46 Annual (1997) Denver X-ray Conference™
Denver Marriott Tech Center Hotel
Denver, Colorado, U.S.A.
August 4 - 8
1997 DENVER X-RAY CONFERENCE
The 1997 Denver X-ray Conference™, 46th in the series was held August 4-8,
1997, in Steamboat Springs Colorado, in conjunction with the 1997 X-TOP Symposium on
High Resolution Diffraction and X-ray Topography. The first two days of the conference
were devoted to tutorial workshops on a number of topics including:
Microfluorescence & Microdiffraction
Composition Depth-Profiling by Combined Grazing-Incidence XRF and vendor
(D. K. Bowen)
(A. C. Wright and G. R. Mitchell)
Specimen Preparation for XRD
(D. Smith and R. Jenkins)
Orientation in Polymers
(G. R. Mitchell)
Applications of Neutron Diffraction
(C. R. Hubbard)
Heteroepitaxial Layers & Semiconductor Substrates I, II
(M. Halliwell and
I. C. Bassignana)
Crystal Chemistry Applied to
XRD Phase Identification I, II
(G. J. McCarthy, D. K. Smith,
P. W. Wallace, R. L. Snyder)
|Specimen Preparation for XRF
Basics of XRF Analysis
(R. Jenkins and J. V. Gilfrich)
XRF Analysis of Light Elements
Quantitative Techniques and Errors in XRF
(J. A. Anzelmo)
Quantitative XRF Analysis - Fundamental Parameters
In Vivo XRF Analysis
(R. Gardner and L. Wielopolski)
The remaining three days were devoted to special sessions, contributed sessions and poster sessions on a variety of topics. In particular, the Plenary Session on X-ray Analysis and Characterization of Thin Films, organized by I. C. Noyan, IBM, Yorktown Heights, NY, which was held in the upper gondola terminal on Mt. Werner was a highlight of the conference, featuring the following invited papers:
High Resolution X-ray Diffraction Applied to Strain Relaxation of Lattice Mismatched Semiconductor Films - P. M. Mooney and J. L. Jordan-Sweet, IBM Research, Yorktown Heights, NY
High Resolution X-ray Diffraction and Process Control of InP-Based Long-Wavelength Lasers - J. M. Vandenberg, Lucent Technologies, Murray Hill, NJ
Synchrotron White Beam X-ray Topography Studies of Semiconductor Substrate Crystals - M. Dudley, SUNY at Stony Brook, NY
Characterization of Thin Films by Grazing Incidence X-ray Scattering - D. K. Bowen, M. Wormington and C. R. Thomas, Bede Scientific, Englewood, CO
The 1997 Barrett Award for X-ray Diffraction was presented to James D. Jorgensen of ANL, Argonne, IL, and ICDD special awards were presented to G. J. McCarthy of North Dakota State University, Fargo, ND and P. K. Predecki, University of Denver, Denver, CO.
Other special sessions (with the organizers shown in parentheses) and contributed sessions were as follows:
|Analysis and Characterization of Thin
Films II, XRD and XRF
(T. C. Huang and
Applications of Microfluorescence and Microdiffraction I & II
(G. Havrilla and B.R. York)
|Polymers I: Time-Resolved SAXS/WAXS
(B. L. Farmer and
B. S. Hsiao)
Applications of Rietveld Analysis
(R. Von Dreele)
Polymers II: Polymer Structure and Morphology
(G. R. Mitchell and
N. S. Murthy)
Polymers III: Amorphous Materials
(R. Barton and
A. C. Wright)
Neutron Diffraction Applications
(J. Richardson and
Strain and Stress Determination By Diffraction
XRD Applications I (mostly peak broadening)
(R. Jenkins and
B. H. O'Connor)
XRD Applications II (texture, structure)
(R. J. DeAngelis and
|In Vivo XRF Analysis
(R. P. Gardner and
Geological and Mineralogical Applications of XRF
(J. Taggart and J. Willis)
Total Reflection X-ray Fluorescence Applications
(M. A. Zaitz and
Quantitative Applications of XRF
(J. V. Gilfrich and
General XRF Applications
(V. Buhrke and
|X-Top-1: High Resolution Diffraction
and X-Ray Topography
(M. Goorsky and R. Matyi)
X-Top-2: High-Resolution Diffraction and
(M. Wormington and
X-Top-3 High-Resolution Diffraction and X-Ray Topography
(M. Dudley and W. Beard)
X-TOP-4: High-Resolution Diffraction and
The conference proceedings will be published in CD-ROM form by the ICDD. Exhibits of X-ray and related equipment by 32 companies were available for perusal during the conference week.
The conference was marked by the usual exceptionally friendly atmosphere engendered by the attendees and the exhibitors. The latter are to be congratulated on the opulence and quality of their receptions which did much to further the spirit of cameraderie and cooperation. The hotel put on a wonderful conference dinner, which was followed by a memorable performance by the Barbershop quartet: The Powdermen (Ron Jenkins, Jim Kaduk, Greg McCarthy and Walt Schreiner), with contributions from various national groups in the audience. An enjoyable and informative time was had by all.
This year marks the last year that the conference will be organized and sponsored by the University of Denver, Department of Engineering, with P.K. Predecki as Conference Chairman. These tasks will henceforth be assumed by the ICDD, with Ron Jenkins as Conference Chairman.
Paul K. Predecki - October 1997
Advanced Materials Identification and Analysis, Inc.
Automated Fusion Technology
Bertan High Voltage
Blake Industries, Inc.
Chemplex Industries, Inc.
Hecus M. Braun-Graz X-ray Systems
Institute for Roentgen Optics
Kevex Instruments, Inc.
Materials Data, Inc.
Oxford Instruments, Inc.
Philips Electronic Instruments Co.
Polycrystal Book Service
Seifert X-ray Corporation
Shimadzu Scientific Instruments, Inc.
Siemens Analytical X-ray Systems, Inc.
SPEX Certiprep, Inc.
Stony Brook Synchrotron Topography Station, NSLS
Veeco Instruments, Inc.
X-ray Instrumentation Associates
X-ray Optical Systems, Inc.