XRD Poster Session II, Tuesday, 5 August (Evergreen)
6:30 p.m. - 8:30 p.m., authors present

The XRD Poster Session II will be held in conjunction with the MDI and Rigaku/MSC, Inc. Mixer.

Chairs:

R. Barton, Jr., Emeritus, Dupont Experimental Station, Wilmington, DE T.C. Huang, Emeritus, IBM Almaden Research Center, San Jose, CA

Session chairs will select the two best papers for awards.

Metals

D090	CHARACTERIZATION OF CRYOGENICALLY TREATED ALLOYS T.R. Watkins, O.B. Cavin, G.M. Ludtka, W.H. Elliott, Jr., L. Riester, Oak Ridge National Laboratory, Oak Ridge, TN R.D. England, Cummins Engine Company, Inc., Columbus, IN
D054	A PORTABLE X-RAY STRESS INSTRUMENT FOR INSPECTING RAILS T. Sasaki, K. Seki, Y. Hirose, Kanazawa University, Kanazawa, Japan Y. Sato, Railway Technical Research Institute, Tokyo, Japan K. Hiratsuka, Kyushyu Polytechnic University, Fukuoka, Japan T. Yamane, Fuji Photo Film Co., LTD., Tokyo, Japan
D103	A FUNDAMENTAL STUDY ON STRESS MEASUREMENTS USING PULSED SPALLATION NEUTRON DIFFRACTION M. Gotoh, T. Sasaki, Y. Hirose, Kanazawa University, Kanazawa, Japan T. Kawasaki, Tohoku University, Miyagi, Japan
D102	A FUNDAMENTAL STUDY ON RESIDUAL STRESS MEASUREMENT OF THIN FILM MATERIALS USING SYNCHROTRON RADIATION M. Gotoh, T. Sasaki, Y. Hirose, Kanazawa University, Kanazawa, Japan S. Takago, Industrial Research Institute of Ishikawa, Ishikawa, Japan
D101	EVALUATION OF (α + γ) DUAL PHASE STAINLESS STEELS USING MISFIT OF PLASTIC STRAIN Δ∈P H. Hirose, Kinjo University, Ishikawa, Japan T. Yano, M. Gotoh, T. Sasaki, Kanazawa University, Kanazawa, Japan
D100	APPLICATIONS OF X-RAY STRESS MEASUREMENT FOR INTERFACE AREA OF Ni3Al INTERMETALLIC COMPOUND COATING T. Murotani, Dalian University, China T. Yano, Kanazawa University, Kanazawa, Japan A. Ikenaga, Osaka Prefecture University, Sakai, Japan H. Hirose, Kinjo University, Ishikawa, Japan
D079	X-RAY STUDY OF RESIDUAL STRESSES IN FERRITE AND AUSTENITE OF DUPLEX STEEL AFTER SHOT PEENING TREATMENT V.I. Monine, J.T. Assis, S.A. Filippov, Rio de Janeiro State University, Rio de Janeiro, Brasil J.R. Teodósio, T. Gurova, Rio de Janeiro Federal University, Rio de Janeiro, Brasil
D078	STUDY OF MICROSTRESSES IN COLD-DRAWN PEARLITE N.Yu. Zolotorevsky, D.M. Vasiliev, Yu.F. Titovets, St. Petersburg State Polytechnical University, St. Petersburg, Russia J.T. Assis, V.I. Monine, S.A. Filippov, Rio de Janeiro State University, Rio de Janeiro, Brasil
D070	APPLICATION OF IMAGE PLATE TO X-RAY STRESS MEASUREMENT OF DUAL PHASE STAINLESS STEEL WITH Cr-K / 211 AND Cr-K/311 DIFFRACTIONS S. Takago, Industrial Research Institute of Ishikawa, Ishikawa, Japan H. Hirose, Kinjo College, Ishikawa, Japan T. Sasaki, Kanazawa University, Ishikawa, Japan
D034	RESIDUAL STRESS DISTRIBUTION IN GRAIN-ORIENTED SILICON STEEL M. Imafuku, T. Suzuki, Nippon Steel Corporation, Chiba, Japan H. Suzuki, Tokyo Metropolitan University, Tokyo, Japan K. Akita, Musashi Institute of Technology, Tokyo, Japan
D038	STRESS ANALYSIS OF VARIOUS MATERIALS BY PRD PORTABLE DIFFRACTOMETR A.V. Lutsao, A.V. Kotelkin, D.V. Matveev, A.D. Zvonkov, MISIS, Moscow, Russia B.N. Kodess, ICSE, Denver, CO and VNIIMS, Moscow, Russia

 
Layers 

D028	X-RAY MICRO-DIFFRACTION STUDY OF THE HALF-V SHAPED SWITCHING FERROELECTRIC LIQUID CRYSTAL K. Takada, T. Noma, T. Togano, T.Mukaide, Canon Research Center, Atsugi, Kanagawa, Japan A. Iida, Institute of Materials Structure Science, Tsukuba, Ibaraki, Japan
D081	X-RAY DIFFRACTION FOR PROCESS DEVELOPMENT AND CONTROL IN SEMICONDUCTOR INDUSTRY K.J. Kozaczek, HyperNex, Inc., State College, PA
D025	STRUCTURE CHARACTERIZATION OF LANGMUIR-BLODGETT FILMS OF PHTHALOCYANINE MATERIALS W. Xia, M.D. Carducci, N.R. Armstrong, University of Arizona, Tucson, AZ
D027	DIFFUSE X-RAY SCATTERING IN THE NANOMETROLOGY OF THIN FILM SYSTEMS AND INTERFACES I. Busch, J. Stümpel, Physikalisch-Technische Bundesanstalt, Braunnschweig, Germany
D026	MICROSTRUCTURES AND STRAIN RELAXATION IN MODULATION-DOPED AlxGa1-xN/GaN HETEROSTRUCTURES W.S. Tan, X.S. Wu, H. Sha, H.L. Cai, S.S. Jiang, Nanjing University, Nanjing, China W.L. Zheng, Q.J. Jia, Q. He, Chinese Academy of Science, Beijing, China
D134	THERMAL INDUCED STRESSES IN THIN ALUMINUM LAYERS GROWN ON SILICON E. Eiper, R. Resel, Graz University of Technology, Austria C. Eisenmenger-Sittner, University of Technology Vienna, Austria M. Hafok, J. Keckes, University of Leoben, Austria

Organics

D116	STRUCTURE DETERMINATION FROM POWDER DIFFRACTION DATA AND STRUCTURE VALIDATION USING SOLID STATE NMR M. Rajeswaran, T. Blanton, N. Zumbulyadis, D.J. Giesen, Eastman Kodak Company, Rochester, NY C. Conesa-Moratilla, Accelrys, Cambridge, UK S. Misture, NYS College of Ceramics at Alfred University, Alfred, NY P.W. Stephens, A. Huq, SUNY-Stony Brook, Stony Brook, NY
D065	EVALUATION OF SEVERAL ACTIVE PHARMACEUTICAL COMPOUNDS IN SAMPLES USED IN THE PRODUCTION OF GENERIC DRUGS R. Toro, A. Uzcátegui, C. Cedeño, G. Díaz de Delgado, J.M. Delgado, Universidad de Los Andes, Mérida, Venezuela E. González, PROULA, Universidad de Los Andes, Mérida, Venezuela

 
Phase Transformations

D015	RIETVELD ANALYSIS BASED ON XRPD AND NEUTRON DIFFRACTION DATA OF METASTABLE SOL-GEL PRODUCTS G. Kimmel, R. Xu, P. Ari-Gur, Western Michigan University, Kalamazoo, MI J.W. Richardson, Argonne National Laboratory, Argonne, IL E. Guncharov, J. Zabicky, Ben-Gurion University of the Negev, Beer-Sheva, Israel
D048	HIGH TEMPERATURE XRD STUDY OF THE REACTION SEQUENCE AND KINETICS DURING SYNTHESIS OF Bi4Ti3O12 M.S. Haluska, S.T. Misture, NYS College of Ceramics at Alfred University, Alfred, NY
D067	IN-SITU HIGH TEMPERATURE PHASE TRANSFORMATIONS IN RARE EARTH NIOBATES K. Jurkschat, P. Sarin, L.F. Siah, W.M. Kriven, University of Illinois at Urbana- Champaign, Urbana, IL
D033	STUDIES OF PHASE TRANSFORMATION AND INTERFACIAL REACTION BY FAST X-RAY MEASUREMENT WITH AN IMAGING PLATE M. Imafuku, Nippon Steel Corporation, Chiba, Japan

 
 Biological

D055	SYNCHROTRON X-RAY MICRO-BEAM DIFFRACTION AND SMALL ANGLE SCATTERING MAPPING IN BONE AND OSSICLES S.R. Stock, A. Veis, H.G. Simon, Northwestern University, Chicago, IL K. Ignatiev, Georgia Institute of Technology, Atlanta, GA J.D. Almer, Argonne National Laboratory, Argonne, IL
D112	X-RAY EVALUATION OF FRACTURE IN DENTAL MATERIAL X. Zhengyang, N. Lian, T. Saito, Dalian Institute of Light Industry, Dalian, China H. Hirose, Kinjyo University, Matto, Japan
D016	CHARACTERIZATION OF THE EVOLUTIONARY ASPECTS OF GREAT WHITE SHARK TEETH BY X-RAY DIFFRACTION METHODS AND OTHER SUPPORTING TECHNIQUES M. Kesmez, J. Lyon, D.L. Cocke, J. Westgate, Lamar University, Beaumont, TX H. McWhinney, T.L. Grady, Prairie View A&M University, Prairie View, TX

For more information please contact Denise Flaherty - flaherty@icdd.com