, Q. He, Chinese Academy of Science, Beijing, China

D134 THERMAL INDUCED STRESSES IN THIN ALUMINUM LAYERS GROWN ON SILICON

E. Eiper, R. Resel, Graz University of Technology, Austria
C. Eisenmenger-Sittner, University of Technology Vienna, Austria
M. Hafok, J. Keckes, University of Leoben, Austria

Organics
D116 STRUCTURE DETERMINATION FROM POWDER DIFFRACTION DATA AND STRUCTURE
VALIDATION USING SOLID STATE NMR

M. Rajeswaran, T. Blanton, N. Zumbulyadis, D.J. Giesen, Eastman Kodak Company,
Rochester, NY
C. Conesa-Moratilla, Accelrys, Cambridge, UK
S. Misture, NYS College of Ceramics at Alfred University, Alfred, NY
P.W. Stephens, A. Huq, SUNY-Stony Brook, Stony Brook, NY

D065 EVALUATION OF SEVERAL ACTIVE PHARMACEUTICAL COMPOUNDS IN SAMPLES
USED IN THE PRODUCTION OF GENERIC DRUGS

R. Toro, A. Uzcátegui, C. Cedeño, G. Díaz de Delgado, J.M. Delgado, Universidad de
Los Andes, Mérida, Venezuela
E. González, PROULA, Universidad de Los Andes, Mérida, Venezuela

 
Phase Transformations
D015 RIETVELD ANALYSIS BASED ON XRPD AND NEUTRON DIFFRACTION DATA OF
METASTABLE SOL-GEL PRODUCTS

G. Kimmel, R. Xu, P. Ari-Gur, Western Michigan University, Kalamazoo, MI
J.W. Richardson, Argonne National Laboratory, Argonne, IL
E. Guncharov, J. Zabicky, Ben-Gurion University of the Negev, Beer-Sheva, Israel

D048 HIGH TEMPERATURE XRD STUDY OF THE REACTION SEQUENCE AND KINETICS
DURING SYNTHESIS OF Bi4Ti3O12

M.S. Haluska, S.T. Misture, NYS College of Ceramics at Alfred University, Alfred, NY

D067 IN-SITU HIGH TEMPERATURE PHASE TRANSFORMATIONS IN RARE EARTH NIOBATES

K. Jurkschat, P. Sarin, L.F. Siah, W.M. Kriven, University of Illinois at Urbana-
Champaign, Urbana, IL

D033 STUDIES OF PHASE TRANSFORMATION AND INTERFACIAL REACTION BY FAST X-RAY
MEASUREMENT WITH AN IMAGING PLATE

M. Imafuku, Nippon Steel Corporation, Chiba, Japan

 
 Biological
D055 SYNCHROTRON X-RAY MICRO-BEAM DIFFRACTION AND SMALL ANGLE SCATTERING
MAPPING IN BONE AND OSSICLES

S.R. Stock, A. Veis, H.G. Simon, Northwestern University, Chicago, IL
K. Ignatiev, Georgia Institute of Technology, Atlanta, GA
J.D. Almer, Argonne National Laboratory, Argonne, IL

D112 X-RAY EVALUATION OF FRACTURE IN DENTAL MATERIAL

X. Zhengyang, N. Lian, T. Saito, Dalian Institute of Light Industry, Dalian, China
H. Hirose, Kinjyo University, Matto, Japan

D016 CHARACTERIZATION OF THE EVOLUTIONARY ASPECTS OF GREAT WHITE SHARK
TEETH BY X-RAY DIFFRACTION METHODS AND OTHER SUPPORTING TECHNIQUES

M. Kesmez, J. Lyon, D.L. Cocke, J. Westgate, Lamar University, Beaumont, TX
H. McWhinney, T.L. Grady, Prairie View A&M University, Prairie View, TX

For more information please contact Denise Zulli - zulli@icdd.com