194 of 2010 DXC abstracts sorted by correspondent author's last name

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UNRAVELING THE INNER WORKINGS OF ENERGY-RELATED MATERIALS USING IN-SITU X-RAY ABSORPTION TECHNIQUES
F.M. Alamgir, Georgia Institute of Technology, Atlanta, GA
VISUALIZING THE 17TH CENTURY UNDERPAINTING USING MOBILE AND SYNCHROTRON-BASED SCANNING MACRO-XRF
M. Alfeld, K. Janssens, University of Antwerp, Antwerp, Belgium
J. Dik, Delft University of Technology, Delft, the Netherlands
P.D. Siddons, Brookhaven National Laboratory, NSLS, Brookhaven, NY
E. van de Wetering, Rembrandt Research Project, Amsterdam, the Netherlands
COMMISSIONING RESUTS AND NEW SCIENTIFIC OPPORTUNITIES AT VULCAN - the SNS MATERIALS SCIENCE AND ENGINEERING DIFFRACTOMETOR
K. An*, X.-L. Wang, A. D. Stoica, H. Skorpenske,D. Ma ,C. R. Hubbard, Oak Ridge National Laboratory, Oak Ridge, TN
T. M. Holden, Northern Stress Technology, Deep River, Canada
P. K. Liaw, H. Choo, Department of Materials Science and Engineering, University of Tennessee, Knoxville, TN
X-RAY DIFFRACTION IN IRON AND STEEL INDUSTRIES – GRADE CONTROL, PROCESS OPTIMIZATION AND MINIMIZING ENERGY CONSUMPTION AND CO2 EMISSIONS
U. Konig, PANalytical B.V., Almelo, Netherlands
J. Anderson*, K. Macchiarola, PANalytical, Westborough, MA, USA
L. Gobbo, PANalytical, Sao Paulo, Brazil
HIGH-RESOLUTION POWDER X-RAY DIFFRACTION STUDY OF COMPLEX MINERALS
Sytle M. Antao, University of Calgary, Calgary, Alberta, Canada
X-RAY ABSORPTION SPECTROSCOPY OF CHANGES IN TI SITES DURING LI INSERTION IN NANOSTRUCTURED ANATASE
R. Apps*, G. Mountjoy, University of Kent, Canterbury, Kent, UK
U. Lafontb, Delft.Chem.Tech., TU Delft, The Netherlands
INVESTIGATION OF MICROSTRUCTURAL CHANGES IN IMPACTED POLYUREA COATINGS USING SMALL ANGLE X-RAY SCATTERING (SAXS)
E. Balizer*, J. Fedderly, G. Lee, NSWCCD, Carderock, MD, USA
Susan Bartyczak*, Willis Mock, NSWCDD, Dahlgren, VA, USA
XRD WINNING SMILES: ANALYSIS OF DENTAL CALCULUS IN BIOARCHAEOLOGY
S. Beckett*, C. Greenwood, S. Ralph, Cranfield Forensic Institute, Department of Applied Science, Security and Resilience, Cranfield University, Shrivenham, SN6 8LA, UK
K.D. Rogers, Cranfield Health, Translational Medicine, Cranfield University, Shrivenham, SN6 8LA, UK
K. Hardy, BioArch, University of York, YO10 5YW, UK
J.G. Clement, Melbourne Dental School, Faculty of Medicine, Dentistry and Health Science, The University of Melbourne, 720 Swanston Street, Melbourne 3010, Australia
SPECIES IDENTIFICATION OF BONE FRAGMENTS: DEVELOPMENT OF A NEW COMBINED METHOD OF HEAT TREATMENT AND X-RAY DIFFRACTION ANALYSIS
S. Beckett*, Cranfield Forensic Institute, Department of Applied Science, Security and Resilience, Cranfield University, Shrivenham, SN6 8LA, UK
K.D.Rogers, Cranfield Health, Translational Medicine, Cranfield University, Shrivenham, SN6 8LA, UK
J.G.Clement, Melbourne Dental School, Faculty of Medicine, Dentistry and Health Science, The University of Melbourne, 720 Swanston Street, Melbourne 3010, Australia
INVESTIGATION OF XSW RELATED EFFECTS ON REFERENCE-FREE QUANTITATION OF NANOPARTICLES
Janos Osán, Szabina Török, Hungarian Academy of Sciences KFKI Atomic Energy Research Institute, Budapest, Hungary
Falk Reinhardt, Burkhard Beckhoff, Physikalisch-Technische Bundesanstalt, Berlin, Germany
A.E. Pap, Hungarian Academy of Sciences, Research Institute for Technical Physics and Materials Science, Budapest, Hungary
ASSESSMENT OF ADVANCED X-RAY GIXRF METHODOLOGY APPLIED TO THE CHARACTERIZATION OF ULTRA SHALLOW JUNCTIONS
P. Hönicke, B. Beckhoff, M. Kolbe, Physikalisch-Technische Bundesanstalt, Berlin, Germany
D. Giuberton, G. Pepponi, Fondazione Bruno Kessler, Trento, Italy
J. van den Berg, Institute for Materials Research, University of Salford, Salford, UK
INVESTIGATION OF SPIN-COATED INORGANIC CONTAMINATION ON SI SURFACES BY VARIOUS ANALYTICAL TECHNIQUES
B. Beckhoff, M. Kolbe, M. Müller, Physikalisch Technische Bundesanstalt, Berlin, Germany
A. Nutsch, R. Altmann, Fraunhofer IISB, Erlangen, Germany
G. Borionetti, C. Pello, MEMC Electronic Materials SpA, Novara, Italy
M. L. Polignano, D. Codegoni, S. Grasso, E. Cazzini, Numonyx, Via Olivetti, Milan, Italy
M. Bersani, P. Lazzeri, S. Gennaro, Fondazione Bruno Kessler, Trento, Italy
P. Kregsamer, F. Posch, Atominstitut, TU Wien, Vienna, Austria
HIGH-RESOLUTION SOFT X-RAY EMISSION SPECTROMETRY EMPLOYED FOR THE DETERMINATION OF ATOMIC FUNDAMENTAL PARAMETERS RELATED TO THE NI L- FLUORESCENCE PROCESS
M. Müller, B. Beckhoff, Physikalisch-Technische Bundesanstalt, Berlin, Germany
B. Kanngießer, TU Berlin, Institut für Optik und Atomare Physik, Berlin, Germany
STRUCTURE AT THE NANOSCALE: ATOMIC PAIR DISTRIBUTION FUNCTION ANALYSIS OF NANOSTRUCTURED MATERIALS
S. Billinge, Columbia University, New York, NY
IN SITU HIGH TEMPERATURE X-RAY DIFFRACTION CHARACTERIZATION OF SILVER SULFIDE, Ag2S
T. Blanton*, N. Dontula, Eastman Kodak Company, Rochester, NY,USA
S. Misture, Alfred University, Alfred, NY, USA
ASSESSING THE ENVIRONMENT WITH X-RAY FLUORESCENCE
Johan, Boman, Department of Chemistry, Atmospheric Science, University of Gothenburg, SE-412 96 Gothenburg, Sweden
Jan B. C., Pettersson, Department of Chemistry, Atmospheric Science, University of Gothenburg, SE-412 96 Gothenburg, Sweden
Michael, Gatari, Institute of Nuclear Science & Technology, University of Nairobi, P.O. Box 30197-00100, Nairobi, Kenya
Annemarie, Wagner, Department of Applied Physics, Chalmers University of Technology, SE-412 96 Gothenburg, Sweden
Peter, Molnár, Department of Occupational and Environmental Medicine, Sahlgrenska University Hospital & University of Gothenburg, Box 414, SE-405 30 Gothenburg, Sweden
Global Cement and Raw Materials Fusion/XRF Analytical Solution: Part 2
M. Bouchard, J. Anzelmo, S. Rivard, Corporation Scientifique Claisse, Quebec, Canada
A. Seyfarth, L. Arias, Bruker-AXS, Madison, WI
K. Behrens, S. Durali-Müller, Bruker-AXS GmbH, Karlsruhe, Germany
ANALYTICAL STRATEGY FOR COMPOSITIONAL AND LAYER THICKNESS ANALYSIS OF COPPER-INDIUM-GALLIUM-SELENIUM ON MOLYBDENUM COATED GLASS SUBSTRATES
Lora L. Brehm*, Towhid T. Hasan, Daniel A. Libby, Todd R. Bryden, The Dow Chemical Company, Midland, Michigan USA
ADVANCING PHOTOVOLTAICS: NEW METHODS FOR THE DETERMINATION OF CZTS STOICHIOMETRY
W. Wayne Brubaker, DuPont Central Research and Development, Wilmington, DE, USA
THE DEVICE FOR DETERMINATION OF EFFECTIVE ATOMIC NUMBER MATERIALS
I.A.Brytov*,R.I. Plotnikov,A.D.Goganov, Saint Petersburg Electrotechnical University ,Russia
PREFERRED ORIENTATION IN POLYMER FIBERS
C. Burger*, B.S. Hsiao, B. Chu, Stony Brook University, Stony Brook, NY, USA
X-RAY FLUORESCENCE ANALYSIS OF PALLADIUM IN NON-HOMOGENEOUS ORGANICS AND SLURRIES VIA GEL SUSPENSIONS
D.W. Burns*, Y. Yang, Dow Chemical, Freeport, TX, USA
S. Yusuf, Dow Chemical, Midland, MI, USA
D.G. Coler, PANalytical, Westborough, MA, USA
GLANCING INCIDENCE XRF FOR THE ANALYSIS OF EARLY CHINESE BRONZE MIRRORS
Robert W. Zuneska, Jane Rong, Isaac Vander, and F. J. Cadieu*, Physics Dept., Queens College of CUNY, Flushing, NY 11367
GLANCING VERSUS NORMAL XRF EXCITATION WITH MONOCHROMATIC AND POLYCHROMATIC RADIATION FOR THE COMPOSITION ANALYSIS OF SmCo BASED FILMS ON SILICON WAFERS
F. J. Cadieu*, Isaac Vander, and Robert W. Zuneska, Physics Dept., Queens College of CUNY, Flushing, NY 11367
Light Element Analysis by Portable XRF in Mining Applications
Michelle Cameron, Bruker Elemental, Kennewick, WA
Daniel Cordier, USGS, Reston, VA
X-ray Diffraction Techniques for Characterization of Thin Film Solar Cells
I. Cernatescu, B. Litteer, S. Rekhi, PANalytical, Westborough, MA
J. Woitok, PANalytical, Almelo, The Netherlands
HIGH-DEFINITION XRF – MULTIPLE MONOCHROMATIC BEAMS EDXRF – FOR CONSUMER PRODUCT ANALYSIS
Z. W. Chen*, Satbir Nayar, X-Ray Optical Systems, Inc., East Greenbush, NY, USA
Analyzing Stratigraphy with a Dual XRD/ XRF instrument
Giacomo Chiari, Getty Conservation Institute, Los Angeles, CA, USA
Effects of Cycling Hydrogen and Nitrogen Mixed Gases on Lithium Nitride based Hydrogen Storage Materials
W. Chien*, J. Lamb, N.K. Pal, D. Chandra, University of Nevada, Reno, Reno, NV, USA
MAGNETIC FOCUSING ACHIEVES SUB-100 μm SPOTS WITH MINI X-RAY TUBES
S Cornaby, Moxtek, Orem, UT, USA
J Steele, Brigham Young University, Provo, UT, USA
M Handley, Brigham Young University, Provo, UT, USA
O Johnson, Brigham Young University, Provo, UT, USA
P Jepsen, Brigham Young University, Provo, UT, USA
S Rose, Brigham Young University, Provo, UT, USA
CERTIFYING LEAD CONTENT IN CHILD-ACCESSIBLE PRODUCTS, A NEW GENERATION OF CALIBRATION AND CERTIFIED REFERENCE MATERIALS
John B. Sardisco*, PhD., Keith A. Perrin, John S. Crnko, Analytical Services, Inc., The Woodlands, TX, USA
X-RAY ABSORPTION IMAGING FOR ANALYSIS OF GAS DISCHARGES IN ENERGY EFFICIENT LIGHTING
J. J. Curry, NIST, Gaithersburg, MD, USA
‘CALCULATED’ REFERENCE PATTERNS &‘MEASURED’ REFERENCE SCANS: NEW DATABASE POSSIBILITIES
Thomas, Degen, PANalytical B.V., Lelyweg 1, 7602 EA Almelo, The Netherlands
SCATTER ENHANCED X-RAY IMAGING
A.Dicken*, K.Rogers, J.Rogers, Department of Translational Medicine, Cranfield Health, Cranfield University, Swindon, UK.
P. Evans, J.W.Chan, The Imaging Science Group, School of Science and Technology, Nottingham Trent University, Nottingham, UK
MEDIEVAL MICROFABRICATION: X-RAY TOMOGRAPHIC AND LAMINOGRAPHIC VISUALIZATION OF RELIGIOUS ARTWORK
J. Dik, TU Delft, Delft, the Netherlands
A. Wallert, Rijksmuseum, Amsterdam, the Netherlands
J. Blaas, TU Delft, Delft, the Netherlands
P. Reischig, European Synchrotron Radiation Facility, Grenoble, France
L. Helfen, European Synchrotron Radiation Facility, Grenoble, France
A. Bravin, European Synchrotron Radiation Facility, Grenoble, France
PDF ANALYSIS OF GLASSY AND NANOCRYSTALLINE METALLIC MATERIALS
W. Dmowski*.Y. Iwashita, T. Egami, University of Tennessee, Knoxville, TN, USA
S. H. Overbury, ORNL, Oak Ridge, TN, USA
TRACE ELEMENT ANALYSIS USING EDXRF WITH POLARIZED OPTICS
Takao Moriyama, Satoshi Ikeda, Makoto Doi*, Rigaku Corporation, Osaka, Japan
Scott Fess, Applied Rigaku Technologies, Inc., Austin, TX, USA
DEVELOPMENT OF QUANTIFICATION METHOD USING FUNDAMENTAL PARAMETER METHOD FOR EDXRF
Shinya Hara, Naoki Kawahara, Takashi Matsuo, Makoto Doi*, Rigaku Corporation, Osaka, Japan
LOW-TEMPERATURE XRD STUDIES OF LITHIUM BATTERY ELECTROLYTES BASED ON ETHYLENE CARBONATE – DIMETHYL CARBONATE MIXTURES
A. Drews, Ford Research and Advanced Engineering, Dearborn, MI USA
J. Adams, Ford Research and Advanced Engineering, Dearborn, MI USA
M. Karulkar, Ford Research and Advanced Engineering, Dearborn, MI USA
R. Kudla, Ford Research and Advanced Engineering, Dearborn, MI USA
C. Paik, Ford Research and Advanced Engineering, Dearborn, MI USA
STRAIN-INDUCED TEXTURE DEVELOPMENT IN THE MAGNESIUM ALLOY AZ31
S. Huang, School of Mechanical Engineering, Shanghai Jiao Tong University, Shanghai, China
A. Drews, Ford Research and Advanced Engineering, Dearborn, MI USA
M. Li, Ford Research and Advanced Engineering, Dearborn, MI USA
J. Allison, Ford Research and Advanced Engineering, Dearborn, MI USA
AN INEXPENSIVE STAGE FOR REFLECTION GEOMETRY VARIABLE TEMPERATURE DIFFRACTION USING AN OFF-THE-SHELF PELTIER DEVICE
A. Drews, Ford Research and Advanced Engineering, Dearborn, MI USA
RECENT ADVANCES IN THE PDF TECHNIQUE (2)
T. Egami, University of Tennessee, Knoxville, TN, USA
ADVANTAGES AND DISADVANTAGES OF BAYESIAN METHODS FOR OBTAINING XRF NET INTENSITIES
W. T. Elam, EDAX, a unit of Ametek Inc. Mahwah, NJ 07430
Bruce Scruggs, EDAX, a unit of Ametek Inc. Mahwah, NJ 07430
Frank Eggert, EDAX, a unit of Ametek Inc. Mahwah, NJ 07430
Joseph Nicolosi, EDAX, a unit of Ametek Inc. Mahwah, NJ 07430
X-RAY DIFFRACTION FROM AL POWDER USING ENERGY DISPERSIVE TECHNIQUE
I.S. Elyaseery, University of Garyounis, Benghazi, Libya
HIGH SPEED 3D DIFFRACTION IMAGING
J.P.O. Evan*, J.W. Chan, S.X. Godber, I. Peatfield, Nottingham Trent University, UK
K.D. Rogers, A. Dicken, J. Rogers, Cranfield University, UK
ACHIEVEMENT OF 1 MCPS OUTPUT RATE FROM A LARGE AREA SILICON DRIFT DETECTOR
L. Feng*, V.D. Saveliev, M. Takahashi, S. Barkan, E.V. Damron, C.R. Tull, SII NanoTechnology USA, Northridge, CA 91324
READOUT ASICS FOR SILICON DRIFT DETECTORS
L.Bombelli, C.Fiorini, A.Celani, A.Longoni, Politecnico di Milano - DEI - , Milano, Italy
R.Alberti, T.Frizzi, R.Nava, XGLab S.R.L., Milano, Italy
ANALYSIS OF INDOOR FINE DUST
U.E.A. Fittschen, A. Rehmers, University of Hamburg, Hamburg, Germany
M. Santen, Greenpeace Hamburg, Hamburg, Germany
M. Wesselmann, Bauinstitut Hamburg, Harburg, Germany
STXM IMAGING OF ORGANIC COATINGS ON GRAINS IN PRIMITIVE INTERPLANETARY DUST: IMPLICATIONS FOR FORMATION OF PRE-BIOTIC ORGANIC MATTER AND GRAIN STICKING IN THE EARLY SOLAR SYSTEM
G. J. Flynn, Dept. of Physics, SUNY-Plattsburgh, Plattsburgh NY 12901 USA
S. Wirick, Dept. of Physics and Astronomy, SUNY- Stony Brook, Stony Brook, NY 11794 USA
L. P. Keller, NASA Johnson Space Center, Houston TX 77058 USA
S. A. Sandford, NASA Ames Research Center, Moffett Field, CA 94035 USA
C. Jacobsen, Dept. of Physics and Astronomy, SUNY- Stony Brook, Stony Brook, NY 11794 USA
EMPYREAN – THE WORLD OF X-RAY DIFFRACTION IS NO LONGER FLAT
M. Fransen, PANalytical, Almelo, The Netherlands
TEMPERATURE CONTROLLED HUMIDITY STUDY OF TREHALOSE USING X RAY POWDER DIFFRACTION
H. van Weeren, C.A. Reiss, PANalytical B.V., Almelo, The Netherlands
C. Resch, Anton Paar GmbH, Graz, Austria
NEW USES OF X-RAY FLUORESCENCE SPECTROSCOPY (XRF) AS A PUBLIC HEALTH SCREENING TOOL FOR THE PRESENCE OF HAZARDOUS CHEMICALS IN CONSUMER PRODUCTS
Jeff Gearhart, Research Director, Ecology Center
INDOOR AIR QUALITY IN BRAZILIAN SCHOOLS NEARBY INDUSTRIES: THE CASE OF CURITIBA
R.H.M.Godoi*, Federal University of Parana - UFPR, Brazil
A.F.L.Godoi, Federal University of Parana - UFPR, Brazil
J. E. F. C. Gardolinski, Federal University of Parana - UFPR, Brazil
J. M. Reis Neto, Federal University of Parana - UFPR, Brazil
R. Alves, Federal University of Parana - UFPR, Brazil
R. Van Grieken, University of Antwerp, Belgium
INVESTIGATIONS OF THE DEFECT STRUCTURE OF TRANSPARENT CONDUCTORS USING X-RAY AND NEUTRON SCATTERING TECHNIQUES
G.B. González Avilés*, Department of Physics, DePaul University, Chicago, IL, USA
T.O. Mason, J.S. Okasinski, Department of Materials Science and Engineering, Northwestern University, Evanston, IL, USA
O. Warschkow, D.E. Ellis, Department of Physics and Astronomy, Northwestern University, Evanston, Illinois, USA
J.P. Hodges, Spallation Neutron Source Division, Oak Ridge National Laboratory, Oak Ridge, Tennessee, USA
T. Buslaps, V. Honkimäki, Experiments Division, European Synchrotron Radiation Facility, Grenoble, France
DISCOVERING THE SELENIUM METABOLISM AND ITS IMPACT FOR HEALTH PREVENTION BY TXRF
A. Gross*, H. Stosnach, Bruker Nano GmbH, Berlin, Germany
K. Renko, T. Behrends, L. Schomburg, Institute for Experimental Endocrinology, Charite Berlin, Berlin, Germany
NEW X-RAY IMAGING CAMERA TO GAIN INSIGHT INTO X-RAY SOURCE CHARACTERISTICS
L.Pina, M.Horvath, Rigaku Innovative technologies Europe, s.r.o., Prague, CZECH REPUBLIC
N.Grupido*, B.Ehlers, B.Kim, Rigaku Innovative Technologies, Inc., Auburn Hills, MI, USA
XRD STRESS ANALYSES ON SURFACES WITH CURVATURE RADIUS BELOW 1MM, ANEW CHALLENGE!
A. Haase, M. Klatt, A. Schafmeister, R. Stabenow, GE Sensing & Inspection Technologies GmbH, 22926 Ahrensburg, Germany
New Advances in Standardless Analysis for XRF: Improvements for the Quantification of Challenging Industrial Samples
Kimberly Halkiotis*, David Coler, Greg Wortman, PANalytical Inc., Westborough, MA 01581
CHARACTERIZATION OF GEMSTONES BY MULTIPLE EXCITATION EDXRF
M.Haller, Fischer Technology,Windsor,Ct,USA
V, Rößiger, Helmut Fischer GmbH, Sindelfingen, Germany
A.Peretti, Gemresearch Swisslab AG, Lucerne, Switzerland
D.Günther, ETH Zürich, Switzerland
SELECTING THE APPROPRIATE X-RAY OPTIC FOR THE RIGHT APPLICATION
George J. Havrilla*, Velma Montoya, Los Alamos National Laboratory, Los Alamos, NM USA
TRACE ELEMENT DETECTION USING MONOCHROMATIC WAVELENGTH DISPERSIVE X-RAY FLUORESCENCE
George J. Havrilla*, Michael Collins, Velma Montoya, Los Alamos National Laboratory, Los Alamos, NM USA
Zewu Chen, Fuzhong Wei, X-ray Optical Systems, East Greenbush, NY USA
X-RAY SOURCE, OPTIC AND DETECTOR FOR TWO-DIMENSIONAL XRD
Bob B. He, Bruker AXS, Madison, WI, USA
APPLICATIONS OF TIME-RESOLVED SYNCHROTRON X-RAY DIFFRACTION TO MINERAL-FLUID REACTIONS
PJ Heaney*, TB Fischer, CR Fleeger, DR Hummer, KM Peterson, AJ Wall, Penn State University, University Park, PA, USA
JE Post, National Museum of Natural History, Smithsonian Institution, Washington, DC, USA
SCANNING PROBE DIFFRACTION MICROSCOPY AT THE CNM/APS HARD X-RAY NANOPROBE BEAMLINE
Martin Holt, S. Hruszkewycz, Robert Winarski, Volker Rose, Jorg Maser, Argonne National Laboratory, Argonne IL
ULTRATHIN MULTI-ELEMENT LAYER STACKS – A NEW TYPE OF REFERENCE SAMPLES FOR µ-XRF AND TXRF
T. Holz, M.Kraemer, R.Dietsch, D.Weissbach, AXO Dresden GmbH, D-01809 Heidenau, Germany
G. Falkenberg, Hasylab, D-22603 Hamburg, Germany
R. Simon, FZ Karlsruhe, D-76344 Eggersheim, Germany
U. Fittschen, T. Krugmann, Universität Hamburg, D-20146 Hamburg, Germany
B. Beckhoff, PTB Berlin, D-10587 Berlin, Germany
FUNCTIONAL MULTILAYER OPTICS – GRADED NANOMETER MULTILAYERS AS POLARIZERS AND BANDPASS FILTERS WITH TUNABLE ENERGY AND ANGULAR RESOLUTION
T. Hol, R.Dietsch, D.Weissbach, M. Kraemer, AXO Dresden GmbH, D-01809 Heidenau, Germany
INVESTIGATION OF THE ELEMENT DISTRIBUTION IN TXRF SAMPLES USING SR µXRF
C. Streli*, C. Horntrich, S. Smolek, A. Maderitsch, P. Kregsamer, Atominstitut, Vienna University of Technology, Vienna, Austria
R. Simon, Forschungszentrum Karlsruhe, Institut für Synchrotronstrahlung, Eggenstein-Leopoldshafen, Germany
A. Nutsch, Fraunhofer Institute for Integrated Systems and Device Technology, Erlangen, Germany
M. Knoerr, Fraunhofer Institute for Integrated Systems and Device Technology (ZKLM), Nürnberg, Germany
CHARACTERIZATION OF BIOMEDICAL MATERIALS USING LOW ANGLE X-RAY SCATTERING (LAXS) SYSTEM
Nagi A . Hussein., Department of Physics, Faculty of Science, University of Garyounis, Benghazi, Libya
A. Shukri, School of Physics, Universiti Sains Malaysia, 11800 Penang, Malaysia.
A. A. Tajuddin, School of Physics, Universiti Sains Malaysia, 11800 Penang, Malaysia
POLYMER-ORIENTED TOOLS IN THE IRENA PACKAGE FOR SMALL-ANGLE SCATTERING DATA ANALYSIS
J. Ilavsky, Advanced Photon Source, ANL, Argonne, IL, USA
Improving XRF Analysis of Atmospheric Particulate Matter Samples: Calibration by Ideal Reference Materials and Investigating Interferences
Hege, Indresand*, Warren, White*, Xiaoya, Cheng*, Krystyna, Trzepla-Nabaglo*, Brian, Perley*, Ann M., Dillner*, IMPROVE Program, Crocker Nuclear Laboratory, University of California Davis, Davis, CA, USA
Xiaoya, Cheng, Department of Environmental Engineering, Zhejiang University, Hangzhou, P.R. China
In-Plane Diffraction Analysis for Twist/Twin Structure of Non-polar A-plane GaN
Young-il Jang*, Kyu-ho Park and Kyu-hyun Bang, Devices & Materials Lab., LG Advanced Research Institute
DESIGN AND DEVELOPMENT OF COMPOND X-RAY OPTICAL SYSTEMS
Boris Verman, Doug Wilcox, Bonglea Kim, Roman Samokyszyn, Mike Young, Yusheng Hua, Licai Jiang*, Rigaku Innovative Technologies, Inc., Auburn Hills, Michigan 48326 USA
Tetsuya Ozawa, Ryuji Matsuo, Kazuhiko Omote, Takeshi Osakabe, Makoto Aoyagi, Koshi Sumii, Rigaku Cooperation, Tokyo, JAPAN
THE LATEST DEVELOPOMENT OF MICROFOCUSING SOURCE BASED BEAM MODULES AND THEIR APPLICATIONS
Bonglea Kim, Boris Verman, Doug Wilcox, Roman Samokyszyn, Mike Young, Licai Jiang*, Rigaku Innovative Technologies, Inc., Auburn Hills, Michigan, USA
CRYSTAL STRUCTURES OF BaSrR4Zn2O10, R = La, Nd, Sm, Eu
J A Kaduk, Poly Crystallography, Naperville IL USA
W. Wong-Ng, NIST, Gaithersburg MD USA
IN-PLANE AND CONVENTIONAL POLE FIGURE MEASUREMENTS
Erina Kagami*, Aya Takase, Rigaku Corporation
CHALLENGES OF XRF ANALYSIS OF CULTRUAL HERITAGE GLASS OBJECTS
Dr Bruce J. Kaiser*, Bruker Elemental, Kennewick, WA USA
Dr Robert Brill, Corning Glass Musuem, Corning, NY USA
The Phase Diagram Studies on the 2-Amino-2-methyl-1, 3-propanediol(AMPL) and tris(hydroxymethyl)aminomethane(TRIS) Binary System
V.K. Kamisetty*, D. Chandra, W.M. Chien, University of Nevada, Reno, NV, USA
X-ray structural studies of Li-ion and Li-air battery materials
N.K. Karan, Y. Ren, M. Balasubramanian, APS, Argonne National Laboratory, IL 60439
L. Trahey, D.P. Abraham, C.S. Johnson, M.M. Thackeray, Chemical Science and Engineering Division, Argonne National Laboratory, IL 60439
MICRO-XRF ANALYSIS OF METAL ALLOYS: FROM THE LABORATORY CALIBRATION TOWARDS IN-SITU ANALYSES
A.G. Karydas*, V. Kantarelou, D. Sokaras, Institute of Nuclear Physics, NCSR Demokritos, 15310, Athens, Greece
D. Wegrzynek, E-Chinea-Cano, A. Markowicz, International Atomic Energy Agency (IAEA), Seibersdorf Laborarories, A-2444, Seibersdorf, Austria
P. Wobrauschek, C. Streli, TU Wien Atominstitut, Stadionallee 2, A-1020 Vienna, Austria
K. Uhlir, M. Griesser, Kunsthistrorisches Museum, Burgring 5, 1010 Wien
NANO-BEAM X-RAY DIFFRACTION REVEALS STRUCTURAL AND MECHANICAL GRADIENTS IN NANO-CRYSTALLINE THIN FILMS
J. Keckes, M. Bartosik, University Leoben, Leoben, Austria
G. Maier, Materials Centre Leoben, Leoben, Austria
M. Burghammer, ESRF, Grenoble, France
THERMO-MECHANICAL BEHAVIOUR OF THIN FILMS AND SMALL STRUCTURES CHARACTERIZED BY SYNCHROTRON X-RAY DIFFRACTION
J. Keckes, University Leoben, Leoben, Austria
Quantitative Speciation of Phosphate in Ternary Mineral Systems Using P K-XANES
N. Khare, University of Wyoming, Laramie, WY, USA
DEVELOPMENT OF IN SITU X-RAY DIFFRACTION SYSTEM FOR HYDROTHERMAL REACTION AND ITS APPLICATION TO AUTOCLAVED AERATED CONCRETE FORMATION
J. Kikuma*, M. Tsunashima, T. Ishikawa, S. Matsuno, Asahi-KASEI Corporation, Fuji, Shizuoka, Japan
K. Matsui, A. Ogawa, Asahi-KASEI Construction Materials Corporation, Sakai, Ibaraki, Japan
STRUCTURE OF CRYSTALLOGRAPHICALLY CHALLENGED HYDROGEN STORAGE MATERIALS
H. J. Kim, Los Alamos National Laboratory, Los Alamos, NM, USA
X-Ray Fluorescence (XRF) Analysis of Soil Heavy Metal Pollution From An Industrial Area - a case study of “Suame- Magazine” in Kumasi, Ghana.
K. Kodom, K. Preko, Kwame Nkrumah University of Science and Technology, Kumasi, Ghana
D. Boamah, Geological Survey Department, Accra, Ghana
XRF SPECTROSCOPY ASSESSMENT OF TRACE METAL POLLUTION AND DISTRIBUTION IN SURFACE SOILS CAUSED BY ANTHROPOGENIC ACTIVITIES
K. Kodom, K. Preko, B. Kwakye-Awuah, Kwame Nkrumah University of Science and Technology, Kumasi, Ghana
D. Boamah, Geological Survey Department, Accra, Ghana
TRANSIENT MICROSTRUCTURE OF THERMOPLASTIC POLYURETHANE NANOCOMPOSITES UNDER UNIAXIAL DEFORMATION
H. Koerner, R. Vaia, Air Force Research Lab, WPAFB, Ohio, US
EXPIRIENS OF STUDY MINERALS FROM KIMBERLITE OF YAKUTIA
L.V. Liskovaya, O.E. Kovalchuk, A.Ya. Rotman, NIGP "ALROSA" Co. Ltd., Mirny, RS (Ya), Russia
THE DETERMINATION OF COPPER SPECIATION IN BREAST TUMOR TISSUE USING A COMPACT, SHORT FOCAL DISTANCE BENT CRYSTAL LAUE ANALYZER
Naresh Kujala, BioCAT, Illinois Institute of Technology, Chicago, IL USA
C. Karanfil, Physics Department, Faculty of Arts & Sciences, Mugla University, Kotekli-Mugla 48187, Turkey
D. Chen, The Prevention Program, Barbara Ann Karmanos Cancer Institute, and Department of Pathology, School of Medicine, Wayne State University, Detroit, Michigan
Q. P. Dou, The Prevention Program, Barbara Ann Karmanos Cancer Institute, and Department of Pathology, School of Medicine, Wayne State University, Detroit, Michigan
Raul Barrea, BioCAT, Illinois Institute of Technology, Chicago, IL USA
Measurements of XRP cross sections and Li (i=1,2) sub-shell fluorescence yields for Ho at 22.6 keV incident photon energy
Anil Kumar, University College of Engineering, Punjabi University, Patiala-147002, Punjab, India.
Sanjiv Puri, University College of Engineering, Punjabi University, Patiala-147002, Punjab, India.
IN-SITU AND TIME RESOLVED SMALL ANGLE X-RAY SCATTERING
B.G. Landes, B.J. Kern. T.J. Hermel-Davidock, M. Demirors, J.D. Weinhold, G.R. Marchand, K.Nanjundiah, R.E. Drumright, The Dow Chemical Company
S.J. Weigand, Northwestern University, DND-CAT
COMBINED X-RAY IMAGING AND SPECTROSCOPY - A LOW COST SOLUTION
D.W.Lane*, J Lyons, CMSE, Cranfield University, Shrivenham, Swindon, UK
Relaxation behaviors of nanoparticles in polymer composites: influence of local frictions by polymer chains
Byeongdu Lee, Argonne National Laboratory
P. Thiyagarajan, Argonne National Laboratory
Suresh. Narayanan, Argonne National Laboratory
Alec. Sandy, Argonne National Laboratory
C.-T. Lo, Argonne National Laboratory
Vilas Pol, Argonne National Laboratory
REFINEMENT OF GARNET STRUCTURE FROM KIMBERLITE OF YAKUTIA
L.V. Liskovaya, O.E. Kovalchuk,, NIGP "ALROSA" Co. Ltd., Mirny, RS (Ya), Russia
A.C. Ivanov, BGRE "ALROSA" Co. Ltd., Mirny, RS (Ya), Russia
THEORETICAL DERIVATION XRD LINE PROFILE BASED ON ITS ABSORPTION
K. Liu,* H. Chen, Shanghai Institute of Tech, Shanghai,China
THE STRUCTURE AND HYDROGEN BONDING OF A HIGHLY DISORDERED FIBER
J.D. Londono, A.D. English, DuPont
P. Langan, Los Alamos
Y. Nishiyama, CNRS
T. Forsyth, ILL/Keele
SYSTEMATIC NEUTRON SCATTERING INVESTIGATION OF STRUCTURAL EVOLUTION IN PYROCHLORES AT LOW AND HIGH TEMPERATURES
Adrian S. Losko, Los Alamos National Laboratory, New Mexico, USA
Sven C. Vogel, Los Alamos National Laboratory, New Mexico, USA
James Rhyne, Los Alamos National Laboratory, New Mexico, USA
Maulik Patel, Los Alamos National Laboratory, New Mexico, USA
POLYMERS CHARACTERIZED USING IN SITU LABORATORY SAXS/WAXS COUPLED WITH MECHANICAL TESTS
M. Feuchter, nstitute of Material Science and Testing of Plastice, University of Leoben, Leoben, Austria
J. Keckes, 2Erich Schmid Institute for Materials Science, Austrian Academy of Sciences and Department of Materials Physics, University of Leoben, Leoben, Austria
G.A. Maier, Materials Center Leoben, Leoben, Austria
TOPOGRAPHY AS A METHOD TO EVALUATE OF X-RAY MIRRORS
Jozef A. Maj*, Argonne National Laboratory, Argonne,IL, USA
Patricia Fernandez, Argonne National Laboratory, Argonne,IL, USA
Krystofer Lazarski, Argonne National Laboratory, Argonne,IL, USA
Xianrong Huang, Argonne National Laboratory, Argonne,IL, USA
PRECONCENTRATION PROCEDURES LEADING TO SOLID THIN LAYERS FOR METAL DETERMINATION IN LIQUID ANALYSIS BY X-RAY FLUORESCENCE SPECTROMETRY
E.Margui*, I.Queralt, Laboratory of X-ray Analytical Applications (LARX). Institute of Earth Sciences “Jaume Almera”, CSIC. Solé Sabarís s/n. 08028 Barcelona, Spain
C.Fontas, M.Hidalgo, Department of Chemistry, University of Girona, Campus Montilivi, 17071 Girona, Spain.
K.Van Meel, R.Van Grieken, Department of Chemistry, University of Antwerp, Universiteitsplein 1, 2610 Antwerp, Belgium.
DETERMINATION OF ELEMENTAL IMPURITIES IN ACTIVE PHARMACEUTICAL INGREDIENTS ACCORDING TO CURRENT LEGISLATION BY USING X-RAY FLUORESCENCE SPECTROMETRY
E.Margui*, I.Queralt, Laboratory of X-ray Analytical Applications (LARX). Institute of Earth Sciences “Jaume Almera”, CSIC. Solé Sabarís s/n. 08028 Barcelona, Spain
C.Fontas, M.Hidalgo, Department of Chemistry, University of Girona, Campus Montilivi, 17071 Girona, Spain.
K.Van Meel, R.Van Grieken, Department of Chemistry, University of Antwerp, Universiteitsplein 1, 2610 Antwerp, Belgium.
X-RAY FLUORESCENCE SPECTROMETRY IN THE ENVIRONMENTAL FIELD: A REVIEW OF SOME RECENT INVESTIGATIONS AND APPLICATIONS
E.Margui*, I.Queralt, Laboratory of X-ray Analytical Applications (LARX). Institute of Earth Sciences “Jaume Almera”, CSIC. Solé Sabarís s/n. 08028 Barcelona, Spain
M.Hidalgo, Department of Chemistry, University of Girona, Campus Montilivi, 17071 Girona, Spain.
R.Van Grieken, Department of Chemistry, University of Antwerp, Universiteitsplein 1, 2610 Antwerp, Belgium.
THREE DIMENSIONAL X-RAY DIFFRACTION MICROSCOPY
L. Margulies, Brookhaven National Laboratory, Upton, NY
H.F. Poulsen, S. Schmidt, D.J. Jensen, Risoe National lab, Roskilde, Denmark
G. Vaughan, J. Wright, ESRF, Grenoble, France
CHARACTERIZATION OF SILVER GELATIN FIBER BASED PHOTOGRAPHIC PAPERS USING X-RAY FLUORESCENCE SPECTROSCOPY
A. Martins, C. McGlinchey, L.A. Daffner, Museum of Modern Art, New York, NY
P. Messier, LLC, Boston, MA
A. Chapman, University of Delaware Program in Art Conservation, Winterthur, DE
THE PHOTO-OXIDATIVE DEGRADATION OF MATISSE’S LE BONHEUR DE VIVRE (1905-6): X-RAY-BASED METHODS FOR DEGRADATION MECHANISM IDENTIFICATION
J. L. Mass*, Winterthur Museum, Winterthur, DE, USA
B. Buckley, M. Little, Barnes Foundation, Merion, PA, USA
IN SITU TIME-RESOLVED X-RAY DIFFRACTION OF TOBERMORITE FORMATION PROCESS UNDER HYDROTHERMAL CONIDITION: INFLUENCE OF REACTIVE Al COMPOUND
K. Matsui*, A. Ogawa, Asahi-KASEI Construction Materials Corporation, Sakai, Ibaraki, Japan
J. Kikuma, M. Tsunashima, T. Ishikawa, S. Matsuno, Asahi-KASEI Corporation, Fuji, Shizuoka, Japan
INCORPORATING THE CONCEPT OF SECONDARY TARGETS IN HANDHELD X-RAY FLUORESCENCE TO INCREASE SENSITIVITY OF MINOR ELEMENTS
Chris, McGlinchey, The Museum of Modern Art, NY, NY, US
Bruce, Kaiser, Bruker Elemental, Kennewick, WA, US
Therese, Howe, Bruker Elemental, Kennewick, WA, US
GOING BEYOND XRF: USE OF MICRO-FLUORESCENCE AND DIFFRACTION TO UNDERSTAND HOW A CULTURAL HERITAGE OBJECT WAS MADE AND HOW IT AGES AND DEGRADES
Marc Walton, Getty Conservation Institute, Los Angelos, CA, USA
Eleanor J. Schofield, University of Kent, Canterbury, UK
Ritimukta Sarangi, SSRL,/SLAC Nat Acc Lab, Menlo Park, CA, USA
Sam Webb, SSRL,/SLAC Nat Acc Lab, Menlo Park, CA, USA
Florian Meirer, Technische Universität Wien, Vienna, Austria
Apurva Mehta, SSRL,/SLAC Nat Acc Lab, Menlo Park, CA, USA
HIGH BRILLIANCE LABORATORY SOURCES FOR SMALL X-RAY BEAMS
C. Michaelsen*, T. Samtleben, B. Hasse, J. Wiesmann, U. Heidorn, S. Kroth, F. Hertlein, Incoatec, Geesthacht, Germany
High Temperature X-ray Diffraction Analyses of Monosodium Titanate & Sodium Peroxotitanate Resins
D.M. Missimer, A.R. Jurgensen, R.L. Rutherford, Savannah River National Laboratory, Aiken, SC
Effect of heat treatment on structure and phase transformation of RE2Zr2O7 powders intended for plasma spraying of ceramic layers
G. Moskal, T. Rzychoń, B. Witala, A. Rozmysłowska, Department of Materials Science, Silesian University of Technology, Krasińskiego 8, 40-019 Katowice, Poland
G. Dercz, Institute of Materials Science, University of Silesia, Bankowa 12, 40-007 Katowice, Poland
XRD residual stress characterization of air plasma sprayed RE-zirconates type of ceramic coatings
G. Moskal, T. Rzychoń, B. Witala, A. Rozmysłowska, Department of Materials Science, Silesian University of Technology, Krasińskiego 8, 40-019 Katowice, Poland
G. Dercz, Institute of Materials Science, University of Silesia, Bankowa 12, 40-007 Katowice, Poland
ANALYSIS OF THE EQUATORIAL STREAK IN SMALL-ANGLE X-RAY SCATTERING PATTERNS
N. Sanjeeva Murthy, Rutgers University
Wenjie Wang, University of Vermont
OXYGEN OCTAHEDRAL ENVIRONMENTS IN THREE-LAYER AURIVILLIUS PHASES VIA COMBINED X-RAY AND NEUTRON POWDER DIFFRACTION
E.J. Nichols, Alfred University, Alfred, NY, USA
S.T. Misture, Alfred University, Alfred, NY, USA
Excellent Performance with 100 mm² Silicon Drift Detectors for X-rays and Gammy Radiation
A. Niculae, A. Simsek, O. Jaritschin, PNDetector GmbH, Munich, Germany
H. Soltau, A. Liebel, R. Eckhardt, G. Lutz, S. Jeschke, P. Lechner, PNSensor GmbH, Munich, Germany
L.Strüder, F. Schopper, G. Schaller, MPI Semiconductor Laboratory, Munich, Germany
IN-SITU PHASE AND TEXTURE CHARACTERIZATION OF SOLUTION DEPOSITED PZT THIN FILMS DURING CRYSTALLIZATION
Krishna Nittala, University of Florida, Gainesville, FL, U. S. A
Geoff. L. Brennecka, Sandia National Laboratories, Albuquerque, NM, U. S. A
Jacob L. Jones, University of Florida, Gainesville, FL, U. S. A
NEAR-SURFACE IN-VITRO STUDIES OF PLASMA SPRAYED HYDROXYAPATITE COATINGS
T.P. Ntsoane*, Necsa, Pretoria, North West Province, South Africa
M. Topic, R. Bucher, iThemba LABS, Cape Town, Western Cape, South Africa
Comparison of X-Ray and Mass Spectroscopy based Analytical Methods for Detection of Organic Contamination
A. Nutsch, Fraunhofer IISB
B. Beckhoff, Physikalisch-Technische Bundesanstalt
G. Borionetti, MEMC Electronic Materials SpA
M.-L. Polignano, Numonyx
A. Leibold, Fraunhofer IISB
M .Müller, Physikalisch-Technische Bundesanstalt
IN-SITU STUDY OF GRAIN GROWTH OF NANO-ITO
John Okasinski*, Argonne National Laboratory, Advanced Photon Source, Argonne, IL, USA
Gabriela González Avilés, DePaul University, Department of Physics, Chicago, IL, USA
Applications of XRF in the Titanium Dioxide Industry
Laurie Ottmar, Millennium Inorganic Chemicals, Glen Burnie, MD, USA
50 MM² SILICON DRIFT DETECTOR IN COMPACT TO8 HOUSING
A. Pahlke, T. Eggert, R. Fojt, L. .Hoellt, J. Knobloch, S. Pahlke, O. Scheid, R. Stoetter, F. Wiest, KETEK GmbH, Munich, Germany
Effect of substrate temperature on the structural, optical and electrical properties of Silver Indium selenide films prepared by laser ablation
dinesh pathak, Material Science Laboratory, Department of Physics, Guru Nanak Dev University, Amritsar – 143005, India
R K Bedi, Material Science Laboratory, Department of Physics, Guru Nanak Dev University, Amritsar – 143005, India
D Kaur, Laser ablation has attracted special interest for the growth of thin films .It allows the formation of high quality layers and maintain stochiometry in the films of even very complex elemental materials. In this communication high quality AgInSe2 (AIS) films were grown onto the glass substrates kept at different temperature using ultra-high-vacuum pulsed laser deposition technique from the AIS target synthesized from high-purity materials. It has been observed that compositional stochiometry is largely maintained in the films .This suggest that PLD could be used as technique for fabrication of ternary semi conducting films. The X-ray diffraction studies of the films show that films are textured in (112) direction. The structural, optical and electrical properties have been investigated as a function of substrate temperature. An increase in substrate temperature results in more ordered structure. Roughness of the films is found to increase at higher deposition temperatures. The optical studies of the films show that the optical band gap lie in the range 1.20 -1.27 eV. The activation energy has been found in the range 0.0103 - 0.0556 eV.
Overlay of Laboratory-Based 3D X-ray Imaging Systems.
G. Havrilla, Los Alamos National Laboratory, Los Alamos, NM, USA
Element-Specific Structure of Nanosized Materials by High-Energy Resonant X-Ray Diffraction and Differential Atomic Pair Distribution Functions
V. Petkov, Central Michigan University, Mt. Pleasant, MI
S. Shastri, APS, Argonne National Laboratory, Argonne, IL
Multi-dimensional X-ray Investigation of Materials - Ranging from classical Bragg-Brentano type diffraction phase analysis to 3 dimensional CT microstructure analysis
Herbert Pöllmann, University of Halle/Mineralogy/Germany
Roger Maier, Panalytical Almelo, Netherlands
Uli Riedl, Panalytical Almelo, Netherlands
Gabriel Blaj, Panalytical Almelo, Netherlands
Synthesis and characterization of ettringites
Herbert, Poellmann
ANALYZING THE GROWTH PROCESS OF SINGLE-WALLED CARBON NANOTUBES BY X-RAY SPECTROMETRY
B. Pollakowski*, B. Beckhoff, Physikalisch-Technische Bundesanstalt, Berlin, Germany
L. Rispal, U. Schwalke, Institute for Semiconductor Technology and Nanoelectronics (ISTN), Technische Universität Darmstadt, Darmstadt, Germany
NON-DESTRUCTIVE CHEMICAL SPECIATION OF BURIED INTERFACES BY ABSORPTION SPECTROSCOPY AT GRAZING INCIDENCE CONDITIONS
F. Reinhardt, B. Beckhoff, B. Pollakowski*, Physikalisch-Technische Bundesanstalt, Berlin, Germany
H. Bresch, S. Seeger, Bundesanstalt für Materialforschung und –prüfung. Berlin, Germany
DEPTH-RESOLVED SPECIATION OF BURIED NANOLAYERS
F. Reinhardt, B. Beckhoff, B. Pollakowski*, Physikalisch-Technische Bundesanstalt, Berlin, Germany
H. Bresch, S. Seeger, Bundesanstalt für Materialforschung und –prüfung. Berlin, Germany
CHARACTERIZATION OF NANOPARTICLES WITH X-RAY SPECTROMETRY UNDER GRAZING INCIDENCE CONDITIONS
F. Reinhardt, B. Beckhoff, B. Pollakowski*, Physikalisch-Technische Bundesanstalt, Berlin, Germany
H. Bresch, S. Seeger, Bundesanstalt für Materialforschung und –prüfung. Berlin, Germany
SYNCHROTRON POWDER X-RAY DIFFRACTION STUDY OF THE STRUCTURE AND DEHYDRATION BEHAVIORS OF SEPIOLITE AND PALYGORSKITE
J.E. Post, Smithsonian Institution, Washington, DC, USA
P.J. Heaney, Penn. State University, University Park, PA, USA
FORCE MEASUREMENT OF DNA WITH PAIR DISTRIBUTION FUNCTION
Xiangyun Qiu, National Institutes of Health, Bethesda, MD, 20892, USA
A NOVEL SAMPLE PRESSING TECHNIQUE TO REDUCE PREFERRED ORIENTATION USING THE BACK-PRESSED PRESENTATION METHOD
N. A. Raftery, X-ray Analysis Facility, Queensland University of Technology, Brisbane, Australia.
COMBINING CdTe AND Si DETECTORS FOR ENERGY-DISPERSIVE X-RAY FLUORESCENCE
R. Redus*, T. Pantazis, J. Pantazis, A. Huber, Amptek, Inc., Bedford, MA, USA
B. Cross, CrossRoads Scientific, El Granada, CA
CHARACTERIZATION OF SILICON DRIFT DETECTORS FOR EDXRF
R. Redus*, T. Pantazis, J. Pantazis, A. Huber, Amptek, Inc., Bedford, MA, USA
NEW HIGH-PRESSURE AND HIGH-TEMPERATURE XRD SAMPLE STAGE FOR IN-SITU STUDIES OF SOLID-GAS INTERACTIONS
C. Resch, J. Gautsch, J. Frühwirth, Anton Paar GmbH, Graz, Austria
A.Teresiak, K. Güth, O. Gutfleisch, Leibniz Institute for Solid State and Material Research Dresden, IFW Dresden, Germany
NEW INSTRUMENTATION FOR X-RAY MATERIAL RESEARCH
Heiko R. Ress, Bruker AXS, Madison, WI, US
Geert Vanhoyland, Bruker AXS, Karlsruhe, Germany
Bob He, Bruker AXS, Madison, WI, US
Brian Jones, Bruker AXS, Madison, WI, US
Quantification of sulfur content in polymer films of varying thicknesses using X-ray fluorescence
P. Ricou, D. Mountz, Arkema Inc. Technical Center, King of Prussia, PA, 19406, USA
Quantification of two-polymeric phases in paint formulation by X-ray fluorescence and X-ray photoelectron spectroscopy
P. Ricou, R. Gupta, Arkema Inc., Technical Center, 900 First Avenue, King of Prussia, PA 19406, USA
FAST DIFFRACTION STUDIES WITH MICROFOCUS SOURCES
P. Panine, S. Rodrigues, B. Lantz, P. Høghøj,, Xenocs, Sassenage, France
HIGH BRILLIANCE MICROFOCUS SOURCES WITH SCATTERLESS COLLIMATION FOR IMPROVED SAXS
S. Rodrigues, P. Panine, V. Roger, P. Høghøj, Xenocs, Sassenage, France
IN-SITU DIFFRACTION: AN IMPORTANT TOOL FOR THE DEVELOPMENT OF RENEWABLE ENERGY TECHNOLOGIES
M.A. Rodriguez, Sandia National Laboratories, Albuquerque, NM
AN ARCHAEOLOGIST'S DILEMMA
K. Rogers, S. Beckett*, S. Kuhn, Cranfield University, Swindon, Wiltshire, U.K.
A. Chamberlain, Sheffield University, Sheffield, U.K.
J. Clement, University of Melbourne, Melbourne, Australia
AN ALTERNATIVE VOYAGE THROUGH RECIPROCAL SPACE
K. Rogers, J. Rogers, A. Dicken, Cranfield University, Swindon, Wiltshire U.K.
P. Evans, J.W. Chan, X. Wang, Nottingham Trent University, Nottingham, U.K.
A NEW GEOMETRY FOR 21ST CENTURY DIFFRACTION
J. Rogers, A. Dicken, Cranfield University, Swindon, Wiltshire. U.K.
P. Evans, J.W. Chan, X. Wang, Nottingham Trent University, Nottingham. U.K.
A Next Generation Neutron Diffraction Strain Scanner for Steady-Sate Sources
R.B. Rogge, Canadian Neutron Beam Centre, National Research Council, Canada
A NEW APPROACH TO HIGH THROUGHPUT DIFFRACTION ANALYSIS
S. Roncalllo, DASSR, Cranfield University, Shrivenham, Swindon, Wiltshire, SN6 8LA, UK
O. Karimi, Cranfield Health, Cranfield University, Cranfield, MK43 0AL, Bedfordshire, UK
K. D. Rogers, Cranfield Health, Cranfield University, Cranfield, MK43 0AL, Bedfordshire, UK
S.A. Ansari, Department of Engineering Systems and Management, CDS, Cranfield University, Shrivenham, Swindon, SN6 8LA, UK
J. M. Gregoire, Cornell Fuel Cell Institute, Cornell University, Ithaca, New York, USA
D. W. Lane, DASSR, Cranfield University, Shrivenham, Swindon, Wiltshire, SN6 8LA, UK
XANES BASED QUANTITATIVE PHASE ANALYSIS IN Cu2ZnSnS4
H. David Rosenfeld, E. I. DuPont de Nemours & Co., Wilmington, DE, USA
FP-BASED EDXRF CHARACTERIZATION OF THIN FILM SOLAR CELLS
V. Rößiger, J. Kessler, Helmut Fischer GmbH, Sindelfingen, Germany
M. Haller, Fischer Technology, Inc., Windsor CT
DETECTION AND QUANTIFICATION OF PASSIVATION LAYERS IN ELECTROCHEMICAL INERT ANODES BY IN-SITU AND EX-SITU DIFFRACTION
M.R. Rowles*, K. McGregor, G.A. Snook, CSIRO Process Science and Engineering / CSIRO Light Metals Flagship, Box 312, Clayton South, Victoria 3168, Australia
I.C. Madsen, N.V.Y. Scarlett, M. Lanyon, A. Urban, CSIRO Process Science and Engineering, Box 312, Clayton South, Victoria 3168, Australia
M.J. Styles, D.P. Riley, School of Engineering, The University of Melbourne, Victoria, 3010, Australia
CLEVER DIFFRACTOMETERS WITH THE INCOATEC MICROFOCUS SOURCE
T. Samtleben, Incoatec, Geesthacht, Germany
C. Michaelsen, Incoatec, Geesthacht, Germany
B. Hasse, Incoatec, Geesthacht, Germany
J. Graf, Incoatec, Geesthacht, Germany
J. Wiesmann, Incoatec, Geesthacht, Germany
DIFFERENT APPLICATIONS OF POLYCAPILLARIES TO X-RAY SPECTROSCOPY
H.J. Sánchez, R.D. Pérez, Facultad de Matemática Astronomía y Física. Universidad Nacional de Córdoba, Argentina
C.A. Pérez, Laboratório Nacional de Luz Síncrotron, Campinas, Brasil
SAXS INVESITGATIONS OF SOLID SAMPLES USING THE NEW MULTI-PURPOSE VARIOSTAGE
H. Santner, C. Resch, Anton Paar GmbH, Graz, Austria
EVOLUTION OF TEXTURE AND DISLOCATIONS OF HIGH-DUCTIL TWIP STEEL DURING DEFORMATION
S. Sato*, T. Yoshimura, Tohoku University, Sendai, Miyagi, Japan
N. Yamada, Bruker AXS K. K., Yokohama, Kanagawa, Japan
K. Wagatsuma, S. Suzuki, Tohoku University, Sendai, Miyagi, Japan
SINGLE- AND FOUR-ELEMENT LARGE AREA SILICON DRIFT DETECTOR X-RAY SPECTROMETERS FOR XRF APPLICATIONS
Valeri D Saveliev, SII NanoTechnology USA, Inc., Northridge, CA, USA
Larry Feng, SII NanoTechnology USA, Inc., Northridge, CA, USA
Carolyn R Tull, SII NanoTechnology USA, Inc., Northridge, CA, USA
Shaul Barkan, SII NanoTechnology USA, Inc., Northridge, CA, USA
Masanori Takahashi, SII NanoTechnology USA, Inc., Northridge, CA, USA
Elena D Damron, SII NanoTechnology USA, Inc., Northridge, CA, USA
COMPUTATIONAL TEXTURE ANALYSIS WITH MTEX
R. Hielscher, Technische Universitaet Chemnitz, Germany
F. Bachmann*, H. Schaeben, Technische Universitaet Bergakademie Freiberg, Germany
QUANTIFYING THE EXTENT TO WHICH EXPERIMENTAL POLE INTENSITY DATA DETERMINE AN ORIENTATION DENSITY FUNCTION EXPLAINING THE DATA
R. Hielscher, Technische Universitaet Chemnitz, Germany
H. Schaeben*, Technische Universitaet Bergakademie Freiberg, Germany
BRUKER EDXRF NEW PRODUCT RELEASES AND NEWS 2010
Alexander Seyfarth*, Bruker AXS Inc., Madison WI, 53711
Armin Gross, Bruker AXS Microanalysis, Berlin Germany
John Patterson, Bruce Kaiser, Bruker Elemental, Kennewick, WA,
ANALYSIS OF MEISSEN CERAMICS FROM THE HOFFMEISTER COLLECTION BY HH-XRF
A J Shortland*, Centre for Archaeological and Forensic Analysis, Cranfield University, Shrivenham, Swindon. Wiltshire SN6 8LA United Kingdom
K Domoney, Centre for Archaeological and Forensic Analysis, Cranfield University, Shrivenham, Swindon. Wiltshire SN6 8LA United Kingdom
S Kuhn, Bonham’s Auctioneers, 101 New Bond Street, London W1S 1SR United Kingdom
APPLICATIONS OF XRF IN CRM DEVELOPMENT AT THE NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY
John R Sieber, NIST, Gaithersburg, MD, USA
In-Situ Neutron Diffraction Study of Residual Stress in Steel Ammonia Nurse Tank Welds
Thomas A. Sisneros* Donald Brown, Los Alamos National Laboratory, Los Alamos, NM, USA
Allen Russel, Ames National Laboratory, Ames, Iowa, USA
Scott Chumbley, Andrew Becker, Iowa State University, Ames, Iowa
CHARACTERIZATION OF X-RAY POWDER DIFFRACTION DATA OF BaX Sr1−X SO4 (0≤x≤1) BY RIETVELD REFINEMENT
Syed Rehan ZAIDI, Research and Department Center, Saudi ARAMCO, PO Box 62, Dhahran 31311, Saudi Arabia
Husin SITEPU*, Research and Department Center, Saudi ARAMCO, PO Box 62, Dhahran 31311, Saudi Arabia
Shouwen SHEN, Research and Department Center, Saudi ARAMCO, PO Box 62, Dhahran 31311, Saudi Arabia
Noqtan Al-Yami, Research and Department Center, Saudi ARAMCO, PO Box 62, Dhahran 31311, Saudi Arabia
DIFFERENCES BETWEEN NEAR-SURFACE AND BULK PREFERRED ORIENTATION WITH POWDER DIFFRACTION DATA OF MOLYBDITE (MOO3) AND CALCITE (CACO3)
Husin Sitepu*, Department of Applied Physics, Curtin University of Technology, Perth, Australia. [Now at Research and Development Center, Saudi Aramco, Dhahran 31311, KSA ]
Brian H. O’Connor, Department of Applied Physics, Curtin University of Technology, Perth, Australia
Deyu Li, Department of Applied Physics, Curtin University of Technology, Perth, Australia
A Stepwise Approach for the X-ray Diffraction Data in Rietveld Refinement
O.A.Smirnova, Institute for Chemical Research, Kyoto University
MULTIALIQUOT CELL APPROACH FOR THE SDPD OF HIGH SYMMETRY COMPOUNDS
O.A.Smirnova, Institute for Chemical Research, Kyoto University
The wave theory of the crystalline phase
O.A.Smirnova, Institute for Chemical Research, Kyoto University
GRAZING INCIDENCE X-RAY ABSORPTION APPLIED TO THE CHARACTERISATION OF AS SHALLOW IMPLANTS IN SI
G. Pepponi, D. Giubertoni,S. Gennaro, E. Demenev, M. Bersani,, MiNALab, CMM–Irst, Fondazione Bruno Kessler, Via Sommarive 18, 38123 Povo, Trento, Italy
F. Meirer, C. Streli, ATI, TU Wien, Stadionallee 2, 1020 Vienna, Austria
M. A. Sahiner, 3 Department of Physics, Seton Hall University, South Orange, New Jersey 07079, USA
M.A. Foad, Advanced Technology Group, CTO Office, Applied Materials Inc., 3225 Oakmead Village Drive, Santa Clara, California 95052, USA
P. Pianetta, SSRL, 2575 Sand Hill Road, Menlo Park, California 94025, USA
Levels and Spatial Distribution of Trace Elements in Bone Following Strontium Treatment in Calcium Deficient Rats
F. Meirer, Atominstitut, Technische Universitaet Wien, Vienna, Austria and Stanford Synchrotron Radiation Lightsource, Menlo Park, CA
J.G. Hofstaetter, Ludwig Boltzmann Institute of Osteology at the Hanusch Hospital of WGKK and AUVA Trauma Centre Meidling, Vienna, Austria and Vienna General Hospital, Vienna, Austria
S. Smolek, B. Pemmer, P. Wobrauschek, C. Streli, Atominstitut, Technische Universitaet Wien, Vienna, Austria
R. Simon, Forschungszentrum Karlsruhe GmbH, Eggenstein-Leopoldshafen, Germany
R.K. Fuchs, Indiana University School of Medicine, Indianapolis, IN
M.R. Allen, K.W. Condon, S. Reinwald, D.B. Burr, School of Health and Rehabilitation Sciences, Indiana University, Indianapolis, IN
ANALYSIS OF PLANT LEAVES RELATED TO REMEDIATION SUTDIES IN POST-MINING AREAS BY LABORATORY BASED MICRO-XRF SPECTROMETRY
S. Smolek, Atominstitut TU Wien, Stadionallee 2, 1020 Wien, Austria
E. Marguí, Laboratory of X-ray Analytical Applications (LARX). Institute of Earth Sciences “Jaume Almera”, CSIC. Solé Sabarís s/n. 08028 Barcelona, Spain
P. Kregsamer, Atominstitut TU Wien, Stadionallee 2, 1020 Wien, Austria
I. Queralt, Laboratory of X-ray Analytical Applications (LARX). Institute of Earth Sciences “Jaume Almera”, CSIC. Solé Sabarís s/n. 08028 Barcelona, Spain
C. Streli, Atominstitut TU Wien, Stadionallee 2, 1020 Wien, Austria
DIRECT MEASUREMENT OF CHARGE DENSUTY WAVE PINNING DYNAMICS USING X-RAY PHOTON CORRELATION SPECTROSCOPY
J.-D Su, Argonne National Laboratory, Argonne, IL 60439, USA
A. R. Sandy, Argonne National Laboratory, Argonne, IL 60439, USA
J. Mohanty, Department of Physics, Technical University, Berlin, Germany
O. G. Shpyrko, University of California, San Diego, La Jolla, CA 92093, USA
M. Sutton, McGill University, Montreal, Quebec, Canada H3A 2T8
HIGH RESOLUTION X-RAY DIFFRACTION OF III-NITRIDE WIDE BANDGAP SEMICONDUCTORS
Q. Sun*, B. Leung, J. Han, Yale University, New Haven, CT, USA
NANOPARTICLE SIZE ANALYSIS USING SAXS AND XRD TECHNIQUES
Aya Takase, Rigaku Americas Corporation, The Woodlands, TX, USA
Small-angle X-ray scattering of composite polypropylene films
D.E. Temnov*, E.E. Fomicheva, Herzen State University of Russia, Saint-Petersburg, Russia
B.A. Fedorov, A.V. Smirnov, Saint-Petersburg University Information Technologies, mechanics and optics, Saint-Petersburg, Russia
PROGRESS WITH THE GSAS-II SOFTWARE PACKAGE FOR CRYSTALLOGRAPHY
B. Toby, Robert B. Von Dreele, Advanced Photon Source, Argonne National Lab, IL (USA)
Your synchrotron powder diffraction instrument: 11-BM at the APS
B. Toby, M.R. Suchomel, R.B. Von Dreele, L. Ribaud, Advanced Photon Source, Argonne National Laboratory, Argonne, IL, USA
XRF LINE AND AREA SCANS IN THE EXAMINATION OF WORKS OF ART
Karen, Trentelman, Getty Conservation Institute, Los Angeles, CA, USA
X-RAY CHEMICAL IMAGING IN SCANNING AND PROJECTION MODES IN THE LABORATORY
K. Tsuji, K. Nakano, Osaka City University, Osaka, Japan
ANALYTICAL PERFORMANCE OF NEWLY DEVELOPED 2D/3D-XRF INSTRUMENTS
T. Nakazawa, K. Nakano, K. Tsuji, Osaka City University, Osaka, Japan
CALCULATION OF X-RAY STRESS FACTORS ON THE BASIS OF SO(3) VECTOR PARAMETRIZATION
A.Ulyanenkov, Bruker AXS, Karlsruhe, Germany
F.Rinaldi, S.Menzel, Ulm University, Ulm, Germany
A.Benediktovich, A.Zhilik, I.Feranchuk, Belarussian State University, Minsk, Belarus
K.Saito, Bruker AXS K.K., Yokohama, Japan
HIGH-RESOLUTION RECIPROCAL SPACE MAPPING OF InGaAs/GaAs STRUCTURES: FROM PSEUDOMORPHIC TO FULLY RELAXED STATE
A.Ulyanenkov, Bruker AXS, Karlsruhe, Germany
F.Rinaldi, S.Menzel, Ulm University, Ulm, Germany
A.Benediktovich, A.Zhilik, I.Feranchuk, Belarussian State University, Minsk, Belarus
K.Saito, Bruker AXS K.K., Yokohama, Japan
XRS for preventive conservation of cultural heritage
Rene Van Grieken, Dept. Chemistry, University of Antwerp, B-2610 Antwerp, Belgium
BOND LENGTH EVOLUTION IN 312 and 211 MAX PHASES FROM HIGH TEMPERATURE NEUTRON DIFFRACTION AND RIETVELD ANALYSIS
Nina J. Lane, Michel W. Barsoum, Department of Materials Science and Engineering, Drexel University, Philadelphia, PA 19104, USA
Sven C. Vogel, Los Alamos Neutron Science Center, Los Alamos National Laboratory, Los Alamos, NM 87545, USA
MACROSCOPIC X-RAY FLUORESCENCE CAPABILITY FOR LARGE-SCALE ELEMENTAL MAPPING
H.M. Volz, G.J. Havrilla, R.M. Aikin, V.M. Montoya, A.N. Duffield, Los Alamos National Laboratory, Los Alamos, NM, USA
HIGH SPEED 2D AND 3D MXRF-IMAGING WITH BENCH TOP TECHOLOGY
Ulrich Waldschlaeger*, Michael Haschke, Bruker Nano GmbH, Schwarzschildstr. 10, 12489 Berlin, Germany
Temperature-Programmed X-ray Diffraction Studies on Phase transitions of Modified ZMS-5 Catalysts for C4-olefin cracking reactions
Huanru Wang, Beijing Research Institute of Chemical Industry, SINOPEC, Beijing, China
Yuanyuan Ji, Beijing Research Institute of Chemical Industry, SINOPEC, Beijing, China
Xiaoqiang Zeng, Beijing Research Institute of Chemical Industry, SINOPEC, Beijing, China
XRD ANISOTROPIC BROADENING OF NANO-PARTICLES
Y.WANG, 1. Analytical Centre, University of New South Wales, Australia
S.L.I. CHAN, Y.R. SHEN, 2. School of Materials Science, University of New South Wales, Australia
R. AMAL. K. KIATKITTIPONG, 3. School of Chemical Science and Engineering, University of New South Wales, Australia
In situ Synchronous XAFS/DRIFTS Study of CO Adsorption on Al2O3-Supported Pt
Q. Wang, N. Marinkovic, Synchrotron Catalysis Consortium,University of Delaware, Newark DE
L. Barrio, Chemistry Department, Brookhaven National Laboratory, Upton, NY
C. Cooper, A. Frenkel, Physics Department, Yeshiva University, New York, NY
SYNCHROTRON X-RAY SCATTERING STUDIES OF THIN FILM INTERFACE EVOLUTION
Andrew P. Warren*, Tik Sun, Bo Yao, Kevin R. Coffey, Advanced Materials Processing and Analysis Center, University of Central Florida, Orlando, FL 32816 USA
Katayun Barmak, Department of Materials Science and Engineering, Carnegie Mellon University Pittsburgh, PA 15213 USA
Michael F. Toney, Stanford Synchrotron Radiation Lightsource Menlo Park, CA 94025 USA
MULTIPLE DIFFRACTION PEAK SPECTRA RESULTING FROM SINGLE CRYSTAL SUBSTRATES
T.R. Watkins, Oak Ridge National Laboratory, Oak Ridge, TN 37831, USA
E.A. Payzant, Oak Ridge National Laboratory, Oak Ridge, TN 37831, USA
TXRF- A VERSATILE TOOL FOR TRACE ELEMENT ANALYSIS: A REVIEW
P. Wobrauschek, Atominstitut, Vienna Univ. of Technology, Vienna, Austria
WASTE REDUCTION PROCESS IMPROVEMENTS IN THE ANALYSIS OF PLUTONIUM BY X-RAY FLUORESCENCE: RESULTS FROM MULTIPLE DATA SETS
C.G. Worley*, C.B. Soderberg, L.E. Townsend, Los Alamos National Laboratory, Los Alamos, NM, USA
Analysis of Fused Metal Alloys by WDXRF Using MOXI, a Wide-Ranging-Oxide Application for Metals
Greg Wortman, David Coler, Kimberly Halkiotis, PANalytical Inc., Westborough, MA 01581
Collector Optics For The “Water Window”
Sergiy Yulin, Viatcheslav Nesterenko, Torsten Feigl, Norbert Kaiser, Fraunhofer Institute for Applied Optics and Precision Engineering IOF
INSIGHTS INTO THERMOELECTRIC MATERIALS: NEW STRUCTURES AND PROPERTIES.
Paul Zschack*, Argonne National Laboratory, Argonne, IL USA
Colby Heideman, Qiyin Lin, Ngoc Nguyen, Mary Smeller, Clay Mortensen, David C. Johnson, University of Oregon, Eugene, OR, USA


 

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